KR102031146B1 - Test connector, manufacturing method of the test connector, and testing method of device-under-test using the test connector - Google Patents

Abstract

According to an embodiment of the present disclosure, provided is a test connector, which comprises: sheets of an insulating material; a plurality of conductive parts extending in the Z-axis direction and space apart from each other in the X-axis direction; and a plurality of supporting parts of the insulating material, extending in the X-axis direction, and spaced apart from each other in the Z-axis direction. In the sheet, a conductive unit formed by weaving the plurality of conductive parts and the plurality of supporting parts is included. Both ends of the plurality of conductive parts in the Z-axis direction are exposed to a surface of the sheet.

Description

TEST CONNECTOR, MANUFACTURING METHOD OF THE TEST CONNECTOR, AND TESTING METHOD OF DEVICE-UNDER-TEST USING THE TEST CONNECTOR}

The present disclosure relates to an inspection connector disposed between a device under test and test equipment, a manufacturing method of an inspection connector, and an inspection method of an inspection device using an inspection connector.

In the inspection process for determining whether a device under test, such as a manufactured semiconductor device, is defective, an inspection connector is disposed between the device under test and test equipment. The inspection connector is electrically connected to the device under test and the test equipment, and an inspection method for determining whether the device under test is defective is known based on whether the device under test and the test equipment are energized.

If the terminal of the device under test is directly contacted with the terminal of the test equipment without the test connector, the terminal of the test equipment may be worn or damaged in a repetitive inspection process, which may cause the entire test equipment to be replaced. Conventionally, the inspection connector is used to prevent the occurrence of the need to replace the entire test equipment. Specifically, when the test connector is worn or broken by repeated contact with the terminal of the device under test, only the corresponding test connector can be replaced.

The conventional test connector includes a conductor for electrically connecting between the terminal of the device under test and the terminal of the test equipment, and a sheet of insulator in which the conductor is arranged. A plurality of said conductors of the test connector are arranged so as to correspond to an interval or pitch between the plurality of terminals of the device under test, and electrically connect the plurality of terminals of the device under test to the corresponding plurality of terminals of the test equipment. Let's do it.

Embodiments of the present disclosure provide a precise arrangement design of the conductors of the inspection connector and means to facilitate its manufacture.

In the prior art, the conductor of the test connector has a problem that it is difficult to prevent deformation or positional change such as buckling caused by compressive stress or the like due to contact with repetitive terminals. Embodiments of the present disclosure solve this problem of the prior art.

In the prior art, when the terminals of the device under test and the terminals of the test equipment come into contact with both ends of the conductor of the test connector, the probability of deformation occurring at the end of the conductor due to pressure increases, and the service life of the test connector is increased. There is a problem that is reduced. Embodiments of the present disclosure solve this problem of the prior art.

Recently, a device under test has been manufactured with a very small pitch of a plurality of terminals, and precise pitch design of a plurality of conductors of an inspection connector has been required. There is a problem in the fine pitch arrangement is a big difficulty in the process. Embodiments of the present disclosure solve this problem of the prior art.

In the prior art, in order to inspect various kinds of devices under test that have different arrangements of terminals, test connectors having different arrangements of conductors must be designed and manufactured, respectively, and used according to the type of device under test. There is a problem that it is uncomfortable. Embodiments of the present disclosure solve this problem of the prior art.

One aspect of the disclosure provides embodiments of a test connector. An inspection connector according to a representative embodiment includes: a sheet of insulating material on XYZ rectangular coordinates; And a plurality of conductive parts of a conductive material extending in the Z-axis direction and spaced apart from each other in the X-axis direction, and a plurality of supporting parts of the insulating material extending in the X-axis direction and spaced apart from each other in the Z-axis direction, The plurality of conductive parts and the plurality of support parts include a conductive unit formed by weaving each other. Both ends of the plurality of conductive portions in the Z-axis direction are exposed to the surface of the sheet.

Another aspect of the disclosure provides embodiments of a method of manufacturing a test connector. According to an exemplary embodiment, a method of manufacturing a test connector includes a plurality of conductive parts of a conductive material extending in the Z-axis direction and spaced from each other in the X-axis direction and extending in the X-axis direction on the XYZ rectangular coordinates. A conductive unit is formed by weaving a plurality of spaced apart supporting portions of the insulating material, and the conductive unit is disposed inside the sheet unit of the insulating material to generate a unit layer having a thickness in the Y-axis direction, and the plurality of unit layers are Y (A) stacking in the axial direction.

In an embodiment, the manufacturing method may include the step (b) of generating the test connector by cutting the stacked plurality of unit layers in a direction crossing the Z-axis direction after the step (a). have.

According to the embodiments of the present disclosure, it is possible to design a precise arrangement of the conductive portions of the inspection connector, and when manufacturing the inspection connector, the probability that the pitches of the plurality of conductive portions are different from the design contents is significantly reduced.

According to the embodiments of the present disclosure, the plurality of support portions prevent deformation or positional variations such as buckling of the plurality of conductive portions, so that durability and lifespan of the inspection connector can be greatly improved.

According to embodiments of the present disclosure, a plurality of support portions may maintain a spacing between the plurality of conductive portions, and the probability of occurrence of a short circuit between the conductive portions is significantly lowered.

According to the embodiments of the present disclosure, the plurality of support portions may be a plurality of support points of the conductive portion to distribute the points where the conductive portion is elastically bent and deformed. By preventing excessive deformation of the conductive portion from being concentrated, the elastic compression performance of the conductive portion can be exhibited, and the durability of the conductive portion can be improved and the permanent deformation of the conductive portion can be prevented.

According to the embodiments of the present disclosure, the elastic deformation performance of the conductive portion is improved, so that the probability of deformation occurring at both ends of the conductive portion is significantly lowered.

