KR20010070769A - LCD aging test apparatus - Google Patents

LCD aging test apparatus Download PDF

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Publication number
KR20010070769A
KR20010070769A KR1020010031592A KR20010031592A KR20010070769A KR 20010070769 A KR20010070769 A KR 20010070769A KR 1020010031592 A KR1020010031592 A KR 1020010031592A KR 20010031592 A KR20010031592 A KR 20010031592A KR 20010070769 A KR20010070769 A KR 20010070769A
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South Korea
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lcd
main body
pallet
opening
test
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KR1020010031592A
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Korean (ko)
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KR100486193B1 (en
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윤순광
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윤순광
오성엘에스티(주)
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    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65GTRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G49/00Conveying systems characterised by their application for specified purposes not otherwise provided for
    • B65G49/05Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
    • B65G49/06Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
    • B65G49/068Stacking or destacking devices; Means for preventing damage to stacked sheets, e.g. spaces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2893Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67748Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a single workpiece
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67751Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber vertical transfer of a single workpiece

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Liquid Crystal (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

PURPOSE: A thin film display aging test device is provided to increase the test efficiency and to effectively use the space by exchanging a liquid crystal display device one by one. CONSTITUTION: A plurality of liquid crystal display devices(2) are installed in a body(6). The temperature or humidity in the body(6) is adjusted by using a heater or a cooler. An opening(10) is formed at one side of the body(6) so as to input or output the liquid crystal display devices(2). A plurality of supporting members(18) are installed in the body(6) so as to arrange the liquid crystal display devices(2). An LCD conveying device(20) is installed in the body(6). The LCD conveying device(20) conveys the liquid crystal devices(2) to the supporting members(18), or conveys the liquid crystal devices(2) from the supporting members(18) to the exterior. The test of the liquid crystal devices(2) is carried out on the supporting members(18). After the test has been finished, the liquid crystal devices(2) are withdrawn through the opening(10) by the LCD conveying device(20).

Description

박막 디스플레이 에이징테스트 장치{LCD aging test apparatus}Thin-film display aging test apparatus {LCD aging test apparatus}

본 발명은 박막 디스플레이 즉, LCD 에이징테스트 장치에 관한 것으로서, 보다 상세하게는 LCD의 적재 및 인출이 용이하고, 공간을 효율적으로 활용할 수 있을 뿐 아니라, 테스트의 효율을 높일 수 있는 새로운 구조의 박막 디스플레이 에이징 테스트 장치에 관한 것이다.The present invention relates to a thin film display, that is, an LCD aging test apparatus, and more particularly, a thin film display having a new structure that can be easily loaded and taken out of an LCD, can efficiently use space, and can increase test efficiency. It relates to an aging test apparatus.

일반적으로, 박막 디스플레이, 즉, LCD는 내구성을 테스트하는 에이징테스트를 거쳐 출시된다. 이와같이 LCD의 내구성을 테스트하는 에이징테스트 장치는 본체의 내부에 히터나 쿨러 등이 구비되어, 내부의 온도와 습도 등을 조절할 수 있도록 된 것으로, 그 내부에 다수개의 LCD를 배치하여 구동시키면서 내부의 온도와 습도를 인위적으로 조절하여 극한상황을 연출하므로써, LCD의 내구성을 테스트할 수 있다.In general, thin-film displays, or LCDs, are released after aging tests to test their durability. As such, the aging test device for testing the durability of the LCD is provided with a heater or a cooler inside the main body so that the temperature and humidity can be adjusted. The inside temperature is driven by arranging and driving a plurality of LCDs therein. You can test the durability of your LCD by artificially adjusting the temperature and humidity to create extreme conditions.

이때, 상기 본체는 관찰창이 구비된 도어가 전면에 장착되며, 그 내부에는 LCD를 거치할 수 있는 다수개의 거치대가 구비되어, LCD를 수평면에서 대략 70°정도 새워진 상태로 배치할 수 있도록 구성된다. 또한, 본체에는 영상신호출력수단이 구비되어, 각 LCD를 이 영상신호출력수단에 연결하여 LCD를 구동시킬 수 있도록 구성된다.At this time, the main body is equipped with a door with an observation window is mounted on the front, the inside is provided with a plurality of holders for mounting the LCD, so that the LCD can be arranged in a state of about 70 ° leaked from the horizontal plane . In addition, the main body is provided with a video signal output means, and is configured to drive the LCD by connecting each LCD to the video signal output means.

