KR101724389B1 - 정전 이온 트랩 - Google Patents
정전 이온 트랩 Download PDFInfo
- Publication number
- KR101724389B1 KR101724389B1 KR1020157032631A KR20157032631A KR101724389B1 KR 101724389 B1 KR101724389 B1 KR 101724389B1 KR 1020157032631 A KR1020157032631 A KR 1020157032631A KR 20157032631 A KR20157032631 A KR 20157032631A KR 101724389 B1 KR101724389 B1 KR 101724389B1
- Authority
- KR
- South Korea
- Prior art keywords
- ions
- frequency
- trap
- ion
- mass
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- ZAGHKONXGGSVDV-UHFFFAOYSA-N CCCCC1CCCC1 Chemical compound CCCCC1CCCC1 ZAGHKONXGGSVDV-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
- H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
- H01J49/0063—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by applying a resonant excitation voltage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/622—Ion mobility spectrometry
- G01N27/623—Ion mobility spectrometry combined with mass spectrometry
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0027—Methods for using particle spectrometers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/4245—Electrostatic ion traps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/426—Methods for controlling ions
- H01J49/427—Ejection and selection methods
- H01J49/429—Scanning an electric parameter, e.g. voltage amplitude or frequency
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Electrochemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Molecular Biology (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (9)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US21550109P | 2009-05-06 | 2009-05-06 | |
| US61/215,501 | 2009-05-06 | ||
| US17639009P | 2009-05-07 | 2009-05-07 | |
| US61/176,390 | 2009-05-07 | ||
| US32511910P | 2010-04-16 | 2010-04-16 | |
| US61/325,119 | 2010-04-16 | ||
| US32916310P | 2010-04-29 | 2010-04-29 | |
| US61/329,163 | 2010-04-29 | ||
| PCT/US2010/033750 WO2010129690A2 (en) | 2009-05-06 | 2010-05-05 | Electrostatic ion trap |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020117028183A Division KR101570652B1 (ko) | 2009-05-06 | 2010-05-05 | 정전 이온 트랩 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20150133300A KR20150133300A (ko) | 2015-11-27 |
| KR101724389B1 true KR101724389B1 (ko) | 2017-04-07 |
Family
ID=43050850
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020117028183A Expired - Fee Related KR101570652B1 (ko) | 2009-05-06 | 2010-05-05 | 정전 이온 트랩 |
| KR1020157032631A Expired - Fee Related KR101724389B1 (ko) | 2009-05-06 | 2010-05-05 | 정전 이온 트랩 |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020117028183A Expired - Fee Related KR101570652B1 (ko) | 2009-05-06 | 2010-05-05 | 정전 이온 트랩 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8586918B2 (enExample) |
| EP (1) | EP2430646B1 (enExample) |
| JP (2) | JP5688494B2 (enExample) |
| KR (2) | KR101570652B1 (enExample) |
| CN (2) | CN104779132B (enExample) |
| WO (1) | WO2010129690A2 (enExample) |
Families Citing this family (70)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1928781A4 (en) | 2005-09-30 | 2011-06-29 | Tata Steel Ltd | METHOD FOR PRODUCING HYDROGEN AND / OR OTHER GASES FROM STEEL WASTE WASTE AND DOWNWATERING |
| TWI484529B (zh) * | 2006-11-13 | 2015-05-11 | Mks Instr Inc | 離子阱質譜儀、利用其得到質譜之方法、離子阱、捕捉離子阱內之離子之方法和設備 |
