KR20220099738A - System for testing signal lines of display devices - Google Patents

Abstract

The present invention is a system for testing deterioration performance of a display device displaying an image, wherein the system for testing includes: a display device accommodating module including a heating means, which heats the display device to a preset test temperature and which is disposed to face an outer surface of the display device in a preset pattern, and having an open portion formed on one side such that probe pins (TC) in contact with each of signal lines of the display device are inserted into the open portion; a connection part connected to and in contact with the probe pins; a bi-directional inspection part connected to the connection part to input a test signal into the signal lines, receiving a feedback signal for a test result from the signal lines, and checking a state of the signal lines by using information included in the feedback signal in a preset manner; and a control module connected to the display device accommodating module and the bi-directional inspection part, controlling the heating means such that the temperature of the inside of the display device accommodating module or the display device reaches the test temperature and transmitting information on the test temperature to the bi-directional inspection part. Accordingly, the system can test all deterioration performances of the display device and the signal lines in advance by detecting a fatal defect of the signal lines at an early stage and at the same time, by simulating an atmosphere similar to an actual situation.

Description

System for testing signal lines of display devices

The present invention relates to a system for testing a signal line of a display device.

As information technology develops, the importance of a display device, which is a connecting medium between users and information, is being emphasized. In response to this, the use of digital display devices such as Liquid Crystal Display Devices and Organic Light Emitting Display Devices is increasing.

In these digital display devices, digital image signals are input to signal lines differently from analog display devices, and images are displayed using liquid crystal, plasma, and organic light emitting materials according to the digital image signals.

The signal lines of the digital display device are mainly formed by a thin film processing process such as a metal film deposition process and a metal film patterning process.

Digital display devices having signal lines to which a digital image signal is input are subjected to a test process after assembly is completed. The operator determines the quality of the digital display by visually inspecting it.

However, when the conventional digital display device is tested in a visual manner, the test is not accurately performed according to the skill level of the operator and the fatigue level of the operator.

In addition, since the test process of the conventional digital display device is performed after the digital display device is completely assembled, the digital display device determined to be defective in the test process cannot be repaired and thus discarded, thereby reducing the yield.

In particular, when the test process is performed after the digital display device is completely assembled, it is difficult to detect fatal defects such as disconnection of signal lines generated during the process of forming the signal lines of the digital display device at an early stage. When the display device is actually used by a user, a problem occurs due to heat generation.

Republic of Korea Patent Publication No. 10-0991367 Republic of Korea Patent Publication No. 10-2188565

In order to solve the above problems, the present invention detects fatal defects of signal lines at an early stage before assembling a digital display device, and at the same time simulates an atmosphere similar to an actual situation in which heat is generated, thereby improving both the degradation performance of the display device and the signal lines. We would like to suggest a technique that can be tested in advance.

The present invention is a system for testing the degradation performance of a display device displaying an image, a display device accommodating module in which the display device is accommodated, comprising a heating means for heating the display device to a preset test temperature, wherein the heating means is previously a display device accommodating module disposed to face an outer surface of the display device in a set pattern, and having an open portion formed on one side to allow probe pins contacting respective signal lines of the display device to enter; a connection part connected to and in contact with the probe pins; A bidirectional inspection unit connected to the connection unit to input a test signal to the signal lines and receive a feedback signal for a test result from the signal lines, using information included in the feedback signal in a preset manner, to determine the state of the signal lines to check, a two-way inspection unit; and a control module connected to the display device accommodating module and the interactive inspection unit, and controls the heating means so that a temperature inside the display device accommodating module or the display device reaches the test temperature, and information on the test temperature a control module that transmits to the interactive inspection unit; wherein the bidirectional inspection unit analyzes the electrical information included in the feedback signal according to a change in the test temperature of the display device, wherein an effective range of the electrical information at a first test temperature is preset, and the feedback signal includes: Provided is a system for testing that checks the state of the signal lines through whether electrical information included in the signal is included in the effective range.

