KR101683094B1 - Index Type Cell Inspecting Apparatus - Google Patents

Abstract

The present invention relates to an index type cell inspecting apparatus, and more particularly, to an index type cell inspecting apparatus having an index plate provided to be rotatable about a central axis and provided in a plate shape having a space in which a plurality of jig frames are seated along a circumference thereof; A loading unit disposed on one side of the index plate for loading a cell of a liquid crystal panel to be inspected by the jig frame; A first checking unit disposed on a side of the loading unit and performing a current check on the cell; A second checking unit which is disposed at a facing portion of the loading unit and performs a vision check on a cell whose current inspection is completed through the first checking unit; And an unloading unit disposed at an opposite part of the first inspection unit and discharging a cell having been subjected to the vision inspection through the second inspection unit; A stepped portion is formed in the seating portion of the jig frame on the index plate to support a bottom surface of the jig frame, and a pneumatic pipe is provided in the index plate to provide pneumatic pressure for fixing the cell to be mounted on the jig frame The pneumatic piping is connected to a pneumatic hole formed in the step portion, and a connection hole corresponding to the pneumatic hole is formed on a bottom surface of the jig frame.
Accordingly, the cell inspecting process can be implemented in an index manner, so that the loading, inspecting, and unloading processes can be independently performed, and the time required for the inspecting process can be remarkably shortened.
In addition, it is possible to replace the jig frame supporting the cell, and it is possible to universally apply the cell inspection of various sizes by the corresponding replacement of the lighting unit according to the jig frame replacement.

Description

[0001] INDEX TYPE CELL INSPECTION APPARATUS [0002]

The present invention relates to an index-type cell inspection apparatus.

In recent years, as the society has become a full-fledged information age, a display field for processing and displaying a large amount of information has rapidly developed, and various flat panel display devices have been developed in response to this.

Specific examples of such flat panel display devices include a liquid crystal display device (LCD), a plasma display panel (PDP), a field emission display (FED) (Electroluminescence Display Device: ELD). These flat panel display devices are superior in performance of thinning, light weight, and low power consumption, and are rapidly replacing existing cathode ray tubes (CRTs).

In particular, a liquid crystal display device is characterized in that it has a large contrast ratio, is suitable for moving picture display, and has a small deflection power, and is used in various fields such as a notebook computer, a monitor, and a TV. As is well known, liquid crystals have optical anisotropy, which is elongated in molecular structure and has directionality in alignment, and polarization property in which molecular alignment direction is changed according to its size when placed in an electric field.

That is, a general liquid crystal display device includes a liquid crystal display device in which a liquid crystal layer is interposed between a first substrate on which an array layer for liquid crystal driving is formed and a second substrate on which a color filter layer for color implementation is provided, A panel is required as an essential component, and this causes a difference in transmittance by changing the arrangement direction of the liquid crystal molecules with an internal electric field.

The transmittance difference of the liquid crystal panel is displayed in the form of a color image by reflecting the color combination of the color filter through light of a back light placed on the back surface thereof.

A typical process for manufacturing a liquid crystal display device can be classified into a cell process for completing a liquid crystal panel, and a module process for integrating a liquid crystal panel, a liquid crystal panel, and a backlight.

In the dual cell process, an array layer and a color filter layer are formed on each substrate by repeating processes such as thin film deposition, photo-lithography, and etching several times. In the cell process, A seal pattern is formed on one of the first and second substrates to form a seal pattern thereon, and the both substrates are bonded to each other with the liquid crystal layer interposed therebetween to complete the liquid crystal panel. And then integrated with the backlight to form a liquid crystal display device.

In the meantime, such a liquid crystal display device is subjected to various inspection processes to select high quality liquid crystal display devices. The inspection process proceeding after the module process is confirmed by the manual operation of the operator and the visual inspection of the operator, There may be cases where it is not possible to confirm whether there is a defect due to carelessness.

As a conventional technique for solving these drawbacks, there has been disclosed in Korean Patent Laid-Open Publication No. 10-2013-0003398 (published on Mar. 01, 2013).

In such a conventional technique, when the cell inspection processing is implemented in an in-line manner and the cell loading, inspection, and unloading processes are performed, if any process is not completed, Such a time loss due to the atmospheric condition has a problem that the efficiency of the entire inspection process is lowered.

