KR101724511B1 - Structure diagnosis system and method of operating structure diagnosis system - Google Patents

Structure diagnosis system and method of operating structure diagnosis system Download PDF

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KR101724511B1
KR101724511B1 KR1020150112894A KR20150112894A KR101724511B1 KR 101724511 B1 KR101724511 B1 KR 101724511B1 KR 1020150112894 A KR1020150112894 A KR 1020150112894A KR 20150112894 A KR20150112894 A KR 20150112894A KR 101724511 B1 KR101724511 B1 KR 101724511B1
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magnetic field
voltage signal
eddy current
target structure
sensor
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KR1020150112894A
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KR20170019046A (en
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손훈
김지민
이준
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한국과학기술원
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L5/00Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
    • G01L5/04Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring tension in flexible members, e.g. ropes, cables, wires, threads, belts or bands
    • G01L5/10Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring tension in flexible members, e.g. ropes, cables, wires, threads, belts or bands using electrical means
    • G01L5/102Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring tension in flexible members, e.g. ropes, cables, wires, threads, belts or bands using electrical means using sensors located at a non-interrupted part of the flexible member
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/12Measuring force or stress, in general by measuring variations in the magnetic properties of materials resulting from the application of stress
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/12Measuring force or stress, in general by measuring variations in the magnetic properties of materials resulting from the application of stress
    • G01L1/127Measuring force or stress, in general by measuring variations in the magnetic properties of materials resulting from the application of stress by using inductive means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
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  • Chemical Kinetics & Catalysis (AREA)
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  • General Health & Medical Sciences (AREA)
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  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

The structure diagnosis system includes a waveform generator, a sensor, a target structure, and a digitizer. The waveform generator provides an excitation signal having a predetermined frequency based on the transmission control signal. The sensor provides a first magnetic field based on the excitation signal. The target structure generates an eddy current in accordance with the first magnetic field and provides a second magnetic field to the sensor that is generated based on the eddy current. The digitizer digitizes the voltage signal corresponding to the second magnetic field to provide a digital voltage signal. The structure diagnosis system according to embodiments of the present invention can improve the performance by generating an eddy current in the target structure according to the first magnetic field generated from the sensor and providing a second magnetic field generated based on the eddy current to the sensor.

Figure R1020150112894

Description

TECHNICAL FIELD [0001] The present invention relates to a structural diagnosis system and a method of operating a structure diagnosis system,

The present invention relates to structure diagnosis, and more particularly, to a structure diagnosis system and a method of operating a structure diagnosis system.

Techniques for diagnosing structures in relation to the safety of structures are continuously being developed. As one of the techniques for diagnosing the structure, a method of monitoring the tensile force of the structure may be used. If the tensions of the structure are reduced, there may be a problem in the safety of the structure. Various studies are being conducted to accurately measure the tension of a structure.

SUMMARY OF THE INVENTION It is an object of the present invention to solve the above problems and to provide a sensor capable of improving the performance by generating an eddy current in a target structure according to a first magnetic field generated from a sensor and providing a second magnetic field, And to provide a structure diagnosis system having such a structure.

SUMMARY OF THE INVENTION It is an object of the present invention to solve the above problems and to provide a sensor capable of improving the performance by generating an eddy current in a target structure according to a first magnetic field generated from a sensor and providing a second magnetic field, And to provide a method of operating the structure diagnosis system.

In order to accomplish one object of the present invention, a structure diagnosis system according to embodiments of the present invention includes a waveform generator, a sensor, a target structure, and a digitizer. The waveform generator provides an excitation signal having a predetermined frequency based on a transmission control signal. The sensor provides a first magnetic field based on the excitation signal. The target structure generates an eddy current according to the first magnetic field and provides a second magnetic field to the sensor, which is generated based on the eddy current. The digitizer digitizes a voltage signal corresponding to the second magnetic field to provide a digital voltage signal.

In an exemplary embodiment, the sensor includes a first coil and a second coil. The first coil may provide the first magnetic field to the target structure based on the excitation signal. The second coil may provide the voltage signal based on the second magnetic field generated from the target structure.

In an exemplary embodiment, the magnitude of the voltage signal increases as the magnitude of the eddy current increases, and the magnitude of the voltage signal decreases as the magnitude of the eddy current decreases.

In an exemplary embodiment, the target structure may include a tendon and a wedge. The tensen can provide a varying stress based on the tension. The wedge may generate the eddy current and the second magnetic field based on electrical conductivity that varies with the stress.

