KR20010111969A - Inspection apparatus and method for pdp electrode pattern using magnetic heads - Google Patents

Abstract

The present invention relates to an apparatus for inspecting an electrode pattern of a plasma display panel using a magnetic head and a method thereof, wherein a magnetic field generated by a current flowing through an electrode pattern is applied to both ends of an electrode pattern of a plasma display panel. By measuring while scanning with the advantage that it is possible to quickly and easily check for short circuit and open.

Description

Electrode pattern inspection apparatus for plasma display panel using magnetic head and its method {INSPECTION APPARATUS AND METHOD FOR PDP ELECTRODE PATTERN USING MAGNETIC HEADS}

The present invention relates to an apparatus for inspecting an electrode pattern of a plasma display panel using a magnetic head and a method thereof. More particularly, the present invention relates to an apparatus for inspecting an electrode pattern of a plasma display panel. The present invention relates to an apparatus for inspecting an electrode pattern of a plasma display panel using a magnetic head and to a method of detecting a short circuit and an opening by observing a magnetic field while scanning with a magnetic head.

In general, PDP (Plasma Display Panel) is a voltage between the positive electrode and the negative electrode by putting a gas such as Ne + Ar, Ne + Xe between the upper glass and the lower glass and the glass sealed by the partition therebetween. It refers to an electronic display device that emits neon light by applying the light to display light.

Accordingly, the plasma display displays various characters or patterns by forming a discharge point between discharge electrodes formed between the vertical electrode patterns and the horizontal electrodes of the upper and lower glass plates facing each other, as the discharge cells.

PDP has been widely used for FA (factory automation) because it is possible to display large size with clear light, but now it is widely used for OA (office automation) such as personal computer with small size, light weight and high performance of display device. As the display quality is high and the response speed is fast, demand is increasing rapidly as it is adopted as a wall-mounted TV.

Since the PDP is configured to emit light by discharge due to plasma generation at the intersection of the electrode patterns formed on the upper glass and the lower glass, the yield of the finished product is determined according to the electrical characteristics of the electrode patterns formed on the upper glass and the lower glass.

FIG. 1 is a view illustrating electrode patterns formed on a top glass and a bottom glass of a general PDP. (A) is an electrode pattern formed on a top glass, and (B) is an electrode pattern formed on a bottom glass.

As shown here, it can be seen that a plurality of electrode patterns 10a, 10b, 11a, and 11b are formed on the top glass 10 and the bottom glass 11. In addition, connector electrodes 10c and 11c for supplying power and the like to the electrode patterns 10a, 10b, 11a and 11b are formed.

The electrode patterns 10a, 10b, 11a and 11b are typically 50 m in line width and 200 m in pitch in the case of 42-inch PDP, whereas the line length reaches 1 m. In the manufacturing process, such as heat treatment (10b), (11a) and (11b), as well as subsequent repeated heat treatment, the wiring is frequently opened or shorted with other adjacent wiring.

Therefore, the electrode patterns 10a, 10b, 11a and 11b are formed through the connector electrodes 10c and 11c formed on both sides of the electrode patterns 10a, 10b, 11a and 11b in the middle of the PDP manufacturing process. The pattern inspection process for inspecting the electrical characteristics of the () is essential to increase the yield of the finished PDP by inspecting whether the electrode patterns 10a, 10b, 11a, and 11b are short-circuited and short-circuited.

2 is an inspection apparatus for inspecting electrical characteristics of a PDP electrode pattern by a conventional test pin block.

As shown here, a plurality of test pins 12a are formed on the side of the test pin block 12 to match the line width and pitch of the PDP electrode pattern to be inspected.

Accordingly, when the electrode patterns 10a, 10b, 11a, and 11b formed on the upper glass 10 or the lower glass 11 of the PDP having the electrode pattern shown in FIG. 1 are to be inspected, the corresponding electrode pattern 10a The test pins 12a are pressed into the connector patterns 10c and 11c formed at one side of the 11a and the other ends of the electrode patterns 10a and 11a, and then the voltage is applied to the connector patterns 10c and 11c. After applying the voltage and measuring the voltage at the other end to check whether the electrode pattern (10a) open and short.

In addition, the test pins 12a are pressed to both ends of the electrode patterns 10a and 11a, and then voltages are alternately applied to measure the voltage at both ends of the adjacent electrode patterns 10b and 11b. The short circuit between the patterns 10a and 11a and the adjacent electrode patterns 10b and 11b is examined.

In addition, Figure 3 is a view showing a non-contact scan type inspection apparatus using a non-contact probe by a timer IC filed by the applicant of the prior patent No. 2000-28084 (2000. 05. 24).

