KR20060133242A - Liquid cristal display, apparatus of testing the same, and testing method thereof - Google Patents

Abstract

An LCD, a test apparatus thereof, and a test method thereof are provided to reduce a time it takes to measure and analyze resistance and signal patterns of a plurality of electric devices and digital circuits by using a dummy pad on a printed circuit board as a test point. A plurality of driving circuits drive an LCD panel(14). Printed circuit boards(20,21) include a plurality of electronic components supplying a driving signal to the driving circuits, and output pad groups corresponding to the plurality of driving circuits, respectively. At least one test terminal is formed in a dummy region between the output pad groups of the printed circuit board, and tests whether the electronic component is defective or not.

Description

Liquid crystal display device and test device thereof and test method thereof {LIQUID CRISTAL DISPLAY, APPARATUS OF TESTING THE SAME, AND TESTING METHOD THEREOF}

1 is a view showing a conventional liquid crystal display device.

2 is a view for explaining a test method of a conventional liquid crystal display device.

3 is a diagram illustrating a liquid crystal display according to a first embodiment of the present invention.

FIG. 4 is a diagram for describing a test process of an electric element formed on the printed circuit board of FIG. 3.

5 is a view for explaining a test process of a digital device formed on the printed circuit board shown in FIG.

6 is a diagram illustrating a manufacturing process of a printed circuit board of a liquid crystal display module according to a first embodiment of the present invention.

7 is a diagram illustrating a liquid crystal display according to a second embodiment of the present invention.

FIG. 8 is a diagram for describing a test process of at least one of an electric element and a digital element formed on the printed circuit board of FIG. 3.

9 is a flowchart illustrating a test method of the liquid crystal display device according to the first and second embodiments of the present invention.

<Brief Description of Drawings>

10: lower substrate 12: upper substrate

14: liquid crystal display panel 20: source printed circuit board

21: gate printed circuit board 30, 32, 34: test pad

40, 41: first and second connecting means 50, 80: electronic component element

90: test point 101: gate line

102: data line 150: connector

200, 300: probe 210, 310: measuring means

302: cable 500, 502, 504: test line

The present invention relates to a liquid crystal display device, and more particularly, to a liquid crystal display device, a test apparatus thereof, and a test method thereof, which can reduce the time for measuring and analyzing the resistance and signal patterns of each of a plurality of electric elements and digital circuits. will be.

Conventional liquid crystal display devices display an image by adjusting the light transmittance of a liquid crystal having dielectric anisotropy using an electric field. To this end, the liquid crystal display includes a liquid crystal display panel in which liquid crystal cells are arranged in a matrix and a driving circuit for driving the liquid crystal display panel.

In a liquid crystal display panel, liquid crystal cells display an image by adjusting light transmittance according to a pixel signal.

The driving circuit includes a gate driver for driving the gate line of the liquid crystal display panel, a timing controller for controlling the driving timing of the data driver, the gate driver, and the data driver for driving the data lines, and the driving of the liquid crystal display panel and the driving circuits. And a power supply unit for supplying necessary power signals.

Each of the gate driving circuit and the data driving circuits manufactured in a chip form may be mounted in an open area on a tape carrier package (TCP) or mounted on a base film of a TCP by a chip on film (COF) method, and tape automated boninding (TAB). Is electrically connected to the liquid crystal display panel. In addition, the driving circuit may be directly mounted on the liquid crystal display panel using a chip on glass (COG) method. The timing control unit and the power supply unit are manufactured in chip form and mounted on the main printed circuit board.

The plurality of first electronic component elements 80 and the second electronic component elements 50 mounted on the printed circuit board 20 may be formed using a plurality of test points 90 as shown in FIGS. 1 and 2. Measure electrical characteristics and signal patterns. Here, the first electronic component element 80 is, for example, at least one electrical element of a resistor, a capacitor, a diode, and an inductor, and the second electronic component element 50 is, for example, a control signal and data to the driving circuit. And at least one of a timing controller supplying at least one of the power supply units and a power supply unit supplying a power signal to the driving circuit.