| GB2470599B (en) * | 2009-05-29 | 2014-04-02 | Thermo Fisher Scient Bremen | Charged particle analysers and methods of separating charged particles |
| CN102906907B (zh) | 2010-06-02 | 2015-09-02 | 株式会社半导体能源研究所 | 蓄电装置及其制造方法 |
| DE102010034078B4 (de) * | 2010-08-12 | 2012-06-06 | Bruker Daltonik Gmbh | Kingdon-Massenspektrometer mit zylindrischen Elektroden |
| WO2012177900A1 (en) * | 2011-06-22 | 2012-12-27 | Research Triangle Institute, International | Bipolar microelectronic device |
| JP5918384B2 (ja) * | 2011-10-31 | 2016-05-18 | エム ケー エス インストルメンツ インコーポレーテッドMks Instruments,Incorporated | 静電イオントラップの同調方法および装置 |
| WO2013098607A1 (en) * | 2011-12-28 | 2013-07-04 | Dh Technologies Development Pte. Ltd. | Dynamic multipole kingdon ion trap |
| JP6570998B2 (ja) * | 2012-03-13 | 2019-09-04 | エム ケー エス インストルメンツ インコーポレーテッドMks Instruments,Incorporated | Art・msトラップにおける微量ガス濃度 |
| DE102012008972B4 (de) * | 2012-05-03 | 2018-02-01 | Bruker Daltonik Gmbh | Spannungsquellen für Massenspektrometer |
| US8921779B2 (en) * | 2012-11-30 | 2014-12-30 | Thermo Finnigan Llc | Exponential scan mode for quadrupole mass spectrometers to generate super-resolved mass spectra |
| DE102013201499A1 (de) * | 2013-01-30 | 2014-07-31 | Carl Zeiss Microscopy Gmbh | Verfahren zur massenspektrometrischen Untersuchung von Gasgemischen sowie Massenspektrometer hierzu |
| US9214321B2 (en) * | 2013-03-11 | 2015-12-15 | 1St Detect Corporation | Methods and systems for applying end cap DC bias in ion traps |
| US8735810B1 (en) * | 2013-03-15 | 2014-05-27 | Virgin Instruments Corporation | Time-of-flight mass spectrometer with ion source and ion detector electrically connected |
| DE102013213501A1 (de) | 2013-07-10 | 2015-01-15 | Carl Zeiss Microscopy Gmbh | Massenspektrometer, dessen Verwendung, sowie Verfahren zur massenspektrometrischen Untersuchung eines Gasgemisches |
| US9190258B2 (en) * | 2013-07-30 | 2015-11-17 | The Charles Stark Draper Laboratory, Inc. | Continuous operation high speed ion trap mass spectrometer |
| US9543138B2 (en) | 2013-08-19 | 2017-01-10 | Virgin Instruments Corporation | Ion optical system for MALDI-TOF mass spectrometer |
| WO2015138826A1 (en) * | 2014-03-14 | 2015-09-17 | Rutgers, The State University Of New Jersey | An electrostatic ion trap mass spectrometer utilizing autoresonant ion excitation and methods of using the same |
| GB2546355A (en) * | 2014-03-31 | 2017-07-19 | Leco Corp | GC-TOF MS With improved detection limit |
| US10211040B2 (en) | 2014-11-07 | 2019-02-19 | The Trustees Of Indiana University | Frequency and amplitude scanned quadrupole mass filter and methods |
| US9588004B2 (en) | 2014-11-07 | 2017-03-07 | Mks Instruments, Inc. | Long lifetime cold cathode ionization vacuum gauge design |
| KR101786950B1 (ko) * | 2014-12-30 | 2017-10-19 | 한국기초과학지원연구원 | 비행시간 질량분석기 |
| TWI739300B (zh) | 2015-01-15 | 2021-09-11 | 美商Mks儀器公司 | 離子化計及其製造方法 |
| GB2536870B (en) * | 2015-02-24 | 2019-09-11 | Micromass Ltd | A method and apparatus for tuning mass spectrometers |
| GB2580199B (en) * | 2016-05-23 | 2020-10-21 | Thermo Fisher Scient Bremen Gmbh | Ion Injection to an electrostatic trap |
| US10192730B2 (en) | 2016-08-30 | 2019-01-29 | Thermo Finnigan Llc | Methods for operating electrostatic trap mass analyzers |
| WO2018066587A1 (en) * | 2016-10-04 | 2018-04-12 | Atonarp Inc. | System and method for accurately quantifying composition of a target sample |