As shown here, the first probe TP1 is installed on the first connector electrode C1 extending from the left side of the first electrode pattern P1, and the second probe extending from the right side of the second electrode pattern P2. The third probe TP3 is installed at the connector electrode C2. The second probe TP2 is installed on the third connector electrode C3 extending from the left side of the third electrode pattern P3, and the fourth connector electrode C4 extending from the right side of the fourth electrode pattern P4. ), The fourth probe TP4 is installed.

In addition, the second non-contact probe CP2 and the second electrode pattern P2 and the fourth electrode pattern P4 for measuring the capacitance on the right side of the first electrode pattern P1 and the third electrode pattern P3. On the left side, first non-contact probes CP1 for measuring capacitance are provided.

As described above, the first to fourth probes TP1, TP2, TP3 and TP4 and the first to second non-contact probes CP1 and CP2 form a pair to inspect the electrode pattern of the PDP.

As described above, the state of the electrode pattern of the plasma display panel is inspected with four test probes TP1, TP2, TP3, and TP4 and two non-contact probes CP1 and CP2 installed on the electrode pattern.

4 is a view showing a test procedure of the inspection apparatus according to FIG.

As shown here, a test is performed while sequentially scanning a cycle consisting of steps I to V. FIG.

First, in step I, the reference value is measured. The output frequency f of the first to second non-contact probes CP1 and CP2 without supplying the ground voltage GND and the power supply voltage VC to the first to fourth probes TP1, TP2, TP3, and TP4. Measure

Next, in step II, the first electrode pattern P1 is opened. The first ground switch IG is turned on to apply the ground voltage GND to the first connector electrode C1. The change of the output frequency f measured by the non-contact probe CP2 determines whether the first electrode pattern P1 is short-circuited. In other words, when the capacitance value C measured by the second non-contact probe CP2 is equal to the reference value, the output frequency f of the timer IC 81 is not changed and the first electrode pattern P1 is disconnected. If it is determined that the measured capacitance value C is greater than the reference value, it is determined that the output frequency f of the timer IC (not shown) is high and is normal.

Next, in step III, a short-circuit state is measured between the first electrode pattern P1 and the second, third and fourth electrode patterns P2, P3, and P4. With the ground voltage GND applied to the connector electrode C1, the second, third and fourth power switches IIS, IIIS and IVS are turned on to the second, third and fourth connector electrodes C2, C3 and C4. When the voltage is measured at the second, third, and fourth probes TP2, TP3, and TP4 while the power supply voltage VC is applied, all of them are normal, but the second, third, and fourth probes TP2 are normal. When the ground voltage GND is measured by at least one of the probes TP3 and TP4, the current path is formed by the ground voltage GND applied to the first electrode pattern P1. ) And the second, third and fourth electrode patterns P2, P3, and P4 are short circuited with at least one of the electrode patterns.

Next, in step IV, the opening of the second electrode pattern P2 is measured. The third ground switch IIIG is turned on to apply the ground voltage GND to the second connector electrode C2. The short circuit of the second electrode pattern P2 is determined by the change in the capacitance value C measured by the one-contact probe CP1. In other words, when the capacitance C measured by the first non-contact probe CP1 is the same as the reference value, the output frequency f of the timer IC is also the same, so the second electrode pattern P2 is determined to be broken. If the measured capacitance value C is larger than the reference value, it is determined that the output frequency f of the timer IC is high.

Next, in step V, a short-circuit state between the second electrode pattern P2 and the first, third and fourth electrode patterns P1, P3, and P4 is measured. The first, third and fourth connector electrodes C1, C3 and C4 are turned on by turning on the first, second and fourth power switches IS, IIS and IVS while the ground voltage GND is applied to the connector electrode C2. When the power supply voltage VC is measured by measuring the voltage at the first, second, and fourth probes TP1, TP2, and TP4 while applying power, the first, second, and fourth probes TP1, TP2, and TP4 are all normal. In the case where the ground voltage is measured by at least one of the probes, the current path is formed by the ground voltage applied to the second electrode pattern P2. Thus, the second electrode pattern P2 and the first, third and fourth electrode patterns are formed. At least one of (P1, P3, P4) is determined as a short circuit state with the electrode pattern.

In this manner, the first to fourth probes TP1, TP2, TP3, and TP4 are used as a pair to measure whether the first electrode pattern P1 and the second electrode pattern P2 are short-circuited and short-circuited for one cycle. After moving the first to fourth probes TP1, TP2, TP3, and TP4 to the next electrode pattern, again measuring whether the third electrode pattern P3 and the fourth electrode pattern P4 are short-circuited and short-circuited. You will repeat the work.