The test point 90 is formed to have a wide cross section so as to connect the probe 200.

The probe 200 connected to the measuring instrument 210 is connected to the test point 90 to test the plurality of first electronic component elements 80 and the second electronic component elements 50. Through such a test, it is determined whether the printed circuit board 20 and the first and second electronic component elements 80 and 50 are defective.

Conventionally, as the number of first and second electronic component elements 80 and 50 mounted on the printed circuit board 20 increases, the area occupied by the test point increases in proportion to the size of the printed circuit board.

In addition, since test points are formed at the input / output terminals of each device, it takes a long time to measure all the devices mounted on the printed circuit board 20, and the analysis time of the measured data becomes long.

An object of the present invention is to use a dummy pad on a printed circuit board as a test point, a liquid crystal display device and a test apparatus thereof and a test thereof capable of shortening the measurement and analysis time of resistance and signal patterns of each of a plurality of electric devices and digital circuits. To provide a way.

In addition, since the size of the printed circuit board can be reduced by removing the test point on the printed circuit board, the liquid crystal display module can be made thinner and lighter.

In order to achieve the above object, a liquid crystal display device according to the present invention is formed of a liquid crystal display panel, a plurality of driving circuits for driving the liquid crystal display panel, and a plurality of electronic component elements for supplying a driving signal to the driving circuit. And at least one test terminal formed on a printed circuit board having output pad groups corresponding to each of the plurality of driving circuits and a dummy area between the output pad groups of the printed circuit board to test whether the electronic component is defective. Characterized in that they have.

Specifically, the test terminals may include a test input pad connected through an input terminal and a test input line of the electronic component device, and a test output pad connected through an output terminal and a test output line of the electronic component device.

The electronic component device may include an integrated device including at least one of a timing controller supplying a control signal to the driving circuit and a power supply unit supplying a power signal to the driving circuit, and an electrical device such as a resistor, a capacitor, a diode, or an inductor. At least one of the elements is characterized in that it comprises.

In order to achieve the above object, a test method of a liquid crystal display according to the present invention includes a printed circuit in which at least one electronic component element is formed and at least one test terminal is formed between each of a plurality of driving circuits and corresponding output pad groups. A printed circuit board preparing step of preparing a substrate, a test signal detecting step of supplying a test input signal to the electronic component element through the test terminal to detect a test output signal from the electronic component element through the test terminal; The electronic component device failure determination step of determining whether the electronic component device is defective through the detected test output signal, characterized in that it comprises a.

The detecting of the test signal may include supplying a test input signal to the electronic component through a test input line positioned between a test input pad and the electronic component among the test terminals, and outputting the output terminal of the electronic component. And supplying the test output signal to a test output pad of the test terminals through a connected test output line.

The second step may include supplying the test input signal to the test input pad using a probe and receiving a test output signal through the test output pad using the probe.

Alternatively, the detecting of the test signal may include providing a connector connected to a test input / output pad among the test terminals, supplying a test input signal from the measurement means to the test input pad through the connector; And supplying said test output signal to said measuring means via a connector.

The preparing of the printed circuit board may include providing the printed circuit board on which an integrated device including at least one of a timing controller supplying a control signal to the driving circuit and a power supply unit supplying a power signal to the driving circuit is mounted. Characterized in that it comprises a step.

Further, the printed circuit board step may include providing the printed circuit board on which at least one of a resistor, a capacitor, a diode, and an inductor is formed.

Hereinafter, exemplary embodiments of the present invention will be described with reference to FIGS. 3 to 9.

The liquid crystal display according to the present invention illustrated in FIG. 3 includes a liquid crystal display panel 14, first and second connection means 40 and 41 connected to the liquid crystal display panel 14, and first and second connections. Source and gate printed circuit boards 20 and 21 for supplying a drive signal to the liquid crystal display panel 14 through means 40 and 41 are provided.