| US10622202B2 (en) * | 2016-10-21 | 2020-04-14 | Purdue Research Foundation | Ion traps that apply an inverse Mathieu q scan |
| CN107219448B (zh) * | 2017-06-07 | 2019-03-26 | 西安电子科技大学 | 基于特征时常数的势垒层内陷阱分布表征方法 |
| US10755913B2 (en) | 2017-07-18 | 2020-08-25 | Duke University | Package comprising an ion-trap and method of fabrication |
| US12237162B2 (en) | 2017-07-18 | 2025-02-25 | Duke University | Small-volume UHV ion-trap package and method of forming |
| US10615016B2 (en) | 2017-09-07 | 2020-04-07 | Thermo Fisher Scientific (Bremen) Gmbh | Determining isotope ratios using mass spectrometry |
| US10199207B1 (en) * | 2017-09-07 | 2019-02-05 | California Institute Of Technology | Determining isotope ratios using mass spectrometry |
| CN107703430B (zh) * | 2017-09-11 | 2019-02-22 | 西安电子科技大学 | 表面态陷阱对器件输出特性影响的测量方法 |
| CN107703431B (zh) * | 2017-09-11 | 2019-02-22 | 西安电子科技大学 | 基于频率可变脉冲技术的器件表面态陷阱测量方法 |
| WO2019060538A1 (en) | 2017-09-20 | 2019-03-28 | The Trustees Of Indiana University | METHODS FOR LIPOPROTEIN RESOLUTION BY MASS SPECTROMETRY |
| WO2019058226A1 (en) * | 2017-09-25 | 2019-03-28 | Dh Technologies Development Pte. Ltd. | MASS SPECTROMETER WITH ELECTRO-STATIC LINEAR ION TRAP |
| RU2683018C1 (ru) * | 2017-11-07 | 2019-03-26 | Евгений Васильевич Мамонтов | Способ масс-анализа ионов в квадрупольных высокочастотных полях с дипольным возбуждением колебаний на границах стабильности |
| CN107993908B (zh) * | 2017-11-27 | 2019-11-15 | 温州大学 | 一种基于场发射阴极电子源的电离真空计及其应用方法 |
| EP3738137A1 (en) | 2018-01-12 | 2020-11-18 | The Trustees of Indiana University | Electrostatic linear ion trap design for charge detection mass spectrometry |
| GB201802917D0 (en) | 2018-02-22 | 2018-04-11 | Micromass Ltd | Charge detection mass spectrometry |
| SG11202008683RA (en) * | 2018-03-23 | 2020-10-29 | Adaptas Solutions Pty Ltd | Particle detector having improved performance and service life |
| GB2572819B (en) | 2018-04-13 | 2021-05-19 | Thermo Fisher Scient Bremen Gmbh | Method and apparatus for operating a vacuum interface of a mass spectrometer |
| CN108535403B (zh) * | 2018-04-17 | 2019-07-02 | 西南大学 | 数据处理的方法及装置 |
| US10622200B2 (en) * | 2018-05-18 | 2020-04-14 | Perkinelmer Health Sciences Canada, Inc. | Ionization sources and systems and methods using them |
| WO2019226958A1 (en) | 2018-05-24 | 2019-11-28 | The Research Foundation For The State University Of New York | Capacitive sensor |
| JP7301885B2 (ja) * | 2018-05-28 | 2023-07-03 | ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド | 静電線形イオントラップにおける2次元フーリエ変換質量分析 |
| US10332732B1 (en) * | 2018-06-01 | 2019-06-25 | Eagle Technology, Llc | Image intensifier with stray particle shield |
| EP4376051A3 (en) | 2018-06-04 | 2024-09-25 | The Trustees of Indiana University | Charge detection mass spectrometry with real time analysis and signal optimization |
| JP7398811B2 (ja) | 2018-06-04 | 2023-12-15 | ザ・トラスティーズ・オブ・インディアナ・ユニバーシティー | 高スループット電荷検出質量分光分析のためのイオン・トラップ・アレイ |
| WO2019236143A1 (en) | 2018-06-04 | 2019-12-12 | The Trustees Of Indiana University | Apparatus and method for calibrating or resetting a charge detector |
| AU2019281715B2 (en) | 2018-06-04 | 2024-06-13 | The Trustees Of Indiana University | Apparatus and method for capturing ions in an electrostatic linear ion trap |
| WO2019236139A1 (en) | 2018-06-04 | 2019-12-12 | The Trustees Of Indiana University | Interface for transporting ions from an atmospheric pressure environment to a low pressure environment |
