KR101796013B1 - Solid State Drive Device Test Chamber - Google Patents

Abstract

An auxiliary memory device test chamber according to the present invention comprises: a housing; a blower fan installed in the housing; a blowing duct provided to transfer air, discharged from the blower fan, to the opposite side of the blower fan; a duct tail extended long in the vertical direction of the housing while sealing up an end part of the blowing duct at the opposite side of the blower fan; a plurality of air purge plates arranged as layers spaced in a vertical direction between the blower fan and the duct tail, installed to receive air individually from the duct tail, and configured to regularly distribute the received air to the entire surface forming each layer; a plurality of purge holes formed in each of the air purge plates to inject the air from the surfaces forming the layers of the air purge plates and to cool the auxiliary memory devices under test; an evaporator partitioning the housing between the blower fan and the layers of the air purge plates and allowing the air injected from the air purge plates to be cooled while passing therethrough; and a heater provided on a space for moving the air having passed through the evaporator to the blower fan and able to heat the air. The present invention can maintain minimum temperature deviations of the auxiliary memory devices under test to perform uniform cooling and temperature adjustment.

Description

[0001] Solid State Drive Device Test Chamber [0002]

[0001] The present invention relates to an auxiliary storage test chamber, and more particularly, to a test chamber for testing a large number of solid state drives (SSD) used as auxiliary storage devices of various computer products .

The test of the auxiliary memory device such as the SSD is performed through the repetitive operation of writing and reading a plurality of times. Since the test circuit and the test auxiliary memory device involve considerable heat generation during the test, Stable warmth control is essential.

Further, in order to test a large number of auxiliary storage devices collectively, it is necessary to stably secure the state in which the AOT devices are uniformly cooled and controlled in temperature. That is, it is possible to obtain more accurate and reliable test results by performing the test with repetitive write and read operations repeatedly in a situation where all of the test auxiliary memories maintain the same temperature condition.

Even during the test, even if the cooling wind or the like acts as a physical external force to the auxiliary storage device or the like, the auxiliary storage device itself or the auxiliary storage device mounted on the test board is not subjected to vibration or deformation Is preferable for obtaining more stable and accurate test results.

KR 0001 A

SUMMARY OF THE INVENTION The present invention has been made in view of the above-described needs, and it is an object of the present invention to provide a method and apparatus for testing a large amount of TAT to collectively perform cooling and temperature control, The auxiliary storage device can be stably maintained and the auxiliary storage devices to be tested can be prevented from being vibrated or deformed by an external force such as cooling wind during the test so that the reliability and stability of the auxiliary storage devices can be improved. A test chamber is provided.

According to an aspect of the present invention,

A housing defining an outer periphery of the test chamber;

A blower fan installed inside one side of the housing;

A blowing duct installed to blow the air discharged from the blower fan to the opposite side of the blower fan while being separated from the inside of the housing;

A duct tail extending in the vertical direction of the housing while sealing an end of the blowing duct opposite to the blower fan;

A plurality of air blowers arranged to be vertically spaced apart from each other between the blower fan and the duct tail and installed to receive air individually from the duct tail and configured to uniformly distribute the supplied air to the entire surface of the layer, A purge plate;

A plurality of purge holes formed in each air purge plate to eject air from the layered surface of the air purge plate to cool the AASs;

An evaporator disposed between the air purge plates arranged in the layer and the blower fan to cool the air blown from the air purge plate while passing through the housing;

And a heater provided on the space through which the air passed through the evaporator flows to the blower fan to heat the air.

The blowing duct may extend from the blower fan to an upper space of the evaporator and air purge plates and then extend downward to form the duct tail;

The width of the duct tail in the direction facing the air purge plates arranged in the layer is constant along the vertical direction, and the width in the direction perpendicular thereto may be gradually narrowed as the duct tail extends downward.

A test board in which auxiliary memory devices to be tested are disposed is inserted between the layered air purge plates;

Wherein the purge holes of the air purge plate are formed in a plurality of rows so as to eject air individually toward the auxiliary storage devices mounted on the test board;

The test board may be provided with a fixed supporting device for fixing and supporting the mounted auxiliary memory devices.

