KR102208278B1 - 연성이고 컨디셔닝가능한 연마층을 갖는 다층의 화학 기계적 연마 패드 적층물 - Google Patents
연성이고 컨디셔닝가능한 연마층을 갖는 다층의 화학 기계적 연마 패드 적층물 Download PDFInfo
- Publication number
- KR102208278B1 KR102208278B1 KR1020140064225A KR20140064225A KR102208278B1 KR 102208278 B1 KR102208278 B1 KR 102208278B1 KR 1020140064225 A KR1020140064225 A KR 1020140064225A KR 20140064225 A KR20140064225 A KR 20140064225A KR 102208278 B1 KR102208278 B1 KR 102208278B1
- Authority
- KR
- South Korea
- Prior art keywords
- polishing
- layer
- curing agent
- laminate
- chemical mechanical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
- B24B37/245—Pads with fixed abrasives
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/22—Lapping pads for working plane surfaces characterised by a multi-layered structure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/017—Devices or means for dressing, cleaning or otherwise conditioning lapping tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
- B24D11/001—Manufacture of flexible abrasive materials
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G18/00—Polymeric products of isocyanates or isothiocyanates
- C08G18/06—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
- C08G18/28—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the compounds used containing active hydrogen
- C08G18/30—Low-molecular-weight compounds
- C08G18/32—Polyhydroxy compounds; Polyamines; Hydroxyamines
- C08G18/3271—Hydroxyamines
- C08G18/3278—Hydroxyamines containing at least three hydroxy groups
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G18/00—Polymeric products of isocyanates or isothiocyanates
- C08G18/06—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
- C08G18/28—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the compounds used containing active hydrogen
- C08G18/65—Low-molecular-weight compounds having active hydrogen with high-molecular-weight compounds having active hydrogen
- C08G18/66—Compounds of groups C08G18/42, C08G18/48, or C08G18/52
- C08G18/6633—Compounds of group C08G18/42
- C08G18/6637—Compounds of group C08G18/42 with compounds of group C08G18/32 or polyamines of C08G18/38
- C08G18/664—Compounds of group C08G18/42 with compounds of group C08G18/32 or polyamines of C08G18/38 with compounds of group C08G18/3203
- C08G18/6644—Compounds of group C08G18/42 with compounds of group C08G18/32 or polyamines of C08G18/38 with compounds of group C08G18/3203 having at least three hydroxy groups
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/906,825 US9238296B2 (en) | 2013-05-31 | 2013-05-31 | Multilayer chemical mechanical polishing pad stack with soft and conditionable polishing layer |
| US13/906,825 | 2013-05-31 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20140141492A KR20140141492A (ko) | 2014-12-10 |
| KR102208278B1 true KR102208278B1 (ko) | 2021-01-27 |
Family
ID=51168262
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020140064225A Active KR102208278B1 (ko) | 2013-05-31 | 2014-05-28 | 연성이고 컨디셔닝가능한 연마층을 갖는 다층의 화학 기계적 연마 패드 적층물 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US9238296B2 (enExample) |
| JP (1) | JP6367611B2 (enExample) |
| KR (1) | KR102208278B1 (enExample) |
| CN (1) | CN104209874B (enExample) |
| DE (1) | DE102014007002A1 (enExample) |
| FR (1) | FR3006220B1 (enExample) |
