CN104067111B - 用于跟踪和监测目标对象上的差异的自动化系统和方法 - Google Patents

用于跟踪和监测目标对象上的差异的自动化系统和方法 Download PDF

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Publication number
CN104067111B
CN104067111B CN201280067976.XA CN201280067976A CN104067111B CN 104067111 B CN104067111 B CN 104067111B CN 201280067976 A CN201280067976 A CN 201280067976A CN 104067111 B CN104067111 B CN 104067111B
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China
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orientation
image
destination object
difference
target object
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Chinese (zh)
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CN104067111A (zh
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G·E·乔格森
J·J·特洛伊
S·W·莱安
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Boeing Co
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Boeing Co
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/87—Combinations of systems using electromagnetic waves other than radio waves
    • G01S17/875—Combinations of systems using electromagnetic waves other than radio waves for determining attitude
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Remote Sensing (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CN201280067976.XA 2012-01-25 2012-11-28 用于跟踪和监测目标对象上的差异的自动化系统和方法 Active CN104067111B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/357,768 US9310317B2 (en) 2012-01-25 2012-01-25 Automated system and method for tracking and detecting discrepancies on a target object
US13/357,768 2012-01-25
PCT/US2012/066747 WO2013112229A1 (en) 2012-01-25 2012-11-28 Automated system and method for tracking and detecting discrepancies on a target object

Publications (2)

Publication Number Publication Date
CN104067111A CN104067111A (zh) 2014-09-24
CN104067111B true CN104067111B (zh) 2017-03-01

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201280067976.XA Active CN104067111B (zh) 2012-01-25 2012-11-28 用于跟踪和监测目标对象上的差异的自动化系统和方法

Country Status (6)

Country Link
US (1) US9310317B2 (enExample)
EP (1) EP2807472B1 (enExample)
JP (1) JP6144282B2 (enExample)
KR (1) KR102000309B1 (enExample)
CN (1) CN104067111B (enExample)
WO (1) WO2013112229A1 (enExample)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011103003A1 (de) * 2011-05-24 2012-11-29 Lufthansa Technik Ag Verfahren und Vorrichtung zur Rissprüfung eines Flugzeug- oder Gasturbinen-Bauteils
WO2014033643A1 (en) * 2012-08-31 2014-03-06 Systèmes Pavemetrics Inc. Method and apparatus for detection of foreign object debris
WO2015039210A1 (en) * 2013-09-18 2015-03-26 Matter and Form Inc. Device, system and method for three-dimensional modeling
US9488589B2 (en) 2013-10-29 2016-11-08 The Boeing Company Mapping damaged regions on objects
US9575004B2 (en) * 2014-11-17 2017-02-21 The Boeing Company Automated low cost method for illuminating, evaluating, and qualifying surfaces and surface coatings
US10049493B1 (en) * 2015-10-22 2018-08-14 Hoyt Architecture Lab, Inc System and methods for providing interaction with elements in a virtual architectural visualization
CN105293070B (zh) * 2015-12-04 2017-06-16 博格华纳汽车零部件（江苏）有限公司 涡轮部件焊缝检测设备及检测方法
FR3046848B1 (fr) * 2016-01-14 2018-01-05 Donecle Procede et systeme de determination de la position d'un engin mobile
WO2017134882A1 (ja) * 2016-02-04 2017-08-10 富士フイルム株式会社 情報処理装置、情報処理方法、及びプログラム
CN106126933B (zh) * 2016-06-24 2018-11-30 清华大学 一种基于动态数据协调降低测量参数噪音的方法
CN107968677B (zh) * 2016-10-20 2021-03-19 株式会社理光 定向传播无线信号的中继装置、方法和系统
US10435173B2 (en) * 2017-01-16 2019-10-08 The Boeing Company Remote optical control surface indication system
US10156439B2 (en) 2017-03-03 2018-12-18 The Boeing Company Inspection system for alignment in restricted volumes
US11238675B2 (en) * 2018-04-04 2022-02-01 The Boeing Company Mobile visual-inspection system
JP2019211998A (ja) * 2018-06-04 2019-12-12 富士通株式会社 点検支援プログラム、点検支援方法および点検支援装置
WO2020069422A1 (en) * 2018-09-28 2020-04-02 Brainbaby Inc. Self-contained low profile cross shooting video apparatus
DE102019201164A1 (de) * 2019-01-30 2020-07-30 Siemens Aktiengesellschaft Verfahren zum Erfassen einer aus einem ersten Werkstoff gebildeten Beschichtung eines Bauteils, insbesondere einer Maschine
US10488185B1 (en) * 2019-03-14 2019-11-26 The Boeing Company Methods and systems for characterizing a surface of a structural component
CN111929319B (zh) * 2020-10-14 2021-04-09 天津文洲机械有限公司 一种间接式高精度丝网破损视觉检测机
CN116745725A (zh) * 2020-12-30 2023-09-12 深圳市大疆创新科技有限公司 使用无人机确定物体位置的系统和方法
US20250071251A1 (en) * 2023-08-22 2025-02-27 Spirit Aerosystems, Inc. System and method for locating and visualizing camera images in relation to a large-scale manufacturing product