In addition, the connection part has upper holes into which the probe pins are respectively inserted, and a side hole communicating with the upper hole is formed on the side, and the marking is on the upper part so that the probe pins are inserted into the upper holes. a connection block on which the device accommodating module is seated; a fastening part disposed on a side of the connection block, each of which includes contact pins having one end inserted into the side hole and in contact with the probe pin; And it may include a flexible circuit board in contact with the other side of the contact pin.

The heating means of the display device accommodating module includes first to n-th heating wires, and the display device accommodating module includes: the first to n-th heating wires connected to a heating wire power supply; and a sensor unit configured to sense a temperature inside the display device accommodating module or a temperature of at least one portion of the display device. Including, wherein the control module, when the temperature sensed by the sensor unit reaches the test temperature, it is possible to cut off the power supply of the heating wire power supply.

In addition, the display device accommodating module, the display device accommodating module is composed of first to n-th cooling line, the cooling means for forcibly cooling the temperature inside the display device accommodating module to a preset temperature, the operation of which is controlled by the control module; It further includes, wherein the first to n-th heating lines are respectively arranged in parallel with a predetermined interval, and a k-th cooling line is disposed between adjacent heating lines among the first to n-th heating lines, and the The control module uses the heating means and the cooling means to repeatedly heat or cool the inside of the display device accommodating module or the display device to form different test temperatures, and the two-way inspection unit includes: By repeatedly transmitting and receiving a signal and a feedback signal of the test signal, the state of the signal lines and the display device can be checked.

On the other hand, the present invention is a method using the above-described system for testing, comprising: (a) receiving a display device in a display device accommodating module, and inputting a test temperature to the control module (S110); (b) operating the heating means of the display device accommodating module to increase the temperature inside the display device accommodating module or the display device to a test temperature (S120); (c) transmitting a test signal from the bidirectional inspection unit to each signal line of the display device (S130); (d) analyzing the feedback signal of the test signal in a preset manner to check the state of the signal lines or the display device (S140); and (e) in step (d), when the state of the signal lines and the display device is confirmed to be normal, the display device is separated from the display device accommodating module, and the display device accommodating module is cooled through the cooling means. , forming a temperature inside the display device accommodating module as a reference temperature (S150); provides a method comprising

According to the present invention, fatal defects of signal lines are detected early before assembly of the digital display device, and deterioration performance of both the display device and the signal lines can be tested in advance by simulating an atmosphere similar to an actual situation in which heat is generated.

1 schematically shows an overall schematic diagram of a system for testing according to an embodiment of the present invention.
2 schematically illustrates a display device accommodating module and probe pins in a test system according to an embodiment of the present invention.
3 is a block diagram of a system for testing according to an embodiment of the present invention.
4 schematically illustrates a cross-section of a display device accommodating module in a test system according to an embodiment of the present invention.
FIG. 5 is a modified example of the shape of the heating wire of FIG. 3 .
6 is another modified example of the heating wire and the cooling wire of FIG.
7 illustrates an embodiment of a connection part of a system for testing according to an embodiment of the present invention.
8 is a flowchart of a method using the inventive system for testing.

Hereinafter, the present invention will be described in detail with reference to the accompanying drawings and examples. A detailed description thereof has been omitted.

And the terms to be described later are terms defined in consideration of functions in the present invention, which may vary according to the intention or custom of the user or operator. Therefore, the definition should be made based on the content throughout this specification.

A "display device" frequently used in the present invention refers to a digital display device that displays an image by applying a digital image signal to a plurality of signal lines and signal lines, and the "display device" is a liquid crystal display device (LCD). LCD) devices, plasma display panel (PDP) devices, organic light emitting diodes (OLED) devices, and the like. A "display device" frequently used in the present invention may include any device that displays a digital image by providing a digital image signal to a signal line in addition to an LCD device, a PDP device, and an OLED device.

In addition, the "bidirectional inspection apparatus" used in the present invention is defined as a device that provides a test signal to the signal lines of the "display apparatus" and tests the signal lines of the "display apparatus" using a feedback signal fed back from the signal lines.

