KR100833477B1 - automatic selection and separation apparatus for resonance parameter of small size quartz chip - Google Patents

Abstract

The small quartz chip resonant parameter automatic selection separation device according to the present invention is composed of a track, a substrate, a work table, an input table, a webcam, a surveying device, a distribution table, and the like. The measuring device comprises a suction head and a measuring table. The feeder is fixedly installed on one side of the workbench and the distribution table is fixedly installed on the opposite side of the workbench, the surveying station is fixedly installed between the feeder and the dispensing table and the track is installed perpendicular to the worktable. It is fixedly installed on the board. A webcam was connected to the substrate using a fixture on the top of the feeder. The track has a sliding module that can be operated by a computer. The suction head is fixed to the sliding module so that one suction head is used as the upper electrode, and the measuring table measures the resonance parameter of the quartz chip using the lower electrode method. The model according to the present invention realizes the resonant parameters of the small quartz chip so that they can be accurately measured and classified. This model has high positioning accuracy and accurate frequency measurement.

Automatic selection of small quartz chip resonant parameters Separator, track, board, workbench, feeder, webcam, surveying device, distribution table

Description

Automatic selection and separation apparatus for resonance parameter of small size quartz chip}

1 is an overall structural cross-sectional view of a device according to the invention,

2 is a cross-sectional view of a surveying device according to the present invention;

3 is a cross-sectional view of the dispensing apparatus according to the present invention.

-Explanation of symbols on the main parts of the drawings-

1: Orbit 2: Suction Head

3: Sliding module 4: Feeding table

5: webcam (webcam) 6: surveying station

7: holder 8: quartz chip

9: Distribution Table 10: Distribution Box

11: Distribution Box Cover 12: Distribution Hole

13 work bench 14 substrate

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a type of crystal resonant parameter measurement device, and more particularly, to a type of automatic selection and separation device of a small size quartz chip resonant parameter.

Quartz crystals are currently the most used piezoelectric crystal material. Electronic components manufactured using the physical properties of quartz crystals, for example, quartz crystal resonators, crystal filters, crystal vibrators, etc., have very high frequency integrity and are used as frequency references or frequency sources. It is widely used in the field of communication and communication. Quartz crystals are the basic materials for the production of quartz crystal parts and require several inspections and classifications of one parameter, especially resonant parameters, on the chip during production and processing. Therefore, the automatic selection and separation system of resonant parameters of quartz chips is an essential equipment for the production of quartz crystal series products. With the development of electronic technology, the volume of electronic components is gradually decreasing, and the demand for SMD-sealed quartz crystal parts is increasing day by day, making the production of small-size quartz chip products an important task that can no longer be delayed. .

The quartz chip selection separation system currently used is represented by the "quartz chip automatic positioning and frequency selection device" disclosed in Chinese patent ZL 002407590 and the "quartz chip frequency automatic selection device" disclosed in Chinese patent ZL 01271098.9. Doing. It mainly feeds raw materials using a hopper and clove feeder in a vibrating manner. That is, the chip is transported to the frequency measuring device. The dispensing device is installed at the outlet of the frequency measuring device and the chip is placed in the dispensing box of each class by the rotational movement of the dispensing device. The use of the above equipment makes the measurement inspection and separation of the resonant parameters of quartz chips realize automated production, which has brought much progress compared to the A-QB-120 type transitional static frequency measurement automatic separation system produced by Japan HUMO company. . This equipment has the advantages of simple mechanical structure, low chip breakage rate and fast separation speed. However, the following drawbacks also exist.

1. As the mechanical structure and working method are limited, it is used only for the separation of the resonance parameters of ordinary volume quartz chips, and when used for small quartz chips, a large amount of chipping chips and leaks occur.

2. The positioning of chips is realized mainly through mechanical devices, so they do not meet the requirements for positioning accuracy of small chips.

An object of the present invention is to provide a device which is accurate in position determination, accurate in measurement, and which can be applied to automatic selection and separation of resonance parameters of a small quartz chip.

The object of the present invention is realized through the following description. The small quartz chip resonant parameter automatic selection separation device according to the present invention for solving the above problems is configured to include a track, a substrate, a work table, a webcam (webcam), an input table used for placing the chip, a measuring device, a distribution table. The measuring device includes a suction head and a measuring table. The distribution table is provided with a distribution hole. The lower side of the distribution hole is provided with a distribution box corresponding to the distribution hole one by one. The feeding table is fixedly installed at one side of the work table in a horizontal position, and the distribution table is fixedly installed at the opposite side of the work table. The measuring table is fixedly installed between the feeding table and the distribution table. The track is fixed to the substrate perpendicular to the workbench, and the webcam is located on the top of the feeder and is connected to the substrate through the holder. Sliding module is installed in the track and the sliding module can be moved in the horizontal direction by subtracting with a computer. The suction head is fixed to the sliding module.

