KR100689972B1 - Apparatus for testing flat type electric device - Google Patents

Abstract

A module IC(Integrated Circuit) test handler is provided to minimize the waste of time due to the change of a module IC to be tested only by adjusting a gap of each conveyor unit according to the change of the kind or size of a module IC. A module IC test handler is composed of a loading unit loaded with plural trays containing plural module ICs(M) to be tested; an unloading unit loaded with plural empty trays receiving the tested module ICs; a test unit electrically testing the module IC transferred from the loading unit; and at least one picker installed at the upper side of the handler to move in X, Y, and Z axis directions and transfer the module ICs among the loading unit, the test unit, and the unloading unit. The test unit comprises bases(11,12); a first conveyor unit(21) installed at the base to be circulated; a second conveyor unit(22) spaced from the first conveyor unit by a predetermined gap and aligned in parallel to the first conveyor unit; plural holding members(30) movably mounted at the first and second conveyor units to releasably fix both sides of the module IC between the first and second conveyor units; a test head(50) disposed between the first and second conveyor units and provided with a test socket electrically connected with the module ICs to test electrical performance of the module ICs; a contact unit(55) connecting and separating the module ICs fixed by the holding members of the first and second conveyor units, to/from the test head; and a driving unit moving the holding members by a predetermined pitch by moving the first and second conveyor units by a predetermined distance.

Description

Module IC test handler {Apparatus for testing flat type electric device}

1 is a plan view schematically showing the configuration of one embodiment of a module IC test handler according to the present invention

2 is a plan view schematically showing the structure of a test site of the handler of FIG.

3 is a schematic front view of the test site of FIG.

4 is a cross-sectional view taken along line II of FIG. 2.

5 is a cross-sectional view taken along the line II-II of FIG.

Explanation of symbols on the main parts of the drawings

1: Loading unit 2: Unloading unit

3: test unit 4: loading picker

5: unloading picker 6: ball tray

11: first base 12: second base

13: Loading Position 14: Unloading Position

15: LM Guide 16: Servo Motor

17: ball screw 18: ball housing

21: first conveyor unit 22: second conveyor unit

211, 221: 1st and 2nd driven pulley 212, 222: 1st and 1st driven pulley

213, 223: First and second power transmission belts 215, 225: Servo motor

30: holding member 31: holder block

32: holder 33: compression spring

34: fixed part 41: loading side guide plate

42: unloading side guide plate 50: test head

51 socket 55 contact unit

60: holder operating unit 61: pneumatic cylinder

62: piston rod 63: operating part

M: Module IC T: Tray

The present invention relates to an apparatus for testing a module IC, and more particularly, to perform a test by electrically connecting the module IC to the socket of the test head, and to classify and load the module IC in a tray according to the test result. The module IC test handler performs this automatically.

In general, a module IC is composed of independent circuits by soldering and fixing a plurality of memory ICs and other devices on a single board, and these module ICs are tested after electrical performance after production. Shipped.

Such module ICs are automatically tested by a test rig called a 'test handler'.

In a conventional handler, a test is performed by transferring and connecting module ICs to a test head using a loading picker that can fix a plurality of module ICs at a time, and when the test is finished, an unloading picker is attached. The test was carried out by separating the tested module ICs from the test heads and classifying them in the trays according to the test results.

However, when the size of the module IC to be tested is changed in the conventional handlers, various components for handling the module IC should be replaced with ones corresponding thereto. This replaced component is called a change kit.

When the change kit is replaced whenever the type or size of the module IC to be tested is changed as described above, the test cannot be performed during the change kit replacement time, thereby causing a problem in that test efficiency and test productivity are deteriorated.

Accordingly, the present invention is to solve the above problems, the object of the present invention is to reduce the test time by allowing the test to continue without almost replacing the component when the type or size of the module IC to be tested changes In addition, to provide a module IC test handler that can prevent the degradation of work efficiency due to replacement work.