Wherein the fixed support apparatus includes a plurality of auxiliary storage units mounted in a row on a top surface of the test board so that the auxiliary storage units can form an electrical connection with the test board, ≪ / RTI >

The tray may be formed such that a plurality of auxiliary storage devices are spaced apart from each other at a predetermined interval, and heat is applied to a portion of each lower side of the tray to be fixed.

The fixed support device

A plurality of guide posts arranged opposite to each other on the test board so as to guide upward and downward linear movement;

A support bar having a horizontally elongated shape so as to be guided and fixed in a vertical direction by the guide posts between the pair of guide posts;

And a plurality of individual fixing means provided on the support bar for fixing and supporting upper ends of the auxiliary memory devices to be tested, respectively.

The fixed support device

A plurality of guide posts arranged opposite to each other on the test board so as to guide upward and downward linear movement;

A support bar having a horizontally elongated shape so as to be guided and fixed in a vertical direction by the guide posts between the pair of guide posts;

A rotation fixing bar provided rotatably with respect to the support bar with a rotation axis parallel to the support bar;

And a plurality of individual fixing means provided on the pivotal fixing bar for fixing and supporting the upper ends of the auxiliary memory devices to be tested, respectively.

The individual fixing means may be composed of a ground contact ring inserted into the upper ground fixing groove of the NGFF type SSD which is an auxiliary memory device to be tested so as to be electrically grounded while fixing the upper end of the SSD.

The fixed support device may include an insert fixing bracket for inserting and fixing a plurality of card brackets at predetermined intervals so that the card bracket type SSD can be inserted into the test board;

The insert fixing bracket is integrally provided with an insert guide bar for guiding the insertion path of the card bracket inserted into the test board and is integrally formed with the insert bracket to be inserted into the engaging groove of the inserted card bracket, A position fixing pin may be provided.

Wherein the test board is provided with a tilted connector through which an SSD card can be inserted in an inclined state with respect to the test board;

The fixed support device may include an inclined guide socket for supporting the SSD card in an inclined state with respect to the test board while enclosing the inclined connector to support an engaged state of the SSD card inserted into the inclined connector.

The present invention enables uniform cooling and temperature control to be performed while testing a large amount of AEDs collectively, thereby stably maintaining a state in which the temperature deviation of the AEDs is minimized, The auxiliary storage devices are prevented from being vibrated or deformed by an external force such as cooling wind during the test, thereby improving the test reliability and stability of the auxiliary storage devices.

1 is a block diagram of an auxiliary memory test chamber according to the present invention;
FIG. 2 is a view for explaining a situation in which the air supplied from the duct tail of FIG. 1 is ejected from an air purge plate,
FIG. 3 illustrates a first embodiment of a stationary support apparatus provided on a test board inserted between air purge plates of FIG. 2;
FIG. 4 is a view illustrating a second embodiment of a fixed support device provided on a test board inserted between the air purge plates of FIG. 2;
Fig. 5 is a detailed view of the main part of Fig. 4,
6 is a view illustrating a third embodiment of a fixed support device provided on a test board inserted between the air purge plates of FIG. 2;
FIG. 7 is a detailed view of the main part of FIG. 6,
FIG. 8 is a view illustrating a fourth embodiment of a fixed support device provided on a test board inserted between the air purge plates of FIG. 2;
FIG. 9 is a view illustrating a fifth embodiment of a fixed support device provided on a test board inserted between the air purge plates of FIG. 2. FIG.

Referring to FIG. 1, an auxiliary memory test chamber of the present invention includes a housing 1 forming an outer periphery of a test chamber; A blower fan (3) mounted inside the housing (1); A blowing duct 5 for blowing air blown from the blower fan 3 to the blower fan 3 while being separated from the inside of the housing 1; A duct tail (7) extending in the vertical direction of the housing (1) while sealing an end of the blowing duct (5) opposite to the blower fan (3); A plurality of ducts arranged in the vertical direction between the blower fan 3 and the duct tail 7 and installed to receive air individually from the duct tail 7, A plurality of air purge plates 9 formed to evenly distribute throughout; A plurality of purge holes 11 formed in each of the air purge plates 9 so as to cool air to be tested from the surface of the air purge plate 9 to cool the MTAs; An evaporator (not shown) provided between the layered air purge plates 9 and the blower fan 3 to cool the air blown from the air purge plate 9 while passing through the housing 1 13); And a heater (15) provided on the space through which the air having passed through the evaporator (13) flows to the blower fan (3) to heat the air.