따라서, 다수개의 LCD를 동시에 본체에 설치한 후, LCD를 상기 영상출력수단에 연결하여 구동시키면서, 상기 히터나 쿨러를 이용하여 본체 내부의 온도나 습도를 조절하여, 동시에 많은 수의 LCD를 테스트할 수 있다. 그리고, 테스트가 끝난 각각의 LCD는 별도의 후공정에서 다시한번 검사를 하여, 각 LCD의 이상유무를 확인하게 된다.Therefore, after installing a plurality of LCDs in the main body at the same time, while driving the LCD connected to the image output means, while controlling the temperature or humidity inside the main body using the heater or cooler, a large number of LCDs can be tested at the same time Can be. In addition, each tested LCD is checked once again in a separate post process to check whether each LCD is abnormal.

그런데, 이러한 에이징 테스트장치는 LCD를 대략 70°정도로 세워진 상태로 배치하게 되므로, LCD가 공간을 많이 차지하게 된다. 따라서, 테스트장치의 크기가 매우 커지는 문제점이 있었다. 또한, 이러한 에이징 테스트장치는 본체 전면의 도어를 통해 LCD를 설치하거나 꺼내게 되는데, 도어를 열 경우, 본체 내부의 온도나 습도가 달라지게 된다. 따라서, 일정한 온도와 습도를 유지하여야 하는 본체 내부의 테스트조건이 바뀌는 것을 방지하기 위하여, 한꺼번에 모든 LCD의 테스트를 동시에 진행하여, LCD를 테스트하는 도중에는 도어를 열 필요가 없도록 하고 있다. 그러나, 이와같이, 한꺼번에 LCD를 테스트하기 위해서는 동시에 많은 수의 LCD를 본체에 설치하여 테스트하고, 테스트가 끝난 많은 수의 LCD를 꺼내야 하기 때문에, LCD를 설치하고 꺼낼 때 집중적으로 작업인력이 필요하게 되므로, 인력을 효율적으로 활용하기 어려운 문제점이 있었다. 또한, LCD를 교체할 때는 테스트가 정지되므로, 테스트에 소요되는 시간이 길어져 생산성이 떨어지는 문제점이 있었다.However, since the aging test apparatus arranges the LCD upright at about 70 °, the LCD takes up a lot of space. Therefore, there is a problem that the size of the test apparatus is very large. In addition, the aging test apparatus is installed or taken out of the LCD through the door on the front of the main body, when the door is opened, the temperature or humidity inside the main body is changed. Therefore, in order to prevent the test conditions inside the main body from maintaining a constant temperature and humidity, all the LCDs are tested at the same time so that the doors do not need to be opened during the LCD test. However, in order to test the LCD at once, because a large number of LCDs must be installed and tested at the same time, and a large number of tested LCDs must be taken out, intensive workforce is required when installing and removing the LCDs. There was a problem that it was difficult to utilize manpower efficiently. In addition, since the test is stopped when replacing the LCD, the test takes a long time, there was a problem that the productivity is lowered.

특히, 테스트가 끝난 후 도어를 열면, 본체 내부의 온도와 습도가 변하게 되므로, LCD를 다시 설치하여 테스트를 재개하기 위해서는 전술한 히터나 쿨러를 이용하여 본체 내부의 온도와 습도를 테스트조건으로 다시 조성하여야 하므로, 테스트를 재개하는데 많은 시간이 소요되는 문제점이 있었다.In particular, when the door is opened after the test is finished, the temperature and humidity inside the main body change, so to re-install the LCD and restart the test, the temperature and humidity inside the main body are re-configured under the test condition using the heater or cooler described above. Because of this, there was a problem that it takes a long time to resume the test.

본 발명은 상기의 문제점을 해결하기 위한 것으로서, 본 발명의 목적은 LCD의 적재 및 인출이 용이하고, 공간을 효율적으로 활용할 수 있을 뿐 아니라, 테스트의 효율을 높일 수 있는 새로운 구조의 박막 디스플레이 에이징 테스트 장치를 제공하는 것이다.The present invention has been made to solve the above problems, and an object of the present invention is to facilitate the loading and withdrawal of the LCD, to effectively utilize the space, and to improve the test efficiency. To provide a device.