| TW (1) | TWI560070B (enExample) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI556910B (zh) * | 2013-10-01 | 2016-11-11 | 三芳化學工業股份有限公司 | 複合硏磨墊及其製造方法 |
| US9259820B2 (en) * | 2014-03-28 | 2016-02-16 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad with polishing layer and window |
| US9216489B2 (en) * | 2014-03-28 | 2015-12-22 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad with endpoint detection window |
| US9238294B2 (en) * | 2014-06-18 | 2016-01-19 | Nexplanar Corporation | Polishing pad having porogens with liquid filler |
| USD785339S1 (en) * | 2014-10-23 | 2017-05-02 | Griot's Garage, Inc. | Hand applicator buffing pad |
| US20160144477A1 (en) * | 2014-11-21 | 2016-05-26 | Diane Scott | Coated compressive subpad for chemical mechanical polishing |
| US9481070B2 (en) * | 2014-12-19 | 2016-11-01 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | High-stability polyurethane polishing pad |
| KR102640690B1 (ko) * | 2015-09-25 | 2024-02-23 | 씨엠씨 머티리얼즈 엘엘씨 | 높은 탄성률 비를 갖는 폴리우레탄 화학 기계적 연마 패드 |
| US9484212B1 (en) * | 2015-10-30 | 2016-11-01 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing method |
| US20180085888A1 (en) * | 2016-09-29 | 2018-03-29 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pads having a consistent pad surface microtexture |
| CN108453970A (zh) * | 2018-03-27 | 2018-08-28 | 成都时代立夫科技有限公司 | 一种化学机械抛光垫的制造方法及其产品和模具 |
| KR102526513B1 (ko) * | 2021-05-26 | 2023-04-26 | 에스케이엔펄스 주식회사 | 연마패드 접착필름, 이를 포함하는 연마패드 적층체 및 웨이퍼의 연마방법 |
| KR102572960B1 (ko) * | 2021-06-10 | 2023-09-01 | 에프엔에스테크 주식회사 | 복수의 패턴 구조체를 포함하는 연마 패드 |
| CN116890492A (zh) * | 2023-07-10 | 2023-10-17 | 安徽禾臣新材料有限公司 | 一种防褶皱断裂的复合型阻尼布及其生产工艺 |
| CN119795025B (zh) * | 2024-10-31 | 2025-11-04 | 比亚迪股份有限公司 | 复合抛光层、抛光垫及其制备方法 |
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| JP2001522729A (ja) | 1997-11-06 | 2001-11-20 | ロデール ホールディングス インコーポレイテッド | 研磨剤研磨システムを使用したメモリーディスクあるいは半導体デバイスの製造方法及び研磨パッド |
| US20050070216A1 (en) | 2003-09-26 | 2005-03-31 | Roberts John V.H. | Resilient polishing pad for chemical mechanical polishing |
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| US5257478A (en) | 1990-03-22 | 1993-11-02 | Rodel, Inc. | Apparatus for interlayer planarization of semiconductor material |
| US5212910A (en) | 1991-07-09 | 1993-05-25 | Intel Corporation | Composite polishing pad for semiconductor process |
| US5287663A (en) | 1992-01-21 | 1994-02-22 | National Semiconductor Corporation | Polishing pad and method for polishing semiconductor wafers |
| US5245790A (en) * | 1992-02-14 | 1993-09-21 | Lsi Logic Corporation | Ultrasonic energy enhanced chemi-mechanical polishing of silicon wafers |
| MY114512A (en) | 1992-08-19 | 2002-11-30 | Rodel Inc | Polymeric substrate with polymeric microelements |
| US5489233A (en) | 1994-04-08 | 1996-02-06 | Rodel, Inc. | Polishing pads and methods for their use |
| JPH08216033A (ja) * | 1995-02-16 | 1996-08-27 | Fuji Photo Film Co Ltd | 研磨テープ |
| EP0779655A3 (en) | 1995-12-14 | 1997-07-16 | International Business Machines Corporation | A method of chemically-mechanically polishing an electronic component |
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| JP3925041B2 (ja) | 2000-05-31 | 2007-06-06 | Jsr株式会社 | 研磨パッド用組成物及びこれを用いた研磨パッド |
| JP3826702B2 (ja) | 2000-10-24 | 2006-09-27 | Jsr株式会社 | 研磨パッド用組成物及びこれを用いた研磨パッド |
| KR100877390B1 (ko) | 2001-11-13 | 2009-01-07 | 도요 고무 고교 가부시키가이샤 | 연마 패드 및 그 제조 방법 |
