KR101025265B1 - Current carrying component, connecting component, test apparatus and method of mending a connecting component - Google Patents

Abstract

A holding portion for electrically connecting the test head and the device under test to an opening provided in the frame of the test head for testing the device under test and the connection member for electrically connecting the device under test, and a holding holding the conductive portion. The electricity supply member which has a part is arrange | positioned so that attachment or detachment is possible. The energization member may be detachably held to the frame by the elasticity of the holding part. The holding portion includes a convex portion fitted to the opening, and the energizing member may be detachably held to the frame by a force generated between the convex portion and the side surface of the opening.

Description

Method for repairing the energizing member, the connecting member, the test apparatus, and the connecting member {CURRENT CARRYING COMPONENT, CONNECTING COMPONENT, TEST APPARATUS AND METHOD OF MENDING A CONNECTING COMPONENT}

TECHNICAL FIELD This invention relates to the method of repairing an electricity supply member, a connection member, a test apparatus, and a connection member.

When testing the electrical characteristics of a device on a semiconductor wafer, a probe card for electrically connecting both is disposed between the device and a test head for supplying a test pattern to the device. Recently, a probe card having a contact probe having a plurality of bumps corresponding to a test pad of a semiconductor chip, a corresponding bump, and a corresponding copper thin film, and an anisotropic conductive rubber conducting in a vertical direction when a vertical pressure is applied It has also been performed to collectively test a plurality of semiconductor chips on a semiconductor wafer (see Patent Document 1, for example).

Japanese Patent No. 4187718

The bump of a contact probe and the copper thin film of an anisotropic conductive rubber are consumed repeatedly during a test. However, in the case where the bump or copper thin film is fixed to the contact probe or the anisotropic conductive rubber, even if some bump or copper thin film is consumed, the consumed bump or copper thin film cannot be easily replaced. When it replaces for every contact probe or anisotropic conductive rubber, running cost increases.

In order to solve the said subject, as a 1st aspect of this invention, in the electricity supply member detachably arrange | positioned at the opening provided in the frame of the connection member which electrically connects a test head which tests a device under test, and a device under test, A conducting member is provided that includes a conductive portion electrically connecting the test head and the device under test, and a holding portion having elasticity and holding the conductive portion.

The energization member may be detachably held to the frame by the elasticity of the holding part. In the said energizing member, the holding | maintenance part may include the convex part inserted in the said opening, and the said energizing member may be detachably held by a frame by the force which arises between the convex part and the side surface of the opening.

In the said energizing member, the holding | maintenance part may include the locking part which is not inserted in the opening, and the locking part may be detachably attached to the surface of a frame. In the energizing member, the locking portion may include a coupling opening that can engage with a protrusion provided on the surface of the frame.

In the energizing member, the conductive portion may have elasticity. In the energizing member, the conductive portion may protrude from the surface of the holding portion. In the energizing member, the contour of at least one cross section of the holding portion may be T-shaped, cross-shaped, H-shaped, Y-shaped or rectangular.

As a second aspect of the present invention, there is provided a connection member for electrically connecting a test head for testing a device under test and a device under test, wherein the frame having an opening and the opening and detachment are detachably arranged to provide a test head and a device under test. An electrically-conductive member which electrically connects is provided, The electrically-conductive member is provided with the connection member containing the electrically conductive part which electrically connects a test head and a device under test, and the holding part which has elasticity and hold | maintains an electrically conductive part.

As a 3rd aspect of this invention, the test apparatus which comprises the test head which tests a device under test, the main body part which supplies a test pattern to a test head, and said connection member is provided.

In a fourth aspect of the present invention, in the method for repairing the connecting member, the connecting member includes a step of detaching the energizing member disposed in the opening from the frame, and disposing another conductive member in the opening. A method of repairing is provided.

The above summary of the invention does not enumerate all of the necessary features of the present invention. Further, subcombinations of these feature groups can also be invented.

1 schematically shows an example of a cross-sectional view of a test apparatus 100.
2 schematically shows an example of a cross-sectional view of a test head 200.
3 schematically shows an example of an exploded view of the probe card 300.
4 schematically illustrates an example of a top view of an elastic connector 400.
5 schematically shows an example of a cross-sectional view of the elastic connector 400.
6 schematically shows an example of a top view of an elastic connector 600.
7 schematically shows an example of a cross-sectional view of the elastic connector 600.

EMBODIMENT OF THE INVENTION Hereinafter, although this invention is demonstrated through embodiment of invention, the following embodiment does not limit invention regarding a claim. Moreover, not all of the combination of the characteristics demonstrated in embodiment is essential to the solution means of this invention.

EMBODIMENT OF THE INVENTION Hereinafter, although embodiment is described with reference to drawings, in description of drawing, the same or similar part may be attached | subjected, and the overlapping description may be abbreviate | omitted. Further, in other embodiments, the corresponding members may have the same configuration, function, and use. In addition, drawing is typical, and the relationship, ratio, etc. of thickness and a planar dimension may differ from an actual thing. In addition, for the sake of explanation, parts with different relations or ratios between the dimensions may be included in the drawings.

1 schematically shows an example of a cross-sectional view of the test apparatus 100. The test apparatus 100 tests the electrical characteristics of a device such as a semiconductor chip formed on the wafer 10 to determine whether the device is good or bad. The test apparatus 100 may test a plurality of semiconductor chips formed on the wafer 10 collectively. Devices such as the wafer 10 and the semiconductor chip may be an example of the device under test.

The test apparatus 100 includes the transfer unit 110, the load unit 130, the FOUP 150, the main unit 160, the alignment unit 170, the test head 200, and the probe card. 300. In this embodiment, the rod unit 130, the conveying unit 110, and the main body unit 160 are sequentially disposed adjacent to the rear side (right side in the drawing) from the front surface (left side in the drawing). In addition, the alignment unit 170, the probe card 300, and the test head 200 are stacked on the main unit 160. The conveying unit 110 and the load unit 130, and the conveying unit 110 and the alignment unit 170 are each in airtight communication therein. Thereby, the cleanliness of the inside of the test apparatus 100 can be maintained.

The conveying unit 110 conveys the wafer 10 inside the test apparatus 100. The transfer unit 110 incorporates a robot arm 116. The robot arm 116 conveys the wafer 10 between the load unit 130 and the alignment unit 170. The robot arm 116 takes out the wafers 10 one by one from the FOUP 150 via the load gate 134 and transfers them to the alignment unit 170. The robot arm 116 mounts the wafer 10 on the wafer tray 20 arranged inside the alignment unit 170. In addition, the robot arm 116 takes out the wafer 10 after completion of the test from the alignment unit 170 via the load gate 134 and stores it in the FOUP 150.