In an exemplary embodiment, the electrical conductivity may increase as the stress decreases.

In an exemplary embodiment, when the electrical conductivity increases as the stress decreases, the intensity of the eddy current may increase.

In an exemplary embodiment, the intensity of the second magnetic field may increase as the magnitude of the eddy current increases.

In an exemplary embodiment, the structure diagnosis system compares a first digital voltage signal obtained during a first time interval of the digital voltage signal and a second digital voltage signal obtained during a second time interval of the digital voltage signal The damage index of the target structure can be determined.

In an exemplary embodiment, the structure diagnosis system may determine the damage index of the target structure based on the variance value of the first digital voltage signal and the variance value of the second digital voltage signal.

In an exemplary embodiment, the damage index of the target structure may increase as the difference between the dispersion value of the first digital voltage signal and the dispersion value of the second digital voltage signal increases.

In order to accomplish one aspect of the present invention, a structure diagnosis system according to embodiments of the present invention includes a controller, a waveform generator, a sensor, a target structure, and a digitizer. The controller provides a transmission control signal and a reception control signal. The waveform generator provides an excitation signal having a predetermined frequency based on the transmission control signal. The sensor provides a first magnetic field based on the excitation signal. The target structure generates an eddy current according to the first magnetic field and provides a second magnetic field to the sensor, which is generated based on the eddy current. The digitizer digitizes a voltage signal corresponding to the second magnetic field based on the receive control signal to provide a digital voltage signal to the controller.

In an exemplary embodiment, the number of the predetermined frequencies may be plural.

According to another aspect of the present invention, there is provided a method of operating a structure diagnostic system, the method comprising: providing a waveform generator with an excitation signal having a predetermined frequency based on a transmission control signal; Providing a first magnetic field based on the excitation signal, the target structure generating an eddy current according to the first magnetic field, providing a second magnetic field to the sensor, the second magnetic field being generated based on the eddy current, And digitizing the voltage signal corresponding to the second magnetic field to provide a digital voltage signal.

The structure diagnosis system according to embodiments of the present invention can improve the performance by generating an eddy current in the target structure according to the first magnetic field generated from the sensor and providing a second magnetic field generated based on the eddy current to the sensor.

1 is a block diagram illustrating a structure diagnostic system in accordance with embodiments of the present invention.
FIG. 2 is a view for explaining the operation of the sensor included in the structure diagnosis system of FIG. 1. FIG.
FIG. 3 is a view for explaining a target structure included in the structure diagnosis system of FIG. 1. FIG.
FIG. 4 is a view for explaining a tensile force and a stress acting on the tendon included in the target structure of FIG. 3; FIG.
5 and 6 are views for explaining the damage index of the structure diagnosis system of FIG.
7 is a block diagram illustrating a structure diagnostic system in accordance with an embodiment of the present invention.
8 is a flowchart illustrating an operation method of a structure diagnosis system according to embodiments of the present invention.

For the embodiments of the invention disclosed herein, specific structural and functional descriptions are set forth for the purpose of describing an embodiment of the invention only, and it is to be understood that the embodiments of the invention may be practiced in various forms, The present invention should not be construed as limited to the embodiments described in Figs.

The present invention is capable of various modifications and various forms, and specific embodiments are illustrated in the drawings and described in detail in the text. It is to be understood, however, that the invention is not intended to be limited to the particular forms disclosed, but on the contrary, is intended to cover all modifications, equivalents, and alternatives falling within the spirit and scope of the invention.

The terms first, second, etc. may be used to describe various components, but the components should not be limited by the terms. The terms may be used for the purpose of distinguishing one component from another. For example, without departing from the scope of the present invention, the first component may be referred to as a second component, and similarly, the second component may also be referred to as a first component.

It is to be understood that when an element is referred to as being "connected" or "connected" to another element, it may be directly connected or connected to the other element, . On the other hand, when an element is referred to as being "directly connected" or "directly connected" to another element, it should be understood that there are no other elements in between. Other expressions that describe the relationship between components, such as "between" and "between" or "neighboring to" and "directly adjacent to" should be interpreted as well.

The terminology used in this application is used only to describe a specific embodiment and is not intended to limit the invention. The singular expressions include plural expressions unless the context clearly dictates otherwise. In the present application, the terms "comprise", "having", and the like are intended to specify the presence of stated features, integers, steps, operations, elements, components, or combinations thereof, , Steps, operations, components, parts, or combinations thereof, as a matter of principle.

