KR102156786B1 - 전기-도금 프로세서의 자동 인­시츄 제어 - Google Patents

전기-도금 프로세서의 자동 인­시츄 제어 Download PDF

Info

Publication number
KR102156786B1
KR102156786B1 KR1020140073535A KR20140073535A KR102156786B1 KR 102156786 B1 KR102156786 B1 KR 102156786B1 KR 1020140073535 A KR1020140073535 A KR 1020140073535A KR 20140073535 A KR20140073535 A KR 20140073535A KR 102156786 B1 KR102156786 B1 KR 102156786B1
Authority
KR
South Korea
Prior art keywords
wafer
electrode
current flow
current
anode
Prior art date
Application number
KR1020140073535A
Other languages
English (en)
Korean (ko)
Other versions
KR20140147044A (ko
Inventor
그레고리 제이. 윌슨
폴 알. 맥휴
Original Assignee
어플라이드 머티어리얼스, 인코포레이티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 어플라이드 머티어리얼스, 인코포레이티드 filed Critical 어플라이드 머티어리얼스, 인코포레이티드
Publication of KR20140147044A publication Critical patent/KR20140147044A/ko
Application granted granted Critical
Publication of KR102156786B1 publication Critical patent/KR102156786B1/ko

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/001Apparatus specially adapted for electrolytic coating of wafers, e.g. semiconductors or solar cells
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/007Current directing devices
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/008Current shielding devices
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/10Electrodes, e.g. composition, counter electrode
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D21/00Processes for servicing or operating cells for electrolytic coating
    • C25D21/12Process control or regulation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Automation & Control Theory (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Sustainable Development (AREA)
  • Electroplating Methods And Accessories (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
KR1020140073535A 2013-06-18 2014-06-17 전기-도금 프로세서의 자동 인­시츄 제어 KR102156786B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/920,709 US20140367264A1 (en) 2013-06-18 2013-06-18 Automatic in-situ control of an electro-plating processor
US13/920,709 2013-06-18

Publications (2)

Publication Number Publication Date
KR20140147044A KR20140147044A (ko) 2014-12-29
KR102156786B1 true KR102156786B1 (ko) 2020-09-16

Family

ID=52018290

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020140073535A KR102156786B1 (ko) 2013-06-18 2014-06-17 전기-도금 프로세서의 자동 인­시츄 제어

Country Status (4)

Country Link
US (1) US20140367264A1 (zh)
KR (1) KR102156786B1 (zh)
CN (1) CN104233423A (zh)
TW (1) TW201504480A (zh)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9758897B2 (en) 2015-01-27 2017-09-12 Applied Materials, Inc. Electroplating apparatus with notch adapted contact ring seal and thief electrode
US9765443B2 (en) * 2015-09-02 2017-09-19 Applied Materials, Inc. Electroplating processor with current thief electrode
US10023969B2 (en) * 2016-05-24 2018-07-17 Applied Materials, Inc. Plating power supply with headroom control and ethercat interface
US10494731B2 (en) * 2017-12-11 2019-12-03 Applied Materials, Inc. Electroplating dynamic edge control
KR102619843B1 (ko) * 2018-12-28 2024-01-02 에이씨엠 리서치 (상하이), 인코포레이티드 도금 장치 및 도금 방법

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040007467A1 (en) * 2002-05-29 2004-01-15 Mchugh Paul R. Method and apparatus for controlling vessel characteristics, including shape and thieving current for processing microfeature workpieces

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6916412B2 (en) * 1999-04-13 2005-07-12 Semitool, Inc. Adaptable electrochemical processing chamber
US6231743B1 (en) * 2000-01-03 2001-05-15 Motorola, Inc. Method for forming a semiconductor device
US8308931B2 (en) * 2006-08-16 2012-11-13 Novellus Systems, Inc. Method and apparatus for electroplating
DE10232612B4 (de) * 2002-07-12 2006-05-18 Atotech Deutschland Gmbh Vorrichtung und Verfahren zur Überwachung eines elektrolytischen Prozesses
US7645364B2 (en) * 2004-06-30 2010-01-12 Lam Research Corporation Apparatus and method for plating semiconductor wafers
US7837851B2 (en) * 2005-05-25 2010-11-23 Applied Materials, Inc. In-situ profile measurement in an electroplating process

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040007467A1 (en) * 2002-05-29 2004-01-15 Mchugh Paul R. Method and apparatus for controlling vessel characteristics, including shape and thieving current for processing microfeature workpieces

Also Published As

Publication number Publication date
KR20140147044A (ko) 2014-12-29
CN104233423A (zh) 2014-12-24
US20140367264A1 (en) 2014-12-18
TW201504480A (zh) 2015-02-01

Similar Documents

Publication Publication Date Title
US7837851B2 (en) In-situ profile measurement in an electroplating process
KR102156786B1 (ko) 전기-도금 프로세서의 자동 인­시츄 제어
KR100678877B1 (ko) 반도체 장치 형성 방법
JP6861610B2 (ja) めっき解析方法、めっき解析システム、及びめっき解析のためのコンピュータプログラム
US11232956B2 (en) Electrochemical additive manufacturing of interconnection features
KR20110020226A (ko) 도전 층의 두께를 측정하는 방법 및 이를 이용한 장치
KR102550311B1 (ko) 전기도금 동안 전해액들 모니터링
US6444101B1 (en) Conductive biasing member for metal layering
US20240162049A1 (en) Electrochemical additive manufacturing system having conductive seed layer
US6866763B2 (en) Method and system monitoring and controlling film thickness profile during plating and electroetching
US20060193992A1 (en) Method and system for controlling a substrate position in an electrochemical process
US6761812B2 (en) Apparatus and method for electrochemical metal deposition
JP4989541B2 (ja) めっき方法、半導体装置の製造方法およびめっき処理システム
WO2020072649A1 (en) Apparatus for an inert anode plating cell
US20050189229A1 (en) Method and apparatus for electroplating a semiconductor wafer
KR20060090822A (ko) 기판 표면상의 금속의 도금 동안 멀티-애노드 구성의 전류분포를 자동으로 제어하는 방법 및 시스템
US7710130B2 (en) Volume resistivity measurement apparatus for dielectric layer of electrostatic chuck and measurement method using the apparatus
TW202204699A (zh) 調平化合物控制
US8147670B2 (en) Profile control on ring anode plating chambers for multi-step recipes
JP7373684B1 (ja) めっき装置
US20240167188A1 (en) Detection of contact formation between a substrate and contact pins in an electoplating system
US20060289299A1 (en) Multi-channel current probe
CN115346888A (zh) 半导体热处理工艺设备、方法及金属薄膜浸润性评价方法
KR20170059104A (ko) 기판상에 전기도금하는 전기화학적 증착 시스템 및 방법

Legal Events

Date Code Title Description
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant