KR102561064B1 - Method for testing heat deterioration of display devices - Google Patents

Abstract

The present invention is a system for testing the deterioration performance of a display device displaying an image, including a heating means for heating the display device to a preset test temperature, the heating means being arranged to face the outer surface of the display device in a preset pattern, and a display accommodating module having an open portion formed on one side so that probe pins (TCs) in contact with respective signal lines of the display device can enter; a connection portion connected to and in contact with the probe pins; A bi-directional inspection unit connected to the connection unit to input test signals into signal lines and receive feedback signals for test results from the signal lines, using information included in the feedback signals in a preset manner to check states of the signal lines; and a control module connected to the display accommodating module and the bi-directional inspection unit, the control module controlling the heating means so that the temperature of the display unit or the inside of the display unit reaches the test temperature, and transmitting information about the test temperature to the bi-directional inspection unit.

Description

Deterioration performance test method of display devices {Method for testing heat deterioration of display devices}

The present invention relates to a system for testing a signal line of a display device.

As information technology develops, the importance of the display device, which is a connection medium between users and information, is being highlighted. In response to this, the use of digital display devices such as liquid crystal display devices and organic light emitting display devices is increasing.

Unlike analog display devices, these digital display devices have digital image signals input to signal lines, and images are displayed using liquid crystal, plasma, or organic light emitting materials by the digital image signals.

Signal lines of a digital display device are mainly formed by a thin film processing process such as a metal film deposition process and a metal film patterning process.

Digital display devices having signal lines to which digital image signals are input are assembled and then a test process is performed. In the test process of the digital display device, a test image is implemented on the digital display device by applying a test signal to the signal lines, and then the operator visually inspects the test image to determine the quality of the digital display device.

However, when a conventional digital display device is tested in a visual manner, the test is not accurately performed depending on the skill level and fatigue of the operator.

In addition, since the test process of the conventional digital display device is performed after the digital display device is completely assembled, the digital display device determined to be defective in the test process cannot be repaired and is discarded, thereby reducing yield.

In particular, when a test process is performed after the digital display device is completely assembled, it is difficult to detect fatal defects such as signal line disconnection occurring during the process of forming signal lines of the digital display device at an early stage, and when the digital display device is actually used by a user, a problem occurs due to heat generation.

Republic of Korea Patent Registration No. 10-0991367 Republic of Korea Patent Registration No. 10-2188565

In order to solve the above problems, the present invention proposes a technology capable of detecting fatal defects of signal lines at an early stage before assembling a digital display device and simultaneously testing the deterioration performance of the display device and signal lines in advance by simulating an atmosphere similar to an actual situation in which heat is generated.

The present invention is a system for testing deterioration performance of a display device displaying an image, a display device accommodating module accommodating the display device, including heating means for heating the display device to a preset test temperature, wherein the heating means is arranged to face the outer surface of the display device in a preset pattern, and an open portion is formed on one side to allow probe pins in contact with respective signal lines of the display device to enter; a connection portion contacting and connected to the probe pins; A bi-directional inspection unit connected to the connection unit, inputting test signals to the signal lines, and receiving feedback signals for test results from the signal lines, using information included in the feedback signals in a preset manner to check states of the signal lines; and a control module connected to the display accommodating module and the bi-directional inspection unit, controlling the heating means so that the temperature of the inside of the display unit or the display unit reaches the test temperature, and transmitting information about the test temperature to the bi-directional inspection unit; The interactive inspection unit analyzes the electrical information included in the feedback signal according to the change in the test temperature of the display device, the valid range of the electrical information at a first test temperature is set in advance, and the test system checks the state of the signal lines through whether or not the electrical information included in the feedback signal is within the valid range.

In addition, the connecting part has upper holes into which the probe pins are respectively inserted, side holes communicating with the upper holes are formed on the upper part, and the marking device accommodating module is seated on the upper part so that the probe pins are inserted into the upper holes. A connection block to be seated; fastening parts including contact pins having one end inserted into the side hole and contacting the probe pin and disposed on a side of the connection block; and a flexible circuit board portion contacting the other side of the contact pin.

In addition, the heating means of the display device accommodating module is composed of first to nth heating wires, and the display device accommodating module includes: the first to nth heating wires connected to a heating wire power supply unit; and a sensor unit sensing a temperature inside the display device accommodation module or a temperature of at least one part of the display device. The control module may cut off power to the heating wire power supply unit when the temperature sensed by the sensor unit reaches the test temperature.