Unless otherwise defined, all terms used herein, including technical or scientific terms, have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. Terms such as those defined in commonly used dictionaries should be construed as meaning consistent with meaning in the context of the relevant art and are not to be construed as ideal or overly formal in meaning unless expressly defined in the present application .

Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. The same reference numerals are used for the same constituent elements in the drawings and redundant explanations for the same constituent elements are omitted.

1 is a block diagram illustrating a structure diagnostic system in accordance with embodiments of the present invention.

Referring to FIG. 1, a structure diagnostic system 10 includes a waveform generator 100, a sensor 200, a target structure 300, and a digitizer 400. The waveform generator 100 provides an excitation signal ES having a predetermined frequency based on the transmission control signal TCS. For example, the frequency of the excitation signal ES can be determined according to the transmission control signal TCS. The frequency range of the excitation signal ES can be from 10 Hz to 250 kHz. The excitation signal ES may be an alternating current signal.

The sensor 200 provides the first magnetic field B1 based on the excitation signal ES. The excitation signal ES may be transmitted to the first coil 220 included in the sensor 200, as described later with reference to FIG. The first magnetic field B1 may be generated around the sensor 200 when the excitation signal ES is transmitted to the first coil 220 included in the sensor 200. [ The first magnetic field B1 may be formed along the first direction D1.

The target structure 300 generates an eddy current EC in accordance with the first magnetic field B1 and provides the sensor 200 with a second magnetic field B2 generated based on the eddy current EC. For example, the magnetic field may change in the target structure 300 by the first magnetic field B1 generated from the sensor 200. [ When the magnetic field is changed in the target structure 300 by the first magnetic field B1, eddy currents EC in the form of swirls may occur in the target structure 300. [ The eddy currents EC can be generated along the second direction D2. When a spiral eddy current EC is generated in the target structure 300, a second magnetic field B2 may be generated in the target structure 300 by the eddy current EC. The second magnetic field B2 generated in the target structure 300 may be transmitted to the second coil 240 included in the sensor 200. [ When the second magnetic field B2 is transmitted to the second coil 240 included in the sensor 200, a voltage signal VS corresponding to the second magnetic field B2 may be generated in the second coil 240 have. The second magnetic field B2 may be formed along the first direction D1.

The digitizer 400 digitizes the voltage signal VS corresponding to the second magnetic field B2 to provide a digital voltage signal DVS. For example, the voltage signal VS corresponding to the second magnetic field B2 may be an analog signal. The digitizer 400 may be used to convert the voltage signal VS corresponding to the analog signal into a digital signal. The digitizer 400 may convert the voltage signal VS into a digital signal to provide a digital voltage signal DVS.

The structure diagnosis system 10 according to embodiments of the present invention generates an eddy current EC in the target structure 300 according to the first magnetic field B1 generated from the sensor 200 and generates an eddy current based on the eddy current EC And the second magnetic field B2 generated by the second magnetic field is provided to the sensor 200, thereby improving the performance.

FIG. 2 is a view for explaining the operation of the sensor included in the structure diagnosis system of FIG. 1. FIG.

1 and 2, a structure diagnostic system 10 includes a waveform generator 100, a sensor 200, a target structure 300, and a digitizer 400. The sensor 200 includes a first coil 220 and a second coil 240. The first coil 220 may provide the first magnetic field B1 to the target structure 300 based on the excitation signal ES. The excitation signal ES may be provided from the waveform generator 100 based on the transmission control signal TCS. For example, the magnitude of the excitation signal ES and the frequency of the excitation signal ES may be varied according to the transmission control signal TCS. The excitation signal ES may be transmitted to the first coil 220 included in the sensor 200. The first magnetic field B1 may be generated around the sensor 200 when the excitation signal ES is transmitted to the first coil 220 included in the sensor 200. [ An eddy current EC can be generated in the target structure 300 disposed adjacent to the sensor 200 when a first magnetic field B1 is generated around the sensor 200. [ A second magnetic field B2 may be generated in the target structure 300 based on the eddy currents EC when the eddy currents EC are generated in the target structure 300 disposed adjacent to the sensor 200. [ The second magnetic field B2 generated in the target structure 300 is applied to the second coil B2 included in the sensor 200 when the second magnetic field B2 is generated based on the eddy current EC in the target structure 300. [ 240). In this case, the second coil 240 may provide a voltage signal VS based on the second magnetic field B2 generated from the target structure 300. [

The magnitude of the voltage signal VS can be determined based on the intensity of the eddy current EC. For example, as the magnitude of the eddy current EC increases, the magnitude of the voltage signal VS increases, and as the magnitude of the eddy current EC decreases, the magnitude of the voltage signal VS may decrease.

