KR100992182B1 - 안과용 양안 파면 측정 시스템 - Google Patents

안과용 양안 파면 측정 시스템 Download PDF

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Publication number
KR100992182B1
KR100992182B1 KR1020067011767A KR20067011767A KR100992182B1 KR 100992182 B1 KR100992182 B1 KR 100992182B1 KR 1020067011767 A KR1020067011767 A KR 1020067011767A KR 20067011767 A KR20067011767 A KR 20067011767A KR 100992182 B1 KR100992182 B1 KR 100992182B1
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South Korea
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eye
light
delete delete
wavefront
optical
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Expired - Fee Related
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KR1020067011767A
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Korean (ko)
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KR20070004550A (ko
Inventor
로렌스 와덴
안드레아스 더블유. 드레허
게리 디. 밀스
슈이 티. 라이
윌리엄 지. 푸트
데이빗 지. 샌들러
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오프소닉스 인코포레이티드
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Priority claimed from US10/971,937 external-priority patent/US20050105044A1/en
Priority claimed from US10/971,769 external-priority patent/US7425067B2/en
Application filed by 오프소닉스 인코포레이티드 filed Critical 오프소닉스 인코포레이티드
Publication of KR20070004550A publication Critical patent/KR20070004550A/ko
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0228Testing optical properties by measuring refractive power
    • G01M11/0235Testing optical properties by measuring refractive power by measuring multiple properties of lenses, automatic lens meters
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/1015Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for wavefront analysis
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/103Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for determining refraction, e.g. refractometers, skiascopes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0242Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G01M11/0264Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Veterinary Medicine (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Medical Informatics (AREA)
  • Molecular Biology (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Biomedical Technology (AREA)
  • Ophthalmology & Optometry (AREA)
  • Biophysics (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Geometry (AREA)
  • Eye Examination Apparatus (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
KR1020067011767A 2003-11-14 2004-10-29 안과용 양안 파면 측정 시스템 Expired - Fee Related KR100992182B1 (ko)

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
US52029403P 2003-11-14 2003-11-14
US60/520,294 2003-11-14
US58112704P 2004-06-18 2004-06-18
US60/581,127 2004-06-18
US10/971,937 2004-10-22
US10/971,937 US20050105044A1 (en) 2003-11-14 2004-10-22 Lensometers and wavefront sensors and methods of measuring aberration
US10/971,769 US7425067B2 (en) 2003-11-14 2004-10-22 Ophthalmic diagnostic instrument
US10/971,769 2004-10-22

Publications (2)

Publication Number Publication Date
KR20070004550A KR20070004550A (ko) 2007-01-09
KR100992182B1 true KR100992182B1 (ko) 2010-11-05

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EP (3) EP1690072A2 (enExample)
JP (2) JP4668204B2 (enExample)
KR (1) KR100992182B1 (enExample)
AU (1) AU2004291042B2 (enExample)
WO (2) WO2005048829A2 (enExample)

