KR20110046258A - Chip-type electronic component characteristic inspection classification device - Google Patents

Abstract

PURPOSE: A chip type electronic component property testing and sorting apparatus is provided to prevent an erroneous sorting. CONSTITUTION: A plurality of receiving holes are equally arranged on a plurality of concentric circles of a disk(1) to transfer a chip type electronic component(7). A discharge air hole(601) which corresponds a plurality of receiving holes and sorts a chip type electronic component is arranged on a standard stand(6). A sorting hole(501) is formed to sort the chip type electronic component discharged by air from the discharge air hole. A bracket(5) includes a shooting tube(503) connected to the sorting hole.

Description

Apparatus for characteristic inspection and classification of chip-type electronic part}

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a technique for inspecting electrical characteristics of a chip-type electronic component and preventing misclassification in the chip-type electronic component characteristic inspection classification apparatus classified based on the inspection result.

In recent years, production of chip-type electronic components such as chip capacitors in liquid crystal televisions, mobile phones, game machines, and the like has increased. In order to ensure the reliability of the device, the chip-type electronic component is subjected to full inspection, and the processing capacity of the chip-type electronic component characteristic inspection classification device for inspection is required to be speeded up by multiple processes (Patent Documents). One).

(Prior art document)

Patent Document 1 Publication No. 2000-501174

As described above, the chip-type electronic component is subjected to full inspection, and the processing capacity of the chip-type electronic component characteristic inspection classification device for inspection is required to be speeded up by the multi-thermal processing.

In order to speed up, it can achieve by densifying the receiving hole of the chip-shaped electronic component of a disk, etc., while rotating the disk for conveying a chip-shaped electronic component at high speed. However, due to such a high speed, when ejecting (injecting) the chip-shaped electronic component from the receiving hole to the sorting hole by ejecting air, it is necessary to eject more strongly in a shorter time, thereby increasing the pressure of the ejecting air. For this reason, as the pitch of the accommodating hole and the dividing hole is narrowed, the chip-shaped electronic component may enter the dividing hole of a rank other than a predetermined sorting division. If different ranks are mixed due to misclassification, the result is a decrease in the reliability of the apparatus accommodating the same.

In the conventional chip type electronic component characteristic inspection classification apparatus or in the apparatus which speeds up the conventional apparatus, the above-mentioned misclassification does not occur at all, and it was an important subject which must be solved.

SUMMARY OF THE INVENTION An object of the present invention is to provide a chip type electronic component characteristic inspection and sorting apparatus capable of preventing misclassification while being a device that realizes high speed by multiple heat treatment.

In order to achieve the above object, the chip type electronic component characteristic inspection classification apparatus according to the present invention,

A chip type electronic component characteristic inspection and classification device having a classification portion for inspecting electrical characteristics of a chip type electronic component and classifying the chip type electronic component based on the inspection result,

The classification part,

A disk having a plurality of receiving holes for conveying the chip-shaped electronic components arranged equally on a plurality of concentric circles;

A reference table corresponding to the plurality of accommodation holes, and having a discharge air hole for sorting the chip electronic components,

A sorting hole for classifying the chip-shaped electronic component discharged by the discharge air from the discharge air hole, and a sorting bracket equipped with a plurality of sets of shoot tubes connected to the sorting hole,

A flexible annular body is provided concentrically on the outer periphery of the distal end of each sorting hole, and the distance between the moving surface on the side of the splitting bracket of the disk and the distal end of the annular body is smaller than the minimum value of the external dimension of the chip-shaped electronic component. It is characterized by maintaining the length of.

In the specification of the present application, the concept of the minimum value of the external dimension of the chip type electronic component is used.

The type of chip type electronic component is prescribed | regulated by the numerical value of length x width x thickness. That is, the external dimensions of a typical small chip electronic component are as follows.

1005 type: 1.0 × 0.5 × 0.5 (unit mm)

0603 type: 0.6 × 0.3 × 0.3 (unit mm)

0402 type: 0.4 × 0.2 × 0.2 (unit mm)

The minimum value of the external dimension of each type is 0.5 mm, 0.3 mm, and 0.2 mm in order, and a gap narrower than the minimum value of this external dimension cannot pass.