The load unit 130 has a load table 132 and a load gate 134. In the load table 132, a FOUP 150 containing a wafer 10 to be tested is mounted. The load gate 134 opens and closes when carrying in or carrying out the wafer 10 to the test apparatus 100. Thereby, the wafer 10 can be loaded from the outside without reducing the cleanliness of the inside of the test apparatus 100.

The FOUP 150 stores a plurality of wafers 10 to be tested. In addition, the FOUP 150 stores the wafer 10 on which the test is completed.

The main body unit 160 controls the operation of each part of the test apparatus 100. For example, the main unit 160 synchronizes the operations of the transfer unit 110, the load unit 130, and the alignment unit 170 to exchange the wafers 10 with each other. In addition, the main body unit 160 controls the operation of the test head 200 in accordance with the test program. The main unit 160 supplies a test pattern to the test head 200. The main body unit 160 may be an example of the main body portion.

The alignment unit 170 adjusts the relative position of the wafer 10 and the probe card 300 to electrically connect the wafer 10 and the probe card 300. The alignment unit 170 has an alignment stage 172. The alignment stage 172 adjusts the relative positions of the wafer 10 and the probe card 300 to align the positions of the probe card 300 and the wafer 10. In this embodiment, the alignment stage 172 mounts the wafer tray 20, and expands and contracts in a vertical direction (up and down direction in the figure).

The wafer tray 20 has a mounting surface on which the wafer 10 is placed. The wafer tray 20 may hold the wafer 10 on the mounting surface by vacuum suction or the like. The alignment stage 172 moves the wafer tray 20 holding the wafer 10 toward the probe card 300, and presses the wafer 10 against the probe card 300. As a result, the terminal provided on the surface of the wafer 10 and the terminal provided on the surface of the probe card 300 come into contact with each other.

In this embodiment, the probe card 300, the wafer 10, and the wafer tray 20 are integrated in this state. Thereby, the wafer 10 can be loaded with respect to the test head 200. For example, the wafer tray 20 has a seal member that seals the space between the probe card 300 and the wafer tray 20, so that the probe card 300 and the wafer tray 20 can carry the wafer 10. The probe card 300, the wafer 10, and the wafer tray 20 are integrated by lowering the pressure in the space between the probe card 300 and the wafer tray 20 to be lower than the external pressure in the state in which the gap is placed. You can. As another method of integration, the fixing jig which sandwiches the probe card 300 which interposed the wafer 10, and the wafer tray 20 from the exterior may be used.

The test head 200 is electrically connected to the wafer 10 to test the electrical characteristics of the wafer 10. The test head 200 may perform burn-in inspection of the wafer 10. The test head 200 stores a plurality of pin electronics 210. The pin electronics 210 has an electric circuit required according to the test object and the content of the test. In the present embodiment, the test head 200 is electrically connected to the probe card 300 through the contactor 202 attached to the lower surface.

The probe card 300 is used for testing the device under test. The probe card 300 electrically connects the test head 200 and the wafer 10 via the test head 200 and the wafer 10 when the test apparatus 100 executes the test. The wiring board unit may be used. When the test is performed on the wafer 10, the conductive path or the electrical signal path is formed between the test head 200 and the wafer 10 by the probe card 300. By replacing the probe card 300, the test apparatus 100 can be made to correspond to the wafer 10 having a different layout.

2 schematically shows an example of a cross-sectional view of the test head 200. In some cases, the same reference numerals are given to elements common to those in FIG. 1 to omit duplicate explanations. The test head 200 includes a case 201, a contactor 202, a pin electronics 210, a motherboard 220, and a flat cable 230.

Inside the case 201, a motherboard 220 having a plurality of relay connectors 224 is arranged horizontally. The relay connector 224 has a receptacle on the upper surface side and the lower surface side of the motherboard 220, respectively, to form a signal path passing through the motherboard 220.

On the upper surface of the motherboard 220, each of the relay connectors 224 is mounted with pin electronics 210 through an angle connector 222. With this structure, the pin electronics 210 can be exchanged in accordance with the specification of the test object and the test contents.

The plurality of pin electronics 210 may have the same specification or may have different specifications. In addition, the pin electronics 210 may not be attached to some relay connectors 224.

On the lower surface of the motherboard 220, a small substrate 228 is connected to each of the relay connectors 224 through the angle connector 226. One end of the flat cable 230 is connected to the small substrate 228. Thereby, the pin electronics 210 in the case 201 and the contactor 202 mentioned later can be connected through the flat cable 230. As shown in FIG.

The contactor 202 is attached to the lower surface of the case 201. The contactor 202 has a support substrate 240, a three-dimensional actuator 250, a contactor substrate 260, a sub substrate 270, and a contactor housing 280.

The upper surface of the support substrate 240 is fixed to the case 201, and at the lower surface of the support substrate 240, the upper end of the three-dimensional actuator 250 is supported. The lower end of the three-dimensional actuator 250 supports the contactor substrate 260. Furthermore, the sub substrate 270 and the contactor housing 280 are fixed to the lower surface of the contactor substrate 260.

The three-dimensional actuator 250 can move in the horizontal direction along the lower surface of the support substrate 240 and also expand and contract in the vertical direction. Thereby, the contactor substrate 260 can be moved three-dimensionally. When the contactor substrate 260 moves, the sub-substrate 270 and the contactor housing 280 also move along with the contactor substrate 260.

In addition, the lower end of the flat cable 230 is coupled to a terminal, such as a spring pin, held in the contactor housing 280. As a result, the pin electronics 210 is electrically connected to the bottom of the test head 200. In addition, although the spring pin was mentioned as an example here, the structure including the connection which does not use a spring pin, such as capacitive coupling and an optical connection, can also be employ | adopted.

3 schematically shows an example of an exploded view of the probe card 300. The probe card 300 electrically connects the test head 200 and the wafer 10. The probe card 300 forms a part of the conductive path between the test head 200 and the wafer 10. The probe card 300 may be an example of a connection member. The probe card 300 includes a wiring board 320, an elastic connector 340, an interpoder 350, an elastic connector 360, and a sheet-shaped connector 370.

Each of the elastic connector 340, the interpoder 350, the elastic connector 360, and the sheet-shaped connector 370 includes an opening 344, an opening 354, an opening 364, and an opening 374 passing through the front and back. ) These openings are arranged such that the openings communicate with each other when the elastic connector 340, the interpoder 350, the elastic connector 360, and the sheet-shaped connector 370 are stacked. Thereby, the exhaust gas between members is assisted.

