KR100959231B1 - A curable composition, a cured film, an antireflective film, and a method for producing the cured film - Google Patents
A curable composition, a cured film, an antireflective film, and a method for producing the cured film Download PDFInfo
- Publication number
- KR100959231B1 KR100959231B1 KR1020080019897A KR20080019897A KR100959231B1 KR 100959231 B1 KR100959231 B1 KR 100959231B1 KR 1020080019897 A KR1020080019897 A KR 1020080019897A KR 20080019897 A KR20080019897 A KR 20080019897A KR 100959231 B1 KR100959231 B1 KR 100959231B1
- Authority
- KR
- South Korea
- Prior art keywords
- meth
- cured film
- acrylate
- refractive index
- film
- Prior art date
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- G03F7/028—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
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- C08F2/48—Polymerisation initiated by wave energy or particle radiation by ultraviolet or visible light
- C08F2/50—Polymerisation initiated by wave energy or particle radiation by ultraviolet or visible light with sensitising agents
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F290/00—Macromolecular compounds obtained by polymerising monomers on to polymers modified by introduction of aliphatic unsaturated end or side groups
- C08F290/08—Macromolecular compounds obtained by polymerising monomers on to polymers modified by introduction of aliphatic unsaturated end or side groups on to polymers modified by introduction of unsaturated side groups
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- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
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- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/091—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers characterised by antireflection means or light filtering or absorbing means, e.g. anti-halation, contrast enhancement
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Abstract
본 발명은, 보다 굴절률이 낮은 경화막이 얻어지는 광 경화성 조성물, 경화막의 제조 방법을 제공한다.This invention provides the photocurable composition in which the cured film with a lower refractive index is obtained, and the manufacturing method of a cured film.
본 발명의 경화막의 제조 방법은,The manufacturing method of the cured film of this invention,
(A) 실리카를 주성분으로 하는 입자, (A) particles containing silica as a main component,
(B) 분자 내에 1개 이상의 (메트)아크릴로일기를 갖는 화합물, (B) a compound having at least one (meth) acryloyl group in a molecule,
(C) 수용성이며, 중합성 불포화기를 갖지 않는, 겔 투과 크로마토그래피로 측정한 폴리스티렌 환산의 중량 평균 분자량이 200 내지 20,000인 화합물, (C) a compound having a weight average molecular weight of 200 to 20,000 in terms of polystyrene measured by gel permeation chromatography, which is water-soluble and does not have a polymerizable unsaturated group,
(D) 광 중합 개시제(D) photoinitiator
를 함유하는 광 경화성 조성물을 도포하는 공정, 광 조사하는 공정 및 물에 침지하는 공정을 포함한다.The process of apply | coating the photocurable composition containing this, the process of light irradiation, and the process immersed in water are included.
광 경화성 조성물, 경화막, 반사 방지막 Photocurable composition, cured film, antireflection film
Description
본 발명은, 광 경화성 조성물 및 이것을 경화하여 이루어지는 경화막 및 경화막의 제조 방법에 관한 것이다. 보다 상세하게는, 저굴절률의 경화막을 제공하는 광 경화성 조성물에 관한 것이다.This invention relates to the photocurable composition and the manufacturing method of the cured film and cured film which harden this. More specifically, it is related with the photocurable composition which provides the cured film of low refractive index.
액정 표시 패널, 냉음극선관 패널, 플라즈마 디스플레이 등의 각종 표시 패널에서 외광의 비침을 방지하고, 화질을 향상시키기 위해, 저굴절률성, 내찰상성, 도공성 및 내구성이 우수한 경화물을 포함하는 저굴절률층을 포함하는 반사 방지막이 요구되고 있다.Low refractive index including hardened material excellent in low refractive index, scratch resistance, coating property and durability in order to prevent external light from shining and to improve image quality in various display panels such as liquid crystal display panels, cold cathode ray tube panels, plasma displays, and the like. There is a need for an antireflection film including a layer.
반사 방지막은, 굴절률이 상이한 투명 박막을 1/4 파장 두께로 적층함으로써, 광학적으로 표면 반사율을 낮게 억제하는 것이다. 반사 방지 효과가 높은 반사 방지막을 구성하기 위해, 보다 굴절률이 낮은 투명 박막을 형성할 수 있는 저굴절률막용 재료가 요구되고 있으며, 굴절률이 낮은 불소 원자를 함유하는 수지 등이 폭넓게 검토되고 있다.The antireflection film is to suppress the surface reflectance low optically by laminating transparent thin films having different refractive indices at a quarter wavelength thickness. In order to form an antireflection film having a high antireflection effect, a low refractive index film material capable of forming a transparent thin film having a lower refractive index is desired, and a resin containing a fluorine atom having a low refractive index is widely studied.
또한, 보다 저반사율의 반사 방지막을 제공하기 위해, 종래보다 더욱 저굴절률을 갖는 저굴절률막용 재료가 요망되고 있다. 따라서 아크릴 등의 수지 성분보다 공기의 굴절률이 낮은 것을 이용하여, 다공질 입자나 중공 입자 등의 입자 내부에 공극을 갖는 입자(이하, 총칭으로서 "중공 입자"라고 함)를 사용한 기술이 알려져 있다(예를 들면, 하기 특허 문헌 1 내지 3).Moreover, in order to provide the antireflection film of a low reflectance, the low refractive index film material which has a lower refractive index than before is desired. Therefore, the technique using the particle | grains which have a void | gap inside a particle | grains, such as porous particle | grains and hollow particle | grains (henceforth collectively called "hollow particle"), is known using what is lower in refractive index of air than resin components, such as acrylic (for example, For example,
한편, 소위 필터로서 사용되는 다공질 고분자막의 제조 방법으로서, 경화막 제조 후, 경화막 중에 존재하는 물 또는 유기 용제에 용해된 성분을 용출시켜 다공질막으로 하는 기술이 알려져 있다(예를 들면, 하기 특허 문헌 4, 5). 이 기술에 의해 제조되는 다공질막의 막 두께는 통상적으로 200 ㎛ 정도이며, 경화막 제조용 조성물에 입자 성분이 포함되어 있지 않다.On the other hand, as a manufacturing method of the porous polymer membrane used as a so-called filter, the technique which makes a porous membrane eluting the component melt | dissolved in the water or the organic solvent which exists in a cured film after manufacture of a cured film is known (for example, the following patent)
[특허 문헌 1] 일본 특허 공개 제2003-139906호 공보[Patent Document 1] Japanese Unexamined Patent Publication No. 2003-139906
[특허 문헌 2] 일본 특허 공개 제2002-317152호 공보[Patent Document 2] Japanese Unexamined Patent Publication No. 2002-317152
[특허 문헌 3] 일본 특허 공개 (평)10-142402호 공보[Patent Document 3] Japanese Unexamined Patent Publication No. 10-142402
[특허 문헌 4] 일본 특허 공개 (소)59-62648호 공보[Patent Document 4] Japanese Unexamined Patent Publication No. 59-62648
[특허 문헌 5] 일본 특허 공개 (평)5-271460호 공보[Patent Document 5] Japanese Patent Application Laid-Open No. 5-271460
본 발명은, 보다 굴절률이 낮은 경화막을 제조하기 위한 광 경화성 조성물, 및 그로부터 경화막을 제조한 후, 경화막 중의 특정 성분을 제거함으로써 보다 굴절률이 낮은 경화막을 얻는 방법을 제공하는 것을 목적으로 한다.An object of the present invention is to provide a photocurable composition for producing a cured film having a lower refractive index and a method for obtaining a cured film having a lower refractive index by removing a specific component in the cured film after producing the cured film therefrom.
상기 목적을 달성하기 위해, 본 발명자들은 예의 연구를 행하여, 실리카를 주성분으로 하는 입자, (메트)아크릴레이트 단량체, 폴리에틸렌글리콜 및 광 중합 개시제를 함유하는 광 경화성 조성물을 경화시켜 얻은 경화막을 물에 침지하여 폴리에틸렌글리콜을 용출시키면, 경화막 내에 나노 오더의 공경을 갖는 공극이 형성되어 경화막이 보다 저굴절률이 된다는 것을 발견하여, 본 발명을 완성시켰다.In order to achieve the above object, the present inventors intensively immersed the cured film obtained by hardening the photocurable composition containing the particle | grains which have a silica as a main component, a (meth) acrylate monomer, polyethyleneglycol, and a photoinitiator, in water. When the polyethylene glycol was eluted, it was found that voids having a nano-order pore size were formed in the cured film, and the cured film was made to have a lower refractive index, thereby completing the present invention.
본 발명은, 하기의 광 경화성 조성물, 이것을 경화시켜 이루어지는 경화막, 경화막의 제조 방법을 제공한다.This invention provides the following photocurable composition, the cured film formed by hardening this, and the manufacturing method of a cured film.
[1] (A) 실리카를 주성분으로 하는 입자, [1] (A) particles mainly containing silica,
(B) 분자 내에 1개 이상의 (메트)아크릴로일기를 갖는 화합물, (B) a compound having at least one (meth) acryloyl group in a molecule,
(C) 수용성이며, 중합성 불포화기를 갖지 않는, 겔 투과 크로마토그래피로 측정한 폴리스티렌 환산의 중량 평균 분자량이 200 내지 20,000인 화합물, (C) a compound having a weight average molecular weight of 200 to 20,000 in terms of polystyrene measured by gel permeation chromatography, which is water-soluble and does not have a polymerizable unsaturated group,
(D) 광 중합 개시제(D) photoinitiator
를 함유하는 광 경화성 조성물을 기재에 도포하여 도막을 형성하는 공정, 상기 도막에 광 조사하는 공정 및 상기 광 조사한 도막을 물에 침지하는 공정을 포함 하는 경화막의 제조 방법.A method for producing a cured film, comprising: applying a photocurable composition containing a substrate to a substrate to form a coating film, a step of irradiating the coating film with light, and a step of immersing the coated film with light in water.
[2] (A) 실리카를 주성분으로 하는 입자, [2] (A) particles mainly containing silica,
(B) 분자 내에 1개 이상의 (메트)아크릴로일기를 갖는 화합물, (B) a compound having at least one (meth) acryloyl group in a molecule,
(C) 수용성이며, 중합성 불포화기를 갖지 않는, 겔 투과 크로마토그래피로 측정한 폴리스티렌 환산의 중량 평균 분자량이 200 내지 20,000인 화합물, (C) a compound having a weight average molecular weight of 200 to 20,000 in terms of polystyrene measured by gel permeation chromatography, which is water-soluble and does not have a polymerizable unsaturated group,
(D) 광 중합 개시제(D) photoinitiator
를 함유하는 저굴절률층 형성용 광 경화성 조성물.The photocurable composition for low refractive index layer formation containing.
[3] 상기 [2]에 있어서, 상기 (A) 실리카를 주성분으로 하는 입자가 중공 입자인 저굴절률층 형성용 광 경화성 조성물.[3] The photocurable composition for forming a low refractive index layer according to the above [2], wherein the particles containing (A) silica as a main component are hollow particles.
[4] 상기 [2] 또는 [3]에 있어서, 상기 (C)의 화합물의 배합량이 상기 (A) 내지 (D) 성분의 합계량을 100 중량%로 했을 때, 5 내지 50 중량%인 저굴절률층 형성용 광 경화성 조성물.[4] The low refractive index according to the above [2] or [3], wherein the compounding amount of the compound (C) is 5 to 50% by weight when the total amount of the components (A) to (D) is 100% by weight. Photocurable composition for layer formation.
[5] 상기 [2] 내지 [4] 중 어느 하나에 있어서, 상기 (B) 분자 내에 1개 이상의 (메트)아크릴로일기를 갖는 화합물이 분자 내에 2개 이상의 (메트)아크릴로일기를 갖는 화합물인 저굴절률층 형성용 광 경화성 조성물.[5] The compound according to any one of [2] to [4], wherein the compound having one or more (meth) acryloyl groups in the molecule (B) has two or more (meth) acryloyl groups in the molecule. The photocurable composition for phosphorus low refractive index layer formation.
[6] 상기 [2] 내지 [5] 중 어느 하나에 있어서, 추가로 (E) 유기 용제를 함유하는 저굴절률층 형성용 광 경화성 조성물.[6] The photocurable composition for forming a low refractive index layer according to any one of the above [2] to [5], further comprising (E) an organic solvent.