The liquid crystal display panel 14 includes upper and lower substrates 12 and 10 bonded to each other with a liquid crystal interposed therebetween. In addition, the liquid crystal display panel 14 includes a plurality of liquid crystal cells Clc disposed in a matrix at the intersections of the data lines 102 and the gate lines 101. Each TFT formed in the liquid crystal cell Clc supplies a data signal supplied from the data lines 102 to the liquid crystal cell Clc in response to a scan signal supplied from the gate line 101.

The first connecting means 40 is connected to the data line 102 formed on the lower substrate 10. The second connection means 41 is connected to the gate line 101 formed on the lower substrate 10. The first and second connection means 40 and 41 are formed of a flexible printed circuit board when the driving circuit is mounted on the liquid crystal display panel 14. On the other hand, when the driving circuit is not mounted on the liquid crystal display panel 14, the first and second connection means 40 and 41 are formed of a tape carrier package (TCP) in which the driving circuit is mounted.

The gate printed circuit board 21 supplies a gate control signal and a gate power signal mounted on each of the timing controller and the power supply unit to the gate driving circuit through the second connection means 41.

The timing control part and the power supply part are mounted on the source printed circuit board 20. The timing controller supplies R, G, and B data and data control signals to the data driving circuit through the first connection means 40. The power supply unit supplies a data power signal to the data driving circuit through the first connection means 40.

The printed circuit boards 20 and 21 are formed with output pad groups 30 connected to the first and second connection means 40 and 41 spaced apart at predetermined intervals. The output pad groups 30 correspond to each of the plurality of driving circuits.

In addition, as illustrated in FIGS. 4 and 5, the printed circuit boards 20 and 21 include a test pad 30 formed in a dummy region between the output pad groups 30, the test pad 30, and the first pad. And a test line 500 connected to each of the second electronic component devices 80 and 50.

The test pad 30 includes a test input pad 32 connected to the test input line 502 and a test output pad 34 connected to the test output line 504.

The test input pad 32 is supplied with a test input signal from the measuring means via a probe. The test input signal is supplied to each of the plurality of first and second electronic component elements 80 and 50 through the test input pad 32 and the test input line 502.

The test output pad 504 is supplied with a test output signal generated at each of the plurality of first and second electronic component devices 80 and 50 through the test output line 504. This test output signal is supplied to the measuring means via a probe.

Meanwhile, the above-described printed circuit boards 20 and 21 are manufactured according to the flowchart shown in FIG.

In the Computer Aided Manufacturing (CAM) process (K10), a test line is designed to connect a plurality of electric and digital devices and test pads. Thereafter, the film to be printed on the printed circuit board is manufactured and developed based on the data designed in the cam process K10 through the film K11 process. Then, a drilling step (K12) for forming a hole for inserting each of the first and second electronic component elements 80 and 50 is performed.

Then, the plating process (K13) for plating the conductive metal and the laminating process (K14) for coating the photosensitive film on the plated printed circuit board are performed, followed by exposure (K15), development (K16), peeling (K17) and nicking. The wiring is formed on the printed circuit board through the step (K18). Since the formed wiring has no insulation coating, shortening of the wiring between the wirings causes problems such as short circuits and misconnections between the wirings. Thus, the photo solder mask process (K19) is performed to insulate the electrodes. In addition, it is preferable to silk-print (K20) the part number of each device on each wiring so that the voltage level and the input / output direction of the signal to be applied during the test are not changed.

As described above, the liquid crystal display according to the first exemplary embodiment of the present invention measures the electrical characteristics of the plurality of first electronic component elements 80 mounted on the printed circuit board 20 to test the presence or absence of normal operation. do. A test line 500 connecting the input / output terminals of the plurality of electronic component elements to be measured with the test pad 30 may be formed to simultaneously test electrical characteristics of the plurality of electronic component elements. In the first electronic component device 80, electrical characteristics such as resistance and current change according to the applied voltage.

