KR101258570B1 - A test system for led - Google Patents

Abstract

A system main body provided with a transfer guide for guiding movement of a strip frame in which a plurality of LED elements are mounted in a strip state, and a frame conveying apparatus for transferring the strip frame along the transfer guide through an on-loader on one side of the system main body, and a frame And a heating and testing device for heating and testing the LED elements on the strip frame transferred by the transfer device, and a defective processing device for marking the LED elements identified as defective in the heating and testing device or separating them from the strip frame. An LED device test system is disclosed.

Description

LED Device Test System {A TEST SYSTEM FOR LED}

The present invention relates to an LED (LED) device test system, and more particularly to an LED device test system for separating a defective product by performing a high temperature test on a plurality of LED devices.

LED (Light Emitting Diode) is a kind of light emitting device using a semiconductor that converts electricity into light, also known as a Luminescent diode.

These LEDs are smaller than conventional light sources, have a long life, have low power consumption, and have high-speed response. Therefore, LEDs are used for display lamps of various kinds of electronic devices such as display devices for automobile instrumentation, optical communication light sources, card readers of numeric display devices or calculators. It is widely used in various fields, such as a backlight.

The LED is manufactured through an epi process (EPI), a chip process (Fabrication) and a package process (Package), etc., and is subjected to a test process in a packaged state through the package process. In the test process, the LEDs which are not normally operated are excluded, and the LEDs which are normally operated are classified and classified according to their performance.

On the other hand, conventionally, when the electric test of the LED was tested in the room temperature state, the LED package is separated from each other by analyzing the performance one by one tester and shipped according to the internal resistance.

As such, testing the LED at room temperature is very useful until now, but recently, LEDs with high light generation, such as high brightness LEDs, have been produced.

However, when the high-brightness LED is subjected to room temperature electric test and classified as a suitable LED and mounted on an actual substrate, the LED is heated to a high temperature by the heat generated by the LED. When electricity is supplied in the heated state, there is a problem that the LED is abnormally damaged by heat generated inside the LED.

In other words, when electricity is supplied at room temperature, the product is passed as a normal product. However, when electricity is supplied at a high temperature state, which is an actual use condition, an abnormal product may occur.

Considering this point, there are many difficulties in testing each LED by using conventional test equipment. In addition, it is not easy to heat individual LEDs, and it takes a lot of time to test, which leads to a sharp decrease in productivity. There is a problem.

The present invention has been made in view of the above, and an object thereof is to provide an improved LED device test system capable of simultaneously heating and testing a plurality of LEDs.

The LED device test system of the present invention for achieving the above object, the system body is provided with a transfer guide for guiding the movement of the strip frame in which a plurality of LED elements are mounted in a strip state; A frame conveying apparatus for conveying the strip frame along the conveying guide through an onloader of one side of the system main body; A heating and testing device for heating and testing the LED elements on the strip frame transferred by the frame feeding device; It characterized in that it comprises a; defective processing device for marking the LED element identified as defective in the heating and testing device or separated from the strip frame.

Here, it is preferable to further include a preheating device for preheating to a suitable temperature before the strip frame is transferred to the heating and testing device.

In addition, the preheating device is installed so as to be accessible and spaced apart from each other with the strip frame supported by the frame transfer device, and includes an upper and lower preheating unit that is in contact with the strip frame to preheat both sides respectively when approaching the strip frame. It is good.

In addition, the frame transfer apparatus, the first horizontal moving unit which is installed to be reciprocating along the transfer guide; A gripper unit installed on the first horizontal moving unit; And a first robot unit for reciprocating the first horizontal moving unit, wherein the gripper unit is installed so as to be accessible and spaced apart from each other to clamp the strip frame loaded from the onloader to the transfer guide. It is preferable to include a pair of grip members and an interference member installed adjacent to the pair of grip members so as to be movable in a horizontal direction and moving the strip frame preheated by the preheater to the heating and test apparatus.

