JP2005077169A - Functional inspection device for electronic equipment - Google Patents

Functional inspection device for electronic equipment Download PDF

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JP2005077169A
JP2005077169A JP2003305781A JP2003305781A JP2005077169A JP 2005077169 A JP2005077169 A JP 2005077169A JP 2003305781 A JP2003305781 A JP 2003305781A JP 2003305781 A JP2003305781 A JP 2003305781A JP 2005077169 A JP2005077169 A JP 2005077169A
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liquid crystal
flexible wiring
inspection
crystal display
wiring board
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JP4487519B2 (en
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Yoshitaka Fujita
義高 藤田
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Casio Computer Co Ltd
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Casio Computer Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a function inspecting device capable of coping with a type change of inspection-objective equipment at a low cost, and suitable for the inspection-objective equipment that gets precise and accurate. <P>SOLUTION: The same flexible wiring board 12' as a flexible wiring board mounted on a liquid crystal display panel Lp is installed as a contact member for a contact head Hc in a lighting inspection device of the liquid crystal display panel Lp. The flexible wiring board 12' is insertion-attached removably to a connector 16 fixed to a circuit board 14 provided removably in an elevation block 13, and is provided under the condition where its backface is brought into close contact with the circuit board 14. A tip end part of the flexible wiring board 12' serving as a continuity contact part is elastically supported by a cushioning pad 17. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

本発明は、液晶表示パネル等の高精細電子機器の機能を検査する機能検査装置に関するものである。   The present invention relates to a function inspection apparatus for inspecting the function of a high-definition electronic device such as a liquid crystal display panel.

通常、液晶表示モジュールの製造プロセスにおいては、不良箇所を早期に発見して部材の歩留まりを高め総合的に液晶表示モジュールのコストを低減するために、製造工程の途中で液晶駆動用の信号を液晶表示パネルに入力してその機能検査を行っている。   Usually, in the manufacturing process of a liquid crystal display module, a signal for driving a liquid crystal is displayed during the manufacturing process in order to detect defective parts early and increase the yield of components and reduce the cost of the liquid crystal display module comprehensively. The function is checked by inputting to the display panel.

例えば、駆動回路素子としてのドライバLSIを、液晶表示パネルの接続端子が配列された基板端部に直接搭載したCOG実装方式の液晶表示モジュールにおいては、ドライバLSIをCOG実装した後、外部駆動制御回路基板と電気接続する為のフレキシブル配線基板を対応する接続端子列部にボンディングする前に、ここまでの製造プロセスで発生した不良箇所の有無を確認する機能検査を行う。   For example, in a COG mounting type liquid crystal display module in which a driver LSI as a driving circuit element is directly mounted on an end portion of a substrate on which connection terminals of a liquid crystal display panel are arranged, an external driving control circuit is mounted after the driver LSI is COG mounted. Before bonding the flexible wiring board for electrical connection with the board to the corresponding connection terminal row portion, a function test is performed to check the presence or absence of a defective portion that has occurred in the manufacturing process so far.

上述の機能検査を行う従来の検査装置は、検査対象の液晶表示パネルの各接続端子に導通接触させるコンタクト部材として、必要な本数のプローブを接触させるべき接続端子に対し弾接可能に同じ配列ピッチで設けてなるプローブユニットを備えている(特許文献1参照)。
特開平10−62451号公報
The conventional inspection apparatus that performs the functional inspection described above has the same arrangement pitch so that the necessary number of probes can be brought into contact with each other as a contact member that is in conductive contact with each connection terminal of the liquid crystal display panel to be inspected. (See Patent Document 1).
JP-A-10-62451

従来の上記機能検査装置による場合、検査対象の液晶表示パネルの機種が替わる毎にその接続端子列の端子ピッチや接続端子数が変わるため、機種毎に専用のプローブユニットを準備しておく必要があり、この為のコストが検査装置のコストアップを招く要因となる。   In the case of the above-described conventional functional inspection device, the terminal pitch and the number of connection terminals of the connection terminal row change every time the type of the liquid crystal display panel to be inspected changes, so it is necessary to prepare a dedicated probe unit for each model. There is a cost for this, which increases the cost of the inspection apparatus.