As described above, when the test pin block is used to test the electrical characteristics of the electrode pattern of the plasma display panel or the measurement is performed by a non-contact probe, the electrical pattern of the electrode pattern is sequentially contacted individually according to the specification of the electrode pattern. The electrode pattern was examined by measuring the characteristics.

Since the test is performed sequentially while individually contacting according to the specification of the electrode pattern, there is a problem that the specification of the equipment for testing also needs to be replaced according to the specification of the electrode pattern when the specification of the electrode pattern is changed.

The present invention was created to solve the above problems, and an object of the present invention is to scan the magnetic field generated by the current flowing through the electrode pattern with the magnetic head after applying power to both ends of the electrode pattern of the plasma display panel. The present invention provides an apparatus and a method for inspecting an electrode pattern of a plasma display panel using a magnetic head, which can observe whether or not a short circuit and an opening occur in a short time.

In addition, an object of the present invention is to provide an apparatus and a method for inspecting an electrode pattern of a plasma display panel using a magnetic head that can be measured with the same equipment even without changing the equipment for testing the electrical characteristics of the electrode pattern even if the pattern of the connector electrode changes. In providing.

FIG. 1 is a view illustrating electrode patterns formed on a top glass and a bottom glass of a general PDP.

2 is an inspection apparatus for inspecting the electrical characteristics of the PDP electrode pattern by the test pin block of the first embodiment.

3 is a view showing a non-contact scan type inspection apparatus using a non-contact probe by the timer IC of the second embodiment.

4 is a view showing a test procedure of the inspection apparatus according to FIG.

5 is a view showing a state of measuring the opening of the electrode pattern by the electrode pattern inspection apparatus of the plasma display panel according to the present invention.

6 is a diagram illustrating a distribution of a magnetic field formed in an electrode pattern of a plasma display panel.

7 is a graph illustrating a change in magnetic flux for measuring whether an electrode pattern is opened in FIG. 5 by a magnetic head according to the present invention.

8 is a view showing a state of measuring the short circuit of the electrode pattern by the electrode pattern inspection apparatus of the plasma display panel according to the present invention.

9 is a graph illustrating a change in magnetic flux for measuring whether an electrode pattern is shorted in FIG. 8 by the magnetic head according to the present invention.

-Explanation of symbols for the main parts of the drawings-

10 top glass 11 bottom glass

10a, 10b, 11a, 11b: electrode pattern 10c, 11c: connector electrode

51, 52: first to second short bar 53: power supply voltage generator

54,55,56: Magnetic head

An electrode pattern inspection apparatus of a plasma display panel using a magnetic head for realizing the above object is a power supply device for simultaneously applying power to a plurality of connector electrodes or a plurality of electrode patterns, and to scan perpendicular to the direction of the electrode pattern While it is characterized in that the magnetic head for observing the magnetic field generated by the electrode pattern.

In addition, the method of inspecting the electrode pattern of the plasma display panel using the magnetic head applies power to all the connector electrodes on one side and power to all the electrode patterns on the other side, and scans the state of magnetic field while scanning the magnetic head to determine whether it is open. Measure and measure the presence or absence of a short circuit by applying power to all of the connector electrodes on both sides and scanning while generating the magnetic field with the magnetic head.

When the power is applied to the electrode pattern according to the present invention, the magnetic field generated as the current flows in the electrode pattern is observed while the magnetic head is scanned in a direction perpendicular to the direction of the electrode pattern, without the individual contact of the electrode pattern. At the same time, by measuring by contact with the short bar, it is easy to measure the change of the standard of the electrode pattern without changing the equipment.

Hereinafter, exemplary embodiments of the present invention will be described with reference to the accompanying drawings. In addition, the present embodiment is not intended to limit the scope of the present invention, but is presented by way of example only and the same parts as in the conventional configuration using the same reference numerals and names.

5 is a view showing a state of measuring the opening of the electrode pattern by the electrode pattern inspection apparatus of the plasma display panel according to the present invention.

As shown in (a), all of the electrode patterns 10a on one side of the upper plate glass 10 are connected to each other through the first short bar 51 and the connector electrodes 10c on the other side extending to the electrode patterns 10a. All of them are connected via the second short bar 52. Then, a power supply voltage generator 53 for applying a power supply voltage V to the first short bar 51 and the second short bar 52 is provided.

In addition, a magnetic head 54 for scanning a magnetic field formed by a current flowing through the electrode pattern by scanning in a direction perpendicular to the direction of the electrode pattern is provided.

(B) is a figure which shows the advancing direction and the specific shape of a magnetic head.

In this embodiment, a toroidal type is used as the magnetic head, but other types of magnetic heads such as a hall sensor for measuring the strength of the magnetic field may be used.