A system for testing a signal line of a display device according to the present invention will be described with reference to FIGS. 1 to 7 .

The test system includes a display device accommodating module 1000 , a connection unit 100 , a bidirectional inspection unit 200 , and a control module 1040 .

In the present disclosure, components other than the display device accommodating module 1000 will be first described, and then the display device accommodating module 1000 will be described in detail later.

The connection unit 100 electrically connects the display device 200 and the interactive inspection device 300 . The connection unit 100 provides the test signal TS generated from the bidirectional test device 300 to each signal line of the display device 200 , and bidirectionally inspects the feedback signal FS from the signal lines of the display device 200 . Applied to device 300 .

The interactive inspection device 300 tests the display device 200 before the display device 200 is completely assembled using the feedback signal FS provided through the connection unit 100 to determine the quality of each signal line as well as the display device ( 200) is tested.

The connection unit 100 according to an embodiment of the present invention is provided with a connection pin or a wire, so that the signal lines of the display device 200 and the bidirectional inspection device 300 can be electrically connected.

In more detail, the display device accommodating module 1000 includes probe pins TC whose one ends are in contact with the signal lines of the display device 200 , and the connection part 100 contacts the other ends of the probe pins TC. By being connected, the signal lines of the display device 200 and the bidirectional inspection device 300 may be electrically connected.

Referring to FIG. 7 , the connection unit 100 according to another embodiment of the present invention may include a connection block 110 , a connection unit 120 , and a flexible circuit board unit 130 .

The connection block 110 may have the display device accommodating module 1000 seated thereon. In addition, a plurality of upper holes 110p into which the probe pins TC are inserted may be formed in the upper portion of the connection block 110 at positions corresponding to the probe pins TC. In addition, a plurality of side holes 110q communicating with the upper hole 110p may be formed on the side of the connection block 110 .

The fastening part 120 may be fastened to the connection block 110 . In addition, the fastening part 120 may include a base plate 121 , a contact pin 122 , a fastening column 123 , and a fastening bar 124 .

The base plate 121 may be disposed on the side of the connection block 110 .

In addition, the contact pins 122 are spaced apart from each other by a predetermined distance and disposed on the upper portion of the base plate 121 , and one end is inserted into the side hole 110q formed in the connection block 110 to be in contact with the probe pin TC. have.

The fastening posts 123 may be respectively disposed so as to protrude upwardly on both upper side portions of the base plate 121 , and a screw thread may be formed on the side portions.

The fastening bar 124 may have fastening holes 124h formed at positions corresponding to the fastening posts 123 , respectively, and may be inserted into the fastening posts 123 to be seated on the other side of the contact pin 122 . And, before the fastening bar 124 is seated on the other upper portion of the contact pin 122 , one side of the flexible circuit board unit 130 may be seated first.

Then, the fastening nut CN is fastened to the fastening column 123 , and by pressing the fastening bar 124 downward, one side of the flexible circuit board unit 130 may be fixed to the contact pin 122 .

In the flexible circuit board unit 130 , wirings 131 may be formed in the same number as the number of contact pins 122 . In addition, the other side of the flexible circuit board unit 130 may be electrically connected to the bidirectional inspection device 300 . In addition, the flexible circuit board unit 130 may be provided as a flexible insulating plate having a thin thickness. In addition, each of the wirings 131 may be insulated by a solder resist film, and a portion of each wiring 131 connected to a connector may be exposed by an opening of the soldering resist film.

In addition, the flexible circuit board unit 130 may be formed of at least one, preferably a plurality. In addition, the total number of the wirings 131 formed on the flexible circuit board units 130 may be substantially equal to the number of the contact pins 122 .

Accordingly, the connection unit 100 may electrically connect the signal lines of the display device 200 and the bidirectional inspection device 300 , and a short circuit occurs between the signal lines of the display device 200 and the bidirectional inspection device 300 . it can be prevented

In addition, a connection operation between the signal lines of the display device 200 and the bidirectional inspection device 300 can be easily performed.

