KR102692696B1 - 기판 처리 장치 및 기판 처리 방법 - Google Patents
기판 처리 장치 및 기판 처리 방법 Download PDFInfo
- Publication number
- KR102692696B1 KR102692696B1 KR1020237017247A KR20237017247A KR102692696B1 KR 102692696 B1 KR102692696 B1 KR 102692696B1 KR 1020237017247 A KR1020237017247 A KR 1020237017247A KR 20237017247 A KR20237017247 A KR 20237017247A KR 102692696 B1 KR102692696 B1 KR 102692696B1
- Authority
- KR
- South Korea
- Prior art keywords
- processing
- substrate
- support tray
- container body
- processing space
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 239000000758 substrate Substances 0.000 title claims abstract description 192
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- 239000012530 fluid Substances 0.000 claims description 108
- 238000000034 method Methods 0.000 claims description 37
- 230000008569 process Effects 0.000 claims description 30
- 230000000903 blocking effect Effects 0.000 claims description 18
- 238000005259 measurement Methods 0.000 claims description 7
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- 230000003028 elevating effect Effects 0.000 claims description 5
- 238000007599 discharging Methods 0.000 claims description 4
- 238000007789 sealing Methods 0.000 claims description 3
- 239000007788 liquid Substances 0.000 description 25
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 18
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 12
- 238000012546 transfer Methods 0.000 description 11
- 238000000352 supercritical drying Methods 0.000 description 10
- 238000010586 diagram Methods 0.000 description 9
- 238000011084 recovery Methods 0.000 description 9
- 229910002092 carbon dioxide Inorganic materials 0.000 description 6
- 239000001569 carbon dioxide Substances 0.000 description 6
- 239000011521 glass Substances 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 238000004140 cleaning Methods 0.000 description 3
- 238000001035 drying Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 239000012535 impurity Substances 0.000 description 3
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- 239000012071 phase Substances 0.000 description 3
- 230000007261 regionalization Effects 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 235000012431 wafers Nutrition 0.000 description 3
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000007791 liquid phase Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
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- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 2
- 238000006467 substitution reaction Methods 0.000 description 2
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- 238000004891 communication Methods 0.000 description 1
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- 238000013461 design Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
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- 239000002245 particle Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/67303—Vertical boat type carrier whereby the substrates are horizontally supported, e.g. comprising rod-shaped elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Manufacturing Of Printed Circuit Boards (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2020-197880 | 2020-11-30 | ||
| JP2020197880A JP7557352B2 (ja) | 2020-11-30 | 2020-11-30 | 基板処理装置および基板処理方法 |
| PCT/JP2021/043391 WO2022114127A1 (ja) | 2020-11-30 | 2021-11-26 | 基板処理装置および基板処理方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20230085211A KR20230085211A (ko) | 2023-06-13 |
| KR102692696B1 true KR102692696B1 (ko) | 2024-08-07 |
Family
ID=81755637
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020237017247A Active KR102692696B1 (ko) | 2020-11-30 | 2021-11-26 | 기판 처리 장치 및 기판 처리 방법 |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP7557352B2 (enExample) |
| KR (1) | KR102692696B1 (enExample) |
| CN (1) | CN116529862A (enExample) |
| TW (1) | TWI804076B (enExample) |
| WO (1) | WO2022114127A1 (enExample) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020127513A (ja) * | 2019-02-07 | 2020-08-27 | 京楽産業.株式会社 | 遊技機 |
| JP2020127512A (ja) * | 2019-02-07 | 2020-08-27 | 京楽産業.株式会社 | 遊技機 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5471740B2 (ja) | 2010-04-08 | 2014-04-16 | 東京エレクトロン株式会社 | 基板処理装置 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6015738B2 (ja) | 2014-11-25 | 2016-10-26 | 東京エレクトロン株式会社 | 処理装置、処理方法及び記憶媒体 |
| KR102055712B1 (ko) * | 2015-10-04 | 2019-12-13 | 어플라이드 머티어리얼스, 인코포레이티드 | 감소된 용적의 처리 챔버 |
| JP2017157746A (ja) * | 2016-03-03 | 2017-09-07 | 東京エレクトロン株式会社 | 基板処理装置、基板処理方法および記憶媒体 |
| JP6922048B2 (ja) * | 2016-11-04 | 2021-08-18 | 東京エレクトロン株式会社 | 基板処理装置、基板処理方法及び記録媒体 |
| JP2018082043A (ja) * | 2016-11-16 | 2018-05-24 | 東京エレクトロン株式会社 | 基板処理装置 |
| US10872789B2 (en) * | 2017-09-28 | 2020-12-22 | Taiwan Semiconductor Manufacturing Co., Ltd. | Wafer cooling system |
| JP6906416B2 (ja) * | 2017-09-29 | 2021-07-21 | 東京エレクトロン株式会社 | 基板処理装置 |
| JP7038524B2 (ja) * | 2017-11-14 | 2022-03-18 | 東京エレクトロン株式会社 | 基板処理装置の洗浄装置および洗浄方法 |
| JP7308688B2 (ja) * | 2019-08-05 | 2023-07-14 | 東京エレクトロン株式会社 | 基板処理装置および基板乾燥方法 |
-
2020
- 2020-11-30 JP JP2020197880A patent/JP7557352B2/ja active Active
-
2021
- 2021-11-26 KR KR1020237017247A patent/KR102692696B1/ko active Active
- 2021-11-26 CN CN202180079981.1A patent/CN116529862A/zh active Pending
- 2021-11-26 WO PCT/JP2021/043391 patent/WO2022114127A1/ja not_active Ceased
- 2021-11-30 TW TW110144510A patent/TWI804076B/zh active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5471740B2 (ja) | 2010-04-08 | 2014-04-16 | 東京エレクトロン株式会社 | 基板処理装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW202236479A (zh) | 2022-09-16 |
| KR20230085211A (ko) | 2023-06-13 |
| JP2022086069A (ja) | 2022-06-09 |
| WO2022114127A1 (ja) | 2022-06-02 |
| TWI804076B (zh) | 2023-06-01 |
| CN116529862A (zh) | 2023-08-01 |
| JP7557352B2 (ja) | 2024-09-27 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
Patent event date: 20230522 Patent event code: PA01051R01D Comment text: International Patent Application |
|
| PA0201 | Request for examination | ||
| PG1501 | Laying open of application | ||
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 20240709 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 20240802 Patent event code: PR07011E01D |
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| PR1002 | Payment of registration fee |
Payment date: 20240802 End annual number: 3 Start annual number: 1 |
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| PG1601 | Publication of registration |