In addition, the heating and test apparatus, the upper heating unit for heating one surface of the strip frame moved to the heating and test position along the transfer guide; A lower heating unit for heating the other surface of the strip frame to correspond to the upper heating unit; A second robot unit reciprocating one of the upper heating unit and the lower heating unit along the transfer guide; And a test unit installed in one of the upper heating unit and the lower heating unit to test the LED element mounted on the strip frame, wherein the heating unit of any one of the upper and lower heating units is connected to the strip frame. Clamping in contact with the second robot unit is sequentially moved to the test position by the second robot unit, the rest of the heating unit is installed to be liftable to contact and heat the clamped strip frame, the test unit is installed to lift When the strip frame moved to the test position is approached, it is preferable to have a plurality of probe pins that are in contact with and test a plurality of LED elements.

Here, the upper heating unit is installed to reciprocately move along the transfer guide by the second robot unit, the lower heating unit is installed to move up and down, the test unit is raised and lowered adjacent to the lower heating unit It is good to be installed to be movable.

In addition, the test unit is connected to the lower heating unit is moved together during the lifting motion of the heating unit, and when in contact with some of the plurality of LED elements mounted on the strip frame supported by the upper heating unit in order to sequentially It is a good idea to do a test.

In addition, the defective article processing apparatus, a marker for marking a defective part of the plurality of LED elements tested by being mounted on the strip frame; A third robot unit supporting the marker and allowing the marker to track the defective article by moving the marker in each of three axes perpendicular to each other; And a support unit installed to be accessible to and spaced apart from the strip frame so as to contact the strip frame on the opposite side of the strip frame while the marker is in contact with the defective article and marked.

According to the LED device test system of the present invention, a plurality of LED devices can be simultaneously supplied and electrical tests can be sequentially performed one by one in a state of being heated to an appropriate temperature.

Therefore, by testing whether each of the LED elements are operating normally under the actual environmental conditions used, it is possible to classify defective and regular products, thereby improving the reliability of the product.

In addition, by supplying a large number of LED elements to the company and simultaneously testing them in a heated state, the test time can be relatively shortened as compared with the high temperature test by supplying them individually, thus minimizing productivity degradation while minimizing high temperature. There is an advantage to performing tests.

In addition, by additionally providing a preheating device, there is an advantage that can further shorten the time required to heat and test the LED element.

1 is a perspective view showing the entire LED device test system according to an embodiment of the present invention.
2 is a view for explaining a strip frame.
3 is an enlarged perspective view illustrating main parts of FIG. 1.
Figure 4 is a perspective view showing a frame transfer device shown in FIG.
FIG. 5 is a perspective view illustrating the gripper unit shown in FIG. 4.
FIG. 6 is a perspective view illustrating the preheater shown in FIG. 1.
FIG. 7 is a perspective view illustrating the heating and test apparatus shown in FIG. 1.
8 is a right side view of the heating and testing apparatus shown in FIG. 7.
9 is a perspective view showing the main portion of the upper heating unit shown in FIG.
FIG. 10 is a perspective view illustrating the lower heating unit and the test unit shown in FIG. 7.
FIG. 11 is a perspective view illustrating the defective article processing apparatus shown in FIG. 1.
12 is a perspective view showing the main portion of FIG.
13 is a schematic diagram for explaining a process of heating and testing.

Hereinafter, an LED device test system according to an exemplary embodiment of the present invention will be described in detail with reference to the accompanying drawings.

1 to 12, the LED device test system 10 according to the embodiment of the present invention includes a system main body 100, an onloader 200, a frame transfer device 300, and a preheating device ( 400, a heating and testing device 500, a defective marking device 600, and an offloader 700.

The system main body 100 includes a main cabinet 110, a fixed stage 120 installed in a horizontal state at a substantially central portion of the main cabinet 110, and a transfer guide installed at an upper portion of the fixed stage 120. 130 is provided.

A protective cover (not shown) is installed outside the main body cabinet 110 to protect the LED device test work from the outside and ensure the safety of the operator. The fixed stage 120 is fixedly installed in a horizontal state at approximately the center height of the main cabinet 110, and the transfer guide 130 is fixedly installed at an upper portion thereof. The transfer guide 130 is provided with a pair of guide members (131, 132) spaced apart from each other and side by side. The strip frame 40 on which the plurality of LED elements 41 to be tested in a strip state along the pair of guide members 131 and 132 may be guided and moved from the onloader 200 to the offloader 700. . Therefore, the transfer guide 130 is installed on the on loader 200 and the off loader 700.