According to embodiments of the present disclosure, an ultrafine pitch process of a plurality of conductive parts of the test connector may be conveniently and accurately performed.

According to embodiments of the present disclosure, the arrangement distance of the plurality of conductive parts is set smaller than the minimum distance between the centers of the plurality of terminals of the device under test, so that the arrangement of the terminals is different from each other. It is convenient to use a kind of inspection connector, and the need for accurate pitch implementation of a plurality of conductive parts can be reduced.

1 is a partial cross-sectional view of the test connector 100 according to an embodiment, and shows a state in which the test connector 100 is disposed between the device under test 10 and the test equipment 20.
2 is a partial elevation view of the inspection connector 100 of FIG. 1 as viewed from the + Z axis direction.
3 is a perspective view of a portion of the conductive unit 100u of FIG. 1.
4 is a cross-sectional view of the conductive unit of FIG. 1 in a direction perpendicular to the X axis, FIG. 4A is a view of the conductive unit 100u according to one embodiment, and FIG. 4B is a different embodiment. It is a figure of the electrically conductive unit 100u '.
FIG. 5 is an elevation view of the conductive unit of FIG. 3 viewed in the + Y-axis direction. FIG. 5A shows the conductive unit 100u according to the first embodiment, and FIG. 5B shows the conductive unit 100u 'according to the second embodiment. '), And FIG. 5C shows the conductive unit 100u''' according to the third embodiment.
6A is a flowchart of a manufacturing method according to an embodiment of an inspection connector.
6B is a flowchart of a manufacturing method according to another embodiment of a test connector.
7 is a perspective view showing each state in the process of manufacturing the test connector according to the manufacturing method of FIGS. 6A and 6B.

Embodiments of the present disclosure are illustrated for the purpose of describing the technical spirit of the present disclosure. The scope of the present disclosure is not limited to the embodiments set forth below or the detailed description of these embodiments.

All technical and scientific terms used in the present disclosure, unless defined otherwise, have the meanings that are commonly understood by one of ordinary skill in the art to which this disclosure belongs. All terms used in the present disclosure are selected for the purpose of more clearly describing the present disclosure, and are not selected to limit the scope of the rights according to the present disclosure.

As used in this disclosure, expressions such as "comprising", "including", "having", and the like, are open terms that imply the possibility of including other embodiments unless otherwise stated in the phrase or sentence in which the expression is included. It should be understood as (open-ended terms).

As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.

Expressions such as “first”, “second”, and the like used in the present disclosure are used to distinguish a plurality of components from each other, and do not limit the order or importance of the components.

Referring to the drawings, in order to describe the present disclosure, a description will be made on the basis of a spatial Cartesian coordinate system based on X, Y, and Z axes that are perpendicular to each other. That is, each configuration of the embodiments can be described on the XYZ rectangular coordinates. Each axial direction (X-axis direction, Y-axis direction, Z-axis direction) means the both directions which each axis extends. The thing with + sign (+ X-axis direction, + Y-axis direction, + Z-axis direction) in front of each axial direction means the positive direction which is either of the directions in which each axis extends. The sign "-" in front of each axis direction (-X-axis direction, -Y-axis direction, -Z-axis direction) means the negative direction which is the other direction of both directions which each axis extends. These are only criteria for explaining the present disclosure so that the present disclosure can be clearly understood, and each direction may be defined differently where the criteria are placed.

As used herein, "XZ plane" means a plane parallel to the X and Z axes, "YZ plane" means a plane parallel to the Y and Z axes, and "XY plane" refers to the X and Y axes. It means a plane parallel to the axis.

As used in the present disclosure, the direction indicators such as "upward" and "upper" mean a direction in which the terminal 11 of the device under test 10 is arranged on the basis of the connector 100 for inspection, and "downward", " "," And the like refer to a direction in which the terminal 21 of the test equipment 20 is disposed based on the test connector 100. The "thickness direction" of the test connector 100 referred to in the present disclosure means an up and down direction, which is a criterion for explaining the present disclosure so that the present disclosure can be clearly understood. Up and down depending on where the reference is placed. Of course it can be defined differently.

The X-axis direction and the Y-axis direction are defined with the Z-axis direction in which the conductive portion extends. In this embodiment with reference to FIG. 1, the thickness direction of the test connector 100 and the Z-axis direction coincide, the upper direction is the + Z axis direction, and the lower direction is the -Z axis direction. However, in another embodiment not shown, the plurality of conductive parts may extend in a direction inclined with respect to the thickness direction, and the thickness direction and the Z-axis direction may be different directions that form an acute angle with each other. In such another embodiment, the conductive portion can be easily exerted in the elastic bending deformation function according to the pressure of the terminal of the device under test.

Hereinafter, embodiments of the present disclosure will be described with reference to the accompanying drawings. In the accompanying drawings, the same or corresponding components are given the same reference numerals. In addition, in the following description of the embodiments, it may be omitted to duplicate the same or corresponding components. However, even if the description of the component is omitted, it is not intended that such component is not included in any embodiment.

Referring to FIG. 1, the device under test 10 may be a semiconductor device or the like. The device under test 10 includes a plurality of terminals 11. The plurality of terminals 11 are disposed on the lower side of the device under test 10. The plurality of terminals 11 may be arranged spaced apart from each other by a predetermined interval. The plurality of terminals 11 may be arranged spaced apart from each other on the XZ plane. The plurality of terminals 11 may be arranged spaced apart from each other on the YZ plane. When inspecting the device under test 10, the plurality of terminals 11 may contact the upper surface of the connector 100 for inspection.

