KR100697376B1 - Liquid crystal panel testing apparatus - Google Patents

Liquid crystal panel testing apparatus Download PDF

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KR100697376B1
KR100697376B1 KR1020000087249A KR20000087249A KR100697376B1 KR 100697376 B1 KR100697376 B1 KR 100697376B1 KR 1020000087249 A KR1020000087249 A KR 1020000087249A KR 20000087249 A KR20000087249 A KR 20000087249A KR 100697376 B1 KR100697376 B1 KR 100697376B1
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tcp
test
substrate
liquid crystal
tft
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KR20020057017A (en
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김종국
손정석
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비오이 하이디스 테크놀로지 주식회사
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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G02F1/133509—Filters, e.g. light shielding masks
    • G02F1/133514—Colour filters
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10—Measuring as part of the manufacturing process
    • H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/50—Tape automated bonding [TAB] connectors, i.e. film carriers; Manufacturing methods related thereto

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Nonlinear Science (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)

Abstract

본 발명은 게이트 TCP(Tape Carrier Package)의 미세피치 출력측은 TFT(Thin Film Transistor)기판에 직접 부착하고 그 TCP의 입력단은 테스트PCB에 FPC(Flexible Printed Circuit)를 이용하여 압착연결(고정/분리)하도록 된 액정표시패널의 테스트장치에 관한 것이다.According to the present invention, the fine pitch output side of the gate TCP (Tape Carrier Package) is directly attached to a TFT (Thin Film Transistor) substrate, and the input terminal of the TCP is crimped (fixed / disconnected) by using a flexible printed circuit (FPC) to a test PCB. The present invention relates to a test apparatus for a liquid crystal display panel.

본 발명에 따르면, 컬러필터가 결합된 TFT기판의 게이트패드에는 미세피치를 갖는 TCP의 출력측이 OLB(Outer Lead Board)방식으로 고정결합되고, 상기 TCP의 입력측은 FPC를 매개하여 테스트기판에 접속되어, 상기 TFT 기판에 대한 테스트가 실행되도록 구성된다.According to the present invention, the output side of the TCP having a fine pitch is fixedly coupled to the gate pad of the TFT substrate to which the color filter is coupled by an outer lead board (OLB) method, and the input side of the TCP is connected to the test substrate through an FPC. And a test on the TFT substrate is executed.

Description

액정표시패널의 테스트장치{Liquid crystal panel testing apparatus}Liquid crystal panel testing apparatus

도 1은 종래의 일예에 따른 액정표시패널의 테스트장치를 설명하는 도면,1 is a view for explaining a test apparatus for a liquid crystal display panel according to a conventional example;

도 2는 본 발명에 따른 액정표시패널의 테스트장치를 설명하는 도면이다.2 is a view for explaining a test apparatus of a liquid crystal display panel according to the present invention.

*도면의 주요부분에 대한 부호의 설명** Explanation of symbols for main parts of drawings *

12,22: TFT기판, 14: 테스트기판,12,22: TFT substrate, 14: test substrate,

16,24: TCP, 26: 테스트기판,16, 24: TCP, 26: test board,

28: FPC(Flexible Printed Circuit).28: Flexible Printed Circuit (FPC).

본 발명은 액정표시패널의 테스트장치에 관한 것으로, 보다 상세하게는 박막트랜지스터-액정표시패널(TFT-LCD Panel)의 테스트를 위한 엔지니어 셀 PCB(Printed circuit board)의 TCP(Tape carrier package)결합구조를 포함하는 액정표시패널의 테스트장치에 관한 것이다.The present invention relates to a test apparatus for a liquid crystal display panel, and more particularly, to a tape carrier package (TCP) coupling structure of an engineer cell printed circuit board (PCB) for testing a thin film transistor (TFT-LCD) panel. It relates to a test apparatus for a liquid crystal display panel comprising a.