As shown in FIG. 1, the onloader 200 is installed at one side (left side of the drawing) of the system main body 100. The onloader 200 includes a first elevating drive unit 210, an on-loading member 220 and a frame take-out unit 240 installed on the first elevating drive unit 210 so as to be able to elevate up and down.

The on-loading member 220 may be moved up and down by the first lift driver 210, and the cassette magazine 30 may be seated in a plurality of stages. As shown in FIG. 2, a plurality of strip frames 40 on which a plurality of LEDs 41 to be tested are mounted in a strip state are stacked and received in the cassette magazine 30. The cassette magazine 30 accommodated by stacking a plurality of strip frames 40 is mounted on the onloading member 220. In the cassette magazine 30 in which the strip frame 40 is accommodated, each strip frame 40 is sequentially positioned to the loading position by lifting and lowering of the onloading member 220. Then, the strip frame 40 is pushed out from the cassette magazine 30 by the frame taking-out unit 240 one by one, and is clamped by the frame transfer device 300 (the position to be mounted on the transfer guide 130). Is moved.

1, 3, 4 and 5, the frame transfer device 300 is a first horizontal movement unit 310 is installed to be reciprocating in the horizontal direction along the transfer guide 130, And a gripper unit 320 installed on the first horizontal moving member 310 and a first robot unit 330 for reciprocating the first horizontal moving unit 310.

The first horizontal moving unit 310 includes a horizontal block 311 and a vertical block 312 connected vertically to the horizontal block 311. The first horizontal moving unit 310 is positioned on the fixed stage 120 and installed to move left and right along the transfer guide 130 and is moved by the first robot unit 330.

The gripper unit 320 is installed on the vertical block 312 of the first horizontal moving unit 310. The gripper unit 320 is a pair of grip members (321, 322) for clamping the end of the strip frame 40, which is loaded from the on-loader 200 and mounted on the transfer guide 130, and the grip member ( The interference member 323 is installed adjacent to the 322.

The pair of grip members 321 and 322 have grip portions 321a and 322a disposed up and down to face each other. Each of the grip members 321 and 322 is driven to be moved up and down by lifting blocks 325 and 326 mounted to the main lifting block 324 so that the grip members 321 and 322 can move up and down, thereby using the grip parts 321a and 322a. 40 can be selectively clamped and de-clamped. The main elevating block 324 is installed to be elevated in the vertical block 312 by a drive means including, for example, an air cylinder, and the elevating blocks 325 and 326 also support the grip members 321 and 322. In addition, the main lifting block 324 is installed to be vertically driven by driving means such as an air cylinder.

The interference member 323 is supported by the horizontal moving block 327 which is installed in the main lifting block 324 so as to be movable horizontally and is installed to reciprocate a predetermined distance in the horizontal direction. The interference member 323 is moved from the on-loader 200 to the preheater 400 by the grip members 321 and 322 to interfere with the preheated strip frame 40 and to be heated and tested along the transfer guide 130. To go to 500.

The first robot unit 330 is reciprocally slidable to the first robot driving unit 332 and the first robot driving unit 332 installed on the fixing bracket 331 is fixed to the lower portion of the fixed stage 110. It is provided with a first slider 333 which is installed so as to, and a chain unit 334 for guiding various pneumatic hoses and wires safely when the first slider 333 moves.

The first robot driver 332 includes a servo motor, a ball screw, a guide guide, and the like, and reciprocally slides the first slider 333. The first slider 333 is installed on the first robot driver 332 so as to reciprocate, and reciprocally moves the horizontal transfer unit 310 while reciprocating during the driving operation of the first robot driver 332. To this end, an upper end of the first slider 333 is connected to the horizontal transfer unit 310. In addition, one end of the chain unit 334 is connected to the first slider 333 and the other end is connected to the fixing bracket 331 so that the first slider 333 is the first horizontal moving unit 310 and the gripper unit. The load of the 320 is supported so that it can be reciprocated stably.

The preheater 400 includes an upper preheating unit 410 and a lower preheating unit 420 which are installed with the strip frame 40 moved to a preheating position therebetween.

