KR101587774B1 - Pogo pin for ito film test and guide block for the pogo pin - Google Patents

Abstract

The present invention relates to a pogo pin for an ITO film test and a pogo pin guide block. The prevent invention provides the pogo pin for an ITO film test which comprises: an elastic pin configured to touch a terminal surface of a PCB constituting a test socket and provide an elastic force in a direction vertical to the terminal surface; and a conductive rod made of cylindrical conductive rubber having a flat touch surface, which touches an ITO film, on a lower surface, and having a trench hole, which accommodates the elastic pin, on an upper side. In addition, provided is the pogo pin guide block with the pogo pin for an ITO film test.

Description

[0001] The present invention relates to a pogo pin and a pogo pin guide for inspecting an ITO film,

The present invention relates to a pogo pin and a pogo pin guide block, and more particularly to a pogo pin and a pogo pin guide block for ITO film inspection.

Generally, the electrical connection between the device and the test apparatus must be stable for testing the electrical characteristics of the device. A test socket is used as a device for connection between the device and the test apparatus.

The role of these test sockets is to connect the terminals of the device and the pads of the test device to each other so that electrical signals can be exchanged bidirectionally. For this purpose, a pogo pin is used as a means of electrically connecting the test socket to the device.

The pogo pin has a spring inside. Therefore, the connection between the device and the test apparatus can be made smooth, and the mechanical impact generated by the connection can be buffered, thereby being used in most test sockets.

1 is a sectional view of a pogo pin and a pogo pin guide block according to a conventional method.

The test socket includes a plurality of pogo pins (20-1, 20-2, 20-3, ..., 20-N) and a guide block (30) arranged to match the terminal arrangement of the device to be tested. At this time, the pogo pins 20-1, 20-2, 20-3, ..., 20-N used may not have uniform elasticity for impact buffering due to manufacturing variations.

Referring to FIG. 1, the pouch pin 20-1, 20-2, 20-3, ..., 20-N arranged when the test socket makes contact with the device under test 400, 20-3). Accordingly, when the inspection target device 400 is a pressure sensitive ITO film (Indium Tin Oxide Film), the film surface may be damaged by the pogo pin 20-3.

Korean Patent Publication No. 10-2011-0065047 "Test Socket, Method of Making the Test Socket and Pogo Pin" Korean Patent Publication No. 10-2002-0078003 "Structure and Manufacturing Method of Silicone Rubber Spring Pogo Pins"

It is an object of the present invention to provide a pogo pin and a pogo pin guide block which can prevent ITO film damage.

According to one aspect of the present invention, the pogo pin for inspecting an ITO film is made of an elastic material that contacts the terminal surface of the PCB constituting the test socket and provides elasticity in a direction perpendicular to the terminal surface, pin; And a conductive bar formed on the lower surface of the conductive rubber having a flat contact surface contacting the ITO film and having a trench for receiving the elastic pin on the upper side.

The bushing may be inserted into the trench hole and the lower end of the bushing may be closed. The elastic pin may be inserted into the bushing and received in the conductive rod.

At this time, the elastic pin has a casing member having a pipe shape with an upper end closed to maintain a constant diameter in a vertical direction; A spring disposed inside the casing member and providing elasticity in a vertical direction by buffering; And a cushioning member having one side inserted into the casing member and in contact with the spring and the other side extending outwardly from the casing member.

At this time, the casing member may have a contact end for contacting the terminal of the PCB.

At this time, the bush has a projection on an inner bottom surface, and the buffer member may have a fitting groove that is engaged with the projection on a lower side of the other side.

The inner side of the lower end of the bush may be formed so that the other side of the buffer member is constrained.

Meanwhile, the conductive bar may be formed of conductive silicone rubber.

According to another aspect of the present invention, there is provided a pogo pin guide block including a pogo pin for inspecting an ITO film.

According to the pogo pin and the pogo pin guide block according to the embodiment of the present invention,

First, since the cross-sectional area of the conductive bar portion contacting with the ITO film is large, it is possible to prevent damage to the ITO film due to load dispersion even when the load is concentrated during pin contact.