Referring back to FIG. 1 , the interactive test apparatus 300 generates a plurality of test signals TS to be provided to each signal line of the display device 200 , and connects each test signal TS to the connection unit 100 or the connection unit ( 100) may be provided to each wire 131 of each flexible circuit board unit 130 simultaneously or sequentially.

At this time, each test signal TS generated from the interactive test device 300 is signal lines of the display device 200 corresponding to the test signal TS by the connection part 100 and the probe pins TC, respectively. can be provided.

Subsequently, a feedback signal FS, which is a test result signal, is output from the signal lines of the display device 200 , and the feedback signal FS is transmitted through each probe pin TC and the connection unit 100 to the bidirectional inspection device 300 . is provided, and the bidirectional inspection device 300 determines the quality of the signal lines using the feedback signal FS.

In an embodiment of the present invention, each of the signal lines, the connection unit 100 and the bidirectional inspection device 300 may be connected in a serial manner, and the test signal ( TS) is input and a feedback signal FS from each signal line is received by the bidirectional inspection device 300 to quickly and accurately test whether individual signal lines of the display device 200 are defective.

The connection unit 100 connects the signal lines of the display device 200 and the bidirectional test device 300 one-to-one, so that the test signal TS from the bidirectional test device 300 is applied to the signal lines and the feedback signal from the signal lines ( FS) as the interactive inspection device 300 to electrically test each signal line to further improve test accuracy, and to test the display device 200 for each unit process before completely assembling the display device 200 . have an effect

1 and 3, the display device accommodating module 1000 of the present invention will be described. The display device accommodating module 1000 includes a heating means 1010 and a cooling means 1020 , and has a housing structure in which the display device 200 is inserted therein. In order to insert the display device 200 inside and for the probe pins TC to come into contact with the respective signal lines of the display device, one side portion is opened.

The heating means consists of first to n-th heating wires, which are connected to the heating wire power supply unit 1011 to receive power. Here, as an example, the heating wire may be configured as a hot wire coil, and may be formed on the inner surface of the display device accommodating module 1000 , thereby increasing the temperature inside the display device accommodating module 1000 , and further, the display device (200) can raise its own temperature.

As described above, the reason for increasing the temperature of the display device by using the heating wire is that heat may act as the biggest problem when a user actually uses the display device. When the display device 200 is heated by internal heat or sunlight, it is very important to check whether an element or signal line inside the display device 200 operates normally. There was a problem that the test was not performed at the temperature of Since users have different usage environments, a lot of problems with heat generation occur in the actual use process. By performing a test by simulating an atmosphere similar to such an environment, the above problem can be prevented in advance.

The display device accommodating module 1000 includes a sensor unit (not shown) configured to sense a temperature inside the display device accommodating module or a temperature of at least one portion of the display device. The sensor unit is connected to the control module 1040 to transmit temperature information to the control module 1040 , and when the temperature sensed by the sensor unit reaches the test temperature, the power of the heating wire power supply unit 1011 is cut off.

Referring to FIG. 1 , in the display device accommodating module 1000 , heating wires 1010 , 1012 , 1014 , and 1016 are disposed to surround the outer surface of the inserted display device 200 . Although the state seen from the top is shown in FIG. 1 , the display device 200 is disposed to surround not only the upper part but also the lower part of the display device 200 . In addition, the display device accommodating module 1000 is further provided with a cooling means 1020 . The cooling means 1020 is composed of first to n-th cooling wires 1020 , 1022 , 1024 and 1026 , and forcibly cools the temperature inside the display device accommodating module to a preset temperature, and is controlled by the control module 1040 . motion is controlled.

At this time, the first to n-th heating wires (1010, 1012, 1014, 1016) are respectively arranged in parallel with a predetermined interval, the first to n-th heating wires (1010, 1012, 1014, 1016) of the neighboring A kth cooling line is disposed between one heating line. That is, the heating wire-cooling wire-heating wire-cooling wire may be configured as an example in order.

