KR101225519B1 - 반사가 감소된 신호 모듈 - Google Patents

반사가 감소된 신호 모듈 Download PDF

Info

Publication number
KR101225519B1
KR101225519B1 KR1020077015842A KR20077015842A KR101225519B1 KR 101225519 B1 KR101225519 B1 KR 101225519B1 KR 1020077015842 A KR1020077015842 A KR 1020077015842A KR 20077015842 A KR20077015842 A KR 20077015842A KR 101225519 B1 KR101225519 B1 KR 101225519B1
Authority
KR
South Korea
Prior art keywords
dielectric
conductor
electromagnetic
signal
conductors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020077015842A
Other languages
English (en)
Korean (ko)
Other versions
KR20070090243A (ko
Inventor
윌리엄 마이클 브룩스
안토 부
Original Assignee
인테스트 코포레이션
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 인테스트 코포레이션 filed Critical 인테스트 코포레이션
Publication of KR20070090243A publication Critical patent/KR20070090243A/ko
Application granted granted Critical
Publication of KR101225519B1 publication Critical patent/KR101225519B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Details Of Connecting Devices For Male And Female Coupling (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Control Of Motors That Do Not Use Commutators (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Light Receiving Elements (AREA)
  • Led Device Packages (AREA)
  • Input Circuits Of Receivers And Coupling Of Receivers And Audio Equipment (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Measuring Pulse, Heart Rate, Blood Pressure Or Blood Flow (AREA)
KR1020077015842A 2004-12-13 2005-12-09 반사가 감소된 신호 모듈 Expired - Fee Related KR101225519B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US63564204P 2004-12-13 2004-12-13
US60/635,642 2004-12-13
PCT/US2005/044730 WO2006065669A1 (en) 2004-12-13 2005-12-09 Signal module with reduced reflections

Publications (2)

Publication Number Publication Date
KR20070090243A KR20070090243A (ko) 2007-09-05
KR101225519B1 true KR101225519B1 (ko) 2013-01-24

Family

ID=36168623

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020077015842A Expired - Fee Related KR101225519B1 (ko) 2004-12-13 2005-12-09 반사가 감소된 신호 모듈

Country Status (8)

Country Link
US (1) US7834718B2 (https=)
EP (1) EP1825282B1 (https=)
JP (1) JP5185625B2 (https=)
KR (1) KR101225519B1 (https=)
CN (1) CN100593726C (https=)
AT (1) ATE451623T1 (https=)
DE (1) DE602005018255D1 (https=)
WO (1) WO2006065669A1 (https=)