최근에, 저소비전력 및 경박소형의 평판디스플레이로서 주목되는 액정표시패널은 TFT(Thin Film Transistor)기판과 그 TFT기판에 대향되도록 부착되는 컬러필터기판 및 그 TFT기판과 컬러필터기판의 사이에 주입되는 액정셀을 포함하여 구성 된다.Recently, a liquid crystal display panel, which is noted as a low power consumption and light and thin flat panel display, is injected between a TFT (Thin Film Transistor) substrate and a color filter substrate attached to face the TFT substrate, and the TFT substrate and the color filter substrate. It consists of a liquid crystal cell.

그 TFT-LCD패널은 TFT기판에 형성되는 스위칭소자에 가해지는 그래픽신호에 반응하는 액정의 전기광학적 성질을 이용하여 정보를 표시하게 된다.The TFT-LCD panel displays information by using the electro-optical properties of the liquid crystal in response to the graphic signal applied to the switching element formed on the TFT substrate.

따라서, 통상적으로 TFT기판상에는 다수의 게이트라인과 데이터라인이 상호 교차되도록 매트릭스형태로 배치되고, 각 게이트라인과 데이터라인에 대해서는 전기적인 신호가 인가되는 입력패드가 대응적으로 형성됨과 더불어 게이트라인과 데이터라인의 교차점에는 스위칭소자(즉, 박막트랜지스터 소자)가 형성된다.Therefore, on the TFT substrate, a plurality of gate lines and data lines are arranged in a matrix so as to cross each other, and an input pad to which an electrical signal is applied to each gate line and data line is correspondingly formed, and the gate line and A switching element (that is, a thin film transistor element) is formed at the intersection of the data lines.

그러한 TFT-LCD패널의 제조공정에 따르면, TFT기판 또는 컬러필터기판의 주변부에 실런트를 프린팅하고나서 2매의 글래스기판을 정합시킨 상태에서 상호 부착하게 되고, 그 부착된 2매의 글래스기판에 정의되는 절단예정선을 따라 그 2매의 글래스기판을 절단하여 TFT기판과 컬러필터기판을 분리시키게 된다.According to the manufacturing process of such a TFT-LCD panel, after the sealant is printed on the periphery of the TFT substrate or the color filter substrate, the two glass substrates are bonded to each other and are attached to each other, and the two glass substrates are defined on the attached glass substrate. The two glass substrates are cut along the cutting line to separate the TFT substrate and the color filter substrate.

그리고나서, 실런트에 의해 TFT기판과 컬러필터기판의 사이에 형성된 공간에 액정을 주입하게 되고, 그 액정이 완전히 주입되면 그 액정주입구를 밀봉하여 액정의 외부적인 누출을 방지하게 된다.Then, the liquid crystal is injected into the space formed between the TFT substrate and the color filter substrate by the sealant, and when the liquid crystal is completely injected, the liquid crystal inlet is sealed to prevent external leakage of the liquid crystal.

상기한 공정에 의해 LCD패널이 제조되면 그 LCD패널과 백라이트어셈블리 및 그 LCD패널을 구동하기 위한 드라이브IC들이 조립된 완제품의 LCD모듈과 동일한 환경으로 형성된 테스트조건하에서 그 LCD패널의 디스플레이상태를 검사하게 된다.When the LCD panel is manufactured by the above process, the LCD panel and the backlight assembly and the drive ICs for driving the LCD panel are inspected under the test conditions formed under the same conditions as the assembled LCD module. do.

즉, LCD패널의 테스트를 위해서는 LCD패널의 구동시와 동일한 구동신호가 인가되어 화상이 디스플레이되기 때문에, 예컨대 LCD패널에 개방(Open)된 데이터라인 또는 게이트라인이 존재하는 경우에는 그 위치에서는 화소전극이 구동되지 않게 되 어 정상적인 화소의 표시가 불가능하게 되어 LCD패널의 불량상태에 대한 확인이 가능하게 된다.That is, for the test of the LCD panel, an image is displayed by applying the same driving signal as the driving of the LCD panel. For example, when there is an open data line or gate line on the LCD panel, the pixel electrode is located at that position. Since the display is not driven, normal pixels cannot be displayed, thereby making it possible to check a defective state of the LCD panel.

