KR20000036440A - Method for forming a electric region by the three dimentional ion implantation - Google Patents

Method for forming a electric region by the three dimentional ion implantation Download PDF

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Publication number
KR20000036440A
KR20000036440A KR1020000012852A KR20000012852A KR20000036440A KR 20000036440 A KR20000036440 A KR 20000036440A KR 1020000012852 A KR1020000012852 A KR 1020000012852A KR 20000012852 A KR20000012852 A KR 20000012852A KR 20000036440 A KR20000036440 A KR 20000036440A
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South Korea
Prior art keywords
ion implantation
forming
conductive region
lcd
semiconductor
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KR1020000012852A
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Korean (ko)
Inventor
김진철
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이준상
주식회사 에폰
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Priority to KR1020000012852A priority Critical patent/KR20000036440A/en
Priority to TW89110221A priority patent/TW463243B/en
Priority to SG200003148A priority patent/SG98406A1/en
Priority to JP2000170042A priority patent/JP3351779B2/en
Publication of KR20000036440A publication Critical patent/KR20000036440A/en
Priority to CN 00124374 priority patent/CN1232676C/en
Priority to KR20010012069A priority patent/KR100415013B1/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/26Bombardment with radiation
    • H01L21/263Bombardment with radiation with high-energy radiation
    • H01L21/265Bombardment with radiation with high-energy radiation producing ion implantation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32412Plasma immersion ion implantation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/67207Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
    • H01L21/67213Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process comprising at least one ion or electron beam chamber

Abstract

PURPOSE: A method for forming a conductive area by a three-dimensional ion implantation by forming a conductive area on a target such as a moving device or film formed by a highly polymerized compound by a three-dimensional ion implantation is provided. CONSTITUTION: In a method for forming a conductive area by a three-dimensional ion implantation, an accelerated ion is three-dimensionally implanted on a surface of a target formed by a highly polymerized compound to form a conductive area thereon. The ion is implanted in a cool plasma state. Any one of a transparent polymer, a general polymer, an engineering plastic, a functional compound plastic obtained by adding an addition such as a filler to the general polymer and engineering plastic is used for the highly polymerized compound. The target includes an LCD module conveying box, a chip tray, a tape for a semiconductor carrier, a semiconductor wafer conveying carrier, a printed circuit board conveying box, an LCD, an LCD thin film, a sheet, and a semiconductor conveying socket.

Description

3차원적인 이온주입에 의한 도전영역 형성방법{Method for forming a electric region by the three dimentional ion implantation}Method for forming a electric region by the three dimentional ion implantation}

본 발명은 이온주입에 의한 도전영역 형성방법에 관한 것으로써, 보다 상세하게는 고분자 화합물로 제작된 대상물 표면에 3차원적인 이온주입공정에 의해서 도전영역을 형성하는 이온주입에 의한 도전영역 형성방법에 관한 것이다.The present invention relates to a method for forming a conductive region by ion implantation, and more particularly, to a method for forming a conductive region by ion implantation in which a conductive region is formed on a surface of an object made of a polymer compound by a three-dimensional ion implantation process. It is about.

통상, 고집적회로가 형성된 전자소자, 반도체소자 등은 이송과정에 정전기에 치명적인 손상을 받게 됨으로써 이를 이송하는 이송도구는 정전기 발생이 억제되도록 전도성이 가미된 고분자 화합물로써 제작하고 있다. 여기서 상기 이송도구는 CSP타입 반도체 캐리어 테이프(Chip scale package type Semiconductor carrier tape), 반도체 웨이퍼 이송용 캐리어, 인쇄회로기판 운반상자, 전자모듈제품 운반상자, LCD(Lipuid Crystal Display)와 LCD박막필름 및 LCD모듈 운반상자, 전자소자 및 반도체소자 포장용기, 트레이(Tray) 등이 있다.In general, electronic devices, semiconductor devices, etc., in which a highly integrated circuit is formed, are subject to fatal damage to static electricity during the transfer process, and thus the transfer tool for transferring them is manufactured as a polymer compound having conductivity added to suppress static electricity generation. Wherein the transfer tool is a CSP type semiconductor carrier tape (Chip scale package type Semiconductor carrier tape), semiconductor wafer transfer carrier, printed circuit board transport box, electronic module product transport box, LCD (Lipuid Crystal Display) and LCD thin film and LCD Module transport boxes, electronic and semiconductor device packaging containers, trays (Tray) and the like.

또한, 고유의 기능을 유지하도록 전자파에 의한 영향이 배제되어야 하는 필름, 시트, 판재, 진공성형물 및 플라스틱 사출물 등도 전도성이 가미된 고분자 화합물로서 제작하고 있다.In addition, films, sheets, plates, vacuum moldings, and plastic injection moldings, which should be excluded from the effects of electromagnetic waves to maintain their inherent function, are also manufactured as polymer compounds with added conductivity.

