KR100698377B1 - Gross test zig for inspecting flat panel display - Google Patents

Abstract

The present invention relates to a gross test jig device for inspecting a display panel, and a technical problem to be solved is to accurately contact a probe pin with an input / output pattern of a display panel by moving a display panel to an accurate reference position. To this end, the gist of the solution according to the present invention includes a jig 110 and a jig 110 in which a display panel 101 having at least one reference pattern 105 and a plurality of input / output patterns 104 is seated thereon. It is installed on the inside, the suction unit 120 for vacuum adsorption by fixing the display panel 101, the jig 110 is installed in the lower portion, the jig for moving the position of the jig 110 in the X, Y, θ direction A camera 140 installed below the stage 130 and one side of the jig stage 130, and photographing the reference pattern 105 of the display panel 101 through the opening 112 of the jig 110; The display is installed on one side of the camera 140, the camera stage 150 to move the position of the camera 140 in the X, Y direction, and is installed on one side of the jig 110, the display mounted on the jig 110 Display including inspection unit 160 electrically connected to input / output pattern 104 of panel 101 The panel gloss test jig apparatus is disclosed for testing.

Display panel, gross test, jig, camera, stage

Description

Gross test zig for inspecting flat panel display

1 is a plan view showing an example of a display panel tested by a gross test jig device for inspecting a display panel according to the present invention.

2 is a side view illustrating a gross test jig device for inspecting a display panel according to the present invention.

3 is a plan sectional view showing a jig, a jig stage, and a camera stage in the gross test jig apparatus for inspecting a display panel according to the present invention.

4 is a cross-sectional view taken along line 1-1 of FIG. 3.

5 is a side view illustrating a gross test jig device for inspecting a display panel according to the present invention.

6 is a plan sectional view showing only a camera in a gross test jig device for inspecting a display panel according to the present invention.

7 is a front view of FIG. 6.

8 illustrates a state in which a reference pattern of a display panel photographed by a camera is displayed on a monitor in a gross test jig device for inspecting a display panel according to the present invention.

<Description of Symbols for Main Parts of Drawings>

100; Gross test jig device for display panel inspection according to the present invention

101; Display panel 102; Active area

103; Border area 104; I / O pattern

105; Reference pattern 110; Jig

111; Seating grooves 112; Opening

113; Backlight 120; Adsorption part

121; Adsorption hose 130; Jig stage

131; X stage 131a; Tops

131b; Bottom 131c; Cross roller bearing

131d; Spring 131e; Opening

131f; 131 g bracket; X micrometer

131h; Rod 131i; ball

132; Y stage 132a; Tops

132b; Lower plate 132c; Cross roller bearing

132d; Spring 132e; Brackets

132f; Y micrometer 132g; road

132h; Bracket 132i; volt

133; θ stage 133a; Support plate

133b; Rotation center axis 133c; Brackets

133d; θ micrometer 133e; road

133f; 133 g bracket; volt

133h; Spring 133i; Protrusion bar

133j; Bearing 140; camera

141; A lens unit 142; Optical transmission unit

143; CCD camera 150; Camera stage

151; Upper transfer block 152; Upper rail

153; Lower transfer block 154; Lower rail

155; X direction knob 156; Y direction knob

157; Bracket 158; spring

160; Inspection unit 161; Probe card

162; Probe pin 163; Lifting block

164; Cylinder 165; Micrometer

166; Monitor 167; Reference position

The present invention relates to a gross test jig device for inspecting a display panel, and more particularly, for a display panel inspection capable of accurately contacting probe pins with an input / output pattern of a display panel by moving a position of the display panel to an accurate reference position. It is related to a gross test jig apparatus.

In general, a flat panel display (hereinafter, referred to as a display panel) refers to an image display device that is thinner and lighter than a television or a computer monitor (Brown Tube). Such display panels typically include LCD, PDP, FED, ELD, etc., and the structure and manufacturing method thereof are slightly different for each type.