In addition, there is a problem in that it is difficult to integrally perform current inspection and vision inspection for cells of various sizes due to insufficient replacement structure of the jig for seating the cell and replacing the lighting unit due to replacement of the jig.

SUMMARY OF THE INVENTION The present invention has been made in order to overcome the above problems, and it is an object of the present invention to provide a method and apparatus for implementing a cell inspection process in an index manner, independently performing loading, inspecting and unloading processes, And a cell inspection apparatus capable of performing a cell inspection.

It is still another object of the present invention to provide a cell inspection apparatus which can be replaced with a jig frame for supporting a cell and can be universally applied to cell inspection of various sizes by corresponding replacement of a lighting unit according to jig frame replacement I have to.

According to an aspect of the present invention, there is provided an index plate, comprising: an index plate provided to rotate about a central axis and provided in a plate shape having a space in which a plurality of jig frames are seated along a circumference; A loading unit disposed on one side of the index plate for loading a cell of a liquid crystal panel to be inspected by the jig frame; A first checking unit disposed on a side of the loading unit on a side surface of the index plate, for performing a current check on the cell; A second inspection unit disposed on an opposite side of the loading unit on a side surface of the index plate, for performing a vision inspection on a cell whose current inspection is completed through the first inspection unit; And an unloading unit disposed on an opposite side of the first inspection unit on a side surface of the index plate, for discharging a cell having undergone the vision inspection through the second inspection unit; A stepped portion is formed in the seating portion of the jig frame on the index plate to support a bottom surface of the jig frame, and a pneumatic pipe is provided in the index plate to provide pneumatic pressure for fixing the cell to be mounted on the jig frame And the pneumatic pipe is connected to a pneumatic hole formed in the step portion, wherein the jig frame is provided such that a cell seating portion on which the cell is placed corresponds to a size of a cell to be inspected, and the size and shape of the jig frame are fixed And a connection hole connected to the cell seating portion is fixed to the bottom surface of the jig frame at a position corresponding to the position of the pneumatic hole formed in the step portion, Wherein when the jig frame is supported on the jaw frame, And an index-type cell inspection apparatus for fixing a cell that is seated in the cell seating portion with a pneumatic pressure provided from a pressure hole.

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Here, the loading unit may include: a supply picker for moving the cell to the aligned frame by adsorbing the cell from the cell supplying part; An alignment check unit installed to move left and right from a lower part of the alignment frame and inspecting an alignment state of the cells placed on the alignment frame; And a transfer picker for picking up the cells having been aligned through the alignment inspection unit and transferring the cells to the jig frame. .

The first inspection unit may include at least one current inspection camera disposed at an upper portion of the jig frame; And a first lighting unit disposed between the camera for current inspection and the jig frame and having a first lighting pin module which is movable upward and downward and applies power to a cell mounted on the jig frame; And the first lighting pin module is detachable from the first lighting unit.

The second inspection unit may include at least one upper light source disposed on the upper portion of the jig frame; A vision inspection camera disposed between the jig frame and the upper light source and disposed on a vertical line from the center of the seated cell; At least one oblique light source disposed between the jig frame and the vision inspection camera, the oblique light source providing a light source tilted toward the seated cell; A second lighting unit disposed between the jig frame and the oblique light source and having a second lighting pin module that is movable upward and downward and applies power to a cell mounted on the jig frame; And the second lighting pin module is detachable from the second lighting unit.

According to the present invention, the cell inspecting process is implemented in an index manner, and the loading, inspecting, and unloading processes are independently performed, and the time required for the inspecting process can be remarkably shortened.

In addition, it is possible to replace the jig frame supporting the cell, and it is possible to universally apply the cell inspection of various sizes by the corresponding replacement of the lighting unit according to the jig frame replacement.

1 is a perspective view schematically showing a configuration of an index-type cell inspection apparatus according to the present invention,
2 is a plan view of an index-type cell inspection apparatus according to the present invention,
3 is a perspective view of an index plate of an index-type cell inspection apparatus according to the present invention and an enlarged view of a seating space of a jig frame,
FIG. 4 is an enlarged view of a first illuminating unit and a perspective view of a first illuminating unit of an index-type cell testing apparatus according to the present invention,
5 is an enlarged view of a perspective view and a second lighting unit of a second inspection unit of the index-type cell inspection apparatus according to the present invention.