Further, the display device accommodating module is composed of first through nth cooling lines, and forcibly cools the internal temperature of the display device accommodating module to a preset temperature, the cooling means controlling the operation by the control module; wherein the first to n-th heating wires are disposed in parallel at a predetermined interval, and a k-th cooling wire is disposed between adjacent heating wires among the first to n-th heating wires, and the control module forms different test temperatures by repeatedly heating or cooling the inside of the display device receiving module or the display device using the heating means and the cooling means, and the bi-directional inspection unit repeatedly transmits and receives the test signal and a feedback signal of the test signal at each test temperature, so that the signal lines, A state of the display device may be checked.

On the other hand, the present invention is a method using the above-described test system, comprising: (a) accommodating a display device in a display device accommodating module and inputting a test temperature to a control module (S110); (b) operating the heating means of the display device accommodating module to raise the temperature of the inside of the display device accommodating module or the display device to a test temperature (S120); (c) transmitting a test signal from the bi-directional inspection unit to each signal line of the display device (S130); (d) analyzing the feedback signal of the test signal in a preset manner to check the state of the signal lines or the display device (S140); and (e) in step (d), when the signal lines and the display device are confirmed to be in normal states, separating the display device from the display device accommodating module, and forming the internal temperature of the display device accommodating module as a reference temperature through a cooling means of the display device accommodating module (S150); Provides a method including.

The present invention detects fatal defects in signal lines early before assembling a digital display device, and at the same time simulates an atmosphere similar to an actual situation in which heat is generated to test both the deterioration performance of the display device and signal lines in advance.

1 schematically illustrates an overall schematic diagram of a system for testing according to an embodiment of the present invention.
2 schematically illustrates a display device accommodating module and probe pins in a test system according to an embodiment of the present invention.
3 is a block diagram of a system for testing according to an embodiment of the present invention.
4 schematically illustrates a cross-section of a display device accommodation module in a test system according to an embodiment of the present invention.
FIG. 5 is a modified example of the heating wire shape of FIG. 3 .
FIG. 6 is another modification of the heating and cooling lines of FIG. 3 .
7 illustrates an embodiment of a connection unit of a system for testing according to an embodiment of the present invention.
8 is a flowchart of a method using the test system of the present invention.

Hereinafter, the present invention will be described in detail through the accompanying drawings and examples, and in the following description of the present invention, if it is determined that a detailed description of a related known function or configuration may unnecessarily obscure the gist of the present invention, the detailed description thereof has been omitted.

In addition, terms to be described later are terms defined in consideration of functions in the present invention, which may vary according to the intention or custom of a user or operator. Therefore, the definition should be made based on the contents throughout this specification.

A "display device" frequently used in the present invention refers to a digital display device that displays an image by applying a digital image signal to a plurality of signal lines and signal lines, and the "display device" may include a liquid crystal display (LCD) device, a plasma display panel (PDP) device, and an organic light emitting diode (OLED) device. The "display device" frequently used in the present invention may include all devices that display digital images by providing digital image signals to signal lines in addition to LCD devices, PDP devices, and OLED devices.

In addition, the "bidirectional test device" used in the present invention is defined as a device that provides test signals to the signal lines of the "display device" and tests the signal lines of the "display device" using feedback signals fed back from the signal lines.

A system for testing a signal line of a display device according to the present invention will be described with reference to FIGS. 1 to 7 .

The test system includes a display device accommodating module 1000, a connection unit 100, a bi-directional inspection unit 200, and a control module 1040.

In the present application, components other than the display device accommodating module 1000 will be described first, and then the display device accommodating module 1000 will be described in detail later.

The connection unit 100 electrically connects the display device 200 and the interactive inspection device 300 . The connection unit 100 provides the test signal TS generated from the bi-directional test device 300 to each signal line of the display device 200, and provides the feedback signal FS from the signal lines of the display device 200 to the bi-directional test. to the device 300.

The bidirectional inspection device 300 tests the display device 200 before it is completely assembled using the feedback signal FS provided through the connection unit 100 to test the quality of each signal line as well as the quality of the display device 200.

The connection unit 100 according to an embodiment of the present invention is provided as a connection pin or wire, and can electrically connect the signal lines of the display device 200 and the interactive inspection device 300.

More specifically, the display device accommodating module 1000 includes probe pins TCs, one end of which is in contact with the signal lines of the display device 200, and the connector 100 contacts and connects the other end of the probe pins TC, thereby electrically connecting the signal lines of the display device 200 and the bidirectional inspection device 300.

Referring to FIG. 7 , a connection unit 100 according to another embodiment of the present invention may include a connection block 110, a fastening unit 120, and a flexible circuit board unit 130.

