KR100875806B1 - 표면 평가를 위한 방법 및 장치 - Google Patents

표면 평가를 위한 방법 및 장치 Download PDF

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Publication number
KR100875806B1
KR100875806B1 KR1020037012945A KR20037012945A KR100875806B1 KR 100875806 B1 KR100875806 B1 KR 100875806B1 KR 1020037012945 A KR1020037012945 A KR 1020037012945A KR 20037012945 A KR20037012945 A KR 20037012945A KR 100875806 B1 KR100875806 B1 KR 100875806B1
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KR
South Korea
Prior art keywords
sample
light
light source
range
paint film
Prior art date
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Expired - Fee Related
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KR1020037012945A
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English (en)
Korean (ko)
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KR20040012743A (ko
Inventor
데하아스클라아스헨드리크
두브벨담게리트코르넬리스
반데르란스이보베르나르두스니콜라아스
프리에스로빈파울
Original Assignee
아크조노벨코팅스인터내셔널비.브이.
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Publication of KR20040012743A publication Critical patent/KR20040012743A/ko
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0216Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using light concentrators or collectors or condensers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/10Arrangements of light sources specially adapted for spectrometry or colorimetry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/504Goniometric colour measurements, for example measurements of metallic or flake based paints
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/52Measurement of colour; Colour measuring devices, e.g. colorimeters using colour charts
    • G01J3/524Calibration of colorimeters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/57Measuring gloss

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
KR1020037012945A 2001-04-06 2002-03-28 표면 평가를 위한 방법 및 장치 Expired - Fee Related KR100875806B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP01201276.1 2001-04-06
EP01201276 2001-04-06
PCT/EP2002/003682 WO2002082063A1 (en) 2001-04-06 2002-03-28 Method and device for surface evaluation

Publications (2)

Publication Number Publication Date
KR20040012743A KR20040012743A (ko) 2004-02-11
KR100875806B1 true KR100875806B1 (ko) 2008-12-26

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020037012945A Expired - Fee Related KR100875806B1 (ko) 2001-04-06 2002-03-28 표면 평가를 위한 방법 및 장치

Country Status (9)

Country Link
EP (1) EP1373867A1 (enExample)
JP (1) JP3933581B2 (enExample)
KR (1) KR100875806B1 (enExample)
CN (1) CN100403011C (enExample)
AU (1) AU2002338353B2 (enExample)
BR (1) BR0208660A (enExample)
RU (1) RU2292037C2 (enExample)
WO (1) WO2002082063A1 (enExample)
ZA (1) ZA200307712B (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0625890D0 (en) * 2006-12-23 2007-02-07 Colormatrix Holdings Inc Polymeric materials
US9025153B2 (en) * 2011-11-16 2015-05-05 Axalta Coating Systems Ip Co., Llc Process for predicting degree of mottling in coating compositions by wet color measurement
JP5475057B2 (ja) 2012-04-20 2014-04-16 株式会社 オフィス・カラーサイエンス 変角分光イメージング測定方法およびその装置
SG11201407341TA (en) * 2012-05-09 2014-12-30 Seagate Technology Llc Surface features mapping
CN103674903A (zh) * 2013-12-31 2014-03-26 爱彼思(苏州)自动化科技有限公司 非接触式光泽度仪
US9880098B2 (en) * 2014-10-28 2018-01-30 Axalta Coatings Systems Ip Co., Llc Method and systems for quantifying differences between colored surfaces
US9678018B2 (en) * 2015-03-30 2017-06-13 Gemological Institute Of America Inc. (Gia) Apparatus and method for assessing optical quality of gemstones
CN106908149A (zh) * 2017-04-11 2017-06-30 上海电机学院 一种机器人物体颜色识别系统及方法
KR102047206B1 (ko) * 2018-10-31 2019-11-20 한국과학기술원 체적함수비별 반사율 측정을 위한 함수특성곡선-초분광 캠 테스트 방법 및 장치
JP7341835B2 (ja) * 2019-10-09 2023-09-11 株式会社日立製作所 粉体混合システム及び粉体混合方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH552197A (de) * 1972-11-24 1974-07-31 Bbc Brown Boveri & Cie Einrichtung zum messen der rauhigkeit einer oberflaeche.
FR2515823B1 (fr) * 1980-11-24 1986-04-11 Cegedur Procede et dispositif de controle optique des etats de surface de produits metallurgiques
JP2588297B2 (ja) * 1990-06-20 1997-03-05 日産自動車株式会社 塗装表面の鮮映性評価方法
US5078496A (en) * 1990-08-14 1992-01-07 Autospect, Inc. Machine vision surface characterization system
GB9307279D0 (en) * 1993-04-07 1993-06-02 Feather James W Goniophotometer
US5640237A (en) * 1995-08-29 1997-06-17 Kla Instruments Corporation Method and apparatus for detecting non-uniformities in reflective surafaces
JP3312849B2 (ja) * 1996-06-25 2002-08-12 松下電工株式会社 物体表面の欠陥検出方法
JP4527205B2 (ja) * 1997-03-31 2010-08-18 リアル・タイム・メトロジー,インコーポレーテッド 光学検査モジュール、及び統合プロセス工具内で基板上の粒子及び欠陥を検出するための方法
JPH11281584A (ja) * 1998-03-30 1999-10-15 Minolta Co Ltd 検査方法およびその装置

Also Published As

Publication number Publication date
JP2004526969A (ja) 2004-09-02
CN1505757A (zh) 2004-06-16
AU2002338353B2 (en) 2006-05-25
JP3933581B2 (ja) 2007-06-20
KR20040012743A (ko) 2004-02-11
BR0208660A (pt) 2004-03-09
WO2002082063A1 (en) 2002-10-17
RU2003132476A (ru) 2005-03-20
EP1373867A1 (en) 2004-01-02
ZA200307712B (en) 2004-07-06
CN100403011C (zh) 2008-07-16
RU2292037C2 (ru) 2007-01-20

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