The present invention for achieving the above object, the loading unit is loaded with a plurality of trays containing a plurality of module ICs to be tested, the unloading unit is loaded with a plurality of empty trays are accommodated, the module modules tested; A test unit configured to perform an electrical test of the module IC returned from the loading unit, and at least one picker installed on the upper side of the handler so as to be movable in the XYZ direction and transferring the module IC between the loading unit, the test unit, and the unloading unit; In the included module IC test handler,

The test unit, the base; A first conveyor unit installed to rotate in the base; A second conveyor unit disposed at one side of the one conveyor unit to be spaced apart from each other by a predetermined distance; A plurality of holding members movably installed on the first conveyor portion and the second conveyor portion to releasably fix both sides of the electrical component between the first conveyor portion and the second conveyor portion; A test head disposed between the first conveyor part and the second conveyor part, the test head including a test socket configured to electrically connect electrical parts to perform an electrical performance test; A contact unit for connecting and releasing the electrical components fixed by the holding members of the first and second conveyor parts to the test head; It provides a module IC test handler, characterized in that it comprises a drive unit for moving the holding member by a predetermined pitch by moving the first conveyor portion and the second conveyor portion by a predetermined distance.

Hereinafter, with reference to the accompanying drawings will be described in detail a preferred embodiment of the module IC test handler according to the present invention.

First, referring to FIG. 1, the module IC test handler of the present invention includes a loading unit 1 in which a plurality of trays T in which a plurality of module ICs M to be tested are stored are loaded, and a tested module IC ( An unloading unit 2 on which a plurality of empty trays T in which Ms are stored are loaded, a test unit 3 in which an electrical test of the module IC M conveyed from the loading unit 1 is performed, and a handler A loading picker 4 and an unloading picker which are installed to be movable in the XYZ direction on the upper side of the loading unit 1 to pick up and transport the module IC M between the loading unit 1, the test unit 3, and the unloading unit 2. It consists of (5).

Between the loading section 1 and the unloading section 2, a blank tray section 6 for receiving the empty tray from the loading section 1 and temporarily loading it is provided. In addition, although not shown in the drawing, the empty tray portion 6 transfers the empty tray from the loading portion 1 to the empty tray portion 6 and the unloading portion 2 from the empty tray portion 6. It is preferable that a tray transfer for supplying the empty tray is installed.

If the empty tray 6 is disposed between the loading unit 1 and the unloading unit 2 as described above, and a tray transfer (not shown) is formed on the empty tray unit 6, the loading unit in the test process is performed. Since the empty tray of (1) can be temporarily loaded into the empty tray part 6 and then delivered to the unloading part 2, the loading part 1 does not need to load many empty trays in the unloading part 2. There is an advantage that you can utilize the trays that are empty.

The unloading unit 2 classifies and stores the module ICs M, which are determined to be good, and the module ICs, which are classified as non-goods. It may be composed of a projecting portion (2b).

The test unit 3 is provided with a test head 50 in which the module ICs M are electrically connected and tested.

In addition, the test unit 3 may be configured to be sealed inside by a chamber so that the test can be performed at a predetermined temperature. When the test unit 3 is configured to be sealed by a chamber, a shutter that allows the loading picker 4 and the unloading picker 5 to enter and exit the test unit 3 is configured. Will be.

2 to 5B illustrate the internal configuration of the test unit 3 in more detail. The test unit 3 includes a first base 11 and a second base 12, and the first base 11. And a first conveyor portion 21 provided on the second conveyor portion 21 and a second conveyor portion 22 disposed parallel to the first conveyor portion 21 on the second base 12.

On one side between the first conveyor unit 21 and the second conveyor unit 22, a loading position 13 in which module ICs M to be tested are placed is disposed. The module IC M is electrically connected to an intermediate portion between the first conveyor portion 21 and the second conveyor portion 22 so as to perform a test on the test head 50 and the test head 50. The contact unit 55 which connects the IC M is provided. On the opposite side of the loading position 13 with respect to the test head 50, an unloading position 14 in which the tested module IC M is unloaded is disposed.

