KR19980036103U - Temperature rise measurement circuit of electronic parts - Google Patents
Temperature rise measurement circuit of electronic parts Download PDFInfo
- Publication number
- KR19980036103U KR19980036103U KR2019960049093U KR19960049093U KR19980036103U KR 19980036103 U KR19980036103 U KR 19980036103U KR 2019960049093 U KR2019960049093 U KR 2019960049093U KR 19960049093 U KR19960049093 U KR 19960049093U KR 19980036103 U KR19980036103 U KR 19980036103U
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- South Korea
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- temperature rise
- value
- circuit
- measuring
- coil
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/34—Testing dynamo-electric machines
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
본 고안은 전자부품의 온도상승값 측정회로에 관한 것으로서,The present invention relates to a circuit for measuring the temperature rise of electronic components,
종래에는, 전자부품의 온도상승값 측정시에 특히, 코일을 구성하고 있는 부품은 전원이 인가되면 부품이 자체발열되고 이때의 저항값은 무한대이므로, 전원을 인가한 상태에서는 측정이 불가하였던바, 본 고안에 의하면 온도상승에 따른 부품시험시에 3방향의 마이크로 스위치를 이용하여 전원을 차단하지 않고 곧바로 코일값을 측정하여 그 부품의 온도상승값을 측정할 수 있게 된 전자부품의 온도상승값 측정회로를 제공하여 정확하고 용이한 측정을 하게 되었다.Conventionally, when measuring the temperature rise value of an electronic component, particularly, the component constituting the coil generates a self-heating component when the power is applied, and the resistance value at this time is infinite. According to the present invention, it is possible to measure the temperature rise value of electronic parts that can measure the temperature rise value of the part by immediately measuring the coil value without shutting off the power by using the micro switch in three directions when testing the part according to the temperature rise. The circuit was provided to make accurate and easy measurements.
Description
본 고안은 전자부품의 온도상승값 측정회로에 관한 것으로서, 특히, 회로내의 코일부품에 대한 저항값 측정시에 3방향의 마이크로 스위치의 접점변경으로 온도변화치의 편차없이 정확한 온도상승값을 측정할 수 있게 된 전자부품의 온도상승값 측정회로에 관한 것이다.The present invention relates to a circuit for measuring the temperature rise value of an electronic component, and in particular, when measuring the resistance value of a coil component in a circuit, it is possible to measure the temperature rise value accurately without deviation of the temperature change value by changing the contact point of the micro switch in three directions. The present invention relates to a circuit for measuring the temperature rise of electronic components.
종래의 경우, 전자부품의 동작시에는 각각의 전원(AC, DC)을 필요로 하는데, 부품자체의 발열온도 이상이면 고장이 나므로 그 전에 검측 즉, 온도상승값을 측정하게 되는데 특히, 코일을 구성하고 있는 부품은 전원이 인가되면 부품이 자체 발열되고 이때의 저항값은 무한대이므로 전원을 인가한 상태에서는 측정이 불가하였다.In the conventional case, each power source (AC, DC) is required for the operation of an electronic component, and if the component itself is above the heat generation temperature, a failure occurs. Therefore, the measurement, that is, the temperature rise value is measured before the coil is constructed. The part itself heats up when power is applied and the resistance value is infinite, so measurement was not possible when power was applied.
즉, 도 2에서 보는 바와 같이 전원이 회로내로 인가되면 모터가 구동되다가, 어느 정도에서 온도가 포화상태에서 A와 B점을 끊고 저항측정치로 시험전 및 시험후 저항치를 측정하여 온도상승값을 확인하게 되는데 주위온도가 일정치 않을 때는 A점 B점을 끊을 시 그 사이에 모터자체 저항이 내려가 정확하게 저항값을 알 수 없는 문제점이 있었다, 예를 들어 시험전저항치와 주위온도를 각각 R1, T1이라 하고 시험후 저항치와 주위온도를 각각 R2, T2라 하면, △T(온도상승) = T2 - T1 / T1(234.5 + T1) - (T2 - T1)의 식이 성립되므로 여기에서 T2의 변화가 심하면 온도상승은 내려가게 된다. 그러므로 정확한 온도상승값을 알 수 없는 문제점이 있었다.That is, as shown in FIG. 2, when the power is applied into the circuit, the motor is driven, and at some point, the temperature is saturated and the A and B points are cut off, and the resistance value is measured before and after the test to check the temperature rise value. When the ambient temperature is not constant, when the A point and B point are cut off, the resistance of the motor itself decreases between the two points. For example, the resistance value before the test and the ambient temperature are R1 and T1, respectively. After the test, if the resistance value and the ambient temperature are R2 and T2, respectively, △ T (temperature rise) = T2-T1 / T1 (234.5 + T1)-(T2-T1) is established. Ascension goes down. Therefore, there was a problem that the exact temperature rise value is unknown.