As an example, the structure of the TFT-LCD will be described as a lower glass substrate on which TFTs (thin film transistors) are formed, an upper glass substrate on which color filters are formed, and liquid crystals injected therebetween. Consists of. The TFT serves to transmit and control the electrical signal, and the liquid crystal controls the transmission of light by varying the molecular structure according to the applied voltage. The light so controlled passes through the color filter to produce the desired color and image.

In addition, the LCD manufacturing method is largely composed of a TFT process, a color filter process, a cell process, and a module process. In the TFT process, very similar to the semiconductor manufacturing process, TFTs are arranged and formed on the lower glass substrate by repeating deposition, photography, and etching. In the color filter step, a color filter is formed on the upper glass substrate. In the cell process, an alignment layer is formed between the lower glass substrate and the upper glass substrate, and the spacers are dispersed and then bonded to each other. After the bonding, the liquid crystal is injected between the upper glass substrate and the lower glass substrate by using a capillary phenomenon, and then the injection hole is sealed. In the module process, various peripheral parts such as a polarizer and a backlight are attached to the flat plate.

On the other hand, such a display panel is subjected to a variety of electrical inspection whether the normal operation before the cell process after the cell process. That is, when various electrical signals are input while the probe pins are electrically connected to the input / output patterns formed on the display panel, the display panel visually inspects whether the display panel properly displays. This visual inspection is a full inspection because the above-described display panel is assembled into a product immediately after modularization.

However, in the related art, the inspection of the display panel is performed manually by an operator, so that the time is very long. That is, in the state where the operator places the above-described display panel on a jig of a certain type, the inspection probe pin is electrically contacted with a predetermined pattern of the display panel and inspected so that it takes a long time and the inspection is not performed accurately. .

In addition, recently, since the pitch of the input / output pattern formed on the display panel is gradually finer, it is very difficult for the operator to directly contact the probe pin with the pattern, and thus the inspection speed is further lowered.

Moreover, the force for bringing the probe pins into contact with the pattern of the display panel is different for each operator, so that the glass substrate or the pattern of the display panel may be broken in some cases.

The present invention is to overcome the above-mentioned conventional problems, an object of the present invention is a gross test jig for inspecting a display panel that can adjust the X, Y, θ position of the display panel seated on the jig for inspection to an accurate reference position To provide a device.

Another object of the present invention is to provide a display panel inspection jig device that can prevent the damage to the pattern or the glass substrate during the inspection, as well as accurate electrical contact by contacting the input and output pattern of the display panel and the probe pin only by a predetermined force. have.

In order to achieve the above object, a gross test jig apparatus for inspecting a display panel according to the present invention includes a jig in which a display panel on which at least one reference pattern and a plurality of input / output patterns are formed is seated on an upper part, and is installed inside the jig. An adsorption part configured to vacuum-adsorb and fix the display panel, a jig stage installed at a lower portion of the jig, a jig stage for moving the position of the jig in the X, Y, and θ directions, a jig stage installed at a lower side of the jig stage, A camera for photographing a reference pattern of the display panel through an opening of a jig, a camera stage installed at one side of the camera to move the camera position in X and Y directions, and an upper part of one side of the jig, The inspection unit is electrically connected to the input / output pattern of the display panel seated on the jig. Characterized in that eojin.

Here, the jig may have a plate shape, and a mounting groove may be formed at an upper portion thereof to allow the display panel to be mounted, and an opening may be formed at a lower portion corresponding to the reference pattern of the display panel.

The adsorption part may include a plurality of adsorption hoses arranged in the seating recesses of the jig to vacuum-suck the display panel seated in the seating recesses.

The jig stage is coupled to the lower portion of the jig, the upper plate and the lower plate is mutually coupled to the cross roller bearing so as to be relatively movable, the lower plate X stage is fixed to the X micrometer for moving the position of the upper plate, Y stage is coupled to the lower part of the X stage, the upper plate and the lower plate is mutually coupled to the cross roller bearing so as to be relatively movable, the lower stage of the Y stage is fixed to the Y micrometer for moving the position of the upper plate, A support plate having a central axis of rotation is coupled to the roller bearing, and the support plate may be formed of a θ stage having a fixed θ micrometer capable of rotating the lower plate of the Y stage by θ angle.