The upper preheating unit 410 includes an upper preheating block 411, an upper lifting block 412 supporting the upper preheating block 411, and an upper supporting block to which the upper lifting block 412 is movable up and down ( 413 and the upper lifting drive unit 414 is provided. The upper preheating block 411 is provided with a heat generating portion that generates heat by electric energy therein, and is controlled to maintain a proper temperature by sensing the heat generated by a temperature sensor not shown. The upper preheating block 411 is installed in the lower portion of the upper lifting block 412, and moved up and down together with the upper lifting block 412, in contact with the strip frame 40 moved to the preheating position preheated after Ascend and separate. The upper elevating block 412 is connected to the upper support block 413 to be moved up and down by the upper elevating drive unit 414. The upper lift driver 414 may include a servo motor or a pneumatic cylinder. The upper support block 413 is fixedly installed on top of the fixing stage 110.

The lower preheating unit 420 supports the lower preheating block 421, the lower preheating block 421 and the lower lifting block 422 capable of lifting up and down, and the lower lifting block 422 to lift up and down. The lower support block 423 and the lower lifting drive unit 424 is provided.

The lower preheating block 421 is positioned below the upper preheating block 411, and is specifically positioned between the pair of guide members 131 and 132, thereby being guided along the guide members 131 and 132 to guide the lower preheating block 411. The lower part of the strip frame 40 mounted on the members 131 and 132 may be preheated in a contact state. The lower preheating block 421 is also provided with a heating element that generates heat by the electric energy therein can be drive controlled to generate heat to a desired predetermined temperature.

The lower elevating block 422 supports the lower preheating block 421 on the upper portion thereof, and is moved up and down a predetermined distance by the lower elevating driving unit 424, and is supported by the lower supporting block 423 so as to be movable upward and downward. The lower lifting driving part 424 may include at least one of a pneumatic cylinder and a servomotor.

In the preheating device 400 having the above configuration, the strip frame 40 is moved between the upper and lower preheating blocks 411 and 421 and driven to approach each other, thereby being in contact with each of the upper and lower portions of the strip frame 40. The strip frame 40 is preheated for a predetermined time. Therefore, it is possible to shorten the heating test time in the heating and testing device 500, it is possible to test a larger amount of LED in a short time.

7 to 10, the heating and test apparatus 500 includes a second robot unit 520 for reciprocating the upper heating unit 510 and the upper heating unit 510 along the transfer guide 130. And a lower heating unit 530 and a test unit 540.

The upper heating unit 510 includes an upper heating block 511, an upper lifting block 512 for supporting the upper heating block 511, and an upper support block 513 for lifting and lowering the upper lifting block 512. ), An upper elevating driving part 514 and a clamping part 515.

The upper heating block 511 is provided with a heat generating portion that generates heat by electric energy therein, and is controlled to be heated to a desired predetermined temperature. The heating block 511 is coupled to the lower portion of the upper elevating block 512 can be lifted up and down a predetermined distance, clamping the strip frame 40 moved to the heating and test position using the clamping unit 515. Are moved together until the test is completed in contact.

The upper elevating block 512 is supported by the upper elevating drive unit 514 so as to be movable up and down with respect to the upper supporting block 513. The upper lifting driver 514 may include at least one of a servo motor and a pneumatic cylinder.

The second robot unit 520 is reciprocally slidable to the second robot driver 522 and the second robot driver 522 installed on the fixing bracket 521 fixed to the upper part of the fixing stage 110. The second slider 523 is installed.

The second robot driver 522 includes a servo motor, a ball screw, a linear guide, and the like, and reciprocally slides the second slider 523 in a direction parallel to the feed guide 130. The second slider 523 is installed on the second robot driver 523 to be reciprocated, and reciprocates the upper support block 513 while reciprocating during the driving operation of the second robot driver 522. To this end, the upper support block 513 is coupled to the second slider 523. In addition, one end of the chain unit 524 is connected to the second slider 523, and the other end thereof is connected to the fixed stage 110 to protect a pneumatic wire or electric wire.

As shown in FIG. 9, the clamping part 515 may include a first contact member 515a fixed to one side of the upper heating block 511 and a transfer guide 30 on the other side of the upper heating block 511. The second contact member 515b is installed to be able to reciprocate in a parallel direction. The second contact member 515b is movable in the horizontal direction by the horizontal driving part 516 provided on the upper heating block 511. The clamping part 515 of this configuration can contact and support both ends of the strip frame 40 moved to the heating and test position by using the first and second contact members 515a and 515b as shown in FIG. 9. As the strip frame 40 clamped by the clamping unit 515 moves stepwise in parallel with the transfer guide 130, the LED elements mounted on the strip frame 40 by the test unit 540 are stepwise. Can be tested.