Families Citing this family (61)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9910144B2 (en) 2013-03-07 2018-03-06 Cpg Technologies, Llc Excitation and use of guided surface wave modes on lossy media
US9912031B2 (en) 2013-03-07 2018-03-06 Cpg Technologies, Llc Excitation and use of guided surface wave modes on lossy media
US9941566B2 (en) 2014-09-10 2018-04-10 Cpg Technologies, Llc Excitation and use of guided surface wave modes on lossy media
US9960470B2 (en) * 2014-09-11 2018-05-01 Cpg Technologies, Llc Site preparation for guided surface wave transmission in a lossy media
US9887556B2 (en) 2014-09-11 2018-02-06 Cpg Technologies, Llc Chemically enhanced isolated capacitance
US10175203B2 (en) 2014-09-11 2019-01-08 Cpg Technologies, Llc Subsurface sensing using guided surface wave modes on lossy media
US10498393B2 (en) 2014-09-11 2019-12-03 Cpg Technologies, Llc Guided surface wave powered sensing devices
US10074993B2 (en) 2014-09-11 2018-09-11 Cpg Technologies, Llc Simultaneous transmission and reception of guided surface waves
US9893402B2 (en) 2014-09-11 2018-02-13 Cpg Technologies, Llc Superposition of guided surface waves on lossy media
US10079573B2 (en) 2014-09-11 2018-09-18 Cpg Technologies, Llc Embedding data on a power signal
US10027116B2 (en) 2014-09-11 2018-07-17 Cpg Technologies, Llc Adaptation of polyphase waveguide probes
US9859707B2 (en) 2014-09-11 2018-01-02 Cpg Technologies, Llc Simultaneous multifrequency receive circuits
US9887557B2 (en) 2014-09-11 2018-02-06 Cpg Technologies, Llc Hierarchical power distribution
US10101444B2 (en) 2014-09-11 2018-10-16 Cpg Technologies, Llc Remote surface sensing using guided surface wave modes on lossy media
US10033198B2 (en) 2014-09-11 2018-07-24 Cpg Technologies, Llc Frequency division multiplexing for wireless power providers
US9887587B2 (en) 2014-09-11 2018-02-06 Cpg Technologies, Llc Variable frequency receivers for guided surface wave transmissions
US10001553B2 (en) 2014-09-11 2018-06-19 Cpg Technologies, Llc Geolocation with guided surface waves
US9882397B2 (en) 2014-09-11 2018-01-30 Cpg Technologies, Llc Guided surface wave transmission of multiple frequencies in a lossy media
US9859658B2 (en) * 2015-05-14 2018-01-02 Te Connectivity Corporation Electrical connector having resonance controlled ground conductors
US10193595B2 (en) 2015-06-02 2019-01-29 Cpg Technologies, Llc Excitation and use of guided surface waves
US9923385B2 (en) 2015-06-02 2018-03-20 Cpg Technologies, Llc Excitation and use of guided surface waves
WO2017044268A1 (en) 2015-09-08 2017-03-16 Cpg Technologies, Llc. Long distance transmission of offshore power
US9997040B2 (en) 2015-09-08 2018-06-12 Cpg Technologies, Llc Global emergency and disaster transmission
US9887585B2 (en) 2015-09-08 2018-02-06 Cpg Technologies, Llc Changing guided surface wave transmissions to follow load conditions
US9857402B2 (en) 2015-09-08 2018-01-02 CPG Technologies, L.L.C. Measuring and reporting power received from guided surface waves
US9921256B2 (en) 2015-09-08 2018-03-20 Cpg Technologies, Llc Field strength monitoring for optimal performance
US9882436B2 (en) 2015-09-09 2018-01-30 Cpg Technologies, Llc Return coupled wireless power transmission
US10031208B2 (en) 2015-09-09 2018-07-24 Cpg Technologies, Llc Object identification system and method
WO2017044281A1 (en) * 2015-09-09 2017-03-16 Cpg Technologies, Llc Guided surface waveguide probes
US10033197B2 (en) 2015-09-09 2018-07-24 Cpg Technologies, Llc Object identification system and method
US9887558B2 (en) 2015-09-09 2018-02-06 Cpg Technologies, Llc Wired and wireless power distribution coexistence
US9496921B1 (en) 2015-09-09 2016-11-15 Cpg Technologies Hybrid guided surface wave communication
US9927477B1 (en) 2015-09-09 2018-03-27 Cpg Technologies, Llc Object identification system and method
US9916485B1 (en) 2015-09-09 2018-03-13 Cpg Technologies, Llc Method of managing objects using an electromagnetic guided surface waves over a terrestrial medium
JP2018527104A (ja) 2015-09-09 2018-09-20 シーピージー テクノロジーズ、 エルエルシーＣｐｇ Ｔｅｃｈｎｏｌｏｇｉｅｓ， Ｌｌｃ 誘導表面波を用いた電力体内医療デバイス
US10205326B2 (en) 2015-09-09 2019-02-12 Cpg Technologies, Llc Adaptation of energy consumption node for guided surface wave reception
US9973037B1 (en) 2015-09-09 2018-05-15 Cpg Technologies, Llc Object identification system and method
JP2018534897A (ja) 2015-09-09 2018-11-22 シーピージー テクノロジーズ、 エルエルシーＣｐｇ Ｔｅｃｈｎｏｌｏｇｉｅｓ， Ｌｌｃ 誘導表面波電力供給系における負荷制限
US10027131B2 (en) 2015-09-09 2018-07-17 CPG Technologies, Inc. Classification of transmission
US10063095B2 (en) 2015-09-09 2018-08-28 CPG Technologies, Inc. Deterring theft in wireless power systems
WO2017044280A1 (en) * 2015-09-09 2017-03-16 Cpg Technologies, Llc. Guided surface waveguide probes
US10312747B2 (en) 2015-09-10 2019-06-04 Cpg Technologies, Llc Authentication to enable/disable guided surface wave receive equipment
US10408916B2 (en) * 2015-09-10 2019-09-10 Cpg Technologies, Llc Geolocation using guided surface waves
US10559893B1 (en) * 2015-09-10 2020-02-11 Cpg Technologies, Llc Pulse protection circuits to deter theft
US10324163B2 (en) 2015-09-10 2019-06-18 Cpg Technologies, Llc Geolocation using guided surface waves
US10103452B2 (en) 2015-09-10 2018-10-16 Cpg Technologies, Llc Hybrid phased array transmission
US10193229B2 (en) 2015-09-10 2019-01-29 Cpg Technologies, Llc Magnetic coils having cores with high magnetic permeability
JP2018530291A (ja) * 2015-09-10 2018-10-11 シーピージー テクノロジーズ、 エルエルシーＣｐｇ Ｔｅｃｈｎｏｌｏｇｉｅｓ， Ｌｌｃ 誘導表面波を用いたグローバル時刻同期
CN108352723A (zh) 2015-09-10 2018-07-31 Cpg技术有限责任公司 移动引导表面波导探头和接收器
US10396566B2 (en) 2015-09-10 2019-08-27 Cpg Technologies, Llc Geolocation using guided surface waves
US10498006B2 (en) 2015-09-10 2019-12-03 Cpg Technologies, Llc Guided surface wave transmissions that illuminate defined regions
HK1253393A1 (zh) 2015-09-10 2019-06-14 Cpg技术有限责任公司 使用引导表面波的地理定位
US10408915B2 (en) 2015-09-10 2019-09-10 Cpg Technologies, Llc Geolocation using guided surface waves
EA201890711A1 (ru) 2015-09-11 2018-09-28 Сипиджи Текнолоджиз, Элэлси. Глобальное умножение электрической мощности
HK1253398A1 (zh) 2015-09-11 2019-06-14 Cpg技术有限责任公司 增强的引导表面波导探头
US10560147B1 (en) 2017-03-07 2020-02-11 Cpg Technologies, Llc Guided surface waveguide probe control system
US10630111B2 (en) 2017-03-07 2020-04-21 Cpg Technologies, Llc Adjustment of guided surface waveguide probe operation
US10559866B2 (en) 2017-03-07 2020-02-11 Cpg Technologies, Inc Measuring operational parameters at the guided surface waveguide probe
US10559867B2 (en) 2017-03-07 2020-02-11 Cpg Technologies, Llc Minimizing atmospheric discharge within a guided surface waveguide probe
US10581492B1 (en) 2017-03-07 2020-03-03 Cpg Technologies, Llc Heat management around a phase delay coil in a probe
US20200190192A1 (en) 2017-03-07 2020-06-18 Sutro Biopharma, Inc. Pd-1/tim-3 bi-specific antibodies, compositions thereof, and methods of making and using the same

