KR20010108837A - Lcd having means for data line open repair - Google Patents

Abstract

The present invention discloses a liquid crystal display device having a repair means capable of performing a repair on opening of all data lines. The disclosed liquid crystal display device is a repair means for opening a data line, disposed on the same plane as the gate line, and disposed in line form on both sides of the data line without being in contact with the gate line. And a dummy gate pattern having at least two protrusions overlapping a portion of the data line.

Description

LCD HAVING MEANS FOR DATA LINE OPEN REPAIR with data line open repair means

The present invention relates to a liquid crystal display device, and more particularly, to a liquid crystal display device provided with a repair means capable of repairing the opening of all data lines.

Liquid crystal displays (hereinafter, LCDs) are used for terminals or video devices of various information devices in place of the CRT (Cathod-ray tube) because they have characteristics such as light weight, thinness, and low power consumption. In particular, a TFT-LCD equipped with a thin film transistor (TFT) as a switching element for each pixel has excellent response characteristics and is suitable for high pixel number, so that the display of high quality and large size comparable to the CRT is performed. The device can be realized.

Such a TFT-LCD largely includes a TFT array substrate, a color filter substrate, and a liquid crystal layer interposed between the substrates.

On the other hand, in manufacturing the TFT array substrate, the open phenomenon of the data line is frequently generated due to a process defect. In particular, the defects generated in the LCD are typically pixel defects and open defects of the data lines. The pixel defects are not regarded as defective products even if several are generated, whereas the defective defectives are generated even when one defect is generated. In order to improve the manufacturing yield of the LCD, it is essential to reduce the open defect of the data line.

Conventionally, in order to reduce the open defect of the data line, a redundancy line is provided in the edge region of the glass substrate, that is, the non-display region, in the manufacture of the TFT array substrate, and the data line is opened. When a failure occurs, the data signal is normally transmitted through the redundancy line by electrically shorting the open data line and the redundancy line using a laser.

1 is a plan view showing a TFT array substrate having a conventional redundancy line, wherein reference numeral 1 denotes a glass substrate, 2 denotes a redundancy line, A denotes a display area, and B denotes a non-display area.

In FIG. 1, two redundancy lines 2 are provided in the non-display area B when the TFT array substrate is manufactured through a five mask process. This redundancy line 2 is usually formed with a gate line (not shown) and is electrically insulated from the data line (not shown) by a gate insulating film (not shown). In addition, when two redundancy lines 2 are provided, up to four data lines can be repaired.

2 is a view for explaining a repair method of an open data line using a conventional redundancy line, 1 is a glass substrate, 2a and 2b is the first and second redundancy line, 3 is a gate line, 5a and 5b is Represent the first and second data lines, respectively.

First, when both of the first and second data lines 5a and 5b are open, a short point C, which is an intersection point of the first redundancy line 2a and the first data line 5a, is shortened using a laser. Similarly, the point E which is the intersection point of the first redundancy line 2a and the second data line 5b is short-circuited using a laser. At this time, the first redundancy line portion disposed between the first data line 5a and the second data line 5b is electrically opened.

As a result, the signal loaded on the first data line 5a flows above the first path P1, that is, the first redundancy line 2a in FIG. 2, and is loaded on the second data line 5b. The signal flows below the second path P2, that is, the first redundancy line 2a. Thus, a repair is made for the opening of two data lines.

In the above, since the arrangement of the lines on the opposite side of the panel is the same as that of FIG. 2, the repair of the opened data lines can be performed in the same manner as described above. In addition, the repair of two data lines may be performed by using the second redundancy line 2b instead of the first redundancy line 2a. In addition, instead of the above repair method, the repair for the first data line 5a uses the first redundancy line 2a, and the repair of the second data line 5b uses the second redundancy line 2b. It can also be done.

However, in the manufacturing process of the TFT array substrate using the conventional five mask process, since only up to two redundancy lines can be provided, only repair for opening up to four data lines is performed. There is a problem that the repair for the opening of the can not be made, and therefore, there is a problem that can not be improved in manufacturing yield.

Accordingly, an object of the present invention is to provide an LCD having a repair means capable of performing repair on all data lines, which has been devised to solve the above problems.

1 is a plan view of a liquid crystal display device having a redundancy line for a data line open repair according to the prior art.

2 is a view for explaining a conventional data line open repair method.

3 is a plan view of main parts of a liquid crystal display device equipped with a data line open repair means according to an exemplary embodiment of the present invention.

(Explanation of symbols for the main parts of the drawing)

21: gate line 22: data line

30 dummy gate pattern 40 thin film transistor

The above object is a repair means for opening a data line, disposed on the same plane as the gate line, and arranged in line form on both sides of the data line without being in contact with the gate line. It is achieved by an LCD according to the invention, characterized in that a dummy gate pattern having at least two protrusions overlapping a portion is provided.

According to the present invention, by providing dummy gate patterns on both sides of the data line, it is possible to perform repair for opening of all data lines, thereby improving the manufacturing yield of the LCD.

(Example)

Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.

3 is a plan view of a main portion of a TFT array substrate having a dummy gate pattern for a data line open repair according to an exemplary embodiment of the present invention, wherein reference numeral 21 is a gate line, 22 is a data line, 30 is a dummy gate pattern, and 30a is a protrusion. And 40 represent TFT, respectively.

As shown, the dummy gate pattern 30 for the data line open repair according to the present invention is provided in the form of a line, and both sides of the data line 22 are provided only in the pixel region without being contacted with the gate line 21. Are placed on each.

In addition, the dummy gate pattern 30 has at least two protrusions 30a disposed to overlap a portion of the data line 22. In this case, the protrusions 30a of the dummy gate patterns 30 disposed on both sides of the data line 22 are alternately overlapped with the data line 22.

Here, the dummy gate pattern 30 is formed together at the time of forming the gate line 21, and thus the dummy gate pattern 30 is disposed on the same plane as the gate line 21.

When the dummy gate pattern for repairing the opening of the data line is provided in the form as described above, repair is possible for all data lines without limiting the number of lines that can be repaired.

In detail, as illustrated in FIG. 3, when the opening of the data line 22 occurs at the point “G”, the dummy gate pattern 30 disposed at both sides of the data line 22 may be “ The dummy gate pattern 30 and the data line 22 are shorted by projecting a laser at the points "H" and "I", or by projecting a laser at the points "J" and "K", respectively. As a result, the signal carried on the data line 22 is normally transmitted through the shorted dummy gate pattern.

Therefore, since the dummy gate pattern 30 is disposed on both sides of all the data lines 22, when the dummy gate pattern 30 is used, repair of opening of all the data lines 22 is possible. .

As described above, according to the present invention, since the dummy gate patterns are provided at both sides of the data line, repair of all data lines can be performed without limiting the number of repairable lines. Therefore, the reliability of the LCD can be secured and the manufacturing yield can be improved.

In addition, this invention can be implemented in various changes within the range which does not deviate from the summary.

Claims (2)

A repair means for opening a data line, the repair means being disposed in the same plane as the gate line, each of which is arranged in the form of lines on both sides of the data line without being in contact with the gate line, and overlapping with a portion of the data line. And a dummy gate pattern having at least two protrusions. The liquid crystal display of claim 1, wherein protrusions in the dummy gate patterns disposed at both sides of the data line are alternately overlapped with the data line.