KR100661744B1 - 플라즈마 처리장치 - Google Patents
플라즈마 처리장치 Download PDFInfo
- Publication number
- KR100661744B1 KR100661744B1 KR1020040110832A KR20040110832A KR100661744B1 KR 100661744 B1 KR100661744 B1 KR 100661744B1 KR 1020040110832 A KR1020040110832 A KR 1020040110832A KR 20040110832 A KR20040110832 A KR 20040110832A KR 100661744 B1 KR100661744 B1 KR 100661744B1
- Authority
- KR
- South Korea
- Prior art keywords
- coolant
- shower head
- chamber
- processing apparatus
- plasma processing
- Prior art date
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45572—Cooled nozzles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
- C23C16/509—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
- C23C16/5096—Flat-bed apparatus
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/513—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using plasma jets
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Chemical Vapour Deposition (AREA)
- Drying Of Semiconductors (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020040110832A KR100661744B1 (ko) | 2004-12-23 | 2004-12-23 | 플라즈마 처리장치 |
CNB200510130190XA CN100512591C (zh) | 2004-12-23 | 2005-12-19 | 等离子体处理设备 |
CN2008101725493A CN101448357B (zh) | 2004-12-23 | 2005-12-19 | 等离子体处理设备 |
US11/313,022 US7886687B2 (en) | 2004-12-23 | 2005-12-20 | Plasma processing apparatus |
TW094145700A TWI312815B (en) | 2004-12-23 | 2005-12-22 | Plasma processing apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020040110832A KR100661744B1 (ko) | 2004-12-23 | 2004-12-23 | 플라즈마 처리장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20060072276A KR20060072276A (ko) | 2006-06-28 |
KR100661744B1 true KR100661744B1 (ko) | 2006-12-27 |
Family
ID=36811739
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020040110832A KR100661744B1 (ko) | 2004-12-23 | 2004-12-23 | 플라즈마 처리장치 |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR100661744B1 (zh) |
CN (2) | CN100512591C (zh) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200913798A (en) | 2007-09-14 | 2009-03-16 | Advanced Display Proc Eng Co | Substrate processing apparatus having electrode member |
KR100970201B1 (ko) * | 2008-03-17 | 2010-07-14 | 주식회사 아이피에스 | 진공처리장치 |
TWI646869B (zh) | 2011-10-05 | 2019-01-01 | 美商應用材料股份有限公司 | 對稱電漿處理腔室 |
CN104701121B (zh) * | 2013-12-04 | 2017-01-04 | 中微半导体设备(上海)有限公司 | 设有可提高对称性的导气装置的泵以及等离子处理装置 |
CN106783500A (zh) * | 2017-01-03 | 2017-05-31 | 京东方科技集团股份有限公司 | 镀膜设备 |
US10900124B2 (en) * | 2018-06-12 | 2021-01-26 | Lam Research Corporation | Substrate processing chamber with showerhead having cooled faceplate |
CN109600898B (zh) * | 2018-12-13 | 2020-04-17 | 大连理工大学 | 一种喷淋式电极及放电系统 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4534816A (en) * | 1984-06-22 | 1985-08-13 | International Business Machines Corporation | Single wafer plasma etch reactor |
KR100234661B1 (ko) | 1992-11-19 | 1999-12-15 | 히가시 데쓰로 | 이방성 에칭장치 |
US6079356A (en) | 1997-12-02 | 2000-06-27 | Applied Materials, Inc. | Reactor optimized for chemical vapor deposition of titanium |
KR20020009597A (ko) * | 1996-04-12 | 2002-02-01 | 가나이 쓰도무 | 플라즈마 처리장치 |
JP2003179044A (ja) | 2001-12-13 | 2003-06-27 | Tokyo Electron Ltd | プラズマ処理装置 |
JP2004342704A (ja) | 2003-05-13 | 2004-12-02 | Tokyo Electron Ltd | 上部電極及びプラズマ処理装置 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5846883A (en) * | 1996-07-10 | 1998-12-08 | Cvc, Inc. | Method for multi-zone high-density inductively-coupled plasma generation |
KR100492258B1 (ko) * | 1996-10-11 | 2005-09-02 | 가부시키가이샤 에바라 세이사꾸쇼 | 반응가스분출헤드 |
TW573053B (en) * | 2001-09-10 | 2004-01-21 | Anelva Corp | Surface processing apparatus |
-
2004
- 2004-12-23 KR KR1020040110832A patent/KR100661744B1/ko not_active IP Right Cessation
-
2005
- 2005-12-19 CN CNB200510130190XA patent/CN100512591C/zh not_active Expired - Fee Related
- 2005-12-19 CN CN2008101725493A patent/CN101448357B/zh not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4534816A (en) * | 1984-06-22 | 1985-08-13 | International Business Machines Corporation | Single wafer plasma etch reactor |
KR100234661B1 (ko) | 1992-11-19 | 1999-12-15 | 히가시 데쓰로 | 이방성 에칭장치 |
KR20020009597A (ko) * | 1996-04-12 | 2002-02-01 | 가나이 쓰도무 | 플라즈마 처리장치 |
US6079356A (en) | 1997-12-02 | 2000-06-27 | Applied Materials, Inc. | Reactor optimized for chemical vapor deposition of titanium |
JP2003179044A (ja) | 2001-12-13 | 2003-06-27 | Tokyo Electron Ltd | プラズマ処理装置 |
JP2004342704A (ja) | 2003-05-13 | 2004-12-02 | Tokyo Electron Ltd | 上部電極及びプラズマ処理装置 |
Also Published As
Publication number | Publication date |
---|---|
CN101448357B (zh) | 2012-07-04 |
KR20060072276A (ko) | 2006-06-28 |
CN101448357A (zh) | 2009-06-03 |
CN100512591C (zh) | 2009-07-08 |
CN1802066A (zh) | 2006-07-12 |
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