The X micrometer is fixed to the bottom plate of the X stage through a bracket, the rod of the X micrometer may be in contact with the ball coupled to the top plate of the X stage.

The Y micrometer is fixed to the lower plate of the Y stage through a bracket, the upper plate of the Y stage is coupled to the bracket extending a certain length to the bottom, the bracket is coupled to the bracket, the Y micrometer is in contact with the bolt Can be.

The θ micrometer is fixed to the support plate through a bracket, and a bolt with a spring is coupled to the support plate spaced a certain distance from the θ micrometer through a bracket, and the Y stage between the rod and the bolt of the θ micrometer Protruding bar protruding from the lower plate of the predetermined length may be interposed.

The X stage may be further coupled to the spring between the upper plate and the lower plate.

The Y stage may be further coupled to the spring between the upper plate and the lower plate.

An opening communicating with the opening of the jig may be further formed in the upper plate of the X stage.

The camera includes two lens units adjacent to each other so as to photograph a reference pattern of a display panel through an opening formed in the jig, an optical transmission unit formed in a direction orthogonal to each lens unit, and a CCD camera coupled to each optical transmission unit. It may be made of.

The camera stage includes a transport block formed by extending a predetermined length to the outside of the optical transmission unit, an X direction handle coupled to the transport block in the X direction to move the transport block in the X direction, and a Y direction to the transport block. Combined, it may be made of a Y-direction handle to move the transfer block in the Y direction.

The inspection unit includes a probe card having a plurality of probe pins so as to be electrically connected to an input / output pattern of a display panel seated on the jig, a lift block on which the probe card is seated, and a cylinder for moving the lift block in an up and down direction. It may be made of.

The lower limit of the elevating block may be further equipped with a micrometer for the lower limit to adjust the falling distance of the elevating block.

The monitor may be further connected to the camera such that the reference pattern of the display panel photographed by the camera is enlarged and displayed.

The jig may further include a backlight to provide lighting to the display panel.

As described above, the gross test jig device for inspecting the display panel according to the present invention can adjust the X, Y, and θ positions of the display panel seated on the jig for inspection to an accurate reference position.

Therefore, the probe pin of the inspection unit can be accurately brought into contact with the input / output pattern of the display panel, and thus the operation inspection of the display panel can be accurately and quickly performed.

In addition, the gross test jig device for inspecting the display panel according to the present invention allows the probe pins of the inspector to always contact the input / output pattern of the display panel with the same force, thereby preventing damage to the input / output pattern or the glass substrate during the inspection as well as accurate electrical contact. You can do it.

Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings such that those skilled in the art may easily implement the present invention.

1 is a plan view showing an example of a display panel tested by a gross test jig device for inspecting a display panel according to the present invention.

As illustrated, the display panel 101 has a border region 103 formed outside the active region 102, and a plurality of input / output patterns 104 and reference patterns 105 are formed at one side of the edge region 103. ) Is formed. Although the display panel 101 will be described later, after detecting the position of the reference pattern 105 to adjust the position of the jig 110 on which the display panel 101 is seated to the correct position, the display panel 101 is applied to the input / output pattern 104. The probe pin 162 is contacted to perform the test.

2 is a side view illustrating a gross test jig device for inspecting a display panel according to the present invention.

As shown, the gross test jig apparatus for inspecting the display panel according to the present invention is provided with a jig 110 in which the display panel 101 is mounted on the upper part, and is installed inside the jig 110, and the display panel 101 is provided. Adsorption unit 120 for vacuum adsorption and fixing, a jig stage 130 installed below the jig 110, and moving the position of the jig 110 in the X, Y, and θ directions, and the jig. It is installed on the lower side of the stage 130, the camera 140 for photographing the reference pattern 105 of the display panel 101 through the jig 110, and is installed on one side of the camera 140, Input and output patterns of the camera stage 150 to move the position of the camera 140 in the X, Y direction, and the upper side of the jig 110, the display panel 101 mounted on the jig 110 An inspection unit 160 electrically connected to 104; On top of the helix 160 includes a monitor 166 that displays the reference pattern 105 of the display panel 101.