According to the present invention, in the apparatus for inspecting the electrical characteristics of a chip-shaped electronic component and classifying the chip-shaped electronic component based on the inspection result, classifying the chip-shaped electronic component discharged by the discharge air from the discharge air hole of the reference stage. And a sorting bracket having a plurality of sets of shooting tubes connected to the sorting holes, and having a flexible annular body at the distal end of each sorting hole, the movable surface of the disk sorting bracket side. A highly reliable chip type electronic component characteristic inspection and classification device, by which the distance between the tip and the tip of the annular body is kept at a predetermined length smaller than the minimum value of the external dimension of the chip type electronic component, thereby preventing the misclassification of the chip type electronic component. Can be provided.

1 is a schematic diagram showing an outline of a chip-type electronic component characteristic inspection classification device according to the present invention.
Fig. 2 is a plan view showing a specific example of the disc used in the chip type electronic component characteristic inspection classification device according to the present invention.
FIG. 3 is an enlarged plan view of the bracket for sorting shown in FIG. 1.
FIG. 4 is a cross-sectional view of the bracket for classification of FIG. 3 as seen from the arrow A direction.
Fig. 5 is an enlarged view of the fractionation hole portion shown in Fig. 4.
Fig. 6 is an enlarged view of a conventional fractionation hole part, and is an explanatory diagram in which misclassification occurs.
Fig. 7 is an enlarged view showing a modification of the fractionation hole portion of the chip type electronic component characteristic inspection classification device according to the present invention.

Hereinafter, an embodiment of a chip type electronic component characteristic inspection classification device according to the present invention will be described with reference to the drawings.

BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic diagram showing an outline of a chip-type electronic component characteristic inspection classification apparatus according to the present invention, and Fig. 2 is a plan view showing a specific example of a disk used in the chip-type electronic component characteristic inspection classification apparatus according to the present invention. .

As shown in FIG. 1, the chip type electronic component characteristic inspection classification apparatus which concerns on this invention is a disk drive mechanism 2 and a disk for intermittently rotating the disk 1 for disc type electronic component conveyance, and the disk 1. A supply section for supplying the chip-shaped electronic component to (1), an electrode bracket having an electrode for inspecting the electrical characteristics of the chip-shaped electronic component, and a function for classifying the chip-shaped electronic component based on the inspection result. It is composed of a bracket 5 for classification. And these structures are provided inclined about 20-30 degrees from the vertical or vertical.

As shown in Fig. 2, in the resin master disk 1, a plurality of accommodation holes 101 for conveying chip electronic components are arranged in equal divisions on a plurality of concentric circles. The disc 1 is intermittently rotated by the disc drive mechanism 2 for each division of the accommodation hole 101 in the clockwise direction.

(Example 1)

The size of the chip type electronic component targeted by the chip type electronic component characteristic inspection classification device is 0.6 mm in length x 0.3 mm in width x 0.3 mm in thickness, and the minimum value of the external dimension is 0.3 mm.

A chip type electronic component characteristic inspection classification device according to Embodiment 1 of the present invention will be described with reference to FIGS. 3, 4, 5, and 6. 3 is an enlarged plan view of the classification bracket portion of FIG. 1, FIG. 4 is a cross-sectional view of the classification bracket portion of FIG. 3 as viewed from the arrow A direction, and FIG. 5 is a portion of the classification hole shown in FIG. 4. 6 is an enlarged view of a conventional fractionation hole portion, and is an explanatory diagram in which misclassification occurs.

As shown in Figs. 3, 4 and 5, the base 6 is provided with a very small gap with the back of the disc 1, and the gap is connected to a vacuum pressure source (not shown). The chip-shaped electronic component 7 in the receiving hole 101 of the disc 1 is held and adsorbed, and the tip of the chip-shaped electronic component 7 in the receiving hole 101 protrudes from the surface of the disc 1. It is kept to be less than 0.05-0.1 mm. Protruding in this way is for good contact between the probe (not shown) and the electrode of the chip-shaped electronic component 7 in the electrode bracket 4.

