KR101143094B1 - 화상 감지기 및 카메라 - Google Patents

화상 감지기 및 카메라 Download PDF

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Publication number
KR101143094B1
KR101143094B1 KR1020067022518A KR20067022518A KR101143094B1 KR 101143094 B1 KR101143094 B1 KR 101143094B1 KR 1020067022518 A KR1020067022518 A KR 1020067022518A KR 20067022518 A KR20067022518 A KR 20067022518A KR 101143094 B1 KR101143094 B1 KR 101143094B1
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KR
South Korea
Prior art keywords
image
noise
hold circuit
sample
capacitor
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KR1020067022518A
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Korean (ko)
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KR20070007860A (ko
Inventor
웨이즈 수
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옴니비전 테크놀러지즈 인코포레이티드
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/65—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to reset noise, e.g. KTC noise related to CMOS structures by techniques other than CDS
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/80—Camera processing pipelines; Components thereof
    • H04N23/81—Camera processing pipelines; Components thereof for suppressing or minimising disturbance in the image signal generation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/767—Horizontal readout lines, multiplexers or registers

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Picture Signal Circuits (AREA)
KR1020067022518A 2004-04-30 2005-04-27 화상 감지기 및 카메라 Expired - Lifetime KR101143094B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/836,884 US7385636B2 (en) 2004-04-30 2004-04-30 Low noise sample and hold circuit for image sensors
US10/836,884 2004-04-30
PCT/US2005/014451 WO2005117418A1 (en) 2004-04-30 2005-04-27 Low noise sample and hold circuit

Publications (2)

Publication Number Publication Date
KR20070007860A KR20070007860A (ko) 2007-01-16
KR101143094B1 true KR101143094B1 (ko) 2012-05-10

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020067022518A Expired - Lifetime KR101143094B1 (ko) 2004-04-30 2005-04-27 화상 감지기 및 카메라

Country Status (7)

Country Link
US (1) US7385636B2 (enExample)
EP (1) EP1741287A1 (enExample)
JP (1) JP4682191B2 (enExample)
KR (1) KR101143094B1 (enExample)
CN (2) CN100479498C (enExample)
TW (1) TWI363561B (enExample)
WO (1) WO2005117418A1 (enExample)

