KR102357242B1 - 아날로그 내장 자체 테스트 트랜시버 - Google Patents

아날로그 내장 자체 테스트 트랜시버 Download PDF

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KR102357242B1
KR102357242B1 KR1020167027316A KR20167027316A KR102357242B1 KR 102357242 B1 KR102357242 B1 KR 102357242B1 KR 1020167027316 A KR1020167027316 A KR 1020167027316A KR 20167027316 A KR20167027316 A KR 20167027316A KR 102357242 B1 KR102357242 B1 KR 102357242B1
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South Korea
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power amplifier
coupled
low noise
switch
state
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Korean (ko)
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KR20160129074A (ko
Inventor
하임 멘델 웨이스먼
리오 라비브
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퀄컴 인코포레이티드
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/11—Monitoring; Testing of transmitters for calibration
    • H04B17/13—Monitoring; Testing of transmitters for calibration of power amplifiers, e.g. gain or non-linearity
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/189—High-frequency amplifiers, e.g. radio frequency amplifiers
    • H03F3/19—High-frequency amplifiers, e.g. radio frequency amplifiers with semiconductor devices only
    • H03F3/195—High-frequency amplifiers, e.g. radio frequency amplifiers with semiconductor devices only in integrated circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/20—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers
    • H03F3/21—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers with semiconductor devices only
    • H03F3/211—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers with semiconductor devices only using a combination of several amplifiers
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/20—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers
    • H03F3/21—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers with semiconductor devices only
    • H03F3/213—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers with semiconductor devices only in integrated circuits
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
    • H04B1/38—Transceivers, i.e. devices in which transmitter and receiver form a structural unit and in which at least one part is used for functions of transmitting and receiving
    • H04B1/40—Circuits
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/11—Monitoring; Testing of transmitters for calibration
    • H04B17/14—Monitoring; Testing of transmitters for calibration of the whole transmission and reception path, e.g. self-test loop-back
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/15—Performance testing
    • H04B17/19—Self-testing arrangements
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/20—Monitoring; Testing of receivers
    • H04B17/21—Monitoring; Testing of receivers for calibration; for correcting measurements
    • H04B17/22—Monitoring; Testing of receivers for calibration; for correcting measurements for calibration of the receiver components
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/421—Multiple switches coupled in the output circuit of an amplifier are controlled by a circuit

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Electromagnetism (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Nonlinear Science (AREA)
  • Transceivers (AREA)
  • Radio Transmission System (AREA)
KR1020167027316A 2014-03-04 2015-03-03 아날로그 내장 자체 테스트 트랜시버 Active KR102357242B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/196,743 2014-03-04
US14/196,743 US9628203B2 (en) 2014-03-04 2014-03-04 Analog built-in self test transceiver
PCT/US2015/018517 WO2015134519A1 (en) 2014-03-04 2015-03-03 Analog built-in self test transceiver

Publications (2)

Publication Number Publication Date
KR20160129074A KR20160129074A (ko) 2016-11-08
KR102357242B1 true KR102357242B1 (ko) 2022-01-27

Family

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KR1020167027316A Active KR102357242B1 (ko) 2014-03-04 2015-03-03 아날로그 내장 자체 테스트 트랜시버

Country Status (6)

Country Link
US (1) US9628203B2 (https=)
EP (1) EP3114782B1 (https=)
JP (1) JP6479843B2 (https=)
KR (1) KR102357242B1 (https=)
CN (1) CN106063160B (https=)
WO (1) WO2015134519A1 (https=)

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US10333579B1 (en) * 2018-04-12 2019-06-25 Shenzhen GOODIX Technology Co., Ltd. Multi-mode configurable transceiver with low voltage switches
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US10498375B1 (en) * 2018-07-11 2019-12-03 Rohde & Schwarz Gmbh & Co. Kg Portable RF receiver module and portable antenna arrangement
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Also Published As

Publication number Publication date
JP2017507611A (ja) 2017-03-16
US20150256272A1 (en) 2015-09-10
KR20160129074A (ko) 2016-11-08
CN106063160A (zh) 2016-10-26
US9628203B2 (en) 2017-04-18
EP3114782A1 (en) 2017-01-11
WO2015134519A1 (en) 2015-09-11
CN106063160B (zh) 2018-09-07
JP6479843B2 (ja) 2019-03-06
EP3114782B1 (en) 2019-04-17

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