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11250996A (ja) * 1997-12-17 1999-09-17 Berg Technol Inc レセプタクル

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3310358A (en) 1963-05-01 1967-03-21 Bell Telephone Labor Inc Conical lens focusing means for tmon modes
US3437960A (en) 1966-03-30 1969-04-08 Amp Inc Dielectric bead structure for coaxial connectors
DE2020173C3 (de) * 1970-04-24 1981-01-08 Spinner-Gmbh Elektrotechnische Fabrik, 8000 Muenchen Isolierstützenanordnung in Koaxialleitungen
US3750086A (en) * 1972-01-03 1973-07-31 Gen Tel Co Calif Rapid connector
EP0465845A3 (en) 1990-06-15 1992-06-10 Asea Brown Boveri Ag Microwave window
US5269702A (en) 1992-10-23 1993-12-14 Helmut Bacher Coaxial support structure
WO2002007265A1 (en) 2000-07-13 2002-01-24 Rika Electronics International, Inc. Contact apparatus particularly useful with test equipment
DE10164799B4 (de) * 2001-03-21 2006-03-30 Audioton Kabelwerk Gmbh Mobiltelefoneinrichtung mit mehradrigen elektrischen Verbindungseinrichtungen
US6844738B2 (en) 2001-12-10 2005-01-18 Intel Corporation Coaxial radio frequency adapter and method