Second, the electrical contact area between the elastic pin and the conductive rod can be widened through the structure in which the elastic pin is inserted into the bush and accommodated in the conductive bar. That is, the resistance of the pogo pin can be reduced.

Third, since the pressure between the elastic pin and the conductive rod is dispersed through the structure in which the elastic pin is inserted into the bushing and is accommodated in the conductive bar, even if an excessive load is applied to the pogo pin, damage to the elastic pin .

Fourthly, since the elastic pin has a spring inside, it is possible to prevent the load from being transmitted to the ITO film as it is even if an excessive load is applied to the pogo pin.

Fifth, since the elastic fins are coupled to the bushes by the interference fit method, the elastic fins can be prevented from being detached from the pogo pins.

Sixth, since the cross-sectional area of the conductive bar portion contacting the ITO film is large, a marginal margin can be given to tolerance when the pogo pin guide block and the ITO film are in contact with each other.

1 is a sectional view of a pogo pin and a pogo pin guide block according to a conventional method.
2 is an exploded cross-sectional view of a pogo pin according to an embodiment of the present invention.
3 is a cross-sectional view of a pogo pin guide block according to an embodiment of the present invention.
4 is a perspective view of a test socket according to an embodiment of the present invention.
FIG. 5 is a perspective view of a pogo pin guide block according to an embodiment of the present invention, viewed from above and from below.

Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. Note that, in the drawings, the same components are denoted by the same reference symbols as possible. Further, the detailed description of known functions and configurations that may obscure the gist of the present invention will be omitted. For the same reason, some of the components in the drawings are exaggerated, omitted, or schematically illustrated.

2 is an exploded cross-sectional view of a pogo pin according to an embodiment of the present invention. 3 is a cross-sectional view of a pogo pin guide block according to an embodiment of the present invention. 4 is a perspective view of a test socket according to an embodiment of the present invention. FIG. 5 is a perspective view of a pogo pin guide block according to an embodiment of the present invention, viewed from above and from below.

The test socket comprises a PCB 100 and a pogo pin guide block 300. The jig supporting the PCB 100 and the ITO film 400 is omitted in the drawing.

2 and 5, the pogo pin 200 according to the present invention includes an elastic pin 210, a bush 220, and a conductive bar 230.

The elastic pins 210 contact the terminal surface of the PCB 100 constituting the test socket and provide elasticity in a direction perpendicular to the terminal surface.

The conductive bar 230 is formed of a cylindrical conductive rubber having a smooth concave surface on the lower surface and has a trench hole for receiving the elastic pin 210 on the upper side.

2, the elastic pins 210 may be directly inserted into the trench holes. However, in order to provide electrical contact and pressure dispersion between the elastic pins 210 and the conductive bars 230, 220, and the bush 220 is inserted into the transistor hole.

At this time, the conductive bar 230 may be formed of conductive silicone rubber, and the bush 220 may be formed of a metal having high conductivity such as brass. However, the material for forming the conductive bar 230 and the bush 220 is not limited to the above material, and any material can be used as long as the material is effective.

The resilient fins 210 are preferably provided with an internal spring for resilience. For example, the elastic pin 210 may be implemented in the form of including a casing member 211, a spring 212, and a buffer member 213.

The casing member 211 may be formed in the shape of a closed pipe whose upper end is kept closed in a vertical direction.

The spring 212 is disposed inside the casing member 211 to provide elasticity in the vertical direction by buffering.

The cushioning member 213 has one side 213a inserted into the casing member 211 and in contact with the spring 211 and the other side 213b extending outside the casing member 211. [

At this time, the casing member 211 may have a contact end 214 at an upper end thereof. The contact end 214 is a portion in contact with the terminal of the PCB 100.

The elastic pin 210 is inserted into the bush 220. Since the elastic pin 210 can freely move up and down in the bush 220, the diameter of the elastic pin 210 is smaller than the diameter of the bush 220 Should be.