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US7372493B2 (en) * 2004-07-12 2008-05-13 Micron Technology, Inc. Column-wise clamp voltage driver for suppression of noise in an imager
US20060187329A1 (en) * 2005-02-24 2006-08-24 Micron Technology, Inc. Clamped capacitor readout noise rejection circuit for imagers
US7701493B2 (en) * 2005-02-28 2010-04-20 Micron Technology, Inc. Imager row-wise noise correction
US7916186B2 (en) 2005-04-07 2011-03-29 Micron Technology, Inc. Anti-eclipse circuitry with tracking of floating diffusion reset level
US7864229B2 (en) * 2005-12-08 2011-01-04 Samsung Electronics Co., Ltd. Analog to digital converting device and image pickup device for canceling noise, and signal processing method thereof
KR100746197B1 (ko) * 2005-12-08 2007-08-06 삼성전자주식회사 공급 전원 및 스위칭 노이즈를 제거할 수 있는 이미지센서의 기준 전압 발생기, 칼럼 아날로그-디지털 변환장치, 이미지 센서, 및 칼럼 아날로그-디지털 변환방법
US7652706B2 (en) * 2006-02-15 2010-01-26 Eastman Kodak Company Pixel analog-to-digital converter using a ramped transfer gate clock
US7593050B2 (en) 2006-02-27 2009-09-22 Eastman Kodak Company Delay management circuit for reading out large S/H arrays
WO2008150283A1 (en) * 2007-05-21 2008-12-11 Micron Technology, Inc. Suppression of row-wise noise in cmos image sensors
TWI401944B (zh) * 2007-06-13 2013-07-11 Novatek Microelectronics Corp 用於視訊處理系統之雜訊消除裝置
US7755689B2 (en) * 2007-10-05 2010-07-13 Teledyne Licensing, Llc Imaging system with low noise pixel array column buffer
US8482639B2 (en) * 2008-02-08 2013-07-09 Omnivision Technologies, Inc. Black reference pixel for backside illuminated image sensor
JP5426220B2 (ja) * 2009-04-13 2014-02-26 株式会社東芝 電源ノイズ除去回路
US8411184B2 (en) * 2009-12-22 2013-04-02 Omnivision Technologies, Inc. Column output circuits for image sensors
US8233066B2 (en) * 2010-02-18 2012-07-31 Omnivision Technologies, Inc. Image sensor with improved black level calibration
CN102316280B (zh) * 2010-06-30 2013-09-04 格科微电子（上海）有限公司 图像传感器及消除图像传感器电源噪声的方法
US8338856B2 (en) 2010-08-10 2012-12-25 Omnivision Technologies, Inc. Backside illuminated image sensor with stressed film
US8830361B2 (en) * 2012-04-12 2014-09-09 Taiwan Semiconductor Manufacturing Company, Ltd. Method of reducing column fixed pattern noise
KR102155480B1 (ko) * 2014-07-07 2020-09-14 삼성전자 주식회사 이미지 센서, 이를 포함하는 이미지 처리 시스템, 및 이를 포함하는 휴대용 전자 장치
CN104703096B (zh) * 2015-02-28 2018-08-31 联想(北京)有限公司 一种噪音消除方法及电子设备
US9960783B2 (en) 2015-09-18 2018-05-01 Taiwan Semiconductor Manufacturing Company Ltd. Conditional correlated multiple sampling single slope analog-to-digital converter, and associated image sensor system and method
US9967496B2 (en) * 2016-06-30 2018-05-08 Sony Corporation Active reset circuit for reset spread reduction in single-slope ADC
CN108496358B (zh) * 2018-04-13 2020-10-16 深圳市汇顶科技股份有限公司 图像传感电路及其控制方法
WO2022011615A1 (zh) * 2020-07-15 2022-01-20 深圳市汇顶科技股份有限公司 图像传感器、图像生成的方法和电子设备
CN111885323B (zh) * 2020-07-15 2023-03-14 深圳市汇顶科技股份有限公司 图像传感器、图像生成的方法和电子设备
CN115134479B (zh) * 2022-06-28 2025-06-27 维沃移动通信有限公司 感光电路、图像处理方法及电子设备

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US20020036700A1 (en) * 2000-09-25 2002-03-28 Merrill Richard B. Active pixel sensor with noise cancellation

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US5144444A (en) * 1991-06-05 1992-09-01 Eastman Kodak Company Method and apparatus for improving the output response of an electronic imaging system
US5329312A (en) * 1992-08-17 1994-07-12 Eastman Kodak Company DC level control circuitry for CCD images
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US5467130A (en) * 1994-10-28 1995-11-14 Eastman Kodak Company Ground driven delay line correlator
US5933189A (en) * 1995-03-09 1999-08-03 Nikon Corporation Solid state image pickup apparatus
JP3031606B2 (ja) * 1995-08-02 2000-04-10 キヤノン株式会社 固体撮像装置と画像撮像装置
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US5872470A (en) * 1996-11-29 1999-02-16 Varian Associates, Inc. Pipelined sample and hold circuit with correlated double sampling
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WO1999007138A1 (en) * 1997-07-31 1999-02-11 Ppt Vision, Inc. Digital correlated double sample camera
US20020036700A1 (en) * 2000-09-25 2002-03-28 Merrill Richard B. Active pixel sensor with noise cancellation

Also Published As

Publication number Publication date
EP1741287A1 (en) 2007-01-10
TW200605651A (en) 2006-02-01
CN101494728B (zh) 2011-04-06
WO2005117418A1 (en) 2005-12-08
US20050243194A1 (en) 2005-11-03
JP2007535871A (ja) 2007-12-06
TWI363561B (en) 2012-05-01
CN100479498C (zh) 2009-04-15
US7385636B2 (en) 2008-06-10
CN101494728A (zh) 2009-07-29
KR20070007860A (ko) 2007-01-16
JP4682191B2 (ja) 2011-05-11
CN1951104A (zh) 2007-04-18

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