The lower heating unit 530 includes a lower heating block 531, a lower lifting block 532, a lower supporting block 533 and a lower lifting driving part 534 to support the lower lifting block 532 to be lifted and lowered. Equipped.

The lower heating block 531 is disposed to face each other at the bottom of the upper heating block 511, is installed on the upper of the lower elevating block 532 and moved up and down with the lower elevating block 532 heating and test position The lower portion of the strip frame 40 moved to the contact heating. The lower heating block 531 may also be provided with a heating element that generates heat by electrical energy, it is possible to maintain the desired temperature by measuring the temperature by a temperature sensor not shown.

The lower lifting block 532 is installed on the lower support block 533 so as to be capable of vertically reciprocating while supporting the lower heating block 531 thereon. The lower lifting block 532 may be reciprocated up and down by driving the lower lifting driving part 534. As shown in the drawing, the lower elevating driver 534 may include a servo motor, a ball screw, a guide guide, a pneumatic cylinder, and various known techniques.

The test unit 540 includes a test block 541 installed adjacent to the lower heating block 531, and a plurality of probe pins 542 and test blocks protruding upward from the test block 541. A guide pin 543 is installed to protrude to the top of the 541.

The test block 541 is coupled to the lower elevating block 532 to be positioned on the side of the lower heating block 531, and can be repeatedly driven up and down with the lower heating block 531 on the lower elevating block 532. have. The plurality of probe pins 542 installed to protrude above the test block 541 is for electrically testing the plurality of LEDs 41 mounted on the strip frame 40. The plurality of probe pins 542 sequentially contact a plurality of LEDs 41 mounted on one strip frame 40 a plurality of times to perform an electrical test. As described above, in order to test the entire LEDs 41 mounted on one strip frame 40 using fewer probe pins 542 than the entire LEDs 41 mounted on one strip frame 40, While the frame 40 is supported by the upper heating block 511, the upper heating unit 510 is moved step by step (maximum spacing distance of the probe pins in the moving direction of the strip frame). When the strip frame 40 is moved, the test block 541 is lowered, and when the movement of the strip frame 40 is completed, the test block 541 is raised again to contact the untested LEDs with the probe pin 542. To perform the test operation.

Here, among the LEDs 41 mounted on the strip frame 40, the untested LEDs are in contact with the upper heating block 511 and the lower heating block 531, and are continuously maintained at or above the set temperature to be electrically operated in a high temperature environment. You will be given a test.

The guide pins 543 are inserted into the positioning holes 42 formed in the strip frame 40 when the strip frame 40 approaches the test unit 540 for the test operation, thereby providing the probe pins 542 with the strip frame. It is possible to be in exact contact with the LEDs 41 mounted on the (40).

In addition, the upper and lower portions of the heating and test apparatus 500 are inverted to move the lower heating block and the test unit to the upper portion, the upper heating block to the lower portion, and the second robot unit may sequentially transfer the lower heating block. .

The strip frame 40 tested in an environment heated to a high temperature in the heating and test apparatus 500 as described above is transferred to the marking position by the defective marking apparatus 600 while being supported by the upper heating block 511. do.

Referring to FIGS. 11 and 12, the defective article processing apparatus 600 tracks and marks defective products among the plurality of LEDs 41 tested by the heating and testing apparatus 500, or removes the defective articles by pushing them from the strip frame 40. It is to. In the embodiment of the present invention will be described taking the marking on the defective product as an example.

The defective article processing apparatus 600 is a marker 610 for marking a defective article, and the marker 610 to track and mark the defective article among a plurality of LEDs 41 mounted on the strip frame 40. The third robot unit 620 for driving in each of the three axis directions orthogonal to each other and the third robot unit 620 installed in the third robot unit 620 for the interference when moving the off-loader 700, the strip frame 40 is completed And a support unit 640 for selectively contacting and supporting the lower portion of the interference frame 630 and the strip frame 40 moved to the marking position.