The display device accommodating module 1000 may be seated on the connection block 110 . Also, a plurality of upper holes 110p into which the probe pins TC are inserted may be formed at positions corresponding to the probe pins TC on the top of the connection block 110 . In addition, a plurality of side holes 110q communicating with the upper hole 110p may be formed on the side of the connection block 110 .

The fastening part 120 may be fastened to the connection block 110 . Also, the fastening part 120 may include a base plate 121 , a contact pin 122 , a fastening pillar 123 , and a fastening bar 124 .

The base plate 121 may be disposed on the side of the connection block 110 .

In addition, the contact pins 122 are spaced apart from each other by a predetermined distance and disposed on the upper portion of the base plate 121, and one end may be inserted into the side hole 110q formed in the connection block 110 to contact the probe pin TC.

The fastening pillars 123 may be disposed on both sides of the upper portion of the base plate 121 so as to protrude upward, and threads may be formed on the side portions.

The fastening bar 124 may have fastening holes 124h formed at positions corresponding to the fastening pillars 123, and may be inserted into the fastening pillars 123 and seated on the upper part of the other side of the contact pin 122. Also, before the fastening bar 124 is seated on the top of the other side of the contact pin 122, one side of the flexible circuit board 130 may be seated first.

In addition, the fastening nut CN is fastened to the fastening pillar 123 and the fastening bar 124 is pressed downward to fix one side of the flexible circuit board unit 130 to the contact pin 122 .

In the flexible circuit board unit 130 , the same number of wires 131 as the number of contact pins 122 may be formed. Also, the other side of the flexible circuit board unit 130 may be electrically connected to the bi-directional inspection device 300 . In addition, the flexible circuit board unit 130 may be formed of a flexible insulating plate having a thin thickness. In addition, each wire 131 is insulated by a solder resist film, and a portion connected to a connector or the like in each wire 131 may be exposed through an opening in the solder resist film.

In addition, at least one flexible circuit board unit 130 may be formed, preferably in plurality. Also, the total sum of the number of wires 131 formed on the flexible circuit board portions 130 may be substantially equal to the number of contact pins 122 .

Therefore, the connection unit 100 can electrically connect the signal lines of the display device 200 and the bidirectional test device 300, and a short circuit between the signal lines of the display device 200 and the bidirectional test device 300 can be prevented from occurring.

In addition, a connection operation between the signal lines of the display device 200 and the interactive inspection device 300 can be easily performed.

Referring back to FIG. 1 , the interactive test device 300 generates a plurality of test signals TS to be provided to each signal line of the display device 200, and each test signal TS can be provided to the connection unit 100 or to each wiring 131 of each flexible circuit board unit 130 of the connection unit 100 simultaneously or sequentially.

At this time, each test signal TS generated from the bidirectional test device 300 may be provided to signal lines of the display device 200 corresponding to the test signal TS by the connection part 100 and the probe pins TC.

Subsequently, a feedback signal FS, which is a test result signal, is output from the signal lines of the display device 200, and the feedback signal FS is provided to the bi-directional inspection device 300 through each probe pin TC and the connection part 100. The bi-directional inspection device 300 determines whether the signal lines are good or bad using the feedback signal FS.

In one embodiment of the present invention, each of the signal lines, the connection unit 100, and the bidirectional inspection device 300 may be connected in a serial manner, and the test signal TS is input to each signal line of the display device 200 from the bidirectional inspection device 300, and the feedback signal FS is received from each signal line to the bidirectional inspection device 300, so that each signal line of the display device 200 can be quickly and accurately tested for defects.

The connection unit 100 connects the signal lines of the display device 200 and the bi-directional test device 300 one-to-one, thereby applying the test signal TS from the bi-directional test device 300 to the signal lines and providing a feedback signal FS from the signal lines to the bi-directional test device 300 to electrically test each signal line to further improve test accuracy, and to test the display device 200 for each unit process before completely assembling the display device 200. have an effect

Referring to FIGS. 1 and 3 , the display device accommodating module 1000 according to the present invention will be described. The display device accommodating module 1000 includes a heating unit 1010 and a cooling unit 1020, and is a housing structure formed such that the display unit 200 is inserted inside. For insertion into the display device 200 and introduction of probe pins TC contacting respective signal lines of the display device, one side portion is formed open.

The heating means is composed of first to nth heating wires, and they are connected to the heating wire power supply unit 1011 to receive power. Here, as an example, the heating wire may be composed of a heating wire coil, and may be formed on the inner surface of the display device accommodating module 1000, thereby increasing the temperature inside the display device accommodating module 1000, and also the temperature of the display device 200 itself.

