KR100670767B1 - 비정질 실리콘 옥사이드 나노선의 제조방법 및 이로부터제조된 나노선 - Google Patents
비정질 실리콘 옥사이드 나노선의 제조방법 및 이로부터제조된 나노선 Download PDFInfo
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- KR100670767B1 KR100670767B1 KR1020040076908A KR20040076908A KR100670767B1 KR 100670767 B1 KR100670767 B1 KR 100670767B1 KR 1020040076908 A KR1020040076908 A KR 1020040076908A KR 20040076908 A KR20040076908 A KR 20040076908A KR 100670767 B1 KR100670767 B1 KR 100670767B1
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- Prior art keywords
- silicon oxide
- nanowires
- silicon
- silicon substrate
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- 239000002070 nanowire Substances 0.000 title claims abstract description 50
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 title claims abstract description 33
- 238000000034 method Methods 0.000 title claims abstract description 20
- 229910021417 amorphous silicon Inorganic materials 0.000 title description 6
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 37
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 36
- 239000010703 silicon Substances 0.000 claims abstract description 36
- 239000000758 substrate Substances 0.000 claims abstract description 31
- 229910052814 silicon oxide Inorganic materials 0.000 claims abstract description 26
- 150000002815 nickel Chemical class 0.000 claims abstract description 8
- 239000002798 polar solvent Substances 0.000 claims abstract description 7
- 239000002994 raw material Substances 0.000 claims abstract description 6
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 18
- 239000011261 inert gas Substances 0.000 claims description 10
- 229910052786 argon Inorganic materials 0.000 claims description 9
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 8
- 238000006243 chemical reaction Methods 0.000 claims description 7
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical group OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 claims description 6
- 238000001035 drying Methods 0.000 claims description 5
- 229910052930 hexahydrite Inorganic materials 0.000 claims description 5
- PXHVJJICTQNCMI-UHFFFAOYSA-N nickel Substances [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 4
- ZVHHIDVFSYXCEW-UHFFFAOYSA-L nickel(ii) nitrite Chemical group [Ni+2].[O-]N=O.[O-]N=O ZVHHIDVFSYXCEW-UHFFFAOYSA-L 0.000 claims description 4
- 239000001307 helium Substances 0.000 claims description 2
- 229910052734 helium Inorganic materials 0.000 claims description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims description 2
- OTRYHTMXLHGJQV-UHFFFAOYSA-M [NiH4]F Chemical compound [NiH4]F OTRYHTMXLHGJQV-UHFFFAOYSA-M 0.000 claims 1
- LAIZPRYFQUWUBN-UHFFFAOYSA-L nickel chloride hexahydrate Chemical compound O.O.O.O.O.O.[Cl-].[Cl-].[Ni+2] LAIZPRYFQUWUBN-UHFFFAOYSA-L 0.000 claims 1
- 239000003054 catalyst Substances 0.000 abstract description 14
- 238000010438 heat treatment Methods 0.000 abstract description 5
- 238000004519 manufacturing process Methods 0.000 abstract description 5
- 230000003287 optical effect Effects 0.000 abstract description 5
- 239000000463 material Substances 0.000 abstract description 4
- 239000007787 solid Substances 0.000 abstract description 3
- 230000007613 environmental effect Effects 0.000 abstract description 2
- 239000007789 gas Substances 0.000 description 11
- 230000015572 biosynthetic process Effects 0.000 description 5
- 239000000243 solution Substances 0.000 description 5
- 238000003786 synthesis reaction Methods 0.000 description 5
- 238000000862 absorption spectrum Methods 0.000 description 3
- 239000012535 impurity Substances 0.000 description 3
- 239000002086 nanomaterial Substances 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 150000003376 silicon Chemical class 0.000 description 3
- 238000004566 IR spectroscopy Methods 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000002003 electron diffraction Methods 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 229910000673 Indium arsenide Inorganic materials 0.000 description 1
- 229910021586 Nickel(II) chloride Inorganic materials 0.000 description 1
- MCDKGVJHAPFQKN-UHFFFAOYSA-L O.O.O.O.O.O.N(=O)[O-].[Ni+2].N(=O)[O-] Chemical compound O.O.O.O.O.O.N(=O)[O-].[Ni+2].N(=O)[O-] MCDKGVJHAPFQKN-UHFFFAOYSA-L 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- 238000003917 TEM image Methods 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- UHYPYGJEEGLRJD-UHFFFAOYSA-N cadmium(2+);selenium(2-) Chemical compound [Se-2].[Cd+2] UHYPYGJEEGLRJD-UHFFFAOYSA-N 0.000 description 1
- 239000002041 carbon nanotube Substances 0.000 description 1
- 229910021393 carbon nanotube Inorganic materials 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 230000015271 coagulation Effects 0.000 description 1
- 238000005345 coagulation Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 239000012776 electronic material Substances 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 150000002505 iron Chemical class 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 239000002105 nanoparticle Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- QMMRZOWCJAIUJA-UHFFFAOYSA-L nickel dichloride Chemical compound Cl[Ni]Cl QMMRZOWCJAIUJA-UHFFFAOYSA-L 0.000 description 1
- DBJLJFTWODWSOF-UHFFFAOYSA-L nickel(ii) fluoride Chemical compound F[Ni]F DBJLJFTWODWSOF-UHFFFAOYSA-L 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000035484 reaction time Effects 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 238000001878 scanning electron micrograph Methods 0.000 description 1
- 238000004098 selected area electron diffraction Methods 0.000 description 1
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
- 238000004454 trace mineral analysis Methods 0.000 description 1
- 238000009827 uniform distribution Methods 0.000 description 1
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-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B33/00—Silicon; Compounds thereof
- C01B33/113—Silicon oxides; Hydrates thereof
- C01B33/12—Silica; Hydrates thereof, e.g. lepidoic silicic acid
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82B—NANOSTRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS, MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES AS DISCRETE UNITS; MANUFACTURE OR TREATMENT THEREOF
- B82B3/00—Manufacture or treatment of nanostructures by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
- B82B3/0004—Apparatus specially adapted for the manufacture or treatment of nanostructural devices or systems or methods for manufacturing the same
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Inorganic Chemistry (AREA)
- Composite Materials (AREA)
- Silicon Compounds (AREA)
Abstract
Description
Claims (11)
- 니켈 염과 극성 용매로 이루어진 용액을 실리콘 기판에 도포하는 단계, 및 상기 도포된 실리콘 기판을 1000℃ 내지 1200℃의 온도 조건에서 반응시키는 단계를 포함하는 실리콘 옥사이드 나노선의 제조 방법.