また、通常のプローブの最小ピッチは0.2mm程度であり、これより小さいピッチの接続端子列には特殊なタイプのプローフが必要となり、検査対象製品の接続端子ピッチが細かくなればなる程その機能検査装置のコストは増加し、製品の高精細化に逆行することになる。   In addition, the minimum pitch of a normal probe is about 0.2 mm, and a connection terminal array with a smaller pitch requires a special type of probe, and the function becomes smaller as the connection terminal pitch of the product to be inspected becomes finer. The cost of the inspection apparatus will increase, and this will go against the higher definition of the product.

本発明は、検査対象機器の機種変更に低コストで柔軟に対応でき、高精細化する検査対象機器にも好適な機能検査装置を提供することを課題とする。   An object of the present invention is to provide a functional inspection apparatus that can flexibly cope with a model change of a device to be inspected at low cost and is suitable for a device to be inspected with higher definition.

本発明は、回路基板の一端部に複数の配線が引き出され、これら配線の各接続端子が配列された接続端子列に配線部材が電気接続され、該配線部材を介して外部回路に接続される電子機器の機能を検査する機能検査装置であって、前記電子機器の機能を検査するための検査信号を出力させる検査回路部を備え、前記配線部材と実質的に同一に作製された部材を前記接続端子列に導通接触させるコンタクト部材として用い、該コンタクト部材を介して前記検査回路部と前記接続端子列を導通接続させることを特徴とするものである。   In the present invention, a plurality of wires are drawn out to one end portion of a circuit board, a wiring member is electrically connected to a connection terminal row in which the connection terminals of these wirings are arranged, and is connected to an external circuit via the wiring member. A function inspection apparatus for inspecting a function of an electronic device, comprising: an inspection circuit unit that outputs an inspection signal for inspecting a function of the electronic device; and a member manufactured substantially the same as the wiring member It is used as a contact member that is brought into conductive contact with the connection terminal row, and the inspection circuit portion and the connection terminal row are made conductive through the contact member.

本発明の電子機器の機能検査装置によれば、検査対象機器の検査信号を入力させる接続端子列に導通接触させるコンタクト部材として、その検査対象機器の製品において外部回路との接続端子列に電気接続される配線部材と同一に製造された部材つまり同じ製造ロットの配線部材を用いるから、機種毎に専用のコンタクト部材を準備する必要がなく、その分コストが低減されると共に、接続端子ピッチが微細な高精細機器の機能検査にも低コストで対応可能となる。   According to the function inspection apparatus for an electronic device of the present invention, as a contact member for conducting contact with a connection terminal row for inputting an inspection signal of the device to be inspected, electrical connection to a connection terminal row with an external circuit in the product of the device to be inspected Since a member manufactured in the same way as the wiring member to be manufactured, that is, a wiring member of the same production lot is used, there is no need to prepare a dedicated contact member for each model, and the cost is reduced correspondingly, and the connection terminal pitch is fine. It is possible to cope with functional inspection of high-definition equipment at low cost.

本発明の電子機器の機能検査装置は、電極が形成された一対の基板間に液晶が挟持されてなる液晶表示パネルの機能検査に好適であり、且つ、液晶表示パネルの基板端部の接続端子列に電気接続される配線部材がフレキシブル配線基板である場合、このフレキシブル配線基板は機能検査装置のコンタクト部材として好適であり、接続端子列に対して常に安定して確実に導通接触させることができる。   The electronic apparatus functional inspection apparatus of the present invention is suitable for a functional inspection of a liquid crystal display panel in which liquid crystal is sandwiched between a pair of substrates on which electrodes are formed, and a connection terminal at the substrate end of the liquid crystal display panel When the wiring member electrically connected to the row is a flexible wiring substrate, this flexible wiring substrate is suitable as a contact member of the function inspection device, and can always be stably and reliably in contact with the connection terminal row. .

また、コンタクト部材がフレキシブル配線基板である場合は、機能検査装置にフレキシブル配線基板を加温するヒーターとフレキシブル配線基板の温度を検知する熱電対を設け、熱電対の温度検知信号に応じてヒーターへの通電を制御することにより、フレキシブル配線基板の温度を適正範囲内に保持する構成とすることが好ましく、これにより、コンタクト部材として用いるフレキシブル配線基板がボンディングの際の加熱による接続端子側基板との膨張率の差に起因する位置ズレを補償するために予め配線ピッチを小さくしたものである場合でも、位置ズレなく接続端子列に導通接触させることができる。   When the contact member is a flexible wiring board, a heater for heating the flexible wiring board and a thermocouple for detecting the temperature of the flexible wiring board are provided in the functional testing device, and the heater is sent to the heater according to the thermocouple temperature detection signal. It is preferable that the temperature of the flexible wiring board be maintained within an appropriate range by controlling the energization of the flexible wiring board, whereby the flexible wiring board used as the contact member is connected to the connection terminal side board by heating during bonding. Even when the wiring pitch is reduced in advance in order to compensate for the positional deviation due to the difference in expansion coefficient, the connection terminal row can be brought into conductive contact without positional deviation.