[7] 상기 [1]에 기재된 제조 방법에 의해 얻어지는 경화막.[7] A cured film obtained by the production method described in [1] above.
[8] 상기 [7]에 기재된 경화막을 포함하는 저굴절률층을 포함하는 반사 방지막.[8] An antireflection film comprising a low refractive index layer containing the cured film according to the above [7].
본 발명에 따르면, 간편한 방법으로 보다 굴절률이 낮은 경화막을 제조할 수 있다.According to the present invention, a cured film having a lower refractive index can be produced by a simple method.
I. 광 경화성 조성물I. Photocurable Compositions
본 발명의 광 경화성 조성물(이하, 본 발명의 조성물이라고 함)은, 하기 성분 (A) 내지 (F)를 포함할 수 있다. 성분 (A) 내지 (D)는 필수 성분이며, 성분 (E), (F)는 필요에 따라 첨가되는 임의 성분이다.The photocurable composition (henceforth a composition of this invention) of this invention can contain the following components (A)-(F). Components (A)-(D) are essential components, and components (E) and (F) are optional components added as needed.
(A) 실리카를 주성분으로 하는 입자(A) Particles based on silica
(B) 분자 내에 1개 이상의 (메트)아크릴로일기를 갖는 화합물(B) a compound having at least one (meth) acryloyl group in the molecule
(C) 수용성이며, 중합성 불포화기를 갖지 않는, 겔 투과 크로마토그래피로 측정한 폴리스티렌 환산의 중량 평균 분자량이 200 내지 20,000인 화합물(C) A compound having a weight average molecular weight of 200 to 20,000 in terms of polystyrene measured by gel permeation chromatography, which is water-soluble and does not have a polymerizable unsaturated group.
(D) 광 중합 개시제(D) photoinitiator
(E) 유기 용제(E) organic solvent
(F) 각종 첨가제(F) various additives
이하, 각 성분에 대하여 설명한다.Hereinafter, each component is demonstrated.
(A) 실리카를 주성분으로 하는 입자(A) Particles based on silica
실리카를 주성분으로 하는 입자(이하, "실리카 입자"라고 함)로서는, 중실 또는 중공 입자를 사용할 수 있다. 또한, 중실 입자와 중공 입자를 병용할 수도 있다. 상기 입자는 저굴절률층의 도막 강도를 발현시키는 기능을 갖는다. 또한, 중공 입자를 사용한 경우, 저굴절률화를 도모할 수 있다. 또한, 연쇄 구상 입자 등 부정형 입자를 사용함으로써, 내부 공극 및 표면 요철에 의해 저굴절률화를 도모할 수 있다.Solid or hollow particles can be used as particles containing silica as a main component (hereinafter referred to as "silica particles"). Moreover, solid particle | grains and hollow particle | grains can also be used together. The particles have a function of expressing the coating film strength of the low refractive index layer. Moreover, when a hollow particle is used, low refractive index can be aimed at. In addition, by using amorphous particles such as chain spherical particles, low refractive index can be achieved by internal voids and surface irregularities.
본 발명에서 사용하는 실리카 입자로서는 공지된 것을 사용할 수 있고, 그 형상도 구상으로 한정되지 않으며, 부정형의 입자일 수도 있다. 동적 광산란법으로 구한 실리카 입자의 수 평균 입경은 1 내지 100 ㎚인 것이 바람직하고, 5 내지 80 ㎚인 것이 보다 바람직하고, 5 내지 60 ㎚인 것이 더욱 바람직하다.As a silica particle used by this invention, a well-known thing can be used, The shape is also not limited to spherical form, Amorphous particle may be sufficient. It is preferable that the number average particle diameter of the silica particle calculated | required by the dynamic light scattering method is 1-100 nm, It is more preferable that it is 5-80 nm, It is still more preferable that it is 5-60 nm.
또한, 본 발명에서 실리카 입자는 본 발명의 조성물이 경화될 때, 경화막 내에서 후술하는 (B) 분자 내에 1개 이상의 (메트)아크릴로일기를 갖는 화합물의 중합체와 (C)의 화합물이 상 분리되어 각각의 큰 덩어리가 되는 것을 방해하고, 이들 성분의 상 분리를 작은 크기로 억제하여, 나노 오더의 (C)의 화합물의 덩어리가 경화막 내에 산재하는 경화막으로 하는 기능을 갖는다.In addition, in the present invention, when the composition of the present invention is cured, the silica particles differ from each other in the polymer of the compound having at least one (meth) acryloyl group in the (B) molecule in the cured film and the compound of (C). It separates and prevents each large lump, and the phase separation of these components is suppressed to a small size, and it has a function which makes the lump of the compound of (C) of a nano order scattered in a cured film.
실리카 입자가 존재하지 않는 경우에는, (C)의 화합물이 경화막 내에서 보다 큰 공경을 갖는 덩어리를 형성하고, 경화막으로부터 (C)의 화합물을 제거하면, 보다 큰 공경의 공극이 생성되어, 얻어지는 경화막의 헤이즈가 높아진다(후술하는 표 2를 참조).In the absence of silica particles, when the compound of (C) forms a lump having a larger pore size in the cured film, and the compound of (C) is removed from the cured film, a larger pore void is formed. The haze of the cured film obtained becomes high (refer Table 2 mentioned later).
본 발명에서 사용하는 실리카 입자는 분체상일 수도 있고, 분산액일 수도 있다.The silica particles used in the present invention may be in powder form or may be in dispersion.
실리카 입자의 분산매는 물 또는 유기 용매가 바람직하다. 유기 용매로서는 메탄올, 이소프로필알코올, 에틸렌글리콜, 부탄올, 에틸렌글리콜모노프로필에테르 등의 알코올류; 메틸에틸케톤, 메틸이소부틸케톤 등의 케톤류; 톨루엔, 크실렌 등의 방향족 탄화수소류; 디메틸포름아미드, 디메틸아세트아미드, N-메틸피롤리돈 등의 아미드류; 아세트산에틸, 아세트산부틸, γ-부티로락톤 등의 에스테르류; 테트라히드로푸란, 1,4-디옥산 등의 에테르류 등의 유기 용제를 들 수 있고, 이들 중에서 알코올류 및 케톤류가 바람직하다. 이들 유기 용제는 단독으로 또는 2종 이상 혼합하여 분산매로서 사용할 수 있다.The dispersion medium of the silica particles is preferably water or an organic solvent. As an organic solvent, Alcohol, such as methanol, isopropyl alcohol, ethylene glycol, butanol, ethylene glycol monopropyl ether; Ketones such as methyl ethyl ketone and methyl isobutyl ketone; Aromatic hydrocarbons such as toluene and xylene; Amides such as dimethylformamide, dimethylacetamide and N-methylpyrrolidone; Esters such as ethyl acetate, butyl acetate and γ-butyrolactone; Organic solvents, such as ethers, such as tetrahydrofuran and a 1, 4- dioxane, are mentioned, Among these, alcohol and ketones are preferable. These organic solvents can be used individually or in mixture of 2 or more types as a dispersion medium.
실리카를 주성분으로 하는 중실 구상 입자의 시판품으로서는, 예를 들면 콜로이달 실리카로서 닛산 가가꾸 고교(주) 제조 상품명: 메탄올 실리카졸, IPA-ST, MEK-ST, MEK-ST-S, MEK-ST-L, IPA-ZL, NBA-ST, XBA-ST, DMAC-ST, ST-OUP, ST-20, ST-40, ST-C, ST-N, ST-O, ST-50, ST-OL 등을 들 수 있다. 또한, 부정형 입자로서는 닛산 가가꾸 고교(주) 제조 상품명: 스노우 텍스-PS-M, PS-S, PS-SO, UP, OUP, 후요 가가꾸 고교(주) 제조 상품명: PL-1, PL-2, PL-3, PL-3H 등을 들 수 있다. 또한, 중공 입자로서는 쇼꾸바이 가가꾸 고교(주) 제조 상품명: JX1008SIV, JX1009SIV, JX1010SIV, JX1011SIV 등을 들 수 있다.As a commercial item of the solid spherical particle which has a silica as a main component, Nissan Chemical Co., Ltd. make is a colloidal silica, for example.Methanol silica sol, IPA-ST, MEK-ST, MEK-ST-S, MEK-ST -L, IPA-ZL, NBA-ST, XBA-ST, DMAC-ST, ST-OUP, ST-20, ST-40, ST-C, ST-N, ST-O, ST-50, ST-OL Etc. can be mentioned. In addition, as an amorphous particle, Nissan Chemical Industries, Ltd. brand name: Snow-Tex-PS-M, PS-S, PS-SO, UP, OUP, Fuyo Chemical Co., Ltd. brand name: PL-1, PL- 2, PL-3, PL-3H, etc. are mentioned. Moreover, as a hollow particle, Shokubai Chemical Industries, Ltd. brand name: JX1008SIV, JX1009SIV, JX1010SIV, JX1011SIV, etc. are mentioned.
또한, 이들 콜로이달 실리카 표면에 화학 수식 등의 표면 처리를 행한 것을 사용할 수 있으며, 예를 들면 분자 중에 1개 이상의 알킬기를 갖는 가수분해성 규소 화합물 또는 그의 가수분해물을 함유하는 것 등을 반응시킬 수 있다. 이러한 가수분해성 규소 화합물로서는 트리메틸메톡시실란, 트리부틸메톡시실란, 디메틸디메톡시실란, 디부틸디메톡시실란, 메틸트리메톡시실란, 부틸트리메톡시실란, 옥틸트리메톡시실란, 도데실트리메톡시실란, 1,1,1-트리메톡시-2,2,2-트리메틸-디실란, 헥사메틸-1,3-디실록산, 1,1,1-트리메톡시-3,3,3-트리메틸-1,3-디실록산, α-트리메틸실릴-ω-디메틸메톡시실릴-폴리디메틸실록산, α-트리메틸실릴-ω-트리메톡시실릴-폴리디메틸실록산헥사메틸-1,3-디실라잔 등을 들 수 있다. 또한, 분자 중에 1 이상의 반응성기를 갖는 가수분해성 규소 화합물을 사용할 수도 있다. 분자 중에 1 이상의 반응성기를 갖는 가수분해성 규소 화합물은, 예를 들면 반응성기로서 NH2기를 갖는 것으로서 요소프로필트리메톡시실란, N-(2-아미노에틸)-3-아미노프로필트리메톡시실란 등, OH기를 갖는 것으로서 비스(2-히드록시에틸)-3-아미노트리프로필메톡시실란 등, 이소시아네이트기를 갖는 것으로서 3-이소시아네이트프로필트리메톡시실란 등, 티오시아네이트기를 갖는 것으로서 3-티오시아네이트프로필트리메톡시실란 등, 에폭시기를 갖는 것으로서 (3-글리시독시프로필)트리메톡시실란, 2-(3,4-에폭시시클로헥실)에틸트리메톡시실란 등, 티올기를 갖는 것으로서 3-머캅토프로필트리메톡시실란 등을 들 수 있다. 바람직한 화합물로서, 3-머캅토프로필트리메톡시실란을 들 수 있다.Moreover, those which surface-treated, such as a chemical formula, can be used for these colloidal silica surfaces, For example, what contains the hydrolyzable silicon compound which has one or more alkyl groups, or its hydrolyzate etc. can be made to react in a molecule | numerator. . Examples of such hydrolyzable silicon compounds include trimethylmethoxysilane, tributylmethoxysilane, dimethyldimethoxysilane, dibutyldimethoxysilane, methyltrimethoxysilane, butyltrimethoxysilane, octyltrimethoxysilane and dodecyltrimeth Methoxysilane, 1,1,1-trimethoxy-2,2,2-trimethyl-disilane, hexamethyl-1,3-disiloxane, 1,1,1-trimethoxy-3,3,3- Trimethyl-1,3-disiloxane, α-trimethylsilyl-ω-dimethylmethoxysilyl-polydimethylsiloxane, α-trimethylsilyl-ω-trimethoxysilyl-polydimethylsiloxanehexamethyl-1,3-disilazane Etc. can be mentioned. It is also possible to use hydrolyzable silicon compounds having at least one reactive group in the molecule. Hydrolyzable silicon compounds having one or more reactive in the molecule, for example as reaction with an NH 2 group as a component trimethoxysilane, N- (2- aminoethyl) -3-aminopropyl trimethoxysilane or the like, 3-thiocyanate propyl tri as having thiocyanate groups, such as 3-isocyanate propyl trimethoxysilane, etc. as having an isocyanate group, such as bis (2-hydroxyethyl) -3-aminotripropylmethoxysilane, etc. as having OH group 3-mercaptopropyl tree as having a thiol group, such as (3-glycidoxypropyl) trimethoxysilane, 2- (3,4-epoxycyclohexyl) ethyltrimethoxysilane, as having an epoxy group, such as methoxysilane Methoxysilane, etc. are mentioned. As a preferable compound, 3-mercaptopropyl trimethoxysilane is mentioned.