The marker 610 is detachably installed on the robot unit 620 and moved in three axis directions (x, y, z) perpendicular to each other by the robot unit 620 to mark the upper surface of the defective product (bad LED). can do. On the fixed stage 120, a marker seating member 611 is installed at the home position where the marker 610 is inserted after the work is finished.

The third robot unit 620 is a robot bracket 622 provided with a first shaft driver 621 and a first shaft driver 621 for elevating and driving the marker 610 in a first axis direction (z-axis direction). ) And a second axis driver 623 for reciprocating the second axis direction (y axis direction), and a third axis driver 624 for driving the second axis driver 623 in the third axis direction (x-axis direction). ).

In the present embodiment, the first shaft driver 621 is driven by an air cylinder, and the second and third shaft drivers 623 and 624 include a servo motor, a ball screw, a guide guide, and the like. It may be configured in a manner.

These driving units 621, 623, 624 are each independently driven and controlled by a control signal of a system controller, so that the marker 610 can be found and moved to mark the defective coordinates so that the marker 610 can be marked on the LED element determined as defective.

Each of the second and third axis drivers 623 and 624 has the same configuration as the second robot unit 520 described above, and may be driven by the same method, and thus detailed description thereof will be omitted. Here, the third shaft driver 624 is fixedly installed on the support block 625 installed on the fixed stage 120.

The interference unit 630 includes an interference member 631, a first interference driver 632 for reciprocating the interference member 631 in a third axial direction (x-axis direction), and a first interference driver 632. A second interference driving part 634 is provided to reciprocate the supporting block 633 in the first axis direction (z-axis direction). The interference unit 630 having the above configuration is positioned to contact the end of the strip frame 40 after the interference member 631 is lowered after the marking operation is completed at the marking position. The strip frame 40 is moved to be mounted to the magazine 30 disposed in the offloader 700 while being moved toward the offloader 700 by driving the 624.

The support unit 640 is an elevating support block 641 which is moved downwardly so as to move up and away from the strip frame 40 at the lower portion of the strip frame 40 moved to the marking position so as to support the strip frame 40 and the elevating support block ( And a support fixing block 643 installed on the fixed stage 120 to support the supporting lift driving unit 642 and the supporting lifting driving unit 642.

The lifting support block 641 is in contact with the lower portion of the strip frame 40 located in the marking position at the time of rising, when the marker 610 is lowered to mark the defective LED, the strip frame 40 by the marker 610 Even if the) is pressed, the strip frame 40 may be bent to prevent damage to the normal LED, and the LED to be marked may be supported by the lower part so that the marked LED is not separated by being pressed by the marker 610.

The support lift driver 642 may include an air cylinder, and various lifting means may be applied. The support unit 640 is installed inside the guide members 131 and 132.

The offloader 700 is for recovering the strip frame 40 that has been tested, and the offload member 720 in which a plurality of magazines 30 are stacked to collect and accommodate the strip frame 40 is second. It has a structure installed so that lifting by the lifting drive part 710 is possible. Since the offloader 700 of such a configuration generally corresponds to a well-known technical configuration, a detailed description thereof will be omitted.

In addition, in the exemplary embodiment of the present invention, the configuration having the onloader 200 and the offloader 700 has been described as an example. However, this is merely an example, and the onloader 200 and the offloader 700 may be omitted. It should also be understood that the LED device test system of the present invention may be applied to an LED manufacturing process.

In addition, in the exemplary embodiment of the present invention, the marking of the defective LED using the marker 610 has been described as an example. However, this is merely an example and uses the marker 610 or a similar configuration to the marker 610. By installing a pusher of the bad LED may be removed in advance by pushing the defective LED from the strip frame (40).

Hereinafter will be described in detail the operation and effect of the LED device test system according to an embodiment of the present invention having the above configuration.

First, the cassette magazine 30 mounted on the onloading member 220 of the onloader 200 is positioned at a loading position, and the strip strip 40 is frame-transmitted by the frame ejection unit 240. It is mounted on the pair of guide members 131 and 132 to be positioned at the position clamped to the 300.

Next, the frame conveying apparatus 300 moves toward the on-loader 200 and clamps one end of the strip frame 40 using the grip members 321 and 322, and clamps the strip as shown in FIG. 5. The frame 40 is transferred to the preheater 400.