3 is a plan sectional view illustrating a jig 110, an adsorption part 120, a jig stage 130, a camera stage 150, and the like in a gross test jig apparatus for inspecting a display panel according to the present invention.

As shown, the jig 110 has a substantially rectangular seating groove 111 formed thereon to seat the display panel 101. In addition, an opening 112 is formed at one side of the seating recess 111, and the opening 112 corresponds to a reference pattern 105 of the display panel 101. In this case, only the edge region 103 is seated in the seating recess 111 in order to prevent the display panel 101 from being damaged in the active region 102. In addition, a backlight 113 is provided below the seating recess 111 to provide illumination to the display panel 101 during the inspection process.

The adsorption part 120 is formed in the seating groove 111 of the jig 110, which is composed of a plurality of adsorption hoses 121 to prevent the display panel 101 from moving during the inspection process. do. Of course, the suction hose 121 adsorbs the edge region 103 of the display panel 101.

The jig stage 130 is installed below the jig 110. The jig stage 130 will be described later, but the X micrometer 131g for moving the jig 110 in the X direction, the Y micrometer 132f for moving the jig 110 in the Y direction, and the jig 110. Θ micrometer 133d for rotating θ by an angle.

In addition, the camera stage 150 is formed on one side of the lower side of the jig 110, but as will be described later, the X direction knob 155 for moving the camera 140 in the X direction and the Y direction for moving in the Y direction. Direction handle 156.

4 is a cross-sectional view taken along line 1-1 of FIG. 3.

5 is a side view illustrating a gross test jig device for inspecting a display panel according to the present invention.

As shown, the jig stage 130 includes an X stage 131, a Y stage 132, and a θ stage 133.

First, the X stage 131 is coupled to the bottom of the jig 110. The X stage 131 has a shape in which a substantially upper plate 131a and a lower plate 131b are coupled to each other. In addition, the upper plate 131a is coupled to each other by a cross roller bearing 131c to move in the X direction on the lower plate 131b. Furthermore, a spring 131d is interposed between the upper plate 131a and the lower plate 131b so as to be strongly fixed after moving in the X direction of the upper plate 131a. In addition, the upper plate 131a extends further outward from the lower plate 131b by a predetermined distance, and a jig 110 is provided thereon. Furthermore, another opening 131e communicating with the opening 112 of the jig 110 is formed in the top plate 131a.

On the other hand, a bracket 131f is installed on the lower plate 131b of the X stage 131, and the X micrometer 131g is fixed to the bracket 131f. In addition, a ball 131i is coupled to the upper plate 131a of the X stage 131, and the ball 131i is in contact with the rod 131h of the X micrometer 131g. Therefore, as the X micrometer 131g is adjusted, the rod 131h pushes the ball 131i in one direction, and the upper plate 131a of the X stage 131 moves in the X direction. . Of course, at this time the top plate (131a) is moved smoothly by the cross roller bearing (131c). Furthermore, the spring 131d is provided between the upper plate 131a and the lower plate 131b, thereby being strongly fixed by the restoring force of the spring 131d after the upper plate 131a is moved.

Subsequently, the Y stage 132 is fixed to the lower plate 131b of the X stage 131. The Y stage 132 also has a form in which the upper plate 132a and the lower plate 132b in the shape of a plate are combined. In addition, the upper plate 132a is coupled to each other by a cross roller bearing 132c to move in the Y direction on the lower plate 132b. In addition, a spring 132d is interposed between the upper plate 132a and the lower plate 132b so that the upper plate 132a may be strongly fixed after the Y plate moves in the Y direction.