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11250996A (ja) * 1997-12-17 1999-09-17 Berg Technol Inc レセプタクル

Also Published As

Publication number Publication date
EP1825282B1 (en) 2009-12-09
EP1825282A1 (en) 2007-08-29
DE602005018255D1 (de) 2010-01-21
JP2008523411A (ja) 2008-07-03
HK1111465A1 (en) 2008-08-08
US20080273201A1 (en) 2008-11-06
CN101080643A (zh) 2007-11-28
JP5185625B2 (ja) 2013-04-17
WO2006065669A1 (en) 2006-06-22
US7834718B2 (en) 2010-11-16
CN100593726C (zh) 2010-03-10
ATE451623T1 (de) 2009-12-15
KR20070090243A (ko) 2007-09-05

Similar Documents

Publication Publication Date Title
KR101225519B1 (ko) 반사가 감소된 신호 모듈
US20060258187A1 (en) Impedance controlled via structure
US20030001587A1 (en) Test structure apparatus and method
US7659790B2 (en) High speed signal transmission line having reduced thickness regions
US6515499B1 (en) Modular semiconductor tester interface assembly for high performance coaxial connections
US4980636A (en) Universal nondestructive MM-wave integrated circuit test fixture
US6236287B1 (en) Wideband shielded coaxial to microstrip orthogonal launcher using distributed discontinuities
CN100499270C (zh) 高频边缘安装连接器
CN111279203B (zh) 测试装置
US6791317B1 (en) Load board for testing of RF chips
US10249989B2 (en) Mitigation of connector stub resonance
CN114791554A (zh) 用于集成电路器件测试工具的具有阻抗调谐的混合屏蔽插座
US11204368B2 (en) Inspection device
US20040002232A1 (en) Electrical cable interconnections for reduced impedance mismatches
CN112540281B (zh) 测试装置
US20170162926A1 (en) Printed circuit integrated broadband directional bridge
EP1316806A1 (en) Non-contact measuring probe device for directional detection of an electromagnetic wave and measuring method
EP1424565A1 (en) Method of and device for determining the transfer function of a connection on a printed circuit board
US6518853B1 (en) Wideband compact large step circular waveguide transition apparatus
US11624764B1 (en) Flange mount coaxial connector system
US7423497B2 (en) Device for coupling suspended stripline and NRD guides
US20030062914A1 (en) Surface mating compliant contact assembly with fixed signal path length
CN112540282B (zh) 测试装置
HK1111465B (en) Signal module with reduced reflections
CN220368259U (zh) 用于测试通道物理层c-phy信号的接口板及装置

Legal Events

Date Code Title Description
PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

AMND Amendment
P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

A201 Request for examination
AMND Amendment
P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

AMND Amendment
E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E601 Decision to refuse application
PE0601 Decision on rejection of patent

St.27 status event code: N-2-6-B10-B15-exm-PE0601

AMND Amendment
J201 Request for trial against refusal decision
P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PJ0201 Trial against decision of rejection

St.27 status event code: A-3-3-V10-V11-apl-PJ0201

PB0901 Examination by re-examination before a trial

St.27 status event code: A-6-3-E10-E12-rex-PB0901

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

B701 Decision to grant
PB0701 Decision of registration after re-examination before a trial

St.27 status event code: A-3-4-F10-F13-rex-PB0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U12-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000

FPAY Annual fee payment

Payment date: 20151230

Year of fee payment: 4

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

FPAY Annual fee payment

Payment date: 20161229

Year of fee payment: 5

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

LAPS Lapse due to unpaid annual fee
PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20180118

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20180118

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000