Hereinafter, the probe card 300 will be described with an example in which the electrodes of the elastic connector 340 and the elastic connector 360 are detachably disposed. In addition, in the following description, according to display of a figure, the test head 200 side may be shown upward and the wafer 10 side may be shown downward. However, the base material is that the test head 200 side is upward when the wiring board 320, the elastic connector 340, the interpoder 350, the elastic connector 360 and the sheet-shaped connector 370 are used. It is not limited.

The wiring board 320 electrically connects the test head 200 and the wafer 10. The wiring board 320 forms a part of the conductive path between the test head 200 and the wafer 10. The wiring board 320 may be an example of a connection member. The wiring board 320 is formed of an insulating substrate having a relatively high mechanical strength, for example, a polyimide plate. The peripheral part of the wiring board 320 is fitted to the upper frame 312 and the lower frame 314 each having a frame shape. The upper frame 312 and the lower frame 314 are stacked on each other and fastened by a screw 316. As a result, the mechanical strength of the wiring board 320 is further improved.

The plurality of guide units 330 are disposed on the upper surface of the wiring board 320. The guide unit 330 functions as a connector guide for guiding and positioning the contactor 202 when the contactor 202 is in contact with the wiring board 320. On the lower surface of the wiring board 320, a plurality of contact pads 323 for obtaining electrical connection by contact are arranged. The contact pads 323 are electrically connected to contact pads (not shown) disposed inside the guide unit 330 on the upper surface of the wiring board 320.

The elastic connector 340 is disposed between the wiring board 320 and the inter feeder 350. The elastic connector 340 electrically connects the test head 200 and the wafer 10. The elastic connector 340 forms part of the conductive path between the test head 200 and the wafer 10. The elastic connector 340 may be an example of a connection member.

The elastic connector 340 has an elastic contact 341 and a frame plate 342. The frame plate 342 has an opening 344 and an opening 346. In the opening 344 and the opening 346, the frame plate 342 is referred to as a surface on the wafer 10 side (hereinafter referred to as a lower surface) from a surface on the test head 200 side (hereinafter may be referred to as an upper surface). Through).

The elastic contact 341 is disposed to be detachable from the opening 346 provided in the frame plate 342. The elastic contact 341 may be an example of the energization member. For example, at least a portion of the elastic contact 341 is fitted into the opening 346, and the elastic contact 341 is formed by the force generated between the elastic contact 341 and the side surface of the opening 346. Removable to 342 is maintained.

The part which contacts the opening 346 of the elastic contact 341 may be formed with the material which has elasticity. In this case, the elastic contact 341 is pressed to the side of the opening 346 by the elasticity of the member, so that the elastic contact 341 is detachably held to the frame plate 342. This part may have elasticity to such an extent that the elastic contact 341 does not miss immediately when the frame plate 342 is reversed. Even in this degree of elasticity, when the elastic contact 341 is fixed to the frame plate 342 with an adhesive, an adhesive having a weak adhesive force is used as long as the elastic contact 341 is held on the frame plate 342 by elasticity. Can be used. Thereby, attachment / detachment of the elastic contact 341 becomes easy.

As another example of detachably attaching the elastic contact member 341 and the frame plate 342, the elastic contact member 341 and the frame plate 342 are attached or detached by an adhesive whose adhesive force is reduced by irradiation of electromagnetic waves or by heating or cooling. It may be combined as possible. For example, the elastic contact member 341 and the frame plate 342 may be detachably coupled to each other by an ultraviolet irradiation peeling tape in which the adhesive force decreases due to ultraviolet irradiation.

By the above structure, even when a defect is found in some elastic contact 341 among the some elastic contact 341, the elastic contact 341 in which the defect was found can be replaced easily. In addition, by replacing the elastic contact 341, the arrangement of the terminals of the elastic connector 340 can be easily changed.

The elastic contact 341 has conductive terminals on its upper and lower surfaces. An elastic member is disposed between the upper terminal and the lower terminal. The upper terminal and the lower terminal are electrically connected. The elastic member may be an insulating material such as silicone rubber or anisotropic conductive rubber. The elasticity of the elastic member may be larger than that of the wiring board 320 or the interposer 350. The elastic contact 341 may have an anisotropic conductive rubber (Pressure sensitive Conductive Ruber) that penetrates the elastic contact 341. In this case, one end of the anisotropic conductive rubber forms a terminal on the upper surface of the elastic contact 341, and the other end forms a terminal on the lower surface of the elastic contact 341.

The terminal provided on the upper surface of the elastic contact 341 is disposed to be electrically connected to the contact pad 323 when the wiring board 320 and the elastic connector 340 are closely stacked. The layout of the terminals on the upper and lower surfaces of the elastic contact 341 may be the same. Thereby, the nonuniformity of the unevenness arrange | positioned between the wiring board 320 and the interpoder 350 can be absorbed. As a result, the connection state of the wiring board 320 and the interpoder 350 can be maintained satisfactorily.

The material constituting the frame plate 342 may be a material having a relatively high rigidity such as metal, alloy, ceramics, or resin. Thereby, the shape of the frame plate 342 can be kept stable. The shape of the frame plate 342 may be a lattice shape or a plate shape. The frame plate 342 may be an example of a frame of the connecting member.

The opening 344 is provided for the purpose of flowing a fluid such as air between the wiring board 320, the elastic connector 340, and the interpoder 350. Thereby, for example, when the probe card 300, the wafer 10, and the wafer tray 20 are integrated, the space between the probe card 300 and the wafer tray 20 can be reduced in a short time. have. The opening 346 may hold at least a portion of the elastic contact 341. The opening 346 may be provided in a lattice shape, or may be provided in accordance with the layout of a terminal provided in the wiring board 320 or the interpoder 350.

The interpoder 350 converts the terminal spacing between the upper surface and the lower surface. The interpoder 350 electrically connects the test head 200 and the wafer 10. The inter feeder 350 forms part of the conductive path between the test head 200 and the wafer 10. The interpoder 350 may be an example of a connection member.

The interpoder 350 has contact pads 351 and contact pads 353 on the top and bottom surfaces of the base substrate 352, respectively. Each of the contact pads 351 corresponds to any one of the contact pads 353. The corresponding contact pads 351 and the contact pads 353 are electrically connected to each other by the wiring 355.