도 1은 본 발명에 따른 박막디스플레이 에이징테스트 장치의 투시도1 is a perspective view of a thin film display aging test apparatus according to the present invention

도 2는 도 1의 측단면 구성도Figure 2 is a side cross-sectional view of Figure 1

<도면의 주요부분에 대한 부호의 설명><Description of the symbols for the main parts of the drawings>

2. LCD 4. 팔레트2. LCD 4. Pallet

6. 본체 10. 개구부6. Body 10. Opening

18. 거치대 20. LCD이송수단18. Cradle 20. LCD Transfer Method

24. 영상신호출력수단 26. 잭24. Video signal output means 26. Jack

28. 접촉단자28. Contact terminal

본 발명에 따르면, 본체(6)의 내부에 다수개의 LCD(2)를 배치할 수 있도록 구성되어, 상기 본체(6)에 구비된 히터나 쿨러로 본체(6) 내부의 온도나 습도 등을 조절하여, LCD(2)의 내구성을 테스트할 수 있도록 된 에이징 테스트 장치에 있어서, 상기 본체(6)의 일측에는 LCD(2)를 투입 또는 배출하는 개구부(10)가 형성되고, 상기 본체(6)의 내부에는 LCD(2)를 배치할 수 있도록 된 다수의 거치대(18)와, 이 본체(6)의 내부에 장착되어 이송기구에 의해 이송되며 LCD이송수단(20)이 구비되며, 이 LCD이송수단(20)은 상기 개구부(10)로 투입된 LCD(2)를 이송하여 상기 거치대(18)에 배치하거나, 거치대(18)에 배치된 LCD(2)를 꺼내어 상기 개구부(10)로 배출할 수 있도록 구성되어, 상기 투입구로 투입된 LCD(2)를 거치대(18)에 배치하여 테스트를 실시하고, 테스트가 완료된 LCD(2)는 상기 개구부(10)로 배출할 수 있도록 된 것을 특징으로 하는 LCD 에이징 테스트 장치가 제공된다.According to the present invention, a plurality of LCDs 2 can be arranged inside the main body 6, and the temperature or humidity inside the main body 6 is controlled by a heater or a cooler provided in the main body 6. Thus, in the aging test apparatus that can test the durability of the LCD 2, an opening 10 for introducing or discharging the LCD 2 is formed on one side of the main body 6, the main body 6 In the interior of the plurality of cradle 18 to be arranged the LCD (2), and the inside of the main body 6 is mounted by the transfer mechanism and the LCD transfer means 20 is provided, this LCD transfer The means 20 may transfer the LCD 2 introduced into the opening 10 to be disposed on the holder 18 or to take out the LCD 2 disposed on the holder 18 and discharge the LCD 2 to the opening 10. It is configured to perform the test by placing the LCD (2) introduced into the inlet to the holder 18, the test is completed LCD (2) is the dog The LCD aging test wherein a to be discharged to the section 10 is provided.

본 발명의 다른 특징에 따르면, 상기 LCD(2)는 이 LCD(2)에 전기적으로 연결되는 잭(26)이 구비된 판형상의 팔레트(4)에 장착되어 본체(6)의 개구부(10)로 투입되고, 상기 LCD이송수단(20)은 이 팔레트(4)를 이송하여 상기 거치대(18)에 배치하도록 구성되며, 상기 본체(6)에는 영상신호를 출력하는 영상신호출력수단(24)이 구비되고, 상기 팔레트(4)와 거치대(18)의 인접부에는 상기 잭(26)과 영상신호출력수단(24)에 연결된 접촉단자(28)가 각각 구비되어, 상기 팔레트(4)를 거치대(18)에 배치하면 상기 접촉단자(28)가 상호 전기적으로 연결되어, 영상신호출력수단(24)의 영상신호를 LCD(2)에 전송하므로써, 상기 거치대(18)에 거치된 LCD(2)를 구동할 수 있도록 된 것을 특징으로 하는 LCD 에이징 테스트 장치가 제공된다.According to another feature of the invention, the LCD 2 is mounted on a plate-shaped pallet 4 with a jack 26 electrically connected to the LCD 2 to the opening 10 of the body 6. The LCD conveying means 20 is configured to convey the pallet 4 to be disposed on the holder 18, and the main body 6 is provided with an image signal output means 24 for outputting an image signal. In addition, a contact terminal 28 connected to the jack 26 and the video signal output means 24 is provided at an adjacent portion of the pallet 4 and the cradle 18, respectively. ), The contact terminals 28 are electrically connected to each other to transmit the video signals of the video signal output means 24 to the LCD 2, thereby driving the LCD 2 mounted on the cradle 18. An LCD aging test apparatus is provided, which is capable of being provided.

이하, 본 발명의 바람직한 실시예를 첨부한 도면에 의거하여 설명하면 다음과 같다.Hereinafter, preferred embodiments of the present invention will be described with reference to the accompanying drawings.