The test equipment 20 includes a plurality of terminals 21. The plurality of terminals 21 correspond to the plurality of terminals 11. The plurality of terminals 21 are arranged on the upper side of the device under test 10. The plurality of terminals 21 may be arranged spaced apart from each other by a predetermined interval. The plurality of terminals 21 may be arranged spaced apart from each other on the XZ plane. The plurality of terminals 21 may be arranged spaced apart from each other on the YZ plane. When inspecting the device under test 10, the plurality of terminals 21 can contact the lower surface of the connector 100 for inspection.

In this embodiment, each of the plurality of terminals 21 is disposed at a position facing each of the plurality of terminals 11 in the vertical direction. Although not shown, in another exemplary embodiment in which the plurality of conductive parts 130 are inclined with respect to the vertical direction, each of the plurality of terminals 21 connects each of the plurality of terminals 11 to the plurality of conductive parts 130. It may be arranged at a position facing in the inclined direction.

The test connector 100 is arranged between the device under test 10 and the test equipment 20 and configured to electrically connect the device under test 10 and the test equipment 20 to each other. The test connector 100 is a conductive unit 110u configured to electrically connect the sheet 110 of insulating material, the terminal 11 of the device under test 10 and the terminal 21 of the test equipment 20. ). The conductive unit 100u includes a conductive portion 130 made of a conductive material extending in the Z-axis direction and a support portion 150 made of an insulating material extending in the X-axis direction. The conductive unit 100u may include a plurality of conductive parts 130 and a plurality of support parts 150.

The sheet 110 has a thickness in the vertical direction. The thickness (length in the thickness direction) of the sheet 110 is smaller than the length in the direction perpendicular to the thickness direction of the sheet 110.

The sheet 110 may be formed of an electrically insulating elastically deformable material. The sheet 110 may be formed of a material having better elastic deformation than the material of the conductive part 130 and the material of the support part 150.

For example, the sheet 110 may be made of an insulating elastic polymer material. The elastic polymer material may be a polymer material having a crosslinked structure. Examples of the curable polymer material-forming material that can be used to obtain the crosslinked polymer material include conjugated diene systems such as polybutadiene rubber, natural rubber, polyisoprene rubber, styrene-butadiene copolymer rubber, and acrylonitrile-butadiene copolymer rubber. Rubbers and their hydrogenated additives, block copolymer rubbers such as styrene-butadiene-diene block copolymer rubbers and styrene-isoprene block copolymers, and their hydrogenated additives, chloroprene, urethane rubbers, polyester-based rubbers and epichlorohydrin rubbers , Silicone rubber, ethylene-propylene copolymer rubber, ethylene-propylene-diene copolymer rubber, and the like.

On the other hand, the conductive unit 100u is disposed in the sheet 110. The conductive unit 100u is supported by the sheet 110. When manufacturing the test connector 100, the conductive unit 100u can be fixed to the sheet 110 by curing the sheet 110 in a state where the conductive unit 100u is disposed.

Both ends of the Z-axis direction of the conductive unit 100u are exposed on the Z-axis surface of the sheet 110. Both ends of the X-axis direction of the conductive unit 100u may be exposed to the X-axis direction surface of the sheet 110.

In the conductive unit 100u, a plurality of conductive portions 130 and a plurality of support portions 150 are formed to be interwoven with each other in the sheet 110. The conductive unit 100u may be formed in a mesh shape.

The conductive parts 130 extend in the Z-axis direction and are spaced apart from each other in the X-axis direction. The distance between the centers of two conductive parts 130 adjacent in the X-axis direction may be referred to as an arrangement distance Ph in the X-axis direction.

The plurality of conductive parts 130 may be arranged to be substantially spaced apart from each other in the X-axis direction. In this case, the arrangement pitch Ph in the X-axis direction of the plurality of conductive parts 130 may be defined.

The plurality of conductive parts 130 may be disposed on the sheet 110. Both ends of the plurality of conductive portions 130 in the Z-axis direction are exposed to the surface of the sheet 110. The upper end of the conductive portion 130 is exposed to the upper surface of the sheet 110, and the lower end of the conductive portion 130 is exposed to the lower surface of the sheet 110. The upper end of the conductive part 130 is configured to be in contact with the terminal 11 of the device under test 10, and the lower end of the conductive part 130 is configured to be in contact with the terminal 21 of the test equipment 20. .

The conductive portion 130 includes an exposed portion 133 exposed on the surface of the sheet 110. The exposed portion 133 is positioned at both ends of the conductive portion 130. The sheet 110 may be configured to surround the conductive portion 130 except for the exposed portion 133.

The exposed part 133 includes an upper exposed part 133a positioned at an upper end of the conductive part 130 and a lower exposed part 133b positioned at a lower end of the conductive part 130. The upper exposed portion 133a is configured to be in contact with the terminal 11 of the device under test 10, and the lower exposed portion 133b is configured to be in contact with the terminal 21 of the test equipment 20.

The conductive portion 130 includes a conductive material such as metal. For example, the entire conductive portion 130 may be formed of a conductive material. The conductive part 130 may be made of stainless steel (SUS), copper, nickel, spring steel, piano steel, tungsten, brass, or the like.

As another example, the conductive part 130 may be formed of a carbon nanotube (CNT) material. Each of the plurality of conductive portions 130 may include carbon nanotubes extending in the Z-axis direction. Carbon nanotubes are made of six carbon hexagonal structures connected to each other to form a tube. One conductive portion 130 may be composed of a plurality of carbon nanotubes. One conductive portion 130 may be formed in a fiber form (CNT fiber) using a plurality of carbon nanotubes. For example, one conductive portion 130 may be formed by twisting a plurality of carbon nanotubes. When each of the plurality of conductive portions 130 is formed of a plurality of carbon nanotubes, the spacing between the plurality of conductive portions 130 is much finer, and the exposed portion per unit area on the upper surface and the lower surface of the sheet 110 ( 133) can be significantly increased.

