KR101301524B1 - Lamination device and lamination method - Google Patents
Lamination device and lamination method Download PDFInfo
- Publication number
- KR101301524B1 KR101301524B1 KR1020120026498A KR20120026498A KR101301524B1 KR 101301524 B1 KR101301524 B1 KR 101301524B1 KR 1020120026498 A KR1020120026498 A KR 1020120026498A KR 20120026498 A KR20120026498 A KR 20120026498A KR 101301524 B1 KR101301524 B1 KR 101301524B1
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- South Korea
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- film
- laminated body
- laminate
- receiving member
- elastic membrane
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- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Lining Or Joining Of Plastics Or The Like (AREA)
- Casting Or Compression Moulding Of Plastics Or The Like (AREA)
Abstract
In a simple configuration, at least the film-like laminate is pierced on the surface having the protruding portion of the layer to be laminated reliably, and molded to a uniform thickness without generating voids.
The lamination apparatus is provided with the heating means 1 and 2 which heat at least the insulating resin film F, and the upper side board 3 and the lower side board 4 which are provided so that opening and closing are possible, and when they are closed, they form the closed chamber 34. ), A receiving member 5 having elasticity opposed to the insulating resin film F polymerized on the side where the bump B of the semiconductor wafer W is formed on the upper half 3, and the lower half. (4), the elastic membrane body (6) facing the semiconductor wafer (W) on which the insulating resin film (F) is polymerized, the vacuum suction means (7) for vacuum suction inside the chamber (34), and the elastic membrane body ( It is provided with the pressurizing means 8 which expands 6) and presses the semiconductor wafer W and the insulating resin film F between the receiving members 5.
Description
BACKGROUND OF THE INVENTION Field of the Invention The present invention relates to a laminating method and a laminating apparatus, and in particular, polymerizing a laminated body having protrusions such as an electronic component having a bump and a film-like laminate such as a resin layer, for example. The present invention relates to a method and an apparatus for laminating such that the protruding portion penetrates at least the film-like laminate by heating, pressing and heating.
As a laminated body, such as an electronic component which has a protrusion part, bumps which consist of metals, such as solder, copper, and gold, are formed in the surface of a semiconductor wafer, for example. This bump protrudes from the surface of the semiconductor wafer, and is generally formed in a cylindrical or egg shape whose tip is close to a spherical surface, and has a height (protrusion amount) of 0.01 to 0.04 mm and a diameter of about 0.01 to 0.04 mm. . Moreover, the space | interval with the mutually adjacent bump is 0.03-0.10 mm. The plating method, paste printing method, ball mounting method, etc. are employ | adopted for formation of such a bump.
The semiconductor wafer on which such bumps are formed is generally made of silicon, molded into a circle, has a diameter of 4, 8, 12, or 16 inches, and has a thickness of 0.025 to 0.800 mm.
On the other hand, the insulating resin film as a film-like laminated body is generally comprised by thermosetting resins, such as epoxy, as a main component. Moreover, the insulating resin film may be comprised by the thermoplastic resin and the mixture of a thermosetting resin and a thermoplastic resin. And as shown to Fig.3 (a), as for flexible resin film F, protective films P1 and P2 which consist of PET etc. are laminated | stacked on both surfaces generally, and lamination | stacking with the semiconductor wafer W When the protective film P2 is peeled off as shown in Fig. 3 (b), and when mounting the package after lamination, for example, as shown in Fig. 3 (c), the other protective film (P1) is also peeled. The thickness of insulating resin film F is about 0.01-0.06 mm, for example. When the tip of bump B penetrates and the other protective film P1 is peeled off as shown in FIG.3 (c), it is generally selected so that it may expose from the surface of insulating resin film F. FIG.
Patent documents 1-4 are known as a conventional technique for laminating | stacking the to-be-laminated body W and film-like laminated body F which have such a protrusion part B. As shown in FIG.
In addition,
Moreover, as another conventional technique,
As another conventional technique,
In the said
In addition, as disclosed in
In
In
SUMMARY OF THE INVENTION The present invention has been made in view of the above-described problems, and in a simple configuration, the film laminated body can be reliably laminated through a surface having a projecting portion of a layer to be laminated, and can be molded to a uniform thickness without generating voids. It is an object of the present invention to provide a method and apparatus.
The invention according to the lamination method of
The invention according to the lamination method of
The invention according to the lamination method of
In addition, the invention according to the lamination apparatus of
According to the lamination method of
According to invention of
According to invention of
Further, according to the invention according to the lamination apparatus of
BRIEF DESCRIPTION OF THE DRAWINGS It is sectional drawing which showed schematically in order to demonstrate one Embodiment of the lamination apparatus of this invention.
Fig. 2 is a partially enlarged cross-sectional view shown for explaining a state in which a laminate and a film-like laminate are laminated according to the present invention.
3 is a cross-sectional view for explaining the general procedure for laminating the layered object and the film-like laminate.
It is sectional drawing shown in order to demonstrate the conventional technique at the time of pressurizing and heating between a pair of rollers, and laminating | stacking a to-be-laminated body and a film-shaped laminated body.