종래의 전자소자 및 반도체소자의 이송도구와 시트, 판재, 진공성형물 및 플라스틱 사출물 등은 이송의 편의성을 위해서 하중이 가볍고 성형이 간편한 투명한 수지계통의 고분자 화합물에 전도성을 가미하기 위하여 전량 수입되는 고가의 카본(Cabon) 및 카본화이버(Carbon fiber) 등을 혼합하여 압축성형함으로써 제작된다. 상기 고분자 화합물은 정전기를 발생시키는 물질이므로 고분자 화합물로만 이송도구를 제작하게 되면 이송제품이 정전기에 의해서 치명적인 영향을 받을 수 있다. 그리고, 상기 카본 및 카본화이버 등의 혼합에 의해서 이송도구의 하중은 무거워지고 그 재질은 불투명해진다.The transfer tools, sheets, plates, vacuum moldings, and plastic injection moldings of conventional electronic devices and semiconductor devices are all imported to add conductivity to the transparent resin-based polymer compound that is light in weight and easy to mold for convenience of transportation. It is manufactured by compression molding by mixing carbon (carbon) and carbon fiber (carbon fiber). Since the polymer compound is a material generating static electricity, if the transport tool is manufactured only with the polymer compound, the transport product may be fatally affected by the static electricity. In addition, the weight of the transfer tool becomes heavy and the material becomes opaque by mixing the carbon and carbon fiber.

또한, 전자파에 의한 영향이 배제되어야 하는 필름 등은 그 상부에 전도성 물질을 증착하여 도전막을 형성함으로써 이루어진다.In addition, a film or the like, to which the influence of electromagnetic waves is to be excluded, is formed by depositing a conductive material thereon to form a conductive film.

그런데, 상기 카본 및 카본화이버 등이 혼합된 이송도구는 카본이 혼합됨으로써 전체 하중이 무거워 물류 운송비용이 높은 문제점이 있었다.However, the transporting tool in which the carbon and the carbon fiber are mixed has a problem in that the overall load is heavy because the carbon is mixed and the logistics transportation cost is high.

그리고, 카본 및 카본화이버 등이 혼합됨으로써 고분자 화합물이 불투명해져 이송도구에 적재된 제품 표면에 기재된 그 제품의 규격, 형상, 특성 등이 기재되어 있는 부분이 보이지 않으므로 하부만 전도성 불투명 재료로 사용하고 상부는 비전도성인 일반 투명 재료를 사용하고 있어 이송제품이 정전기에 의해 손상을 받을 우려가 상존하고 있다.In addition, since the polymer compound is opaque due to the mixing of carbon and carbon fiber, the part of the specification, shape, characteristics, etc. of the product described on the surface of the product loaded on the conveying tool is not visible. Only the lower part is used as the conductive opaque material. The company uses non-conductive ordinary transparent materials, and there is a concern that the transported products may be damaged by static electricity.

그리고, 고분자 화합물에 카본 및 카본화이버 등을 혼합하여 전도성을 가미함으로써 카본 및 카본화이버 등의 혼합비율이 이송도구의 부위별로 상이하여 특정부위와 다른 특정부위의 전도성이 상이함으로써 이송도구에 가미된 전도성에 의해서 이송도구에 적재된 제품이 오히려 치명적인 정전기를 받는 문제점이 있었다.In addition, by adding carbon and carbon fiber to the polymer compound to add conductivity, the mixing ratio of carbon and carbon fiber is different for each part of the transfer tool, and thus the conductivity added to the transfer tool is different. There was a problem that the product loaded on the transfer tool is rather lethal static electricity.

또한, 현재 국내에서 전량 수입에 의존하는 고가의 카본 및 카본화이버 등을 이용하여 전도성을 가미함으로써 이송도구 제작비용이 비싼 문제점이 있었다.In addition, there is a problem that the production cost of the transfer tool is expensive by adding conductivity using expensive carbon and carbon fiber, etc., which depend on the total amount of imports in Korea.

그리고, 카본 및 카본화이버 등이 혼합된 이송도구는 카본 및 카본화이버 등의 혼합에 따라 용이하게 재활용할 수 없었고, 종래의 이송도구는 카본 및 카본화이버 등이 혼합됨으로써 사용 과정에 다량의 파티클을 발생시켜 이송제품을 오염시키는 문제점이 있었다.In addition, the transfer tool mixed with carbon and carbon fiber, etc. could not be easily recycled according to the mixing of carbon and carbon fiber, and the conventional transfer tool generates a large amount of particles in the use process by mixing carbon and carbon fiber. There was a problem to contaminate the transport product.

또한, 증착에 의해서 도전막이 형성된 필름 등의 증착품은 원재료에 전도성 물질을 증착함으로써 필름의 계면과 도전막 사이의 접착력 저하에 의해서 도전막이 벗겨지고, 증착 물질의 화학반응으로 그 표면이 화학적으로 변성되는 문제점이 있었다.In addition, in a vapor-deposited product such as a film in which a conductive film is formed by vapor deposition, the conductive film is peeled off by lowering the adhesion between the interface of the film and the conductive film by depositing a conductive material on the raw material, and the surface is chemically modified by chemical reaction of the deposition material. There was a problem.