As another example, the conductive part 130 may be formed of a main body (not shown) extending in the Z-axis direction and a plating layer (not shown) of a conductive material plated on the main body. The conductive portion 130 may be formed of a main body, at least one intermediate layer (not shown) coated around the main body, and a plating layer of a conductive material plated on the surface of the intermediate layer. For example, the body may be piano steel, tungsten, brass, or the like, the intermediate layer may be nickel, or the like, and the plating layer may be gold, silver, rhodium, palladium, or the like.

The plurality of support parts 150 extend in the X-axis direction and are spaced apart from each other in the Z-axis direction. The distance between the centers of two conductive parts 130 adjacent to each other in the Z-axis direction may be referred to as an arrangement distance Pv in the Z-axis direction.

The plurality of support parts 150 may be arranged to be substantially spaced apart from each other in the Z-axis direction. In this case, the arrangement pitch Ph in the Z-axis direction of the plurality of support parts 150 may be defined.

Both ends of the plurality of support parts 150 in the X-axis direction may be exposed to the lateral surface of the sheet 110. Both ends of the plurality of support parts 150 in the X-axis direction may be covered by the sheet 110. The sheet 110 may be configured to surround the support part 150 except at least both ends in the X-axis direction. The sheet 110 may be configured to surround both ends of the support 150 in the X-axis direction.

The plurality of support parts 150 may be formed of a material having a stronger rigidity than that of the sheet 110. As a result, the support unit 150 supports the conductive unit 130 above the performance of the sheet 110 supporting the conductive unit 130, thereby preventing the positional change or permanent deformation of the conductive unit 130. Rises significantly.

The support part 150 is formed of an insulating material such as resin. For example, the support part 150 may be formed of poly resin or the like. The poly resins include polyester, polyimid, polyamide, and the like.

The arrangement distance Pv of two adjacent Z-axis directions among the plurality of support parts 150 may be 0.5 to 2 times the arrangement pitch Ph of the X-axis direction of the plurality of conductive parts 130. In FIG. 1, the plurality of support parts 150 are arranged to be spaced apart from each other by a predetermined distance, but the arrangement distances Pv of the plurality of support parts 150 may be different from each other. For example, the plurality of supports 150 may have partially different pitches.

The plurality of support parts 150 may be arranged spaced apart from each other by a predetermined interval. The array pitch Pv in the Z-axis direction of the plurality of support units 150 may be 0.5 to 2 times the array pitch Ph.

For example, the Pv may be 0.9 to 1.1 times the pH. The Pv may be substantially the same as the Ph.

On the other hand, the plurality of terminals 11 of the device under test 10 are arranged to be spaced apart from each other. In FIG. 1, the arrangement distance Pi between the centers of two adjacent terminals 11 on the XZ plane is shown. The plurality of terminals 11 may be arranged to be substantially spaced apart from each other on the XZ plane. In this case, the arrangement pitch Pi on the XZ plane of the plurality of terminals 11 can be defined.

The two inspection distances (Ph) adjacent on the XZ plane among the plurality of terminals 133a in the + Z axis direction of the plurality of conductive parts 130 contact the + Z axis direction side of the connector 100 for inspection. It may be less than the minimum distance Pi between the centers on the XZ plane of the plurality of terminals 11 of the device 10. An XZ plane arrangement pitch Ph of the plurality of ends 133a may be smaller than the minimum distance Pi. In FIG. 1, although the plurality of terminals 11 are arranged to be spaced apart from each other by a predetermined distance, the array distances Pi of the plurality of terminals 11 may be different from each other, and in this case, the minimum distance among the array distances Pi. The arrangement distance Ph on the XZ plane of the plurality of terminals 133a may be smaller than (Pi). According to this, one or more terminals 133a of the conductive parts 130 come into contact with one terminal. Even if the arrangement distance of the terminals 11 in the X-axis direction becomes larger than the minimum distance Pi, any one or more of the plurality of conductive portions 130 of the inspection connector 100 contact each terminal 11. can do. As a result, without having to use the test connector 100 having the plurality of conductive parts 130 corresponding to the plurality of terminals 11 one-to-one, one terminal is provided for the plurality of terminals 11 having various types of arrangement. The inspection connector 100 can be used.

In this case, the thickness on the XZ plane of the plurality of terminals 133a in the + Z axis direction of the plurality of conductive portions 130 may be 1/4 or more of the arrangement distance Ph, and may be smaller than the arrangement distance Ph. . As a result, while the plurality of conductive parts 130 are spaced apart from each other, the contact range of the conductive parts 130 is widened by a predetermined range or more, so that at least one conductive part may be formed on the terminal 11 regardless of the pitch of the terminal 11. 130) is easy to contact.

Referring to FIG. 2, the test connector 100 may include a plurality of unit layers 100A, 100B, 100C, 100D, 100E, ... stacked in the Y-axis direction. The unit layers 100A, 100B, 100C, 100D, 100E, ... each have a thickness in the Y-axis direction.

An interface 115 is formed between two adjacent ones of the plurality of unit layers 100A, 100B, 100C, 100D, 100E,... The plurality of unit layers 100A, 100B, 100C, 100D, 100E, ... may be adhered to each other by an adhesive, or may be adhered to each other by an adhesive force in the curing process of the sheet.

One unit layer 100A includes one conductive unit 100u and a sheet unit 110u supporting the conductive unit 100u. The test connector 100 includes a plurality of conductive units 100u. The inspection connector 100 may include a plurality of sheet units 110u corresponding to the plurality of conductive units 100u.