실리카 입자는, 중합성 불포화기를 포함하는 유기 화합물에 의해 표면 처리가 이루어진 것일 수도 있다. 이러한 표면 처리에 의해, 후술하는 (B)의 (메트)아크릴레이트 단량체와 공가교화할 수 있으며, 내찰상성이 향상된다. 본 발명에서 사용하는 특정 유기 화합물, 및 특정 유기 화합물에 의한 실리카 입자의 표면 처리 방법에 대해서는, 일본 특허 공개 (평)9-100111호 공보에 기재되어 있다.Silica particle may be surface-treated with the organic compound containing a polymerizable unsaturated group. By such a surface treatment, it can co-crosslink with the (meth) acrylate monomer of (B) mentioned later, and abrasion resistance improves. The specific organic compound used by this invention and the surface treatment method of the silica particle by a specific organic compound are described in Unexamined-Japanese-Patent No. 9-100111.
본 발명의 조성물 중에서의 (A) 성분의 배합량은, 유기 용제 이외의 조성물 전량에 대하여 통상적으로 10 내지 70 중량% 배합되며, 20 내지 70 중량%가 바람직하고, 30 내지 65 중량%가 보다 바람직하다. 10 중량% 미만이면 굴절률이 높아져 충분한 반사 방지 효과가 얻어지지 않게 될 우려가 있고, 70 중량% 이상이면 성막성이 악화될 우려가 있다.The compounding quantity of (A) component in the composition of this invention is mix | blended 10-70 weight% normally with respect to the composition whole quantity other than the organic solvent, 20-70 weight% is preferable and 30-65 weight% is more preferable. . If it is less than 10 weight%, there exists a possibility that a refractive index may become high and a sufficient antireflection effect may not be obtained, and when it is 70 weight% or more, there exists a possibility that film-forming property may deteriorate.
또한, (A) 실리카 입자의 양은 고형분을 의미하며, 입자가 용제 분산 졸의 형태로 사용될 때에는, 그 배합량에는 용제의 양을 포함시키지 않는다.In addition, the quantity of (A) silica particle means solid content, and when particle | grains are used in the form of a solvent dispersion sol, the quantity of a solvent is not included in the compounding quantity.
(B) 분자 내에 1개 이상의 (메트)아크릴로일기를 갖는 화합물(B) a compound having at least one (meth) acryloyl group in the molecule
분자 내에 1개 이상의 (메트)아크릴로일기를 갖는 화합물(이하, "(메트)아크릴레이트 화합물"이라고 하는 경우가 있음)은, 본 발명의 조성물을 경화하여 얻어지는 경화막의 형상을 유지하여, 경화막 및 이것을 사용한 반사 방지막의 내찰상성을 높이는 기능을 갖는다.A compound having one or more (meth) acryloyl groups in the molecule (hereinafter may be referred to as a "(meth) acrylate compound") maintains the shape of the cured film obtained by curing the composition of the present invention, and a cured film And a scratch resistance of the antireflection film using the same.
(메트)아크릴로일기를 1개 함유하는 화합물로서는 이소보르닐(메트)아크릴레이트, 보르닐(메트)아크릴레이트, 트리시클로데카닐(메트)아크릴레이트, 디시클로펜타닐(메트)아크릴레이트, 디시클로펜테닐(메트)아크릴레이트, 시클로헥실(메트)아크릴레이트 등의 지환식 구조 함유 (메트)아크릴레이트, 벤질(메트)아크릴레이트, 4-부틸시클로헥실(메트)아크릴레이트, 아크릴로일모르폴린, 비닐이미다졸, 비닐피리딘, 2-히드록시에틸(메트)아크릴레이트, 2-히드록시프로필(메트)아크릴레이트, 2-히드록시부틸(메트)아크릴레이트, 메틸(메트)아크릴레이트, 에틸(메트)아크릴레이트, 프로필(메트)아크릴레이트, 이소프로필(메트)아크릴레이트, 부틸(메트)아크릴레이트, 아밀(메트)아크릴레이트, 이소부틸(메트)아크릴레이트, t-부틸(메 트)아크릴레이트, 펜틸(메트)아크릴레이트, 이소아밀(메트)아크릴레이트, 헥실(메트)아크릴레이트, 헵틸(메트)아크릴레이트, 옥틸(메트)아크릴레이트, 이소옥틸(메트)아크릴레이트, 2-에틸헥실(메트)아크릴레이트, 노닐(메트)아크릴레이트, 데실(메트)아크릴레이트, 이소데실(메트)아크릴레이트, 운데실(메트)아크릴레이트, 도데실(메트)아크릴레이트, 라우릴(메트)아크릴레이트, 스테아릴(메트)아크릴레이트, 이소스테아릴(메트)아크릴레이트, 테트라히드로푸르푸릴(메트)아크릴레이트, 부톡시에틸(메트)아크릴레이트, 에톡시디에틸렌글리콜(메트)아크릴레이트, 벤질(메트)아크릴레이트, 페녹시에틸(메트)아크릴레이트, 폴리에틸렌글리콜모노(메트)아크릴레이트, 폴리프로필렌글리콜모노(메트)아크릴레이트, 메톡시에틸렌글리콜(메트)아크릴레이트, 에톡시에틸(메트)아크릴레이트, 메톡시폴리에틸렌글리콜(메트)아크릴레이트, 메톡시폴리프로필렌글리콜(메트)아크릴레이트, 디아세톤(메트)아크릴아미드, 이소부톡시메틸(메트)아크릴아미드, N,N-디메틸(메트)아크릴아미드, t-옥틸(메트)아크릴아미드, 디메틸아미노에틸(메트)아크릴레이트, 디에틸아미노에틸(메트)아크릴레이트, 7-아미노-3,7-디메틸옥틸(메트)아크릴레이트, N,N-디에틸(메트)아크릴아미드, N,N-디메틸아미노프로필(메트)아크릴아미드 등을 들 수 있다. 이들의 시판품으로서는 아로닉스 M-101, M-102, M-111, M-113, M-114, M-117(이상, 도아 고세이(주) 제조); 비스코트 LA, STA, IBXA, 2-MTA, #192, #193(오사까 유끼 가가꾸(주) 제조); NK 에스테르 AMP-10G, AMP-20G, AMP-60G(이상, 신나까무라 가가꾸 고교(주) 제조); 라이트 아크릴레이트 L-A, S-A, IB-XA, PO-A, PO-200A, NP-4EA, NP-8EA(이상, 교에샤 가가꾸(주) 제조); FA-511, FA-512A, FA-513A(이상, 히타치 가세 이 고교(주) 제조) 등을 들 수 있다.As a compound containing one (meth) acryloyl group, isobornyl (meth) acrylate, bornyl (meth) acrylate, tricyclodecanyl (meth) acrylate, dicyclopentanyl (meth) acrylate, and dish Alicyclic structure-containing (meth) acrylate, benzyl (meth) acrylate, 4-butylcyclohexyl (meth) acrylate, acryloyl mor, such as clopentenyl (meth) acrylate and cyclohexyl (meth) acrylate Pauline, vinylimidazole, vinylpyridine, 2-hydroxyethyl (meth) acrylate, 2-hydroxypropyl (meth) acrylate, 2-hydroxybutyl (meth) acrylate, methyl (meth) acrylate, Ethyl (meth) acrylate, propyl (meth) acrylate, isopropyl (meth) acrylate, butyl (meth) acrylate, amyl (meth) acrylate, isobutyl (meth) acrylate, t-butyl (meth ) Acrylate, pentyl (meth) ) Acrylate, isoamyl (meth) acrylate, hexyl (meth) acrylate, heptyl (meth) acrylate, octyl (meth) acrylate, isooctyl (meth) acrylate, 2-ethylhexyl (meth) acrylate , Nonyl (meth) acrylate, decyl (meth) acrylate, isodecyl (meth) acrylate, undecyl (meth) acrylate, dodecyl (meth) acrylate, lauryl (meth) acrylate, stearyl ( Meth) acrylate, isostearyl (meth) acrylate, tetrahydrofurfuryl (meth) acrylate, butoxyethyl (meth) acrylate, ethoxydiethylene glycol (meth) acrylate, benzyl (meth) acrylate, Phenoxyethyl (meth) acrylate, polyethylene glycol mono (meth) acrylate, polypropylene glycol mono (meth) acrylate, methoxyethylene glycol (meth) acrylate, ethoxyethyl (meth) acrylate , Methoxy polyethylene glycol (meth) acrylate, methoxy polypropylene glycol (meth) acrylate, diacetone (meth) acrylamide, isobutoxymethyl (meth) acrylamide, N, N-dimethyl (meth) acrylamide , t-octyl (meth) acrylamide, dimethylaminoethyl (meth) acrylate, diethylaminoethyl (meth) acrylate, 7-amino-3,7-dimethyloctyl (meth) acrylate, N, N-di Ethyl (meth) acrylamide, N, N-dimethylaminopropyl (meth) acrylamide, and the like. As these commercial items, Aronix M-101, M-102, M-111, M-113, M-114, M-117 (above, Toagosei Co., Ltd. make); Biscotti LA, STA, IBXA, 2-MTA, # 192, # 193 (manufactured by Osaka Yuki Chemical Co., Ltd.); NK ester AMP-10G, AMP-20G, and AMP-60G (above, manufactured by Shin-Nakamura Kagaku Kogyo Co., Ltd.); Light acrylate L-A, S-A, IB-XA, PO-A, PO-200A, NP-4EA, NP-8EA (above, manufactured by Kyoeisha Chemical Co., Ltd.); FA-511, FA-512A, FA-513A (above, Hitachi Kasei Kogyo Co., Ltd.), etc. are mentioned.
1개의 (메트)아크릴로일기를 함유하는 화합물을 첨가함으로써, 바탕 하드 코팅과의 밀착성을 개선할 수 있다. 구체적으로는, 상기 화합물 중 (메트)아크릴로일모르폴린, 벤질(메트)아크릴레이트, 테트라히드로푸르푸릴아크릴레이트, 4-(메트)아크릴로일옥시메틸-2-메틸-2-에틸-1,3-디옥솔란, 4-(메트)아크릴로일옥시메틸-2-메틸-2-이소부틸-1,3-디옥솔란, 4-(메트)아크릴로일옥시메틸-2-메틸-2-시클로헥실-1,3-디옥솔란, 4-(메트)아크릴로일옥시메틸-2,2-디메틸-1,3-디옥솔란 등을 들 수 있다. 이들 화합물 중 (메트)아크릴로일모르폴린, 벤질(메트)아크릴레이트가 특히 바람직하다. 이들 화합물의 시판품으로서는, 예를 들면 MMDOL30, MEDOL30, MIBDOL30, CHDOL30, MEDOL10, MIBDOL10, MIBDOL10, CHDOL10, 비스코트 150, 비스코트 160(이상, 오사까 유끼 가가꾸 고교(주) 제조), ACMO(이상, (주)고진 제조) 등을 들 수 있다.By adding the compound containing one (meth) acryloyl group, adhesiveness with a ground hard coating can be improved. Specifically, (meth) acryloyl morpholine, benzyl (meth) acrylate, tetrahydrofurfuryl acrylate, 4- (meth) acryloyloxymethyl-2-methyl-2-ethyl-1 in the said compound , 3-dioxolane, 4- (meth) acryloyloxymethyl-2-methyl-2-isobutyl-1,3-dioxolane, 4- (meth) acryloyloxymethyl-2-methyl-2- Cyclohexyl-1,3-dioxolane, 4- (meth) acryloyloxymethyl-2,2-dimethyl-1,3-dioxolane, and the like. Among these compounds, (meth) acryloyl morpholine and benzyl (meth) acrylate are particularly preferable. Commercially available products of these compounds include, for example, MMDOL30, MEDOL30, MIBDOL30, CHDOL30, MEDOL10, MIBDOL10, MIBDOL10, CHDOL10, Biscotti 150, Biscotti 160 (above, manufactured by Osaka Yuka Kagaku Kogyo Co., Ltd.), ACMO (above, Kojin Co., Ltd.) etc. are mentioned.