The first conveyor unit 21 includes a first driving pulley 211, a first driven pulley 212, and the first driving pulley 211 and the first base 11 which are installed to face each other on the first base 11. It is composed of a first power transfer belt 213 wound around the first driven pulley 212 and circulated.

The first conveyor unit 21 is a servo motor 215 installed on one side of the first base 11, the first power transmission pulley 216 is connected to the drive shaft of the servo motor 215 and rotated, A second power transmission pulley 217 is connected to the first drive pulley 211 coaxially and rotated, the first power transmission pulley 216 and the second power transmission pulley 217 is wound around the first power transmission It rotates by the drive unit which consists of the drive belt 218 which transmits the rotational force of the pulley 216 to the 2nd power transmission pulley 217.

The second conveyor unit 22 also has the same configuration as the first conveyor unit 21. That is, the second conveyor portion 22 is the second driving pulley 221, the second driven pulley 222 and the second power transmission belt 223 which are installed on the second base 12 to face each other. Is done. In addition, the second conveyor portion 22 is rotated by a driving unit configured in the same manner as the driving unit for driving the first conveyor portion 21. Reference numeral 225 denotes a servo motor for rotating the second driving pulley 221.

A plurality of holding members 30 are installed on outer surfaces of the first power transmission belt 213 of the first conveyor unit 21 and the second power transmission belt 223 of the second conveyor unit 22. The holding members 30 move along the first and second power transmission belts 213 and 223 so as to releasably fix both sides of the module IC M, and to carry the module IC M to a predetermined position. It works.

Detailed configuration of the holding member 30 will be described in more detail with reference to FIGS. 3A and 3B below.

Meanwhile, when the module IC M to be newly tested is fixed to the holding member 30 at the lower side of the loading position 13, the fixing position of the module IC is determined while preventing the module IC M from falling. The loading side guide plate 41 is installed. The loading side guide plate 41 preferably has a plurality of slots 411 into which the module IC M is inserted into the upper surface thereof at regular intervals.

In addition, the loading side guide plate 41 is preferably installed to be able to move up and down. This assists the holding members 30 of the first and second conveyor parts 21 and 22 to fix the module IC when the loading side guide plate 41 receives the module IC M and moves upward. After the ICs (M) are fixed by the holding member 30 to lower so as not to interfere with the movement of the module IC (M).

Similar to the loading position 13, the unloading position 14 may further include an unloading side guide plate 42 for preventing the module IC from falling.

The loading side guide plate 41 and the unloading side guide plate 42 are moved up and down by a predetermined distance by the pneumatic cylinder 415 operating up and down.

On the upper surface of the test head 50, a plurality of sockets 51 which are inserted and electrically connected to the lower terminal part of the module IC M are arranged. The test head 50 is electrically connected to a tester (TESTER) for transmitting and receiving an electrical signal for testing and analyzing the electrical performance from the outside.

In addition, the contact unit 55 is installed to be movable up and down between the first conveyor portion 21 and the second conveyor portion 22, so that the module IC (M) from the upper side of the test head 50 When aligned with the socket 51, the upper edge of the module IC (M) by pressing a predetermined force to connect to the socket 51, the function of separating the module IC (M) from the socket 51 after the test is completed Do this.

Of course, unlike this embodiment, the contact unit 55 does not press the upper end of the module IC M, but rather presses the concave groove portions of both sides, particularly both sides, to connect and disconnect the module ICs to the socket 51. Could be

Meanwhile, referring to FIGS. 4A and 4B, the holding member 30 includes a plurality of holder blocks 31 to which the first and second power transmission belts 213 and 223 are fixedly attached to the outer surface, and the holder block ( The holder 32 is installed to be movable horizontally in and outward from the 31 and presses both sides of the module IC M to fix the holder 32, and the holder 32 is elastically supported with respect to the holder block 31. Compression spring 33 is configured.