도 1은 종래의 일예에 따른 액정표시패널의 테스트장치를 설명하는 도면으로, 도면에 도시된 액정표시패널의 테스트장치는 TFT-LCD패널의 미세피치(Fine pitch) 게이트패드부에 대한 TCP를 예컨대 '엔지니어 셀 테스트 PCB'로 참조되는 PCB상에 부착하기 위해 적용되는 구조를 나타낸다.1 is a view illustrating a test apparatus for a liquid crystal display panel according to a conventional example. The test apparatus for a liquid crystal display panel illustrated in the drawing may include a TCP for a fine pitch gate pad portion of a TFT-LCD panel. Refers to the structure applied to attach on the PCB referred to as the 'engineer cell test PCB'.

도 1에서 상측에 컬러필터기판(10)이 부착된 TFT기판(12)의 일측면에는 이방성 도전막(Anisotropic conductive film; ACF)(12a)이 제공되고, 테스트PCB(14)의 저면 일측에도 상기 TFT기판(12)의 이방성 도전막(12a)과의 결합을 위한 이방성 도전막(14a)이 대응적으로 제공된다.In FIG. 1, an anisotropic conductive film (ACF) 12a is provided on one side of the TFT substrate 12 having the color filter substrate 10 attached thereon, and on the one side of the bottom surface of the test PCB 14. An anisotropic conductive film 14a for bonding with the anisotropic conductive film 12a of the TFT substrate 12 is correspondingly provided.

또, 상기 테스트PCB(14)에는 상기 TFT기판(12)의 미세피치 게이트패드에 연계되는 TCP(16)가 결합되는 바, 그 TCP(16)는 일측(즉, 입력측)(16a)이 상기 PCB(14)의 일측면에 예컨대 납땜에 의해 고정되고 그 타측(즉, 출력측)(18b)은 이방성 도전막(18b)을 매개하여 상기 PCB(14)에 접착된다.In addition, the test PCB 14 is coupled to the TCP (16) connected to the fine pitch gate pad of the TFT substrate 12, the TCP 16 is one side (that is, the input side) 16a is the PCB One side of 14 is fixed by soldering, for example, and the other side (ie, output side) 18b is bonded to the PCB 14 via an anisotropic conductive film 18b.

따라서, 도 1에서는 테스트PCB(14)로부터의 테스트신호가 상기 이방성 도전막(18b)에 의해 결합된 상기 TCP(16)의 입력측(16a)을 통해 전달되어 그 출력측(18b)을 경유하여 상기 TFT기판(12)에 전달되어 테스트가 실행된다. Thus, in Fig. 1, the test signal from the test PCB 14 is transmitted through the input side 16a of the TCP 16 coupled by the anisotropic conductive film 18b and the TFT via its output side 18b. The test is executed by transferring to the substrate 12.

그런데, 도 1에 도시된 종래의 액정표시패널의 테스트장치에서는 상기 테스트PCB(14)의 제작시 미세피치(fine pitch)PCB패턴 마스킹기술력이 부족하여 라인간 단락(short)의 발생가능성이 높고, 그 미세피치 TCP(16)를 TFT기판(12)의 게이트패드에 수조작에 의해 정합시켜야만 된다는 어려움이 발생되며, 그 정합시 오접촉이 이루어지는 라인이 다량을 발생되는 일이 빈번하게 발생되어 액정표시패널에 대한 정확한 측정이 지장을 받게 된다. However, in the test apparatus of the conventional liquid crystal display panel illustrated in FIG. 1, the short pitch between lines is high due to the lack of fine pitch PCB pattern masking technology when the test PCB 14 is manufactured. The difficulty of matching the fine pitch TCP 16 to the gate pad of the TFT substrate 12 by hand operation occurs, and a large amount of miscontacted lines are frequently generated during the matching. Accurate measurements on the panel will be hampered.