Family Cites Families (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4895448A (en) 1988-01-13 1990-01-23 Laird Richard P Method and apparatus for determining the surface quality of an object
JPH02311961A (ja) * 1989-05-29 1990-12-27 Mitsubishi Heavy Ind Ltd 画像処理技術を利用した検査方法
KR100193494B1 (ko) 1993-07-23 1999-06-15 신형인 Ccd카메라와 레이저 거리계를 이용한 타이어 형상 변화 측정 방법
US6064429A (en) 1997-08-18 2000-05-16 Mcdonnell Douglas Corporation Foreign object video detection and alert system and method
JP2003065736A (ja) * 2001-08-24 2003-03-05 Sanyo Electric Co Ltd ３次元モデリング装置
AU2002362669A1 (en) 2001-10-11 2003-04-22 Laser Projection Technologies Inc. A Delaware Corporation Method and system for visualizing surface errors
US7220978B2 (en) * 2003-04-15 2007-05-22 The University Of South Carolina System and method for detecting defects in semiconductor wafers
US7236625B2 (en) 2003-07-28 2007-06-26 The Boeing Company Systems and method for identifying foreign objects and debris (FOD) and defects during fabrication of a composite structure
US20050205781A1 (en) * 2004-01-08 2005-09-22 Toshifumi Kimba Defect inspection apparatus
US20060108048A1 (en) 2004-11-24 2006-05-25 The Boeing Company In-process vision detection of flaws and fod by back field illumination
US7424902B2 (en) 2004-11-24 2008-09-16 The Boeing Company In-process vision detection of flaw and FOD characteristics
US7307001B2 (en) * 2005-01-05 2007-12-11 Taiwan Semiconductor Manufacturing Company, Ltd. Wafer repair method using direct-writing
US7480037B2 (en) 2005-12-02 2009-01-20 The Boeing Company System for projecting flaws and inspection locations and associated method
US7835567B2 (en) 2006-01-24 2010-11-16 Ingersoll Machine Tools, Inc. Visual fiber placement inspection
US7454265B2 (en) 2006-05-10 2008-11-18 The Boeing Company Laser and Photogrammetry merged process
US9052294B2 (en) 2006-05-31 2015-06-09 The Boeing Company Method and system for two-dimensional and three-dimensional inspection of a workpiece
US8050486B2 (en) 2006-05-16 2011-11-01 The Boeing Company System and method for identifying a feature of a workpiece
US7495758B2 (en) 2006-09-06 2009-02-24 Theo Boeing Company Apparatus and methods for two-dimensional and three-dimensional inspection of a workpiece
KR100846633B1 (ko) * 2006-11-09 2008-07-16 삼성전자주식회사 패턴 결함 검출 방법 및 장치
US7904845B2 (en) * 2006-12-06 2011-03-08 Kla-Tencor Corp. Determining locations on a wafer to be reviewed during defect review
DE102007036271A1 (de) 2007-07-31 2009-02-05 Baumer Hübner GmbH Drehgeber mit Überwachung des Lagerverschleißes sowie Verfahren hierzu
US8044991B2 (en) * 2007-09-28 2011-10-25 The Boeing Company Local positioning system and method
US7859655B2 (en) 2007-09-28 2010-12-28 The Boeing Company Method involving a pointing instrument and a target object
CN101614677A (zh) * 2008-06-25 2009-12-30 沈阳利泰自控技术有限责任公司 机翼夹板蜂窝结构的高精度激光全息自动检测系统
US8199194B2 (en) * 2008-10-07 2012-06-12 The Boeing Company Method and system involving controlling a video camera to track a movable target object
US8198617B2 (en) 2008-12-15 2012-06-12 The Boeing Company Locating a component underneath a surface of a target object and locating an access panel for accessing the component
FR2945630B1 (fr) * 2009-05-14 2011-12-30 Airbus France Procede et systeme d'inspection a distance d'une structure
US8493444B2 (en) * 2009-09-29 2013-07-23 United States Postal Service System and method of detecting a blocked aperture in letter or flat mail image sensor
US8249832B2 (en) 2009-12-05 2012-08-21 The Boeing Company Correlation of inspection information and computer-aided design data for structural assessment
US8279412B2 (en) 2009-12-17 2012-10-02 The Boeing Company Position and orientation determination using movement data
JP2013528795A (ja) 2010-05-04 2013-07-11 クリアフォーム インコーポレイティッド 参照容量分析センサを用いた対象検査
US9149929B2 (en) 2010-05-26 2015-10-06 The Boeing Company Methods and systems for inspection sensor placement

Also Published As

Publication number Publication date
EP2807472A1 (en) 2014-12-03
JP6144282B2 (ja) 2017-06-07
KR102000309B1 (ko) 2019-07-15
EP2807472B1 (en) 2020-05-06
WO2013112229A1 (en) 2013-08-01
US20130188059A1 (en) 2013-07-25
CN104067111A (zh) 2014-09-24
JP2015506480A (ja) 2015-03-02
US9310317B2 (en) 2016-04-12
KR20140109858A (ko) 2014-09-16

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