A middle portion of the holder 32 is formed with a fixing portion 34 extending radially outward. The holder 32 is a holder operating unit in which the fixing part 34 is disposed at one side of the loading position 13 (see FIG. 1), the unloading position 14 (see FIG. 1), and the test head 50. Selective contact with 60 causes horizontal movement.

According to this embodiment, the holder operating unit 60 has a plurality of pneumatic cylinders 61, which are installed on one side of the loading position 13 and the unloading position 14 and the test head 50, and the pneumatic cylinder ( The end of the piston rod 62 of the 61 is installed to extend toward the fixing portion 34 is composed of an operating portion 63 to selectively contact with the fixing portion 34 in accordance with the operation of the piston rod 62. .

Therefore, when the piston rod 62 of the pneumatic cylinder 61 is contracted, the operating portion 63 is in contact with the fixing portion 34, the holder 32 is moved to the outside to open and, on the contrary, the pneumatic cylinder ( When the piston rod 62 of the 61 is extended, the contact between the operating portion 63 and the fixing portion 34 is released, and is moved inward by the restoring force of the compression spring 33 of the holder 32, thereby increasing the module IC M. Press both sides of the side.

On the other hand, the first base 11 is configured to be movable by a predetermined distance with respect to the second base 12, the holder 32 of the first conveyor portion 21 in accordance with the movement of the first base (11). And the interval between the holder 32 of the second conveyor portion 22 can be adjusted.

That is, the first base 11 moves by an arbitrary distance in a direction approaching or away from the second base 12, and corresponding to the size of the module IC (M), the first and second conveyor parts (21, 22) The distance between the holder 32 of the will be adjusted.

The first base 11 is an L guide 15 by a linear motion device such as a ball screw 17, a servo motor 16 for rotating it, and a ball housing part 18 moving along the ball screw 17. ) Can be moved to any distance.

Of course, in addition to the linear motion device to which the above-described ball screw is applied as a means for linearly moving the first base 11, various well-known linear motion devices such as a linear motion device using a plurality of pulleys, belts and servomotors may be used. .

In addition, in the embodiment of the test unit 3, the second base 12 is fixed, and only the first base 11 is moved to adjust the distance between the holders 32. Alternatively, the first base 11 The distance may be adjusted by moving both and the second base 12.

The test handler of the present invention configured as described above operates as follows.

First, a plurality of trays T containing the module ICs M to be tested by the operator are loaded into the loading unit 1, empty trays T are loaded into the unloading unit 2, and then the handler is operated. In this case, the loading picker 4 moves to the loading unit 1.

The loading picker 4 picks up a plurality of module ICs M located in the loading unit 1 and moves them to the test unit 3.

When the loading picker 4 returns the module IC M to the test unit 3 and prepares to load the four module ICs M from the upper side of the loading position 13, as shown in FIG. 4A. The pneumatic cylinder 61 of the holder operation unit 60 is operated to open the holder 32 of the first and second conveyor parts 21 and 22 to both sides. Then, the loading side guide plate 41 is moved upward to prepare to receive the module IC (M).

Subsequently, as shown in FIG. 4B, when the loading picker 4 seats the module IC M in each slot 411 of the loading side guide plate 41, the first and second conveyor parts 21 and 22 are installed. The pneumatic cylinder 61 of the holder operating unit 60 of the holder operates in the opposite manner as described above so that each holder 32 is moved inward by the action of the compression spring 33, and each end of the holder 32 is a module. Both sides of the IC (M) is fixed by pressing.

Thereafter, the loading side guide plate 41 is lowered by the action of the pneumatic cylinder 61, and the module ICs M are supported only by the holders 32 of the first and second conveyor parts 21 and 22. . At this time, the loading picker 4 moves to the loading unit 1 again and picks up the new module ICs M. FIG.