That is, the air flow formed by the blower fan 3 in the housing 1 is supplied to the plurality of air purge plates 9 through the blowing duct 5 and the duct tail 7, In the air purge plate 9, the air is uniformly distributed evenly to the auxiliary memories inserted between the layered structures so as to secure and maintain a uniform and stable cooling state of the auxiliary memories M to be tested, The air used for cooling is cooled again after passing through the evaporator 13 and can be circulated to the blower fan 3. The temperature of the circulated air can be heated by the heater 15, So that the temperature of the appropriate air can be actively controlled to be used for cooling the auxiliary storage devices M being tested.

Of course, a test apparatus (not shown) is connected to the auxiliary storage apparatus test chamber of the present invention, which is inserted into the test chamber and is electrically connected to the tested auxiliary storage apparatuses to perform a substantial test of the auxiliary storage apparatus M .

The blower fan 3 is installed inside the housing 1 as shown in FIG. 1 and the blower motor 3-1 for providing a rotational force to the blower fan 3 is disposed outside the housing 1 So that the heat generated in the blower motor 3-1 does not affect the temperature control inside the housing, so that the temperature in the test chamber can be more easily adjusted and the capacity of the evaporator can be reduced Respectively.

The blowing duct 5 extends from the blower fan 3 to the space above the evaporator 13 and the air purge plates 9 and then extends downward to form the duct tail 7, The width of the tail 7 in the direction facing the air purge plates 9 arranged in the layer is constant along the vertical direction and the width in the direction perpendicular thereto is gradually narrowed as the duct tail 7 extends downward .

2, the duct tail 7 is gradually expanded in width as it extends downward, so that the air that is transmitted from the blower fan 3 through the blowing duct 5 is relatively positioned on the lower side So that the air purge plate 9 can be supplied with a sufficient pressure so that the air can be supplied to all the air purge plates 9 arranged at the upper and lower positions with the same level of pressure will be.

Therefore, the air blown from the blower fan 3 flows on the upper side of the test chamber and is guided to the air purge plates 9 through one side of the air purge plates 9 in the duct tail 7 And then ejected through the purge hole 11 of the air purge plate 9, thereby directly and evenly cooling the auxiliary storage devices M to be tested.

The air purge plate 9 is most simply opened so that one side of the air purge plate 9 connected to the duct tail 7 is communicated with the duct tail 7 and all of the remaining sides of the air purge plate 9 have a closed flat hollow box shape An air guide or the like for guiding the air flow inside the air purge plate 9 so that the air can be evenly supplied to the purge holes 11 provided in the air purge plate 9, It may be provided inside.

A test board 17 in which auxiliary memory devices to be tested are disposed is inserted between the air purge plates 9 arranged in the layered manner and the purge hole 11 of the air purge plate 9 is inserted into the test board A plurality of matrices are formed in such a manner that air can be ejected individually and directly toward the auxiliary storage devices M mounted on the main body 17.

In addition, the test board 17 is provided with a fixed supporting device for fixing and supporting the attached auxiliary memory devices M.

That is, referring to FIG. 2, the purge holes 11 of the air purge plate are arranged at regular intervals while forming a plurality of rows and columns on the lower surface of the air purge plate 9, Air can be uniformly sprayed directly to a plurality of auxiliary storage devices arranged on the board 17 and the auxiliary storage devices M are maintained in a stable supported state by the fixed support device.

Referring to FIG. 3, the first embodiment of the fixed support device includes a plurality of auxiliary storage devices M connected to the test board 17 in an electrically connected state And a tray 110 that can be seated on the upper surface of the test board 17 in a state in which a relationship can be established.

