KR101724389B1 - 정전 이온 트랩 - Google Patents

정전 이온 트랩 Download PDF

Info

Publication number
KR101724389B1
KR101724389B1 KR1020157032631A KR20157032631A KR101724389B1 KR 101724389 B1 KR101724389 B1 KR 101724389B1 KR 1020157032631 A KR1020157032631 A KR 1020157032631A KR 20157032631 A KR20157032631 A KR 20157032631A KR 101724389 B1 KR101724389 B1 KR 101724389B1
Authority
KR
South Korea
Prior art keywords
ions
frequency
trap
ion
mass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020157032631A
Other languages
English (en)
Korean (ko)
Other versions
KR20150133300A (ko
Inventor
게라르도 에이. 브루커
케니스 디. 반 앤트워프
쥐. 제프리 래스본
스콧 씨. 헤인부흐
마이클 앤. 스콧
Original Assignee
엠케이에스 인스트루먼츠, 인코포레이티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 엠케이에스 인스트루먼츠, 인코포레이티드 filed Critical 엠케이에스 인스트루먼츠, 인코포레이티드
Publication of KR20150133300A publication Critical patent/KR20150133300A/ko
Application granted granted Critical
Publication of KR101724389B1 publication Critical patent/KR101724389B1/ko
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/004Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/0063Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by applying a resonant excitation voltage
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/622Ion mobility spectrometry
    • G01N27/623Ion mobility spectrometry combined with mass spectrometry
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/0027Methods for using particle spectrometers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205Device types
    • H01J49/4245Electrostatic ion traps
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426Methods for controlling ions
    • H01J49/427Ejection and selection methods
    • H01J49/429Scanning an electric parameter, e.g. voltage amplitude or frequency

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electrochemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Molecular Biology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
KR1020157032631A 2009-05-06 2010-05-05 정전 이온 트랩 Expired - Fee Related KR101724389B1 (ko)

Applications Claiming Priority (9)

Application Number Priority Date Filing Date Title
US21550109P 2009-05-06 2009-05-06
US61/215,501 2009-05-06
US17639009P 2009-05-07 2009-05-07
US61/176,390 2009-05-07
US32511910P 2010-04-16 2010-04-16
US61/325,119 2010-04-16
US32916310P 2010-04-29 2010-04-29
US61/329,163 2010-04-29
PCT/US2010/033750 WO2010129690A2 (en) 2009-05-06 2010-05-05 Electrostatic ion trap

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
KR1020117028183A Division KR101570652B1 (ko) 2009-05-06 2010-05-05 정전 이온 트랩

Publications (2)

Publication Number Publication Date
KR20150133300A KR20150133300A (ko) 2015-11-27
KR101724389B1 true KR101724389B1 (ko) 2017-04-07

Family

ID=43050850

Family Applications (2)

Application Number Title Priority Date Filing Date
KR1020117028183A Expired - Fee Related KR101570652B1 (ko) 2009-05-06 2010-05-05 정전 이온 트랩
KR1020157032631A Expired - Fee Related KR101724389B1 (ko) 2009-05-06 2010-05-05 정전 이온 트랩

Family Applications Before (1)

Application Number Title Priority Date Filing Date
KR1020117028183A Expired - Fee Related KR101570652B1 (ko) 2009-05-06 2010-05-05 정전 이온 트랩

Country Status (6)

Country Link
US (1) US8586918B2 (enExample)
EP (1) EP2430646B1 (enExample)
JP (2) JP5688494B2 (enExample)
KR (2) KR101570652B1 (enExample)
CN (2) CN104779132B (enExample)
WO (1) WO2010129690A2 (enExample)