본 발명의 목적은, 고분자 화합물로 제작된 이송도구, 필름 등의 대상물에 3차원적인 이온주입공정을 수행하여 도전영역을 형성함으로써 대상물의 하중을 종래보다 한층 경량화할 수 있는 3차원적인 이온주입에 의한 도전영역 형성방법을 제공하는 데 있다.It is an object of the present invention to form a conductive region by performing a three-dimensional ion implantation process on an object such as a transfer tool and a film made of a polymer compound, thereby reducing the load of the object to a three-dimensional ion implantation, which can be lighter than conventional. The present invention provides a method for forming a conductive region.

본 발명의 다른 목적은, 고분자 화합물로 제작된 이송도구, 필름 등의 대상물에 3차원적인 이온주입공정을 수행하여 도전영역을 형성함으로써 대상물이 고유의 투명성을 유지할 수 있도록 하는 3차원적인 이온주입에 의한 도전영역 형성방법을 제공하는 데 있다.Another object of the present invention is to form a conductive region by performing a three-dimensional ion implantation process on an object such as a transfer tool, a film made of a high molecular compound to the three-dimensional ion implantation to maintain the inherent transparency of the object The present invention provides a method for forming a conductive region.

본 발명의 또 다른 목적은, 고분자 화합물로 제작된 이송도구, 필름 등의 대상물에 3차원적인 이온주입공정을 수행함으로써 대상물 표면에 전체적으로 균일한 도전영역을 형성할 수 있는 3차원적인 이온주입에 의한 도전영역 형성방법을 제공하는 데 있다.It is still another object of the present invention to provide a uniform conductive region on the surface of an object by performing a three-dimensional ion implantation process on an object such as a transfer tool or a film made of a polymer compound. It is to provide a method for forming a conductive region.

본 발명의 또 다른 목적은, 고분자 화합물로 제작된 이송도구, 필름 등의 대상물에 3차원적인 이온주입공정을 수행하여 도전영역을 형성함으로써 대상물 표면에 증착된 도전막이 벗겨지고, 그 성질이 변성되는 종래의 문제점을 해결할 수 있는 3차원적인 이온주입에 의한 도전영역 형성방법을 제공하는 데 있다.It is still another object of the present invention to form a conductive region by performing a three-dimensional ion implantation process on an object such as a transfer tool or a film made of a polymer compound, thereby removing the conductive film deposited on the surface of the object and modifying its properties. It is to provide a method for forming a conductive region by three-dimensional ion implantation that can solve the conventional problems.

본 발명의 또 다른 목적은, 고분자 화합물로 제작된 이송도구, 필름 등의 대상물에 단일 공정으로써 간편하게 3차원적으로 도전영역을 형성할 수 있는 3차원적인 이온주입에 의한 도전영역 형성방법을 제공하는 데 있다.Still another object of the present invention is to provide a method for forming a conductive region by three-dimensional ion implantation, which can easily form a three-dimensional conductive region in a single process on an object such as a transfer tool or a film made of a polymer compound. There is.

도1은 본 발명에 따른 3차원적인 플라즈마 이온주입에 의해서 도전영역을 형성하는 방법을 설명하기 위한 이온주입장치의 개략도이다.1 is a schematic diagram of an ion implantation apparatus for explaining a method of forming a conductive region by three-dimensional plasma ion implantation according to the present invention.

도2는 도1에 도시된 내부챔버와 외부챔버의 사시도이다.2 is a perspective view of the inner chamber and the outer chamber shown in FIG.

도3은 본 발명에 따른 3차원적인 플라즈마 이온주입에 의해서 LCD모듈 운반상자 표면에 도전영역을 형성하는 방법의 일 실시예를 설명하기 위한 공정도이다.3 is a process diagram illustrating an embodiment of a method for forming a conductive region on the surface of an LCD module carrying box by three-dimensional plasma ion implantation according to the present invention.

도4는 본 발명에 따라 LCD모듈 운반상자에 3차원적인 플라즈마 이온주입공정을 수행함으로서 나타나는 LCD모듈 운반상자 표면 분자사슬의 변화를 설명하기 위한 도면이다.4 is a view for explaining the change in the molecular chain surface of the LCD module carrying box appearing by performing a three-dimensional plasma ion implantation process to the LCD module carrying box according to the present invention.

※도면의 주요부분에 대한 부호의 설명※ Explanation of symbols for main parts of drawing

2 : 로딩부 4 : LCD모듈 운반상자2: Loading unit 4: LCD module carrying box

6 : 제 1 예비챔버 8 : 제 1 저진공펌프6: first preliminary chamber 8: first low vacuum pump

10, 32 : 게이트밸브 11 : 공정챔버10, 32: gate valve 11: process chamber

12 : 외부챔버 14 : 내부챔버12: outer chamber 14: inner chamber

15 : 유통홀 16 : 고진공펌프15: distribution hole 16: high vacuum pump

20 : 가스공급원 22 : 이온건20 gas supply source 22 ion gun

26 : 홀더 28 : 전원26: holder 28: power

30 : 제 2 예비챔버 34 : 제 2 저진공펌프30: second prechamber 34: second low vacuum pump

상기 목적을 달성하기 위한 본 발명에 따른 3차원적인 이온주입에 의한 도전영역 형성방법은, 고분자 화합물로 제작된 대상물 표면에 가속된 이온을 3차원적으로 주입함으로써 도전영역을 형성하는 것을 특징으로 한다.The method for forming a conductive region by three-dimensional ion implantation according to the present invention for achieving the above object is characterized in that the conductive region is formed by three-dimensionally injecting accelerated ions to the surface of the object made of a polymer compound .