The contact pads 351 are arranged to be electrically connected to the terminals on the lower surface of the elastic contact 341 when the interpoder 350 and the elastic connector 340 are closely stacked. The contact pads 353 may have a different layout from that of the contact pads 351. Thereby, even when the layout of the contact pad 353 matches the layout of the test pad of the wafer 10, the contact pad 351 can be arbitrarily laid out.

The test pad of the wafer 10 is formed on an integrated circuit so that the test area of the test pad is small and the pitch of the pads is small. However, by using the interpoder 350, the pitch P1 of the contact pad 351 can be made larger than the pitch P2 of the contact pad 353. In addition, by using the interpoder 350, the area of the contact pad 351 can be made larger than the area of the contact pad 353. Thereby, connection of the contactor 202 and the probe card 300 can be made easy and reliable.

The elastic connector 360 is disposed between the interpoder 350 and the sheet-shaped connector 370. The elastic connector 360 electrically connects the test head 200 and the wafer 10. The elastic connector 360 forms part of the conductive path between the test head 200 and the wafer 10. The elastic connector 360 may be an example of a connection member.

The elastic connector 360 has an elastic contact 361 and a frame plate 362. The frame plate 362 has an opening 364 and an opening 366. The opening 364 and the opening 366 penetrate the frame plate 362 from the upper surface to the lower surface. The elastic contact 361 is arranged to be detachable from the opening 366 provided in the frame plate 362. The elastic connector 360 may have the same structure as the elastic connector 340 except for the layout of the elastic contact 361 and the opening 366. Here, the description which overlaps with each structure of the elastic connector 340 about the structure of the elastic connector 360 may be abbreviate | omitted.

The elastic contact 361 has conductive terminals on its upper and lower surfaces. The elastic contact 361 may have the same structure as the elastic contact 341. The elastic contact 361 may be an example of an energization member. The terminal provided on the upper surface of the elastic contact 361 is arranged to be electrically connected to the contact pad 353 when the interpoder 350 and the elastic connector 360 are closely stacked. The layout of the terminals on the upper and lower surfaces of the elastic contact 361 may be the same. Thereby, the nonuniformity of the unevenness arrange | positioned between the interpoder 350 and the sheet-like connector 370 can be absorbed. As a result, the connection situation of the interpoder 350 and the sheet-shaped connector 370 can be maintained favorable.

The frame plate 362 may have the same structure as the frame plate 342. The frame plate 362 may be an example of a frame of the connecting member. The opening 364 may have the same structure as the opening 344. The opening 364 is provided for the purpose of flowing a fluid such as air between the interpoder 350, the elastic connector 360, and the sheet-shaped connector 370. Thereby, for example, when the probe card 300, the wafer 10, and the wafer tray 20 are integrated, the space between the probe card 300 and the wafer tray 20 can be reduced in a short time. have. The opening 366 may have the same structure as the opening 346.

The sheet-shaped connector 370 electrically connects the test head 200 and the wafer 10. The sheet-like connector 370 forms part of the conductive path between the test head 200 and the wafer 10. The sheet-shaped connector 370 may be an example of a connection member. The sheet-shaped connector 370 is disposed at the bottom of the probe card 300 so that the sheet-shaped connector 370 and the wafer 10 contact when the probe card 300 and the wafer 10 contact each other.

The sheet-shaped connector 370 has a contact pad 371, an elastic sheet 372, a bump 373, a wiring 375, and a peripheral frame 376. The elastic sheet 372 has an opening 374. The contact pad 371 is disposed on the upper surface of the elastic sheet 372. The layout of the contact pad 371 may be the same as the terminal layout of the lower surface of the elastic contact 361. The elastic sheet 372 is formed of an insulating material having elasticity. The elastic sheet 372 may be a polyimide film.

The bump 373 is disposed on the lower surface of the elastic sheet 372. The bump 373 functions as a contact terminal with the wafer 10 at the lowermost surface of the probe card 300. Each of the bumps 373 has a shape in which the center protrudes downward. As a result, the bump 373 functions as a contact terminal with respect to the wafer 10 at the lowermost surface of the probe card 300. Each of the bumps 373 is electrically connected to any one of the contact pads 371 through a wiring 375 embedded in a through hole formed in the elastic sheet 372. The peripheral frame 376 grips the peripheral portion of the elastic sheet 372 to hold the elastic sheet 372 in a flat state. The peripheral frame 376 may be formed of a material having the same thermal expansion ratio as that of the wafer 10.

4 schematically shows an example of a plan view of the elastic connector 400. 5 schematically shows an example of a cross-sectional view of the elastic connector 400. FIG. 5: shows AA 'cross section of the elastic connector 400 of FIG. In FIG. 4 and FIG. 5, the detail of an elastic contactor and an elastic connector is demonstrated using the elastic connector 400 which has eight elastic contactors 420 for the purpose of simplifying description.

The elastic connector 400 electrically connects the test head 200 and the wafer 10. The elastic connector 400 forms part of the conductive path between the test head 200 and the wafer 10. The elastic connector 400 may be an example of a connection member. The elastic connector 400 includes a frame plate 410 and an elastic contact 420.

The elastic connector 400 may have the same structure as the elastic connector 340 or the elastic connector 360. The frame plate 410 may have the same structure as the frame plate 342 or the frame plate 362. The elastic contact 420 may have the same structure as the elastic contact 341 or the elastic contact 361. Here, the description overlapping with each configuration of the elastic connector 340 or the elastic connector 360 may be omitted for each configuration of the elastic connector 400.

The frame plate 410 holds the elastic contact 420 detachably. The frame plate 410 may hold | maintain the some elastic contact 420 detachably. The plurality of elastic contacts 420 can be attached and detached individually. The frame plate 410 has a plurality of openings 414 and a plurality of openings 416. The frame plate 410 may be an example of a frame of the contact member. The opening 414 may have the same configuration as the opening 344 or the opening 364. By providing the opening 414, when the probe card 300, the wafer 10, and the wafer tray 20 are integrated, the space between the probe card 300 and the wafer tray 20 is reduced in a short time. can do.

The opening 416 may have the same configuration as the opening 346 or the opening 366. In the opening 416, a part of the elastic contact 420 is fitted. Unevenness may be formed on the side surface of the opening 416. The opening 416 may be formed in a zigzag pattern, or a thread or a screw groove may be formed in the side surface of the opening 416. Thereby, when the elastic contact 420 is elastic, the contact area of the side surface of the opening 416 and the elastic contact 420 can be increased.

The elastic contact 420 is detachably arranged in the opening 416 of the frame plate 410. The elastic contact 420 may be an example of an energization member. The elastic contact 420 has an electrode holder 422 and a through electrode 424.