Hereinafter, the configuration of the present invention will be described in detail with reference to the accompanying drawings.

Prior to this, if a detailed description of the related art is deemed to unnecessarily obscure the gist of the present invention, a detailed description thereof will be omitted (for example, in the loading and unloading process, A concrete process of the cell inspection and the monopoly determination performed in the first and second inspection units, and the like). In addition, numerals (e.g., first, second, etc.) used in the description of the present invention are merely an identifier for distinguishing one component from another.

In addition, the terms used in the specification and claims should not be construed in a dictionary meaning, and the inventor may, on the principle that the inventor can properly define the concept of a term in order to explain its invention in the best way, And should be construed in light of the meanings and concepts consistent with the technical idea of the present invention.

Therefore, the embodiments shown in the present specification and the drawings are only exemplary embodiments of the present invention, and not all of the technical ideas of the present invention are presented. Therefore, various equivalents It should be understood that water and variations may exist.

FIG. 1 is a perspective view schematically showing the configuration of an index-type cell inspection apparatus according to the present invention, FIG. 2 is a plan view of an index-type cell inspection apparatus according to the present invention, FIG. 4 is an enlarged view of a first illuminating unit and a first illuminating unit of an index-type cell testing apparatus according to the present invention, FIG. 5 is an enlarged view of a first illuminating unit, Fig. 5 is an enlarged view of a second illuminating unit and a perspective view of an index-type cell inspection apparatus according to a second embodiment of the present invention. Fig.

1 to 5, an index type cell inspection apparatus according to the present invention includes an index plate 10, a loading unit 20, a first inspection unit 30, a second inspection unit 40, and an unloading unit 50).

The index plate 10 is configured to move a cell to a region corresponding to each inspection process in a state in which a liquid crystal cell (hereinafter, referred to as a "cell") to be inspected is placed. The index plate 10 is configured to rotate about a central axis, Like shape in which a space for supporting a plurality of jig frames 16 to seat the plurality of jig frames 16 is formed. 1 to 5, the shape of the index plate 10 is formed in a substantially quadrangular plate shape, and two jig frames 16 are seated on one side. However, the present invention is not limited thereto, And the number of the spaces in which the jig frame 16 is mounted along the circumference may be varied. (Hereinafter, the rectangular shape with the protruding sides The configuration in which two jig frames are respectively seated on the index plate and the protruding sides will be described on the assumption that the jig frame is seated on the index plate and the protruded sides. It is noted that it is structured as to be.

3, the index plate 10 is formed with a plurality of spaces (hereinafter, referred to as "jig frame seating portions") on which the jig frames 16 are seated along the circumferential portion, (In the figure, the jig frame seating portion is formed so as to have a space of " C " toward the inside in a state where the outer side is open, and the stepped portion 12 is formed in this space) The shape of the jig frame seating portion and the step portion is not limited to the drawing representation.)

The index plate 10 is formed with a pneumatic pipe P for providing a pneumatic pressure for fixing a cell to be mounted on the jig frame 16 and the pneumatic pipe P is connected to a pneumatic hole And a connection hole 18 corresponding to the pneumatic hole 14 is formed in the bottom surface of the jig frame 16 so that pneumatic pressure applied through the pneumatic piping P is seated on the jig frame 16 And is implemented to fix the cell.

As described above, according to the structure of the jig frame 16 that is replaceably supported from the index plate 10, the present invention can be applied to the integration inspection of cells of various sizes and sizes (current inspection + vision Inspection) is implemented. That is, the size and shape of the jig frame 16 vary in the size of the cell seating portion in the jig frame 16 in a fixed state. (In this case, the interlocking of the connection hole and the pneumatic hole must be fixed for fixing the cell. ), An integrated test for all cells within various sizes and sizes of cells, for example, 2.5 to 9 inches, is implemented.