At this time, the printed circuit board 20 is an output pad group and an output line and a plurality of first and second electrons which are connected to an input terminal of the connecting means 40 connected to the liquid crystal display panel to normally operate the liquid crystal display device. The test pad and the test line formed for the purpose of testing the component elements 80 and 50 are preferably manufactured in multiple layers so that a short circuit does not occur between each other.

In this way, a predetermined signal is applied to the test input pads to compare the signals output through the test output pads, and the existence and problems of the first and second electronic component elements 80 and 50 are checked.

7 is a diagram illustrating a liquid crystal display according to a second exemplary embodiment of the present invention.

The liquid crystal display illustrated in FIG. 7 includes the same components except that the LCD 150 further includes a connector 150 formed in a dummy region between the output pad groups as compared to the liquid crystal display illustrated in FIG. 4. Accordingly, detailed description of the same components will be omitted.

The connector 150 is connected to at least one of the test line 500 and the test pad. This connector 150 supplies the test input signal from the measuring means 310 to the test input line 502 via the cable 302 as shown in FIG. Then, the connector 150 supplies the test output signal from the test output line 504 to the measuring means 310. Through such a connector 150 to test the electrical devices individually or to test a plurality of electrical devices to be tested at the same time to store or output the measurement data.

As in the present invention, by removing the test points formed to measure the electrical characteristics of the first and second electronic component elements and forming test lines and connectors in the dummy area, the size of the printed circuit board can be reduced, and the test is performed. You can run it in a short time.

In addition, by inputting the programmed test input signal to compare the output test output signal can be easily and quantitatively determine whether there is a defect.

Next, a test method of the liquid crystal display according to the present invention will be described in detail with reference to FIG. 9.

First, a test pad including a test input pad and a test output pad is formed in a dummy region between output pad groups of a printed circuit board (S10). In addition, a test line including a test input line and a test output line is formed between each of the input / output terminals of at least one of the plurality of first and second electronic component elements and the test pad (S20). The test input signal is supplied to at least one of the first and second electronic component devices 80 and 50 using the test pad and the test line (S30). Here, the test input signal is a signal voltage level at which the first and second electronic component elements used in the actual liquid crystal display device operate or a voltage level higher than the actual operation signal voltage level so that the threshold voltage of the module may be measured.

Then, the first and second electronic component devices supply the test output signal generated by using the test input signal to the measurement terminal through the test line and the test pad (S40). The measurement terminal compares and analyzes the test input signal and the test output signal to determine whether there is a defect (S50). That is, the measurement terminal may check the normal operation state by measuring electrical characteristics of the plurality of first electronic component elements. In addition, the measurement terminal may check an operating state of the second electronic component by measuring a test input signal input to the second electronic component and a test output signal output from the second electronic component. As a result, the defective state of the driving circuit may be checked before the signal is applied to the entire liquid crystal display panel, thereby preventing malfunction of the liquid crystal display panel due to high voltage and abnormal signals.

The applied test signal may be programmed to image and control signals applied to the liquid crystal display panel to output an output signal pattern corresponding to the input and to analyze the same, thereby reducing test time.

Meanwhile, the method may further include forming a connector 150 connected to the test pad or the test line in a portion where the test pad 30 is formed before applying the test signal.

The connector 150, which may connect the measuring means 310, may be installed in a portion where the test pad 30 is formed to reduce the test time and increase the reliability of the test result.

In addition, the measurement means 310 simultaneously generates test signals for measuring electrical characteristics of different first and second electronic component elements, thereby controlling electrical characteristics of the plurality of first and second electronic component elements 80 and 50. You can reduce the time to test.

When the programmed signal is generated from the measuring instrument and applied to the first and second electronic component devices 80 and 50, the output signal can be easily measured to check whether the device is defective.

Meanwhile, although the liquid crystal display according to the first and second embodiments of the present invention has been described with an example of attaching and testing the first and second connection means to a printed circuit board, the first and second connection means are attached. You can also test the printed circuit board before.