On the other hand, a bracket 132e is installed on the lower plate 132b of the Y stage 132, and the Y micrometer 132f is fixed to the bracket 132e. In addition, another bracket 132h extending a predetermined length downward is fixed to the upper plate 132a of the Y stage 132, and a bolt 132i is coupled to the bracket 132h. The bolt 132i is also in contact with the rod 132g of the Y micrometer 132f. Therefore, as the Y micrometer 132f is adjusted, the rod 132g pushes the bolt 132i in one direction, and thus the upper plate 132a of the Y stage 132 moves in the Y direction. . Of course, at this time, the top plate 132a is smoothly moved by the cross roller bearing 132c. In addition, the spring 132d is provided between the upper plate 132a and the lower plate 132b, thereby being strongly fixed by the restoring force of the spring 132d after the upper plate 132a is moved.

The θ stage 133 is coupled to the support plate 132b with the rotation center axis 133b interposed on the lower plate 132b of the Y stage 132. Furthermore, a bearing 133j is coupled between the rotational central axis 133b and the lower plate 132b of the Y stage 132. In addition, a bracket 133c is fixed to the support plate 132b, and a θ micrometer 133d capable of rotating the lower plate 132b of the Y stage 132 by θ angle is fixed to the bracket 133c. It is. In addition, another bracket 133f is fixed at a position spaced apart from the θ micrometer 133d by a predetermined distance. The bracket 133f is coupled with a bolt 133g having a spring 133h interposed therebetween, and a lower plate of the Y stage 132 between the bolt 133g and the rod 133e of the θ micrometer 133d. A protruding bar 133i extending and protruding a predetermined length to the outside of 132b is provided. Therefore, when the θ micrometer 133d is adjusted, the rod 133e of the θ micrometer 133d pushes the protruding bar 133i in a predetermined direction, and thus the lower plate of the Y stage 132 ( 132b is rotated by an angle through the rotation center axis 133b. Of course, this rotation is transmitted to the X stage 131 as it is. Further, the bolt 133g coupled to the bracket 133f by the adjustment of the θ micrometer 133d moves the protruding bar 133i by the elastic force of the spring 133h to the rod 133e of the θ micrometer 133d. Because it is in a state of pushing toward), the rotation state is kept strong.

In addition, the camera 140 and the inspection unit 160 is installed on one side of the jig stage 130. The camera 140 may photograph the reference pattern 105 of the display panel 101 through the opening 131e formed in the upper plate 131a and the opening 112 formed in the jig 110 of the X stage 131. It is supposed to be.

In addition, the inspection unit 160 is provided with a probe card 161 having a probe pin 162 so that the probe pin 162 may be in electrical contact with the input / output pattern 104 of the display panel 101. . That is, the inspection unit 160 includes a lifting block 163 on which the probe card 161 is seated. In addition, the lifting block 163 is fixed to the cylinder 164 moving in the Y direction. Accordingly, the lifting block 163 and the probe card 161 move in the Y direction by the operation of the cylinder 164, so that the probe pin 162 of the probe card 161 is moved to the display panel 101. It is in electrical contact with the formed input / output pattern 104.

Meanwhile, another micrometer 165 is installed below the elevating block 163. The micrometer 165 accurately limits the falling distance of the lifting block 163, and thus prevents the input / output pattern 104 of the display panel 101 from being damaged by the probe pin 162 or the damage of the glass substrate. It becomes possible.

6 is a plan sectional view showing only the camera 140 in the gross test jig device for inspecting the display panel according to the present invention.

7 is a front view of FIG. 6.

As shown, the camera 140 is adjacent to each other so that the reference pattern 105 of the display panel 101 can be photographed through the opening 112 formed in the jig 110 and the opening 131e of the top plate 131a. Two lens parts 141 are included. In addition, an optical transmission unit 142 is connected to each lens unit 141 in a substantially perpendicular direction, and a CCD camera 143 is mounted to each optical transmission unit 142.