When the strip frame 40 is transferred to the preheater 400, the upper preheating block 411 is lowered and the lower preheating block 421 is raised to preheat in a state of being in contact with the upper and lower portions of the strip frame 40. . At this time, by installing a separate temperature sensor can be controlled to maintain the preheating temperature at an appropriate temperature (for example about 150 ℃).

The strip frame 40 preheated to the proper temperature in the preheater 400 is heated and heated by the interference member 323 while the frame transfer device 300 is moved to the heating and test position. The test apparatus 500 is moved to a position corresponding to the test apparatus 500, that is, a heating and test position.

When the strip frame 40 is moved to the heating and test position in the preheated state, the upper heating block 511 is lowered to contact the upper part of the strip frame 40, as shown in FIG. The clamping unit 515 operates to clamp the strip frame 40.

In the state where the clamping unit 515 clamps the strip frame 40 as described above, the upper heating block 511 is fixed at a predetermined unit time and intervals as shown in FIGS. 13A, 13B, and 13C. Repeated movement and raising and lowering movement in the direction (A) of the on-loader 700, and when the upper heating block 511 is lowered, the LED before the test is in contact with the upper heating block 511 and the lower heating block 531. And heated, and the LED element in contact with the probe pin 542 of the test unit 540 is subjected to an electrical test. At this time, the guide pins 543 are complementarily coupled to the guide holes formed in the strip frame 40 so that the probe pins 542 and the LEDs 41 may be positioned to be exactly coincident with each other so that the test pins may be tested in an electrically contacted state. It becomes possible.

When the test for the plurality of LED elements 41 mounted on one strip frame 40 is completed a plurality of times by repeating the heating and test operation as shown in FIG. 13, the clamping part 515 is clamped. The defective product is moved to the marking position.

When the strip frame 40 is moved to the marking position, the marker 61 is adjusted by the operation of the third robot unit 620 so as to track the LED determined to be defective. The position of the defective product is obtained during the test process in the test unit 540, which is performed, the position information of the obtained defective product is transmitted to the system controller, and the system controller controls the third robot unit 620 to drive the defective product. Allow marking on the

In addition, the strip frame 40 for which the marking work for the defective product is completed is pushed toward the offloader 700 by the operation of the third robot unit 620 in the state of being interfered by the interference unit 630 and mounted on the offloader 700. Mounted on the cassette magazine 30, the heating and testing process is completed.

As described above, according to the LED device test system according to an exemplary embodiment of the present invention, the LED devices are arranged in a strip state in the strip frame 40 so as to be preheated and heated at the same time to maintain the high temperature environment. An electrical test is done at.

Therefore, the electrical test is performed in the high temperature state at the time of driving rather than the room temperature state, and thus it is possible to find a defective product that performs abnormal operation in actual use, thereby improving the reliability of the product.

In addition, instead of heating and testing the LED elements 41 one by one, a plurality of strips are installed on the frame 40 to simultaneously perform heating and test operations, thereby shortening the heating and testing time, thereby increasing productivity. There is this.

In addition, the preheating device 400 is further provided to shorten the heating time in the heating and testing device 500, thereby reducing the product high temperature test process time, thereby increasing productivity.

On the other hand, in the embodiment of the present invention has been described with an example to supply the strip frame 40 so that the light emitting portion of the LED element 41 to the upper side, this is merely illustrative, the light of the LED element 41 The strip frame 40 is supplied in an inverted state so that the radiating part faces downward, and in this state, preheating, heating, testing, and marking operations may be performed.

In addition, in the embodiment of the present invention, the upper heating unit 510 is reciprocated along the transfer guide 130 by the second robot unit 520, the lower heating unit 530 is moved up and down and the test unit 540 Although connected to the lower heating unit 530 has been described as an example, this is merely illustrative.

That is, the upper heating unit 510 is installed to move up and down, and the lower heating unit 530 is installed to reciprocate along the transfer guide 130 and connected to the test unit 540 to the lower heating unit 530. May be reciprocated together. In this case, the strip frame 40 is moved up and down while being clamped to the upper heating unit 510, and the lower heating unit 530 and the test unit 540 are moved along the transfer guide 130 step by step to test unit ( Probe pins 542 of 540 may be tested by stepping the LED elements 41 mounted on the strip frame 40 step by step.