상기 이온을 냉플라즈마상태에서 주입할 수 있다.The ion can be implanted in a cold plasma state.

그리고, 상기 고분자 화합물로 투명성 폴리머, 범용 폴리머, 엔지니어링 플라스틱, 상기 범용 폴리머 및 엔지니어링 플라스틱에 휠러 등의 첨가물을 첨가하여 기능성을 부여한 기능성 컴파운드 플라스틱 중에서 어느 하나를 사용할 수 있다.As the polymer compound, any one of a functional compound plastic having added functionality such as a transparent polymer, a general purpose polymer, an engineering plastic, and an additive such as wheeler to the general purpose polymer and the engineering plastic may be added.

또한, 상기 대상물은 LCD모듈 운반상자, 칩트레이, 반도체 캐리어용 테이프, 반도체 웨이퍼 이송용 캐리어, 인쇄회로기판 운반상자, 전자모듈제품 운반상자, LCD, LCD박막필름, 시트 및 반도체 운반용 소켓 중에서 어느 하나일 수 있다.In addition, the object is any one of the LCD module transport box, chip tray, semiconductor carrier tape, semiconductor wafer transport carrier, printed circuit board transport box, electronic module product transport box, LCD, LCD thin film, sheet and socket for semiconductor transport Can be.

이하, 본 발명의 구체적인 실시예를 첨부한 도면을 참조하여 상세히 설명한다.Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

도1은 본 발명에 따른 플라즈마 이온주입에 의해서 LCD모듈 운반상자 표면에 도전영역을 형성하는 방법을 설명하기 위한 장치의 개략도이고, 도2는 도1에 도시된 내부챔버와 외부챔버의 사시도이다.1 is a schematic diagram of an apparatus for explaining a method for forming a conductive region on a surface of an LCD module carrying box by plasma ion implantation according to the present invention, and FIG. 2 is a perspective view of an inner chamber and an outer chamber shown in FIG.

본 발명에 따른 플라즈마 이온주입에 의해 LCD모듈 운반상자 즉, 대상물에 도전영역을 형성하는 장치는 파티클(Particle)의 개수가 제한되는 클린룸(Clean room) 내부에 설치되며 도1에 도시된 바와 같이, 고분자 화합물로 제작된 LCD모듈 운반상자(4)가 순차적으로 적재된 로딩부(2)를 구비한다. 상기 고분자 화합물로 투명성 폴리머, PE(Polyethylene), PP (Polypropylene), HIPS(High-Impact-Polystyrene), ABS(Acrylonitrile-Butadiene -Styrene) 등의 범용 폴리머, PC(Polycarbonate), N6(Nylon6), N66(Nylon66), MPPO(Modified Polypenylene Oxide), PSU(Polysulfon), PES(Polyethersulfon) , PEEK(Polyether-etherketone) 등의 엔지니어링 플라스틱 및 상기 범용 폴리머 또는 엔지니어링 플라스틱에 기능성을 부여하기 위한 휠러(Filler) 등을 혼합한 기능성 컴파운드 플라스틱 등을 사용할 수 있다.An apparatus for forming a conductive area in an LCD module transport box, that is, an object by plasma ion implantation according to the present invention is installed in a clean room in which the number of particles is limited, as shown in FIG. 1. , LCD module carrying box (4) made of a polymer compound is provided with a loading unit (2) sequentially loaded. As the polymer compound, general-purpose polymers such as transparent polymer, polyethylene (PE), polypropylene (PP), high-impact-polystyrene (HIPS), and acrylonitrile-butadiene-styrene (ABS), polycarbonate (PC), N6 (Nylon 6), and N66 (Nylon66), Modified Polypenylene Oxide (MPPO), Polysulfon (PSU), Polyethersulfon (PES), Polyether-etherketone (PEEK), and a wheeler for imparting functionality to the general-purpose polymer or engineering plastic. Mixed functional compound plastics and the like can be used.

또한, 로딩부(2)의 LCD모듈 운반상자(4)가 이송수단에 의해서 투입되어 공정진행을 위해 소정시간 대기하는 제 1 예비챔버(6)를 구비한다. 상기 제 1 예비챔버(6)는 제 1 저진공펌프(8)의 펌핑에 의해서 10-4Torr정도의 내부압력을 유지한다.In addition, the LCD module carrying box 4 of the loading unit 2 is provided by the transfer means and has a first preliminary chamber 6 waiting for a predetermined time for process progress. The first preliminary chamber 6 maintains an internal pressure of about 10 −4 Torr by pumping the first low vacuum pump 8.