図1は、本発明の実施形態としての液晶表示パネルの機能検査装置とこれによる機能検査動作を示す模式的断面図で、図2は検査対象の液晶表示パネルからなる液晶表示モジュールを示す斜視図である。   FIG. 1 is a schematic cross-sectional view showing a function testing device for a liquid crystal display panel and a function testing operation using the same as an embodiment of the present invention, and FIG. 2 is a perspective view showing a liquid crystal display module comprising a liquid crystal display panel to be tested. It is.

まず、本機能検査装置の検査対象の液晶表示パネルからなる液晶表示モジュールについて説明する。図2に示されるように、本実施形態に係わる液晶表示モジュールMLは、液晶表示パネルLpにドライバLSIを実装する方式としてCOG(Chip On Glass)方式が採用されたものである。即ち、液晶を挟持する一対のガラス基板1、2のうちの一方のガラス基板2の一端部を他方のガラス基板1の対応する端面から突出させ、この突出部2aにドライバLSI3がCOG実装されている。   First, a liquid crystal display module including a liquid crystal display panel to be inspected by the functional inspection apparatus will be described. As shown in FIG. 2, the liquid crystal display module ML according to the present embodiment employs a COG (Chip On Glass) system as a system for mounting a driver LSI on the liquid crystal display panel Lp. That is, one end of one glass substrate 2 of the pair of glass substrates 1 and 2 sandwiching the liquid crystal is projected from the corresponding end surface of the other glass substrate 1, and the driver LSI 3 is COG mounted on the projected portion 2a. Yes.

検査対象の液晶表示パネルLpは、図1に示されるように、一対のガラス基板1、2をそれぞれの電極4、5が形成された面を対向させてシール材6で接合し、この各電極形成面とシール材6で囲まれた空間に、液晶Lを封入してなる。なお、両ガラス基板1、2の各電極形成面には、液晶分子の配向を規制する配向膜7、8がそれぞれ被着されている。   As shown in FIG. 1, the liquid crystal display panel Lp to be inspected is formed by joining a pair of glass substrates 1 and 2 with a sealing material 6 with the surfaces on which the electrodes 4 and 5 are formed facing each other. The liquid crystal L is sealed in a space surrounded by the formation surface and the sealing material 6. In addition, alignment films 7 and 8 for regulating the alignment of liquid crystal molecules are respectively deposited on the electrode formation surfaces of the glass substrates 1 and 2.

また、本実施形態の液晶表示パネルLpは、両ガラス基板1、2にそれぞれ設けられた電極4、5に対応する各接続端子を一方のガラス基板2側にまとめて配置したものであり、ガラス基板2の突出部2aに双方の電極4、5にそれぞれ接続されたリード配線9が引き出され、各リード配線9の各接続端子9aが配置されたチップ搭載エリアにドライバLSI3が異方性導電接着材10を介してCOG搭載されている。   Further, the liquid crystal display panel Lp of the present embodiment is one in which the connection terminals corresponding to the electrodes 4 and 5 provided on the glass substrates 1 and 2 are arranged together on one glass substrate 2 side, Lead wirings 9 connected to both electrodes 4 and 5 are drawn out from the projecting portion 2a of the substrate 2, and the driver LSI 3 is anisotropically conductively bonded to the chip mounting area where the connection terminals 9a of the lead wirings 9 are arranged. The COG is mounted via the material 10.

チップ搭載エリアの入力ポートから突出部2aの突出側端部に向けて、複数の入力配線11が配設され、突出部2a端部には、各入力配線11の外部接続端子11aが所定のピッチで配列されている。この外部接続端子11aには、図2に示すように、外部駆動制御回路(不図示)と液晶表示パネルLpを電気接続するフレキシブル配線基板12が接続されている。なお、本発明に係わる機能検査は、上記フレキシブル配線基板12を取り付ける前に行う。   A plurality of input wirings 11 are arranged from the input port in the chip mounting area toward the projecting side end of the projecting portion 2a, and the external connection terminals 11a of each input wiring 11 have a predetermined pitch at the projecting portion 2a end. Are arranged in As shown in FIG. 2, a flexible wiring board 12 that electrically connects an external drive control circuit (not shown) and the liquid crystal display panel Lp is connected to the external connection terminal 11a. The function inspection according to the present invention is performed before the flexible wiring board 12 is attached.