The electrode holder 422 holds the through electrode 424. The electrode holder 422 may be an example of a holding part. In this embodiment, the electrode holder 422 holds the plurality of through electrodes 424. The electrode holder 422 may have insulation. Thereby, the through electrode 424 and the frame plate 410 can be electrically insulated. In addition, the plurality of through electrodes 424 can be electrically insulated from each other.

The electrode holder 422 is not fitted to the opening 416 when attached to the frame plate 410, and remains on the upper surface of the frame plate 410, and is opened when mounted to the frame plate 410. 416 has a lower holder 434 fitted therein. The upper holder 432 may be an example of the locking portion. The lower holder 434 may be an example of the convex portion. In this embodiment, the upper holder 432 and the lower holder 434 are integrally formed.

The electrode holder 422 may be detachably held to the frame plate 410 by a force generated between the lower holder 434 and the side surface of the opening 416. As a force generated between the lower holder 434 and the side surface of the opening 416, the friction force between the lower holder 434 and the side surface of the opening 416 can be illustrated. The cross-sectional area in the case where the lower holder 434 is cut in the plane perpendicular to the through direction of the opening 416 may be larger than the cross-sectional area in the case in which the opening 416 is cut away from the plane perpendicular to the through direction of the opening 416. .

The electrode holder 422 may have elasticity. The elastic contact 420 may be held by the frame plate 410 by the elasticity of the electrode holder 422. As the elasticity of the electrode holder 422 becomes stronger, the force that the lower holder 434 biases the opening 416 becomes stronger, and the elastic contact 420 is firmly fixed to the frame plate 410. However, since the elastic contact 420 is hold | maintained in the frame board 410 by the elasticity of the electrode holder 422, it can attach or detach individually. The electrode holder 422 may have elasticity such that the elastic contact 341 does not immediately miss when the frame plate 342 is inverted.

The electrode holder 422 may be formed of a material having a repulsive elasticity of 20% or more and 70% or less. As a result, the lower holder 434 can appropriately press the opening 416. Measuring the impact resilience is, is carried out in accordance with JIS K6255 ^-1996. That is, the rebound elasticity is measured by a Luffke-type repulsive elasticity test apparatus using the cylindrical test piece of thickness 12mm or more and 13mm or less, diameter 28.5mm or more, and 29.5mm or less on the conditions which are 21 degreeC or more and 25 degrees C or less. .

The electrode holder 422 may contain materials excellent in resilience and electrical insulation, such as natural rubber, isoprene rubber, butadiene rubber, silicone rubber, urethane rubber, and chloroprene rubber. Since silicone rubber is excellent also in heat resistance, it is preferable to select silicone rubber as a material which comprises the electrode holder 422.

Here, the fact that the elastic contact 420 is detachably held to the frame plate 410 by the elasticity of the electrode holder 422 means that the elastic contact 420 is caused by the force generated by the elasticity of the electrode holder 422. ) Is not only held in the frame plate 410 detachably, but also by the force generated by the elasticity of the electrode holder 422 and the force generated by factors other than the elasticity of the electrode holder 422. ) Is detachably held to the frame plate 410. Thereby, compared with the case where there is no force produced by the elasticity of the electrode holder 422, the elastic contact 420 can be hold | maintained even if the force produced by factors other than the elasticity of the electrode holder 422 is small. In the present embodiment, the ultraviolet irradiation release tape 426 is disposed between the upper holder 432 of the electrode holder 422 and the upper surface of the frame plate 410.

Adhesive force falls with the ultraviolet irradiation peeling tape 426 by irradiation of an ultraviolet-ray. As a result, the elastic contact 420 is detachably held to the frame plate 410 by the force generated by the elasticity of the electrode holder 422 and the adhesive force of the ultraviolet irradiation peeling tape 426. In other words, when the elastic contact 420 is removed from the frame plate 410, the elastic contact 420 can be removed individually by irradiating ultraviolet rays around the elastic contact 420 to be removed.

The contour of the cross section when the electrode holder 422 is cut in the direction from the upper surface of the frame plate 410 to the lower surface may be T-shaped, cross-shaped, H-shaped, Y-shaped or rectangular. According to the cutting method, when the shape of a cross section differs, the outline of at least 1 cross section may be as mentioned above. In particular, in the case of T type, cross type, H type, and Y type, the movement of the electrode holder 422 in the penetrating direction of the opening can be suppressed by the upper holder 432. The T-type also includes a shape such as "to" in katakana or a shape such as a mushroom. In addition, even if the width | variety of the cross section in the upper surface of the frame board 410 (it says length of the left-right direction in drawing) and the width of the cross section in the lower surface of the frame board 410 are included in H type. The width of the cross section at the lower surface of the frame plate 410 may be shorter than the width of the cross section at the upper surface of the frame plate 410.

The through electrode 424 electrically connects the test head 200 and the wafer 10. The elastic connector 400 forms part of the conductive path between the test head 200 and the wafer 10. The through electrode 424 may be an example of the conductive portion. The through electrode 424 penetrates through the electrode holder 422 from the upper surface of the electrode holder 422 to the lower surface.

The through electrode 424 may have elasticity. As a result, the through electrode 424 can contact the wiring board 320, the interpoder 350, or the terminal of the sheet-shaped connector at an appropriate pressure. The through electrode 424 may be formed of an anisotropic conductive rubber. At least one end of the through electrode 424 may be arranged to protrude from the surface of the electrode holder 422. Thereby, the through electrode 424 can reliably contact the terminal of the wiring board 320, the interpoder 350, or the sheet-shaped connector.

The elastic contact 420 can be manufactured, for example in the following procedure. First, the silicone rubber is molded into a mold to manufacture the electrode holder 422. Next, a through hole penetrating the electrode holder 422 is formed in the electrode holder 422. Thereafter, the through electrode 424 is formed of an anisotropic conductive rubber or a metal in the through hole. Alternatively, the elastic contactor 420 may be manufactured by flowing a silicon rubber raw material into a mold in which a rod-shaped anisotropic conductive rubber or a metal through electrode 424 is disposed. Alternatively, the electrode contact 422 made of a material such as insulating silicone rubber may be disposed around the through electrode 424 to manufacture the elastic contact 420 so as to insulate the single or plurality of through electrodes 424 from each other. . In addition, the manufacturing method of the elastic contact 420 is not limited to these.