Furthermore, in the reference table 6, a plurality of discharge air holes 601 necessary for classifying the chip-shaped electronic components 7 in the receiving holes 101 are processed, and the electrical characteristics of the chip-shaped electronic components 7 are processed. On the basis of the inspection result, the air discharged from the discharge air hole 601 at the designated place causes the chip-shaped electronic component 7 in the receiving hole 101 to form the classification hole 501 processed in the classification bracket 5. Fly towards In the sorting bracket 5, a plurality of sorting holes 501 corresponding to the plurality of ejecting air holes 601 processed in the reference table 6 are processed, and the sorting holes 501 are blown off as described above. A shooting tube 503 is mounted to introduce the chip electronic component 7 into a holder (not shown).

In addition, the gap between the dividing hole 501 and the disc 1 is provided with a size larger than the maximum diagonal of the size of the chip-shaped electronic component 7 as a target, and is provided at the distal ends of the plurality of dividing holes 501. A tube 502 is deposited concentrically to the flow dividing hole 501 as a flexible resinous thermoplastic annular body. Then, the distance between the moving surface on the side of the splitting bracket 5 of the disk 1 and the tip of the tube 502 is kept at 0.2 mm as a predetermined length smaller than 0.3 mm, which is the minimum value of the external dimension of the chip-shaped electronic component 7. It is installed to

FIG. 6 shows a conventional bracket 8 for classification, and there is no equivalent to the tube 502 of FIG. Other functions are the same as the description of FIG.

Next, how to prevent misclassification which is the object of the present invention will be described in contrast to FIGS. 5 and 6.

The chip-shaped electronic component 7 in the receiving hole 101 of the disc 1 may come out of the normal position for some reason before coming to the sorting place. In such a case, in order not to cause cracking, cracking, or scratching in the chip-shaped electronic component 7, or to prevent damage such as surface scratches or deformation of the receiving hole 101 of the resin master disk 1, In FIG. 5 and FIG. 6, as mentioned above, the gap | interval of the dividing hole 501 or 801 and the disk 1 is provided in the dimension larger than the largest diagonal of the dimension of the chip-shaped electronic component 7 made into object.

When the chip-shaped electronic component 7 in the receiving hole 101 of the disk 1 is out of the normal position for some reason before coming to the sorting place, the chip-shaped electronic component 7 is The phenomenon of falling out of the accommodating hole 101 during the rotation and falling into the above-described gap, or of the discharge-type air hole 601 for the chip-shaped electronic component 7 in the accommodating hole 101 of the disc 1. When blown by the air for ejection, the phenomenon of falling into the above-mentioned gap without protruding into the dividing hole 501 or 801 and striking near the end face of the vicinity is a very low probability, but it may occur. have. In this case, in the conventional sorting bracket 8 shown in FIG. 6, when the electronic component 9 falling by the two phenomena mentioned above reaches the place where the discharge air for sorting is injected in the middle of a fall, The discharge air causes misclassification, which flows into the flow dividing hole 801 at this place and enters it (indicated by a thick arrow in FIG. 6). This phenomenon is because the processing capacity of the chip-type electronic component characteristic inspection sorting apparatus is high speed of 36 msec per piece, so that the above-mentioned falling electronic parts 9 may exist in the place where the discharged air for sorting is injected during the fall.

On the other hand, in FIG. 5 which shows the classification bracket 5 part of this invention, the flexible tube 502 is attached to the front-end | tip part of the classification hole 501, and the classification bracket 5 of the disc 1 is carried out. Since the distance between the moving surface on the side and the tip of the tube 502 is set to be 0.2 mm as a predetermined length smaller than the minimum value of the external dimension of the chip-shaped electronic component 7, the chip-shaped electronic component is formed inside the tube 502. (7) can not enter. As described above, since the tip of the chip-shaped electronic component 7 in the receiving hole 101 is held so that the amount of protrusion from the surface of the disk 1 is less than 0.05 to 0.1 mm, the chip-shaped electronic component 7 The tip of is not in contact with the tip of the tube 502. Therefore, since the dividing hole 501 is protected by the tube 502, the chip-shaped electronic component 7 in the accommodation hole 101 of the disk 1 mentioned above is caused by some cause before coming to the dividing place. In the state where it is out of the normal position, even when the chip-shaped electronic component 7 escapes from the accommodation hole 101 and falls when the disc 1 is rotated, it is protruded from the tube 502 and is separated from the tube 502. It does not enter, and misclassification is prevented.