도 1내지 도 는 본 발명에 따른 LCD 에이징 테스트 장치를 도시한 것으로, 본체(6)의 내부에 다수개의 LCD(2)를 배치할 수 있도록 구성되어, 상기 본체(6)에 구비된 히터나 쿨러로 본체(6) 내부의 온도나 습도 등을 조절하여, LCD(2)의 내구성을 테스트할 수 있도록 된 것은 종래와 동일하다. 이때, 상기 LCD(2)는 판형상의 팔레트(4)에 장착한 상태로 테스트하게 되며, 하나의 팔레트(4)에는 대략 4개의 LCD(2)를 장착할 수 있도록 구성된다.1 to 1 illustrate an LCD aging test apparatus according to the present invention, and is configured to arrange a plurality of LCDs 2 inside a main body 6, and includes a heater or a cooler provided in the main body 6. The temperature and humidity inside the furnace body 6 are adjusted to test the durability of the LCD 2 as in the prior art. In this case, the LCD 2 is tested in a state of being mounted on a plate-shaped pallet 4, and one pallet 4 is configured to mount approximately four LCDs 2.

그리고, 상기 본체(6)는 대략 사각 박스형상으로 구성되며, 그 내부에 LCD(2)가 장착된 다수개의 팔레트(4)를 동시에 수납할 수 있는 수납부(8)가 형성된 것으로, 그 일측에는 개구부(10)가 형성되어, 이 개구부(10)를 통해 LCD(2)가 장착된 팔레트(4)를 투입하거나, 내부의 팔레트(4)를 외부로 배출할 수 있도록 구성된다. 이 개구부(10)는 수평방향으로 길게 형성되어, 상기 팔레트(4)를 눕힌 상태로 통과시킬 수 있도록 된 것으로, 그 전방에는 도어(12)가 승강가능하게 장착되어, 이 도어(12)를 승강시키므로써, 개구부(10)를 개폐할 수 있도록 구성된다. 또한, 이 개구부(10)의 전방에는 그 상면에 상기 팔레트(4)를 올려놓을 수 있도록 된 슬라이드패널(14)이 구비된다. 이 슬라이드패널(14)은 개구부(10)의 전방에 장착된 수평가이드(16)에 장착되며, 도시안된 구동장치에 의해 자동으로 전후 슬라이드되는 것으로, 전후진에 따라 상기 개구부(10)를 통해 본체(6)의 내측으로 출몰하여, 그 상면에 배치된 팔레트(4)를 본체(6)의 내부로 이송하는 기능을 한다. 그리고, 상기 슬라이드패널(14)에는 상기 팔레트(4)를 회동시켜 세울 수 있도록 된 스탠드기구가 구비된다. 따라서, 상기 팔레트(4)를 회동상승시켜 대략 70°정도로 세운 상태에서, 그 전면에 LCD(2)를 장착한 후, 이 스탠드기구로 팔레트(4)를 수평방향으로 눕히면, 상기 슬라이드패널(14)이 작동되어 본체(6)의 내부로 삽입되어, 팔레트(4)를 본체(6)의 내부로 이송하게 된다.In addition, the main body 6 is formed in a substantially rectangular box shape, and an accommodating part 8 for accommodating a plurality of pallets 4 on which the LCD 2 is mounted is formed therein, and at one side thereof. An opening 10 is formed, and through this opening 10, a pallet 4 on which the LCD 2 is mounted can be put or a pallet 4 inside can be discharged to the outside. The opening 10 is formed to be elongated in the horizontal direction so that the pallet 4 can be passed in a lying state, and the door 12 is mounted to be movable up and down, and the door 12 is lifted up and down. By doing so, the opening 10 can be opened and closed. In addition, in front of the opening 10, a slide panel 14 is provided on which the pallet 4 can be placed. The slide panel 14 is mounted to the horizontal guide 16 mounted in front of the opening 10, and is automatically slid back and forth by a driving device (not shown), the main body through the opening 10 in accordance with the forward and backward It penetrates inside of (6) and functions to convey the pallet 4 arrange | positioned at the upper surface inside the main body 6. As shown in FIG. In addition, the slide panel 14 is provided with a stand mechanism for rotating the pallet 4 to stand. Therefore, in the state where the pallet 4 is rotated and raised to about 70 °, the LCD 2 is mounted on the front surface thereof, and then the pallet 4 is laid down in the horizontal direction by the stand mechanism. ) Is operated to be inserted into the main body 6 to transport the pallet 4 into the main body 6.

그리고, 상기 본체(6)의 내부에는 상기 팔레트(4)를 배치할 수 있도록 된 다수의 거치대(18)와, 상기 팔레트(4)를 이송할 수 있도록 된 LCD이송수단(20)이 구비되어, 상기 개구부(10)로 투입된 팔레트(4)를 이송하여 상기 거치대(18)에 배치하거나, 거치대(18)에 배치된 팔레트(4)를 꺼내어 상기 개구부(10)로 배출할 수 있도록 구성되며,In addition, the inside of the main body 6 is provided with a plurality of cradles 18 for placing the pallet 4, and the LCD transfer means 20 for transferring the pallet (4), It is configured to transfer the pallet 4 introduced into the opening 10 to be disposed on the cradle 18 or to take out the pallet 4 disposed on the cradle 18 and to discharge it to the opening 10.