The plurality of conductive parts 130 belonging to one conductive unit 100u may be arranged in a line along the X-axis direction. The + Z direction ends of the plurality of conductive parts 130 belonging to one conductive unit 100u may be arranged in a line on the upper surface of the sheet 110.

The plurality of conductive portions 130 belonging to the plurality of conductive units 100u may not be arranged in a line along the Y-axis direction. The terminals in the + Z direction of the plurality of conductive parts 130 belonging to the plurality of conductive units 100u need not be arranged in a line in the Y-axis direction. For example, each conductive unit 100u may select the conductive part 130 closest to the virtual line based on a virtual line crossing the center of one conductive part 130 in the Y-axis direction. At this time, the distance (maximum deviation) between the center of the most distant from the said virtual line and the said virtual line among the said some electroconductive part 130 is 1/2 or less of the said arrangement pitch Ph. For example, when the arrangement pitch Ph is about 70 μm, the maximum deviation is about 35 μm.

The test connector 100 includes a plurality of conductive units 100u spaced apart from each other in the Y-axis direction. The distance between the centers of two conductive units 100u adjacent in the Y-axis direction may be referred to as an arrangement distance Pl in the Y-axis direction.

The plurality of conductive units 100u may be arranged to be substantially spaced apart from each other in the Y-axis direction. In this case, the arrangement pitch P1 in the Y-axis direction of the plurality of conductive units 100u can be defined.

The arrangement distance Pl of two adjacent Y-axis directions among the some conductive units 100u may be 0.2-5 times the arrangement pitch Ph of the X-axis direction of the some electroconductive part 130. FIG. In FIG. 2, the plurality of conductive units 100u are arranged to be spaced apart from each other by a predetermined distance, but the arrangement distances Pl of the plurality of conductive units 100u may be different from each other.

The plurality of support parts 150 may be arranged spaced apart from each other by a predetermined interval. The array pitch Pl in the Y-axis direction of the plurality of conductive units 100u may be 0.2 to 5 times the array pitch Ph.

Although not shown, a plurality of terminals 11 of the device under test may be spaced apart from each other on the YZ plane. The plurality of terminals 11 may be arranged to be substantially spaced apart at regular intervals in the Y-axis direction on the YZ plane. In this case, the arrangement pitch (not shown) on the YZ plane of the plurality of terminals 11 can be defined. The arrangement pitch Pi on the XZ plane of the plurality of terminals 11 and the arrangement pitch on the YZ plane may be substantially the same.

The two inspection distances Pl adjacent on the YZ plane among the plurality of terminals 133a in the + Z axis direction of the plurality of conductive portions 130 are in contact with the + Z axis direction side of the connector 100 for inspection. It may be smaller than the minimum distance (not shown, Pj) between the centers on the YZ plane of the plurality of terminals 11 of the device 10. The YZ planar arrangement pitch Pl of the plurality of ends 133a may be smaller than the minimum distance Pj. As a result, even if the arrangement distance in the Y-axis direction of the terminals 11 becomes larger than the minimum distance Pj, any one or more of the plurality of conductive parts 130 of the test connector 100 are connected to the respective terminals 11. ) Can be contacted. Since the arrangement pitch Ph is smaller than the minimum distance Pi and the arrangement pitch Pl is smaller than the minimum distance Pj, the pitch P in the X-axis direction and the Y-axis direction of the plurality of terminals 11 are reduced. One test connector 100 that can be used regardless of the pitch Pj may be implemented.

In this case, the YZ plane thicknesses of the plurality of terminals 133a in the + Z-axis direction of the plurality of conductive parts 130 may be 1/4 or more of the arrangement distance Pl and may be smaller than the arrangement distance Pl. . As a result, while the plurality of conductive parts 130 are spaced apart from each other, the contact range of the conductive parts 130 is widened by a predetermined range or more, so that at least one conductive part may be formed on the terminal 11 regardless of the pitch of the terminal 11. 130) is easy to contact.

The pitch of the present minimum level of the plurality of terminals 11 of the device under test 10 is 100 μm. Arrangement distance Ph in any two adjacent X-axis directions of the plurality of conductive parts 130 may be less than 100 μm. Of the plurality of terminals 133a in the + Z axis direction of the plurality of conductive parts 130, two adjacent arrangement distances Ph on the XZ plane may be smaller than 100 μm. Furthermore, the arrangement distance Pl of two adjacent Y-axis directions among the plurality of conductive units 100u may be smaller than 100um. Of the plurality of terminals 133a in the + Z axis direction of the plurality of conductive units 100u, any two adjacent array distances Pl on the YZ plane may be smaller than 100 μm. Thereby, the various types of test target device 10 having a pitch of the plurality of terminals 11 having a length of 100 μm or more can be inspected using one test connector 100.

The diameter of the conductive portion 130 is equal to or greater than 1/4 of the arrangement distance Ph and may be smaller than the arrangement distance Ph. In addition, the diameter of the conductive part 130 may be 1/4 or more of the arrangement distance Pl and may be smaller than the arrangement distance Pl.

In the present embodiment, the arrangement distance Ph and the arrangement distance Pl of the plurality of conductive portions 130 are about 70 to 80 μm, respectively. In this embodiment, the diameter of the conductive portion 130 is about 30um.

The sheet unit 110u has a thickness in the Y-axis direction. One sheet unit 110u may support one conductive unit 100u. The conductive unit 100u may be disposed in the middle portion of the sheet unit 110u in the Y-axis direction.

3 and 4, each of the plurality of conductive parts 130 is preferably convexly curved in the Y-axis direction at each point crossing each of the plurality of support parts 150. As a result, when the terminal 11 contacts the + Z axis direction terminal 133a of the conductive portion 130, the conductive portion 130 may be elastically compressed efficiently like a spring.