그리고, 상기 제 1 예비챔버(6)와 냉플라즈마상태에서 이온주입공정이 진행되는 공정챔버(11)가 게이트밸브(10)를 사이에 두고 서로 연결되어 있다. 상기 공정챔버(11)는 도2에 도시된 바와 같이 원통형상의 외부챔버(12)와 이에 수용된 내부챔버(14)로 이루어진다. 여기서, 상기 내부챔버(14) 표면에는 복수의 유통홀(15)이 형성되어 있고, 그 내부에는 제 1 예비챔버(6)에서 투입된 LCD모듈 운반상자(4)의 양끝 단부를 잡아 90。회전할 수 있는 홀더(Holder : 26)가 구비되어 있다.In addition, the first preliminary chamber 6 and the process chamber 11 in which the ion implantation process is performed in the cold plasma state are connected to each other with the gate valve 10 interposed therebetween. The process chamber 11 is composed of a cylindrical outer chamber 12 and an inner chamber 14 accommodated therein as shown in FIG. Here, a plurality of distribution holes 15 are formed on the surface of the inner chamber 14, and both ends of the LCD module carrying box 4 inserted from the first preliminary chamber 6 are rotated by 90 ° in the interior chamber 14. Holder 26 is provided.

또한, 상기 공정챔버(11)의 외부챔버(12)에는 외부챔버(12)와 내부챔버(14) 사이의 이격공간의 내부압력을 10-6Torr정도로 형성할 수 있는 고진공펌프 (16)가 연결되어 있다.In addition, the outer chamber 12 of the process chamber 11 is connected to a high vacuum pump 16 that can form an internal pressure of about 10 -6 Torr in the separation space between the outer chamber 12 and the inner chamber 14. It is.

그리고, 공정챔버(11)의 외부챔버(12) 일측에는 질소가스, 아르곤가스, 헬륨가스, 수소가스 등의 반응가스를 외부챔버(12)와 내부챔버(14) 사이의 이격공간으로 공급할 수 있는 가스공급원(20)이 연결되어 있고, 상기 공정챔버 (11)의 외부챔버(12) 다른 일측에는 질소가스, 아르곤가스, 헬륨가스, 수소가스 등에 의해서 발생된 이온을 역시 외부챔버(12)와 내부챔버(14) 사이의 이격공간으로 공급할 수 있는 이온건(22)이 연결되어 있다.In addition, one side of the outer chamber 12 of the process chamber 11 may supply a reaction gas such as nitrogen gas, argon gas, helium gas, and hydrogen gas into a space between the outer chamber 12 and the inner chamber 14. A gas supply source 20 is connected, and ions generated by nitrogen gas, argon gas, helium gas, hydrogen gas, etc., on the other side of the outer chamber 12 of the process chamber 11 are also internal to the outer chamber 12. An ion gun 22 that can be supplied to the spaced space between the chambers 14 is connected.

또한, 공정챔버(11)의 외부챔버(12)에는 펄스제너레이터(Pulse generator : 도시되지 않음)에 의해서 조절된 고주파전력을 인가할 수 있는 전원(28)이 연결되어 있고, 상기 외부챔버(12) 및 내부챔버(14)는 동일지점에 접지되어 있다.In addition, the external chamber 12 of the process chamber 11 is connected to a power source 28 capable of applying high frequency power controlled by a pulse generator (not shown), and the external chamber 12. And the inner chamber 14 are grounded at the same point.

그리고, 공정챔버(11)와 제 2 예비챔버(30)가 게이트밸브(32)를 사이에 두고 서로 연결되어 있다. 상기 제 2 예비챔버(30)는 제 2 저진공펌프(34)의 펌핑에 의해서 10-4Torr정도의 내부압력을 유지한다.The process chamber 11 and the second preliminary chamber 30 are connected to each other with the gate valve 32 interposed therebetween. The second prechamber 30 maintains an internal pressure of about 10 −4 Torr by pumping the second low vacuum pump 34.

이하, 전술한 구조로 이루어지는 플라즈마 이온주입설비를 이용하여 LCD모듈 운반상자에 도전영역을 형성하는 방법을 도3을 참조하여 상세히 설명한다.Hereinafter, a method of forming a conductive region in the LCD module carrying box using the plasma ion implantation device having the above-described structure will be described in detail with reference to FIG. 3.

본 발명에 따른 3차원적인 플라즈마 이온주입에 의한 도전영역을 형성하는 방법은 S2단계에서 공정챔버(11)의 내부챔버(14)에 도전영역 형성 대상물인 LCD모듈 운반상자(4)를 투입하는 것으로 시작된다. 상기 LCD모듈 운반상자 (4)의 투입은 이송수단에 의해서 로딩부(2)에서 제 1 저진공펌프(8)에 의해서 10-4Torr정도의 내부압력을 유지하고 있는 제 1 예비챔버(6)로 이송된 후, 다시 이송수단에 의해서 게이트밸브(10)를 통해서 내부챔버(14)로 이송됨으로 이루어진다. 이때, 공정챔버(11)는 고진공펌프(16)에 의해서 10-6Torr정도의 내부압력을 유지하게 된다.The method of forming the conductive region by the three-dimensional plasma ion implantation according to the present invention is to put the LCD module carrying box 4 which is the conductive region forming target to the inner chamber 14 of the process chamber 11 in step S2. Begins. The input of the LCD module carrying box (4) is the first preliminary chamber (6) which maintains an internal pressure of about 10 -4 Torr by the first low vacuum pump (8) in the loading section (2) by a conveying means. After being transferred to, it is made to be transferred to the inner chamber 14 through the gate valve 10 again by the transfer means. At this time, the process chamber 11 maintains an internal pressure of about 10 −6 Torr by the high vacuum pump 16.