As shown here, when the electrode pattern is wired in the x-axis direction, it is generated in the electrode pattern according to the intensity of induced electromotive force generated in the magnetic head 54 by the magnetic flux while scanning the magnetic head 54 in the y-axis direction. The resulting magnetic field will measure the intensity.

6 is a diagram illustrating a distribution of a magnetic field formed in an electrode pattern of a plasma display panel.

The magnetic field distribution diagram shown here is a magnetic field distribution diagram in a state in which current flows through the electrode pattern shown in black in the sectional view taken along line II ′ of FIG. 5.

As the magnetic field is formed around the electrode pattern as described above, the intensity of the magnetic flux is strong in the electrode pattern through which current flows and weak in the electrode pattern through which current does not flow.

Accordingly, as shown in FIG. 5, the magnetic head 54 is scanned in the y-axis direction perpendicular to the direction of the electrode pattern while the power supply voltage V is applied to the electrode pattern. Will be measured.

That is, as shown in (a) of FIG. 7, when the electrode pattern is normal, the magnetic flux appears hard in the electrode pattern through which current flows, and the magnetic flux is measured at a weakly constant period in the electrode pattern through which current does not flow. However, as shown in (b), when the electrode pattern 'A' is opened, the magnetic flux measured at regular intervals is weakly measured instead of being strongly measured at the 'A' electrode pattern, thereby measuring that the 'A' electrode pattern is opened. Done.

8 is a view showing a state of measuring the short circuit of the electrode pattern by the electrode pattern inspection apparatus of the plasma display panel according to the present invention.

The first short bar 51 and the second short bar 52 are connected to the connector electrodes 10c on both sides of the upper plate glass 10, and then to the first short bar 51 and the second short bar 52. A power supply voltage generator 53 for applying the power supply voltage V is provided.

When the power supply voltage V is applied to the connector electrodes 10c on both sides, the electrode patterns 10a of the upper glass 10 are formed by extending the connector electrodes 10c to the left and right sides, respectively. Therefore, no current path is formed, so no current flows, and no magnetic field is formed.

However, when the electrode patterns 'B' and 'B' are shorted to each other, a magnetic field is formed while current flows along a line in which a current path is formed, so that the first magnetic head 55 and the second magnetic head 56 are formed. By measuring the intensity of the magnetic flux through it is possible to distinguish between the electrode patterns shorted to each other.

9 (a) is a graph showing the change in intensity of the magnetic flux measured by the first magnetic head, (b) is a graph showing the change in intensity of the magnetic flux measured by the second magnetic head.

As shown in (a), the magnetic flux is measured hard in the 'B' electrode pattern by the first magnetic head, and the magnetic flux is measured in the 'B' electrode pattern in the second magnetic head as shown in (b). Therefore, the electrode patterns 'B' and 'B' are shorted to each other.

As described above, the present invention applies power to both ends of the electrode pattern of the plasma display panel, and then inspects the intensity of the magnetic field generated in the electrode pattern while scanning the magnetic head while scanning in the direction perpendicular to the direction of the electrode pattern. There is an advantage that can be easily checked at high speed whether or not and opening.

In addition, the present invention has the advantage that can be measured with the same equipment without replacing the inspection equipment because the measurement can be performed by applying the power supply voltage through the short bar when testing the electrical characteristics of the electrode pattern even in the pattern change of the connector electrode .

In addition, the present invention has the advantage of reducing the electrode pattern inspection cost of the PDP electrode pattern by testing the electrical characteristics of the electrode pattern with a low-cost magnetic head after applying power to the electrode pattern through a short bar.

Claims (3)

A power supply device for simultaneously applying power to a plurality of connector electrodes or a plurality of electrode patterns; Magnetic head for measuring the intensity change of the magnetic field generated in the electrode pattern while scanning in the direction perpendicular to the direction of the electrode pattern Electrode pattern inspection apparatus of the plasma display panel using a magnetic head, characterized in that consisting of. The apparatus of claim 1, wherein the power applying device is First to second short bars for simultaneously connecting the plurality of connector electrodes and the plurality of electrode patterns; A power supply voltage generator for applying the power supply voltage to the first to second short bars. Electrode pattern inspection apparatus of the plasma display panel using a magnetic head, characterized in that consisting of. Apply power to all of the connector electrodes on one side and power to all other electrode patterns on the other side to measure the strength of the magnetic field in the electrode pattern while scanning with the magnetic head to determine whether it is open, and apply power to all connector electrodes on both sides. And measuring the intensity of the magnetic field in the electrode pattern by scanning with the magnetic head to measure the short circuit Electrode pattern inspection method of plasma display panel using magnetic head