상기 거치대(18)는 본체(6)의 내부에 수평패널을 설치하여, 이 수평패널의상면에 상기 팔레트(4)를 눕힌 상태로 올려놓을 수 있도록 된 것으로, 각 거치대(18)는 상호 수직상하측에 위치되도록 수직방향으로 쌓여있는 형태로 설치된다. 상기 LCD이송수단(20)은 상기 본체(6)의 내부에 승강가능하게 장착되어 소정의 구동기구에 의해 승강되는 것으로, 그 일측에는 팔레트(4)를 파지하여 수평방향으로 이송할 수 있도록 된 암기구(22)가 구비된다. 또한, 이 LCD이송수단(20)은 도시안된 별도의 컨트롤러에 연결되어, 상기 개구부(10)로 투입된 팔레트(4)를 순서대로 상기 거치대(18)에 세팅하고, 테스트가 끝난 팔레트(4)는 꺼내서 순서대로 본체(6)의 외부로 배출하게 된다.The cradle 18 has a horizontal panel installed inside the main body 6 so that the pallet 4 can be placed on the upper surface of the horizontal panel in a lying state, and each cradle 18 is vertically up and down. It is installed in a form stacked in the vertical direction so as to be located on the side. The LCD transfer means 20 is mounted to the inside of the main body 6 to be lifted up and down by a predetermined drive mechanism, the arm on which one side is to hold the pallet 4 to be transported in the horizontal direction The instrument 22 is provided. In addition, the LCD transfer means 20 is connected to a separate controller (not shown) to set the pallet 4 introduced into the opening 10 in the holder 18 in order, and the tested pallet 4 is It is taken out and discharged out of the main body 6 in order.

따라서, 상기 슬라이드패널(14)에 의해 본체(6)의 내부로 팔레트(4)가 이송되면, 상기 암기구(22)를 이용하여 팔레트(4)를 파지한 상태로 승강되어, 팔레트(4)가 설치되지 않은 빈 거치대(18)에 팔레트(4)를 삽입하여 설치하고, 거치대(18)에 설치된 팔레트(4) 중에서 테스트가 완료된 팔레트(4)는 상기 암기구(22)로 꺼내어 상기 개구부(10)를 통해 본체(6)의 외부로 배출할 수 있다.Therefore, when the pallet 4 is conveyed to the inside of the main body 6 by the slide panel 14, the pallet 4 is raised and lowered by holding the pallet 4 using the arm mechanism 22, Is installed by inserting the pallet (4) into the empty holder 18 is not installed, the tested pallet of the pallet (4) installed in the holder 18 is taken out to the female mechanism 22 and the opening ( Through 10) it can be discharged to the outside of the main body (6).

또한, 상기 본체(6)에는 영상신호출력수단(24)이 구비되어, 이 영상신호출력수단(24)에서 출력되는 영상신호를 상기 거치대(18)에 설치된 팔레트(4)에 전송하여, LCD(2)를 구동할 수 있도록 구성된다. 즉, 상기 팔레트(4)에는 LCD(2)가 연결되는 4개의 잭(26)이 구비되며, 상기 팔레트(4)와 거치대(18)의 인접부에는 상기 잭(26)과 영상신호출력수단(24)에 연결된 접촉단자(28)가 각각 구비된다. 상기 잭(26)은 LCD(2)의 일측에 구비된 커넥터를 끼움결합할 수 있도록 구성되며, 상기 접촉단자(28)는 팔레트(4)와 거치대(18)의 인접면에 돌출형성되어, 팔레트(4)를 거치대(18)에 설치하면, 자동으로 접속되어, 잭(26)에 연결된 LCD(2)와 영상신호출력수단(24)을 상호 연결할 수 있도록 구성된다. 따라서, 상기 팔레트(4)를 거치대(18)에 설치하여 LCD(2)를 테스트하는 동안, LCD(2)를 구동하면서 테스트할 수 있다.In addition, the main body 6 is provided with a video signal output means 24, and transmits the video signal output from the video signal output means 24 to the pallet (4) installed in the holder 18, LCD ( 2) can be driven. That is, the pallet 4 is provided with four jacks 26 to which the LCD 2 is connected, and the jack 26 and the video signal output means are adjacent to the pallet 4 and the holder 18. Contact terminals 28 connected to 24 are provided respectively. The jack 26 is configured to fit the connector provided on one side of the LCD (2), the contact terminal 28 is protruded to the adjacent surface of the pallet 4 and the cradle 18, the pallet (4) is installed on the cradle 18, it is automatically connected, it is configured to interconnect the LCD 2 and the video signal output means 24 connected to the jack 26. Therefore, while testing the LCD 2 by installing the pallet 4 in the holder 18, it can be tested while driving the LCD (2).