次に、本実施形態の機能検査装置について説明する。
本機能検査装置は、図1に示すように、大略、コンタクトヘッド部Hcと検査信号を出力するテスター部Tからなる。
Next, the function inspection apparatus of this embodiment will be described.
As shown in FIG. 1, this functional inspection device is generally composed of a contact head portion Hc and a tester portion T that outputs an inspection signal.

コンタクトヘッド部Hcでは、図示しない駆動機構により昇降される昇降ブロック13の下面に回路基板14が例えばネジ止め等の方法により適宜取り外し可能に設置され、この回路基板14はテスター部Tの検査信号発生回路15に電気接続されている。そして、回路基板14の下面には、コンタクト部材として、製品としての液晶表示モジュールに設置される上述のフレキシブル配線基板12と実質的に同一に製造されたフレキシブル配線基板12´が、コネクタ16を介して着脱自在に設置されている。ここで、実質的に同一に製造されたフレキシブル配線基板12´とは、フレキシブル配線基板12として製造されたものであるがコンタクト部材として使用するもののことである。   In the contact head portion Hc, the circuit board 14 is detachably installed on the lower surface of the elevating block 13 that is raised and lowered by a driving mechanism (not shown), for example, by screwing or the like. The circuit 15 is electrically connected. On the lower surface of the circuit board 14, a flexible wiring board 12 ′ manufactured as substantially the same as the above-described flexible wiring board 12 installed in a liquid crystal display module as a product is provided as a contact member via a connector 16. It is installed detachably. Here, the flexible wiring board 12 ′ manufactured substantially in the same manner is a board manufactured as the flexible wiring board 12 but used as a contact member.

フレキシブル配線基板12´は、そのベースフィルム12´a側表面を回路基板14に密着させ、配線12´bが形成された表面を下方に向けた状態で、一方の端部がコネクタ16内に着脱自在に挿着されている。これにより、フレキシブル配線基板12´の配線12´bと回路基板14の対応する配線(不図示)とが導通接続される。   The flexible wiring board 12 'has its base film 12'a side surface in close contact with the circuit board 14, and one end of the flexible wiring board 12' is attached to and detached from the connector 16 with the surface on which the wiring 12'b is formed facing downward. It is inserted freely. Thereby, the wiring 12′b of the flexible wiring board 12 ′ and the corresponding wiring (not shown) of the circuit board 14 are conductively connected.

そして、フレキシブル配線基板12´のコネクタ16に挿着される端部とは反対側の端部は、回路基板14の端面から突出させてあり、この突出部12´cが検査対象の液晶表示パネルLpの外部回路接続端子11aに対する導通接触部となる。この突出させた導通接触部12´cと昇降ブロック13の下面との間には、ゴム等の弾性材からなる緩衝パッド17が介装されている。なお、フレキシブル配線基板12´の配線12´b形成面には図示しない絶縁保護膜が被着されているが、導通接触部12´aには絶縁保護膜が被着されず、各配線12´bが露出している。   The end of the flexible wiring board 12 'opposite to the end inserted into the connector 16 protrudes from the end face of the circuit board 14, and this protrusion 12'c is the liquid crystal display panel to be inspected. Lp is a conductive contact portion for the external circuit connection terminal 11a. A buffer pad 17 made of an elastic material such as rubber is interposed between the protruding conduction contact portion 12 ′ c and the lower surface of the lifting block 13. An insulating protective film (not shown) is attached to the surface of the flexible wiring board 12 'where the wiring 12'b is formed, but the insulating protective film is not attached to the conductive contact portion 12'a. b is exposed.

フレキシブル配線基板12´が設置される回路基板14の下面には、フレキシブル配線基板12´の設置位置を決めるための位置決めピン18を突出させてある。この位置決めピン18は、昇降ブロック13の下面の所定位置に立設され、回路基板14を貫通させてその下面から突出させてある。この位置決めピン18の突出先端部に、フレキシブル配線基板12´に穿設されている位置決め孔12´dを通すことにより、一端部をコネクタ16に挿着されたフレキシブル配線基板12´のコンタクトヘッドHcにおける設置位置が確定する。   On the lower surface of the circuit board 14 on which the flexible wiring board 12 'is installed, positioning pins 18 for determining the installation position of the flexible wiring board 12' are projected. The positioning pin 18 is erected at a predetermined position on the lower surface of the elevating block 13 and penetrates the circuit board 14 and protrudes from the lower surface. By passing a positioning hole 12'd formed in the flexible wiring board 12 'through the protruding tip of the positioning pin 18, the contact head Hc of the flexible wiring board 12' having one end inserted into the connector 16 is inserted. The installation position at is determined.