Families Citing this family (70)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1928781A4 (en) 2005-09-30 2011-06-29 Tata Steel Ltd METHOD FOR PRODUCING HYDROGEN AND / OR OTHER GASES FROM STEEL WASTE WASTE AND DOWNWATERING
TWI484529B (zh) * 2006-11-13 2015-05-11 Mks Instr Inc 離子阱質譜儀、利用其得到質譜之方法、離子阱、捕捉離子阱內之離子之方法和設備
GB2470599B (en) * 2009-05-29 2014-04-02 Thermo Fisher Scient Bremen Charged particle analysers and methods of separating charged particles
CN102906907B (zh) 2010-06-02 2015-09-02 株式会社半导体能源研究所 蓄电装置及其制造方法
DE102010034078B4 (de) * 2010-08-12 2012-06-06 Bruker Daltonik Gmbh Kingdon-Massenspektrometer mit zylindrischen Elektroden
WO2012177900A1 (en) * 2011-06-22 2012-12-27 Research Triangle Institute, International Bipolar microelectronic device
JP5918384B2 (ja) * 2011-10-31 2016-05-18 エム ケー エス インストルメンツ インコーポレーテッドMks Instruments,Incorporated 静電イオントラップの同調方法および装置
WO2013098607A1 (en) * 2011-12-28 2013-07-04 Dh Technologies Development Pte. Ltd. Dynamic multipole kingdon ion trap
JP6570998B2 (ja) * 2012-03-13 2019-09-04 エム ケー エス インストルメンツ インコーポレーテッドMks Instruments,Incorporated Art・msトラップにおける微量ガス濃度
DE102012008972B4 (de) * 2012-05-03 2018-02-01 Bruker Daltonik Gmbh Spannungsquellen für Massenspektrometer
US8921779B2 (en) * 2012-11-30 2014-12-30 Thermo Finnigan Llc Exponential scan mode for quadrupole mass spectrometers to generate super-resolved mass spectra
DE102013201499A1 (de) * 2013-01-30 2014-07-31 Carl Zeiss Microscopy Gmbh Verfahren zur massenspektrometrischen Untersuchung von Gasgemischen sowie Massenspektrometer hierzu
US9214321B2 (en) * 2013-03-11 2015-12-15 1St Detect Corporation Methods and systems for applying end cap DC bias in ion traps
US8735810B1 (en) * 2013-03-15 2014-05-27 Virgin Instruments Corporation Time-of-flight mass spectrometer with ion source and ion detector electrically connected
DE102013213501A1 (de) 2013-07-10 2015-01-15 Carl Zeiss Microscopy Gmbh Massenspektrometer, dessen Verwendung, sowie Verfahren zur massenspektrometrischen Untersuchung eines Gasgemisches
US9190258B2 (en) * 2013-07-30 2015-11-17 The Charles Stark Draper Laboratory, Inc. Continuous operation high speed ion trap mass spectrometer
US9543138B2 (en) 2013-08-19 2017-01-10 Virgin Instruments Corporation Ion optical system for MALDI-TOF mass spectrometer
WO2015138826A1 (en) * 2014-03-14 2015-09-17 Rutgers, The State University Of New Jersey An electrostatic ion trap mass spectrometer utilizing autoresonant ion excitation and methods of using the same
GB2546355A (en) * 2014-03-31 2017-07-19 Leco Corp GC-TOF MS With improved detection limit
US10211040B2 (en) 2014-11-07 2019-02-19 The Trustees Of Indiana University Frequency and amplitude scanned quadrupole mass filter and methods
US9588004B2 (en) 2014-11-07 2017-03-07 Mks Instruments, Inc. Long lifetime cold cathode ionization vacuum gauge design
KR101786950B1 (ko) * 2014-12-30 2017-10-19 한국기초과학지원연구원 비행시간 질량분석기
TWI739300B (zh) 2015-01-15 2021-09-11 美商Mks儀器公司 離子化計及其製造方法
GB2536870B (en) * 2015-02-24 2019-09-11 Micromass Ltd A method and apparatus for tuning mass spectrometers
GB2580199B (en) * 2016-05-23 2020-10-21 Thermo Fisher Scient Bremen Gmbh Ion Injection to an electrostatic trap
US10192730B2 (en) 2016-08-30 2019-01-29 Thermo Finnigan Llc Methods for operating electrostatic trap mass analyzers
WO2018066587A1 (en) * 2016-10-04 2018-04-12 Atonarp Inc. System and method for accurately quantifying composition of a target sample
US10622202B2 (en) * 2016-10-21 2020-04-14 Purdue Research Foundation Ion traps that apply an inverse Mathieu q scan
CN107219448B (zh) * 2017-06-07 2019-03-26 西安电子科技大学 基于特征时常数的势垒层内陷阱分布表征方法
US10755913B2 (en) 2017-07-18 2020-08-25 Duke University Package comprising an ion-trap and method of fabrication
US12237162B2 (en) 2017-07-18 2025-02-25 Duke University Small-volume UHV ion-trap package and method of forming
US10615016B2 (en) 2017-09-07 2020-04-07 Thermo Fisher Scientific (Bremen) Gmbh Determining isotope ratios using mass spectrometry
US10199207B1 (en) * 2017-09-07 2019-02-05 California Institute Of Technology Determining isotope ratios using mass spectrometry
CN107703430B (zh) * 2017-09-11 2019-02-22 西安电子科技大学 表面态陷阱对器件输出特性影响的测量方法
CN107703431B (zh) * 2017-09-11 2019-02-22 西安电子科技大学 基于频率可变脉冲技术的器件表面态陷阱测量方法