The tray 110 is formed such that a plurality of auxiliary memory devices M are spaced apart from each other at a predetermined interval to fix the lower parts of the test devices by inserting heat, Even if the air ejected from the purge hole 11 of the air purge plate 9 collides with the auxiliary storage devices M while the test is performed on the auxiliary storage devices M, By allowing the test to be completed while keeping the stable state continuously without oscillating or leaving the auxiliary memory devices M, the test of the auxiliary memory device M can be performed more stably and the reliability of the test can be improved .

When the test board 17 is inserted into the test board 17 under the air purge plate 9 for blowing air into the attached auxiliary memory devices M, And a detachable lever 19 to be used is mounted.

FIGS. 4 and 5 illustrate a second embodiment of the fixed support device. In FIG. 4 and FIG. 5, a plurality of guide posts 120 (not shown) )Wow; A horizontally elongated support bar 122 provided between the pair of guide posts 120 so as to be guided and fixed in the vertical direction by the guide posts 120; And a plurality of individual fixing means provided in the support bar 122 to fix and support the upper ends of the auxiliary memory devices to be tested, respectively.

That is, the guide posts 120 are mounted in a pillar shape perpendicular to the test board 17 in a pair, and the horizontal support bars 120, which are guided by the pair of the guide posts 120, And the upper end of the plurality of auxiliary storage devices M fitted in the vertical direction with the test board 17 being heated is fixed and supported by the individual fixing means of the support bar 122 will be.

Both ends of the support bar 122 are mounted on the guide post 120 so as to be slidable in the vertical direction. The guide post 120 is provided with a position fixing bolt 124 as shown in FIG. 4, So that the support bar 122 can be moved and fixed in the vertical direction with respect to the guide post 120.

The vertical position of the support bar 122 can be changed as described above so that it is possible to stably support the auxiliary memory devices of various sizes in a state of being supported by the test board 17, There is an advantage that auxiliary memory devices of various sizes can be arranged and supported.

That is, for example, as shown in FIG. 4, the auxiliary memory devices supported by the two left support bars are relatively short in length, and the auxiliary memory devices supported by the two right support bars are relatively long.

For reference, the auxiliary memory devices illustrated in FIG. 4 are NGFF (Next Generation Form Factor) type SSD (Solid State Drive), also called M.2 type.

The individual fixing means is composed of a ground contact ring 126 inserted into the upper ground fixing groove of the NGFF type SSD as an auxiliary memory device to be tested and provided so as to be electrically grounded while fixing the upper end of the SSD.

That is, the ground contact ring 126 is formed of a ring of a circular drum shape as illustrated in FIG. 5 and inserted into the upper ground fixing groove of the NGFF type SSD serving as the auxiliary memory device M, so that the position of the NGFF type SSD And an electric ground connection can be established.

For example, the ground contact ring 126 has a drum groove in which a top ground fixing groove of the SSD is fitted in a center of a round drum. When the ground fixing groove is fitted in the drum groove, an electric ground connection It can be configured to be done all at once.

5, a plate-shaped alignment guide plate 128 protruding downward from the support bar 122 is integrally provided so as to guide a plurality of auxiliary memory devices M to be tested in a row, The test board 17 is capable of displaying the state of each auxiliary storage device by a lighting means such as an LED or the like so that the state of the tested auxiliary storage device can be confirmed and a protection of the transparent material covering and protecting the upper side of the lighting means A cover 129 is provided on the test board 17.

6 and 7 illustrate a third embodiment of the fixed support apparatus provided on the test board 17, wherein the fixed support apparatus is arranged in pairs on the test board 17 so as to face each other, A plurality of guide posts (130) formed to guide movement; A horizontally elongated support bar 132 provided between the pair of guide posts 130 so as to be guided and fixed in the vertical direction by the guide posts 130; A rotation fixing bar 134 rotatably mounted on the support bar 132 with a rotation axis parallel to the support bar 132; And a plurality of individual fixing means provided on the rotation fixing bar 134 to fix and support upper ends of auxiliary memory devices to be tested, respectively.