The cooling lines 1020 , 1022 , 1024 , and 1026 may be very usefully used when the test for the same display device 200 is repeated. When the test of the display device 200 or the signal line is performed while the test temperature is changed, the already heated ones are cooled as quickly as possible to form an initial state again. To this end, it may be connected to the refrigerant circulation pump 1021, and additionally, a fan means 1030 for cooling may be further provided. The cooling wires 1020 , 1022 , 1024 , and 1026 may be configured as a flow path through which the refrigerant flows, unlike the first to n-th heating wires 1010 , 1012 , 1014 , and 1016 described above.

In this case, the interactive test unit 300 may check the state of the signal lines and the display device by repeatedly transmitting and receiving the test signal and the feedback signal of the test signal at each test temperature. As an example, the interactive test unit 300 may determine an abnormal state using voltage information, current information, etc. included in the feedback signal of the test signal. In this application, these are collectively referred to as 'electrical information'. The interactive inspection unit 300 analyzes the electrical information included in the feedback signal according to the change in the test temperature of the display device, but the effective range of the electrical information at the first test temperature is preset, and the electrical information included in the feedback signal is configured to check the state of the signal lines through whether or not is included within the effective range. The effective range of the electrical information may be set differently for each test temperature.

The control module 1040 includes a display device temperature setting unit 1042 , a heating wire operation unit 1044 , and a cooling wire operation unit 1046 . The test temperature is input to the display device temperature setting unit 1042 . The test temperature may be automatically input, and it is preferable that related laws and regulations are further considered when inputting.

4 to 6, a modified example of the arrangement of the heating wire and the cooling wire according to the present invention will be described, focusing on the differences.

4 shows a structure in which heating wires 1010 , 1012 , 1014 , and 1016 and cooling wires 1020 , 1022 , 1024 , and 1026 are alternately arranged, and a sidewall is positioned between the heating wire and the cooling wire.

5 also has a structure in which the heating wires 1110 , 1112 , 1114 and the cooling wires 1120 , 1122 , 1124 are alternately arranged, but has a structure in which the area of the heating wire at the center is wide. This is to simulate a situation most similar to reality. When a user uses the display device 200 , heat at the center side of the display device 200 may be the most severe. In order to simulate this situation, the width or area of the heating wire 1110 at the center side is formed to be the largest. did it The heating wires 1110 , 1112 , and 1114 are formed to decrease in width from the center toward the outside.

6 shows a concentric circle pattern of heating and cooling wires. The heating wire and the cooling wire are alternately arranged, and the pattern of FIG. 6 is also to simulate the central heating situation of the display device 200 . In the present invention, degradation performance can be evaluated by applying all of the display device accommodating modules 1000 shown in FIGS. 4 to 6 to a single display device 200 .

8 is a flowchart of a test method using the system for testing according to the present invention.

The method consists of steps S110 to S150.

Step S110 is a step in which the display device is accommodated in the display device accommodating module, and a test temperature is input to the control module.

Step S120 is a step in which the heating means of the display device accommodating module is operated to increase the temperature inside the display device accommodating module or the display device to the test temperature.

Step S130 is a step in which a test signal is transmitted from the bidirectional inspection unit to each signal line of the display device.

Step S140 is a step of analyzing the feedback signal of the test signal in a preset manner to check the state of the signal lines or the display device.

In step S150, when the state of the signal lines and the display device is confirmed to be normal in step S140, the display device is separated from the display device accommodating module, and a cooling means of the display device accommodating module is installed. It is a step of forming the temperature inside the display device accommodating module as a reference temperature through the

Here, after step S150 , the state of the display device may be repeatedly checked while raising the temperature inside the display device 200 or the display device accommodating module 1000 from the reference temperature to a predetermined test temperature again. As described above, it is determined whether the display device 200 and the signal line are normal using voltage information, current information, and the like, which are electrical information included in the feedback signal.