FIG. 5 is an enlarged cross-sectional view illustrating a state in which voids are generated in the film-like laminate laminated with the laminated body by FIG. 4. FIG.
First, one Embodiment of the lamination apparatus of this invention is described in detail based on FIG. 1 and FIG. In addition, in this embodiment, the laminated body which has a protrusion part is the semiconductor wafer W which has bump B (henceforth a protrusion part is called bump, and a laminated body is called a semiconductor wafer), and a film-like laminated body is shown in FIG. As shown in FIG. 8, an insulating resin film (hereinafter, referred to as an insulating resin film) provided with a protective film P1 on at least a surface opposite to the surface to be laminated when the semiconductor wafer W is laminated (F) Will be explained.
The stacking apparatus of the present invention is laminated so that the bumps B penetrate at least the insulating resin film F by polymerizing, heating and pressing the semiconductor wafer W having the bumps B and the insulating resin film F. In order to do so, at least the heating means (1, 2) for heating the insulating resin film (F), and the upper side and the lower side (3) are provided so as to be openable and close, and form a closed chamber (34) when closed. 4) and the
The
The
In addition, on the surfaces of the receiving
Moreover, in this embodiment, the
Moreover, in this embodiment, the
In this embodiment, in the vicinity of the
Next, one embodiment of the lamination method of the present invention is a semiconductor wafer W having a bump B as a laminated body having a protrusion, and a film-like laminate using a lamination device configured as described above. When the film in which the protective film P1 peeled off after lamination is laminated | stacked on the insulating resin film F is laminated | stacked, it demonstrates in detail with the operation | movement.
The lamination method of the present invention schematically stacks the semiconductor wafer W having the bumps B and the insulating resin film F so that at least the bumps B penetrate the insulating resin film F by heating and pressing the insulating resin film F. In order to do so, the surface on the side where the bump B of the semiconductor wafer W is formed and the insulating resin film F are opposed to each other so as to polymerize with each other, and the insulating resin film F and the receiving
In laminating the insulating resin film F and the semiconductor wafer W, the surface on which the bump B of the semiconductor wafer W is first formed face up, and the surface on which the bump B of the semiconductor wafer W is formed. The rectangular insulating resin film F whose one side is larger than the diameter of the semiconductor wafer W is polymerized and placed on the carrier film C2 below the set stage SS. At this time, when the protective films P1 and P2 are provided on both surfaces of the insulating resin film F, as shown to Fig.3 (a), peeling off the protective film P2 located below, and this implementation is carried out. In the form, it is superposed | polymerized on the semiconductor wafer W after making the protective film P1 affix only on the upper side of insulating resin film F. FIG. In addition, this invention is not limited to this embodiment, Since the semiconductor wafer W is mounted on the carrier film C2 below in the set stage SS, it is insulating to this semiconductor wafer W You may polymerize resin film (F).
Next, as shown in FIG. 1, in the state where the
In this state, the inside of the
In this state, as shown in FIG. 2, the connection to the
When the
At this time, since the tip of the bump B formed on the surface of the semiconductor wafer W elastically deforms the receiving
In addition, since the semiconductor wafer W and the insulating resin film F are pressed between the receiving
When the insulating resin film F is laminated on the semiconductor wafer W, the
The present invention is not limited to the above-described embodiment, and can be applied to a wiring board (TSV) with a silicon through via, a microelectromechanical system wafer (MEMS wafer), or the like as a laminated body having a protrusion. Moreover, depending on the material of the semiconductor wafer W and the insulating resin film F, the thing of the range which deviates from the conditions (temperature, pressure, molding time, etc.) described in the said embodiment is also assumed. Moreover, when the insulating resin film F is laminated | stacked on the semiconductor wafer W, it is common that the bump B penetrates the insulating resin film F, However, this lamination apparatus can also be used even if it embeds without penetrating. Can be. Moreover, as a film-shaped laminated body, it is applicable also when laminating | stacking things other than insulating resin film (F), such as a photoresist layer, for example. Moreover, the insulating resin film F may be a continuous one like the upper and lower carrier films C1 and C2.
B ... Bump
W ... Semiconductor Wafer (Laminate)
F ... Insulating resin film (film laminate)
C1, C2... Carrier film
P1, P2 ... Protective film
One… Upper side heating plate (heating means)
2… Lower heating plate (heating means)
3 ... Upper half (one of a pair of half)
4… Lower half (the other half of pair)
5 ... Receiving member
6 ... Elastic membrane
7 ... Vacuum suction means
8… Pressurizing means
34 ... chamber
Claims (4)
The side in which the protrusion part of the said laminated body is formed, and the said film laminated body are made to oppose, and a laminated body and a film laminated body will superpose | polymerize,
Between the receiving member having elasticity and the elastic membrane body, the polymerized laminated body and the film laminated body are disposed so that the film-like laminate faces the receiving member and the laminated body faces the elastic membrane body. and,
Pressing the said laminated body and a film-shaped laminated body between the said elastic film body and a receiving member by swelling the said elastic film body in the state which carried out the vacuum suction at least between the said laminated body and a film-shaped laminated body,
Laminating method, characterized in that the receiving member is arranged to be harder than the hardness of the elastic membrane body.
