KR102143124B1 - 발생 가스 분석 장치의 교정 방법 및 발생 가스 분석 장치 - Google Patents

발생 가스 분석 장치의 교정 방법 및 발생 가스 분석 장치 Download PDF

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KR102143124B1
KR102143124B1 KR1020160133532A KR20160133532A KR102143124B1 KR 102143124 B1 KR102143124 B1 KR 102143124B1 KR 1020160133532 A KR1020160133532 A KR 1020160133532A KR 20160133532 A KR20160133532 A KR 20160133532A KR 102143124 B1 KR102143124 B1 KR 102143124B1
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gas component
heating
sample
gas
chromatogram
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KR20170059383A (ko
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히데유키 아키야마
간타로 마루오카
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가부시키가이샤 히다치 하이테크 사이언스
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/622—Ion mobility spectrometry
    • G01N27/623—Ion mobility spectrometry combined with mass spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/622—Ion mobility spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7206—Mass spectrometers interfaced to gas chromatograph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0006—Calibrating gas analysers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0009—Calibration of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N2030/022—Column chromatography characterised by the kind of separation mechanism
    • G01N2030/025—Gas chromatography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/04—Preparation or injection of sample to be analysed
    • G01N2030/042—Standards

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Combustion & Propulsion (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Plasma & Fusion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Molecular Biology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
KR1020160133532A 2015-11-20 2016-10-14 발생 가스 분석 장치의 교정 방법 및 발생 가스 분석 장치 Expired - Fee Related KR102143124B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015227372A JP6622570B2 (ja) 2015-11-20 2015-11-20 発生ガス分析装置の校正方法及び発生ガス分析装置
JPJP-P-2015-227372 2015-11-20

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KR20170059383A KR20170059383A (ko) 2017-05-30
KR102143124B1 true KR102143124B1 (ko) 2020-08-10

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KR1020160133532A Expired - Fee Related KR102143124B1 (ko) 2015-11-20 2016-10-14 발생 가스 분석 장치의 교정 방법 및 발생 가스 분석 장치

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US (1) US9897579B2 (enExample)
JP (1) JP6622570B2 (enExample)
KR (1) KR102143124B1 (enExample)
CN (1) CN107064396B (enExample)
TW (1) TWI700491B (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9899198B2 (en) * 2015-11-20 2018-02-20 Hitachi High-Tech Science Corporation Method for analyzing evolved gas and evolved gas analyzer
JP6622570B2 (ja) * 2015-11-20 2019-12-18 株式会社日立ハイテクサイエンス 発生ガス分析装置の校正方法及び発生ガス分析装置
JP6505268B1 (ja) * 2018-01-11 2019-04-24 株式会社日立ハイテクサイエンス 質量分析装置及び質量分析方法
US12266517B2 (en) 2018-09-28 2025-04-01 Shimadzu Corporation Method for evaluating mass spectrometry device, method for calibrating mass spectrometry device, analysis method, mass spectrometry device, and mass spectrometry reagent
CN109061025B (zh) * 2018-10-26 2021-08-10 苏州科技大学 一种食品中溴代阻燃剂含量的检测方法
CN112067732B (zh) * 2020-09-19 2022-11-11 中国计量科学研究院 定量检测溴化阻燃剂的方法

Citations (4)

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Publication number Priority date Publication date Assignee Title
JP2002005915A (ja) 2000-06-22 2002-01-09 Hitachi Ltd ガスクロマト装置
US20090026362A1 (en) 2006-03-17 2009-01-29 Rigaku Corporation Gas analyzer
JP2009210305A (ja) 2008-02-29 2009-09-17 Rigaku Corp ガス定量分析方法及びガス定量分析装置
JP2015165223A (ja) 2014-02-10 2015-09-17 電子科学株式会社 コンクリートの劣化診断装置およびコンクリートの劣化診断方法