The reason why the temperature of the display device is increased using the heating wire is that heat generation may be the biggest problem when a user actually uses the display device. When the display device 200 is heated by internal heat or sunlight, it is very important to check whether elements or signal lines inside the display device 200 are normally operated. However, in the related art, there was a problem in that the temperature was kept constant or the temperature at the time of heating was not tested. Since each user has a different use environment, a lot of heat generation problems occur during actual use, and the above problem can be prevented in advance by performing the test by simulating an atmosphere similar to this environment.

Inside the display device accommodating module 1000 includes a sensor unit (not shown) that senses a temperature inside the display device accommodating module or a temperature of at least one part of the display device. The sensor unit is connected to the control module 1040 to transmit temperature information to the control module 1040, and when the temperature sensed by the sensor unit reaches the test temperature, power to the heating wire power supply unit 1011 is cut off.

Referring to FIG. 1 , in the display device accommodating module 1000 , heating wires 1010 , 1012 , 1014 , and 1016 are disposed to surround the outer surface of the display device 200 inserted therein. In FIG. 1 , a state viewed from the top is shown, but it is disposed so as to surround not only the upper part of the display device 200 but also the lower part. In addition, the display device accommodating module 1000 further includes a cooling unit 1020 . The cooling unit 1020 is composed of first to nth cooling lines 1020, 1022, 1024, and 1026, and forcibly cools the internal temperature of the display device accommodating module to a preset temperature, and the operation is controlled by the control module 1040.

At this time, the first to n-th heating wires 1010, 1012, 1014, and 1016 are disposed in parallel at a predetermined interval, respectively, and the k-th cooling wire is disposed between adjacent heating wires among the first to n-th heating wires 1010, 1012, 1014, and 1016. That is, it may be configured as an example in which the heating wire-cooling wire-heating wire-cooling wire are arranged in order.

The cooling lines 1020 , 1022 , 1024 , and 1026 can be used very usefully when a test for the same display device 200 is repeated. When testing the display device 200 or the signal line while changing the test temperature, the initial state may be formed again by cooling the already heated ones as quickly as possible. To this end, it may be connected to the refrigerant circulation pump 1021, and additionally, a fan means 1030 for cooling may be further provided. Unlike the first to n-th heating wires 1010, 1012, 1014, and 1016, the cooling wires 1020, 1022, 1024, and 1026 may be configured as passages through which a refrigerant flows.

At this time, the bi-directional inspection unit 300 can check the states of the signal lines and the display device by repeatedly transmitting and receiving the test signal and the feedback signal of the test signal for each test temperature. As an example, the bi-directional inspection unit 300 may determine an abnormal state by using voltage information, current information, etc. included in the feedback signal of the test signal. In the present application, these are collectively referred to as 'electrical information'. The bidirectional inspection unit 300 analyzes the electrical information included in the feedback signal according to the change in the test temperature of the display device, the valid range of the electrical information at the first test temperature is set in advance, and the electrical information included in the feedback signal is configured to check the state of the signal lines through whether or not it is included in the valid range. The effective range of electrical information may be set differently for each test temperature.

The control module 1040 includes a display device temperature setting unit 1042 , a heating wire operating unit 1044 and a cooling wire operating unit 1046 . The test temperature is input to the display device temperature setting unit 1042 . The test temperature may be automatically input, and it is preferable to further consider related laws and regulations when inputting.

Referring to FIGS. 4 to 6 , modifications of the arrangement of the heating wire and the cooling wire according to the present invention will be described, focusing on the differences.

4 shows a structure in which heating wires 1010, 1012, 1014, and 1016 and cooling wires 1020, 1022, 1024, and 1026 are alternately disposed, and a side wall is positioned between the heating wires and the cooling wires.

5 also has a structure in which the heating wires 1110, 1112, and 1114 and the cooling wires 1120, 1122, and 1124 are alternately arranged, but the area of the heating wire at the center is wide. This is to simulate a situation most similar to the real one. When a user uses the display device 200, the center side of the display device 200 may generate the most heat. In order to simulate this situation, the width or area of the heating line 1110 at the center side is formed to be the largest. The heating wires 1110, 1112, and 1114 are formed such that their width decreases from the center to the outside.

6 shows a concentric pattern of heating and cooling lines. Heating lines and cooling lines are alternately arranged, and the pattern of FIG. 6 is also for simulating a heating situation at the center of the display device 200 . In the present invention, degradation performance can be evaluated by applying all of the display device receiving modules 1000 shown in FIGS. 4 to 6 to a single display device 200 .

8 is a flowchart of a test method using the test system of the present invention.

The method is composed of steps S110 to S150.

Step S110 is a step in which the display device is accommodated in the display device accommodating module and the test temperature is input to the control module.