이어서, S4단계에서 가스공급원(20)은 외부챔버(12)와 내부챔버(14)의 이격공간 내부로 반응가스를 공급하고, 전원(28)에서는 펄스제너레이터에 의해서 조절된 특정 전류, 전압, 및 주파수 등을 가진 고주파전력을 외부챔버 (12)에 인가하여 외부챔버(12)와 내부챔버(14) 사이의 이격공간에 자기장을 형성함에 따라 반응가스는 자기장에 의해서 에너지를 받아 냉플라즈마(Cold plasma) 상태로 전환된다.Subsequently, in step S4, the gas supply source 20 supplies the reaction gas into the separation space between the outer chamber 12 and the inner chamber 14, and in the power supply 28, a specific current, voltage, and As a high-frequency power having a frequency or the like is applied to the outer chamber 12 to form a magnetic field in the space between the outer chamber 12 and the inner chamber 14, the reaction gas receives energy by the magnetic field and cold plasma. ) Is switched to the state.

다음으로, S6단계에서 이온건(22)은 질소가스, 아르곤가스, 헬륨가스, 수소가스 등에 의해서 발생된 이온을 외부챔버(12)와 내부챔버(14) 사이의 이격공간에 공급한다.Next, in step S6, the ion gun 22 supplies ions generated by nitrogen gas, argon gas, helium gas, hydrogen gas, and the like to the spaced space between the outer chamber 12 and the inner chamber 14.

계속해서, S8단계에서는 S6단계에서 외부챔버(12)와 내부챔버(14) 사이로 가속되어 공급된 이온이 냉플라즈마 상태에서 내부챔버(14)의 유통홀(15)을 통해서 내부챔버(14) 내부로 공급되어 LCD모듈 운반상자(4)의 전표면에 3차원적으로 1차 이온주입되어 도전영역을 형성한다. 상기 1차 이온주입공정을 진행함에 있어서 이온에너지는 30 KeV 내지 2 GeV이며, 상기 이온은 수백 Å 내지 수 ㎛의 두께로 10E4 Ω/Square 내지 10E13 Ω/Square의 영역에서 표면저항을 예를 들면 10E8 Ω/Square 내지 10E9 Ω/Square와 같이 정밀하게 제어되어 주입되며, 이온 도즈량은 1 ×102ions/㎠ 내지 5 ×1020ions/㎠ 이상도 가능하다.Subsequently, in step S8, the ions accelerated and supplied between the outer chamber 12 and the inner chamber 14 in step S6 are internally formed through the distribution hole 15 of the inner chamber 14 in a cold plasma state. It is supplied to the primary ion implantation three-dimensionally to the entire surface of the LCD module carrying box (4) to form a conductive area. In the first ion implantation process, the ion energy is 30 KeV to 2 GeV, and the ion has a surface resistance in the range of 10E4 Ω / Square to 10E13 Ω / Square with a thickness of several hundreds of micrometers to several micrometers, for example, 10E8. It is precisely controlled and injected, such as Ω / Square to 10E9 Ω / Square, and the ion dose may be 1 × 10 2 ions / cm 2 to 5 × 10 20 ions / cm 2 or more.

다음으로, S10단계에서 LCD모듈 운반상자(4)를 홀더(26)를 이용하여 90。회전한다.Next, in step S10 to rotate the LCD module carrying box 4 by 90 ° using the holder (26).