However, in order to prevent the elastic pin 210 from being separated from the bush 220 in the process of improving the electrical contact between the elastic pin 210 and the bush 220 and inspecting the bush 220, the other side 213b of the buffer member 213 It is preferable that the bushing 200 is formed in such a manner as to be pressed against.

The inner diameter B of the lower end of the bush 220 is smaller than the inner diameter of the entire bush 220 and the diameter A of the other side 213b of the buffer member 213 is smaller than the inner diameter B So that interference fit can be achieved.

The protruding portion 221 may be provided on the inner bottom surface of the weir bush 220 and the fitting groove 215 may be formed on the other side 213b of the buffer member 213 to engage with the protruding portion 221 .

A plating film may be formed on the surface of the contact terminal 214 and the buffer member 213 to lower the contact resistance as required.

Even if a load is concentrated on a pogo pin due to manufacturing variations of the elastic pin 210, the portion of the pogo pin 200 contacting the ITO film 400 has a wide cross-section C, The damage of the ITO film 400 can be prevented.

In addition, since the cross section C of the conductive bar portion contacting the ITO film is formed to a large extent, a marginal margin can be given to the tolerance when the pogo pin guide block 300 and the ITO film 400 are in contact with each other.

Referring to FIG. 5, the pogo pin guide block 300 is shown as having a linear array shape. However, for example, the pogo pin guide block 300 may include a pogo pin guide 300 corresponding to the contact terminal arrangement of the ITO film 400, The shape of block 300 may be suitably modified.

In addition, although the pogo pin 300 is shown as a cylindrical shape, the pogo pin 300 in the present invention is not limited to the pogo pin 300, but may be implemented in a shape such as a triangular square.

Since the cushioning member 213 and the casing member 211 in the elastic fin 210 have a relative movement with respect to the spring 212, the projecting portion 213b of the cushioning member 213 is moved in the direction of the PCB 100 As shown in Fig.

The embodiments of the present invention disclosed in the present specification and drawings are merely illustrative examples of the present invention and are not intended to limit the scope of the present invention in order to facilitate understanding of the present invention. It will be apparent to those skilled in the art that other modifications based on the technical idea of the present invention are possible in addition to the embodiments disclosed herein.

100: PCB
200: Pogo pin
300: Pogo pin guide block
400: ITO film
210: Elastic pin
220: Bush
230:

Claims (8)

A pogo pin provided in a test socket for inspecting an ITO film,
An elastic pin contacting the terminal surface of the PCB constituting the test socket and providing elasticity in a direction perpendicular to the terminal surface; And
And a trenched hole formed in a cylindrical conductive rubber having a flat contact surface in contact with the ITO film on the lower surface and having a trench for receiving the elastic pin on an upper side thereof. The method according to claim 1,
Further comprising a pipe-shaped bush inserted into the trench hole and closed at the lower end thereof,
Wherein the resilient fins are inserted into the bushes and are received in the conductive rods. 3. The method of claim 2,
The elastic pin
A casing member which maintains a constant diameter in a vertical direction and has a pipe shape whose top end is closed;
A spring disposed inside the casing member and providing elasticity in a vertical direction by buffering; And
And a cushioning member inserted into the casing member, the cushioning member being in contact with the spring, and the other end of the cushioning member extending outwardly from the casing member. The method of claim 3,
The casing member
And a contact end for contacting a terminal of the PCB on an upper surface thereof. The method of claim 3,
The bush includes:
And a protruding portion on the inner bottom surface,
The cushioning member,
And a fitting groove that is engaged with the protrusion at the lower end of the other side of the pogo pin. The method of claim 3,
Wherein the lower end of the bushing is formed so that the other side of the buffer member is constrained. The method according to claim 1,
Wherein the conductive bar is formed of conductive silicone rubber. A pogo pin guide block comprising a pogo pin for inspecting an ITO film as claimed in any one of claims 1 to 7.

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