AU2002338353B2 - Method and device for surface evaluation - Google Patents

Method and device for surface evaluation Download PDF

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Publication number
AU2002338353B2
AU2002338353B2 AU2002338353A AU2002338353A AU2002338353B2 AU 2002338353 B2 AU2002338353 B2 AU 2002338353B2 AU 2002338353 A AU2002338353 A AU 2002338353A AU 2002338353 A AU2002338353 A AU 2002338353A AU 2002338353 B2 AU2002338353 B2 AU 2002338353B2
Authority
AU
Australia
Prior art keywords
light
sample
light source
imaging device
recording
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
AU2002338353A
Other languages
English (en)
Other versions
AU2002338353A1 (en
Inventor
Klaas Hendrik De Haas
Gerrit Cornelis Dubbeldam
Robin Paul Fries
Ivo Bernardus Nicolaas Van Der Lans
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Akzo Nobel Coatings International BV
Original Assignee
Akzo Nobel Coatings International BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Akzo Nobel Coatings International BV filed Critical Akzo Nobel Coatings International BV
Publication of AU2002338353A1 publication Critical patent/AU2002338353A1/en
Application granted granted Critical
Publication of AU2002338353B2 publication Critical patent/AU2002338353B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0216—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using light concentrators or collectors or condensers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/504—Goniometric colour measurements, for example measurements of metallic or flake based paints
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/52—Measurement of colour; Colour measuring devices, e.g. colorimeters using colour charts
    • G01J3/524—Calibration of colorimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
AU2002338353A 2001-04-06 2002-03-28 Method and device for surface evaluation Ceased AU2002338353B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP01201276.1 2001-04-06
EP01201276 2001-04-06
PCT/EP2002/003682 WO2002082063A1 (en) 2001-04-06 2002-03-28 Method and device for surface evaluation

Publications (2)

Publication Number Publication Date
AU2002338353A1 AU2002338353A1 (en) 2003-04-10
AU2002338353B2 true AU2002338353B2 (en) 2006-05-25

Family

ID=8180117

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2002338353A Ceased AU2002338353B2 (en) 2001-04-06 2002-03-28 Method and device for surface evaluation

Country Status (9)

Country Link
EP (1) EP1373867A1 (enExample)
JP (1) JP3933581B2 (enExample)
KR (1) KR100875806B1 (enExample)
CN (1) CN100403011C (enExample)
AU (1) AU2002338353B2 (enExample)
BR (1) BR0208660A (enExample)
RU (1) RU2292037C2 (enExample)
WO (1) WO2002082063A1 (enExample)
ZA (1) ZA200307712B (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0625890D0 (en) * 2006-12-23 2007-02-07 Colormatrix Holdings Inc Polymeric materials
US9025153B2 (en) * 2011-11-16 2015-05-05 Axalta Coating Systems Ip Co., Llc Process for predicting degree of mottling in coating compositions by wet color measurement
JP5475057B2 (ja) 2012-04-20 2014-04-16 株式会社 オフィス・カラーサイエンス 変角分光イメージング測定方法およびその装置
SG11201407341TA (en) * 2012-05-09 2014-12-30 Seagate Technology Llc Surface features mapping
CN103674903A (zh) * 2013-12-31 2014-03-26 爱彼思（苏州）自动化科技有限公司 非接触式光泽度仪
US9880098B2 (en) * 2014-10-28 2018-01-30 Axalta Coatings Systems Ip Co., Llc Method and systems for quantifying differences between colored surfaces
US9678018B2 (en) * 2015-03-30 2017-06-13 Gemological Institute Of America Inc. (Gia) Apparatus and method for assessing optical quality of gemstones
CN106908149A (zh) * 2017-04-11 2017-06-30 上海电机学院 一种机器人物体颜色识别系统及方法
KR102047206B1 (ko) * 2018-10-31 2019-11-20 한국과학기술원 체적함수비별 반사율 측정을 위한 함수특성곡선-초분광 캠 테스트 방법 및 장치
JP7341835B2 (ja) * 2019-10-09 2023-09-11 株式会社日立製作所 粉体混合システム及び粉体混合方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5640237A (en) * 1995-08-29 1997-06-17 Kla Instruments Corporation Method and apparatus for detecting non-uniformities in reflective surafaces
US5909276A (en) * 1997-03-31 1999-06-01 Microtherm, Llc Optical inspection module and method for detecting particles and defects on substrates in integrated process tools
US5946029A (en) * 1996-06-25 1999-08-31 Matsushita Electric Works, Ltd Image processing process

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH552197A (de) * 1972-11-24 1974-07-31 Bbc Brown Boveri & Cie Einrichtung zum messen der rauhigkeit einer oberflaeche.
FR2515823B1 (fr) * 1980-11-24 1986-04-11 Cegedur Procede et dispositif de controle optique des etats de surface de produits metallurgiques
JP2588297B2 (ja) * 1990-06-20 1997-03-05 日産自動車株式会社 塗装表面の鮮映性評価方法
US5078496A (en) * 1990-08-14 1992-01-07 Autospect, Inc. Machine vision surface characterization system
GB9307279D0 (en) * 1993-04-07 1993-06-02 Feather James W Goniophotometer
JPH11281584A (ja) * 1998-03-30 1999-10-15 Minolta Co Ltd 検査方法およびその装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5640237A (en) * 1995-08-29 1997-06-17 Kla Instruments Corporation Method and apparatus for detecting non-uniformities in reflective surafaces
US5946029A (en) * 1996-06-25 1999-08-31 Matsushita Electric Works, Ltd Image processing process
US5909276A (en) * 1997-03-31 1999-06-01 Microtherm, Llc Optical inspection module and method for detecting particles and defects on substrates in integrated process tools

Also Published As

Publication number Publication date
JP2004526969A (ja) 2004-09-02
CN1505757A (zh) 2004-06-16
JP3933581B2 (ja) 2007-06-20
KR20040012743A (ko) 2004-02-11
BR0208660A (pt) 2004-03-09
WO2002082063A1 (en) 2002-10-17
RU2003132476A (ru) 2005-03-20
EP1373867A1 (en) 2004-01-02
KR100875806B1 (ko) 2008-12-26
ZA200307712B (en) 2004-07-06
CN100403011C (zh) 2008-07-16
RU2292037C2 (ru) 2007-01-20

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FGA Letters patent sealed or granted (standard patent)
MK14 Patent ceased section 143(a) (annual fees not paid) or expired