In addition, the camera 140 is provided with a camera stage 150 for moving the camera 140 a predetermined distance in the X and Y directions. The camera stage 150 includes an upper transfer block 151 and a lower transfer block 153 extending outwardly to the optical transmitter 142 by a predetermined length. In addition, the lower transfer block 153 is coupled to the guide rail 154 extending a predetermined distance in the X direction. In addition, the lower transfer block 153 is coupled to the X-direction handle 155. Therefore, when adjusting the X-direction handle 155, the lower transfer block 153 is moved a predetermined distance in the X direction along the guide rail 154. That is, as the X-direction knob 155 is adjusted, the lens unit 141, the light transmitting unit 142, and the CCD camera 143 move a predetermined distance in the X direction to form the reference pattern 105 formed on the display panel 101. Will be photographed.

On the other hand, the upper transfer block 151 is coupled to the guide rail 152 formed in the Y direction on the lower transfer block 153. In addition, a bracket 157 is fixed to one side of the lower transfer block 153, and a Y-direction handle 156 is coupled to the bracket 157. Furthermore, a spring 158 is coupled between the bracket 157 and the upper transfer block 151. Therefore, when the Y-direction handle 156 is adjusted, the upper transfer block 151 moves a certain distance in the Y direction while overcoming the tension of the spring 158. That is, as the Y-direction knob 156 is adjusted, the lens unit 141, the light transmitting unit 142, and the CCD camera 143 move a predetermined distance in the Y direction to form the reference pattern 105 formed on the display panel 101. Will be photographed.

With the above configuration, the gross test jig device for inspecting the display panel according to the present invention operates as follows.

As shown in FIG. 8, a basic object of the present invention is to match the cross-reference pattern 105 of the display panel 101 captured by the camera 140 with the cross-reference position 167 displayed on the monitor 166. will be. To this end, the present invention uses the jig stage 130 to adjust the X, Y, θ position of the display panel 101.

First, the inspector mounts the display panel 101 on which the plurality of input / output patterns 104 and the reference patterns 105 are formed in the mounting recess 111 of the jig 110. In this state, the suction unit 120 is operated so that the display panel 101 is not separated to a predetermined position.

Subsequently, the camera 140 checks whether the reference pattern 105 of the display panel 101 mounted on the jig 110 is displayed at a predetermined position of the monitor 166. That is, the reference pattern 105 of the display panel 101 exposed downward through the jig 110 and the opening 112 of the X stage 131 is incident by the lens unit 141 of the camera 140. The incident light is incident on the CCD camera 143 through the light transmission unit 142. Then, the CCD camera 143 converts it into an electrical signal and displays the reference pattern 105 at a predetermined position of the monitor 166. For example, as shown in FIG. 8, the reference pattern 105 of the display panel 101 may be displayed on the monitor 166 without coinciding with the reference position 167.

On the other hand, since the size of the display panel 101 is very diverse, the position of the reference pattern 105 may also be formed in different positions. In this case, the camera stage 150 installed in the camera 140 is adjusted to adjust the position of the camera 140 in the X and Y directions.

First, in order to adjust the camera 140 in the X direction, the X direction knob 155 is adjusted. Then, the lower transfer block 153 moves a predetermined distance along the guide rail 154 in the X direction. That is, as the X-direction knob 155 is adjusted, the lens unit 141, the light transmitting unit 142, and the CCD camera 143 move a predetermined distance in the X direction to form the reference pattern 105 formed on the display panel 101. Will be photographed.

Next, to adjust the camera 140 in the Y direction, the Y direction knob 156 is adjusted. Then, the upper transfer block 151 moves a predetermined distance along the guide rail 152 in the Y direction while overcoming the tension of the spring 158. That is, as the Y-direction knob 156 is adjusted, the lens unit 141, the light transmitting unit 142, and the CCD camera 143 move a predetermined distance in the Y direction to form the reference pattern 105 formed on the display panel 101. Will be photographed.

Subsequently, when the reference pattern 105 of the display panel 101 does not exactly match the reference position 167 on the monitor 166 as described above, the jig stage 130 is adjusted to adjust the jig stage 130. To match the reference position 167.