Furthermore, as shown in Fig. 5, the inner diameter of the tube 502 is sufficiently larger than the hole diameter of the splitting hole 501, so that the chip-shaped electronic component 7 in the receiving hole 101 of the disk 1 described above. ) Is blown out by the discharge air of the discharge air hole 601 at the sorting place, and the chip-shaped electronic component 7 is not formed in the tube 502 even if it hits the end face of the vicinity without entering the sorting hole 501. ), It is prevented from falling and misclassifying as described above.

In addition, as described above, even if the chip-shaped electronic component 7 in the receiving hole 101 of the disc 1 may be out of the normal position for some reason before coming to the sorting place, the tube 502 Since it has flexibility, the chip-shaped electronic component 7 does not cause cracking, cracking, or scratching, and does not cause damage such as surface scratches or deformation of the receiving hole 101 of the resin master disk 1.

The modification of the fractionation hole enlargement part demonstrated in detail above is demonstrated with reference to FIG. In this modification, the tube 502 shown in FIG. 5 is replaced with the annular body 602. The annular body 602 is molded so that the cross section passing through the center of the resin becomes a substantially triangular shape. The end portion is made thinner than the base portion to give flexibility, and the bottom surface is directly adhered to the bracket 5 for sorting.

When the object of the chip type electronic part characteristic inspection classification device is a chip type electronic part [1005 type], since the minimum value of the external dimension is 0.5 mm, the predetermined length smaller than the minimum value of the external dimension of the chip electronic component is 0.4 mm, for example. You can do

When the object of the chip type electronic part characteristic inspection classification device is a chip type electronic part [0402 type], since the minimum value of the external dimension is 0.2 mm, the predetermined length smaller than the minimum value of the external dimension of the chip type electronic component is 0.15 mm, for example. You can do

As described above, various modifications can be made to the embodiments described in detail within the scope of the present invention. For example, the predetermined length smaller than the minimum value of the external dimension of the chip-shaped electronic component is selectable in response to the situation within this rule. In addition, as is clear from the above description, the effects of the present invention are also effective for chip-type electronic components having an external dimension other than the embodiment. At this time, the chip-type electronic component to be subjected to all objects, and the amount of the tip of the chip-shaped electronic component in the receiving hole 101 of the target chip-type electronic component described in Embodiment 1 described above protruding from the surface of the disk 1 In addition, it is necessary to determine the value smaller than the predetermined length smaller than the minimum value of the external dimension of the target chip-shaped electronic component.

1 disc
101 receiving hole
2 disc drive mechanism
3 Supply Section
4-electrode bracket
5, 8 Classification Bracket
501, 801 Sorting hole
502 tubular toroid
503, 802 shot tubes
6 standard band
601 Discharge Air Hole
602 other rings
7, 9 chip electronic components

Claims (1)

A chip type electronic component characteristic inspection and classification device having a classification portion for inspecting electrical characteristics of a chip type electronic component and classifying the chip type electronic component based on the inspection result,
The classification part,
A disk having a plurality of receiving holes for conveying the chip-shaped electronic components arranged equally on a plurality of concentric circles;
A reference table corresponding to the plurality of accommodation holes, and having a discharge air hole for sorting the chip electronic components,
A sorting hole for classifying the chip-shaped electronic component discharged by the discharge air from the discharge air hole, and a sorting bracket equipped with a plurality of sets of shot tubes connected to the sorting hole,
A flexible annular body is provided concentrically on the outer periphery of the distal end of each sorting hole, and the distance between the movable surface on the sorting bracket side of the disk and the distal end of the annular body is smaller than the minimum value of the external dimension of the chip-shaped electronic component. Chip-type electronic component characteristics inspection classification device, characterized in that it is maintained at the length of.

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