By employing the above configuration, some of the elastic contacts 420 can be exchanged among the plurality of elastic contacts 420 of the elastic connector 400. That is, the elastic connector 400 is removed by removing the elastic contact 420 disposed in the opening 416 from the frame plate 410, and arranging another elastic contact 420 in the opening 416. ) Can be repaired. Thus, when a problem is found in some of the elastic contacts 420 due to poor manufacturing or consumption, or when the layout of the through electrode 424 is changed, the purpose can be achieved by changing some of the elastic contacts 420. Can be.

As a result, the yield at the time of manufacture of the elastic connector 400 can be improved. In addition, as compared with the case where every elastic connector 400 is replaced, the cost or time required for maintenance can be saved. For example, even when a different type of device is formed on a single wafer, a spare elastic contactor is prepared for each device, so that the probe card can be maintained at low cost and in a short period of time. In addition, when conduction test of the elastic contact 420 is performed and the quality of the elastic contact 420 is determined, the jig used for the test can be miniaturized or simplified.

By employing the above configuration, it is possible to provide the test apparatus 100 that can easily maintain the probe card 300. The test apparatus 100 which can suppress the maintenance cost of the probe card 300 can be provided. The test apparatus 100 which can test the wafer in which the other kind of device was formed at low cost can be provided.

Although the case where one elastic contact 420 is arrange | positioned with respect to one opening 416 was demonstrated in this embodiment, the elastic connector 400 is not limited to this. One elastic contact 420 may be disposed with respect to the plurality of openings 416. In this embodiment, although the case where the terminal layout of the upper surface of the elastic contact 420 and the terminal layout of the lower surface is the same was demonstrated, the elastic contact 420 is not limited to this. The terminal layout of the upper surface of the elastic contact 420 and the terminal layout of the lower surface may be different.

In the present embodiment, the elastic contact 420 is detachably held on the frame plate 410 by the adhesive force of the ultraviolet irradiation peeling tape 426 as an example of the force generated by factors other than elasticity of the electrode holder 422. The case was described. However, the force generated by factors other than the elasticity of the electrode holder 422 is not limited to the adhesive force of the ultraviolet irradiation peeling tape 426.

For example, the electrode holder 422 is fixed to the frame plate 410 by solder, so that the elastic contact 420 can be detachably attached to the frame plate 410. In this case, the elastic contact 420 can be removed individually by heating the periphery of the elastic contact 420 to be removed. For example, by irradiating the vicinity of the elastic contact 420 with electromagnetic waves having a wavelength capable of selectively heating the solder, the elastic contact 420 can be removed individually. In addition, for the purpose of facilitating fixing by soldering, metal plating which can be soldered to the lower surface or the periphery of the upper holder 432 may be performed.

According to this example, compared to the case where the elastic contact 420 is held by elasticity or the elastic contact 420 is held by an ultraviolet irradiation peeling tape, the trouble of processing the solder remaining on the frame plate 410 is increased. Increases. However, since solder is not used for the purpose of electrically connecting the frame plate 410 and the elastic contactor 420, the solder is used to connect the terminals such as the elastic contactor 420 and the interpoder 350. In comparison with the case, the arrangement or the size of the solder can be freely designed to some extent.

As another example, the elastic contact 420 may be detachably attached to the frame plate 410 by magnetic force, or may be detachably attached to the frame plate 410 by pressure difference. For example, recesses are provided in the side portions of the openings 416 or in the openings 416 of the lower holder 434 to seal the both ends of the openings 416 with the shape of the elastic contact 420. By making it possible to shape, the elastic contact 420 can be detachably attached to the frame board 410 by a pressure difference. That is, by making the pressure inside the opening 416 lower than the outside pressure, the elastic contact 420 can be detachably attached to the frame plate 410.

For example, inside the pressure reduction container, the elastic contact 420 is inserted into the opening 416 to manufacture the elastic connector 400. The pressure inside the pressure reduction container is set to a pressure lower than the pressure at the place of use of the elastic connector 400 in consideration of the temperature at the time of use of the elastic connector 400. Thereby, the pressure of the said recessed part is maintained at the pressure inside the pressure reduction container. Then, by using the elastic connector 400 based on the pressure higher than the pressure of a pressure reduction container, the elastic contact 420 can be detachably attached to the frame plate 410.

In this case, by making a hole in the upper holder 432, the elastic contact 420 can be removed. In addition, the elastic contact member 400 may be detached by providing the elastic connector 400 removed from the probe card 300 inside the pressure reduction container and setting the pressure of the pressure reduction container to the pressure at the time of manufacture.

In addition, the upper holder 432 has a hollow region provided inside the upper holder 432, and an opening communicating the lower surface of the upper holder 432 with the hollow region to externally pressurize the pressure of the hollow region. The elastic contact 420 may be made to adsorb | suck to the frame board 410 by making it lower than the pressure of.

For example, while pressing the hollow area of the upper holder 432, the elastic contact 420 is inserted into the opening 416 so that the opening provided in the lower surface of the upper holder 432 contacts the upper surface of the frame plate 410. . Then, when pressing down the hollow area, the hollow area of the upper holder 432 is depressurized, and the elastic contact 420 is attracted to the upper surface of the frame plate 410. Thereby, the elastic contact 420 can be detachably attached to the frame board 410 by a pressure difference. In this case, the elastic contact 420 can be detached by, for example, making a hole in the hollow region of the upper holder 432.

In this embodiment, the elastic contact 420 is detachably held to the frame plate 410 by the force generated by the elasticity of the electrode holder 422 and the force generated by factors other than the elasticity of the electrode holder 422. The case and the case were described. However, the elastic connector 400 is not limited thereto. For example, the elastic contact 420 is applied to the frame plate 410 by at least one of the force generated by the elasticity of the electrode holder 422 and the force generated by factors other than the elasticity of the electrode holder 422. You may remain detachably.

6 schematically shows an example of a plan view of the elastic connector 600. 7 schematically shows an example of a cross-sectional view of the elastic connector 600. FIG. 7 is a cross-sectional view taken along line B-B 'of the elastic connector 600 of FIG. The elastic connector 600 shows another example of an elastic connector. The elastic connector 600 electrically connects the test head 200 and the wafer 10. The elastic connector 600 forms part of the conductive path between the test head 200 and the wafer 10. The elastic connector 600 may be an example of a connection member. Hereinafter, another example in which the elastic contactor is detachably held to the frame by elasticity will be described using the elastic connector 600.

The elastic connector 600 includes a frame plate 610 and an elastic contact 620. The elastic connector 600 may have the same structure as the elastic connector 340, the elastic connector 360, or the elastic connector 400. The frame plate 610 may have the same structure as the frame plate 342, the frame plate 362, or the frame plate 410. The elastic contact 620 may have the same structure as the elastic contact 341, the elastic contact 361, or the elastic contact 420. Here, descriptions overlapping with respective configurations of the elastic connector 340, the elastic connector 360, or the elastic connector 400 may be omitted for each configuration of the elastic connector 600.