(메트)아크릴로일기를 2개 이상 함유하는 화합물로서는, 예를 들면 에틸렌글리콜디(메트)아크릴레이트, 디시클로펜테닐디(메트)아크릴레이트, 트리에틸렌글리콜디아크릴레이트, 테트라에틸렌글리콜디(메트)아크릴레이트, 트리시클로데칸디일디메틸렌디(메트)아크릴레이트, 트리스(2-히드록시에틸)이소시아누레이트디(메트)아크릴레이트, 트리스(2-히드록시에틸)이소시아누레이트트리(메트)아크릴레이트, 카프로락톤 변성 트리스(2-히드록시에틸)이소시아누레이트트리(메트)아크릴레이트, 트리메틸올프로판트리(메트)아크릴레이트, 에틸렌옥시드(이하 "EO"라고 함) 변성 트리메틸올프로판트리(메트)아크릴레이트, 프로필렌옥시드(이하 "PO"라고 함) 변성 트리메틸올프로판트리(메트)아크릴레이트, 트리프로필렌글리콜디(메트)아크릴레이트, 네오펜틸글리콜디(메트)아크릴레이트, 비스페놀 A 디글리시딜에테르의 양쪽 말단 (메트)아크릴산 부가물, 1,4-부탄디올디(메트)아크릴레이트, 1,6-헥산디올디(메트)아크릴레이트, 펜타에리트리톨트리(메트)아크릴레이트, 펜타에리트리톨테트라(메트)아크릴레이트, 폴리에스테르디(메트)아크릴레이트, 폴리에틸렌글리콜디(메트)아크릴레이트, 디펜타에리트리톨헥사(메트)아크릴레이트, 디펜타에리트리톨펜타(메트)아크릴레이트, 디펜타에리트리톨테트라(메트)아크릴레이트, 카프로락톤 변성 디펜타에리트리톨헥사(메트)아크릴레이트, 카프로락톤 변성 디펜타에리트리톨펜타(메트)아크릴레이트, 디트리메틸올프로판테트라(메트)아크릴레이트, EO 변성 비스페놀 A 디(메트)아크릴레이트, PO 변성 비스페놀 A 디(메트)아크릴레이트, EO 변성 수소 첨가 비스페놀 A 디(메트)아크릴레이트, PO 변성 수소 첨가 비스페놀 A 디(메트)아크릴레이트, EO 변성 비스페놀 F 디(메트)아크릴레이트, 페놀노볼락폴리글리시딜에테르의 (메트)아크릴레이트 등을 예시할 수 있다. 이들 다관능성 단량체의 시판품으로서는, 예를 들면 SA1002(이상, 미쯔비시 가가꾸(주) 제조), 비스코트 195, 비스코트 230, 비스코트 260, 비스코트 215, 비스코트 310, 비스코트 214HP, 비스코트 295, 비스코트 300, 비스코트 360, 비스코트 GPT, 비스코트 400, 비스코트 700, 비스코트 540, 비스코트 3000, 비스코트 3700(이상, 오사까 유끼 가가꾸 고교(주) 제조), 카야래드 R-526, HDDA, NPGDA, TPGDA, MANDA, R-551, R-712, R-604, R-684, PET-30, GPO-303, TMPTA, THE-330, DPHA, DPHA-2H, DPHA-2C, DPHA-2I, D-310, D-330, DPCA-20, DPCA-30, DPCA-60, DPCA-120, DN-0075, DN-2475, T- 1420, T-2020, T-2040, TPA-320, TPA-330, RP-1040, RP-2040, R-011, R-300, R-205(이상, 닛본 가야꾸(주) 제조), 아로닉스 M-210, M-220, M-233, M-240, M-215, M-305, M-309, M-310, M-315, M-325, M-400, M-6200, M-6400(이상, 도아 고세이(주) 제조), 라이트 아크릴레이트 BP-4EA, BP-4PA, BP-2EA, BP-2PA, DCP-A(이상, 교에샤 가가꾸(주) 제조), 뉴프론티어 BPE-4, BR-42M, GX-8345(이상, 다이이찌 고교 세이야꾸(주) 제조), ASF-400(이상, 신닛데쯔 가가꾸(주) 제조), 리폭시 SP-1506, SP-1507, SP-1509, VR-77, SP-4010, SP-4060(이상, 쇼와 고분시(주) 제조), NK 에스테르 A-BPE-4(이상, 신나까무라 가가꾸 고교(주) 제조) 등을 들 수 있다.Examples of the compound containing two or more (meth) acryloyl groups include ethylene glycol di (meth) acrylate, dicyclopentenyldi (meth) acrylate, triethylene glycol diacrylate, and tetraethylene glycol di (meth). ) Acrylate, tricyclodecanediyldimethylenedi (meth) acrylate, tris (2-hydroxyethyl) isocyanurate di (meth) acrylate, tris (2-hydroxyethyl) isocyanurate tree ( Meth) acrylate, caprolactone modified tris (2-hydroxyethyl) isocyanurate tri (meth) acrylate, trimethylolpropane tri (meth) acrylate, ethylene oxide (hereinafter referred to as "EO") modified trimethyl All propane tri (meth) acrylate, propylene oxide (hereinafter referred to as "PO") modified trimethylolpropane tri (meth) acrylate, tripropylene glycol di (meth) acrylate, neopentyl Recall di (meth) acrylate, both terminal (meth) acrylic acid adducts of bisphenol A diglycidyl ether, 1,4-butanediol di (meth) acrylate, 1,6-hexanediol di (meth) acrylate, Pentaerythritol tri (meth) acrylate, pentaerythritol tetra (meth) acrylate, polyester di (meth) acrylate, polyethylene glycol di (meth) acrylate, dipentaerythritol hexa (meth) acrylate, di Pentaerythritol penta (meth) acrylate, dipentaerythritol tetra (meth) acrylate, caprolactone modified dipentaerythritol hexa (meth) acrylate, caprolactone modified dipentaerythritol penta (meth) acrylate, di Trimethylolpropane tetra (meth) acrylate, EO modified bisphenol A di (meth) acrylate, PO modified bisphenol A di (meth) acrylate, EO modified hydrogenated bisphenol A di (meth ) And the like can be given acrylate, PO-modified hydrogenated bisphenol A di (meth) acrylate, EO-modified bisphenol F di (meth) acrylate, phenol novolak polyglycidyl ether (meth) acrylate. Examples of commercially available products of these polyfunctional monomers include SA1002 (above, manufactured by Mitsubishi Chemical Corporation), Biscot 195, Biscuit 230, Biscot 260, Biscot 215, Biscot 310, Biscot 214HP, Biscot 295, Biscot 300, Biscot 360, Biscot GPT, Biscot 400, Biscot 700, Biscot 540, Biscot 3000, Biscot 3700 (above, manufactured by Osaka Yuki Kagaku Kogyo Co., Ltd.) -526, HDDA, NPGDA, TPGDA, MANDA, R-551, R-712, R-604, R-684, PET-30, GPO-303, TMPTA, THE-330, DPHA, DPHA-2H, DPHA-2C , DPHA-2I, D-310, D-330, DPCA-20, DPCA-30, DPCA-60, DPCA-120, DN-0075, DN-2475, T-1420, T-2020, T-2040, TPA -320, TPA-330, RP-1040, RP-2040, R-011, R-300, R-205 (above, manufactured by Nippon Kayaku Co., Ltd.), Aronix M-210, M-220, M- 233, M-240, M-215, M-305, M-309, M-310, M-315, M-325, M-400, M-6200, M-6400 (above, manufactured by Toagosei Co., Ltd.) ), Light acrylates BP-4EA, BP-4PA, BP-2EA, BP-2PA, DCP-A (above, Kyoesha Kagaku Co., Ltd., New Frontier BPE-4, BR-42M, GX-8345 (above, Daiichi Kogyo Seiyaku Co., Ltd.), ASF-400 (above, Shin-Nitetsu Kagaku Co., Ltd.) Manufacture), Repoxy SP-1506, SP-1507, SP-1509, VR-77, SP-4010, SP-4060 (above, Showa Kobunshi Co., Ltd.), NK ester A-BPE-4 ( As above, Shin-Nakamura Kagaku Kogyo Co., Ltd.) etc. are mentioned.
또한, 본 발명의 조성물에는, 이들 중 분자 내에 2개 이상의 (메트)아크릴로일기를 함유하는 화합물이 바람직하고, 분자 내에 3개 이상의 (메트)아크릴로일기를 갖는 화합물이 보다 바람직하다. 이러한 2개 이상의 (메트)아크릴로일기를 함유하는 화합물로서는, 상기에 예시된 트리(메트)아크릴레이트 화합물, 테트라(메트)아크릴레이트 화합물, 펜타(메트)아크릴레이트 화합물, 헥사(메트)아크릴레이트 화합물 등 중으로부터 선택할 수 있고, 이들 중에서 펜타에리트리톨히드록시트리아크릴레이트, 트리메틸올프로판트리아크릴레이트가 특히 바람직하다. 상기한 화합물은, 각각 1종 단독으로 또는 2종 이상을 조합하여 사용할 수 있다.Moreover, in the composition of this invention, the compound containing two or more (meth) acryloyl groups in a molecule is preferable among these, and the compound which has three or more (meth) acryloyl groups in a molecule is more preferable. As a compound containing such two or more (meth) acryloyl groups, the tri (meth) acrylate compound, the tetra (meth) acrylate compound, the penta (meth) acrylate compound, and the hexa (meth) acrylate illustrated above Among these compounds, pentaerythritol hydroxytriacrylate and trimethylolpropane triacrylate are particularly preferable. Said compound can be used individually by 1 type or in combination of 2 or more types, respectively.
또한, 이들 (메트)아크릴레이트 화합물은 불소를 포함할 수도 있다. 이러한 화합물의 예로서, 퍼플루오로-1,6-헥산디올디(메트)아크릴레이트, 옥타플루오로옥탄-1,6-디(메트)아크릴레이트, 옥타플루오로옥탄디올과 2-(메트)아크릴로일옥시에틸이소시아네이트, 2-(메트)아크릴로일옥시프로필이소시아네이트, 1,1-(비스아크릴 로일옥시메틸)에틸이소시아네이트의 부가물, 트리아크릴로일헵타데카플루오로노네닐펜타에리트리톨(LINC-3A, 교에이샤 가가꾸 제조) 등의 1종 단독 또는 2종 이상의 조합을 들 수 있다.In addition, these (meth) acrylate compounds may contain fluorine. Examples of such compounds include perfluoro-1,6-hexanedioldi (meth) acrylate, octafluorooctane-1,6-di (meth) acrylate, octafluorooctanediol and 2- (meth) Acryloyloxyethyl isocyanate, 2- (meth) acryloyloxypropyl isocyanate, adduct of 1,1- (bisacryloyloxymethyl) ethyl isocyanate, triacryloylheptadecafluorononenylpentaerythritol ( LINC-3A, the Kyoeisha Chemical Co., Ltd. product), etc. 1 type, or 2 or more types of combination is mentioned.
본 발명의 조성물 중에서의 (B) 성분의 배합량에 대해서는 특별히 제한되지 않지만, 유기 용제를 제외한 조성물 전량에 대하여 통상적으로 5 내지 50 중량%, 바람직하게는 10 내지 40 중량%, 보다 바람직하게는 10 내지 35 중량%이다. 첨가량이 5 중량% 미만이면, 얻어지는 경화막의 내찰상성이 불충분해지는 경우가 있기 때문이고, 한편 첨가량이 50 중량%를 초과하면, 얻어지는 경화막의 굴절률이 높아져, 충분한 반사 방지 효과가 얻어지지 않는 경우가 있기 때문이다.Although there is no restriction | limiting in particular about the compounding quantity of (B) component in the composition of this invention, It is 5-50 weight% normally with respect to the composition whole quantity except the organic solvent, Preferably it is 10-40 weight%, More preferably, it is 10- 35 wt%. It is because the scratch resistance of the cured film obtained may become inadequate when the addition amount is less than 5 weight%, On the other hand, when the addition amount exceeds 50 weight%, the refractive index of the cured film obtained will become high and sufficient antireflection effect may not be obtained. Because.