The loading unit 20 is disposed on one side of the index plate 10 and serves to load a cell to be inspected by the jig frame 16 on the index plate 10. Specifically, A supply picker 22 for sucking a cell from a supply part (cell conveyance belt or the like) and moving the cell to the aligning frame 21; An alignment detector 24 for checking the alignment of the cells placed on the frame 21, a transfer picker 26 for picking up the alignment confirmed cells through the alignment checker 24 and transferring the cells to the jig frame 16, .

The loading unit 20 is configured to move left and right at a predetermined distance from one side of the index plate 10 to seat the cells aligned in the jig frame 16 accommodated in one side of the index plate 10 .

The first inspection unit 30 is disposed on the side of the loading unit 20 and performs a current inspection for the cells mounted on the jig frame 16. The first inspection unit 30 determines whether the cells are short- Check whether the flicker is bad or not. Specifically, the first inspection section 30 is one or more current inspection cameras 32 disposed on the top of the jig frame 16, as shown in Figs. 1 and 4. Fig. A first lighting pin module 36 disposed between the camera for current inspection 32 and the jig frame 16 and capable of moving up and down and applying power to the cells mounted on the jig frame 16 is provided And a first lighting unit 34. The first lighting pin module 36 is detachable from the first lighting unit 34. [ The attachment and detachment of the first lighting pin module 36 is performed in the same context as the replacement of the above-described jig frame 16 to realize inspection of cells having various specifications. That is, when the standard or size of the cell is changed, the lighting pin connection portion for applying power to the corresponding cell also changes at the same time. Therefore, cell inspection of various standards is implemented by replacing the first lighting pin module 36.

The second inspecting unit 40 is arranged in the opposing part of the loading unit 20 and performs a vision inspection on the cells whose current inspection is completed through the first inspecting unit 30. In this case, Perform a vision check. 1 and 5, the second inspection unit 40 includes at least one upper light source 42 disposed at an upper portion of the jig frame 16, at least one upper light source 42 disposed between the jig frame 16 and the upper light source 16, , A vision inspection camera (44) arranged on a vertical line from the center of the seated cell, a light source arranged between the jig frame (16) and the vision inspection camera (44) A second light source 46 which is disposed between the jig frame 16 and the oblique light source 46 and which is movable upward and downward and which applies power to the cell mounted on the jig frame 16, And a second lighting unit 48 provided with a pin module 49. The second lighting pin module 49 is detachable from the second lighting unit 48. [ The attachment and detachment of the second turn-on pin module 49 is performed in the same context as the replacement of the jig frame 16 and the first turn-on pin module 36 described above to implement inspection for cells having various specifications. That is, when the size and size of the cell are changed, the lighting pin connection portion for applying power to the corresponding cell also changes at the same time. Therefore, cell inspection of various standards is implemented by replacing the second lighting pin module 49. The second inspection unit 40 may further include a lower light source (not shown) for providing a light source at a lower portion of the jig frame 16 and may control the light irradiation angle and height of the oblique light source 46 and the lower light source (The constitution of the second inspection section and the inspection process are the same as those described in the application and the registered Korean Patent Registration No. 10-1072390 (issued on October 11, 2011) The detailed description thereof will be omitted.)

Although the first and second inspection units 30 and 40 are exposed to the outside of the apparatus in FIGS. 1 to 5, the first inspection unit 30 and the second inspection unit 40 are protected in the form of a housing It is preferable that foreign matters such as particles are prevented from contaminating the cell during each inspecting process, and the loading and unloading process areas as well as the inspection unit are also protected in the form of a housing.

On the other hand, the unloading unit 50 is disposed in the opposing portion of the first inspection unit 30 and discharges the cells having been subjected to the vision inspection through the second inspection unit 40. According to the inspection result, And a discharge picker for transferring each determined cell to the corresponding discharge area.

2, an unloading portion 50 is disposed on a lower portion of the index-type cell inspection apparatus according to the present invention in a state in which a plate-shaped index plate 10 rotating at the center is disposed, The loading unit 20 is disposed on the left side and the first inspection unit 30 is disposed on the upper side and the second inspection unit 40 is disposed on the right side to perform the respective processes in the stopped state of the index plate 10, The index plate 10 is rotated 90 degrees and the rear end process is performed. The process sequence is in the order of loading -> first inspection -> second inspection -> unloading. From the completion of one cycle process (360 degree rotation of the index plate) at the beginning of the first process, Process can be performed to maximize the process time efficiency for the cell inspection.