次に、本機能検査機による液晶表示パネルの点灯機能検査動作について、図1に基づき説明する。
まず、コンタクト部材とする上述のフレキシブル配線基板12´をコンタクトヘッドHcに装着する。この場合、フレキシブル配線基板12´の導通接触部とする端部とは反対側の端部をコネクタ16内に確実に挿着した後、位置決め孔12´cを位置決めピン18に通してフレキシブル配線基板12´のコンタクトヘッドHcにおける設置位置を確定させ、図示しない固定ピンにより回路基板14の下面に密着させた状態で固定する。
Next, the lighting function testing operation of the liquid crystal display panel by the function testing machine will be described with reference to FIG.
First, the above-described flexible wiring board 12 ′ as a contact member is mounted on the contact head Hc. In this case, after the end of the flexible wiring board 12 ′ opposite to the end serving as the conductive contact portion is securely inserted into the connector 16, the positioning hole 12 ′ c is passed through the positioning pin 18 and the flexible wiring board. The installation position in the contact head Hc of 12 'is fixed and fixed in a state of being in close contact with the lower surface of the circuit board 14 by a fixing pin (not shown).

次に、検査対象の液晶表示パネルLpを所定の検査台(不図示)上に載置し、ガラス基板1、2の端面を基準として位置決めを行う。これにより、フレキシブル配線基板12´の導通接触部12´cにおける各配線12´bつまり各接続端子とこれらに対応する液晶表示パネルLpの各外部回路接続端子11aとがそれぞれ対向した配置となる。なお、検査対象が高精細液晶表示パネルの場合は、撮像カメラによる接続端子同士の位置決めを行うことが好ましい。   Next, the liquid crystal display panel Lp to be inspected is placed on a predetermined inspection table (not shown), and positioning is performed with reference to the end surfaces of the glass substrates 1 and 2. Thereby, each wiring 12'b, that is, each connection terminal in the conductive contact portion 12'c of the flexible wiring board 12 'is arranged to face each external circuit connection terminal 11a of the liquid crystal display panel Lp corresponding thereto. Note that when the inspection object is a high-definition liquid crystal display panel, it is preferable to position the connection terminals by an imaging camera.

この後は、昇降ブロック13等と一体にフレキシブル配線板12´を下降させ、各配線12´bの接続端子部を液晶表示パネルLpの対応する各外部回路接続端子11aに当接させる。このとき、フレキシブル配線板12´の下降ストロークを若干大き目に設定し、各配線12´bの接続端子部12´cを対応する各外部回路接続端子11aに対して緩衝パッド17の弾発力により弾接させる。これにより、各配線12´bの接続端子部12´cを対応する各外部回路接続端子11aに対し、常に充分な接触面積を確保して適正に導通接触させることができる。   Thereafter, the flexible wiring board 12 'is lowered integrally with the elevating block 13 and the like, and the connection terminal portion of each wiring 12'b is brought into contact with the corresponding external circuit connection terminal 11a of the liquid crystal display panel Lp. At this time, the downward stroke of the flexible wiring board 12 'is set slightly larger, and the connection terminal portion 12'c of each wiring 12'b is caused by the elasticity of the buffer pad 17 with respect to each corresponding external circuit connection terminal 11a. Let it come into contact. As a result, the connection terminal portions 12'c of the wirings 12'b can always be in proper conductive contact with the corresponding external circuit connection terminals 11a while ensuring a sufficient contact area.

上述したコンタクトヘッドHc側の各接続端子部12´cを対応する各外部回路接続端子11aに対し適性に導通接触させた状態下で、テスター部Tの検査信号発生回路15から検査信号を出力させて液晶表示パネルLpを点灯させ、画素欠陥の有無を点検する。   An inspection signal is output from the inspection signal generation circuit 15 of the tester unit T in a state in which the connection terminal portions 12′c on the contact head Hc side are appropriately brought into conductive contact with the corresponding external circuit connection terminals 11a. The liquid crystal display panel Lp is turned on to check for pixel defects.

