KR102000309B1 - 타겟 오브젝트 상의 디스크레펀시들을 추적하고 검출하기 위한 자동화된 시스템 및 방법 - Google Patents

타겟 오브젝트 상의 디스크레펀시들을 추적하고 검출하기 위한 자동화된 시스템 및 방법 Download PDF

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KR102000309B1
KR102000309B1 KR1020147011725A KR20147011725A KR102000309B1 KR 102000309 B1 KR102000309 B1 KR 102000309B1 KR 1020147011725 A KR1020147011725 A KR 1020147011725A KR 20147011725 A KR20147011725 A KR 20147011725A KR 102000309 B1 KR102000309 B1 KR 102000309B1
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target object
orientation
camera
image
discrepancy
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KR20140109858A (ko
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게리 이. 조지슨
제임스 제이. 트로이
스캇 더블유. 레아
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더 보잉 컴파니
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/87—Combinations of systems using electromagnetic waves other than radio waves
    • G01S17/875—Combinations of systems using electromagnetic waves other than radio waves for determining attitude
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
KR1020147011725A 2012-01-25 2012-11-28 타겟 오브젝트 상의 디스크레펀시들을 추적하고 검출하기 위한 자동화된 시스템 및 방법 Active KR102000309B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/357,768 2012-01-25
US13/357,768 US9310317B2 (en) 2012-01-25 2012-01-25 Automated system and method for tracking and detecting discrepancies on a target object
PCT/US2012/066747 WO2013112229A1 (en) 2012-01-25 2012-11-28 Automated system and method for tracking and detecting discrepancies on a target object

Publications (2)

Publication Number Publication Date
KR20140109858A KR20140109858A (ko) 2014-09-16
KR102000309B1 true KR102000309B1 (ko) 2019-07-15

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KR1020147011725A Active KR102000309B1 (ko) 2012-01-25 2012-11-28 타겟 오브젝트 상의 디스크레펀시들을 추적하고 검출하기 위한 자동화된 시스템 및 방법

Country Status (6)

Country Link
US (1) US9310317B2 (enExample)
EP (1) EP2807472B1 (enExample)
JP (1) JP6144282B2 (enExample)
KR (1) KR102000309B1 (enExample)
CN (1) CN104067111B (enExample)
WO (1) WO2013112229A1 (enExample)

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CN105293070B (zh) * 2015-12-04 2017-06-16 博格华纳汽车零部件（江苏）有限公司 涡轮部件焊缝检测设备及检测方法
FR3046848B1 (fr) * 2016-01-14 2018-01-05 Donecle Procede et systeme de determination de la position d'un engin mobile
JP6534457B2 (ja) 2016-02-04 2019-06-26 富士フイルム株式会社 情報処理装置、情報処理方法、及びプログラム
CN106126933B (zh) * 2016-06-24 2018-11-30 清华大学 一种基于动态数据协调降低测量参数噪音的方法
CN107968677B (zh) * 2016-10-20 2021-03-19 株式会社理光 定向传播无线信号的中继装置、方法和系统
US10435173B2 (en) * 2017-01-16 2019-10-08 The Boeing Company Remote optical control surface indication system
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DE102019201164A1 (de) * 2019-01-30 2020-07-30 Siemens Aktiengesellschaft Verfahren zum Erfassen einer aus einem ersten Werkstoff gebildeten Beschichtung eines Bauteils, insbesondere einer Maschine
US10488185B1 (en) * 2019-03-14 2019-11-26 The Boeing Company Methods and systems for characterizing a surface of a structural component
CN111929319B (zh) * 2020-10-14 2021-04-09 天津文洲机械有限公司 一种间接式高精度丝网破损视觉检测机
WO2022141231A1 (en) * 2020-12-30 2022-07-07 SZ DJI Technology Co., Ltd. Systems and methods for determining the position of an object using an unmanned aerial vehicle
US20250071251A1 (en) * 2023-08-22 2025-02-27 Spirit Aerosystems, Inc. System and method for locating and visualizing camera images in relation to a large-scale manufacturing product

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Also Published As

Publication number Publication date
JP6144282B2 (ja) 2017-06-07
EP2807472A1 (en) 2014-12-03
CN104067111B (zh) 2017-03-01
WO2013112229A1 (en) 2013-08-01
US20130188059A1 (en) 2013-07-25
EP2807472B1 (en) 2020-05-06
JP2015506480A (ja) 2015-03-02
KR20140109858A (ko) 2014-09-16
US9310317B2 (en) 2016-04-12
CN104067111A (zh) 2014-09-24

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