Step S120 is a step in which the heating unit of the display device accommodating module is operated to raise the temperature of the display device or the inside of the display device accommodating module to a test temperature.

Step S130 is a step in which a test signal is transmitted from the bi-directional inspection unit to each signal line of the display device.

Step S140 is a step of analyzing the feedback signal of the test signal in a preset manner to check the state of the signal lines or the display device.

In step S150, when the states of the signal lines and the display device are confirmed to be normal in step S140, the display device is separated from the display device accommodating module, and the display device accommodating module is cooled.

Here, after step S150 , while the temperature inside the display device 200 or the display device accommodating module 1000 is raised from the reference temperature to a predetermined test temperature, the state of the display device may be checked repeatedly. As described above, it is determined whether the display device 200 and the signal line are normal using voltage information, current information, etc., which are electrical information included in the feedback signal.

The above embodiment in the present invention is an example, and the present invention is not limited thereto. Anything that has substantially the same configuration as the technical concept described in the claims of the present invention and achieves the same effect is included in the technical scope of the present invention.

100: connection unit 110: connection block
120: fastening part 130: flexible circuit board part
200: display device 300: bi-directional inspection device
1000: display device accommodating module 1030: fan means
1040: control module

Claims (5)

A method using a system for testing the degradation performance of a display device displaying an image,
The system for testing the degradation performance,
A display device accommodating module accommodating a display device, including heating means for heating the display device to a preset test temperature, the heating means being disposed to face the outer surface of the display device in a preset pattern, and having an open portion formed on one side of the display device so that probe pins in contact with respective signal lines of the display device can enter;
a connection portion contacting and connected to the probe pins;
A bi-directional inspection unit connected to the connection unit, inputting test signals to the signal lines, and receiving feedback signals for test results from the signal lines, using information included in the feedback signals in a preset manner to check states of the signal lines; and
a control module connected to the display device accommodating module and the bi-directional inspection unit, controlling the heating means so that the temperature of the inside of the display device accommodation module or the display device reaches the test temperature, and transmitting information about the test temperature to the bi-directional inspection unit; Including,
The two-way inspection unit,
Analyze the electrical information included in the feedback signal according to the change in the test temperature of the display device,
The effective range of the electrical information at the first test temperature is preset,
Checking the state of the signal lines through whether or not the electrical information included in the feedback signal is included within the effective range;
The method,
(a) accommodating the display device in the display device accommodating module and inputting a test temperature to the control module (S110);
(b) operating the heating means of the display device accommodating module to raise the temperature of the inside of the display device accommodating module or the display device to a test temperature (S120);
(c) transmitting a test signal from the bi-directional inspection unit to each signal line of the display device (S130);
(d) analyzing the feedback signal of the test signal in a preset manner to check the state of the signal lines or the display device (S140); and
(e) in the step (d), when the signal lines and the display device are confirmed to be in normal states, separating the display device from the display device accommodating module, and forming the internal temperature of the display device accommodating module as a reference temperature through a cooling means of the display device accommodating module (S150); Including, the degradation performance test method of the display device. The method of claim 1,
The connection part,
a connection block on which upper holes into which the probe pins are respectively inserted are formed, side holes communicating with the upper holes are formed, and the marking device accommodating module is seated thereon so that the probe pins are inserted into the upper holes;
fastening parts including contact pins having one end inserted into the side hole and contacting the probe pin and disposed on a side of the connection block; and
A method for testing degradation performance of a display device including a flexible circuit board portion contacting the other side of the contact pin. The method of claim 1,
The heating means of the display device accommodating module is composed of first to nth heating wires,
The display device accommodating module,
the first to n-th heating wires connected to the heating wire power supply unit; and
a sensor unit that senses a temperature inside the display device accommodating module or a temperature of at least one part of the display device; including,
The control module,
When the temperature sensed by the sensor unit reaches the test temperature, power to the heating wire power supply unit is cut off. The method of claim 3,
The display device accommodating module,
cooling means composed of first to nth cooling lines, forcibly cooling the temperature inside the display device receiving module to a preset temperature, the operation of which is controlled by the control module; Including more,
The first to nth heating wires are arranged in parallel at a predetermined interval, respectively,
A k-th cooling wire is disposed between adjacent heating wires among the first to n-th heating wires,
The control module,
Forming different test temperatures by repeatedly heating or cooling the inside of the display device accommodating module or the display device using the heating means and the cooling means;
The two-way inspection unit,
A method for testing deterioration performance of a display device, wherein states of the signal lines and the display device are checked by repeatedly transmitting and receiving the test signal and a feedback signal of the test signal at each test temperature. delete