That is, the present embodiment is further provided with a rotation fixing bar 134 installed on the support bar 132 in comparison with the second embodiment, and the individual fixing means is provided on the rotation fixing bar 134 different.

Therefore, in the case of the second embodiment, the auxiliary storage devices M to be tested are mounted in rows and then the support bars 122 are moved from the upper side to the lower side to fix the auxiliary storage devices M The position fixing bolts 124 are always loosened before and after the test of the auxiliary memory device M and the support bar 122 is unfastened and the fixing bolts 124 are fixed to the support bar 122. Therefore, However, in the case of the third embodiment, the position of the support bar 132 is fixed in a fixed manner as long as the specifications of the test target auxiliary memory M are not changed. The auxiliary storage device M can be locked and unlocked by merely rotating the auxiliary storage device 134 so that the usability is relatively improved.

It is needless to say that the weight of the pivoting fixing bar 134 may be sufficiently increased or the pivoting of the pivoting fixing bar 134 may be increased so that the auxiliary storage devices M to be tested can be adequately fixedly supported only by the rotation of the pivoting fixing bar 134. [ A rotating state fixing means such as a method of increasing the frictional force of the rotating portion of the rotation fixing bar 134 or a separate rotation position fixing knob for fixing the rotation state of the rotation fixing bar 134 to the support bar 132 is added .

8 shows a fourth embodiment of the fixed support apparatus provided on the test board 17. The fixed support apparatus includes a card bracket type SSD as an auxiliary memory M to be tested on the test board 17, And a plurality of card brackets MB are inserted and fixed at predetermined intervals so that the plurality of card brackets MB can be inserted into the test fixture brackets 140. The test fixture brackets 140 are provided on the test fixture brackets 140, An insert guide bar 142 for guiding the insertion path of the card bracket MB inserted into the card bracket MB is inserted into the coupling groove of the inserted card bracket MB to move the card bracket MB And a position fixing pin 144 integrally provided so as to be able to restrain it.

Therefore, when the card bracket type SSD is inserted into the test board 17, the card bracket MB is inserted while being guided by the insert guide bar 142 of the insert fixing bracket 140, When the position fixing pin 144 is inserted into the coupling groove formed in the test board 17, the card bracket type SSD is moved in the direction opposite to the direction in which the card 17 is inserted, The motions in all directions are restrained by the insert fixing bracket 140 and the stable test is ensured without being vibrated or displaced by the air provided from the purge hole 11. [

Referring to FIG. 8, the test board 17 is capable of displaying the status of each auxiliary memory device by a lighting means such as an LED or the like so that the state of the tested auxiliary memory device can be confirmed. And a number plate 148 is provided on the test board 17 so as to be able to distinguish each of the auxiliary storage devices mounted on the test board 17 by serial numbers And a portion of the test board 17 shown in FIG. 8 as a front view is a connecting portion 17-1 connected to the test apparatus.

FIG. 9 shows a fifth embodiment of the fixed supporting device provided on the test board 17. In the test board 17, an auxiliary memory M is formed at an acute angle with respect to the test board, And a slant connector 17-2 into which the SSD card can be inserted, and the fixed support device is connected to the slant connector 17-2 so as to support the engaged state of the SSD card inserted into the slant connector 17-2. And an inclined guide socket 150 for supporting the SSD card in an inclined state with respect to the test board 17 while surrounding the SSD card.

That is, in the present embodiment, the test can be performed in a state where the SSD card, which is the auxiliary storage device M to be tested, is tilted with respect to the test board. For example, Is insufficient as compared with the length of the SSD card to be tested, the SSD card can be mounted on the test board 17 in an inclined manner to enable the test.

In this case, the inclined guide socket 150 is the fixed supporting device, which supports the lower side of the SSD card mounted on the test board 17 through the inclined connector 17-2 to support the air purge plate 9, the SSD card can be stably and continuously maintained in a state in which the SSD card is mounted on the test board 17 against vibration transmitted from the air ejected from the purge hole 11 and other external sources, So that a reliable test can be performed.