Families Citing this family (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101248492B1 (ko) * 2005-07-29 2013-04-03 알콘 리프랙티브호리존스, 인코포레이티드 안과용 장치의 위치결정 시스템 및 관련 방법
US8820929B2 (en) * 2006-01-20 2014-09-02 Clarity Medical Systems, Inc. Real-time measurement/display/record/playback of wavefront data for use in vision correction procedures
US8506083B2 (en) 2011-06-06 2013-08-13 Clarity Medical Systems, Inc. Compact wavefront sensor module and its attachment to or integration with an ophthalmic instrument
FR2897426B1 (fr) * 2006-02-16 2012-07-27 Onera (Off Nat Aerospatiale) Procede d'analyse de surface d'onde par interferometrie multilaterale a difference de frequences
EP1999443B1 (en) 2006-03-14 2017-12-27 AMO Manufacturing USA, LLC Spatial frequency wavefront sensor system and method
JP2008246153A (ja) * 2007-03-30 2008-10-16 Topcon Corp 検眼装置及びその方法
JP5608892B2 (ja) * 2008-07-25 2014-10-22 東海光学株式会社 レンズ評価方法
JP5335922B2 (ja) * 2008-09-29 2013-11-06 サイファイ メドテック エッセ.エッレ.エッレ. カスタマイズされたバイオメトリック眼内レンズを設計および移植するためのシステムおよび方法
KR100900899B1 (ko) * 2009-03-17 2009-06-03 국방과학연구소 소화기 사격통제용 복합광학계
JP5265425B2 (ja) * 2009-03-19 2013-08-14 オリンパス株式会社 干渉計による2次元位相デ−タのアンラップ方法および装置
JP5237869B2 (ja) * 2009-04-08 2013-07-17 株式会社トプコン 模型眼
JP2010252994A (ja) * 2009-04-24 2010-11-11 Topcon Corp 眼科装置
JP2010286434A (ja) * 2009-06-15 2010-12-24 Brother Ind Ltd 動的面形状測定装置および動的面形状測定方法
JP5394902B2 (ja) * 2009-11-27 2014-01-22 株式会社トプコン 眼科装置
CN101947157B (zh) * 2009-12-18 2012-02-15 中国科学院光电技术研究所 人眼自适应光学视知觉学习训练仪
CN101947158B (zh) * 2009-12-18 2012-07-04 中国科学院光电技术研究所 双眼自适应光学视知觉学习训练仪
JP5641744B2 (ja) * 2010-02-10 2014-12-17 キヤノン株式会社 撮像装置及びその制御方法
KR101325988B1 (ko) 2010-10-29 2013-11-07 엘지디스플레이 주식회사 입체 디스플레이의 광학 측정 장치 및 방법
GB2484998B (en) * 2010-10-29 2014-08-20 Lg Display Co Ltd Optical measuring apparatus and measuring method of stereoscopic display device
EP2596745B1 (en) * 2011-10-07 2019-06-19 Popovic, Zoran Reference calibration for an adaptive optics system
EP2809220A4 (en) * 2012-02-03 2015-04-08 Digitalvision Llc REFRACTOMETER WITH A COMPARATIVE SEH CORRECTION SIMULATOR
FR2992843B1 (fr) * 2012-07-06 2016-05-06 Essilor Int Dispositif et procede de mesure de refraction oculaire objective et d'au moins un parametre geometrico-morphologique d'un individu
JP6000773B2 (ja) * 2012-09-13 2016-10-05 キヤノン株式会社 収差推定方法、プログラムおよび撮像装置
WO2014083392A1 (en) * 2012-11-28 2014-06-05 Perfect Vision Technology, Ltd. Methods and systems for automated measurement of the eyes and delivering of sunglasses and eyeglasses
CN105578947B (zh) * 2013-07-02 2018-10-26 麻省理工学院 确定眼处方的装置和方法
EP3242585A1 (en) * 2015-01-09 2017-11-15 Smart Vision Labs, Inc. Portable wavefront aberrometer with open field alignment channel
WO2016184571A2 (de) * 2015-05-20 2016-11-24 Carl Zeiss Smt Gmbh Messverfahren und messanordnung für ein abbildendes optisches system
JP6821361B2 (ja) * 2016-09-05 2021-01-27 キヤノン株式会社 計測装置、光学機器の製造方法および光学機器の製造装置
US10595724B2 (en) * 2017-08-04 2020-03-24 Ho Wa LAI Adaptor for an image capture device for fundus photography
FR3082274B1 (fr) 2018-06-06 2021-11-19 Gaztransport Et Technigaz Cuve etanche et thermiquement isolante
KR102082747B1 (ko) * 2019-01-23 2020-02-28 연세대학교 산학협력단 초점거리 조절이 가능한 led 어레이 기반 3차원 이미징 장치 및 방법
EP3914144A4 (en) * 2019-01-24 2022-11-02 6 Over 6 Vision Ltd APPARATUS, SYSTEM AND METHOD FOR DETERMINING ONE OR MORE PARAMETERS OF A REFRACTION ERROR OF AN EYE TESTED
KR102771619B1 (ko) 2019-03-11 2025-02-25 삼성전자주식회사 영상의 횡이동이 가능한 디스플레이 장치
JP6581325B1 (ja) * 2019-06-12 2019-09-25 株式会社アサヒビジョン レンズ光学特性測定装置、レンズ光学特性測定方法、プログラム、及び、記録媒体。
CN110274696B (zh) * 2019-06-26 2020-11-06 中国科学院长春光学精密机械与物理研究所 大视场主动光学望远镜的波前传感方法、装置、及系统
AU2020358938B2 (en) 2019-09-30 2026-01-22 Alcon Inc. Improved ocular aberrometry recovery systems and methods
KR20230146387A (ko) * 2022-04-12 2023-10-19 주식회사 휴비츠 안경 렌즈의 근적외선 투과율을 측정할 수 있는 렌즈미터
CN117357056A (zh) * 2023-11-03 2024-01-09 瑞尔明康(浙江)医疗科技有限公司 人眼测量装置及人眼测量方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003050472A1 (en) 2001-12-10 2003-06-19 Ophthonix, Inc. Systems and methods for wavefront measurement