- 제1항에 있어서, 상기 니켈 염이 니켈 나이트라이트 헥사하이드라이트(Ni(NO3)2)·6H2O), 니켈 클로라이드 헥사하이드하이트(NiCl2 ·6H2O), 및 니켈 플루라이드 테트라하이드라이트(NiF2·4H2O) 중 선택되는 것을 특징으로 하는 방법.
- 제 1항에 있어서, 상기 극성 용매가 메탄올 및 에탄올 중 선택되는 것을 특징으로 하는 방법.
- 제 1항에 있어서, 상기 도포하는 단계가 상기 실리콘 기판을 상기 용액에 침지한 후, 70℃ 이상에서 10분 이상 건조시키는 것으로 이루어진 것을 특징으로 하는 방법.
- 제 1항에 있어서, 상기 반응 온도 승온 개시 전부터 반응 종료 후까지 계속 불활성 기체가 주입되는 것을 특징으로 하는 방법.
- 제 1항에 있어서, 상기 용액의 농도가 0.01 M 내지 0.05 M이 되는 것을 특징으로 하는 방법.
- 제 6항에 있어서, 상기 불활성 기체가 헬륨 및 아르곤 중에서 선택되는 것을 특징으로 하는 방법.
- 제 6항에 있어서, 상기 반응 동안의 불활성 기체의 유량이 400 내지 500 sccm인 것을 특징으로 하는 방법.
- 제 1항에 있어서, 상기 실리콘 기판이 실리콘 옥사이드 나노선의 원료로 사용되는 것을 특징으로 하는 방법.
- 제 1항 내지 제 9항 중 어느 한 항의 방법에 의해 제조된 직경 50 내지 150 nm 의 실리콘 옥사이드 나노선.
- 삭제
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KR1020040076908A KR100670767B1 (ko) | 2004-09-24 | 2004-09-24 | 비정질 실리콘 옥사이드 나노선의 제조방법 및 이로부터제조된 나노선 |
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KR1020040076908A KR100670767B1 (ko) | 2004-09-24 | 2004-09-24 | 비정질 실리콘 옥사이드 나노선의 제조방법 및 이로부터제조된 나노선 |
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Families Citing this family (3)
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CN100341782C (zh) * | 2006-07-17 | 2007-10-10 | 天津大学 | 快速加热分解有机硅氧烷制备氧化硅纳米线的方法 |
KR101139914B1 (ko) * | 2009-08-28 | 2012-04-30 | 경희대학교 산학협력단 | Ni 박막이 증착된 Si-과잉산화막을 이용한 실리카 나노선의 제조 방법 |
DE102010032747B4 (de) | 2010-07-29 | 2014-07-17 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | Verfahren zur solaren Herstellung von Nanodrähten mit einem Katalysator |
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JP2003147417A (ja) * | 2001-11-02 | 2003-05-21 | Japan Science & Technology Corp | 金属ナノサイズ粒子とその製造方法 |
US6720240B2 (en) | 2000-03-29 | 2004-04-13 | Georgia Tech Research Corporation | Silicon based nanospheres and nanowires |
US20040099093A1 (en) | 2002-11-26 | 2004-05-27 | Avetik Harutyunyan | Method for synthesis of metal nanoparticles |
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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US6720240B2 (en) | 2000-03-29 | 2004-04-13 | Georgia Tech Research Corporation | Silicon based nanospheres and nanowires |
JP2003147417A (ja) * | 2001-11-02 | 2003-05-21 | Japan Science & Technology Corp | 金属ナノサイズ粒子とその製造方法 |
US20040099093A1 (en) | 2002-11-26 | 2004-05-27 | Avetik Harutyunyan | Method for synthesis of metal nanoparticles |
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1020040076908 - 622089 * |
15147417 * |
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