Meanwhile, when the module ICs M are fixed by the holders 32 in the loading position 13 as described above, the servo motors 215 and 225 of the first and second conveyor parts 21 and 22 operate to operate. The first and second drive pulleys 211 and 222 rotate, and the first and second power transfer belts 213 and 223 rotate by a predetermined amount. Accordingly, the holder 32 installed in the first and second power transmission belts 213 and 223 and the module ICs M fixed by the holder 32 are moved by a predetermined distance.

As shown in FIG. 5A, the module ICs (M) are formed by the motion of the first and second power transmission belts 213 and 223 of the first and second conveyor parts 21 and 22. When moved upward and aligned with the socket 51, the holder 32 holding the module IC M is opened by the operation of the holder operating unit 60, and the module IC is free and at the same time, the contact unit ( 55) is lowered to press the upper end of the module IC (M).

Accordingly, as illustrated in FIG. 5B, the module IC M is connected to the lower socket 51, and the test is performed while an electrical signal is input from an external tester (not shown). At this time, while the test is performed in the test head 50 as described above, the loading picker 4 picks up the new module ICs M from the loading unit 1, and the new module ICs are loaded into the loading position 13. M) perform the work of mounting them.

When the test is finished, the contact unit 55 is raised, and thus the connection between the module IC M and the socket 51 is released.

Subsequently, the pneumatic cylinder 61 of the holder operating unit 60 is operated again so that the holder 32 of the first and second conveyor parts 21 and 22 presses and fixes both sides of the module ICs M tested. do.

Then, the servo motors 215 and 225 of the first and second conveyor parts 21 and 22 are operated again so that the first and second power transmission belts 213 and 223 move a predetermined distance, and the tested module IC Are moved to the unloading position 14. At the same time, the newly mounted module IC M in the loading position 13 moves to the upper side of the test head 50 to stand by.

When the module ICs M are positioned in the unloading position 14, the unloading side guide plate 42 is raised by the operation of a pneumatic cylinder (not shown) to support the lower end of the module IC M. . Then, the holder operation unit 60 is operated to open the holders 32 of the first and second conveyor parts 21 and 22 and free the module ICs.

At this time, the unloading picker 5 waits on the upper side of the unloading position 14, picks up the module ICs which have been tested and returns them to the unloading unit 2, classifies them according to the test results, and unloads the unloading unit. It is stored back in the empty tray T of (2). As a result of the test, the module ICs M determined as good quality are classified and stored in the good quality unloading part 2a, and the other module ICs determined as other grades are placed in the tray T of the reject part 2b.

The first and second conveyor parts 21 and 22 repeatedly move the module ICs in the test part 3 while repeating the above-described process and perform a test.

In the test process as described above, the first and second conveyor parts 21 and 22 may move the module ICs by one pitch. However, the first and second conveyor parts 21 and 22 may move by several rules to move several module ICs at once.

On the other hand, when the size or type of the module IC to be tested is changed, the servo motor 16 for moving the first base 11 is operated so that the first base 11 along the both sides of the LM guide 15 The distance is moved by a predetermined distance in a desired direction, and the distance between the holders 32 of the first and second conveyor parts 21 and 22 is adjusted according to the size of the module IC M to be tested.

In the above-described embodiment of the test handler, the loading side guide plate 41 and the unloading side of the loading position 13 and the unloading position 14 of the test unit 3 are seated and supported by the lower end of the module IC M. Although the guide plate 42 is configured, if the accuracy and stability of the operation of the loading picker 4 and the unloading picker 5 can be ensured, it will not be necessary to configure the same as the guide plate described above.

In addition, in the above-described embodiment of the handler, a pair of conveyors are configured in the test unit 3, and the module ICs are conveyed and tested one by one. Alternatively, two or more pairs of conveyor rows may be used by three or four conveyors in the test unit. May be configured to return the module ICs in a single row and perform the test.