For example, in order to move the jig 110 in the X direction, the X micrometer 131g coupled to the X stage 131 of the jig stage 130 is adjusted. That is, when the X micrometer 131g is adjusted, the rod 131h pushes the ball 131i coupled to the top plate 131a of the X stage 131 in one direction, and thus the top plate of the X stage 131. 131a moves in the X direction. Of course, at this time, the top plate 131a is smoothly moved in the X direction by the cross roller bearing 131c. Furthermore, the spring 131d is provided between the upper plate 131a and the lower plate 131b, thereby being strongly fixed by the restoring force of the spring 131d after the upper plate 131a is moved.

Subsequently, in order to move the jig 110 in the Y direction, the Y micrometer 132f coupled to the Y stage 132 of the jig stage 130 is adjusted. That is, when the Y micrometer 132f is adjusted, the rod 132g pushes the bolt 132i coupled to the top plate 132a of the Y stage 132 through the bracket 132h in one direction, and thus Y The upper plate 132a of the stage 132 moves in the Y direction. Of course, at this time, the top plate 132a is smoothly moved in the Y direction by the cross roller bearing 132c. In addition, the spring 132d is provided between the upper plate 132a and the lower plate 132b, thereby being strongly fixed by the restoring force of the spring 132d after the upper plate 132a is moved.

Subsequently, in order to rotate the jig 110 by a predetermined angle in the θ direction, the θ micrometer 133d coupled to the θ stage 133 of the jig stage 130 is adjusted. That is, when the θ micrometer 133d is adjusted, the rod 133e pushes the protruding bar 133i coupled to the lower plate 132b of the Y stage 132 in a predetermined direction, and thus the Y stage 132 The lower plate 132b is rotated at an angle through the rotation center axis 133b. Of course, this rotation is transmitted to the X stage 131 as it is. Further, the bolt 133g coupled to the bracket 133f by the adjustment of the θ micrometer 133d moves the protruding bar 133i by the elastic force of the spring 133h to the rod 133e of the θ micrometer 133d. Because it is in a state of pushing toward), the rotation state is kept strong.

As such, the cross reference pattern 105 formed on the display panel 101 is moved by moving the jig 110 in a predetermined direction by using the X micrometer 131g, the Y micrometer 132f, and the θ micrometer 133d. It exactly matches the cross reference position 167 displayed on the monitor 166.

After that, the inspection unit 160 is operated. That is, when the cylinder 164 is operated, the probe card 161 mounted on the lifting block 161 of the cylinder 164 descends by a predetermined distance. Therefore, the plurality of probe pins 162 formed on the bottom surface of the probe card 161 are electrically connected to the plurality of input / output patterns 104 formed on the display panel 101. In this case, since another micrometer 165 is installed below the elevating block 161, the lowering distance of the elevating block 161 is precisely limited, and therefore, the display panel by the probe pin 162 ( Breakage of the input / output pattern 104 and breakage of the glass substrate of 101 are prevented.

Of course, by the operation of the inspection unit 160, the inspector visually inspects various images displayed through the display panel 101 to confirm whether the display panel 101 is abnormal.

As described above, the gross test jig device for inspecting the display panel according to the present invention can adjust the X, Y, and θ positions of the display panel seated on the jig for inspection to an accurate reference position.

Therefore, the probe pin of the inspection unit can be accurately brought into contact with the input / output pattern of the display panel, and thus the operation inspection of the display panel can be accurately and quickly performed.

In addition, the gross test jig device for inspecting the display panel according to the present invention allows the probe pins of the inspector to always contact the input / output pattern of the display panel with the same force, thereby preventing damage to the input / output pattern or the glass substrate during the inspection as well as accurate electrical contact. You can do it.

What has been described above is only one embodiment for implementing the gross test jig device for inspecting the display panel according to the present invention, the present invention is not limited to the above embodiment, as claimed in the following claims Without departing from the gist of the present invention, anyone of ordinary skill in the art will have the technical spirit of the present invention to the extent that various modifications can be made.