FIG. 3 is a view for explaining a target structure included in the structure diagnosis system of FIG. 1, and FIG. 4 is a view for explaining a tensile force and a stress acting on a tendon included in the target structure of FIG.

Referring to FIGS. 1, 3 and 4, a structure diagnostic system 10 includes a waveform generator 100, a sensor 200, a target structure 300, and a digitizer 400. The waveform generator 100 provides an excitation signal ES having a predetermined frequency based on the transmission control signal TCS. The sensor 200 provides the first magnetic field B1 based on the excitation signal ES. The target structure 300 generates an eddy current EC in accordance with the first magnetic field B1 and provides the sensor 200 with a second magnetic field B2 generated based on the eddy current EC. The digitizer 400 digitizes the voltage signal VS corresponding to the second magnetic field B2 to provide a digital voltage signal DVS. The target structure 300 may include a tendon 310 and a wedge 330. The anchor head 370 may be disposed to surround the wedge 330. The connector 210 may be used to provide an excitation signal ES to the sensor 200 and to receive the voltage signal VS from the sensor 200. [

The tendon 310 can provide a varying stress (SF) based on a tension force (TF). For example, the tensile force TF of the tendon 310 may be formed along the first direction D1, and the stress SF of the tendon 310 may be formed along the second direction D2. As time passes, the tensile force (TF) of the tendon 310 may decrease. If the tensile force (TF) of the tendon 310 decreases over time, there may be a problem with the safety of the target structure 300. If the tensile force TF of the tendon 310 decreases with the lapse of time, the stress SF of the tendon 310 may also decrease.

The wedge 330 can generate the eddy current EC and the second magnetic field B2 based on the electrical conductivity that varies with the stress SF. For example, the wedge 330 may surround the periphery of the tendon 310 as in FIG. The wedge 330 may be made of a ferromagnetic material. Depending on the stress SF, the electrical conductivity of the wedge 330 may vary. As the stress SF decreases, the electrical conductivity may increase and the electrical conductivity may decrease as the stress SF increases.

In an exemplary embodiment, the strength of the eddy current EC may vary based on the electrical conductivity of the wedge 330. For example, if the electrical conductivity increases as the stress SF decreases, the intensity of the eddy currents EC may increase. Further, when the electrical conductivity decreases as the stress SF increases, the intensity of the eddy currents EC can be reduced.

In an exemplary embodiment, the intensity of the second magnetic field B2 may vary based on the intensity of the eddy current EC. For example, as the intensity of the eddy current EC increases, the intensity of the second magnetic field B2 may increase, and as the intensity of the eddy current EC decreases, the intensity of the second magnetic field B2 may decrease have.

5 and 6 are views for explaining the damage index of the structure diagnosis system of FIG.

1, 5 and 6, a structure diagnostic system 10 includes a waveform generator 100, a sensor 200, a target structure 300, and a digitizer 400. The waveform generator 100 provides an excitation signal ES having a predetermined frequency based on the transmission control signal TCS. The sensor 200 provides the first magnetic field B1 based on the excitation signal ES. The target structure 300 generates an eddy current EC in accordance with the first magnetic field B1 and provides the sensor 200 with a second magnetic field B2 generated based on the eddy current EC. The digitizer 400 digitizes the voltage signal VS corresponding to the second magnetic field B2 to provide a digital voltage signal DVS.

In an exemplary embodiment, the structure diagnostic system 10 includes a first digital voltage signal DVS1 and a second digital voltage signal DVS obtained during a first time interval TI1 of the digital voltage signal DVS, The second digital voltage signal DVS2 obtained during the period TI2 may be compared to determine the damage index DI of the target structure 300. [ For example, the first time interval TI1 may be from the first time T1 to the second time T2. In addition, the second time interval TI2 may be from the third time T3 to the fourth time T4. During the first time interval TI1, the digitizer 400 may provide the first digital voltage signal DVS1. Also, during the second time interval TI2, the digitizer 400 may provide the second digital voltage signal DVS2.