WO2019060538A1 (en) 2017-09-20 2019-03-28 The Trustees Of Indiana University METHODS FOR LIPOPROTEIN RESOLUTION BY MASS SPECTROMETRY
WO2019058226A1 (en) * 2017-09-25 2019-03-28 Dh Technologies Development Pte. Ltd. MASS SPECTROMETER WITH ELECTRO-STATIC LINEAR ION TRAP
RU2683018C1 (ru) * 2017-11-07 2019-03-26 Евгений Васильевич Мамонтов Способ масс-анализа ионов в квадрупольных высокочастотных полях с дипольным возбуждением колебаний на границах стабильности
CN107993908B (zh) * 2017-11-27 2019-11-15 温州大学 一种基于场发射阴极电子源的电离真空计及其应用方法
EP3738137A1 (en) 2018-01-12 2020-11-18 The Trustees of Indiana University Electrostatic linear ion trap design for charge detection mass spectrometry
GB201802917D0 (en) 2018-02-22 2018-04-11 Micromass Ltd Charge detection mass spectrometry
SG11202008683RA (en) * 2018-03-23 2020-10-29 Adaptas Solutions Pty Ltd Particle detector having improved performance and service life
GB2572819B (en) 2018-04-13 2021-05-19 Thermo Fisher Scient Bremen Gmbh Method and apparatus for operating a vacuum interface of a mass spectrometer
CN108535403B (zh) * 2018-04-17 2019-07-02 西南大学 数据处理的方法及装置
US10622200B2 (en) * 2018-05-18 2020-04-14 Perkinelmer Health Sciences Canada, Inc. Ionization sources and systems and methods using them
WO2019226958A1 (en) 2018-05-24 2019-11-28 The Research Foundation For The State University Of New York Capacitive sensor
JP7301885B2 (ja) * 2018-05-28 2023-07-03 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド 静電線形イオントラップにおける2次元フーリエ変換質量分析
US10332732B1 (en) * 2018-06-01 2019-06-25 Eagle Technology, Llc Image intensifier with stray particle shield
EP4376051A3 (en) 2018-06-04 2024-09-25 The Trustees of Indiana University Charge detection mass spectrometry with real time analysis and signal optimization
JP7398811B2 (ja) 2018-06-04 2023-12-15 ザ・トラスティーズ・オブ・インディアナ・ユニバーシティー 高スループット電荷検出質量分光分析のためのイオン・トラップ・アレイ
WO2019236143A1 (en) 2018-06-04 2019-12-12 The Trustees Of Indiana University Apparatus and method for calibrating or resetting a charge detector
AU2019281715B2 (en) 2018-06-04 2024-06-13 The Trustees Of Indiana University Apparatus and method for capturing ions in an electrostatic linear ion trap
WO2019236139A1 (en) 2018-06-04 2019-12-12 The Trustees Of Indiana University Interface for transporting ions from an atmospheric pressure environment to a low pressure environment
DE102018121942B3 (de) 2018-09-07 2020-01-16 Quantum Factory GmbH Ionenfalle, Verfahren zum Regeln der Ionenfalle und Verwendungen als Antrieb einer Ionenfalle
WO2020106310A1 (en) 2018-11-20 2020-05-28 The Trustees Of Indiana University Orbitrap for single particle mass spectrometry
KR102742959B1 (ko) 2018-12-03 2024-12-16 더 트러스티즈 오브 인디애나 유니버시티 정전 선형 이온 트랩을 이용하여 다수의 이온을 동시에 분석하기 위한 장치 및 방법
US10930485B2 (en) * 2019-03-25 2021-02-23 Hamilton Sundstrand Corporation Ion source for an ion mobility spectrometer
WO2020198332A1 (en) * 2019-03-25 2020-10-01 The Regents Of The University Of California Multiplex charge detection mass spectrometry
US10892398B2 (en) * 2019-03-28 2021-01-12 Johannes Pollanen Qubit hardware for electrons on helium
US11942317B2 (en) 2019-04-23 2024-03-26 The Trustees Of Indiana University Identification of sample subspecies based on particle mass and charge over a range of sample temperatures
WO2020226977A1 (en) * 2019-05-07 2020-11-12 Transient Plasma Systems, Inc. Pulsed non-thermal atmospheric pressure plasma processing system
JP7671510B2 (ja) 2019-09-25 2025-05-02 ザ・トラスティーズ・オブ・インディアナ・ユニバーシティー パルス・モード電荷検出質量分析のための装置および方法
WO2021072186A1 (en) 2019-10-10 2021-04-15 The Trustees Of Indiana University System and method for identifying, selecting and purifying particles
KR20220117264A (ko) 2019-12-18 2022-08-23 더 트러스티즈 오브 인디애나 유니버시티 전하 측정 배열체를 구비한 질량 분석기
CN111044805B (zh) * 2019-12-27 2021-12-24 中国航空工业集团公司西安飞机设计研究所 一种静电放电射频噪声测试方法
CA3166860A1 (en) 2020-02-03 2021-08-12 The Trustees Of Indiana University Time-domain analysis of signals for charge detection mass spectrometry
JP7508840B2 (ja) * 2020-04-06 2024-07-02 株式会社島津製作所 ガスクロマトグラフ質量分析計、質量分析方法およびプログラム
WO2021207494A1 (en) 2020-04-09 2021-10-14 Waters Technologies Corporation Ion detector
WO2023111707A1 (en) 2021-12-15 2023-06-22 Waters Technologies Corporation An inductive detector with integrated amplifier
JP2025526308A (ja) * 2022-07-17 2025-08-13 ノヴァ メジャリング インスツルメンツ インコーポレイテッド 二次イオン質量分析器適応型カウント率変調