따라서 본 고안은 상술한 바와 같이 종래 기술의 제반문제점을 감안하여 안출한 것으로서, 온도상승에 따른 부품시험시에 3방향의 마이크로 스위치를 이용하여 전원을 차단하지 않고 곧바로 코일값을 측정하여 그 부품의 온도상승값을 측정할 수 있게 된 전자부품의 온도상승값 측정회로를 제공하는데 그 목적이 있는 것이다.Therefore, the present invention has been devised in consideration of the problems of the prior art as described above, and the coil value is measured immediately without shutting off the power by using a three-way micro switch in the part test due to the temperature rise. It is an object of the present invention to provide a circuit for measuring the temperature rise of electronic components that can measure the temperature rise.
도 1은 본 고안의 개락적인 회로구성도1 is a schematic circuit diagram of the present invention
도 2는 종래 기술의 회로구성도2 is a circuit diagram of a prior art
*도면의 주요부분에 대한 부호의 설명** Description of the symbols for the main parts of the drawings *
V : 전원부M : 모터V: Power Supply M: Motor
C : 코일측정기 MS : 마이크로 스위치C: Coil Meter MS: Micro Switch
이하 첨부된 도면을 참조하여 본 고안의 목적을 달성하기 위한 기술적 구성을 상세히 설명하면 다음과 같다.Hereinafter, with reference to the accompanying drawings will be described in detail the technical configuration for achieving the object of the present invention.
도 1은 본 고안의 개략적인 회로 구성도에 관한 것으로서, 전원이 모터(M)와 연결되는 회로상에 마이크로 스위치(MS)가 접속되어 있으며 나머지 하나의 단자(b) 일측으로 코일측정기(C)를 접속하고, 상기의 회로구성과 폐회로를 이루도록 하여 구성된 것이다.1 is a schematic circuit diagram of the present invention, in which a micro switch (MS) is connected on a circuit where a power source is connected to a motor (M), and a coil measuring device (C) toward one side of the other terminal (b). Is connected to each other to form a closed circuit.
이상과 같이 구성되어진 본 고안의 작용 및 효과를 실시예에 의거하여 구체적으로 설명하면 다음과 같다.Referring to the operation and effect of the present invention configured as described above based on the embodiments in detail.
본 고안의 초기동작시에는 도 1에서 보는 바와 같이 마이크로 스위치(MS)의 접점은 a와 c에 연결되어 있으므로 전원이 모터(M)에 인가되어 모터(M)가 구동된다. 이때 모터(M)의 코일온도가 포화 (어느 시점에서 온도상승이 일정하다는 것)상태가 되면 마이크로 스위치(MS)의 접점을 b와 c에 연결되게 하여 코일측정기(C)로서 코일값을 측정하게 된다.In the initial operation of the present invention, as shown in Figure 1, the contact of the micro switch (MS) is connected to a and c, so power is applied to the motor (M) to drive the motor (M). At this time, when the coil temperature of the motor M becomes saturated (temperature rise is constant at some point), the contact of the micro switch MS is connected to b and c to measure the coil value with the coil measuring device C. do.
이럴 경우 코일측정시의 온도편차는 시험전과 시험후의 비교가 ±10℃ 이내가 되어 정확한 측정이 가능케 된 것이다.In this case, the temperature deviation at the time of coil measurement is within ± 10 ℃ before and after the test, so that accurate measurement is possible.
이상에서 설명된 바와 같이 본 고안은 온도상승 시험시에 마이크로 스위치를 이용하여 전원을 차단치 않고 곧바로 코일값을 측정하여 그 부품의 온도상승값을 확인하므로서 정확한 값을 측정할 수 있게 된 고안인 것이다.As described above, the present invention is a device that can measure an accurate value by measuring a coil value immediately by measuring a coil value without turning off a power supply using a micro switch during a temperature rise test. .
Claims (1)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR2019960049093U KR19980036103U (en) | 1996-12-14 | 1996-12-14 | Temperature rise measurement circuit of electronic parts |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR2019960049093U KR19980036103U (en) | 1996-12-14 | 1996-12-14 | Temperature rise measurement circuit of electronic parts |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR19980036103U true KR19980036103U (en) | 1998-09-15 |
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ID=53989928
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR2019960049093U KR19980036103U (en) | 1996-12-14 | 1996-12-14 | Temperature rise measurement circuit of electronic parts |
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| Country | Link |
|---|---|
| KR (1) | KR19980036103U (en) |
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1996
- 1996-12-14 KR KR2019960049093U patent/KR19980036103U/en not_active Application Discontinuation
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