The side in which the protrusion part of the said laminated body is formed, and the said film laminated body are made to oppose, and a laminated body and a film laminated body will superpose | polymerize,
Between the receiving member having elasticity and the elastic membrane body, the polymerized laminated body and the film laminated body are disposed so that the film-like laminate faces the receiving member and the laminated body faces the elastic membrane body. and,
Pressing the said laminated body and a film-shaped laminated body between the said elastic film body and a receiving member by swelling the said elastic film body in the state which carried out the vacuum suction at least between the said laminated body and a film-shaped laminated body,
The laminated body is placed on a carrier film, and the polymerized film-like laminated body and the laminated body are conveyed between the receiving member and the elastic membrane body,
And the elastic film body presses the laminated body and the film-like laminate toward the receiving member through the carrier film.
Heating means for heating at least the film-like laminate,
A pair of halves provided to open and close and form a closed chamber when closed,
A receiving member provided in one of these halves and having elasticity opposed to the film-like laminated body polymerized on the side where the protrusions of the laminated body are formed;
An elastic membrane body provided at the other half of the half and opposed to the laminated body to which the film-like laminate is polymerized;
Vacuum suction means for vacuum suction in the chamber;
Pressurizing means for expanding said elastic membrane body to pressurize said laminated body and said film-shaped laminate between said receiving member,
A lamination apparatus, wherein the receiving member is arranged to be harder than the hardness of the elastic membrane body.
Heating means for heating at least the film-like laminate,
A pair of halves provided to open and close and form a closed chamber when closed,
A receiving member provided in one of these halves and having elasticity opposed to the film-like laminated body polymerized on the side where the protrusions of the laminated body are formed;
An elastic membrane body provided at the other half of the half and opposed to the laminated body to which the film-like laminate is polymerized;
Vacuum suction means for vacuum suction in the chamber;
Pressing means for expanding the elastic membrane body to press the laminated body and the film-shaped laminate between the receiving member and
With a carrier film,
The laminated body is placed on the carrier film, and the polymerized film-like laminate and the laminated body are conveyed between the receiving member and the elastic membrane body,
And the elastic membrane body presses the laminated body and the film-like laminate toward the receiving member through the carrier film.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JPJP-P-2011-253800 | 2011-11-21 | ||
JP2011253800 | 2011-11-21 |
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KR20130056153A KR20130056153A (en) | 2013-05-29 |
KR101301524B1 true KR101301524B1 (en) | 2013-09-04 |
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KR1020120026498A KR101301524B1 (en) | 2011-11-21 | 2012-03-15 | Lamination device and lamination method |
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TW (1) | TWI492845B (en) |
Families Citing this family (2)
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KR102448726B1 (en) * | 2017-08-14 | 2022-09-28 | 삼성전자주식회사 | Laminating device and method for fabricating semiconductor package using the same |
KR102556106B1 (en) * | 2021-06-29 | 2023-07-18 | 주식회사 좋은에너지기술 | Laminating apparatus |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08332646A (en) * | 1995-06-06 | 1996-12-17 | Meiki Co Ltd | Vacuum lamination apparatus and method |
KR20000076785A (en) * | 1999-03-10 | 2000-12-26 | 토와 가부시기가이샤 | Method of coating semiconductor wafer with resin and mold used therefor |
JP2004299147A (en) * | 2003-03-31 | 2004-10-28 | Sumitomo Metal Electronics Devices Inc | Method and apparatus for laminating ceramic green sheets |
JP2008012918A (en) * | 2006-06-07 | 2008-01-24 | Nichigo Morton Co Ltd | Laminating apparatus, and laminating method using it |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100357278B1 (en) * | 1996-07-12 | 2002-10-19 | 후지쯔 가부시끼가이샤 | Semiconductor device |
US6197665B1 (en) * | 1998-04-15 | 2001-03-06 | Tessera, Inc. | Lamination machine and method to laminate a coverlay to a microelectronic package |
US7851334B2 (en) * | 2007-07-20 | 2010-12-14 | Infineon Technologies Ag | Apparatus and method for producing semiconductor modules |
-
2012
- 2012-03-15 KR KR1020120026498A patent/KR101301524B1/en active IP Right Grant
- 2012-03-19 TW TW101109321A patent/TWI492845B/en active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08332646A (en) * | 1995-06-06 | 1996-12-17 | Meiki Co Ltd | Vacuum lamination apparatus and method |
KR20000076785A (en) * | 1999-03-10 | 2000-12-26 | 토와 가부시기가이샤 | Method of coating semiconductor wafer with resin and mold used therefor |
JP2004299147A (en) * | 2003-03-31 | 2004-10-28 | Sumitomo Metal Electronics Devices Inc | Method and apparatus for laminating ceramic green sheets |
JP2008012918A (en) * | 2006-06-07 | 2008-01-24 | Nichigo Morton Co Ltd | Laminating apparatus, and laminating method using it |
Also Published As
Publication number | Publication date |
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TW201321189A (en) | 2013-06-01 |
TWI492845B (en) | 2015-07-21 |
KR20130056153A (en) | 2013-05-29 |
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