The frame plate 610 holds the elastic contact 620 detachably. The frame plate 610 may hold | maintain the some elastic contact 620 detachably. The plurality of elastic contacts 620 can be attached and detached individually. The frame plate 610 has a plurality of openings 616. The frame plate 610 may be an example of the frame of the contact member. The frame plate 610 may have the same structure as the frame plate 410. The opening 616 may have the same structure as the opening 416.

The elastic contact 620 is disposed in the opening 616 of the frame plate 610 in a detachable manner. The elastic contact 620 has an electrode holder 622 and a through electrode 624. The electrode holder 622 holds the through electrode 624. The electrode holder 622 may be an example of the holding part. The electrode holder 622 is not fitted to the opening 616 when attached to the frame plate 610, and remains at the upper surface of the frame plate 610, and the opening when mounted to the frame plate 610. 616 has a lower holder 634 fitted therein.

The elastic contact 620 may be an example of an energization member. The upper holder 632 may be an example of the locking portion. The lower holder 634 may be an example of the convex portion. The elastic contact 620, the electrode holder 622, the through electrode 624, the upper holder 632, and the lower holder 634 are the elastic contact 420, the electrode holder 422, and the through electrode 424, respectively. The upper holder 432 and the lower holder 434 may have the same configuration.

The elastic connector 600 differs from the elastic connector 400 in that the upper holder 632 has an opening 626 that penetrates the upper holder 632 from the upper surface to the lower surface. The elastic connector 600 is different from the elastic connector 400 in that the electrode holder 622 has an opening 628 that penetrates the electrode holder 622 from the upper surface to the lower surface. The elastic connector 600 differs from the elastic connector 400 in that the frame plate 610 has a pin 618 and the pin 618 is fitted in the opening 628.

The opening 626 is provided at the periphery of the upper holder 632. The opening 626 may engage with the pin 618 provided on the surface of the frame plate 610. The opening 626 may be an example of an opening for engagement. As a result, the electrode holder 622 is detachably held to the frame plate 610. When the electrode holder 622 has elasticity, the elastic contact 620 is detachably held to the frame plate 610 by the force generated between the pin 618 and the side surface of the opening 626.

The cross-sectional area of the opening 626 in the state where the electrode holder 622 is not attached to the frame plate 610 may be larger than the cross-sectional area of the pin 618. Here, the cross section of the opening 626 means the cross section at the time of cutting the opening 626 in the surface perpendicular | vertical to the penetrating direction of the opening 626. In addition, the cross section of the pin 618 is the case where the pin 618 is cut | disconnected in the surface perpendicular | vertical to the penetrating direction of the opening 626 in the state in which the electrode holder 622 is attached to the frame board 610. As shown in FIG. Say cross section.

The opening 628 has the same function as the opening 344, the opening 364, or the opening 414. By providing the opening 628, when the probe card 300, the wafer 10, and the wafer tray 20 are integrated, the space between the probe card 300 and the wafer tray 20 is reduced in a short time. can do.

The pin 618 is provided on the surface of the frame plate 610. The pin 618 may be a columnar member. The pin 618 may be an example of the protrusion. The shape of the cross section of the pin 618 may be circular or polygonal. The pin 618 may have uneven | corrugated surface. The pin 618 may be formed in a zigzag pattern, or a thread or a threaded groove may be formed on the surface of the pin 618. Thereby, when the electrode holder 622 is elastic, the contact area between the pin 618 and the side surface of the opening 626 can be increased. The cross-sectional area of the upper part of the pin 618 may be larger than the cross-sectional area of the lower part of the pin 618. For example, a spherical or hemispherical member may be disposed on the upper end of the pin 618. As a result, the electrode holder 622 can be prevented from suddenly deviating from the frame plate 610.

In the above, the case where the elastic contactor was detachably arrange | positioned in the elastic connector was demonstrated. However, the probe card 300 is not limited thereto. For example, the interpoder 350 or the sheet-like connector 370 may have the same structure as the elastic connector 400 or the elastic connector 600. That is, a member having the contact pad 351, the contact pad 353, and the wiring 355 of the interpoder 350 may be detachably held to the base substrate 352. Alternatively, the member having the contact pads 371, the bumps 373 and the wirings 375 of the sheet-shaped connector 370 may be detachably held to the elastic sheet 372.

In particular, elastic members, such as anisotropic conductive rubber, are easy to change or damage resistance value by plastic deformation by repeated compressive stress or thermal stress. Here, when the above configuration is adopted for the elastic connector 340, the elastic connector 360, the elastic connector 400 or the elastic connector 600, the effect can be more remarkably exhibited.

According to the above description, it is clear that the following energizing members are described in this specification. That is, in this specification, it is an electricity supply member detachably arrange | positioned at the opening provided in the frame of the connection member which electrically connects a test head and a device under test to test a device under test, and electrically connects a test head and a device under test. The electricity supply member provided with the electrically-conductive part to connect and the holding | maintenance part holding a electrically-conductive part is described.

As mentioned above, although this invention was demonstrated using embodiment, the technical scope of this invention is not limited to the range as described in the said embodiment. It is apparent to those skilled in the art that various changes or improvements can be added to the above embodiment. It is clear from description of a claim that the form which added such a change or improvement can also be included in the technical scope of this invention.

The order of execution of each process such as operations, procedures, steps and steps in the devices, systems, programs, and methods shown in the claims, the specification, and the drawings is not specifically stated before, before, or the like. In addition, it should be noted that the output of the previous process is used in the subsequent process, so that it can be realized in any order unless it is used. Regarding the operation flow in the claims, the specification, and the drawings, the description is made by using "priority", "next,", and the like for convenience, but it does not mean that it is essential to carry out in this order.