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57211504A (en) * 1981-06-24 1982-12-25 Canon Inc Observation member for talbot interferometer
JPH0761312B2 (ja) * 1990-04-27 1995-07-05 キヤノン株式会社 眼屈折計
US5777718A (en) * 1992-12-31 1998-07-07 Canon Kabushiki Kaisha Eye refractometer
EP0663179A1 (en) * 1994-01-12 1995-07-19 Ciba-Geigy Ag Spatial refractometer
US5838424A (en) * 1997-02-26 1998-11-17 Welch Allyn, Inc. View port for eye test apparatus
JP3823266B2 (ja) * 1997-05-13 2006-09-20 株式会社トプコン 光学特性測定装置
US5963300A (en) * 1998-02-17 1999-10-05 Amt Technologies, Corp. Ocular biometer
US6002484A (en) * 1999-06-18 1999-12-14 Rozema; Jos J. Phase contrast aberroscope
CA2377162A1 (en) * 1999-07-27 2001-02-01 Amt Technologies, Corp. Ocular biometer
US6264328B1 (en) * 1999-10-21 2001-07-24 University Of Rochester Wavefront sensor with off-axis illumination
IL143503A0 (en) * 2001-05-31 2002-04-21 Visionix Ltd Aberration correction spectacle lens
US6631991B2 (en) * 2001-08-31 2003-10-14 Adaptive Optics Associates, Inc. Ophthalmic instrument having hartmann wavefront sensor deriving location of spots with spot fitting techniques
US6761454B2 (en) * 2002-02-13 2004-07-13 Ophthonix, Inc. Apparatus and method for determining objective refraction using wavefront sensing
US6634752B2 (en) * 2002-03-11 2003-10-21 Alcon, Inc. Dual-path optical system for measurement of ocular aberrations and corneal topometry and associated methods

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003050472A1 (en) 2001-12-10 2003-06-19 Ophthonix, Inc. Systems and methods for wavefront measurement

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Publication number Publication date
WO2005048829A2 (en) 2005-06-02
JP4668204B2 (ja) 2011-04-13
EP1691669A2 (en) 2006-08-23
WO2005052538A2 (en) 2005-06-09
WO2005048829A3 (en) 2005-08-18
JP2007511278A (ja) 2007-05-10
EP1691669B1 (en) 2018-03-28
EP1690072A2 (en) 2006-08-16
WO2005052538A3 (en) 2005-12-01
KR20070004550A (ko) 2007-01-09
AU2004291042A1 (en) 2005-06-02
JP4832310B2 (ja) 2011-12-07
AU2004291042B2 (en) 2010-10-14
EP3001945A3 (en) 2016-10-26
EP3001945B1 (en) 2021-01-27
EP3001945A2 (en) 2016-04-06
JP2007527526A (ja) 2007-09-27

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