Claims (16)

A jig in which a display panel having at least one reference pattern and a plurality of input / output patterns formed thereon is mounted on an upper side, an inside of the jig, an adsorption unit which vacuum-adsorbs the display panel, and a lower side of the jig. And a jig stage for moving the position of the jig in X, Y, and θ directions, a camera installed under one side of the jig stage, and photographing a reference pattern of the display panel through the jig, and on one side of the camera. It is installed, the camera stage for moving the position of the camera in the X, Y direction, and installed on one side of the jig, the inspection unit is electrically connected to the input and output pattern of the display panel seated on the jig, The inspection unit includes a probe card having a plurality of probe pins so as to be electrically connected to an input / output pattern of a display panel seated on the jig, a lift block on which the probe card is seated, and a cylinder for moving the lift block in an up and down direction. Made up of The lower end of the elevating block is equipped with a micrometer for the lowering limit to limit the falling distance of the elevating block, The jig has a plate shape and a seating groove is formed in the upper portion so that the display panel is seated, and an opening is formed in the lower portion corresponding to the reference pattern of the display panel. The adsorption unit has a plurality of adsorption hoses are arranged in the seating groove of the jig, so as to vacuum suck the display panel seated in the seating groove, The jig stage is coupled to the lower portion of the jig, the upper plate and the lower plate is mutually coupled to the cross roller bearing so as to be relatively movable, the lower plate X stage is fixed to the X micrometer for moving the position of the upper plate, Y stage is coupled to the lower part of the X stage, the upper plate and the lower plate is mutually coupled to the cross roller bearing so as to be relatively movable, the lower stage of the Y stage is fixed to the Y micrometer for moving the position of the upper plate, The support plate having a central axis of rotation is coupled to the roller bearings, and the support plate includes a θ stage having a fixed θ micrometer that can rotate the lower plate of the Y stage by θ angle. Test jig device. delete delete delete The gross for display panel inspection of claim 1, wherein the X micrometer is fixed to the bottom plate of the X stage by a bracket, and the rod of the X micrometer is in contact with a ball coupled to the top plate of the X stage. Test jig device. According to claim 1, wherein the Y micrometer is fixed to the lower plate of the Y stage through the bracket, the upper plate of the Y stage is coupled to the bracket extending a certain length to the bottom, the bracket is coupled to the Y micro, The gross test jig device for inspecting the display panel, characterized in that the meter is in contact with the bolt. According to claim 1, wherein the θ micrometer is fixed to the support plate through the bracket, the support plate spaced apart from the θ micrometer a certain distance is coupled to the bolt through the bracket through the bracket, the rod and bolt of the θ micrometer A gross test jig device for inspecting a display panel, wherein a protrusion bar protruding a predetermined length from a lower plate of the Y stage is interposed therebetween. The gross test jig device of claim 1, wherein the X stage further includes a spring coupled between an upper plate and a lower plate. The gross test jig device of claim 1, wherein the Y stage further includes a spring coupled between an upper plate and a lower plate. The gross test jig device for inspecting a display panel of claim 1, wherein an opening communicating with the opening of the jig is further formed on the upper plate of the X stage. The method of claim 1, wherein the camera Two lens units adjacent to each other so that the reference pattern of the display panel can be photographed through the opening formed in the jig; An optical transmission unit formed at right angles to each of the lens units; And, And a gross test jig device for inspecting a display panel comprising a CCD camera coupled to each of the optical transmission units. The method of claim 11, wherein the camera stage A transfer block formed by extending a predetermined length to the outside of the optical transmission unit; An X-direction handle coupled to the transfer block in an X direction to move the transfer block in an X direction; And, The gross test jig device for inspecting the display panel is coupled to the transfer block in the Y direction, and made of a Y-direction handle for moving the transfer block in the Y direction. delete delete The gross test jig device for inspecting a display panel of claim 1, wherein a monitor is further connected to the camera such that a reference pattern of the display panel photographed by the camera is enlarged and displayed. The gross test jig device for inspecting a display panel according to claim 1, wherein the jig further includes a backlight installed under the jig to provide illumination to the display panel.

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