KR101075149B1 - 태양전지 및 그 제조방법 - Google Patents
태양전지 및 그 제조방법 Download PDFInfo
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- KR101075149B1 KR101075149B1 KR1020090117817A KR20090117817A KR101075149B1 KR 101075149 B1 KR101075149 B1 KR 101075149B1 KR 1020090117817 A KR1020090117817 A KR 1020090117817A KR 20090117817 A KR20090117817 A KR 20090117817A KR 101075149 B1 KR101075149 B1 KR 101075149B1
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- Prior art keywords
- layer
- quantum dot
- substrate
- thin film
- forming
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- 238000000034 method Methods 0.000 title claims abstract description 25
- 239000002096 quantum dot Substances 0.000 claims abstract description 86
- 239000000758 substrate Substances 0.000 claims abstract description 52
- 239000000463 material Substances 0.000 claims abstract description 38
- 239000010409 thin film Substances 0.000 claims abstract description 31
- 238000004519 manufacturing process Methods 0.000 claims abstract description 18
- 238000000151 deposition Methods 0.000 claims abstract description 15
- 239000010408 film Substances 0.000 claims abstract description 7
- 238000004381 surface treatment Methods 0.000 claims abstract description 4
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 9
- 229910052698 phosphorus Inorganic materials 0.000 claims description 8
- 239000011574 phosphorus Substances 0.000 claims description 8
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 5
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims description 4
- 229910002367 SrTiO Inorganic materials 0.000 claims description 4
- 229910010413 TiO 2 Inorganic materials 0.000 claims description 4
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 claims description 4
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Inorganic materials [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 claims description 4
- 239000005368 silicate glass Substances 0.000 claims description 3
- 230000008569 process Effects 0.000 abstract description 10
- 230000005611 electricity Effects 0.000 abstract description 8
- 238000001228 spectrum Methods 0.000 abstract description 4
- 238000000926 separation method Methods 0.000 abstract description 2
- 238000010248 power generation Methods 0.000 abstract 1
- 239000010410 layer Substances 0.000 description 140
- 238000009792 diffusion process Methods 0.000 description 7
- 239000002356 single layer Substances 0.000 description 6
- 238000010438 heat treatment Methods 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 230000004913 activation Effects 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- RLOWWWKZYUNIDI-UHFFFAOYSA-N phosphinic chloride Chemical compound ClP=O RLOWWWKZYUNIDI-UHFFFAOYSA-N 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 229910004205 SiNX Inorganic materials 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000004093 laser heating Methods 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 229910021423 nanocrystalline silicon Inorganic materials 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000004054 semiconductor nanocrystal Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 230000005476 size effect Effects 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 238000000844 transformation Methods 0.000 description 1
- 238000001429 visible spectrum Methods 0.000 description 1
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/14—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
- H10F77/143—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies comprising quantum structures
- H10F77/1433—Quantum dots
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/121—The active layers comprising only Group IV materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/30—Coatings
- H10F77/306—Coatings for devices having potential barriers
- H10F77/311—Coatings for devices having potential barriers for photovoltaic cells
- H10F77/315—Coatings for devices having potential barriers for photovoltaic cells the coatings being antireflective or having enhancing optical properties
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/40—Optical elements or arrangements
- H10F77/413—Optical elements or arrangements directly associated or integrated with the devices, e.g. back reflectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/70—Surface textures, e.g. pyramid structures
- H10F77/703—Surface textures, e.g. pyramid structures of the semiconductor bodies, e.g. textured active layers
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Photovoltaic Devices (AREA)
Abstract
Description
Claims (14)
- 태양광의 반사율을 최소화하기 위한 표면처리가 이루어진 기판과,상기 기판의 표면에 박막물질을 증착시켜 형성되는 양자점층과,상기 양자점층의 상부에 형성되는 n-접합층과,상기 n-접합층에 형성되어 상기 양자점층으로 입사된 태양광에 의해 분리된 전하가 이동하는 에미터와,상기 n-접합층 및 상기 에미터 상부에 형성되어 태양광선의 반사를 막는 반사 방지막을 포함하며,상기 양자점층은 기판과 원자 크기가 다른 박막물질을 원자섬 형태로 초기 성장시켜 형성되는 것을 특징으로 하는 태양전지.
- 청구항 1에 있어서,상기 양자점층은 밴드갭 에너지가 다른 양자점층들을 다층구조로 적층하여 형성된 것을 특징으로 하는 태양전지.
