KR101697239B1 - Apparatus for characteristic inspection and classification of chip-type electronic part - Google Patents

Abstract

An object of the present invention is to provide a chip-type electronic component characteristic inspection / classification device having a classification portion for examining electrical characteristics of a chip-type electronic component and classifying the chip-type electronic component based on the inspection result.
The sorting portion includes a master 1 in which a plurality of receiving holes for conveying the chip-type electronic component 7 are equally divided on a plurality of concentric circles, and a chip-type electronic component 7 A sorting hole 501 for sorting the chip-type electronic component 7 discharged by the discharge air from the discharge air hole 601; And a sorting bracket 5 provided with a plurality of sets of shooting tubes 503 connected to the sorting holes 501. A flexible tube 502 is provided concentrically on the outer periphery of the tip end of each of the dividing holes 501 so that the distance between the moving surface of the disk 1 on the sorting bracket 5 side and the tip end of the tube 502 is set to be a chip- And a predetermined length smaller than the minimum value of the external dimensions of the component (7).

Description

TECHNICAL FIELD [0001] The present invention relates to a chip-

TECHNICAL FIELD [0001] The present invention relates to a technology for inspecting electrical characteristics of a chip-type electronic component and preventing misclassification in a chip-type electronic component characteristic inspecting and classifying device for classifying based on inspection results.

Background Art [0002] Chip-type electronic components such as chip capacitors incorporated in liquid crystal televisions, cellular phones, game machines, etc., have recently been increasing in production. In order to ensure the reliability of the device, the chip-type electronic parts are subjected to full water inspections, and the processing capability of the chip-type electronic part characteristic inspecting and classifying device for inspection is required to be increased by multi-row processing One).

(Prior art document)

Patent Document 1: Specification Document 2000-501174

As described above, the chip type electronic parts are subjected to full water inspections, and the processing capability of the chip type electronic part characteristic inspecting and classifying apparatus for inspection is required to be increased by multi-heat treatment.

In order to increase the speed, it is possible to achieve higher densification of receiving holes of the chip-type electronic component of the disc while rotating the chip-type electronic component transfer disc at a higher speed. However, when the chip-type electronic component is ejected (ejected) from the receiving hole to the sorting hole by the ejecting air due to such an increase in speed, the ejecting air must be ejected more strongly in a shorter period of time. As a result, as the pitch of the receiving hole and the dividing hole becomes narrower, the chip-type electronic component may enter the sorting hole of another rank instead of the predetermined sorting discrimination in some cases. If another category is mixed due to the misclassification, the reliability of the device accommodating the same is lowered.

In the conventional chip-type electronic component characteristic inspecting and classifying apparatus, or in the apparatus in which the conventional apparatus is accelerated, the above-described misclassification does not occur at all, which is an important problem to be solved.

It is an object of the present invention to provide a chip-type electronic component characteristic inspection and classification apparatus that can realize high speed operation by multi-heating but can prevent misclassification.

In order to achieve the above object, a chip-type electronic component characteristic inspection /

1. A chip-type electronic component characteristic inspecting and classifying apparatus having a classifying portion for examining an electrical characteristic of a chip-type electronic component and classifying the chip-type electronic component based on the result of the test,

Wherein the classification section comprises:

A disc in which a plurality of receiving holes for conveying the chip-type electronic component are equally divided on a plurality of concentric circles;

A reference base corresponding to the plurality of receiving holes and having a discharge air hole for classifying the chip-type electronic component;

A sorting hole for sorting the chip-type electronic component discharged by the discharge air from the discharge air hole, and a sorting bracket having a plurality of sets of shoot tubes connected to the sorting hole,

Wherein a flexible annular body is concentrically provided on the outer periphery of the tip end of each of the bored holes, and a distance between a moving surface of the disk on the separating bracket side and a tip end of the annular body is smaller than a minimum value of the external dimensions of the chip- Of the total length.

In the specification of the present application, the concept of the minimum value of the external dimension of the chip-type electronic component is used, which will be described by way of example.