Each of the conductive parts 130 may include a plurality of bending parts 135 that are convexly curved in the Y-axis direction and spaced apart from each other in the Z-axis direction. The plurality of bending parts 135 may include a plurality of first bending parts 135a convexly curved in the + Y-axis direction and a plurality of second bending parts 135b convexly curved in the -Y-axis direction. have. In one conductive portion 130, the first bending portion 135a and the second bending portion 135b may be alternately arranged along the Z-axis direction.

In the conductive unit 100u according to one embodiment referring to FIG. 4 (a) and the conductive unit 100u 'according to another embodiment referring to FIG. 4 (b), the conductive part 130 may include a plurality of supporting parts ( 150, the bending portion 135 is formed at each point across each.

Referring to FIG. 4A, each of the plurality of support parts 150 of the conductive unit 100u is convexly curved in the Y-axis direction at each point across each of the plurality of conductive parts 130. All. According to the exemplary embodiment, at each of the points, the support part 150 and the conductive part 130 that cross each other are bent in opposite directions.

Referring to FIG. 4B, the support portion 150 of the conductive unit 100u 'according to another embodiment has a smaller level of curvature (curvature) than the conductive portion 130. Each of the plurality of support portions 150 of the conductive unit 100u 'may extend linearly in the X-axis direction without bending. The plurality of bending parts 135 of the conductive unit 100u 'according to the other exemplary embodiment may be bent at a larger curvature than the plurality of bending parts 135 of the conductive unit 100u according to the one embodiment.

5A to 5C, the plurality of conductive parts 130 and the plurality of support parts 150 may be woven in any one or two or more of a plain weave structure, a twill weave structure, and a main weave structure. Referring to FIG. 5A, in the conductive unit 100u according to the first embodiment, a plurality of conductive portions 130 and a plurality of support portions 150 are formed by weaving a flat weave structure. Referring to FIG. 5B, the conductive unit 100u ″ according to the second embodiment is formed by weaving a plurality of conductive portions 130 and a plurality of support portions 150 in a twill structure. Referring to FIG. 5C, in the conductive unit 100u ′ ″ according to the third embodiment, a plurality of conductive parts 130 and a plurality of support parts 150 are formed by weaving a main structure.

The plurality of support parts 150 that any one of the conductive parts 130 intersect are divided into a first group and a second group. At least one of the plurality of support parts 150 that any one of the conductive parts 130 intersects is defined as a first group, and the rest except the first group is defined as a second group.

Any one of the plurality of conductive portions 130 crosses each of the first groups of the plurality of supporting portions 150 at a position in the + Y-axis direction with respect to each of the first groups, and the plurality of supporting portions 150 Each of the second groups is traversed at a position in the -Y axis direction with respect to each of the second groups. Here, "any one conductive part 130 of the plurality of conductive parts 130" means any one conductive part 130 selected at random from the plurality of conductive parts 130. That is, each conductive portion 130 traverses the first group at a position in the + Y-axis direction with respect to the first group and the second group defined based on the respective conductive portions 130, and the second group -Traverse at the position in the Y-axis direction.

Referring to FIG. 5A, the conductive unit 100u according to the first embodiment is described as follows. One conductive portion 130-1 crosses the first group 150-1 at the + Y axis direction and crosses the second group 150-2 at the-Y axis direction. In addition, one of the conductive parts 130-2 crosses the first group 150-2 at the position in the + Y axis direction, and crosses the second group 150-1 at the position in the −Y axis direction.

Referring to FIG. 5B, the conductive unit 100u ″ according to the second embodiment is described as follows. One conductive portion 130-1 traverses the first group 150-3 at a position in the + Y-axis direction, and the second group 150-1 and 150-2 is transversely at the position in the -Y-axis direction. Shout One conductive portion 130-2 traverses the first group 150-2 at a position in the + Y-axis direction, and one of the conductive units 130-2 is transversely at the position in the -Y-axis direction. Shout One conductive portion 130-3 traverses the first group 150-1 at a position in the + Y-axis direction, and the second group 150-2 and 150-3 is transverse at the position in the -Y-axis direction. Shout

Referring to FIG. 5C, the conductive unit 100u '' 'according to the third embodiment will be described below. One conductive part 130-1 crosses the first group 150-1, 150-2, 150-3, and 150-4 at a position in the + Y-axis direction, and the second group 150-5. -Traverse at the position in the Y-axis direction. One conductive part 130-2 traverses the first group 150-1, 150-3, 150-4, and 150-5 at a position in the + Y-axis direction, and the second group 150-2. -Traverse at the position in the Y-axis direction. One conductive part 130-3 crosses the first group 150-1, 150-2, 150-3, and 150-5 at a position in the + Y-axis direction, and the second group 150-4. -Traverse at the position in the Y-axis direction. One conductive part 130-4 crosses the first group 150-2, 150-3, 150-4, and 150-5 at a position in the + Y-axis direction, and the second group 150-1. -Traverse at the position in the Y-axis direction. One conductive portion 130-5 crosses the first group 150-1, 150-2, 150-4, and 150-5 at a position in the + Y-axis direction, and the second group 150-3. -Traverse at the position in the Y-axis direction.

Referring to FIG. 5A, the conductive unit 100u is preferably woven in a plain weave structure. Any one of the plurality of conductive portions 130-1 and 130-2 crosses any one of two adjacent adjacent support portions 150-1 and 150-2 at a position in the + Y-axis direction, The other of the two support parts 150-1 and 150-2 crosses at a position in the −Y axis direction. In addition, any one of the plurality of support portions 150-1 and 150-2 crosses any one of two adjacent adjacent conductive portions 130-1 and 130-2 at a position in the + Y-axis direction. The other one of the two conductive parts 130-1 and 130-2 is crossed at the position of-Y-axis direction.