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US4814612A (en) * 1983-08-30 1989-03-21 Research Corporation Method and means for vaporizing liquids for detection or analysis
US4883958A (en) * 1988-12-16 1989-11-28 Vestec Corporation Interface for coupling liquid chromatography to solid or gas phase detectors
JP3123843B2 (ja) * 1992-12-17 2001-01-15 日本電子株式会社 プラズマフレームを用いた試料気化装置
CN1088191C (zh) * 1996-09-01 2002-07-24 武汉钢铁(集团)公司 一种用于分析焦油中三混油的气相色谱柱及分析方法
JP3846800B2 (ja) * 2003-08-18 2006-11-15 株式会社リガク 発生ガス分析方法とその装置
JP2005106524A (ja) 2003-09-29 2005-04-21 Tdk Corp 標準試料、ならびに校正方法、分析方法およびデバイスの製造方法
DE102005004325A1 (de) * 2005-01-31 2006-08-10 Bruker Daltonik Gmbh Ionenmobilitätsspektrometer und Verfahren zu seinem Betrieb
JP5012507B2 (ja) * 2005-07-14 2012-08-29 パナソニック株式会社 分析装置、及び分析方法
JP2008139130A (ja) * 2006-12-01 2008-06-19 Hitachi Ltd リアルタイム分析装置及び方法
JP2008190898A (ja) 2007-02-01 2008-08-21 Hitachi High-Technologies Corp 四重極型質量分析装置および四重極型質量分析装置の質量校正方法
IL193003A (en) * 2008-07-23 2011-12-29 Aviv Amirav Open probe method and device for sample introduction for mass spectrometry analysis
JP5815535B2 (ja) * 2010-08-31 2015-11-17 アトナープ株式会社 イオン移動装置
CN103282768B (zh) * 2010-12-28 2015-09-30 株式会社岛津制作所 色谱质量分析装置
JP5771458B2 (ja) * 2011-06-27 2015-09-02 株式会社日立ハイテクノロジーズ 質量分析装置及び質量分析方法
CN104204776B (zh) * 2012-01-17 2017-02-22 Mks仪器有限公司 生物气中硅氧烷的测量方法及装置
WO2014030479A1 (ja) * 2012-08-24 2014-02-27 株式会社島津製作所 液体クロマトグラフとそれに用いるカラムオーブン
JP6622570B2 (ja) * 2015-11-20 2019-12-18 株式会社日立ハイテクサイエンス 発生ガス分析装置の校正方法及び発生ガス分析装置
US10401342B2 (en) * 2015-11-20 2019-09-03 Hitachi High-Tech Science Corporation Evolved gas analyzer and method for analyzing evolved gas
US9831077B2 (en) * 2015-11-20 2017-11-28 Hitachi High-Tech Science Corporation Method for analyzing evolved gas and evolved gas analyzer
US9899198B2 (en) * 2015-11-20 2018-02-20 Hitachi High-Tech Science Corporation Method for analyzing evolved gas and evolved gas analyzer

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002005915A (ja) 2000-06-22 2002-01-09 Hitachi Ltd ガスクロマト装置
US20090026362A1 (en) 2006-03-17 2009-01-29 Rigaku Corporation Gas analyzer
JP2009210305A (ja) 2008-02-29 2009-09-17 Rigaku Corp ガス定量分析方法及びガス定量分析装置
JP2015165223A (ja) 2014-02-10 2015-09-17 電子科学株式会社 コンクリートの劣化診断装置およびコンクリートの劣化診断方法

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Publication number Publication date
JP2017096695A (ja) 2017-06-01
US20170146497A1 (en) 2017-05-25
CN107064396A (zh) 2017-08-18
TW201723477A (zh) 2017-07-01
JP6622570B2 (ja) 2019-12-18
US9897579B2 (en) 2018-02-20
TWI700491B (zh) 2020-08-01
KR20170059383A (ko) 2017-05-30
CN107064396B (zh) 2020-09-22

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