이어서, S12단계에서 다시 LCD모듈 운반상자(4)의 전표면에 3차원적으로 이온을 주입하는 2차 이온주입공정을 수행하여 다시 도전영역을 강화한다. 상기 S12단계는 생략할 수 있으나 상기 1차 이온주입에 의해서 LCD모듈 운반상자(4)의 일부 표면에 이온주입량이 일정하지 않을 수 있으므로 다시 대상물을 회전시켜 이온주입공정을 수행함으로써 LCD모듈 운반상자(4)의 전표면에 이온주입량이 균일하도록 한다. 이때, LCD모듈 운반상자(4) 전표면은 전술한 1차 및 2차 이온주입공정에 의해서 도4A에 도시된 바와 같이 본드(Bond)가 포화되거나, 도4B에 도시된 바와 같이 체인(Chain)의 분열이 발생하거나, 도4C에 도시된 바와 같이 각 체인의 크로스링킹(Cross-linking)이 발생하는 등에 의해서 원하는 전기 전도성을 뛰는 도전영역이 형성되며, 또한 부가적으로 표면의 경도는 한층 더 향상된다. 그리고 이온의 종류, 이온 에너지 등을 조절함으로써 LCD모듈 운반상자(4)의 표면이 친수성 또는 소수성을 가지도록 조절할 수 있으며, 이온주입에 의해서 방염처리도 향상시킬 수 있다. 그리고, 이온주입공정에 도전영역이 형성됨으로써 LCD모듈 운반상자(4)가 고유의 투명성을 유지하여 작업자가 LCD모듈 운반상자(4)에 적재되는 LCD모듈의 기재사항을 용이하게 판독할 수 있다. 또한, 본 실시예의 LCD모듈 운반상자(4)는 자체의 하중을 유지함으로써 종래의 LCD모듈 운반상자보다 가볍다.Subsequently, a second ion implantation process of injecting ions three-dimensionally into the entire surface of the LCD module carrying box 4 is performed again in step S12 to reinforce the conductive region. The step S12 may be omitted, but the ion implantation amount may not be constant on a part of the surface of the LCD module carrying box 4 by the primary ion implantation. Make uniform ion implantation amount on the entire surface of 4). At this time, the front surface of the LCD module carrying box 4 is saturated as shown in FIG. 4A by the primary and secondary ion implantation processes described above, or as shown in FIG. 4B. A conductive region that exhibits the desired electrical conductivity is formed by the cleavage of or the cross-linking of each chain as shown in FIG. 4C. In addition, the hardness of the surface is further improved. do. The surface of the LCD module carrying box 4 can be adjusted to have hydrophilicity or hydrophobicity by adjusting the type of ions, ion energy, etc., and the flame retardant treatment can be improved by ion implantation. In addition, since the conductive region is formed in the ion implantation process, the LCD module carrying box 4 maintains its inherent transparency so that an operator can easily read the description of the LCD module loaded on the LCD module carrying box 4. In addition, the LCD module carrying box 4 of the present embodiment is lighter than the conventional LCD module carrying box by maintaining its own load.

마지막으로, S14단계에서 공정챔버(11)의 내부챔버(14) 내부에서 도전영역이 형성된 LCD모듈 운반상자(4)를 외부로 방출한다. 상기 LCD모듈 운반상자(4)의 방출은 LCD모듈 운반상자(4)가 이송수단에 의해서 게이트밸브(32)를 통해서 제 2 저진공펌프(34)에 의해서 10-4Torr정도의 내부압력을 유지하는 제 2 예비챔버(30)로 이송됨으로써 이루어진다.Finally, in step S14, the LCD module carrying box 4 in which the conductive area is formed in the inner chamber 14 of the process chamber 11 is discharged to the outside. The discharge of the LCD module carrying box 4 maintains the internal pressure of about 10 -4 Torr by the second low vacuum pump 34 through the gate valve 32 by the transfer means of the LCD module carrying box 4. It is made by being transferred to the second preliminary chamber (30).

본 실시예에서는 LDC모듈 운반상자에 한정하여 설명하였으나 당업자는 투명성 폴리머, PE(Polyethylene), PP(Polypropylene), HIPS(High-Impact-Polystyrene), ABS(Acrylonitrile-Butadiene-Styrene) 등의 범용 폴리머, PC (Polycarbonate), N6(Nylon6), N66(Nylon66), MPPO(Modified Polypenylene Oxide), PSU(Polysulfon), PES(Polyethersulfon), PEEK(Polyether-etherketone) 등의 엔지니어링 플라스틱 및 상기 범용 폴리머 또는 엔지니어링 플라스틱에 기능성을 부여하기 위한 휠러(Filler) 등을 혼합한 기능성 컴파운드 플라스틱 등의 고분자 화합물을 사용하여 제작된 칩트레이, 반도체 캐리어용 테이프, 반도체 웨이퍼 이송용 캐리어, 인쇄회로기판 운반상자, 전자모듈제품 운반상자, LCD, LCD박막필름, LCD모듈 운반상자, 시트 및 반도체 운반용 소켓 등에 광범위하게 응용하여 실시할 수 있음은 명백하다.In the present embodiment, the description is limited to the LDC module carrying box, but those skilled in the art will understand general-purpose polymers such as transparent polymer, polyethylene (PE), polypropylene (PP), high-impact-polystyrene (HIPS), and acrylonitrile-butadiene-styrene (ABS), Engineering plastics such as PC (Polycarbonate), N6 (Nylon6), N66 (Nylon66), Modified Polypenylene Oxide (MPPO), Polysulfon (PSU), Polyethersulfon (PES), Polyether-etherketone (PEEK) and the above general purpose polymers or engineering plastics Chip tray made of polymer compound such as functional compound plastic mixed with wheeler to impart functionality, tape for semiconductor carrier, carrier for transporting semiconductor wafer, transport box for printed circuit board, transport box for electronic module product Widely applied to LCD, LCD thin film, LCD module carrying box, sheet and semiconductor carrying socket Can that is obvious.