One; housing
3; Blower fan
5; Blowing duct
7; Duct tail
9; Air purge plate
11; Purge hall
13; evaporator
15; heater
17; Test board
M; Auxiliary memory
110; tray
120, 130; Guide post
122, 132; Support bar
134; Pivoting fixed bar
140; Insert fixing bracket
150; Inclined guide socket

Claims (9)

A housing defining an outer periphery of the test chamber; A blower fan installed inside one side of the housing; A blowing duct installed to blow the air discharged from the blower fan to the opposite side of the blower fan while being separated from the inside of the housing; A duct tail extending in the vertical direction of the housing while sealing an end of the blowing duct opposite to the blower fan; A plurality of air blowers arranged to be vertically spaced apart from each other between the blower fan and the duct tail and installed to receive air individually from the duct tail and configured to uniformly distribute the supplied air to the entire surface of the layer, A purge plate; A plurality of purge holes formed in each air purge plate to eject air from the layered surface of the air purge plate to cool the AASs; An evaporator disposed between the air purge plates arranged in the layer and the blower fan to cool the air blown from the air purge plate while passing through the housing; A heater disposed in a space where the air passing through the evaporator flows to the blower fan to heat the air; Test boards inserted between the layered air purge plates and in which auxiliary memory devices to be tested are disposed; And a fixed support device mounted on the test boards to fix and support the auxiliary memory devices on the test boards,
The fixed support device includes:
A plurality of guide posts arranged opposite to each other on the test board so as to guide upward and downward linear movement;
A support bar having a horizontally elongated shape so as to be guided and fixed in a vertical direction by the guide posts between the pair of guide posts;
And a plurality of individual fixing means provided on the support bar for fixing and supporting the upper ends of the auxiliary memory devices to be tested, respectively
Wherein the test chamber is a test chamber.
A housing defining an outer periphery of the test chamber; A blower fan installed inside one side of the housing; A blowing duct installed to blow the air discharged from the blower fan to the opposite side of the blower fan while being separated from the inside of the housing; A duct tail extending in the vertical direction of the housing while sealing an end of the blowing duct opposite to the blower fan; A plurality of air blowers arranged to be vertically spaced apart from each other between the blower fan and the duct tail and installed to receive air individually from the duct tail and configured to uniformly distribute the supplied air to the entire surface of the layer, A purge plate; A plurality of purge holes formed in each air purge plate to eject air from the layered surface of the air purge plate to cool the AASs; An evaporator disposed between the air purge plates arranged in the layer and the blower fan to cool the air blown from the air purge plate while passing through the housing; A heater disposed in a space where the air passing through the evaporator flows to the blower fan to heat the air; Test boards inserted between the layered air purge plates and in which auxiliary memory devices to be tested are disposed; And a fixed support device mounted on the test boards to fix and support the auxiliary memory devices on the test boards,
The fixed support device
A plurality of guide posts arranged opposite to each other on the test board so as to guide upward and downward linear movement;
A support bar having a horizontally elongated shape so as to be guided and fixed in a vertical direction by the guide posts between the pair of guide posts;
A rotation fixing bar provided rotatably with respect to the support bar with a rotation axis parallel to the support bar;
And a plurality of individual fixing means provided on the pivotal fixing bar to fix and support the upper ends of the auxiliary memory devices to be tested, respectively
Wherein the test chamber is a test chamber.
The method according to claim 1 or 2,
The individual fixing means is composed of a ground contact ring inserted in an upper ground fixing groove of an NGFF type SSD which is an auxiliary memory device to be tested and provided so as to be electrically grounded while fixing the upper end of the SSD
Wherein the test chamber is a test chamber.
The method according to claim 1 or 2,
Wherein the blowing duct extends from the blower fan to a space above the evaporator and the air purge plates and then extends downward to form the duct tail;
The width of the duct tail in the direction in which the air purge plates are arranged facing the air purge plates is constant along the vertical direction and the width in the direction perpendicular thereto is gradually narrowed as the duct tail extends downward
Wherein the test chamber is a test chamber.
The method according to claim 1 or 2,
The purge holes of the air purge plate are formed by arranging a plurality of matrices so that air can be directly blown toward the auxiliary memory devices mounted on the test board
Wherein the test chamber is a test chamber.
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