| JP4039214B2 (ja) | 2002-11-05 | 2008-01-30 | Jsr株式会社 | 研磨パッド |
| US7704125B2 (en) | 2003-03-24 | 2010-04-27 | Nexplanar Corporation | Customized polishing pads for CMP and methods of fabrication and use thereof |
| US20040192178A1 (en) | 2003-03-28 | 2004-09-30 | Barak Yardeni | Diamond conditioning of soft chemical mechanical planarization/polishing (CMP) polishing pads |
| US20040224622A1 (en) | 2003-04-15 | 2004-11-11 | Jsr Corporation | Polishing pad and production method thereof |
| US8066552B2 (en) | 2003-10-03 | 2011-11-29 | Applied Materials, Inc. | Multi-layer polishing pad for low-pressure polishing |
| US7074115B2 (en) | 2003-10-09 | 2006-07-11 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Polishing pad |
| US20050171224A1 (en) * | 2004-02-03 | 2005-08-04 | Kulp Mary J. | Polyurethane polishing pad |
| US7132033B2 (en) | 2004-02-27 | 2006-11-07 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Method of forming a layered polishing pad |
| JP4475404B2 (ja) | 2004-10-14 | 2010-06-09 | Jsr株式会社 | 研磨パッド |
| SG162794A1 (en) | 2005-07-15 | 2010-07-29 | Toyo Tire & Rubber Co | Layered sheets and processes for producing the same |
| KR100709392B1 (ko) * | 2005-07-20 | 2007-04-20 | 에스케이씨 주식회사 | 액상의 비닐계 모노머가 상호침투 가교된 형태를 갖는폴리우레탄 연마 패드 |
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| JP5393434B2 (ja) | 2008-12-26 | 2014-01-22 | 東洋ゴム工業株式会社 | 研磨パッド及びその製造方法 |
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| US9156124B2 (en) * | 2010-07-08 | 2015-10-13 | Nexplanar Corporation | Soft polishing pad for polishing a semiconductor substrate |
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| JP2013082035A (ja) * | 2011-10-11 | 2013-05-09 | Toyo Tire & Rubber Co Ltd | 積層研磨パッド及びその製造方法 |
| US9233451B2 (en) * | 2013-05-31 | 2016-01-12 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Soft and conditionable chemical mechanical polishing pad stack |
-
2013
- 2013-05-31 US US13/906,825 patent/US9238296B2/en active Active
-
2014
- 2014-05-13 DE DE102014007002.6A patent/DE102014007002A1/de active Pending
- 2014-05-28 KR KR1020140064225A patent/KR102208278B1/ko active Active
- 2014-05-30 FR FR1454945A patent/FR3006220B1/fr active Active
- 2014-05-30 CN CN201410238701.9A patent/CN104209874B/zh active Active
- 2014-05-30 JP JP2014112282A patent/JP6367611B2/ja active Active
- 2014-05-30 TW TW103118946A patent/TWI560070B/zh active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001522729A (ja) | 1997-11-06 | 2001-11-20 | ロデール ホールディングス インコーポレイテッド | 研磨剤研磨システムを使用したメモリーディスクあるいは半導体デバイスの製造方法及び研磨パッド |
| US20050070216A1 (en) | 2003-09-26 | 2005-03-31 | Roberts John V.H. | Resilient polishing pad for chemical mechanical polishing |
| JP2005167200A (ja) * | 2003-09-26 | 2005-06-23 | Rohm & Haas Electronic Materials Cmp Holdings Inc | ケミカルメカニカルポリッシングのための弾性研磨パッド |
Also Published As
| Publication number | Publication date |
|---|---|
| US20140357163A1 (en) | 2014-12-04 |
| FR3006220A1 (fr) | 2014-12-05 |
| TWI560070B (en) | 2016-12-01 |
| CN104209874A (zh) | 2014-12-17 |
| JP2014233835A (ja) | 2014-12-15 |
| KR20140141492A (ko) | 2014-12-10 |
| JP6367611B2 (ja) | 2018-08-01 |
| US9238296B2 (en) | 2016-01-19 |
| TW201511964A (zh) | 2015-04-01 |
| DE102014007002A1 (de) | 2014-12-04 |
| FR3006220B1 (fr) | 2016-09-23 |
| CN104209874B (zh) | 2017-09-08 |
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