KR100686706B1 - 폭발용접이 적용된 반도체 제조장치 - Google Patents
폭발용접이 적용된 반도체 제조장치 Download PDFInfo
- Publication number
- KR100686706B1 KR100686706B1 KR1020040102083A KR20040102083A KR100686706B1 KR 100686706 B1 KR100686706 B1 KR 100686706B1 KR 1020040102083 A KR1020040102083 A KR 1020040102083A KR 20040102083 A KR20040102083 A KR 20040102083A KR 100686706 B1 KR100686706 B1 KR 100686706B1
- Authority
- KR
- South Korea
- Prior art keywords
- base material
- metal base
- semiconductor manufacturing
- explosion
- explosives
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 34
- 238000003466 welding Methods 0.000 title claims abstract description 30
- 239000002360 explosive Substances 0.000 title claims abstract description 24
- 229910052751 metal Inorganic materials 0.000 claims abstract description 46
- 239000002184 metal Substances 0.000 claims abstract description 46
- 239000000463 material Substances 0.000 claims abstract description 41
- 238000004880 explosion Methods 0.000 claims abstract description 37
- 238000004519 manufacturing process Methods 0.000 claims abstract description 32
- 239000007788 liquid Substances 0.000 claims description 5
- 238000000034 method Methods 0.000 abstract description 18
- 230000007547 defect Effects 0.000 abstract description 5
- 238000005452 bending Methods 0.000 abstract 1
- 125000006850 spacer group Chemical group 0.000 description 3
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 239000010953 base metal Substances 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 239000003721 gunpowder Substances 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K20/00—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
- B23K20/06—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating by means of high energy impulses, e.g. magnetic energy
- B23K20/08—Explosive welding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Pressure Welding/Diffusion-Bonding (AREA)
Abstract
Description
즉, 폭발로 발생되는 고온 고압력에 의해 금속판의 표면막이 액체로 변형됨과 동시에 폭발시 발생되는 고압력에 의해 큰 판이 금속판 상면에 용접되는 것이다.
상기 금속모재(10)와 프레임판(40) 사이에 스페이서(도시 생략)를 위치시켜 금속모재(10)에 일정 높이로 프레임판(40)을 위치하도록 한다.
이러한 폭발용접방법으로 인해 반도체 제조용 히터 및 서셉터의 평탄성이 휘어지는 현상을 최소화하여 공정상의 불량 발생을 방지토록 하는 것이다.
Claims (5)
- 반도체 제조용 챔버, 챔버 내부에 설치되어 상면에 안착되는 웨이퍼에 열원을 공급하도록 금속모재(10)로 제조되는 히터 및 서셉터가 포함 구성된 반도체 제조장치에 있어서,상기 금속모재(10)의 상면 표면을 고온 고압력에 의해 액체로 변형시킬 수 있도록 뇌관(20)이 갖추어진 폭약(30); 및상기 폭약(30)의 폭발로 발생되는 고온 고압력의 충격에 의해 변형되는 상기 금속모재(10) 상면에 압접되어 평탄성이 저하되는 현상을 최소화하도록 폭약(30)의 바닥면에 부착되는 프레임판(40)으로 구성된 폭발용접장치를 이용하여 제조된 것을 특징으로 하는 반도체 제조장치.
- 삭제
- 삭제
- 제1항에 있어서, 상기 프레임판(40)은 폭약(30)의 폭발로 인해 발생되는 고온 고압력에 의해 변형되는 금속모재(10) 상면에 압접되도록 금속모재(10) 위에 3~30°경사지게 위치시킨 것을 특징으로 하는 반도체 제조장치.
- 제1항에 있어서, 상기 프레임판(40)은 폭약(30)의 폭발로 인해 발생되는 고온 고압력에 의해 변형되는 금속모재(10) 상면에 압접되도록 금속모재(10) 위에 일정간격을 두고 평행하게 위치시킨 것을 특징으로 하는 반도체 제조장치.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020040102083A KR100686706B1 (ko) | 2004-12-07 | 2004-12-07 | 폭발용접이 적용된 반도체 제조장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020040102083A KR100686706B1 (ko) | 2004-12-07 | 2004-12-07 | 폭발용접이 적용된 반도체 제조장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20060063036A KR20060063036A (ko) | 2006-06-12 |
KR100686706B1 true KR100686706B1 (ko) | 2007-02-27 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020040102083A KR100686706B1 (ko) | 2004-12-07 | 2004-12-07 | 폭발용접이 적용된 반도체 제조장치 |
Country Status (1)
Country | Link |
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KR (1) | KR100686706B1 (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102268599B1 (ko) * | 2021-03-26 | 2021-06-24 | 추태호 | 폭발 용접 시스템 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100340645B1 (ko) * | 1997-12-13 | 2002-07-18 | 이구택 | 고크롬페라이트계스테인레스강의폭발접합방법 |
-
2004
- 2004-12-07 KR KR1020040102083A patent/KR100686706B1/ko active IP Right Grant
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100340645B1 (ko) * | 1997-12-13 | 2002-07-18 | 이구택 | 고크롬페라이트계스테인레스강의폭발접합방법 |
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Publication number | Publication date |
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KR20060063036A (ko) | 2006-06-12 |
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