The type of chip-type electronic component is defined by numerical values of length x width x thickness. That is, the external dimensions of a typical small-sized chip-type electronic component are as follows.

1005 Type: 1.0 占 0.5 占 0.5 (unit: mm)

0603 Type: 0.6 x 0.3 x 0.3 (unit: mm)

0402 Type: 0.4 x 0.2 x 0.2 (unit: mm)

The minimum value of the external dimensions of each type is 0.5 mm, 0.3 mm, and 0.2 mm in order, and the gap narrower than the minimum value of the external dimensions can not pass through.

According to the present invention, there is provided an apparatus for inspecting electrical characteristics of a chip-type electronic component and classifying the chip-type electronic component based on the inspection result, the chip-type electronic component being discharged by the discharge air from the discharge air hole of the reference block, And a plurality of shooting tubes connected to the bifurcated holes, wherein the flexible brackets are concentrically provided at the distal end of each of the bifurcated holes, and the moving surface Type electronic component characteristic inspecting and classifying device having a highly reliable chip-type electronic component characteristic measuring device which can obtain an effect of preventing misclassification of the chip-type electronic component by keeping the distance between the tip of the annular body and the tip end of the annular body at a predetermined length smaller than the minimum value of the external dimensions of the chip- Can be provided.

BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic diagram showing an outline of a chip-type electronic component characteristic inspection and classification apparatus according to the present invention.
Fig. 2 is a plan view showing a specific example of a disc used in the chip-type electronic component characteristic inspecting and classifying apparatus according to the present invention.
Fig. 3 is an enlarged plan view of the sorting bracket portion of Fig. 1. Fig.
Fig. 4 is a sectional view of the sorting bracket of Fig. 3 viewed from the arrow A direction shown in Fig.
5 is an enlarged view of the part of the partitioning hole shown in Fig.
Fig. 6 is an enlarged view of a conventional bored hole portion, which is an explanatory view in which a misclassification occurs.
Fig. 7 is an enlarged view showing a modified example of the partitioning hole portion of the chip-type electronic component characteristic inspecting and classifying device according to the present invention.

DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, an embodiment of a chip-type electronic component characteristic inspection and classification apparatus according to the present invention will be described with reference to the drawings.

Fig. 1 is a schematic diagram showing an outline of a chip-type electronic component characteristic inspecting and classifying device according to the present invention, and Fig. 2 is a plan view showing a specific example of a disc used in the chip- .

As shown in Fig. 1, the chip-type electronic component characteristic inspecting and classifying apparatus according to the present invention includes a chip-type electronic component transporting disc 1, a disc driving mechanism 2 for intermittently rotating and driving the disc 1, (3) for supplying a chip-type electronic component to the chip-type electronic component (1), an electrode bracket (4) having an electrode for checking the electrical characteristics of the chip-type electronic component, and a function And a separating bracket (5) having a separating wall (5). These structures are provided by being inclined by about 20 to 30 degrees from the vertical or vertical direction.

As shown in Fig. 2, a plurality of receiving holes 101 for conveying chip-type electronic components are arranged on a plurality of concentric circles on the resin base 1 so as to be equally divided. Then, the disc 1 is rotationally driven intermittently every time the receiving hole 101 is divided clockwise by the disc driving mechanism 2.

(Example 1)

The chip-type electronic component [0603 type] to which the chip-type electronic component characteristic inspecting and classification device targets is 0.6 mm in length × 0.3 mm in width × 0.3 mm in thickness, and the minimum value of external dimensions is 0.3 mm.

A chip-type electronic component characteristic inspecting and classifying device according to a first embodiment of the present invention will be described with reference to Figs. 3, 4, 5, and 6. Fig. 3 is a cross-sectional view of the sorting bracket of Fig. 3 viewed from the direction of the arrow A, Fig. 5 is a sectional view of the sorting hole portion shown in Fig. 4, Fig. 6 is an enlarged view of a conventional bored hole portion, and is an explanatory view in which a misclassification occurs.