INDUSTRIAL APPLICABILITY As described above, the index-type cell inspection apparatus according to the present invention realizes an index-type cell inspection process, so that the loading, inspection, and unloading processes are independently performed, thereby shortening the time required for the inspection process.

In addition, it is possible to replace the jig frame supporting the cell, and it is possible to universally apply the cell inspection of various sizes by the corresponding replacement of the lighting unit according to the jig frame replacement.

While the present invention has been described with reference to the exemplary embodiments and the drawings, it is to be understood that the technical scope of the present invention is not limited to these embodiments and that various changes and modifications will be apparent to those skilled in the art. Various modifications and variations may be made without departing from the scope of the appended claims.

Description of the Related Art [0002]
10: Index plate
12:
14: Pneumatic hole
16: Jig frame
18: Connection hole
20: loading section
21: Aligned frame
22: Feed picker
24:
26: Feed picker
30: First inspection section
32: Camera for current inspection
34: First lighting unit
36: First lighting pin module
40:
42: upper light source
44: Vision Inspection Camera
46: inclined light source
48: Second lighting unit
49: Second lighting pin module
50: Unloading section
P: Pneumatic piping

Claims (6)

An index plate provided to rotate about a center axis and provided in a plate shape having a space in which a plurality of jig frames are seated along the circumference;
A loading unit disposed on one side of the index plate for loading a cell of a liquid crystal panel to be inspected by the jig frame;
A first checking unit disposed on a side of the loading unit on a side surface of the index plate, for performing a current check on the cell;
A second inspection unit disposed on an opposite side of the loading unit on a side surface of the index plate, for performing a vision inspection on a cell whose current inspection is completed through the first inspection unit; And
An unloading unit disposed on an opposite side of the first inspection unit on a side surface of the index plate and discharging a cell having undergone the vision inspection through the second inspection unit; Lt; / RTI >
Wherein a stepped portion is formed in the seating portion of the jig frame on the index plate to support a bottom surface of the jig frame,
A pneumatic pipe for providing a pneumatic pressure for fixing a cell to be mounted on the jig frame is formed in the index plate, the pneumatic pipe is connected to a pneumatic hole formed in the step,
Wherein the jig frame has a cell seating portion in which the cell is seated, the cell seating portion corresponding to a size of a cell to be inspected, the size and shape of the jig frame being fixedly fixed and being seated and supported so as to be replaceable in the step portion, A connection hole is fixedly formed on a bottom surface of the frame at a position corresponding to a position of the pneumatic hole formed in the step, And fixes the cell that is seated in the cell seating portion with pneumatic pressure provided from the pneumatic hole through the connection hole
Index type cell inspection device. delete delete The method according to claim 1,
The loading unit may include:
A supply picker for adsorbing cells from the cell supply portion and moving the cells to the alignment frame;
An alignment check unit installed to move left and right from a lower part of the alignment frame and inspecting an alignment state of the cells placed on the alignment frame; And
A transfer picker for picking up the cells whose alignment has been confirmed through the alignment inspection unit and transferring the cells to the jig frame; ≪ RTI ID = 0.0 >
Index type cell inspection device. The method according to claim 1,
The first checking unit,
At least one current inspection camera disposed on an upper portion of the jig frame; And
A first lighting unit disposed between the camera for current inspection and the jig frame and having a first lighting pin module which is movable upward and downward and applies power to a cell mounted on the jig frame; / RTI >
And the first lighting pin module is detachable from the first lighting unit
Index type cell inspection device. The method according to claim 1,
Wherein the second checking unit comprises:
At least one upper light source disposed at an upper portion of the jig frame;
A vision inspection camera disposed between the jig frame and the upper light source and disposed on a vertical line from the center of the seated cell;
At least one oblique light source disposed between the jig frame and the vision inspection camera, the oblique light source providing a light source tilted toward the seated cell;
A second lighting unit disposed between the jig frame and the oblique light source and having a second lighting pin module that is movable upward and downward and applies power to a cell mounted on the jig frame; / RTI >
And the second lighting pin module is detachable from the second lighting unit
Index type cell inspection device.

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