As described above, the liquid crystal display device, the test device thereof, and the test method thereof according to the present invention form a test pad on a printed circuit board and connect the input / output terminals of each of the first and second electronic component elements to be tested to the test pad. Therefore, the printed circuit board can be miniaturized and reduced in weight.

In addition, the conventional test point is removed to prevent short-circuit and misconnection between wires due to densified wiring in the printed circuit board design.

In addition, the first and second electronic component devices mounted on a portion where test points are hard to be formed may be tested, and rapid test and analysis may be performed.

The present invention described above will be capable of various substitutions, modifications and changes by those skilled in the art to which the present invention pertains. Therefore, the present invention should not be limited to the above-described embodiments and the accompanying drawings, and the rights thereof should be determined by the claims.

Claims (15)

A liquid crystal display panel; A plurality of driving circuits for driving the liquid crystal display panel; A printed circuit board having a plurality of electronic component elements for supplying a driving signal to the driving circuit and having output pad groups corresponding to each of the plurality of driving circuits; And at least one test terminal formed in a dummy region between output pad groups of the printed circuit board to test whether the electronic component is defective. The method of claim 1, The test terminals A test input pad connected to an input terminal of the electronic component device through a test input line; And a test output pad connected to an output terminal of the electronic component and a test output line. The method of claim 2, And a connector connected to at least one of the test input / output pad and the test input / output line. The method of claim 1, The electronic component device An integrated element including at least one of a timing controller supplying a control signal to the driving circuit and a power supply unit supplying a power signal to the driving circuit; And at least one of an electrical element such as a resistor, a capacitor, a diode, or an inductor. A printed circuit board on which a plurality of electronic component elements for supplying driving signals to a plurality of driving circuits are formed, and output pad groups corresponding to each of the plurality of driving circuits are formed; At least one test terminal formed in a dummy region between output pad groups of the printed circuit board to test whether the electronic component is defective; A signal supply unit supplying a test signal to the test terminals; And measuring means for comparing and analyzing test signals inputted and outputted through the signal supply unit. The method of claim 5, The test terminals A test input pad connected to an input terminal of the electronic component device through a test input line; And a test output pad connected to an output terminal of the electronic component and a test output line. The method of claim 6, And the signal supply unit is a probe supplying a test input signal to the test input pad and receiving a test output signal from the electronic component element through the test output terminal. The method of claim 5, The test terminal And a connector connected to an input / output terminal of the electronic component and a test input / output line. The method of claim 8, And the signal supply unit is a cable formed between the measurement means and the connector to supply a test input signal and an output signal to the test input / output pads. A printed circuit board preparing step of preparing a printed circuit board on which at least one electronic component element is formed and at least one test terminal is formed between each of a plurality of driving circuits and corresponding output pad groups; A test signal detecting step of supplying a test input signal to the electronic component element through the test terminal to detect a test output signal from the electronic component element through the test terminal; And determining an electronic component element defect by determining whether the electronic component element is defective based on the detected test output signal. The method of claim 10, The test signal detection step Supplying a test input signal to the electronic component through a test input line positioned between a test input pad and the electronic component among the test terminals; And supplying the test output signal to a test output pad of the test terminals through a test output line connected to an output terminal of the electronic component element. The method of claim 11, The test signal detection step And supplying the test input signal to the test input pad by using a probe, and receiving a test output signal through the test output pad by using the probe. The method of claim 10, The test signal detection step Providing a connector connected to a test input / output pad among the test terminals; Supplying a test input signal from the measuring means to the test input terminal through the connector; And supplying the test output signal to the measuring means through the connector. The method of claim 10, The preparing of the printed circuit board And providing the printed circuit board mounted with an integrated element including at least one of a timing controller supplying a control signal to the driving circuit and a power supply unit supplying a power signal to the driving circuit. Test method of display device. The method of claim 14, The preparing of the printed circuit board And providing the printed circuit board on which at least one of a resistor, a capacitor, a diode, and an inductor is formed.

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