As shown in Figs. 3, 4 and 5, the reference plate 6 is provided with the back surface of the disc 1 and a very small gap, which is connected to a vacuum pressure source (not shown) Like electronic component 7 in the receiving hole 101 is attracted and held by the disc 1 so that the tip end of the chip-shaped electronic component 7 in the receiving hole 101 protrudes from the surface of the disc 1 And is maintained to be less than 0.05 to 0.1 mm. The reason for this protrusion is to improve the contact between a probe (not shown) and the electrode of the chip-type electronic component 7 in the electrode bracket 4.

A plurality of discharge air holes 601 necessary for sorting the chip-type electronic component 7 in the receiving hole 101 are processed and the electrical characteristics of the chip-type electronic component 7 The chip type electronic component 7 in the receiving hole 101 is inserted into the dividing hole 501 processed in the dividing bracket 5 by the air discharged from the discharging air hole 601 at the designated place based on the inspection result Flies to. The sorting bracket 5 is formed with a plurality of sorting holes 501 corresponding to a plurality of discharge air holes 601 machined in the reference piece 6, And a shooting tube 503 for introducing the chip-type electronic part 7 into a housing (not shown).

The opposing gaps between the bushing hole 501 and the disk 1 are provided with a dimension larger than the maximum diagonal line of the dimension of the chip-type electronic component 7 to be subjected to, As the resinous thermoplastic annular body having flexibility, the tube 502 is coaxially attached to the sorting hole 501. The distance between the moving surface of the disk 1 on the sorting bracket 5 side and the tip end of the tube 502 is maintained at 0.2 mm as a predetermined length smaller than 0.3 mm, which is the minimum value of the external dimensions of the chip- Respectively.

Fig. 6 is a view showing a conventional bracket 8 for classification, and nothing corresponding to the tube 502 of Fig. 5 exists. The other functions are the same as those in Fig.

Next, in comparison with FIG. 5 and FIG. 6, how to prevent misclassification of the present invention is explained.

The chip-type electronic component 7 in the receiving hole 101 of the master disc 1 may be out of the normal position for some reason before coming to the sorting place. In such a case, in order not to cause cracking, cracks, scratches, or damage to the chip-type electronic component 7 or to damage such as surface scratches of the resin original disc 1 or deformation of the receiving hole 101, 5 and 6, as described above, the opposing gaps between the dividing hole 501 or 801 and the disc 1 are provided with a dimension larger than the maximum diagonal line of the dimension of the chip-like electronic component 7 to be subjected.

When the chip type electronic part 7 in the receiving hole 101 of the master 1 is out of the normal position due to some cause before coming to the sorting place, The chip type electronic component 7 in the receiving hole 101 of the original 1 falls out from the inside of the receiving hole 101 and drops into the above described gap or the like when the original 1 is inserted into the air hole 601 for discharging, There is a very low probability that a phenomenon in which the air bubbles against the adjacent end surface and falls down in the above-described gap without entering the bifurcated hole 501 or 801 when the air bubbles by the air for discharge of air have. In this case, in the conventional sorting bracket 8 shown in Fig. 6, when the electronic component 9 falling due to the above-described two phenomena reaches a place where the discharge air for sorting is being injected during the fall, Misfire occurs in which air is blown into the partition hole 801 at this place by the discharge air (indicated by a thick arrow in FIG. 6). This phenomenon is because the processing capability of the chip-type electronic component characteristic inspecting and dividing device is high at 36 msec per unit, so that the falling electronic component 9 may exist in a place where the discharge air for classification is injected during the drop.