이와같이 구성된 LCD 에이징 테스트장치의 작동을 설명하면 다음과 같다.The operation of the LCD aging test apparatus configured as described above is as follows.

우선, 상기 슬라이드패널(14)이 본체(6)의 외부로 돌출되고, 상기 스탠드기구에 의해 팔레트(4)가 세워진 상태에서, 작업자가 별도의 컨베이어에 의해 이송되는 LCD(2)를 상기 팔레트(4)의 잭(26)에 연결한 후 팔레트(4)를 눕히면, 상기 슬라이드패널(14)이 개구부(10)를 통해 본체(6)의 내부로 삽입되어, 팔레트(4)를 본체(6)의 내부로 공급하게 된다, 그리고, 상기 LCD이송수단(20)의 암기구(22)가 본체(6)의 내부로 공급된 팔레트(4)를 파지하여 승강되면서, 팔레트(4)가 설치되지 않은 비어있는 거치대(18)에, 팔레트(4)를 삽입하여 설치한다. 이때, 팔레트(4)와 거치대(18)의 접촉단자(28)가 자동적으로 상호 연결되어, 영상신호출력수단(24)에서 출력된 영상신호가 LCD(2)에 전달되므로, 테스트중간에 LCD(2)를 구동하게 된다. 그리고, 상기 LCD이송수단(20)이 테스트시간이 경과된 팔레트(4)를 거치대(18)에서 꺼내어 슬라이드패널(14)에 올려놓으면, 슬라이드패널(14)이 개구부(10)를 통해 외부로 돌출되어, 테스트가 완료된 팔레트(4)를 배출할 수 있다.First, in a state where the slide panel 14 protrudes out of the main body 6 and the pallet 4 is erected by the stand mechanism, the LCD 2, which is transported by a separate conveyor, is transported by the operator. When the pallet 4 is laid down after connecting to the jack 26 of 4), the slide panel 14 is inserted into the main body 6 through the opening 10, and the pallet 4 is inserted into the main body 6. And the arm mechanism 22 of the LCD transfer means 20 grasps the pallet 4 supplied to the inside of the main body 6, and ascends and raises the pallet 4 so that the pallet 4 is not installed. In the empty holder 18, the pallet 4 is inserted and installed. At this time, the contact terminal 28 of the pallet 4 and the holder 18 is automatically interconnected, and the image signal output from the image signal output means 24 is transmitted to the LCD 2, so that the LCD (in the middle of the test) 2) will be driven. Then, when the LCD transfer means 20 removes the pallet 4 having passed the test time from the holder 18 and places it on the slide panel 14, the slide panel 14 protrudes outward through the opening 10. Thus, the tested pallet 4 can be discharged.

이때, 상기 슬라이드패널(14)에는 상기 영상신호출력수단(24)에 연결되는 별도의 접촉단자가 더 구비되어, 이 슬라이드패널(14)에 팔레트(4)를 올려놓으면, 팔레트(4)에 구비된 접촉단자(28)가 슬라이드패널(14)의 접촉단자(28)에 접촉되도록구성된다. 따라서, 상기 슬라이드패널(14)에 놓여진 팔레트(4)에 영상출력신호의 영상신호를 전송하여, 팔레트(4)에 설치된 LCD(2)를 구동시키므로써, 테스트 전후에, LCD(2)의 상태를 작업자가 육안으로 점검할 수 있도록 구성된다.At this time, the slide panel 14 is further provided with a separate contact terminal connected to the video signal output means 24, if the pallet 4 is placed on the slide panel 14, it is provided on the pallet (4) The contact terminals 28 are configured to contact the contact terminals 28 of the slide panel 14. Thus, by transmitting the video signal of the video output signal to the pallet 4 placed on the slide panel 14 to drive the LCD 2 installed on the pallet 4, the state of the LCD 2 before and after the test. It is configured to allow the operator to visually inspect.