In the present invention, the above embodiment is an example, and the present invention is not limited thereto. Anything that has substantially the same configuration as the technical idea described in the claims of the present invention and achieves the same effect is included in the technical scope of the present invention.

100: connection part 110: connection block
120: fastening unit 130: flexible circuit board unit
200: display device 300: two-way inspection device
1000: display device accommodation module 1030: fan means
1040: control module

Claims (5)

A system for testing the degradation performance of a display device that displays an image, comprising:
A display device accommodating module in which a display device is accommodated, comprising a heating means for heating the display device to a preset test temperature, wherein the heating means is disposed to face the outer surface of the display device in a preset pattern, and at one side the a display device accommodating module in which an open portion is formed so that probe pins contacting respective signal lines of the display device are introduced;
a connection part connected to and in contact with the probe pins;
A bidirectional inspection unit connected to the connection unit to input a test signal to the signal lines and receive a feedback signal for a test result from the signal lines, using information included in the feedback signal in a preset manner, to determine the state of the signal lines to check, a two-way inspection unit; and
A control module connected to the display device accommodating module and the bidirectional inspection unit, and controls the heating means so that a temperature inside the display device accommodating module or the display device reaches the test temperature, and information on the test temperature a control module that transmits to the bidirectional inspection unit; includes,
The two-way inspection unit,
Analyze the electrical information included in the feedback signal according to the change in the test temperature of the display device,
The effective range of the electrical information at the first test temperature is preset,
A system for testing a signal line of a display device to check the state of the signal lines through whether the electrical information included in the feedback signal is included in the effective range. The method according to claim 1,
The connection part,
Upper holes into which the probe pins are respectively inserted are formed on the upper portion, side holes communicating with the upper hole are formed on the side, and the marking device accommodating module is seated on the upper portion so that the probe pins are inserted into the upper holes connecting block;
a fastening part disposed on a side of the connection block, each of which includes contact pins having one end inserted into the side hole and in contact with the probe pin; and
A system for testing a signal line of a display device including a flexible circuit board part contacting the other side of the contact pin. The method according to claim 1,
The heating means of the display device accommodating module is composed of first to n-th heating wires,
The display device accommodating module,
the first to n-th heating wires connected to the heating wire power supply; and
a sensor unit configured to sense a temperature inside the display device accommodating module or a temperature of at least one portion of the display device; including,
The control module is
When the temperature sensed by the sensor unit reaches the test temperature, the system for testing a signal line of a display device cuts off the power of the heating line power supply unit. 4. The method of claim 3,
The display device accommodating module,
a cooling means comprising first to n-th cooling lines, forcibly cooling the temperature inside the display device accommodating module to a preset temperature, the operation of which is controlled by the control module; further comprising,
The first to n-th heating wires are respectively arranged in parallel with a predetermined interval,
A k-th cooling line is disposed between adjacent heating lines among the first to n-th heating lines,
The control module is
By repeatedly heating or cooling the inside of the display device accommodating module or the display device using the heating means and the cooling means, different test temperatures are formed,
The two-way inspection unit,
A system for testing signal lines of a display device for checking states of the signal lines and the display device by repeatedly transmitting and receiving the test signal and a feedback signal of the test signal at each test temperature. A method using the system for testing a signal line of a display device according to any one of claims 1 to 4,
(a) the display device is accommodated in the display device accommodating module, and the test temperature is input to the control module (S110);
(b) operating the heating means of the display device accommodating module to increase the temperature inside the display device accommodating module or the display device to a test temperature (S120);
(c) transmitting a test signal from the bidirectional inspection unit to each signal line of the display device (S130);
(d) analyzing the feedback signal of the test signal in a preset manner to check the state of the signal lines or the display device (S140); and
(e) in the step (d), when the state of the signal lines and the display device is confirmed to be normal, the display device is separated from the display device accommodating module, and through the cooling means of the display device accommodating module, forming a temperature inside the display device accommodating module as a reference temperature (S150); A method for testing degradation performance of a display device, comprising:

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