KR100842616B1 - 시각 모형에 의해 평면 표시장치를 검출하는 방법과 장치 - Google Patents

시각 모형에 의해 평면 표시장치를 검출하는 방법과 장치 Download PDF

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Publication number
KR100842616B1
KR100842616B1 KR1020050104351A KR20050104351A KR100842616B1 KR 100842616 B1 KR100842616 B1 KR 100842616B1 KR 1020050104351 A KR1020050104351 A KR 1020050104351A KR 20050104351 A KR20050104351 A KR 20050104351A KR 100842616 B1 KR100842616 B1 KR 100842616B1
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South Korea
Prior art keywords
image
detection
generation system
detecting
flat panel
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KR1020050104351A
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English (en)
Korean (ko)
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KR20060052414A (ko
Inventor
차오 후아 웬
지아 하우 구오
지 지안 장
Original Assignee
타이완 티에프티 엘씨디 오쏘시에이션
중화 픽쳐 튜브스 리미티드
에이유 오프트로닉스 코퍼레이션
퀀타 디스플레이 인크
한스타 디스플레이 코퍼레이션
치 메이 옵토일렉트로닉스 코포레이션
인더스트리얼 테크놀로지 리써치 인스티튜트
탑폴리 옵토일렉트로닉스 코포레이션
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Application filed by 타이완 티에프티 엘씨디 오쏘시에이션, 중화 픽쳐 튜브스 리미티드, 에이유 오프트로닉스 코퍼레이션, 퀀타 디스플레이 인크, 한스타 디스플레이 코퍼레이션, 치 메이 옵토일렉트로닉스 코포레이션, 인더스트리얼 테크놀로지 리써치 인스티튜트, 탑폴리 옵토일렉트로닉스 코포레이션 filed Critical 타이완 티에프티 엘씨디 오쏘시에이션
Publication of KR20060052414A publication Critical patent/KR20060052414A/ko
Application granted granted Critical
Publication of KR100842616B1 publication Critical patent/KR100842616B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/40—Analysis of texture
    • G06T7/41—Analysis of texture based on statistical description of texture
    • G06T7/44—Analysis of texture based on statistical description of texture using image operators, e.g. filters, edge density metrics or local histograms
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L2300/00—Additional constructional details
    • B01L2300/02—Identification, exchange or storage of information
    • B01L2300/025—Displaying results or values with integrated means
    • B01L2300/027—Digital display, e.g. LCD, LED
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity
    • G01N21/5907—Densitometers
    • G01N2021/5957—Densitometers using an image detector type detector, e.g. CCD

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Biochemistry (AREA)
  • Probability & Statistics with Applications (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
KR1020050104351A 2004-11-02 2005-11-02 시각 모형에 의해 평면 표시장치를 검출하는 방법과 장치 KR100842616B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
TW93133394 2004-11-02
TW093133394A TWI267737B (en) 2004-11-02 2004-11-02 Method and device for detecting flat panel display device by visual model

Publications (2)

Publication Number Publication Date
KR20060052414A KR20060052414A (ko) 2006-05-19
KR100842616B1 true KR100842616B1 (ko) 2008-06-30

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KR1020050104351A KR100842616B1 (ko) 2004-11-02 2005-11-02 시각 모형에 의해 평면 표시장치를 검출하는 방법과 장치

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JP (1) JP2006139777A (ja)
KR (1) KR100842616B1 (ja)
TW (1) TWI267737B (ja)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4799329B2 (ja) * 2006-09-07 2011-10-26 株式会社東芝 ムラ検査方法、表示パネルの製造方法及びムラ検査装置
JP5813610B2 (ja) 2012-09-28 2015-11-17 富士フイルム株式会社 画像評価装置、画像評価方法、及びプログラム
JP5813611B2 (ja) 2012-09-28 2015-11-17 富士フイルム株式会社 画像評価装置、画像評価方法、及びプログラム
CN104216546B (zh) * 2013-06-03 2017-03-15 鸿富锦精密工业（深圳）有限公司 触控显示装置
TWI486839B (zh) * 2013-06-03 2015-06-01 Ye Xin Technology Consulting Co Ltd 觸控顯示裝置
TWI690748B (zh) * 2018-07-23 2020-04-11 財團法人工業技術研究院 透明顯示系統及其操作方法
CN113703203B (zh) * 2021-07-30 2023-08-22 惠州市德赛西威汽车电子股份有限公司 一种针对lcd屏的显示均匀性自动测试法
CN114199892B (zh) * 2021-12-10 2022-11-18 江苏雷默智能科技有限公司 一种基于机器视觉的板材测量方法及系统

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09264728A (ja) * 1996-01-23 1997-10-07 Hitachi Ltd 欠陥または異物の検出の方法および装置、および欠陥または異物を検査された電子部品

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09264728A (ja) * 1996-01-23 1997-10-07 Hitachi Ltd 欠陥または異物の検出の方法および装置、および欠陥または異物を検査された電子部品

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KR20060052414A (ko) 2006-05-19
TWI267737B (en) 2006-12-01
JP2006139777A (ja) 2006-06-01
TW200615744A (en) 2006-05-16

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