(C) 분자량이 200 이상이며, 중합성 불포화기를 갖지 않는 수용성의 화합물(이하, "수용성 화합물"이라고 하는 경우가 있음)(C) A water-soluble compound having a molecular weight of 200 or more and not having a polymerizable unsaturated group (hereinafter, may be referred to as a "water-soluble compound").
수용성 화합물은, 본 발명의 조성물을 경화시킨 경화막을 물에 침지했을 때, 물에 용해되어 경화막으로부터 제거되는 성분이다. 수용성 화합물이 경화막으로부터 제거됨으로써, 나노 오더의 공경을 갖는 공극이 형성되고, 이에 따라 경화막의 굴절률을 낮출 수 있다. 또한, 본 발명에서 "수용성"이란, 25 ℃에서 5 g/물 100 g 이상의 용해성을 갖고 있는 것을 말한다.A water-soluble compound is a component which melt | dissolves in water and removes from a cured film, when the cured film which hardened the composition of this invention is immersed in water. By removing a water-soluble compound from a cured film, the space | gap which has the pore diameter of a nano order is formed and it can lower the refractive index of a cured film by this. In addition, in this invention, "water solubility" means having solubility of 5 g / water 100 g or more at 25 degreeC.
수용성 화합물의 분자량은 200 이상일 필요가 있다. 이것은 분자량이 200 미만이면 화합물의 비점이 낮아져, 본 발명의 조성물의 도막 형성시의 가열 공정에서 저비점의 화합물이 휘발되어 막 중에 잔존하지 않기 때문에, 물에 침지하여도 나노 오더의 구멍을 형성할 수 없기 때문이다. 상술한 바와 같이 그 분자량은 200 이상일 필요가 있으며, 200 내지 20,000의 범위 내인 것이 바람직하고, 400 내지 4,000의 범위 내인 것이 보다 바람직하다. 또한, 본 발명의 분자량이란, 겔 투과 크로마토그래피로 측정한 폴리스티렌 환산의 중량 평균 분자량을 말한다.The molecular weight of the water-soluble compound needs to be 200 or more. If the molecular weight is less than 200, the boiling point of the compound is lowered, and since the compound having a low boiling point is not volatilized and remains in the film during the heating step in forming the coating film of the composition of the present invention, it is possible to form pores of the nano order even when immersed in water. Because it is not. As mentioned above, the molecular weight needs to be 200 or more, it is preferable to exist in the range of 200-20,000, and it is more preferable to exist in the range of 400-4,000. In addition, the molecular weight of this invention means the weight average molecular weight of polystyrene conversion measured by the gel permeation chromatography.
수용성 화합물은, 25 ℃에서 5 g/물 100 g 이상의 수용성을 가질 필요가 있으며, 10 g/물 100 g 이상인 것이 바람직하고, 15 g/물 100 g 이상인 것이 보다 바람직하다. 5 g/물 100 g 미만이면, 경화막을 물에 침지했을 때 충분히 용출되지 않기 때문에, 굴절률을 낮춘다는 본 발명의 효과가 얻어지지 않게 될 우려가 있다.The water-soluble compound needs to have a water solubility of 5 g / water 100 g or more at 25 ° C, preferably 10 g / water 100 g or more, and more preferably 15 g / water 100 g or more. If it is less than 5 g / water 100g, when a cured film is immersed in water, it will not fully elute, and there exists a possibility that the effect of this invention of lowering a refractive index may not be acquired.
수용성 화합물의 구체예로서는, 예를 들면 폴리에틸렌글리콜, 폴리프로필렌글리콜, 폴리비닐알코올 등을 들 수 있다.As a specific example of a water-soluble compound, polyethyleneglycol, polypropylene glycol, polyvinyl alcohol, etc. are mentioned, for example.
본 발명의 조성물에서의 성분 (C)의 배합량은, 성분 (A) 내지 (D)의 합계량을 100 중량%로 했을 때, 통상적으로 5 내지 50 중량%의 범위 내, 바람직하게는 10 내지 40 중량%의 범위 내, 보다 바람직하게는 10 내지 30 중량%이다. 5 중량% 미만이면, 얻어지는 경화막의 굴절률의 저하가 불충분해질 우려가 있고, 50 중량%를 초과하면 막의 강도가 저하될 우려가 있다.When the compounding quantity of the component (C) in the composition of this invention makes the total amount of a component (A)-(D) 100 weight%, it is normally in the range of 5-50 weight%, Preferably it is 10-40 weight It is in the range of%, More preferably, it is 10-30 weight%. If it is less than 5 weight%, there exists a possibility that the fall of the refractive index of the cured film obtained may become inadequate, and when it exceeds 50 weight%, there exists a possibility that the intensity | strength of a film may fall.
(D) 광 중합 개시제(D) photoinitiator
본 발명에서 사용하는 광 중합 개시제란, 활성 에너지선의 조사에 의해 활성종을 발생하는 화합물을 말하며, 활성종으로서 라디칼을 발생하는 광 라디칼 발생제 등을 들 수 있다.The photoinitiator used by this invention means the compound which generate | occur | produces an active species by irradiation of an active energy ray, and an optical radical generator etc. which generate | occur | produce a radical as an active species are mentioned.
또한, 활성 에너지선이란, 활성종을 발생하는 화합물을 분해하여 활성종을 발생시킬 수 있는 에너지선으로 정의된다. 이러한 활성 에너지선으로서는, 가시 광, 자외선, 적외선, X선, α선, β선, γ선 등의 광 에너지선을 들 수 있다. 단, 일정한 에너지 레벨을 갖고, 경화 속도가 빠르며, 조사 장치가 비교적 저렴할 뿐만 아니라, 소형이라는 점에서 자외선을 사용하는 것이 바람직하다.In addition, an active energy ray is defined as an energy ray which can generate | occur | produce an active species by decomposing the compound which produces an active species. Examples of such active energy rays include light energy rays such as visible light, ultraviolet rays, infrared rays, X-rays, α-rays, β-rays, and γ-rays. However, it is preferable to use ultraviolet light in view of having a constant energy level, fast curing speed, relatively low cost of the irradiation device, and small size.
광 라디칼 발생제의 예로서는, 예를 들면 아세토페논, 아세토페논벤질케탈, 안트라퀴논, 1-(4-이소프로필페닐)-2-히드록시-2-메틸프로판-1-온, 카르바졸, 크산톤, 4-클로로벤조페논, 4,4'-디아미노벤조페논, 1,1-디메톡시데옥시벤조인, 3,3'-디메틸-4-메톡시벤조페논, 티오크산톤, 2,2-디메톡시-2-페닐아세토페논, 1-(4-도데실페닐)-2-히드록시-2-메틸프로판-1-온, 2-메틸-1-[4-(메틸티오)페닐]-2-모르폴리노프로판-1-온, 트리페닐아민, 2,4,6-트리메틸벤조일디페닐포스핀옥시드, 1-히드록시시클로헥실페닐케톤, 2-히드록시-2-메틸-1-페닐프로판-1-온, 플루오레논, 플루오렌, 벤즈알데히드, 벤조인에틸에테르, 벤조인프로필에테르, 벤조페논, 미힐러 케톤, 3-메틸아세토페논, 3,3',4,4'-테트라(tert-부틸퍼옥시카르보닐)벤조페논(BTTB), 2-(디메틸아미노)-1-[4-(모르폴리닐)페닐]-2-페닐메틸)-1-부타논, 4-벤조일-4'-메틸디페닐술피드, 벤질, 또는 BTTB와 크산텐, 티오크산텐, 쿠마린, 케토쿠마린, 그 이외의 색소 증감제와의 조합 등을 들 수 있다.As an example of an optical radical generating agent, for example, acetophenone, acetophenonebenzyl ketal, anthraquinone, 1- (4-isopropylphenyl) -2-hydroxy-2-methylpropan-1-one, carbazole, xanthone , 4-chlorobenzophenone, 4,4'-diaminobenzophenone, 1,1-dimethoxydeoxybenzoin, 3,3'-dimethyl-4-methoxybenzophenone, thioxanthone, 2,2- Dimethoxy-2-phenylacetophenone, 1- (4-dodecylphenyl) -2-hydroxy-2-methylpropan-1-one, 2-methyl-1- [4- (methylthio) phenyl] -2 -Morpholinopropane-1-one, triphenylamine, 2,4,6-trimethylbenzoyldiphenylphosphine oxide, 1-hydroxycyclohexylphenyl ketone, 2-hydroxy-2-methyl-1-phenylpropane -1-one, fluorenone, fluorene, benzaldehyde, benzoin ethyl ether, benzoin propylether, benzophenone, Michler's ketone, 3-methylacetophenone, 3,3 ', 4,4'-tetra (tert- Butylperoxycarbonyl) benzophenone (BTTB), 2- (dimethylamino) -1- [4- (morpholinyl) phenyl] -2-phenyl Yl) -1-butanone, 4-benzoyl-4'-methyldiphenylsulfide, benzyl, or a combination of BTTB with xanthene, thioxanthene, coumarin, ketocoumarin, other dye sensitizers, and the like. Can be mentioned.
이들 광 중합 개시제 중, 2,2-디메톡시-2-페닐아세토페논, 2-히드록시-2-메틸-1-페닐프로판-1-온, 1-히드록시시클로헥실페닐케톤, 2,4,6-트리메틸벤조일디페닐포스핀옥시드, 2-메틸-1-[4-(메틸티오)페닐]-2-모르폴리노프로판-1-온, 2-(디메틸아미노)-1-[4-(모르폴리닐)페닐]-2-페닐메틸)-1-부타논 등이 바람직하고, 더욱 바람직하게는 1-히드록시시클로헥실페닐케톤, 2-메틸-1-[4-(메틸티오)페닐]-2-모르 폴리노프로판-1-온, 2-(디메틸아미노)-1-[4-(모르폴리닐)페닐]-2-페닐메틸)-1-부타논 등을 들 수 있다.Among these photoinitiators, 2,2-dimethoxy-2-phenylacetophenone, 2-hydroxy-2-methyl-1-phenylpropan-1-one, 1-hydroxycyclohexylphenyl ketone, 2,4, 6-trimethylbenzoyldiphenylphosphineoxide, 2-methyl-1- [4- (methylthio) phenyl] -2-morpholinopropane-1-one, 2- (dimethylamino) -1- [4- ( Morpholinyl) phenyl] -2-phenylmethyl) -1-butanone and the like are preferred, and more preferably 1-hydroxycyclohexylphenyl ketone, 2-methyl-1- [4- (methylthio) phenyl] 2-morph polynopropan-1-one, 2- (dimethylamino) -1- [4- (morpholinyl) phenyl] -2-phenylmethyl) -1-butanone, etc. are mentioned.
본 발명의 조성물 중에서의 성분 (D)의 배합량은 특별히 제한되지 않지만, 유기 용제를 제외한 조성물 전량을 100 중량%로 했을 때, 통상적으로 0.01 내지 15 중량%의 범위 내, 바람직하게는 0.1 내지 10 중량%의 범위 내, 보다 바람직하게는 0.5 내지 8 중량%의 범위 내이다. 배합량이 0.01 중량% 미만이면, 경화 반응이 불충분해져 내찰상성이 저하되는 경우가 있기 때문이다. 한편, 배합량이 15 중량%를 초과하면, 경화물의 굴절률이 증가하여 반사 방지 효과가 저하되거나, 내찰상성이 불충분해지는 경우가 있다.Although the compounding quantity of the component (D) in the composition of this invention is not specifically limited, When the composition whole quantity except the organic solvent is 100 weight%, it is usually in the range of 0.01-15 weight%, Preferably it is 0.1-10 weight It is in the range of%, More preferably, it exists in the range of 0.5-8 weight%. It is because hardening reaction may become inadequate and abrasion resistance may fall that a compounding quantity is less than 0.01 weight%. On the other hand, when a compounding quantity exceeds 15 weight%, the refractive index of hardened | cured material may increase and antireflection effect may fall, or scratch resistance may become inadequate.