5 showing the parting bracket 5 according to the present invention, a tube 502 having flexibility is attached to the tip end of the dividing hole 501, Type electronic component 7 is provided inside the tube 502 so that the distance between the moving surface of the tube 502 and the tip of the tube 502 is maintained at 0.2 mm as a predetermined length smaller than the minimum value of the external dimensions of the chip- (7) can not enter. As described above, since the tip end of the chip-type electronic component 7 in the receiving hole 101 is held so as to be less than 0.05 to 0.1 mm from the surface of the disc 1, The tip of the tube 502 does not come into contact with the tip of the tube 502. Therefore, since the sorting hole 501 is protected by the tube 502, the chip-like electronic component 7 in the receiving hole 101 of the disk 1 described above can be prevented The chip-type electronic component 7 protrudes from the tube 502 and comes out of the classifying hole 501 even if the chip-type electronic component 7 comes out of the receiving hole 101 and falls down when the disc 1 rotates. It is prevented from being misclassified.

5, since the inner diameter of the tube 502 is sufficiently larger than the hole diameter of the partitioning hole 501, the chip-like electronic component 7 (see FIG. 5) in the receiving hole 101 of the disc 1 Shaped electronic component 7 does not enter the borehole 501 and protrudes from the vicinity of the end surface thereof when the bare cell 50 is blown by the air for discharge of the discharge air hole 601 in the sorting place, , It is prevented from falling and misclassified as described above.

As described above, even when the chip-type electronic component 7 in the receiving hole 101 of the master 1 is out of the normal position due to some cause before coming to the sorting place, Cracks, and scratches do not occur in the chip-type electronic component 7 and does not cause damage such as surface scratches on the resin-made master 1 and deformation of the receiving hole 101. Further,

Modified examples of the above-described hole expanding portion explained in detail above will be described with reference to Fig. In this modified example, the tube 502 shown in Fig. 5 is replaced with the annular body 602. The annular member 602 is formed so that the cross section passing through the center of the resin is substantially triangular. The tip is made thinner than the base portion to provide flexibility, and the bottom surface is directly bonded to the brazing bracket 5.

When the chip-type electronic component characteristic inspecting and classification device is a chip-type electronic component [1005 type], the minimum value of the external dimension is 0.5 mm. Therefore, a predetermined length smaller than the minimum external dimension of the chip- .

When the chip-type electronic component characteristic inspecting and classification device is a chip-type electronic component [0402 type], the minimum value of the external dimension is 0.2 mm. Therefore, a predetermined length smaller than the minimum value of the external dimensions of the chip- .

As described above, various modifications can be made within the scope of the present invention with respect to the embodiments described in detail. For example, a predetermined length smaller than the minimum value of the external dimensions of the chip-type electronic component can be selected in response to the situation in this specification. As is clear from the above description, the effects of the present invention are also effective for chip-type electronic parts having external dimensions other than the embodiments. The amount of protrusion of the tip of the chip-type electronic component in the receiving hole 101 of the target chip-type electronic component described in the above-described first embodiment from the surface of the disc 1 corresponds to all the chip- , It is necessary to determine a value smaller than a predetermined length which is smaller than the minimum value of the external dimensions of the chip-type electronic component as a target.

1 disc
101 receiving hole
Two-disc semi-drive mechanism
3 Supply
4-electrode bracket
5, 8 classification bracket
501, 801 Classification hole
502 tube
503, 802 shots tube
6 bases
601 Air hole for ejection
602 Other annular materials
7, 9 chip electronic parts

Claims (1)

1. A chip-type electronic component characteristic inspecting and classifying apparatus having a classifying portion for examining an electrical characteristic of a chip-type electronic component and classifying the chip-type electronic component based on the result of the test,
Wherein the classification section comprises:
A disc in which a plurality of receiving holes for conveying the chip-type electronic component are equally divided on a plurality of concentric circles;
A reference base corresponding to the plurality of receiving holes and having a discharge air hole for classifying the chip-type electronic component;
A sorting hole for sorting the chip-type electronic component discharged by the discharge air from the discharge air hole, and a sorting bracket having a plurality of sets of shooting tubes connected to the sorting hole,
Wherein a flexible annular body is concentrically provided on the outer periphery of the tip end of each of the bored holes, and a distance between a moving surface of the disk on the separating bracket side and a tip end of the annular body is smaller than a minimum value of the external dimensions of the chip- Of the chip type electronic component characteristic inspection and classification apparatus.

Images