次に、検査対象の液晶表示パネルを種類の異なるものに変える。新たな検査対象の液晶表示パネルは、図3に示すように、TAB/COF実装方式の液晶表示パネルLp´である。即ち、外部駆動制御回路に電気接続する配線部材として、駆動回路素子のドライバLSI21が配線パターンが形成されたフィルムシート22上にCOF(Chip On Film)方式で直接搭載されたTAB(Tape Automated Bonding)配線シート20を用いている。   Next, the liquid crystal display panel to be inspected is changed to a different type. As shown in FIG. 3, the new liquid crystal display panel to be inspected is a TAB / COF mounting type liquid crystal display panel Lp ′. That is, as a wiring member to be electrically connected to an external drive control circuit, a TAB (Tape Automated Bonding) in which a driver LSI 21 of a drive circuit element is directly mounted by a COF (Chip On Film) method on a film sheet 22 on which a wiring pattern is formed. A wiring sheet 20 is used.

TAB配線シート20は、前の検査対象液晶表示パネルで用いた配線部材のFPCとは外形が大きくことなる配線部材であり、前の検査で用いたコネクタ16にTAB配線シート20を挿着できない。従って、コネクタ16を回路基板14と共にTAB配線シート20が挿着できるものに取り換える。   The TAB wiring sheet 20 is a wiring member whose outer shape is greatly different from the FPC of the wiring member used in the previous liquid crystal display panel to be inspected, and the TAB wiring sheet 20 cannot be inserted into the connector 16 used in the previous inspection. Therefore, the connector 16 is replaced with a circuit board 14 to which the TAB wiring sheet 20 can be inserted.

取り換えられたコネクタにTAB配線シート20を挿着した後は、上記液晶表示パネルLpのときと同じ手順で点灯機能検査を行えばよい。   After the TAB wiring sheet 20 is inserted into the replaced connector, the lighting function test may be performed in the same procedure as that for the liquid crystal display panel Lp.

以上のように、本実施形態の機能検査装置によれば、検査対象の液晶表示パネルを液晶表示モジュールとして製品化するときに実装される配線部材を機能検査装置のコンタクト部材として使用するから、検査対象液晶表示パネルの機種毎に専用のコンタクト部材を準備しておく必要がなく、多機種の製品の機能検査に適用可能で汎用性に優れると共に、配線の接続端子ピッチが極めて細かい高精細な電子機器製品の機能検査にも好適な機能検査装置を、低コストで提供可能となる。   As described above, according to the functional inspection device of the present embodiment, the wiring member mounted when the liquid crystal display panel to be inspected is commercialized as a liquid crystal display module is used as a contact member of the functional inspection device. There is no need to prepare a dedicated contact member for each target LCD panel model, and it can be applied to the function inspection of many types of products. It has excellent versatility, and the wiring connection terminal pitch is extremely fine. It is possible to provide a functional inspection device suitable for functional inspection of equipment products at a low cost.

次に、上記液晶表示パネル用機能検査装置の変形例について、図4に基づき説明する。
本変形例の機能検査装置は、上述の実施形態の機能検査装置に、コンタクト部材を加温するヒータ24と、そのコンタクト部材の温度を検知する熱電対25を、新たに設けたものである。
Next, a modification of the liquid crystal display panel function testing device will be described with reference to FIG.
The function inspection apparatus of this modification is a function inspection apparatus according to the above-described embodiment in which a heater 24 for heating a contact member and a thermocouple 25 for detecting the temperature of the contact member are newly provided.

すなわち、昇降ブロック13の先端部に電熱ヒータ24を内蔵し、昇降ブロック13の先端面には熱電対25が設置されている。従って、熱電対25による温度検知信号に応じて電熱ヒータ24がオン・オフ制御されることにより、コンタクト部材として設置されたフレキシブル配線基板26のうち、少なくとも電熱ヒータ24と熱電対25の検温部25aに近い導通接触部(配線26bの接続端子部)26cが一定の温度範囲内に加温され保持される。   That is, an electric heater 24 is built in the tip of the lift block 13, and a thermocouple 25 is installed on the tip surface of the lift block 13. Accordingly, the electric heater 24 is controlled to be turned on / off in accordance with a temperature detection signal from the thermocouple 25, so that at least the electric heater 24 and the temperature detecting portion 25a of the thermocouple 25 among the flexible wiring boards 26 installed as contact members. The conductive contact portion (connection terminal portion of the wiring 26b) 26c close to is heated and held within a certain temperature range.