(E) 유기 용제(E) organic solvent
본 발명의 조성물은, 필요에 따라 유기 용제를 함유할 수도 있다. 이러한 유기 용제로서는, 상기 (A) 실리카를 주성분으로 하는 입자의 분산액에서의 분산매나, 균일한 도막을 형성하기 위해 점도를 조정하기 위해 첨가되는 유기 용제를 들 수 있다. 구체적으로는 아세트산에틸, 아세트산부틸, 락트산에틸, 프로필렌글리콜모노메틸아세테이트, 메틸아밀케톤 등의 에스테르류, 메틸이소부틸케톤, 메틸에틸케톤, 아세톤 등의 케톤류, t-부탄올, 이소프로판올, 프로필렌글리콜모노메틸에테르 등의 알코올류 등의 1종 단독 또는 2종 이상의 조합을 들 수 있다.The composition of this invention may contain the organic solvent as needed. As such an organic solvent, the dispersion medium in the dispersion liquid of the particle | grains which has the said (A) silica as a main component, and the organic solvent added in order to adjust a viscosity in order to form a uniform coating film are mentioned. Specifically, esters, such as ethyl acetate, butyl acetate, ethyl lactate, propylene glycol monomethyl acetate, and methyl amyl ketone, ketones, such as methyl isobutyl ketone, methyl ethyl ketone, and acetone, t-butanol, isopropanol, and propylene glycol monomethyl
본 발명의 조성물 중에서의 성분 (E) 유기 용제의 배합량은 특별히 제한되지 않지만, 유기 용제를 제외한 조성물 전량 100 중량부에 대하여, 100 내지 100,000 중량부의 유기 용제를 첨가하는 것이 바람직하다. 그 이유는, 첨가량을 100 중량 부 미만 또는 100,000 중량부 이상으로 하면, 도포성이 악화되어 반사 방지막에 적합한 광학 박막을 얻을 수 없기 때문이다.Although the compounding quantity of the component (E) organic solvent in the composition of this invention is not specifically limited, It is preferable to add 100-100,000 weight part of organic solvents with respect to 100 weight part of compositions whole quantity except the organic solvent. The reason is that when the added amount is less than 100 parts by weight or 100,000 parts by weight or more, the applicability deteriorates and an optical thin film suitable for the antireflection film cannot be obtained.
(F) 기타 첨가제(F) other additives
본 발명의 조성물에는, 본 발명의 효과를 손상시키지 않는 한, 필요에 따라 광 증감제, 중합 금지제, 중합 개시 보조제, 레벨링제, 습윤성 개량제, 계면활성제, 가소제, 자외선 흡수제, 산화 방지제, 대전 방지제, 무기 충전제, 안료, 염료 등을 적절하게 배합할 수 있다.In the composition of the present invention, as long as the effect of the present invention is not impaired, a photosensitizer, a polymerization inhibitor, a polymerization initiation aid, a leveling agent, a wettability improving agent, a surfactant, a plasticizer, an ultraviolet absorber, an antioxidant, and an antistatic agent are required. , Inorganic fillers, pigments, dyes and the like can be suitably blended.
2. 본 발명의 조성물의 제조 방법2. Process for preparing the composition of the present invention
본 발명의 조성물은, 상기 (A) 실리카를 주성분으로 하는 입자, 상기 (B) (메트)아크릴레이트, 상기 (C) 수용성 화합물 및 (D) 광 중합 개시제, 및 필요에 따라 (F) 유기 용제 및 (F) 첨가제를 각각 첨가하고, 실온 또는 가열 조건하에서 혼합함으로써 제조할 수 있다. 구체적으로는 믹서, 혼련기, 볼밀, 삼축롤 등의 혼합기를 사용하여 제조할 수 있다.The composition of this invention is a particle | grain which has said (A) silica as a main component, the said (B) (meth) acrylate, the said (C) water-soluble compound, and (D) photoinitiator, and (F) organic solvent as needed. And (F) additives, respectively, and can be produced by mixing at room temperature or under heating conditions. Specifically, it can manufacture using mixers, such as a mixer, a kneader, a ball mill, and a triaxial roll.
3. 본 발명의 조성물의 도포(코팅) 방법3. Application (coating) method of the composition of the present invention
본 발명의 조성물은 반사 방지막의 저굴절률층을 형성하는 용도에 바람직하며, 반사 방지막의 기재로서는, 예를 들면 플라스틱(폴리카르보네이트, 폴리메타크릴레이트, 폴리스티렌, 폴리에스테르, 폴리올레핀, 에폭시, 멜라민, 트리아세틸셀룰로오스, ABS, AS, 노르보르넨계 수지 등), 금속, 목재, 종이, 유리, 슬레이트 등을 들 수 있다. 이들 기재의 형상은 판상, 필름상 또는 3차원 성형체일 수도 있고, 코팅 방법은 통상적인 코팅 방법, 예를 들면 침지 코팅, 분무 코팅, 플로우 코 팅, 샤워 코팅, 롤 코팅, 스핀 코팅, 쇄모 도포 등을 들 수 있다.The composition of the present invention is suitable for use in forming a low refractive index layer of an antireflection film. As the base material of the antireflection film, for example, plastic (polycarbonate, polymethacrylate, polystyrene, polyester, polyolefin, epoxy, melamine) , Triacetyl cellulose, ABS, AS, norbornene-based resin, etc.), metal, wood, paper, glass, slate and the like. The shape of these substrates may be plate-shaped, film-like or three-dimensional shaped bodies, and the coating method is a conventional coating method, for example, dip coating, spray coating, flow coating, shower coating, roll coating, spin coating, hair coating, etc. Can be mentioned.
4. 본 발명의 조성물의 경화 방법4. Curing method of the composition of the present invention
본 발명의 조성물은, 방사선(광)에 의해 경화시킬 수 있다. 그 선원으로서는, 조성물을 코팅한 후 단시간에 경화시킬 수 있는 것인 한 특별히 제한은 없지만, 예를 들면 적외선의 선원으로서 램프, 저항 가열판, 레이저 등을, 가시광선의 선원으로서 일광, 램프, 형광등, 레이저 등을, 자외선의 선원으로서 수은 램프, 할라이드 램프, 레이저 등을, 전자선의 선원으로서 시판되어 있는 텅스텐 필라멘트로부터 발생하는 열전자를 이용하는 방식, 금속에 고전압 펄스를 통과시켜 발생시키는 냉음극 방식 및 이온화한 가스상 분자와 금속 전극의 충돌에 의해 발생하는 2차 전자를 이용하는 2차 전자 방식을 들 수 있다. 또한, α선, β선 및 γ선의 선원으로서, 예를 들면 60Co 등의 핵 분열 물질을 들 수 있고, γ선에 대해서는 가속 전자를 양극에 충돌시키는 진공관 등을 이용할 수 있다. 이들 방사선은 1종 단독으로 또는 2종 이상을 동시에 또는 일정 기간을 두고 조사할 수 있다.The composition of the present invention can be cured by radiation (light). The source is not particularly limited as long as it can be cured in a short time after coating the composition. For example, a lamp, a resistance heating plate, a laser, or the like may be used as a source of visible light such as sunlight, a lamp, a fluorescent lamp, or a laser. Mercury lamps, halide lamps, lasers, and the like as a source of ultraviolet rays, using a hot electron generated from a commercially available tungsten filament as a source of electron beams, a cold cathode system and a ionized gas phase generated by passing a high voltage pulse through a metal. The secondary electron system using the secondary electron which arises by the collision of a molecule and a metal electrode is mentioned. Examples of the sources of the α-ray, β-ray and γ-rays include nuclear fission materials such as 60 Co. For γ-rays, for example, a vacuum tube for impinging the accelerated electrons on the anode can be used. These radiations can be irradiated alone or in combination of two or more thereof over a period of time.
본 발명의 조성물의 경화 조건에 대해서는 특별히 제한되지 않지만, 예를 들면 활성 에너지선을 사용한 경우, 노광량을 0.01 내지 10 J/㎠의 범위 내의 값으로 하는 것이 바람직하다. 그 이유는 노광량을 0.01 J/㎠ 미만으로 하면, 경화 불량이 발생하는 경우가 있기 때문이고, 한편 노광량이 10 J/㎠를 초과하면, 경화 시간이 과도하게 길어지는 경우가 있기 때문이다.Although it does not restrict | limit especially about the hardening conditions of the composition of this invention, For example, when an active energy ray is used, it is preferable to make an exposure amount into the value within the range of 0.01-10 J / cm <2>. This is because when the exposure amount is less than 0.01 J / cm 2, curing failure may occur. On the other hand, when the exposure amount exceeds 10 J / cm 2, the curing time may be excessively long.
또한, 이러한 이유에 의해 노광량을 0.05 내지 5 J/㎠의 범위 내의 값으로 하는 것이 보다 바람직하고, 0.1 내지 3 J/㎠의 범위 내의 값으로 하는 것이 더욱 바람직하다.Moreover, it is more preferable to make exposure value into the value within the range of 0.05-5 J / cm <2> for such a reason, and it is still more preferable to set it as the value within the range which is 0.1-3 J / cm <2>.
또한, 산소에 의한 중합 저해를 방지하기 위해 경화 분위기를 불활성 가스 분위기로 하는 것이 바람직하다. 불활성 가스로서는 헬륨, 아르곤, 질소, 이산화탄소 등을 들 수 있다. 이들 불활성 가스의 분위기로서는 잔존 산소 농도가 5000 ppm 이하가 되는 것이 바람직하고, 더욱 바람직하게는 1000 ppm 이하, 특히 바람직하게는 100 ppm 이하이다. 잔존 산소 농도가 5000 ppm을 초과하면 경화 불량이 발생하는 경우가 있다.Moreover, in order to prevent the inhibition of polymerization by oxygen, it is preferable to make hardening atmosphere into an inert gas atmosphere. Helium, argon, nitrogen, carbon dioxide, etc. are mentioned as an inert gas. As an atmosphere of these inert gases, it is preferable that residual oxygen concentration becomes 5000 ppm or less, More preferably, it is 1000 ppm or less, Especially preferably, it is 100 ppm or less. When the residual oxygen concentration exceeds 5000 ppm, curing failure may occur.
또한, 본 발명의 조성물을 가열하여 경화시키는 경우에는, 30 내지 200 ℃의 범위 내의 온도에서 1 내지 180분간 가열하는 것이 바람직하다. 이와 같이 가열함으로써, 기재 등을 손상시키지 않고 보다 효율적으로 내찰상성이 우수한 반사 방지막을 얻을 수 있다.Moreover, when heating and hardening the composition of this invention, it is preferable to heat for 1 to 180 minutes at the temperature within the range of 30-200 degreeC. By heating in this way, an antireflection film excellent in scratch resistance can be obtained more efficiently without damaging the substrate or the like.
또한, 이러한 이유로부터, 50 내지 180 ℃의 범위 내의 온도에서 2 내지 120분간 가열하는 것이 보다 바람직하고, 80 내지 150 ℃의 범위 내의 온도에서 5 내지 60분간 가열하는 것이 더욱 바람직하다.Moreover, for this reason, it is more preferable to heat 2 to 120 minutes at the temperature within the range of 50-180 degreeC, and it is still more preferable to heat for 5 to 60 minutes at the temperature within the range of 80-150 degreeC.
II. (C)의 화합물이 제거된 본 발명의 경화막의 제조 방법II. The manufacturing method of the cured film of this invention from which the compound of (C) was removed.
성분 (C)의 화합물이 제거된 본 발명의 경화막의 제조 방법(이하, 본 발명의 방법이라고 함)은, 본 발명의 조성물을 도포하는 공정, 광 조사하는 공정 및 물에 침지하는 공정을 포함하는 것을 특징으로 한다.The manufacturing method (henceforth a method of this invention) of the cured film of this invention from which the compound of the component (C) was removed includes the process of apply | coating the composition of this invention, the process of light irradiation, and the process immersed in water. It is characterized by.
본 발명의 조성물을 사용하여 경화막을 제조하는 공정은 특별히 한정되지 않 으며, 상술한 바와 같은 종래 공지된 방법에 의해 행할 수 있다. 이 공정에서 얻어진 경화막은, 성분 (C)의 화합물을 제거하기 전의 경화막이다.The process of manufacturing a cured film using the composition of this invention is not specifically limited, It can carry out by the conventionally well-known method as mentioned above. The cured film obtained at this process is a cured film before removing the compound of component (C).
