KR100902668B1 - Ssd 테스트용 탑재장치 - Google Patents
Ssd 테스트용 탑재장치 Download PDFInfo
- Publication number
- KR100902668B1 KR100902668B1 KR1020090014550A KR20090014550A KR100902668B1 KR 100902668 B1 KR100902668 B1 KR 100902668B1 KR 1020090014550 A KR1020090014550 A KR 1020090014550A KR 20090014550 A KR20090014550 A KR 20090014550A KR 100902668 B1 KR100902668 B1 KR 100902668B1
- Authority
- KR
- South Korea
- Prior art keywords
- ssd
- socket
- connector
- fixing part
- main body
- Prior art date
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
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- G—PHYSICS
- G08—SIGNALLING
- G08B—SIGNALLING OR CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS
- G08B21/00—Alarms responsive to a single specified undesired or abnormal condition and not otherwise provided for
- G08B21/18—Status alarms
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- G—PHYSICS
- G08—SIGNALLING
- G08B—SIGNALLING OR CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS
- G08B5/00—Visible signalling systems, e.g. personal calling systems, remote indication of seats occupied
- G08B5/22—Visible signalling systems, e.g. personal calling systems, remote indication of seats occupied using electric transmission; using electromagnetic transmission
- G08B5/36—Visible signalling systems, e.g. personal calling systems, remote indication of seats occupied using electric transmission; using electromagnetic transmission using visible light sources
Abstract
Description
Claims (8)
- 소켓이 구비된 SSD(solid state drive)가 안착되는 안착부가 구비되며 상기 안착부의 일측으로 고정부가 구비된 본체부; 및상기 소켓과 전기적으로 연결되는 커넥터가 설치되며 상기 본체부에 안착된 SSD의 소켓측으로 슬라이딩 이동 시 상기 커넥터가 상기 소켓에 연결되도록 상기 고정부에 슬라이딩 가능하게 설치되는 이동부;를 포함하여 구성된 SSD 테스트용 탑재장치.
- 제1항에 있어서,상기 본체부는,안착부가 구비됨과 동시에 상기 안착부에 상기 SSD가 안착된 상태를 유지하도록 상기 SSD의 외부 테두리에 밀착되는 위치로 구비되는 끼움부를 더 포함하여 구성된 것을 특징으로 하는 SSD 테스트용 탑재장치.
- 제2항에 있어서,상기 끼움부는,상기 안착부에 안착된 후의 상기 SSD의 모서리부의 위치에 각각 구비되는 것을 특징으로 하는 SSD 테스트용 탑재장치.
- 제1항에 있어서,상기 이동부는 슬라이딩 방식으로 이동 후 상기 고정부에 고정된 상태를 이루도록 하는 걸림후크를 더 포함하여 구성된 것을 특징으로 하는 SSD 테스트용 탑재장치.
- 제4항에 있어서,일단이 상기 이동부에 결합됨과 동시에 상기 고정부에 관통삽입되어 상기 고정부를 따라 슬라이딩 이동되도록 하는 슬라이딩바를 더 포함하여 구성된 것을 특징으로 하는 SSD 테스트용 탑재장치.
- 제4항에 있어서,상기 이동부가 상기 고정부에 고정된 상태에서 상기 걸림편을 상기 고정부로부터 해제시킨 경우 탄성력에 의하여 원래의 위치로 돌아가도록 하는 탄성부재가 더 포함된 것을 특징으로 하는 SSD 테스트용 탑재장치.
- 제6항에 있어서,상기 탄성부재는 코일스프링인 것을 특징으로 하는 SSD 테스트용 탑재장치.
- 제1항에 있어서,상기 본체부는,상기 소켓이 상기 커넥터와 전기적으로 연결되는 경우 연결된 상태를 시각적으로 알려주기 위한 LED가 더 포함된 것을 특징으로 하는 SSD 테스트용 탑재장치.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020090014550A KR100902668B1 (ko) | 2009-02-20 | 2009-02-20 | Ssd 테스트용 탑재장치 |
Applications Claiming Priority (1)
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KR1020090014550A KR100902668B1 (ko) | 2009-02-20 | 2009-02-20 | Ssd 테스트용 탑재장치 |
Publications (1)
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KR100902668B1 true KR100902668B1 (ko) | 2009-06-15 |
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KR1020090014550A KR100902668B1 (ko) | 2009-02-20 | 2009-02-20 | Ssd 테스트용 탑재장치 |
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100934972B1 (ko) * | 2009-07-13 | 2010-01-06 | (주) 제노맥스 | Ssd 소켓장치 |
US9360499B2 (en) | 2012-07-12 | 2016-06-07 | Samsung Electronics Co., Ltd. | Socket for testing a semiconductor device and test equipment including the same |
KR20190036076A (ko) | 2017-09-27 | 2019-04-04 | (주) 제노맥스 | Ssd 테스터 보드의 보드 번호 부여용 usb 장치 및 그 방법 |
KR102054323B1 (ko) * | 2018-10-22 | 2019-12-11 | (주)트로이씨앤씨 | 솔리드 스테이트 디스크를 구비한 웹서버장치 |
KR20200109529A (ko) * | 2019-03-13 | 2020-09-23 | 주식회사 오킨스전자 | Ssd 테스트용 오토 로딩-언로딩 젠더 |
KR20220022612A (ko) | 2020-08-19 | 2022-02-28 | 여석현 | 온라인 네트워크 기반 ssd 렌탈 관리 시스템 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20030023214A (ko) * | 2001-09-12 | 2003-03-19 | 미래산업 주식회사 | 반도체 소자 테스트용 핸들러 |
-
2009
- 2009-02-20 KR KR1020090014550A patent/KR100902668B1/ko active IP Right Grant
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20030023214A (ko) * | 2001-09-12 | 2003-03-19 | 미래산업 주식회사 | 반도체 소자 테스트용 핸들러 |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100934972B1 (ko) * | 2009-07-13 | 2010-01-06 | (주) 제노맥스 | Ssd 소켓장치 |
US9360499B2 (en) | 2012-07-12 | 2016-06-07 | Samsung Electronics Co., Ltd. | Socket for testing a semiconductor device and test equipment including the same |
KR20190036076A (ko) | 2017-09-27 | 2019-04-04 | (주) 제노맥스 | Ssd 테스터 보드의 보드 번호 부여용 usb 장치 및 그 방법 |
KR102054323B1 (ko) * | 2018-10-22 | 2019-12-11 | (주)트로이씨앤씨 | 솔리드 스테이트 디스크를 구비한 웹서버장치 |
KR20200109529A (ko) * | 2019-03-13 | 2020-09-23 | 주식회사 오킨스전자 | Ssd 테스트용 오토 로딩-언로딩 젠더 |
KR102184991B1 (ko) * | 2019-03-13 | 2020-12-01 | 주식회사 오킨스전자 | Ssd 테스트용 오토 로딩-언로딩 젠더 |
KR20220022612A (ko) | 2020-08-19 | 2022-02-28 | 여석현 | 온라인 네트워크 기반 ssd 렌탈 관리 시스템 |
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