KR102805203B1 - 임프린트 방법, 임프린트 장치 및 물품의 제조 방법 - Google Patents
임프린트 방법, 임프린트 장치 및 물품의 제조 방법 Download PDFInfo
- Publication number
- KR102805203B1 KR102805203B1 KR1020210002296A KR20210002296A KR102805203B1 KR 102805203 B1 KR102805203 B1 KR 102805203B1 KR 1020210002296 A KR1020210002296 A KR 1020210002296A KR 20210002296 A KR20210002296 A KR 20210002296A KR 102805203 B1 KR102805203 B1 KR 102805203B1
- Authority
- KR
- South Korea
- Prior art keywords
- light
- imprint material
- imprint
- substrate
- mold
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70775—Position control, e.g. interferometers or encoders for determining the stage position
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Shaping Of Tube Ends By Bending Or Straightening (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020007019A JP7403325B2 (ja) | 2020-01-20 | 2020-01-20 | インプリント方法、インプリント装置、および物品の製造方法 |
| JPJP-P-2020-007019 | 2020-01-20 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20210093755A KR20210093755A (ko) | 2021-07-28 |
| KR102805203B1 true KR102805203B1 (ko) | 2025-05-12 |
Family
ID=76856873
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020210002296A Active KR102805203B1 (ko) | 2020-01-20 | 2021-01-08 | 임프린트 방법, 임프린트 장치 및 물품의 제조 방법 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US11442361B2 (enExample) |
| JP (1) | JP7403325B2 (enExample) |
| KR (1) | KR102805203B1 (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI771623B (zh) * | 2018-11-08 | 2022-07-21 | 日商佳能股份有限公司 | 壓印裝置和產品製造方法 |
| JP7749443B2 (ja) * | 2021-12-16 | 2025-10-06 | キヤノン株式会社 | 運動制御装置、リソグラフィー装置、平坦化装置、処理装置および物品製造方法 |
| JP7716343B2 (ja) * | 2022-01-06 | 2025-07-31 | キヤノン株式会社 | インプリント装置、インプリント方法、および物品製造方法 |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20130207288A1 (en) * | 2012-02-15 | 2013-08-15 | Kabushiki Kaisha Toshiba | Imprinting apparatus and imprinting method |
| JP2014241396A (ja) | 2013-05-14 | 2014-12-25 | キヤノン株式会社 | インプリント装置、インプリント方法および物品の製造方法 |
| JP2016058735A (ja) * | 2014-09-08 | 2016-04-21 | キヤノン株式会社 | インプリント装置、インプリント方法および物品の製造方法 |
| US20180074419A1 (en) | 2016-09-12 | 2018-03-15 | SK Hynix Inc. | Methods of forming patterns using nanoimprint lithography |
| JP2019021749A (ja) | 2017-07-14 | 2019-02-07 | キヤノン株式会社 | インプリント方法、インプリント装置および物品の製造方法 |
| JP2019212690A (ja) | 2018-05-31 | 2019-12-12 | キヤノン株式会社 | 成形装置、成形方法及び物品の製造方法 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7030533B2 (ja) * | 2018-01-15 | 2022-03-07 | キオクシア株式会社 | インプリント装置、インプリント方法、及び半導体装置の製造方法 |
-
2020
- 2020-01-20 JP JP2020007019A patent/JP7403325B2/ja active Active
-
2021
- 2021-01-08 KR KR1020210002296A patent/KR102805203B1/ko active Active
- 2021-01-15 US US17/150,267 patent/US11442361B2/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20130207288A1 (en) * | 2012-02-15 | 2013-08-15 | Kabushiki Kaisha Toshiba | Imprinting apparatus and imprinting method |
| JP2014241396A (ja) | 2013-05-14 | 2014-12-25 | キヤノン株式会社 | インプリント装置、インプリント方法および物品の製造方法 |
| JP2016058735A (ja) * | 2014-09-08 | 2016-04-21 | キヤノン株式会社 | インプリント装置、インプリント方法および物品の製造方法 |
| US20180074419A1 (en) | 2016-09-12 | 2018-03-15 | SK Hynix Inc. | Methods of forming patterns using nanoimprint lithography |
| JP2019021749A (ja) | 2017-07-14 | 2019-02-07 | キヤノン株式会社 | インプリント方法、インプリント装置および物品の製造方法 |
| JP2019212690A (ja) | 2018-05-31 | 2019-12-12 | キヤノン株式会社 | 成形装置、成形方法及び物品の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20210093755A (ko) | 2021-07-28 |
| JP7403325B2 (ja) | 2023-12-22 |
| JP2021114561A (ja) | 2021-08-05 |
| US20210223689A1 (en) | 2021-07-22 |
| US11442361B2 (en) | 2022-09-13 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 20210108 |
|
| PG1501 | Laying open of application | ||
| PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20220708 Comment text: Request for Examination of Application Patent event code: PA02011R01I Patent event date: 20210108 Comment text: Patent Application |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20240612 Patent event code: PE09021S01D |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 20250212 |
|
| PG1601 | Publication of registration |