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080111067A1 (en) 2004-05-04 2008-05-15 Glish Gary L Octapole Ion Trap Mass Spectrometers And Related Methods
US20080121795A1 (en) 2006-11-24 2008-05-29 Hitachi High-Technologies Corporation Mass spectrometer and mass spectrometry method
WO2008063497A2 (en) * 2006-11-13 2008-05-29 Brooks Automation, Inc. Electrostatic ion trap

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL86953C (enExample) * 1950-12-02
NL240108A (enExample) 1958-06-13
US3174034A (en) 1961-07-03 1965-03-16 Max Planck Gesellschaft Mass spectrometer
DE1448192A1 (de) 1961-07-03 1968-10-10 Inst Plasmaphysik Gmbh Massenspektrometer
US3258591A (en) 1961-12-22 1966-06-28 Pulse type mass spectrometer wherein ions are separated by oscillations in an electrostatic field
US3258592A (en) 1961-12-23 1966-06-28 Dynamic mass spectrometer wherein ions are periodically oscillated until se- lectively accelerated to a detector
DE1498870A1 (de) 1962-02-22 1969-03-27 Max Planck Gesellschaft Reflexions-Massenspektrometer
DE1498873A1 (de) 1962-05-02 1969-04-10 Max Planck Gesellschaft Mit elektrischen Feldern arbeitendes Massenspektrometer
US5128542A (en) * 1991-01-25 1992-07-07 Finnigan Corporation Method of operating an ion trap mass spectrometer to determine the resonant frequency of trapped ions
US5200614A (en) * 1992-01-16 1993-04-06 Ion Track Instruments, Inc. Ion mobility spectrometers
US5371364A (en) * 1993-02-18 1994-12-06 Thermo King Corporation Practical implementations for ion mobility sensor
GB9506695D0 (en) 1995-03-31 1995-05-24 Hd Technologies Limited Improvements in or relating to a mass spectrometer
US6177668B1 (en) * 1996-06-06 2001-01-23 Mds Inc. Axial ejection in a multipole mass spectrometer
JPH10233187A (ja) * 1997-02-19 1998-09-02 Shimadzu Corp 四重極質量分析計
US7019289B2 (en) 2003-01-31 2006-03-28 Yang Wang Ion trap mass spectrometry
GB0416288D0 (en) 2004-07-21 2004-08-25 Micromass Ltd Mass spectrometer
US7498585B2 (en) 2006-04-06 2009-03-03 Battelle Memorial Institute Method and apparatus for simultaneous detection and measurement of charged particles at one or more levels of particle flux for analysis of same
JP2006286210A (ja) * 2005-03-31 2006-10-19 Shimadzu Corp 質量分析装置及び質量分析装置用印加電圧設定パラメータデータ
GB0526043D0 (en) 2005-12-22 2006-02-01 Micromass Ltd Mass spectrometer
US7511278B2 (en) 2006-01-30 2009-03-31 Spectro Analytical Instruments Gmbh & Co. Kg Apparatus for detecting particles
EP2013893A2 (en) * 2006-04-26 2009-01-14 Axcelis Technologies, Inc. Methods and systems for trapping ion beam particles and focusing an ion beam
US7403065B1 (en) 2006-08-22 2008-07-22 Sandia Corporation Differential transimpedance amplifier circuit for correlated differential amplification