According to the present invention as described above, when the type or size of the module IC to be tested changes only the interval of each conveyor part, the number of change kits is very small, thus minimizing waste of time due to the change of the module IC under test And, there is an advantage that can prevent the degradation of the work efficiency due to replacement work.

In addition, since both sides of the module IC are held and moved continuously, even if the lower end cannot be supported by the terminal formed at the lower end of the module IC, the terminal can be tested without touching the terminal, thereby providing very advantageous advantages. have.

Claims (9)

A loading unit in which a plurality of trays containing a plurality of module ICs to be tested are loaded, an unloading unit in which a plurality of empty trays in which the tested module ICs are stored are loaded, and an electrical test of the module ICs returned from the loading unit A module IC test handler comprising: a test unit formed at least one picker configured to move in an XYZ direction on an upper side of a handler, and to carry a module IC between the loading unit, the test unit, and the unloading unit, The test unit, A base; A first conveyor unit installed to rotate in the base; A second conveyor unit disposed at one side of the one conveyor unit to be spaced apart from each other by a predetermined distance; A plurality of holding members movably installed in the first conveyor part and the second conveyor part to releasably fix the module IC between the first conveyor part and the second conveyor part; A test head installed between the first conveyor unit and the second conveyor unit, the test head having a test socket electrically connected to module ICs to perform an electrical performance test; A contact unit for connecting and disconnecting the module ICs fixed by the holding members of the first and second conveyor parts to the test head; And a driving unit to move the holding member by a predetermined pitch by moving the first and second conveyor portions by a predetermined distance. The method of claim 1, wherein the first conveyor portion, the first driving pulley and the first driven pulley which is installed opposite to each other on the base, and wound around the first driving pulley and the first driven pulley circulating rotation and the outer surface A rotating member is formed of a first power transmission belt fixed at predetermined intervals; The second conveyor portion is wound around the second driving pulley and the second driven pulley and the second driving pulley and the second driven pulley which are installed opposite to each other on the base, and the rotation member is rotated on the outer surface at predetermined intervals. Module IC test handler, characterized in that consisting of a second power transmission belt fixed. The module of claim 2, wherein the holding member comprises a holder block fixedly coupled to outer surfaces of the first power transmission belt and the second power transmission belt, and horizontally movable in and out of the holder block. And a holder in contact with both sides, and an elastic member elastically supporting the holder with respect to the holder block. The module IC test handler according to claim 1, further comprising a guide plate installed at a lower portion between the first conveyor portion and the second conveyor portion to prevent the module IC from falling. The base of claim 1, wherein the base is separated into a first base on which the first conveyor part is installed, and a second base on which the second conveyor part is installed, and the first base and / or the second base are horizontal to each other. The module IC test handler, characterized in that for adjusting the interval of the holder member between the first conveyor portion and the second conveyor portion. [4] The apparatus of claim 3, further comprising a holder operating unit for forcibly moving the holder of the holder member located at a predetermined position between the first and second conveyor parts so that the holder is in contact with and released from both sides of the module IC. Module IC test handler, characterized in that. The method of claim 6, wherein the holder operation unit is coupled to one end of the pneumatic cylinder is installed on one side of the first and second conveyor parts, the piston rod of the pneumatic cylinder and the one side of the holder in accordance with the movement of the piston rod Module IC test handler, characterized in that it comprises an operating unit for moving the holder in contact and non-contact. The driving unit of claim 2, wherein the driving unit comprises: a servo motor, a first power transfer pulley connected to the drive shaft of the servo motor and rotating, and a second power transfer pulley coaxially connected to the driving pulleys and rotating. And a driving belt wound around the first power transmission pulley and the second power transmission pulley to transfer the rotational force of the first power transmission pulley to the second power transmission pulley. The module IC test handler of claim 1, further comprising a chamber that shields the test unit from the outside.

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