KR102233060B1 - 사실상 원통형인 경면 반사면의 형상을 결정하기 위한 방법 - Google Patents

사실상 원통형인 경면 반사면의 형상을 결정하기 위한 방법 Download PDF

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Publication number
KR102233060B1
KR102233060B1 KR1020167019371A KR20167019371A KR102233060B1 KR 102233060 B1 KR102233060 B1 KR 102233060B1 KR 1020167019371 A KR1020167019371 A KR 1020167019371A KR 20167019371 A KR20167019371 A KR 20167019371A KR 102233060 B1 KR102233060 B1 KR 102233060B1
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KR
South Korea
Prior art keywords
data
reflective surface
target structure
specular reflective
shape
Prior art date
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KR1020167019371A
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English (en)
Korean (ko)
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KR20160101091A (ko
Inventor
세르게이 와이 포타펜코
Original Assignee
코닝 인코포레이티드
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Application filed by 코닝 인코포레이티드 filed Critical 코닝 인코포레이티드
Publication of KR20160101091A publication Critical patent/KR20160101091A/ko
Application granted granted Critical
Publication of KR102233060B1 publication Critical patent/KR102233060B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B17/00—Forming molten glass by flowing-out, pushing-out, extruding or drawing downwardly or laterally from forming slits or by overflowing over lips
    • C03B17/06—Forming glass sheets
    • C03B17/064—Forming glass sheets by the overflow downdraw fusion process; Isopipes therefor
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P40/00—Technologies relating to the processing of minerals
    • Y02P40/50—Glass production, e.g. reusing waste heat during processing or shaping
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P40/00—Technologies relating to the processing of minerals
    • Y02P40/50—Glass production, e.g. reusing waste heat during processing or shaping
    • Y02P40/57—Improving the yield, e-g- reduction of reject rates

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Organic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
KR1020167019371A 2013-12-19 2014-12-16 사실상 원통형인 경면 반사면의 형상을 결정하기 위한 방법 KR102233060B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361918262P 2013-12-19 2013-12-19
US61/918,262 2013-12-19
PCT/US2014/070450 WO2015095101A1 (fr) 2013-12-19 2014-12-16 Procédé de détermination de la forme d'une surface à réflexion spéculaire sensiblement cylindrique

Publications (2)

Publication Number Publication Date
KR20160101091A KR20160101091A (ko) 2016-08-24
KR102233060B1 true KR102233060B1 (ko) 2021-03-30

Family

ID=53403577

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020167019371A KR102233060B1 (ko) 2013-12-19 2014-12-16 사실상 원통형인 경면 반사면의 형상을 결정하기 위한 방법

Country Status (5)

Country Link
JP (1) JP6670241B2 (fr)
KR (1) KR102233060B1 (fr)
CN (1) CN106029585B (fr)
TW (1) TWI653426B (fr)
WO (1) WO2015095101A1 (fr)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003338907A (ja) 2002-03-14 2003-11-28 Ricoh Co Ltd 画像入力装置
KR101266115B1 (ko) 2006-04-05 2013-05-27 이스라 서피스 비젼 게엠베하 반사면의 형상을 측정하는 방법 및 시스템

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3185599B2 (ja) * 1995-04-17 2001-07-11 日産自動車株式会社 表面欠陥検査装置
JPH10170240A (ja) * 1996-12-05 1998-06-26 Toshiba Corp パターン欠陥検査方法及びその装置
KR101455875B1 (ko) * 2006-09-20 2014-11-03 코닝 인코포레이티드 유리 기판의 형상-유도 평면내 응력에 대한 온도 보상
US7920257B2 (en) * 2008-08-27 2011-04-05 Corning Incorporated Systems and methods for determining the shape of glass sheets
DE102009010988B4 (de) * 2009-02-19 2010-11-04 Carl Zeiss Oim Gmbh Verfahren und Vorrichtung zum optischen Inspizieren einer Oberfläche an einem Gegenstand
US8441532B2 (en) * 2009-02-24 2013-05-14 Corning Incorporated Shape measurement of specular reflective surface
BR112012031749B1 (pt) * 2010-06-15 2020-02-18 AGC Inc. Dispositivo de medição de forma, método de medição de forma, e método de fabricação de placa de vidro
JPWO2012077683A1 (ja) * 2010-12-09 2014-05-19 旭硝子株式会社 ガラスリボン内欠陥測定方法およびガラスリボン内欠陥測定システム
US9068904B2 (en) * 2011-01-18 2015-06-30 Arizona Board Of Regents On Behalf Of The University Of Arizona System and method for non-contact metrology of surfaces

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003338907A (ja) 2002-03-14 2003-11-28 Ricoh Co Ltd 画像入力装置
KR101266115B1 (ko) 2006-04-05 2013-05-27 이스라 서피스 비젼 게엠베하 반사면의 형상을 측정하는 방법 및 시스템

Also Published As

Publication number Publication date
KR20160101091A (ko) 2016-08-24
JP2017500572A (ja) 2017-01-05
WO2015095101A1 (fr) 2015-06-25
TWI653426B (zh) 2019-03-11
CN106029585B (zh) 2019-04-09
JP6670241B2 (ja) 2020-03-18
TW201531663A (zh) 2015-08-16
CN106029585A (zh) 2016-10-12

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