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080111067A1 (en) 2004-05-04 2008-05-15 Glish Gary L Octapole Ion Trap Mass Spectrometers And Related Methods
WO2008063497A2 (en) * 2006-11-13 2008-05-29 Brooks Automation, Inc. Electrostatic ion trap
US20080121795A1 (en) 2006-11-24 2008-05-29 Hitachi High-Technologies Corporation Mass spectrometer and mass spectrometry method

Also Published As

Publication number Publication date
US8586918B2 (en) 2013-11-19
JP2012526362A (ja) 2012-10-25
WO2010129690A2 (en) 2010-11-11
EP2430646A4 (en) 2016-11-09
KR20120060941A (ko) 2012-06-12
CN102648511B (zh) 2015-05-06
KR20150133300A (ko) 2015-11-27
EP2430646B1 (en) 2019-02-27
WO2010129690A3 (en) 2011-03-10
CN102648511A (zh) 2012-08-22
KR101570652B1 (ko) 2015-11-23
US20120112056A1 (en) 2012-05-10
CN104779132B (zh) 2018-04-13
CN104779132A (zh) 2015-07-15
JP5688494B2 (ja) 2015-03-25
EP2430646A2 (en) 2012-03-21
WO2010129690A8 (en) 2012-06-21
JP5918821B2 (ja) 2016-05-18
JP2015072902A (ja) 2015-04-16

Similar Documents

Publication Publication Date Title
KR101724389B1 (ko) 정전 이온 트랩
KR101465502B1 (ko) 정전기 이온 트랩
JP2703724B2 (ja) イオントラップ質量分析器において不所望なイオンを排出する方法及び装置
Schwartz et al. A two-dimensional quadrupole ion trap mass spectrometer
US9040907B2 (en) Method and apparatus for tuning an electrostatic ion trap
AU2003297655B2 (en) Processes for designing mass separators and ion traps, methods for producing mass separators and ion traps. mass spectrometers, ion traps, and methods for analysing samples
EP4053878A1 (en) High frequency voltage supply control method for multipole or monopole analysers
Plass et al. Theory, simulation and measurement of chemical mass shifts in RF quadrupole ion traps
JP3413079B2 (ja) イオントラップ型質量分析装置
CA2528300C (en) Space charge adjustment of activation frequency
JP2019095456A (ja) データ依存制御の改善方法
Dziekonski et al. Voltage-induced frequency drift correction in fourier transform electrostatic linear ion trap mass spectrometry using mirror-switching
Lippert Further development and application of a mobile multiple-reflection time-of-flight mass spectrometer for analytical high-resolution tandem mass spectrometry
GB2527614A (en) High frequency voltage supply control method for multipole or monopole analysers
Patterson Development of a portable ion trap mass spectrometer
Remes Instrumentation and methods for the characterization of ion structure and internal energy in the gas phase

Legal Events

Date Code Title Description
A107 Divisional application of patent
PA0104 Divisional application for international application

St.27 status event code: A-0-1-A10-A16-div-PA0104

St.27 status event code: A-0-1-A10-A18-div-PA0104

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

Fee payment year number: 1

St.27 status event code: A-2-2-U10-U12-oth-PR1002

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000

PR1001 Payment of annual fee

Fee payment year number: 4

St.27 status event code: A-4-4-U10-U11-oth-PR1001

PR1001 Payment of annual fee

Fee payment year number: 5

St.27 status event code: A-4-4-U10-U11-oth-PR1001

PR1001 Payment of annual fee

Fee payment year number: 6

St.27 status event code: A-4-4-U10-U11-oth-PR1001

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000

PR1001 Payment of annual fee

Fee payment year number: 7

St.27 status event code: A-4-4-U10-U11-oth-PR1001

PC1903 Unpaid annual fee

Not in force date: 20240404

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

St.27 status event code: A-4-4-U10-U13-oth-PC1903

PC1903 Unpaid annual fee

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20240404

St.27 status event code: N-4-6-H10-H13-oth-PC1903

R18 Changes to party contact information recorded

Free format text: ST27 STATUS EVENT CODE: A-5-5-R10-R18-OTH-X000 (AS PROVIDED BY THE NATIONAL OFFICE)

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000