경화막을 물에 침지하는 공정은, 경화막 중의 (C) 수용성 화합물을 물로 용출ㆍ제거하여 나노 오더의 공경을 갖는 공극을 형성시키는 공정이다.The process of immersing a cured film in water is a process of eluting and removing the (C) water-soluble compound in a cured film with water, and forming the space | gap which has the pore diameter of a nano order.
경화막의 물에의 침지는, 예를 들면 10 ㎝×15 ㎝ 사방의 경화 필름 1매를 25 ℃의 순수 1 L 속에 매달고, 교반자 등의 교반 수단을 사용하거나 사용하지 않고 실온에서 2분 내지 1 시간 동안 교반을 행한다.Immersion of the cured film in water, for example, suspended 10 cm x 15 cm of a cured film in 1 L of 25 ° C pure water, 2 minutes to 1 at room temperature with or without stirring means such as a stirrer Stirring is performed for a time.
III. 경화막III. Cured film
본 발명의 경화막은 상기 본 발명의 방법에 의해 제조된 것이며, 성분 (C)를 제거함으로써 제거 전에 비해 최저 반사율이 크게 저하된다. 최저 반사율의 저하의 크기는 성분 (C)의 배합량에 따라 상이하며, 성분 (C)가 많이 배합되어 있는 경우에는 제거 전후에서의 최저 반사율의 차가 커진다.The cured film of this invention is manufactured by the method of the said invention, and a minimum reflectance falls significantly compared with before removal by removing a component (C). The magnitude | size of the fall of minimum reflectance changes with the compounding quantity of component (C), and when many components (C) are mix | blended, the difference of the minimum reflectance before and behind removal becomes large.
또한, 본 발명의 경화막은, 성분 (C)를 제거함으로써 광선 투과율이 향상된다.Moreover, the light transmittance of the cured film of this invention is improved by removing a component (C).
본 발명의 경화막은 낮은 최저 반사율을 갖고, 높은 광선 투과율을 가짐으로써, 반사 방지막의 저굴절률층으로서 사용한 경우에 매우 우수한 반사 방지 효과 및 시인성이 얻어진다.The cured film of the present invention has a low minimum reflectance and a high light transmittance, whereby an excellent antireflection effect and visibility can be obtained when used as a low refractive index layer of the antireflection film.
IV. 반사 방지막IV. Antireflection film
본 발명의 반사 방지막은, 상기 본 발명의 방법으로 제조된 경화막(성분 (C)의 화합물을 제거한 경화막)을 포함하는 저굴절률층을 포함한다. 또한, 본 발명의 반사 방지막은, 전형적으로 저굴절률층의 하측에 고굴절률층, 하드 코팅층, 대전 방지층 및 기재를 포함할 수 있다.The antireflection film of the present invention includes a low refractive index layer containing a cured film (cured film obtained by removing the compound of component (C)) produced by the method of the present invention. In addition, the antireflection film of the present invention may typically include a high refractive index layer, a hard coating layer, an antistatic layer, and a substrate under the low refractive index layer.
도 1에 이러한 반사 방지막 (10)의 모식도를 도시한다. 도 1에 도시한 바와 같이, 기재 (12) 위에 하드 코팅층 (14), 고굴절률층 (16) 및 저굴절률층 (18)이 적층되어 있다.The schematic diagram of such an
이때, 기재 (12) 위에 하드 코팅층 (14)를 설치하지 않고, 직접 고굴절률층 (16)을 형성할 수도 있다.At this time, the high refractive index layer 16 may be formed directly on the
또한, 고굴절률층 (16)과 저굴절률층 (18)의 사이, 또는 고굴절률층 (16)과 하드 코팅층 (14)의 사이에, 추가로 중굴절률층이나 대전 방지층(모두 도시하지 않음)을 설치할 수도 있다.In addition, between the high refractive index layer 16 and the low refractive index layer 18 or between the high refractive index layer 16 and the hard coating layer 14, a medium refractive index layer or an antistatic layer (both not shown) is further provided. It can also be installed.
(1) 저굴절률층(1) low refractive index layer
저굴절률층은, 상기 본 발명의 조성물을 경화하여 얻어지는 경화막을 물에 침지하고, (C) 수용성 화합물을 제거하여 얻어진 경화막으로 구성된다. 수지 조성물의 구성 등에 대해서는 상술한 바와 같기 때문에, 여기서의 구체적인 설명은 생략하며, 이하 저굴절률층의 굴절률 및 두께에 대하여 설명한다.The low refractive index layer is comprised by the cured film obtained by immersing the cured film obtained by hardening | curing the composition of the said invention in water, and removing (C) water-soluble compound. Since the structure of a resin composition etc. are as above-mentioned, the detailed description here is abbreviate | omitted and the refractive index and thickness of a low refractive index layer are demonstrated below.
(i) 굴절률(i) refractive index
본 발명의 반사 방지막의 저굴절률층을 구성하는, 성분 (C)를 제거한 후의 경화막의 굴절률(Na-D선의 굴절률, 측정 온도 25 ℃)은, 통상적으로 1.45 이하이고, 바람직하게는 1.20 내지 1.43이고, 보다 바람직하게는 1.20 내지 1.40이다. 성분 (C)를 제거함으로써, 성분 (C) 제거 전의 경화막보다 굴절률이 낮아진다. 이 것은, 성분 (C)를 제거함으로써 경화막 내에 나노 오더의 공경을 갖는 공극이 형성되고, 용매 또는 공기 등의 경화막을 구성하는 성분보다 굴절률이 낮은 물질에 의해 이 공극이 점유되기 때문이다.The refractive index (refractive index of Na-D ray, measurement temperature of 25 degreeC) of the cured film after removing the component (C) which comprises the low refractive index layer of the antireflection film of this invention is 1.45 or less normally, Preferably it is 1.20-1.43 More preferably, they are 1.20-1.40. By removing a component (C), refractive index becomes lower than the cured film before component (C) removal. This is because by removing the component (C), a void having a nano order pore diameter is formed in the cured film, and the void is occupied by a substance having a lower refractive index than a component constituting the cured film such as a solvent or air.
또한, 저굴절률막을 복수층 설치하는 경우에는, 그 중 한 층 이상이 상술한 범위 내의 굴절률의 값을 가지면 되고, 따라서 그 이외의 저굴절률막은 1.45를 초과한 값일 수도 있다.In the case where a plurality of low refractive index films are provided, one or more of them may have a value of the refractive index within the above-described range, and thus the other low refractive index films may have a value exceeding 1.45.
또한, 저굴절률층을 설치하는 경우, 보다 우수한 반사 방지 효과가 얻어지기 때문에, 고굴절률층과의 사이의 굴절률차를 0.05 이상의 값으로 하는 것이 바람직하다. 그 이유는 저굴절률층과 고굴절률층 사이의 굴절률차를 0.05 미만의 값으로 하면, 이들 반사 방지막층에서의 상승 효과가 얻어지지 않고, 오히려 반사 방지 효과가 저하되는 경우가 있기 때문이다.In addition, when providing a low refractive index layer, since the outstanding antireflection effect is acquired, it is preferable to make the refractive index difference between a high refractive index layer and a value 0.05 or more. This is because if the refractive index difference between the low refractive index layer and the high refractive index layer is less than 0.05, the synergistic effect in these antireflection film layers is not obtained, but the antireflection effect may be lowered.
따라서, 저굴절률층과 고굴절률층 사이의 굴절률차를 0.1 내지 0.5의 범위 내의 값으로 하는 것이 보다 바람직하고, 0.15 내지 0.5의 범위 내의 값으로 하는 것이 더욱 바람직하다.Therefore, it is more preferable to make the refractive index difference between the low refractive index layer and the high refractive index layer into the value within the range of 0.1 to 0.5, and even more preferably to the value within the range of 0.15 to 0.5.
(ii) 두께(ii) thickness
또한, 저굴절률층의 두께에 대해서도 특별히 제한되지 않지만, 예를 들면 50 내지 300 ㎚인 것이 바람직하다. 그 이유는, 저굴절률층의 두께를 50 ㎚ 미만으로 하면, 바탕으로서의 고굴절률막에 대한 밀착력이 저하되는 경우가 있기 때문이고, 한편 두께가 300 ㎚를 초과하면, 광 간섭이 발생하여 반사 방지 효과가 저하되는 경우가 있기 때문이다.The thickness of the low refractive index layer is not particularly limited, but is preferably 50 to 300 nm. The reason for this is that when the thickness of the low refractive index layer is less than 50 nm, the adhesion to the high refractive index film serving as the base may decrease. On the other hand, when the thickness exceeds 300 nm, light interference occurs and the antireflection effect This is because may be reduced.
따라서, 저굴절률층의 두께를 50 내지 250 ㎚로 하는 것이 보다 바람직하고, 60 내지 200 ㎚로 하는 것이 더욱 바람직하다.Therefore, the thickness of the low refractive index layer is more preferably 50 to 250 nm, and more preferably 60 to 200 nm.
또한, 보다 높은 반사 방지성을 얻기 위해, 저굴절률층을 복수층 설치하여 다층 구조로 하는 경우에는, 그 합계 두께를 50 내지 300 ㎚로 할 수 있다.In addition, in order to obtain higher antireflection property, when providing a multi-layered structure by providing two or more low refractive index layers, the sum total thickness can be 50-300 nm.
(2) 고굴절률층(2) high refractive index layer
고굴절률층을 형성하기 위한 경화성 조성물로서는 특별히 제한되지 않지만, 피막 형성 성분으로서 에폭시계 수지, 페놀계 수지, 멜라민계 수지, 알키드계 수지, 시아네이트계 수지, 아크릴계 수지, 폴리에스테르계 수지, 우레탄계 수지, 실록산 수지 등의 1종 단독 또는 2종 이상의 조합을 포함하는 것이 바람직하다. 이들 수지라면 고굴절률층으로서 강고한 박막을 형성할 수 있으며, 결과로서 반사 방지막의 내찰상성을 현저히 향상시킬 수 있기 때문이다.Although it does not restrict | limit especially as a curable composition for forming a high refractive index layer, As a film formation component, an epoxy resin, a phenol resin, melamine resin, alkyd resin, cyanate resin, acrylic resin, polyester resin, urethane resin It is preferable to include 1 type individually or 2 or more types of combinations, such as a siloxane resin. It is because these resin can form a strong thin film as a high refractive index layer, and as a result, the scratch resistance of an antireflection film can be improved significantly.
그러나, 통상적으로 이들 수지 단독에서의 굴절률은 1.45 내지 1.62이며, 높은 반사 방지 성능을 얻기 위해서는 충분하지 않은 경우가 있다. 그 때문에 고굴절률의 무기 입자, 예를 들면 금속 산화물 입자를 배합하는 것이 보다 바람직하다. 또한, 경화 형태로서는 열 경화, 자외선 경화, 전자선 경화할 수 있는 경화성 조성물을 사용할 수 있지만, 보다 바람직하게는 생산성이 양호한 자외선 경화성 조성물이 사용된다.However, the refractive index in these resins is usually 1.45 to 1.62, which may not be sufficient to obtain high antireflection performance. Therefore, it is more preferable to mix | blend high refractive index inorganic particle, for example, metal oxide particle. Moreover, although the curable composition which can thermoset, ultraviolet-ray curing, and electron beam hardening can be used as a hardening form, More preferably, the ultraviolet curable composition with favorable productivity is used.
고굴절률층의 두께는 특별히 제한되지 않지만, 예를 들면 50 내지 30,000 ㎚인 것이 바람직하다. 그 이유는 고굴절률층의 두께를 50 ㎚ 미만으로 하면, 저굴절률층과 조합한 경우, 반사 방지 효과나 기재에 대한 밀착력이 저하되는 경우가 있기 때문이고, 한편 두께가 30,000 ㎚를 초과하면, 광 간섭이 발생하여 오히려 반사 방지 효과가 저하되는 경우가 있기 때문이다.The thickness of the high refractive index layer is not particularly limited, but is preferably 50 to 30,000 nm. The reason for this is that when the thickness of the high refractive index layer is less than 50 nm, in combination with the low refractive index layer, the antireflection effect and the adhesion to the substrate may decrease, while when the thickness exceeds 30,000 nm, This is because interference may occur and the antireflection effect may be lowered.