As time passes, the tensile force (TF) of the tendon 310 may decrease. If the tensile force (TF) of the tendon 310 decreases over time, there may be a problem with the safety of the target structure 300. The first digital voltage signal DVS1 obtained during the first time period TI1 and the second digital voltage signal DVS2 obtained during the second time period TI2 are compared to diagnose the safety of the target structure 300 . The structure diagnosis system 10 may compare the first digital voltage signal DVS1 and the second digital voltage signal DVS2 to determine the damage index DI of the target structure 300. [ The safety of the target structure 300 can be diagnosed based on the damage index DI of the target structure 300. [ If the damage index DI of the target structure 300 increases, there may be a problem with the safety of the target structure 300.

In an exemplary embodiment, the structure diagnostic system 10 calculates the damage index (DI) of the target structure 300 based on the variance value of the first digital voltage signal DVS1 and the variance value of the second digital voltage signal DVS2 Can be determined. For example, as the difference between the dispersion value of the first digital voltage signal DVS1 and the dispersion value of the second digital voltage signal DVS2 increases, the damage index DI of the target structure 300 may increase.

For example, as the tensile force TF of the tendon 310 decreases, the damage index DI of the target structure 300 may increase. When the tensile force TF of the tendon 310 is 150 kN in the second time interval TI2, the difference between the dispersion value of the first digital voltage signal DVS1 and the dispersion value of the second digital voltage signal DVS2 The damage index (DI) of the target structure 300 may be 0.005. In the case where the tensile force TF of the tendon 310 is 90 kN in the second time period TI2, the difference between the dispersion value of the first digital voltage signal DVS1 and the dispersion value of the second digital voltage signal DVS2 The damage index (DI) of the target structure 300 may be 0.013. When the tensional force TF of the tendon 310 is 30 kN in the second time period TI2, the difference between the dispersion value of the first digital voltage signal DVS1 and the dispersion value of the second digital voltage signal DVS2 The damage index (DI) of the target structure 300 may be 0.017.

7 is a block diagram illustrating a structure diagnostic system in accordance with an embodiment of the present invention.

7, the structure diagnosis system 10a includes a controller 500, a waveform generator 100, a sensor 200, a target structure 300, and a digitizer 400. [ The controller 500 provides a transmission control signal TCS and a reception control signal RCS. The waveform generator 100 provides an excitation signal ES having a predetermined frequency based on the transmission control signal TCS. The sensor 200 provides the first magnetic field B1 based on the excitation signal ES. The target structure 300 generates an eddy current EC in accordance with the first magnetic field B1 and provides the sensor 200 with a second magnetic field B2 generated based on the eddy current EC. The digitizer 400 digitizes the voltage signal VS corresponding to the second magnetic field B2 based on the reception control signal RCS and provides the digital voltage signal DVS to the controller 500. [ For example, the transmission control signal TCS and the reception control signal RCS may be used for synchronization between the waveform generator 100 and the digitizer 400 included in the structure diagnosis system 10. [

In an exemplary embodiment, the number of predetermined frequencies may be plural. For example, the frequency of the excitation signal ES can be determined according to the transmission control signal TCS. The frequency range of the excitation signal ES can be from 10 Hz to 250 kHz. When a plurality of frequencies are used, the structure diagnosis system 10a can acquire a more diversified digital voltage signal DVS. When the structure diagnosis system 10a acquires a more diversified digital voltage signal DVS, it is possible to diagnose the safety of the target structure 300 more accurately.

8 is a flowchart illustrating an operation method of a structure diagnosis system according to embodiments of the present invention.

1, 2 and 8, in the method of operation of the structure diagnosis system 10, the waveform generator 100 provides an excitation signal ES having a predetermined frequency based on the transmission control signal TCS S100). For example, the frequency of the excitation signal ES can be determined according to the transmission control signal TCS. The frequency range of the excitation signal ES can be from 10 Hz to 250 kHz. The excitation signal ES may be an alternating current signal.

The sensor 200 provides the first magnetic field B1 based on the excitation signal ES (S110). The excitation signal ES may be transmitted to the first coil 220 included in the sensor 200. The first magnetic field B1 may be generated around the sensor 200 when the excitation signal ES is transmitted to the first coil 220 included in the sensor 200. [ The first magnetic field B1 may be formed along the first direction D1.