10 wafers 20 wafer trays
100 test device 110 conveying unit
116 Robot Arm 130 Load Unit
132 loading table 134 loading gate
150 Front Opening Unified Pod (FOUP) 160 Body Unit
170 Alignment Unit 172 Alignment Stage
200 test heads in 201 cases
202 Contactor 210 Pin Electronics
220 motherboard 222 angle connector
224 Relay Connector 226 Angle Connector
228 Small Board 230 Flat Cable
240 support substrate 250 three-dimensional actuator
260 Contactor Board 270 Sub Board
280 contactor housing 300 probe card
312 Upper frame 314 Lower frame
316 screw 320 wiring board
323 Contact Pad 330 Guide Unit
340 elastic connector 341 elastic contactor
342 frame plate 344 opening
346 openings 350 interpoders
351 Contact Pads 352 Base Boards
353 contact pads 354 opening
355 wiring 360 elastic connector
361 elastic contactor 362 frame plate
364 opening 366 opening
370 Sheet Geometry Connectors 371 Contact Pads
372 elastic sheet 373 bump
374 opening 375 wiring
376 Cast Frame 400 Elastic Connector
410 frame plate 414 opening
416 opening 420 elastic contactor
422 electrode holder 424 through electrode
426 UV irradiation stripping tape 432 upper holder
434 Lower Holder 600 Elastic Connector
610 frame plate 616 opening
618 pin 620 elastic contactor
622 electrode holder 624 through electrode
626 opening 628 opening
632 Upper Holder 634 Lower Holder

Claims (26)

In the energization member detachably arranged in the opening provided in the frame of the test head which tests a device under test, and the connection member which electrically connects the device under test,
A conductive portion electrically connecting the test head and the device under test; And
A holding part having elasticity and holding the conductive part
Including,
The holding portion includes a convex portion fitted into the opening and a locking portion detachably coupled to the surface of the frame and not fitted into the opening.
Removably held to the frame by the force generated between the convex portion and the side surface of the opening and the engagement of the locking portion and the surface of the frame,
Absence of current.
The method of claim 1,
The locking portion includes a coupling opening that can engage with a protrusion provided on the surface of the frame,
Absence of current.
In the energization member detachably arranged in the opening provided in the frame of the test head which tests a device under test, and the connection member which electrically connects the device under test,
A conductive portion electrically connecting the test head and the device under test; And
A holding part having elasticity and holding the conductive part
Including,
The holding portion includes a locking portion detachably coupled to the surface of the frame and not fitted into the opening,
The locking portion includes a coupling opening that can engage with a protrusion provided on the surface of the frame member,
Absence of current.
4. The method according to any one of claims 1 to 3,
Removably held to the frame by the pressure difference between the area sealed by the frame and the holding portion and the outside of the sealed area,
Absence of current.
4. The method according to any one of claims 1 to 3,
Inside the locking portion,
Hollow area; And
An opening in communication with the outside of the hollow region and the locking portion
Installed,
Absence of current.
The method of claim 5,
The hollow area is closed by the frame and the holding part by blocking the opening with the opening communicating with the outside of the hollow area and the locking part.
Absence of current.
4. The method according to any one of claims 1 to 3,
Removably held to the frame by the elasticity of the holding portion,
Absence of current.
4. The method according to any one of claims 1 to 3,
The conductive portion has elasticity,
Absence of current.
4. The method according to any one of claims 1 to 3,
The conductive portion protrudes from the surface of the holding portion,
Absence of current.
4. The method according to any one of claims 1 to 3,
The outline of at least one cross section of the holding portion is T-shaped, cross-shaped, H-shaped, Y-shaped, or rectangular,
Absence of current.
4. The method according to any one of claims 1 to 3,
The conductive portion penetrates the holding portion,
The said holding part has insulation,
Absence of current.
A connecting member for electrically connecting a test head for testing a device under test and a device under test,
A frame having an opening; And
An electricity-carrying member detachably disposed in the opening and electrically connecting the test head and the device under test;
Including,
The energization member,
A conductive portion electrically connecting the test head and the device under test; And
A holding part having elasticity and holding the conductive part
Including,
The holding portion includes a convex portion fitted into the opening and a locking portion detachably coupled to the surface of the frame and not fitted into the opening.
The energizing member is detachably held to the frame by the force generated between the convex portion and the side surface of the opening, and the engagement of the locking portion and the surface of the frame.
Connection member.
The method of claim 12,
The cross-sectional area when the convex portion is cut off at a surface perpendicular to the opening direction of the opening is larger than the cross-sectional area when the opening is cut off at the surface perpendicular to the opening direction of the opening,
Connection member.
The method of claim 12,
The frame includes a protrusion on the surface,
The locking portion includes a coupling opening into which the protrusion is fitted,
Connection member.
The method of claim 13,
The frame includes a protrusion on the surface,
The locking portion includes a coupling opening into which the protrusion is fitted,
Connection member.
A connecting member for electrically connecting a test head for testing a device under test and a device under test,
A frame having an opening; And
An electricity-carrying member detachably disposed in the opening and electrically connecting the test head and the device under test;
Including,
The energization member,
A conductive portion electrically connecting the test head and the device under test; And
A holding part having elasticity and holding the conductive part
Including
The frame includes a protrusion on the surface,
The holding portion includes a locking portion detachably coupled to the surface of the frame and not fitted into the opening,
The locking portion includes a coupling opening into which the protrusion is fitted,
Connection member.
The method according to any one of claims 14 to 16,
The cross-sectional area when the coupling opening is cut in the plane perpendicular to the penetrating direction of the coupling opening is larger than the cross-sectional area when the protrusion is cut in the plane perpendicular to the penetrating direction of the coupling opening.
Connection member.
The method according to any one of claims 14 to 16,
The protrusions have irregularities on the surface,
Connection member.
The method according to any one of claims 12 to 16,
Removably held to the frame by the pressure difference between the area sealed by the frame and the holding portion and the outside of the sealed area,
Connection member.
The method according to any one of claims 12 to 16,
Inside the locking portion,
Hollow area; And
An opening in communication with the outside of the hollow region and the locking portion
Installed,
Connection member.
The method of claim 20,
The hollow area is closed by the frame and the holding part by blocking the opening with the opening communicating with the outside of the hollow area and the locking part.
Connection member.
The method according to any one of claims 12 to 16,
The energizing member is held in the frame by the elasticity of the holding portion,
Connection member.
The method according to any one of claims 12 to 16,
The frame has irregularities on the side of the opening,
Connection member.
The method according to any one of claims 12 to 16,
The contour of the cross section when the holding portion is cut in the direction from the surface on the test head side of the frame toward the surface on the device under test side of the frame is T-shaped, cross-shaped, H-shaped, Y-shaped or rectangular.
Connection member.
A test head for testing the device under test;
A main body supplying a test pattern to the test head; And
The connecting member according to any one of claims 12 to 16, which electrically connects the test head and the device under test.
Including,
tester.
In the method of repairing the connection member of any one of Claims 12-16,
Removing the energizing member disposed in the opening from the frame; And
Disposing the other conducting member in the opening;
Including,
The method of repairing a connection member.

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