따라서, 본 발명에 의하면 고분자 화합물로 제작된 대상물의 표면에 가속된 이온을 냉플라즈마 영역에서 3차원적으로 주입하여 도전영역을 균일하게 형성함으로써 기존의 카본 및 카본화이버 등의 혼합물 보다 모재를 경량화함으로써 물류 운송비용을 절감하고, 대상물 고유의 투명성을 유지할 수 있도록 하고, 표면에 전체적으로 균일한 도전영역을 형성할 수 있도록 하는 효과가 있다.Therefore, according to the present invention, the accelerated ions are injected three-dimensionally on the surface of the object made of the polymer compound in the cold plasma region to uniformly form the conductive region, thereby making the base material lighter than a mixture of carbon and carbon fiber. It is effective to reduce the logistics transportation cost, to maintain the inherent transparency of the object, and to form a uniform conductive area on the surface as a whole.

그리고, 대상물이 필름일 경우 종래와 같이 필름 상에 증착된 도전막이 벗겨지거나 그 성질이 화학적으로 변성되는 것을 방지할 수 있는 효과가 있다.When the object is a film, the conductive film deposited on the film may be peeled off or chemically denatured, as in the conventional art.

또한, 대상물의 표면경도를 증가시킬 수 있고, 현재 국내에서 전량 수입에 의존하는 고가의 카본 및 카본화이버 등을 전혀 사용하지 않아 제조경비를 절감할 수 있음은 물론 수입 대체 효과가 있다.In addition, it is possible to increase the surface hardness of the object, it is possible to reduce the manufacturing cost by using no expensive carbon and carbon fiber, etc., which depend on the total imports at present, as well as import substitution effect.

그리고, 카본 및 카본화이버 등의 혼합물을 모재로 사용하지 않아서 카본 및 카본화이버를 혼합한 모재가 갖고 있는 취성 및 가공성, 불투명성 및 낮은 재활용율 등의 문제점을 해결할 수 있으며, 표면의 카본 파티클이 이송제품의 오염원으로 작용하는 것을 방지하는 효과가 있다.In addition, it is possible to solve problems such as brittleness and processability, opacity and low recycling rate of the base material mixed with carbon and carbon fiber by not using a mixture of carbon and carbon fiber as a base material, and the surface carbon particles are transported products. There is an effect to prevent acting as a source of pollution.

이상에서 본 발명은 기재된 구체예에 대해서만 상세히 설명되었지만 본 발명의 기술사상 범위 내에서 다양한 변형 및 수정이 가능함은 당업자에게 있어서 명백한 것이며, 이러한 변형 및 수정이 첨부된 특허청구범위에 속함은 당연한 것이다.Although the present invention has been described in detail only with respect to the described embodiments, it will be apparent to those skilled in the art that various modifications and variations are possible within the technical scope of the present invention, and such modifications and modifications are within the scope of the appended claims.

Claims (4)

고분자 화합물로 제작된 대상물 표면에 가속된 이온을 3차원적으로 주입함으로써 도전영역을 형성하는 것을 특징으로 하는 3차원적인 이온주입에 의한 도전영역 형성방법.3. A method for forming a conductive region by three-dimensional ion implantation, wherein the conductive region is formed by three-dimensionally injecting accelerated ions into a surface of an object made of a polymer compound. 제 1 항에 있어서,The method of claim 1, 상기 이온을 냉플라즈마상태에서 주입하는 것을 특징으로 하는 상기 3차원적인 이온주입에 의한 도전영역 형성방법.The method for forming a conductive region by implanting the three-dimensional ion, characterized in that for implanting the ion in a cold plasma state. 제 1 항에 있어서,The method of claim 1, 상기 고분자 화합물로 투명성 폴리머, 범용 폴리머, 엔지니어링 플라스틱, 상기 범용 폴리머 및 엔지니어링 플라스틱에 휠러(Filler) 등의 첨가물을 첨가하여 기능성을 부여한 기능성 컴파운드 플라스틱 중에서 어느 하나를 사용하는 것을 특징으로 하는 상기 3차원적인 이온주입에 의한 도전영역 형성방법.As the polymer compound, any one of the above-described three-dimensionally characterized by using a transparent compound, a general-purpose polymer, an engineering plastic, a functional compound plastic to which functionality is added by adding an additive such as a filler to the general-purpose polymer and the engineering plastic. Method for forming a conductive region by ion implantation. 제 1 항에 있어서,The method of claim 1, 상기 대상물은 LCD모듈 운반상자, 칩트레이, 반도체 캐리어용 테이프, 반도체 웨이퍼 이송용 캐리어, 인쇄회로기판 운반상자, 전자모듈제품 운반상자, LCD, LCD박막필름, 시트 및 반도체 운반용 소켓 중에서 어느 하나인 것을 특징으로 하는 상기 3차원적인 이온주입에 의한 도전영역 형성방법.The object may be any one of an LCD module transport box, a chip tray, a semiconductor carrier tape, a semiconductor wafer transport carrier, a printed circuit board transport box, an electronic module product transport box, an LCD, an LCD thin film, a sheet, and a socket for semiconductor transport. The conductive region forming method by the three-dimensional ion implantation.
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SG200003148A SG98406A1 (en) 2000-03-14 2000-06-06 Conductive region formation method by ion injection
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