本変形例の機能検査装置は、フレキシブル配線基板26がボンディング時に加熱圧着された際に熱膨張して接続端子ピッチが広がることを見込んでその分だけ小さく形成されたものである場合に、好適に用いられる。   The functional inspection device of the present modification is suitably used when the flexible wiring board 26 is formed so as to be smaller by expecting that the connection terminal pitch widens due to thermal expansion when the flexible wiring board 26 is heat-bonded during bonding. Used.

接続端子ピッチがボンディング時に熱膨張することを前提にその分だけ小さく形成されたフレキシブル配線基板26をコンタクト部材として使用する場合、そのフレキシブル配線基板26を加温せずに機能検査を行うと位置ズレが発生し、検査対象液晶表示パネルの各接続端子にフレキシブル配線基板26の対応する各配線26bの接続端子部26cを導通接触させることができない。   When the flexible wiring board 26 formed so as to be small by that amount is used as a contact member on the assumption that the connection terminal pitch is thermally expanded at the time of bonding, if the functional inspection is performed without heating the flexible wiring board 26, the positional deviation will occur. Therefore, the connection terminal portions 26c of the corresponding wirings 26b of the flexible wiring board 26 cannot be brought into conductive contact with the connection terminals of the liquid crystal display panel to be inspected.

しかし、本変形例の機能検査装置によれば、フレキシブル配線基板26がボンディング時における熱膨張を見込んだものである場合は、その少なくとも導通接触部の接続端子部26cを実装時のボンディングの際に加温される温度と同程度に加温することができるから、常に位置ズレを起こすことなく検査対象液晶表示パネルの各接続端子にフレキシブル配線基板26の対応する接続端子部26cを確実に導通接触させることができる。   However, according to the functional inspection device of the present modification, when the flexible wiring board 26 is for thermal expansion during bonding, at least the connection terminal portion 26c of the conductive contact portion is used during bonding during mounting. Since it can be heated to the same temperature as the temperature to be heated, the corresponding connection terminal portion 26c of the flexible wiring board 26 is surely brought into conductive contact with each connection terminal of the liquid crystal display panel to be inspected without causing any positional deviation. Can be made.

なお、本発明は、上述した実施形態に限定されるものではない。例えば、上記実施形態においては、コンタクト部材としてのフレキシブル配線基板12´の配線12´bのうちの導通接触部となる接続端子12´cを検査対象液晶表示パネルLpの外部接続端子11aに直接接触させているが、異方性導電シート等の導通接合部材を介して接触させる構成としてもよく、これにより、導通接触部の接続端子12´cが検査回数を重ねるにつれて磨耗する度合いが抑制され、機能検査装置の耐久性が向上する。   In addition, this invention is not limited to embodiment mentioned above. For example, in the above-described embodiment, the connection terminal 12′c, which is the conductive contact portion of the wiring 12′b of the flexible wiring board 12 ′ as the contact member, is in direct contact with the external connection terminal 11a of the liquid crystal display panel Lp to be inspected. However, it may be configured to contact through a conductive bonding member such as an anisotropic conductive sheet, thereby suppressing the degree of wear of the connection terminal 12'c of the conductive contact portion as the number of inspections is repeated, The durability of the function testing device is improved.

また、本発明は、液晶表示パネルの点灯検査装置に限らず、複数の配線の接続端子が微細なピッチで配列され、これを外部駆動制御回路に配線部材を介して電気接続する、電子機器の機能検査装置として広く適用可能である。   Further, the present invention is not limited to a liquid crystal display panel lighting inspection device, but is an electronic device in which a plurality of wiring connection terminals are arranged at a fine pitch and are electrically connected to an external drive control circuit via a wiring member. It is widely applicable as a function inspection device.

本発明の一実施形態としての液晶表示パネルの機能検査装置とその機能検査動作を示す模式的断面図である。FIG. 2 is a schematic cross-sectional view showing a function testing device for a liquid crystal display panel and its function testing operation as an embodiment of the present invention. 上記機能検査装置の検査対象としての液晶表示モジュールを示す斜視図である。It is a perspective view which shows the liquid crystal display module as a test object of the said function test | inspection apparatus. 上記機能検査装置の他の検査対象としての液晶表示モジュールを示す斜視図である。It is a perspective view which shows the liquid crystal display module as another test object of the said function test | inspection apparatus. 上記実施形態の変形例を示す模式的断面図である。It is typical sectional drawing which shows the modification of the said embodiment.