이와같이 구성된 LCD 에이징테스트 장치는 본체(6)의 일측에 형성된 개구부(10)를 통해 LCD(2)를 투입하고, 테스트가 끝난 LCD(2)만을 먼저 꺼내어 개구부(10)를 통해 외부로 배출할 수 있으므로, LCD(2)를 하나씩 계속적으로 교체하게 된다. 따라서, 테스트가 끝다면 본체(6) 내부에 설치된 LCD(2) 전체를 교체하여야 하는 종래의 테스트장치와 달리, LCD(2)를 교체하기 위해, 테스트를 정지시킬 필요가 없이 연속적인 테스트가 가능하므로, 테스트에 걸리는 시간을 줄일 수 있는 장점이 있다. 특히, 본체(6) 전면의 도어(12)를 개폐하여, LCD(2)를 교체할 때 내부의 온도나 습도가 달라지는 종래의 에이징 테스터와 달리, LCD(2)를 교체할 때 본체(6) 내부의 온도나 습도가 변하지 않으므로, 테스트에 걸리는 시간을 더욱 절감할 수 있는 장점이 있다. 또한, LCD(2)를 한번에 하나씩 교체하므로, 한명의 작업자만으로 교체작업을 할 수 있으므로, 인력을 줄일 수 있는 장점이 있다.The LCD aging test apparatus configured as described above may input the LCD 2 through the opening 10 formed at one side of the main body 6, and take out only the tested LCD 2 first and discharge it to the outside through the opening 10. Therefore, the LCD 2 is continuously replaced one by one. Therefore, unlike the conventional test apparatus, in which the entire LCD 2 installed inside the main body 6 needs to be replaced when the test is completed, in order to replace the LCD 2, continuous testing is possible without having to stop the test. Therefore, there is an advantage that can reduce the time taken for testing. In particular, unlike the conventional aging tester in which the internal temperature or humidity is changed when the LCD 2 is replaced by opening and closing the door 12 on the front of the main body 6, the main body 6 when the LCD 2 is replaced. Since the internal temperature or humidity does not change, the test time can be further reduced. In addition, since the LCD 2 is replaced one at a time, since only one worker can replace the work, there is an advantage that can reduce the manpower.

그리고, 상기 거치대(18)는 그 상면에 LCD(2)를 눕힌 상태로 적재하게 되므로, LCD(2)를 세워서 적재하는 종래의 에이징테스트 장치에 비해, 공간을 효율적으로 활용할 수 있는 장점이 있다.In addition, since the holder 18 is loaded with the LCD 2 lying on its upper surface, there is an advantage that the space can be efficiently used as compared to the conventional aging test apparatus in which the LCD 2 is placed upright.

이상에서와 같이 본 발명에 의하면, 본체(6)의 내부에 LCD(2)를 거치할 수있도록 된 거치대(18)와, LCD(2)를 이송하는 LCD이송수단(20)을 구비하여, LCD(2)를 하나씩 교체할 수 있도록 구성하므로써, LCD(2)의 적재 및 인출이 용이하고, 공간을 효율적으로 활용할 수 있을 뿐 아니라, 테스트의 효율을 높일 수 있는 새로운 구조의 박막 디스플레이 에이징 테스트 장치를 제공할 수 있다.According to the present invention as described above, the LCD having a holder 18 to mount the LCD (2) inside the main body 6, and the LCD transfer means 20 for transferring the LCD (2), LCD (2) can be replaced one by one, so that the LCD 2 can be easily loaded and unloaded, the space can be utilized efficiently, and a thin-film display aging test apparatus with a new structure that can improve the test efficiency is provided. Can provide.

Claims (2)