Hereinafter, an embodiment of the present invention will be described in detail with reference to the accompanying drawings.

1, 2, 3, the installation apparatus according to the present invention, the track 1, the substrate 14, the work table 13, the webcam (webcam) 5, the input table 4, It comprises a surveying apparatus and a distribution table 9. The surveying device comprises a suction head 2, a surveying table 6. The overall structure will be described with reference to FIG. 1. The feeding table 4 is fixedly installed on one side of the worktable 13 in a horizontal position, the distribution table 9 is fixedly installed on the opposite side of the working table, and the surveying table 6 is the loading table. It is fixed between the 4 and the distribution table 9.

The track 1 is fixedly mounted on a substrate 14 perpendicular to the work table, and the webcam 5 is connected to the substrate 14 through a holder 7 on an upper side of the feeding table 4. Connected. The track 1 is provided with a sliding module 3 to move the position in the horizontal direction through the computer. The suction stand 2 is fixed to the sliding module 3. The feeder 4 is used to feed the chip, and the webcam 5 checks and measures the chip to be measured by the image identification method. The computer deducts the sliding module and moves the suction head 2 to the top of the chip to be measured and at the same time sucks the chip.

The measurement device will be described with reference to FIG. 2. The surveying device includes the suction head 2 and the surveying table 6. The suction head 2 sucks the chip, and then transfers the chip to the top of the surveying table 6. At the same time, the suction head 2 is divided into an upper electrode, and the measuring stand 6 is divided into a lower electrode to measure the resonance parameter of the chip 8.

The distribution device will be described with reference to FIG. 3. A distribution hole 12 is installed in the distribution table 9 so that the distribution box 10 corresponds to the distribution hole 12. After the surveying, the suction head 2 sucks the chip and transfers the upper portion of the distribution table 9. Then, based on the survey result, the chip is placed in the distribution hole 12 corresponding to the grade. The chip is dropped into the corresponding distribution box 10 through the distribution hole 12.

The operation principle is described below.

First, the chip is put into the loading table 14. The webcam 5 measures and checks a chip to be measured by an image identification method. Then, the sliding module is controlled by a computer to move in the horizontal direction, that is, move the suction head 2 to determine the suction head position toward the normal direction of the chip to be measured. The suction head 2 transfers the chip to be measured to the measurement stand 6 after suction. In this case, the suction head 2 is an upper electrode, and the measuring table measures a resonance parameter of the chip as a lower electrode. After the survey is finished, the chip is placed in the corresponding distribution hole 12 based on the survey result. The chip then falls into the corresponding dispenser through the distribution hole 12 and thus the selection of one chip is finished.

The device according to the present invention configured as described above has the significant advantages compared to the prior art as follows:

1. In accordance with the characteristics of the small chip, the vibration raw material transfer method is discarded, and the flat plate transfer method is adopted to reduce chip loss and there is no fear of power failure.

2. It is a measurement test method of image identification method and it is combined with a small suction head to guarantee the accuracy of positioning.

3. The whole process of raw material acquisition, measurement and distribution is completed with the same suction head on the same track, so that the efficiency is high and the chip damage is reduced.

4. Simple structure and simple operation.

Claims (2)

Between the input table 4 fixed to one side of the work table 13, the separator 9 fixed to the opposite side of the work table 13, and the input table 4 and the separator table 9; A measuring table 6 fixed to the substrate, a substrate 14 perpendicular to the work table 13, a track 1 fixed to the substrate 14, and an upper portion of the charging table 4; Webcam (5) which is located on the side and connected to the substrate (14) through a fixed base (7), and installed on the track (1) and can be controlled to move in a horizontal direction with a computer Small quartz chip resonant parameter automatic selection separator characterized in that the surveying device is composed of a suction head (2) fixed to the sliding module (3) and the suction head (2) and the surveying table (6) . The method of claim 1, The device for automatically selecting and separating a small quartz chip resonant parameter according to claim 1, wherein the suction head 2 is an upper electrode, and the measuring table 6 is a lower electrode.

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