符号の説明Explanation of symbols

1、2 ガラス基板
3、21 ドライバLSI
4 シール材
9 リード配線
11 入力配線
12、 フレキシブル配線基板
12´、26 フレキシブル配線基板(コンタクト部材)
13 昇降ブロック
14 回路基板
15 検査信号発生回路
16 コネクタ
17 緩衝パッド
18 位置決めピン
Lp、Lp´ 液晶表示パネル
Hc コンタクトヘッド部
T テスター部
1, 2 Glass substrate 3, 21 Driver LSI
4 Sealing material 9 Lead wiring 11 Input wiring 12 Flexible wiring board 12 ', 26 Flexible wiring board (contact member)
13 Lifting Block 14 Circuit Board 15 Inspection Signal Generating Circuit 16 Connector 17 Buffer Pad 18 Positioning Pin Lp, Lp ′ Liquid Crystal Display Panel Hc Contact Head Part T Tester Part

Claims (3)

回路基板の一端部に複数の配線が引き出され、これら配線の各接続端子が配列された接続端子列に配線部材が電気接続され、該配線部材を介して外部回路に接続される電子機器の機能を検査する機能検査装置であって、
前記電子機器の機能を検査するための検査信号を出力させる検査回路部を備え、前記配線部材と実質的に同一に製造された部材を前記接続端子列に導通接触させるコンタクト部材として用い、該コンタクト部材を介して前記検査回路部と前記接続端子列を導通接続させることを特徴とする電子機器の機能検査装置。
A function of an electronic device in which a plurality of wires are drawn out to one end portion of a circuit board, a wiring member is electrically connected to a connection terminal row in which connection terminals of these wires are arranged, and is connected to an external circuit through the wiring member A functional inspection device for inspecting
An inspection circuit unit for outputting an inspection signal for inspecting the function of the electronic device, and a member manufactured substantially the same as the wiring member is used as a contact member for conducting contact with the connection terminal row; A function inspection device for an electronic apparatus, wherein the inspection circuit unit and the connection terminal row are conductively connected through a member.
前記電子機器は電極が形成された一対の基板間に液晶が挟持されてなる液晶表示パネルであり、前記配線部材は前記電極に配線接続された接続端子列に導通接続されるフレキシブル配線基板であることを特徴とする請求項1に記載の電子機器の機能検査装置。   The electronic device is a liquid crystal display panel in which liquid crystal is sandwiched between a pair of substrates on which electrodes are formed, and the wiring member is a flexible wiring substrate that is conductively connected to a connection terminal row that is wire-connected to the electrodes. The function inspection apparatus for an electronic device according to claim 1. 前記機能検査装置は、更に、前記フレキシブル配線基板と同一に製造されたコンタクト部材を加温するヒーターと該コンタクト部材の温度を検知する熱電対を備え、前記熱電対の温度検知信号に応じて前記ヒーターへの通電を制御することにより、前記コンタクト部材の温度を所定範囲内に保持することを特徴とする請求項2に記載の電子機器の機能検査装置。   The functional inspection device further includes a heater for heating a contact member manufactured in the same manner as the flexible wiring board, and a thermocouple for detecting the temperature of the contact member, and according to the temperature detection signal of the thermocouple, The electronic device function inspection device according to claim 2, wherein the temperature of the contact member is maintained within a predetermined range by controlling energization to the heater.
JP2003305781A 2003-08-29 2003-08-29 Electronic device functional inspection device Expired - Fee Related JP4487519B2 (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107481654A (en) * 2017-09-08 2017-12-15 武汉精测电子技术股份有限公司 A kind of pressure head for being used to align the FPC of crimping
KR102445050B1 (en) * 2021-03-26 2022-09-21 (주)지엠더블유 Wireless device inspection device equipped with a vibration proof function
KR102445052B1 (en) * 2021-03-26 2022-09-21 (주)지엠더블유 Inspection device equipped with shock absorber

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107481654A (en) * 2017-09-08 2017-12-15 武汉精测电子技术股份有限公司 A kind of pressure head for being used to align the FPC of crimping
CN107481654B (en) * 2017-09-08 2023-10-27 武汉精测电子集团股份有限公司 A pressure head for counterpoint crimping FPC
KR102445050B1 (en) * 2021-03-26 2022-09-21 (주)지엠더블유 Wireless device inspection device equipped with a vibration proof function
KR102445052B1 (en) * 2021-03-26 2022-09-21 (주)지엠더블유 Inspection device equipped with shock absorber

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