따라서, 고굴절률층의 두께를 50 내지 1,000 ㎚로 하는 것이 보다 바람직하고, 60 내지 500 ㎚로 하는 것이 더욱 바람직하다.Therefore, the thickness of the high refractive index layer is more preferably 50 to 1,000 nm, more preferably 60 to 500 nm.
또한, 보다 높은 반사 방지성을 얻기 위해, 고굴절률층을 복수층 설치하여 다층 구조로 하는 경우에는, 그 합계 두께를 50 내지 30,000 ㎚로 할 수 있다.In addition, in order to obtain higher antireflection property, when providing a high refractive index layer in multiple layers and having a multilayered structure, the total thickness can be 50-30,000 nm.
또한, 고굴절률층과 기재 사이에 하드 코팅층을 설치하는 경우에는, 고굴절률층의 두께를 50 내지 300 ㎚로 할 수 있다.In addition, when providing a hard-coat layer between a high refractive index layer and a base material, the thickness of a high refractive index layer can be 50-300 nm.
(3) 하드 코팅층(3) hard coating layer
본 발명의 반사 방지막에 사용하는 하드 코팅층의 구성 재료에 대해서는 특별히 제한되지 않는다. 이러한 재료로서는 실록산 수지, 아크릴 수지, 멜라민 수지, 에폭시 수지 등의 1종 단독 또는 2종 이상의 조합을 들 수 있다.There is no restriction | limiting in particular about the constituent material of the hard coat layer used for the antireflection film of this invention. As such a material, single 1 type, or 2 or more types of combinations, such as a siloxane resin, an acrylic resin, a melamine resin, an epoxy resin, are mentioned.
또한, 하드 코팅층의 두께에 대해서도 특별히 제한되지 않지만, 1 내지 50 ㎛로 하는 것이 바람직하고, 5 내지 10 ㎛로 하는 것이 보다 바람직하다. 그 이유는 하드 코팅층의 두께를 1 ㎛ 미만으로 하면, 반사 방지막의 기재에 대한 밀착력을 향상시킬 수 없는 경우가 있기 때문이고, 한편 두께가 50 ㎛를 초과하면, 균일하게 형성하는 것이 곤란해지는 경우가 있기 때문이다.In addition, the thickness of the hard coat layer is not particularly limited, but is preferably 1 to 50 m, more preferably 5 to 10 m. The reason is that when the thickness of the hard coating layer is less than 1 m, the adhesion of the antireflection film to the substrate may not be improved. On the other hand, when the thickness exceeds 50 m, it may be difficult to form uniformly. Because there is.
(4) 기재(4) mention
본 발명의 반사 방지막에 사용하는 기재의 종류는 특별히 제한되지 않지만, 예를 들면 유리, 폴리카르보네이트계 수지, 폴리에스테르계 수지, 아크릴계 수지, 트리아세틸셀룰로오스 수지(TAC) 등을 포함하는 기재를 들 수 있다. 이들 기재를 포함하는 반사 방지막으로 함으로써, 카메라의 렌즈부, 텔레비전(CRT)의 화면 표시부, 또는 액정 표시 장치에서의 컬러 필터 등의 광범위한 반사 방지막의 이용 분야에서 우수한 반사 방지 효과를 얻을 수 있다.Although the kind in particular of the base material used for the antireflection film of this invention is not restrict | limited, For example, the base material containing glass, a polycarbonate resin, polyester resin, acrylic resin, a triacetyl cellulose resin (TAC), etc. is used. Can be mentioned. By using the antireflection film containing these base materials, excellent antireflection effect can be obtained in the field of use of a wide range of antireflection films such as a lens part of a camera, a screen display part of a television (CRT), or a color filter in a liquid crystal display device.
<실시예><Examples>
이하, 실시예를 나타내어 본 발명을 더욱 구체적으로 설명하지만, 본 발명의 범위는 이들 실시예의 기재로 한정되지 않는다.EXAMPLES Hereinafter, although an Example is shown and this invention is demonstrated further more concretely, the scope of the present invention is not limited to description of these Examples.
제조예 1Preparation Example 1
펜타에리트리톨테트라아크릴레이트(상품명: PET-30, 닛본 가야꾸사 제조) 95부, 이르가큐어 184(시바 스페셜티 케미컬즈사 제조) 4부, 이르가큐어 907(시바 스페셜티 케미컬즈사 제조) 1부, 메틸이소부틸케톤 70부, 메틸에틸케톤 30부를 혼합하고, 균일해질 때까지 교반하여 하드 코팅용 조성물로 하였다. 상기 하드 코팅용 조성물을 트리아세틸셀룰로오스(TAC) 기재 위에 12.5밀의 바코터로 도포하고, 80 ℃의 오븐에 1분간 넣어 건조를 행한 후, 고압 수은등으로 500 mJ/㎠ 조사하여 경화를 행하여, 6 ㎛ 두께의 하드 코팅 부착 필름을 제조하였다.95 parts of pentaerythritol tetraacrylate (brand name: PET-30, Nippon Kayaku Co., Ltd.), 4 parts of Irgacure 184 (made by Ciba Specialty Chemicals), 1 part of Irgacure 907 (made by Ciba Specialty Chemicals), methyl 70 parts of isobutyl ketones and 30 parts of methyl ethyl ketones were mixed, it stirred until it became uniform, and it was set as the composition for hard coatings. The hard coating composition was applied on a triacetyl cellulose (TAC) substrate with a 12.5 mil bar coater, dried in an oven at 80 ° C. for 1 minute, dried, and then cured by irradiation with 500 mJ / cm 2 using a high pressure mercury lamp, followed by curing at 6 μm. A thick hard coat adhesion film was prepared.
실시예 1Example 1
(1) 광 경화성 조성물의 제조(1) Preparation of Photocurable Composition
하기 표 1에 나타낸 비율로 성분 (A) 내지 (E)를 다갈색병에 넣고, 실온에서 30분간 교반하여 조성물을 얻었다.Components (A) to (E) were placed in a brown bottle at the ratio shown in Table 1 below, and stirred at room temperature for 30 minutes to obtain a composition.
(2) 수침지 처리 전의 경화막의 제조(2) Preparation of cured film before water immersion treatment
6 ㎛ 막 두께의 하드 코팅이 형성된 TAC 기재 위에 고형분 농도가 4.2 %인 상기 조성물을 3밀의 바코터를 사용하여 도공하였다. 도공 후 80 ℃에서 2분간 건조를 행하고, 질소 박스에서 질소의 퍼지를 2분간 행하였다. 이 후 80 mW/㎠의 고압 수은등을 사용하여 300 mJ/㎠를 2회 조사하여 경화를 행하였다.The composition having a solid content concentration of 4.2% was coated on a TAC substrate on which a hard coating having a 6 μm film thickness was formed using a 3-mil bar coater. After coating, it dried for 2 minutes at 80 degreeC, and purged with nitrogen for 2 minutes in the nitrogen box. Thereafter, 300 mJ / cm 2 was irradiated twice using a high-pressure mercury lamp of 80 mW / cm 2 to cure.
(3) 수침지 처리 후의 경화막의 제조(3) Production of cured film after water immersion treatment
수침지 후의 필름은 80 ℃의 오븐 중에서 1 시간 동안 건조를 행하여, 충분히 막내의 수분을 제거한 후 반사율의 측정을 행하였다.The film after the water immersion was dried in an oven at 80 ° C. for 1 hour, and after sufficiently removing moisture in the film, the reflectance was measured.
실시예 2 내지 3 및 비교예 1Examples 2 to 3 and Comparative Example 1
표 1에 나타낸 조성으로 한 것 이외에는 실시예 1과 동일하게 하여, 광 경화성 조성물, 수침지 처리 전의 경화막 및 수침지 처리 후의 경화막을 제조하였다.Except having set it as the composition shown in Table 1, it carried out similarly to Example 1, and manufactured the photocurable composition, the cured film before water immersion treatment, and the cured film after water immersion treatment.
실시예 1 내지 3 및 비교예 1에서 제조한 경화막의 특성을 하기와 같이 평가하였다.The properties of the cured films prepared in Examples 1 to 3 and Comparative Example 1 were evaluated as follows.
(a) 최저 반사율(%)(a) Minimum reflectance (%)
얻어진 반사 방지막의 반사율을 반사 분광계를 사용하여 측정하였다. 최저 반사율의 값을 표 1에 나타낸다.The reflectance of the obtained antireflection film was measured using a reflection spectrometer. Table 1 shows the values of the lowest reflectance.
(b) 헤이즈(b) haze
얻어진 반사 방지막에 대하여, 컬러 헤이즈 미터로 헤이즈를 측정하였다. 결과를 표 1에 나타낸다.About the obtained antireflection film, haze was measured with the color haze meter. The results are shown in Table 1.
(c) 광선 투과율(%)(c) Light transmittance (%)
얻어진 반사 방지막에 대하여, 컬러 헤이즈 미터로 광선 투과율을 측정하였 다. 결과를 표 1에 나타낸다.About the obtained antireflection film, light transmittance was measured with the color haze meter. The results are shown in Table 1.
표 1의 결과로부터, 수침지 처리 후의 경화막은 수침지 처리 전의 경화막에 비해 반사율이 낮아져 있고, 광선 투과율이 높아져 있다는 것을 알 수 있었다. 이에 비해, 성분 (C)를 함유하지 않은 비교예 1에서는, 수침지 처리 전후에 광선 투과율은 높아져 있지만, 최저 반사율은 변화되지 않는다는 것을 알 수 있었다.From the results of Table 1, it was found that the cured film after the water immersion treatment had a lower reflectance and a higher light transmittance than the cured film before the water immersion treatment. On the other hand, in the comparative example 1 which does not contain the component (C), although the light transmittance was high before and after the water immersion process, it turned out that the minimum reflectance does not change.
실시예 4 및 비교예 2, 3Example 4 and Comparative Examples 2 and 3
표 2에 나타낸 조성의 광 경화성 조성물을 표 2에 나타낸 막 두께가 되도록 TAC 기재 위에 직접 도포한 것 이외에는, 실시예 1과 동일하게 하여 수침지 처리 후의 경화막을 얻었다. 얻어진 경화막의 헤이즈 및 광선 투과율을 측정하였다. 결과를 표 2에 나타낸다.Except having apply | coated directly the photocurable composition of the composition shown in Table 2 on the TAC base material so that it may become the film thickness shown in Table 2, it carried out similarly to Example 1, and obtained the cured film after water immersion treatment. The haze and light transmittance of the obtained cured film were measured. The results are shown in Table 2.
표 2의 결과로부터, 성분 (A) 실리카 입자를 함유하지 않은 비교예 2에서는, 막 두께가 100 ㎚로 얇기 때문에 헤이즈가 비교적 작지만, 광선 투과율은 낮다는 것을 알 수 있었다. 실시예 4에서는 막 두께가 300 ㎚여도 헤이즈가 작지만, 비교예 3에서는 경화막이 백탁되어 있고, 광선 투과율도 낮다는 것을 알 수 있었다.From the result of Table 2, in the comparative example 2 which does not contain the component (A) silica particle, since the film thickness was thin at 100 nm, although haze was comparatively small, it turned out that light transmittance is low. In Example 4, although the haze was small even if the film thickness was 300 nm, in the comparative example 3, it turned out that the cured film was cloudy and the light transmittance was also low.
본 발명의 광 경화성 조성물에 따르면, 굴절률 및 반사율이 매우 낮은 경화막을 형성할 수 있다. 그 때문에, 특히 반사 방지막의 저굴절률층 형성용 재료로서 유용하다.According to the photocurable composition of this invention, the cured film with a very low refractive index and a reflectance can be formed. Therefore, it is especially useful as a low refractive index layer forming material of an antireflection film.
[도 1] 본 발명의 한 실시 형태에 따른 반사 방지막의 단면도이다.1 is a cross-sectional view of an antireflection film according to an embodiment of the present invention.
<도면의 주요 부분에 대한 부호의 간단한 설명><Brief description of symbols for the main parts of the drawings>
10: 반사 방지막10: antireflection film
12: 기재12: description
14: 하드 코팅층14: hard coating layer
16: 고굴절률층16: high refractive index layer
18: 저굴절률층18: low refractive index layer
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