In addition, the strip frame 40 can be reciprocated along the transfer guide 130 while being clamped to the lower heating unit 530, and the lifting unit moves up and down with the test unit 540 mounted on the upper heating unit 510. Naturally, the LED element 41 on the lower heating unit 530 clamped strip frame 40, which is moved in stages, may be tested.

As such, it should be understood by those skilled in the art that the heating and testing apparatus 500 may be various embodiments.

In addition, in the exemplary embodiment of the present invention, the test unit 540 is supported by the lower heating unit 530 to be moved up and down as an example, but this is merely illustrative, and the test unit 540 is a lower heating unit ( It is installed adjacent to the 530, it may be installed so as to move independently lift independently of the lower heating unit (530).

While the invention has been shown and described in connection with preferred embodiments for illustrating the principles of the invention, the invention is not limited to the construction and operation as shown and described. Those skilled in the art will readily appreciate that many modifications and variations of the present invention are possible without departing from the spirit and scope of the appended claims.

10. LED test system 30. Cassette magazine
40.Strip frame 41.LED element
100. System body 130. Transfer guide
200. On-loader 300. Frame feeder
400. Preheater 500. Heating and tester
600. Defective device 700. Offloader

Claims (8)

A system body provided with a transfer guide for guiding movement of a strip frame in which a plurality of LED elements are mounted in a strip state;
A frame conveying apparatus for conveying the strip frame along the conveying guide through an onloader of one side of the system main body;
A heating and testing device for heating and testing the LED elements on the strip frame transferred by the frame feeding device;
Includes; defective processing device for marking the LED element identified as defective in the heating and testing device or separated from the strip frame,
It further comprises a preheating device for preheating to a suitable temperature in advance before the strip frame is transferred to the heating and test device,
The preheater,
An LED device test comprising an upper and a lower preheating unit which are installed to be accessible and spaced apart from each other with the strip frame supported by the frame transfer device interposed therebetween, and in contact with the strip frame to preheat both sides. system. delete delete According to claim 1, wherein the frame transfer device,
A first horizontal moving unit installed to reciprocate along the transfer guide;
A gripper unit installed on the first horizontal moving unit; And
And a first robot unit for reciprocating the first horizontal moving unit.
The gripper unit,
A pair of grip members which are installed to be approached and spaced apart from each other to clamp the strip frame loaded from the onloader to the transfer guide, and are installed to be movable in a horizontal direction adjacent to the pair of grip members; And an interference member for pushing the preheated strip frame from the preheater to the heating and test apparatus. According to claim 1, wherein the heating and testing device,
An upper heating unit for heating one surface of the strip frame moved to the heating and test position along the transfer guide;
A lower heating unit for heating the other surface of the strip frame to correspond to the upper heating unit;
A second robot unit reciprocating one of the upper heating unit and the lower heating unit along the transfer guide; And
And a test unit installed in one of the upper heating unit and the lower heating unit to test the LED element mounted on the strip frame.
The heating unit of any one of the upper and lower heating units is sequentially clamped in contact with the strip frame to be moved to the test position by the second robot unit, and the remaining heating units are installed to be liftable and clamped. In contact with the strip frame to heat it,
The test unit is mounted to the elevating, LED device test system, characterized in that it has a plurality of probe pins to test the contact with a plurality of LED elements when approaching the strip frame moved to the test position. The method of claim 5,
The upper heating unit is installed to reciprocate along the transfer guide by the second robot unit,
The lower heating unit is installed to move up and down,
The test unit is an LED device test system, characterized in that installed in the lifting movement adjacent to the lower heating unit. The method according to claim 6,
The test unit is connected to the lower heating unit and moved together during the lifting motion of the heating unit, and when raised, the test unit contacts some of the plurality of LED elements mounted on the strip frame supported by the upper heating unit to sequentially perform an electrical test. LED device test system, characterized in that. According to claim 1, The defective article processing apparatus,
A marker for marking a defective product among a plurality of LED elements mounted on the strip frame and tested;
A third robot unit supporting the marker and allowing the marker to track the defective article by moving the marker in each of three axes perpendicular to each other;
And a support unit installed to be accessible to and spaced apart from the strip frame so as to contact the strip frame on the opposite side of the strip frame while the marker is in contact with the defective part and marked.

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