따라서, 본 발명은 상기한 종래 기술을 감안하여 이루어진 것으로, 게이트 TCP의 미세피치 출력측은 OLB(Outer Lead Board)로 구성해서 직접 패널에 부착하고 그 TCP의 입력단만 테스트PCB와의 FPC(Flexible Printed Circuit)를 이용하여 압착연결(고정/분리)하도록 구성한 액정표시패널의 테스트장치를 제공함에 그 목적이 있다.Accordingly, the present invention has been made in view of the above-described prior art, and the fine pitch output side of the gate TCP is configured as an outer lead board (OLB) and directly attached to a panel, and only the input terminal of the TCP is a flexible printed circuit (FPC) with the test PCB. The purpose of the present invention is to provide a test apparatus for a liquid crystal display panel configured to be crimped (fixed / separated) by using a.

상기한 목적을 달성하기 위해, 본 발명의 바람직한 실시예에 따르면 컬러필터가 결합된 TFT기판의 게이트패드에는 미세피치를 갖는 TCP의 출력측이 고정결합되고, 상기 TCP의 입력측은 테스트기판에 접속되어, 상기 TFT 기판에 대한 테스트가 실행되도록 구성된 액정표시패널의 테스트장치가 제공된다.In order to achieve the above object, according to a preferred embodiment of the present invention, the output side of the TCP having a fine pitch is fixedly coupled to the gate pad of the TFT substrate to which the color filter is coupled, and the input side of the TCP is connected to the test substrate, A test apparatus for a liquid crystal display panel configured to perform a test on the TFT substrate is provided.

상기 TFT기판과 상기 TCP의 출력측의 고정결합은 OLB를 매개하여 이루어진다.The fixed coupling between the TFT substrate and the output side of the TCP is performed through OLB.

또, 상기 TCP의 입력측과 상기 테스트기판의 사이에는 FPC가 개재되어 접속이 이루어지게 된다.In addition, an FPC is interposed between the input side of the TCP and the test substrate to establish a connection.

상기한 본 발명에 따른 액정표시패널의 테스트장치에 의하면, 미세피치로 형성된 TCP의 출력부는 OLB방식을 매개하여 TFT기판에 부착되고, 상기 TFT기판과 상 기 TCP의 출력측의 고정결합은 OLB를 매개하여 이루어지며, 그에 따라 TCP의 출력부에 대한 수조작의 정합공정이 배제된다. According to the test apparatus of the liquid crystal display panel according to the present invention, the output portion of the TCP formed with a fine pitch is attached to the TFT substrate by the OLB method, and the fixed coupling of the TFT substrate and the output side of the TCP is mediated by the OLB. This eliminates the manual matching process for the TCP output.

이하, 본 발명에 대해 첨부도면을 참조하여 상세하게 설명한다.Hereinafter, with reference to the accompanying drawings, the present invention will be described in detail.

도 2는 본 발명의 바람직한 실시예에 따른 액정표시패널의 테스트장치를 설명하는 도면이다.2 is a view illustrating a test apparatus for a liquid crystal display panel according to an exemplary embodiment of the present invention.

도면에서, 상측에 컬러필터기판(20)이 부착된 TFT기판(22)의 일측면에 형성된 게이트 패드(22a)에는 OLB구조로 TCP(24)의 출력부(24a)가 고정된다.In the drawing, the output part 24a of the TCP 24 is fixed to the gate pad 22a formed on one side of the TFT substrate 22 having the color filter substrate 20 attached thereto.

또, 상기 TCP(24)의 입력부(24b)에는 테스트기판(26)과의 접속을 위해 FPC(Flexible Printed Circuit)(28)가 개재되고, 그 FPC(28)는 수동조작방식의 압력지그프레임(30)에 의해 상기 TCP(24)의 입력부(24b)와 상기 테스트기판(26)의 접속부(26a)를 신호적으로 연결시키게 된다.In addition, a flexible printed circuit (FPC) 28 is interposed in the input portion 24b of the TCP 24 for connection with the test substrate 26, and the FPC 28 has a pressure jig frame of a manual operation method. 30, the input portion 24b of the TCP 24 and the connection portion 26a of the test substrate 26 are signaledly connected.