| DE102018121942B3 (de) | 2018-09-07 | 2020-01-16 | Quantum Factory GmbH | Ionenfalle, Verfahren zum Regeln der Ionenfalle und Verwendungen als Antrieb einer Ionenfalle |
| WO2020106310A1 (en) | 2018-11-20 | 2020-05-28 | The Trustees Of Indiana University | Orbitrap for single particle mass spectrometry |
| KR102742959B1 (ko) | 2018-12-03 | 2024-12-16 | 더 트러스티즈 오브 인디애나 유니버시티 | 정전 선형 이온 트랩을 이용하여 다수의 이온을 동시에 분석하기 위한 장치 및 방법 |
| US10930485B2 (en) * | 2019-03-25 | 2021-02-23 | Hamilton Sundstrand Corporation | Ion source for an ion mobility spectrometer |
| WO2020198332A1 (en) * | 2019-03-25 | 2020-10-01 | The Regents Of The University Of California | Multiplex charge detection mass spectrometry |
| US10892398B2 (en) * | 2019-03-28 | 2021-01-12 | Johannes Pollanen | Qubit hardware for electrons on helium |
| US11942317B2 (en) | 2019-04-23 | 2024-03-26 | The Trustees Of Indiana University | Identification of sample subspecies based on particle mass and charge over a range of sample temperatures |
| WO2020226977A1 (en) * | 2019-05-07 | 2020-11-12 | Transient Plasma Systems, Inc. | Pulsed non-thermal atmospheric pressure plasma processing system |
| JP7671510B2 (ja) | 2019-09-25 | 2025-05-02 | ザ・トラスティーズ・オブ・インディアナ・ユニバーシティー | パルス・モード電荷検出質量分析のための装置および方法 |
| WO2021072186A1 (en) | 2019-10-10 | 2021-04-15 | The Trustees Of Indiana University | System and method for identifying, selecting and purifying particles |
| KR20220117264A (ko) | 2019-12-18 | 2022-08-23 | 더 트러스티즈 오브 인디애나 유니버시티 | 전하 측정 배열체를 구비한 질량 분석기 |
| CN111044805B (zh) * | 2019-12-27 | 2021-12-24 | 中国航空工业集团公司西安飞机设计研究所 | 一种静电放电射频噪声测试方法 |
| CA3166860A1 (en) | 2020-02-03 | 2021-08-12 | The Trustees Of Indiana University | Time-domain analysis of signals for charge detection mass spectrometry |
| JP7508840B2 (ja) * | 2020-04-06 | 2024-07-02 | 株式会社島津製作所 | ガスクロマトグラフ質量分析計、質量分析方法およびプログラム |
| WO2021207494A1 (en) | 2020-04-09 | 2021-10-14 | Waters Technologies Corporation | Ion detector |
| WO2023111707A1 (en) | 2021-12-15 | 2023-06-22 | Waters Technologies Corporation | An inductive detector with integrated amplifier |
| JP2025526308A (ja) * | 2022-07-17 | 2025-08-13 | ノヴァ メジャリング インスツルメンツ インコーポレイテッド | 二次イオン質量分析器適応型カウント率変調 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080111067A1 (en) | 2004-05-04 | 2008-05-15 | Glish Gary L | Octapole Ion Trap Mass Spectrometers And Related Methods |
| US20080121795A1 (en) | 2006-11-24 | 2008-05-29 | Hitachi High-Technologies Corporation | Mass spectrometer and mass spectrometry method |
| WO2008063497A2 (en) * | 2006-11-13 | 2008-05-29 | Brooks Automation, Inc. | Electrostatic ion trap |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL86953C (enExample) * | 1950-12-02 | |||
| NL240108A (enExample) | 1958-06-13 | |||
| US3174034A (en) | 1961-07-03 | 1965-03-16 | Max Planck Gesellschaft | Mass spectrometer |
| DE1448192A1 (de) | 1961-07-03 | 1968-10-10 | Inst Plasmaphysik Gmbh | Massenspektrometer |
| US3258591A (en) | 1961-12-22 | 1966-06-28 | Pulse type mass spectrometer wherein ions are separated by oscillations in an electrostatic field | |
| US3258592A (en) | 1961-12-23 | 1966-06-28 | Dynamic mass spectrometer wherein ions are periodically oscillated until se- lectively accelerated to a detector | |