The target structure 300 generates the eddy current EC in accordance with the first magnetic field B1 and provides the sensor 200 with the second magnetic field B2 generated based on the eddy current EC at step S120. For example, the magnetic field may change in the target structure 300 by the first magnetic field B1 generated from the sensor 200. [ When the magnetic field is changed in the target structure 300 by the first magnetic field B1, eddy currents EC in the form of swirls may occur in the target structure 300. [ The eddy currents EC can be generated along the second direction D2. When a spiral eddy current EC is generated in the target structure 300, a second magnetic field B2 may be generated in the target structure 300 by the eddy current EC. The second magnetic field B2 generated in the target structure 300 may be transmitted to the second coil 240 included in the sensor 200. [ When the second magnetic field B2 is transmitted to the second coil 240 included in the sensor 200, a voltage signal VS corresponding to the second magnetic field B2 may be generated in the second coil 240 have. The second magnetic field B2 may be formed along the first direction D1.

The digitizer 400 digitizes the voltage signal VS corresponding to the second magnetic field B2 to provide the digital voltage signal DVS (S130). For example, the voltage signal VS corresponding to the second magnetic field B2 may be an analog signal. The digitizer 400 may be used to convert the voltage signal VS corresponding to the analog signal into a digital signal. The digitizer 400 may convert the voltage signal VS into a digital signal to provide a digital voltage signal DVS.

The structure diagnosis system 10 according to embodiments of the present invention generates an eddy current EC in the target structure 300 according to the first magnetic field B1 generated from the sensor 200 and generates an eddy current based on the eddy current EC And the second magnetic field B2 generated by the second magnetic field is provided to the sensor 200, thereby improving the performance.

The structure diagnosis system according to the embodiments of the present invention can improve the performance by generating an eddy current in the target structure according to the first magnetic field generated from the sensor and providing a second magnetic field generated based on the eddy current to the sensor, And can be applied to a structure diagnosis apparatus.

While the present invention has been described with reference to the preferred embodiments thereof, it will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit and scope of the invention as defined in the appended claims. It will be understood.

Claims (11)

A waveform generator for providing an excitation signal having a predetermined frequency based on a transmission control signal;
A sensor for providing a first magnetic field based on the excitation signal;
A target structure for generating an eddy current in accordance with the first magnetic field and providing a second magnetic field to the sensor, the second magnetic field being generated based on the eddy current; And
And a digitizer for digitizing a voltage signal corresponding to the second magnetic field to provide a digital voltage signal,
The target structure may include:
A tendon for providing a varying stress based on a tension force; And
And a wedge that surrounds the tendon and generates a eddy current and a second magnetic field based on electrical conductivity that varies with the stress.
The sensor according to claim 1,
A first coil for providing the first magnetic field to the target structure based on the excitation signal; And
And a second coil for providing the voltage signal based on the second magnetic field generated from the target structure.
3. The method of claim 2,
Wherein the magnitude of the voltage signal increases as the magnitude of the eddy current increases, and the magnitude of the voltage signal decreases as the magnitude of the eddy current decreases.
delete The method according to claim 1,
Wherein the electrical conductivity increases as the stress decreases.
6. The method of claim 5,
When the electric conductivity increases as the stress decreases, the intensity of the eddy current increases,
And the intensity of the second magnetic field increases as the intensity of the eddy current increases.
The system according to claim 1,
Wherein the damage index of the target structure is determined by comparing a first digital voltage signal obtained during a first time interval of the digital voltage signal with a second digital voltage signal obtained during a second time interval of the digital voltage signal, Structure diagnosis system.
8. The system according to claim 7,
Wherein the damage index of the target structure is determined based on a variance value of the first digital voltage signal and a variance value of the second digital voltage signal.
A controller for providing a transmission control signal and a reception control signal;
A waveform generator for providing an excitation signal having a predetermined frequency based on the transmission control signal;
A sensor for providing a first magnetic field based on the excitation signal;
A target structure for generating an eddy current in accordance with the first magnetic field and providing a second magnetic field to the sensor, the second magnetic field being generated based on the eddy current; And
And a digitizer for digitizing a voltage signal corresponding to the second magnetic field based on the receive control signal to provide a digital voltage signal to the controller,
The target structure may include:
A tendon for providing a varying stress based on a tension force; And
And a wedge that surrounds the tendon and generates a eddy current and a second magnetic field based on electrical conductivity that varies with the stress.
10. The method of claim 9,
And the number of the predetermined frequencies is plural.
delete
KR1020150112894A 2015-08-11 2015-08-11 Structure diagnosis system and method of operating structure diagnosis system KR101724511B1 (en)

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