따라서, 도 2에 도시된 구성에서는 미세피치(대략 85㎛)로 형성된 상기 TCP(24)의 출력부(24a)는 OLB방식을 매개하여 상기 TFT기판(22)의 게이트 패드(22a)에 부착되고, 그 때문에 미세피치 TCP(24)의 출력부(24a)를 TFT기판(22)의 게이트 패드(22a)에 수조작에 의한 정합이 배제되며, 그에 따라 오접촉의 발생가능성이 배제되어 액정표시패널에 대한 정확한 측정이 가능하게 된다.Therefore, in the configuration shown in Fig. 2, the output portion 24a of the TCP 24 formed with fine pitch (approximately 85 mu m) is attached to the gate pad 22a of the TFT substrate 22 via the OLB method. Therefore, matching of the output portion 24a of the fine pitch TCP 24 to the gate pad 22a of the TFT substrate 22 by manual operation is eliminated, thereby eliminating the possibility of false contact, thereby eliminating the possibility of liquid crystal display panel. This enables accurate measurement of.

상기한 바와 같이, 본 발명에 따른 액정표시패널의 테스트장치에 의하면 미세피치로 형성된 TCP의 출력부는 OLB방식을 매개하여 TFT기판에 부착되기 때문에 미세피치 TCP의 출력부를 TFT기판의 게이트패드에 수조작에 의한 정합공정이 불필 요하게 되고, 그에 따라 미세피치라인간의 오접촉의 발생가능성이 배제되어 액정표시패널에 대한 정확한 측정이 가능하게 된다.As described above, according to the test apparatus of the liquid crystal display panel according to the present invention, since the output portion of the TCP formed with the fine pitch is attached to the TFT substrate through the OLB method, the output portion of the fine pitch TCP is manually operated on the gate pad of the TFT substrate. This eliminates the need for a matching process, thereby eliminating the possibility of erroneous contact between the fine pitch lines, thereby enabling accurate measurement of the liquid crystal display panel.

Claims (3)

컬러필터가 결합된 TFT(Thin Film Transistor)기판의 게이트패드에는 미세피치를 갖는 TCP(Tape Carrier Package)의 출력측이 고정결합되고, 상기 TCP의 입력측은 테스트기판에 접속되어, 상기 TFT 기판에 대한 테스트가 실행되도록 구성된 것을 특징으로 하는 액정표시패널의 테스트장치.The output side of the Tape Carrier Package (TCP) having a fine pitch is fixedly coupled to the gate pad of the TFT (Thin Film Transistor) substrate in which the color filter is coupled, and the input side of the TCP is connected to a test substrate to test the TFT substrate. Test apparatus for a liquid crystal display panel, characterized in that configured to be executed. 제 1항에 있어서, 상기 TFT기판과 상기 TCP의 출력측의 고정결합은 OLB(Outer Lead Board)를 매개하여 이루어진 것을 특징으로 하는 액정표시패널의 테스트장치.The test apparatus of claim 1, wherein the fixed coupling between the TFT substrate and the output side of the TCP is performed through an outer lead board (OLB). 제 1항에 있어서, 상기 TCP의 입력측과 상기 테스트기판의 사이에는 FPC(Flexible Printed Circuit)가 개재되는 것을 특징으로 하는 액정표시패널의 테스트장치.The test apparatus according to claim 1, wherein an FPC (Flexible Printed Circuit) is interposed between the TCP input side and the test substrate.
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Publication number Priority date Publication date Assignee Title
JPH07270817A (en) * 1994-04-01 1995-10-20 Enplas Corp Contact device for liquid crystal panel inspection
JPH09211483A (en) * 1996-02-01 1997-08-15 Sharp Corp Tape carrier package for liquid crystal driver ic and liquid crystal cell inspecting device
KR20000031295A (en) * 1998-11-05 2000-06-05 구본준 Testing apparatus for liquid crystal displaying device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07270817A (en) * 1994-04-01 1995-10-20 Enplas Corp Contact device for liquid crystal panel inspection
JPH09211483A (en) * 1996-02-01 1997-08-15 Sharp Corp Tape carrier package for liquid crystal driver ic and liquid crystal cell inspecting device
KR20000031295A (en) * 1998-11-05 2000-06-05 구본준 Testing apparatus for liquid crystal displaying device

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