| DE1498870A1 (de) | 1962-02-22 | 1969-03-27 | Max Planck Gesellschaft | Reflexions-Massenspektrometer |
| DE1498873A1 (de) | 1962-05-02 | 1969-04-10 | Max Planck Gesellschaft | Mit elektrischen Feldern arbeitendes Massenspektrometer |
| US5128542A (en) * | 1991-01-25 | 1992-07-07 | Finnigan Corporation | Method of operating an ion trap mass spectrometer to determine the resonant frequency of trapped ions |
| US5200614A (en) * | 1992-01-16 | 1993-04-06 | Ion Track Instruments, Inc. | Ion mobility spectrometers |
| US5371364A (en) * | 1993-02-18 | 1994-12-06 | Thermo King Corporation | Practical implementations for ion mobility sensor |
| GB9506695D0 (en) | 1995-03-31 | 1995-05-24 | Hd Technologies Limited | Improvements in or relating to a mass spectrometer |
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| JPH10233187A (ja) * | 1997-02-19 | 1998-09-02 | Shimadzu Corp | 四重極質量分析計 |
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| JP2006286210A (ja) * | 2005-03-31 | 2006-10-19 | Shimadzu Corp | 質量分析装置及び質量分析装置用印加電圧設定パラメータデータ |
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| EP2013893A2 (en) * | 2006-04-26 | 2009-01-14 | Axcelis Technologies, Inc. | Methods and systems for trapping ion beam particles and focusing an ion beam |
| US7403065B1 (en) | 2006-08-22 | 2008-07-22 | Sandia Corporation | Differential transimpedance amplifier circuit for correlated differential amplification |
-
2010
- 2010-05-05 EP EP10772778.6A patent/EP2430646B1/en not_active Not-in-force
- 2010-05-05 CN CN201510194511.6A patent/CN104779132B/zh not_active Expired - Fee Related
- 2010-05-05 KR KR1020117028183A patent/KR101570652B1/ko not_active Expired - Fee Related
- 2010-05-05 KR KR1020157032631A patent/KR101724389B1/ko not_active Expired - Fee Related
- 2010-05-05 WO PCT/US2010/033750 patent/WO2010129690A2/en not_active Ceased
- 2010-05-05 JP JP2012509953A patent/JP5688494B2/ja not_active Expired - Fee Related
- 2010-05-05 CN CN201080029456.0A patent/CN102648511B/zh not_active Expired - Fee Related
-
2011
- 2011-11-04 US US13/289,142 patent/US8586918B2/en not_active Expired - Fee Related
-
2014
- 2014-09-10 JP JP2014183890A patent/JP5918821B2/ja not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080111067A1 (en) | 2004-05-04 | 2008-05-15 | Glish Gary L | Octapole Ion Trap Mass Spectrometers And Related Methods |
| WO2008063497A2 (en) * | 2006-11-13 | 2008-05-29 | Brooks Automation, Inc. | Electrostatic ion trap |
| US20080121795A1 (en) | 2006-11-24 | 2008-05-29 | Hitachi High-Technologies Corporation | Mass spectrometer and mass spectrometry method |
Also Published As
| Publication number | Publication date |
|---|---|
| US8586918B2 (en) | 2013-11-19 |
| JP2012526362A (ja) | 2012-10-25 |
| WO2010129690A2 (en) | 2010-11-11 |
| EP2430646A4 (en) | 2016-11-09 |
| KR20120060941A (ko) | 2012-06-12 |
| CN102648511B (zh) | 2015-05-06 |
| KR20150133300A (ko) | 2015-11-27 |
| EP2430646B1 (en) | 2019-02-27 |
| WO2010129690A3 (en) | 2011-03-10 |
| CN102648511A (zh) | 2012-08-22 |
| KR101570652B1 (ko) | 2015-11-23 |
| US20120112056A1 (en) | 2012-05-10 |
| CN104779132B (zh) | 2018-04-13 |
| CN104779132A (zh) | 2015-07-15 |
| JP5688494B2 (ja) | 2015-03-25 |
| EP2430646A2 (en) | 2012-03-21 |
| WO2010129690A8 (en) | 2012-06-21 |
| JP5918821B2 (ja) | 2016-05-18 |
| JP2015072902A (ja) | 2015-04-16 |
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