- 삭제
- 청구항 1 또는 청구항 2에 있어서,상기 양자점층은 각층의 두께가 1 내지 20 nm인 것을 특징으로 하는 태양전지.
- 청구항 1 또는 청구항 2에 있어서,상기 박막물질은 SiO2, SiNx, SiO, Al2O3, MgO, SrTiO3, Ta3O5, TiO2, MgF2, ZnO, ITO 및 Si 중 적어도 하나 이상을 포함하는 것을 특징으로 하는 태양전지.
- 기판을 마련하는 단계와,기판 표면으로 입사하는 태양광선의 반사율을 최소화하기 위해 기판의 표면을 표면처리하는 단계와,표면처리된 기판에 박막물질을 증착시켜 양자점층을 형성하는 단계와,상기 양자점층에 n-접합층을 형성하는 단계와,상기 n-접합층을 열처리하여 에미터(emitter) 층을 형성하는 단계와,상기 에미터 층을 형성하는 단계에서 상기 n-접합층에 형성된 PSG(phosphorus silicate glass)를 제거하는 단계와,상기 n-접합층 및 상기 에미터 층에 반사 방지막을 형성하는 단계를 포함하며,상기 양자점층을 형성하는 단계는 기판과 원자 크기가 다른 박막물질을 원자섬의 형태로 초기 성장시킴으로써 수행되는 것을 특징으로 하는 태양전지 제조방법.
- 청구항 6에 있어서,상기 양자점층을 형성하는 단계는 밴드갭 에너지가 다른 하나 이상의 양자점층을 다층구조로 적층하여 형성하는 것을 특징으로 하는 태양전지 제조방법.
- 삭제
- 청구항 6 또는 청구항 7에 있어서,상기 양자점층을 형성하는 단계는 박막물질을 한 층씩 층구조로 증착시키는 단계와, 증착된 박막물질층을 열처리하는 단계를 포함하는 것을 특징으로 하는 태양전지 제조방법.
- 청구항 6 또는 청구항 7에 있어서,상기 양자점층을 형성하는 단계는 박막물질을 한 층 이상의 층구조로 반복하여 증착시키는 단계와, 한 층 이상으로 증착된 박막물질층을 한번에 열처리하는 단계를 포함하는 것을 특징으로 하는 태양전지 제조방법.
- 청구항 6 또는 청구항 7에 있어서,상기 양자점층을 형성하는 단계는 상기 기판의 표면에 직경이 0.1 내지 20 ㎛ 인 구멍을 갖는 마스크를 형성하는 단계와, 상기 구멍을 통해 상기 기판에 박막물질을 증착하는 단계와, 상기 마스크를 제거한 후 박막물질을 열처리하는 단계를 포함하는 것을 특징으로 하는 태양전지 제조방법.
- 청구항 6 또는 청구항 7에 있어서,상기 양자점층은 각층의 두께가 1 내지 20 nm인 것을 특징으로 하는 태양전지 제조방법.
- 청구항 6 또는 청구항 7에 있어서,상기 박막물질은 SiO2, SiNx, SiO, Al2O3, MgO, SrTiO3, Ta3O5, TiO2, MgF2, ZnO, ITO, Si 중 적어도 하나 이상을 포함하는 것을 특징으로 하는 태양전지 제조방법.
- 청구항 6 또는 청구항 7에 있어서,상기 n-접합층을 형성한 후 또는 상기 n-접합층을 형성하는 동시에 선택적 에미터층을 형성하는 단계를 더 포함하는 것을 특징으로 하는 태양전지 제조방법.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
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KR1020090117817A KR101075149B1 (ko) | 2009-12-01 | 2009-12-01 | 태양전지 및 그 제조방법 |
TW099127192A TW201123503A (en) | 2009-12-01 | 2010-08-13 | Solar cell and method of manufacturing the same |
CN2010102624020A CN102082184B (zh) | 2009-12-01 | 2010-08-25 | 太阳能电池及其制造方法 |
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KR1020090117817A KR101075149B1 (ko) | 2009-12-01 | 2009-12-01 | 태양전지 및 그 제조방법 |
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KR20110061228A KR20110061228A (ko) | 2011-06-09 |
KR101075149B1 true KR101075149B1 (ko) | 2011-10-19 |
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KR1020090117817A KR101075149B1 (ko) | 2009-12-01 | 2009-12-01 | 태양전지 및 그 제조방법 |
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KR102012388B1 (ko) * | 2013-03-13 | 2019-08-20 | 삼성전자주식회사 | 태양 전지 |
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