Hereinafter, a manufacturing method of the test connector will be described with reference to FIGS. 6A and 6B. Although process steps, method steps, algorithms, and the like have been described in sequential order in the flow diagrams shown in FIGS. 6A and 6B, such processes, methods, and algorithms may be configured to operate in any suitable order. In other words, the steps of the processes, methods, and algorithms described in various embodiments of the present disclosure need not be performed in the order described in this disclosure. In addition, although some steps are described as being performed asynchronously, in some embodiments these some steps may be performed simultaneously. Moreover, illustration of the process by depiction in the figures does not mean that the illustrated process excludes other changes and modifications thereto, and any of the illustrated process or steps thereof is one of the various embodiments of the present disclosure. It is not meant to be essential to more than one, nor does it mean that the illustrated process is preferred.

The manufacturing method may include stacking a plurality of unit layers 100A, 100B, 100C, and S10 and S10 '. The manufacturing method may include cutting (S30) the plurality of stacked unit layers after the steps S10 and S10 '. Here, step S30 may be referred to as cutting step S30.

In the above steps (S10, S10 ′), the plurality of conductive units 130 and the plurality of support units 150 are woven together to generate the conductive unit 100u. In the steps S10 and S10 ′, the conductive unit 100u is disposed in the sheet unit 110u to generate a unit layer 100A having a thickness in the Y-axis direction. In the above steps (S10, S10 ′), the unit layer may be generated by curing the sheet unit 110u while the conductive unit 100u is disposed inside the liquid sheet unit 110u.

In step S10 and S10 ′, a plurality of unit layers 100A, 100B, 100C,? In the steps S10 and S10 ', the plurality of unit layers are stacked in the Y-axis direction.

The plurality of unit layers may be bonded to each other and stacked. For example, the plurality of unit layers may be adhered to each other using an adhesive. As another example, the plurality of unit layers may be adhered to each other through an adhesive force generated by curing the sheet unit 110u on the Y-axis surface of another adjacent sheet unit 110u.

Referring to Figure 6a, the manufacturing method (S1) according to an embodiment is as follows. The manufacturing method S1 includes a step S11 of generating a first unit layer. Thereafter, a process of generating an n-th unit layer and stacking the n-th unit layer with the n-th unit layer is performed. After the first unit layer is generated, n is 2 (S12), so that a process of generating a second unit layer and stacking it with the first unit layer (S13) is performed. After the step S13, when the number n of stacked unit layers does not reach a predetermined target number p (S14), the n value is increased by 1 (S15), and the step S13 is again performed. Proceed. After the process S13, when the number n of stacked unit layers reaches a predetermined target number p (S14), a cutting step S30 of cutting the stacked p unit layers is performed. For example, if the p value is 100, the first unit layers to the 100th unit layers are sequentially generated and stacked (S10). Here, p is a natural number of 2 or more.

Referring to Figure 6b, the manufacturing method (S1 ') according to another embodiment is as follows. The manufacturing method S1 ′ includes a step S17 of generating a plurality of unit layers. Thereafter, the process of stacking the generated unit layers (S18) is performed. In the process S18, a plurality of unit layers may be laminated using an adhesive. After the process S18, the cutting step S30 is performed.

Referring to Figure 7, when describing the manufacturing method of the test connector according to an embodiment are as follows. In FIG. 7, a plurality of conductive parts 130 and a plurality of support parts 150 are omitted from each other.

Referring to FIG. 7A, a plurality of conductive parts 130 and a plurality of support parts 150 are woven to generate a conductive unit 100u. For example, a pair of fixing bars that support both ends of the Z-axis direction of the plurality of conductive parts 130 may be used. In addition, a pair of fixing bars supporting both ends of the X-axis direction of the plurality of support parts 150 may be used. As another example, while the conductive unit is rolled and rolled, the Z-axis one end of the conductive unit 100u may be supported using a fixing bar, and the other end may be supported by the roll. As another example, one end of the conductive unit 100u in the X-axis direction may be supported using a fixing bar, and the other end may be supported by a roll.

Referring to FIG. 7B, at least one of the plurality of conductive parts 130 and the plurality of support parts 150 is supported by a fixing bar or a roll, the liquid sheet unit 110u is introduced. Can be. Here, one of the Y-axis directions (for example, the + Y-axis direction) of the conductive unit 100u becomes the gravity direction, and the liquid sheet unit 110u can spread widely along the XZ plane. The conductive unit 100u is deposited on the liquid sheet unit 110u while being spaced apart from the bottom in the Y-axis direction so that the sheet unit 110u is formed in both the + Y-axis direction and the -Y-axis direction of the conductive unit 100u. Can be applied. Here, when the conductive unit 100u is deposited on the liquid sheet unit 100u, and the liquid sheet unit 110u is cured, one unit layer 100A is generated.

Referring to FIG. 7C, the unit layers 100A, 100B, 100C, and? Are generated according to the method described above and stacked in the Y-axis direction.

Referring to FIG. 7D, the plurality of stacked unit layers 100A, 100B, 100C,..., Are cut in a direction crossing the Z-axis direction to generate a test connector 100. Here, the direction crossing the Z-axis direction is meant to encompass not only the direction perpendicular to the Z axis but also the direction forming the acute angle with the Z axis. Through the cutting process, it is possible to implement a set length in the thickness direction of the test connector 100. For example, the inspection connector 100 may have a length in the thickness direction such that about 30 supports 150 having an arrangement pitch Pv of about 70 μm are arranged in the thickness direction.