본체(6)의 내부에 다수개의 LCD(2)를 배치할 수 있도록 구성되어, 상기 본체(6)에 구비된 히터나 쿨러로 본체(6) 내부의 온도나 습도 등을 조절하여, LCD(2)의 내구성을 테스트할 수 있도록 된 에이징 테스트 장치에 있어서, 상기 본체(6)의 일측에는 LCD(2)를 투입 또는 배출하는 개구부(10)가 형성되고, 상기 본체(6)의 내부에는 LCD(2)를 배치할 수 있도록 된 다수의 거치대(18)와, 이 본체(6)의 내부에 장착되어 이송기구에 의해 이송되며 LCD이송수단(20)이 구비되며, 이 LCD이송수단(20)은 상기 개구부(10)로 투입된 LCD(2)를 이송하여 상기 거치대(18)에 배치하거나, 거치대(18)에 배치된 LCD(2)를 꺼내어 상기 개구부(10)로 배출할 수 있도록 구성되어, 상기 투입구로 투입된 LCD(2)를 거치대(18)에 배치하여 테스트를 실시하고, 테스트가 완료된 LCD(2)는 상기 개구부(10)로 배출할 수 있도록 된 것을 특징으로 하는 LCD 에이징 테스트 장치.It is configured to arrange a plurality of LCD (2) inside the main body 6, by adjusting the temperature or humidity inside the main body 6 with a heater or cooler provided in the main body 6, LCD (2) In the aging test apparatus that can test the durability of the), an opening 10 for inputting or discharging the LCD 2 is formed at one side of the main body 6, and the LCD (in the inside of the main body 6); 2) a plurality of cradle 18 to be arranged, and the inside of the main body 6 is mounted by the transfer mechanism and is provided by the LCD transfer means 20, the LCD transfer means 20 is provided It is configured to transfer the LCD 2 introduced into the opening 10 to be placed on the holder 18 or to take out the LCD 2 disposed on the holder 18 and to discharge it to the opening 10. The test is performed by placing the LCD 2, which is introduced as an input port, in the holder 18, and the LCD 2, which has been tested, is discharged to the opening 10. The LCD aging test wherein so. 제 1항에 있어서, 상기 LCD(2)는 이 LCD(2)에 전기적으로 연결되는 잭(26)이 구비된 판형상의 팔레트(4)에 장착되어 본체(6)의 개구부(10)로 투입되고, 상기 LCD이송수단(20)은 이 팔레트(4)를 이송하여 상기 거치대(18)에 배치하도록 구성되며, 상기 본체(6)에는 영상신호를 출력하는 영상신호출력수단(24)이 구비되고, 상기 팔레트(4)와 거치대(18)의 인접부에는 상기 잭(26)과 영상신호출력수단(24)에연결된 접촉단자(28)가 각각 구비되어, 상기 팔레트(4)를 거치대(18)에 배치하면 상기 접촉단자(28)가 상호 전기적으로 연결되어, 영상신호출력수단(24)의 영상신호를 LCD(2)에 전송하므로써, 상기 거치대(18)에 거치된 LCD(2)를 구동할 수 있도록 된 것을 특징으로 하는 LCD 에이징 테스트 장치.2. The LCD (2) according to claim 1, wherein the LCD (2) is mounted on a plate-shaped pallet (4) provided with a jack (26) electrically connected to the LCD (2) and fed into the opening (10) of the body (6). The LCD transfer means 20 is configured to transfer the pallet 4 to the holder 18, and the main body 6 is provided with an image signal output means 24 for outputting an image signal. Adjacent portions of the pallet 4 and the cradle 18 are provided with contact terminals 28 connected to the jack 26 and the video signal output means 24, respectively. When arranged, the contact terminals 28 are electrically connected to each other, and the LCD 2 mounted on the cradle 18 can be driven by transmitting the image signal of the image signal output means 24 to the LCD 2. LCD aging test apparatus, characterized in that.
KR10-2001-0031592A 2001-06-07 2001-06-07 LCD aging test apparatus KR100486193B1 (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20040045173A (en) * 2002-11-22 2004-06-01 갈란트 프리시젼 머시닝 캄파니, 리미티드 Inspection system with alternation pallets
WO2007014493A1 (en) * 2005-08-04 2007-02-08 Fujen Hsiao Aging room used for the last assembling process of lcd panel modules
DE102006023968B4 (en) * 2005-12-29 2009-12-10 Lg Display Co., Ltd. Inspection device for liquid crystal display panel

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JPH05218158A (en) * 1992-01-31 1993-08-27 Nec Corp Lcd aging device
KR100210235B1 (en) * 1996-09-03 1999-07-15 윤순광 Aging tester for lcd
KR19980023666A (en) * 1996-09-30 1998-07-06 양재신 Aging device for plasma display panel
KR200151055Y1 (en) * 1996-11-06 1999-07-15 윤종용 Lcd module edging device
JPH10160629A (en) * 1996-11-29 1998-06-19 Micronics Japan Co Ltd Inspection system for liquid crystal panel
JP3379911B2 (en) * 1998-06-26 2003-02-24 エスペック株式会社 High temperature visual inspection equipment
KR100324614B1 (en) * 1999-09-28 2002-02-27 류규열 Aging Device for Liquid Crystal Display Element

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20040045173A (en) * 2002-11-22 2004-06-01 갈란트 프리시젼 머시닝 캄파니, 리미티드 Inspection system with alternation pallets
WO2007014493A1 (en) * 2005-08-04 2007-02-08 Fujen Hsiao Aging room used for the last assembling process of lcd panel modules
DE102006023968B4 (en) * 2005-12-29 2009-12-10 Lg Display Co., Ltd. Inspection device for liquid crystal display panel
US7777828B2 (en) 2005-12-29 2010-08-17 Lg Display Co., Ltd. Inspection apparatus for liquid crystal display panels

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