Hereinafter, a test method of a device under test using the test connector 100 according to the embodiment will be described. In the inspection method, the connector 100 is disposed between the device under test 10 and the test equipment 20 to determine whether there is a defect based on whether the device under test 10 is energized.

The inspection connector 100 used in the inspection method includes a conductive unit having a sheet of insulating material and a plurality of conductive portions 130 extending in the Z-axis direction and spaced apart from each other in the X-axis direction. Here, both ends in the Z-axis direction of the plurality of conductive parts 130 are exposed on the surface of the sheet 110. The test connector 100 may include a plurality of conductive units spaced apart from each other in the Y-axis direction.

Here, among the plurality of terminals 133a in the + Z axis direction of the plurality of conductive parts 130, two arrangement distances Phh adjacent on the XZ plane contact the + Z axis direction side of the connector 100 for inspection. It is preferable to set smaller than minimum distance Pi between centers on the XZ plane of the plurality of terminals 11 of the device under test 10. Detailed description thereof will be omitted as described above.

Here, two arrangement distances Pl adjacent on the YZ plane among the plurality of terminals 133a in the + Z axis direction of the plurality of conductive units 100u are YZ of the plurality of terminals 11 of the device under test 10. It is preferably set smaller than the minimum distance between the centers in the plane. Detailed description thereof will be omitted as described above.

While the technical spirit of the present disclosure has been described with reference to some embodiments and the examples shown in the accompanying drawings, the technical spirit and scope of the present disclosure may be understood by those skilled in the art. It will be appreciated that various substitutions, modifications, and alterations can be made in the scope. Also, such substitutions, modifications and variations are intended to be included within the scope of the appended claims.

10: device under test, 20: test equipment, 100: test connector,
100A, 100B, 100C, 100D, 100E: unit layer,
100u, 100u ', 100u'',100u''': conductive unit, 110: sheet,
100u: sheet unit, 130: conductive portion, 150: support portion

Claims (16)

In the inspection connector arranged between the device under test and the test equipment for electrically connecting the device under test and the test equipment with each other,
On XYZ Cartesian coordinates,
Sheets of insulating material; And
A plurality of conductive parts of a conductive material extending in the Z-axis direction and spaced apart from each other in the X-axis direction, and a plurality of supporting parts of the insulating material extending in the X-axis direction and spaced apart from each other in the Z-axis direction, A plurality of conductive units and a plurality of supporting units include conductive units formed by weaving each other;
An inspection connector, in which both ends in the Z-axis direction of the plurality of conductive portions are exposed on the surface of the sheet. The method of claim 1,
And a plurality of the conductive units arranged to be spaced apart from each other in the Y-axis direction. The method of claim 2,
An arraying distance in two adjacent Y-axis directions of the plurality of conductive units is 0.2 to 5 times an array pitch in the X-axis direction of the plurality of conductive portions. The method of claim 1,
And each of the plurality of conductive portions is convexly curved in the Y-axis direction at each point across each of the plurality of support portions. The method of claim 1,
And the plurality of conductive portions and the plurality of support portions are woven in any one or a combination of two or more of a plain weave structure, a twill structure, and a main weave structure. The method of claim 1,
Any one of the plurality of conductive portions, the conductive portion,
Traverse each of the first group, which is at least one of the plurality of supports, at a position in the + Y axis direction with respect to each of the first groups,
And each of the second group except the first group of the plurality of supports crosses at a position in the -Y axis direction with respect to each of the second groups. The method of claim 6,
Any one of the plurality of conductive portions, the conductive portion,
Traverse any one of any two adjacent supports at a position in the + Y axis direction, cross the other of the two supports at a position in the -Y axis direction,
Any one of the plurality of support parts,
And any one of the two adjacent conductive portions traverses at a position in the + Y-axis direction, and the other of the two conductive portions traverses at a position in the -Y-axis direction. The method of claim 1,
The plurality of supporting parts are formed of a material having a rigidity stronger than that of the sheet. The method of claim 1,
Each of the plurality of conductive parts includes a carbon nanotube extending in the Z-axis direction. The method of claim 1,
An arraying distance in the adjacent two Z-axis directions among the plurality of supporting portions is 0.5 to 2 times the arrangement pitch in the X-axis direction of the plurality of conductive portions. The method of claim 1,
An inspection connector, wherein an arrangement pitch of two adjacent X-axis directions among the plurality of conductive portions is smaller than 100 um. The method of claim 11,
It includes a plurality of the conductive unit spaced apart from each other in the Y-axis direction,
The connector for inspection in which arrangement distances of two adjacent Y-axis directions of a plurality of conductive units are smaller than 100 um. The method of claim 1,
Two arrangement distances adjacent to each other on the XZ plane among the plurality of terminals in the + Z axis direction of the plurality of conductive parts are between XZ plane centers of a plurality of terminals of the device under test in contact with the + Z axis direction side of the test connector. Less than the minimum distance of the connector for inspection. The conductive unit is formed by weaving a plurality of conductive portions of a conductive material extending in the Z-axis direction and spaced apart from each other in the X-axis direction and a plurality of support portions of the insulating material extending in the X-axis direction and spaced apart from each other in the Z-axis direction on XYZ rectangular coordinates. And generating a unit layer having a thickness in the Y-axis direction by arranging the conductive unit inside the sheet unit of an insulating material, and stacking a plurality of the unit layers in the Y-axis direction. Method of manufacturing a connector for inspection. The method of claim 14,
And (b) after the step (a), cutting the stacked plurality of unit layers in a direction crossing the Z-axis direction to generate the test connector. The method of claim 14,
In the step (a), hardening the sheet unit in a state in which the conductive unit is disposed inside the sheet unit in a liquid phase, to produce the unit layer, the manufacturing method of the connector for inspection.