KR100627739B1 - 개선된 궤도 계획 및 실행을 위한 방법, 시스템 및 컴퓨터 판독가능 매체 - Google Patents

개선된 궤도 계획 및 실행을 위한 방법, 시스템 및 컴퓨터 판독가능 매체 Download PDF

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KR100627739B1
KR100627739B1 KR1020030082661A KR20030082661A KR100627739B1 KR 100627739 B1 KR100627739 B1 KR 100627739B1 KR 1020030082661 A KR1020030082661 A KR 1020030082661A KR 20030082661 A KR20030082661 A KR 20030082661A KR 100627739 B1 KR100627739 B1 KR 100627739B1
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computer
trajectory
program code
signal
readable program
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KR20040044175A (ko
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다니엘 갈버트
토드제이. 베드나렉
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에이에스엠엘 홀딩 엔.브이.
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    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691—Handling of masks or workpieces
    • G03F7/70716—Stages
    • G03F7/70725—Stages control
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P76/00—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Control Of Position Or Direction (AREA)
  • Numerical Control (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
KR1020030082661A 2002-11-20 2003-11-20 개선된 궤도 계획 및 실행을 위한 방법, 시스템 및 컴퓨터 판독가능 매체 Expired - Fee Related KR100627739B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/299,855 2002-11-20
US10/299,855 US6845287B2 (en) 2002-11-20 2002-11-20 Method, system, and computer program product for improved trajectory planning and execution

Publications (2)

Publication Number Publication Date
KR20040044175A KR20040044175A (ko) 2004-05-27
KR100627739B1 true KR100627739B1 (ko) 2006-09-25

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KR1020030082661A Expired - Fee Related KR100627739B1 (ko) 2002-11-20 2003-11-20 개선된 궤도 계획 및 실행을 위한 방법, 시스템 및 컴퓨터 판독가능 매체

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US (2) US6845287B2 (https=)
EP (1) EP1422569B1 (https=)
JP (1) JP4093950B2 (https=)
KR (1) KR100627739B1 (https=)
CN (1) CN100386701C (https=)
DE (1) DE60325933D1 (https=)
SG (1) SG105593A1 (https=)
TW (1) TWI266950B (https=)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100540588B1 (ko) * 2002-12-27 2006-01-10 삼성중공업 주식회사 모션 제어의 실시간 응답을 위한 궤적발생방법 및 시스템
US7341822B2 (en) 2003-02-25 2008-03-11 Asml Netherlands B.V. Time-optimal setpoint generator in a lithographic apparatus
EP1452920A3 (en) * 2003-02-25 2006-06-21 ASML Netherlands B.V. Device manufacturing method,device manufactured thereby,computer program for performing the method,lithographic apparatus, and robotics system
US20040204777A1 (en) * 2003-04-14 2004-10-14 Alon Harpaz Precision motion control using feed forward of acceleration
US20040236453A1 (en) * 2003-05-22 2004-11-25 Gabor Szoboszlay Method and apparatus for combining and generating trajectories
US7016019B2 (en) * 2003-12-16 2006-03-21 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US20060190136A1 (en) * 2005-02-24 2006-08-24 Paragon Technical Services, Inc. Method and system for controlling a manipulator
DE102005061570A1 (de) * 2005-12-22 2007-07-05 Siemens Ag Ermittlungsverfahren für eine lagegeführte abzufahrende Grobbahn
US7919940B2 (en) * 2007-10-21 2011-04-05 Ge Intelligent Platforms, Inc. System and method for jerk limited trajectory planning for a path planner
TWI402641B (zh) * 2009-12-04 2013-07-21 Ind Tech Res Inst 聯結多系統達成多軸同步插值裝置與方法
EP2996003B1 (en) * 2014-09-11 2021-06-30 Robert Bosch GmbH Device and method for moving an object
CN105319989B (zh) * 2015-11-19 2018-06-15 清华大学 一种永磁弹射掩模台弹射区电机出力最小轨迹规划方法
CN106817508B (zh) 2015-11-30 2019-11-22 华为技术有限公司 一种同步对象确定方法、装置和系统
WO2018161148A1 (en) * 2017-03-06 2018-09-13 Honeywell Limited Method and apparatus for designing model-based control having temporally robust stability and performance for multiple-array cross-direction (cd) web manufacturing or processing systems or other systems
CN109358492A (zh) * 2018-10-31 2019-02-19 电子科技大学 一种光刻机工件台运动控制方法
CN109782815B (zh) * 2018-12-27 2020-06-19 西安交通大学 基于多轴联动系统的复杂型面自适应测量路径规划方法
CN110207966A (zh) * 2019-06-13 2019-09-06 北京工业大学 一种航空结构多轴随机疲劳载荷下在线损伤评估方法
CN110333722A (zh) * 2019-07-11 2019-10-15 北京电影学院 一种机器人轨迹生成和控制方法、装置及系统
CN113031511B (zh) * 2019-12-24 2022-03-22 沈阳智能机器人创新中心有限公司 一种基于高阶b样条的多轴系统实时引导轨迹规划方法
CN112558427A (zh) * 2020-12-11 2021-03-26 西安工业大学 一种适用于步进扫描投影光刻机的轨迹规划系统及方法
CN113759853B (zh) * 2021-09-18 2023-07-18 法兰泰克重工股份有限公司 一种物料自动搬运控制系统
CN114139339B (zh) * 2021-10-14 2025-10-10 苏州谋迅智能科技有限公司 基于位置平滑的速度滤波方法和装置、存储介质和设备
CN114740715A (zh) * 2022-03-15 2022-07-12 青岛科技大学 一种基于时间与急动度最优的速度曲线模型方法
CN116009473B (zh) * 2022-10-25 2024-02-06 华中科技大学 基于非对称fir滤波器的刀具位姿轨迹插补与光顺方法
CN116339391A (zh) * 2022-10-28 2023-06-27 中国科学院长春光学精密机械与物理研究所 基于时钟间隔的太阳望远镜扫描机构实时轨迹规划器
US20240286280A1 (en) * 2023-02-24 2024-08-29 Sanctuary Cognitive Systems Corporation Method and system of generating a feasible smooth reference trajectory for an actuator
CN116795044B (zh) * 2023-08-16 2023-11-14 通用技术集团机床工程研究院有限公司 速度规划方法、装置、机床控制系统和存储介质
US20250164892A1 (en) * 2023-11-17 2025-05-22 Taiwan Semiconductor Manufacturing Company, Ltd. Lithography scanner throughput

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3477698B2 (ja) * 1994-06-13 2003-12-10 株式会社ニコン 走査型露光装置および走査露光方法
US5623853A (en) * 1994-10-19 1997-04-29 Nikon Precision Inc. Precision motion stage with single guide beam and follower stage
US5625267A (en) * 1995-12-13 1997-04-29 Coburn Optical Industries, Inc. Constant delay filtering for synchronized motion on multiple axes
US6069684A (en) * 1998-02-04 2000-05-30 International Business Machines Corporation Electron beam projection lithography system (EBPS)
US6509953B1 (en) * 1998-02-09 2003-01-21 Nikon Corporation Apparatus for exposing a pattern onto an object with controlled scanning
US6320345B1 (en) 1998-03-05 2001-11-20 Nikon Corporation Command trajectory for driving a stage with minimal vibration
US6008610A (en) * 1998-03-20 1999-12-28 Nikon Corporation Position control apparatus for fine stages carried by a coarse stage on a high-precision scanning positioning system
US6260282B1 (en) * 1998-03-27 2001-07-17 Nikon Corporation Stage control with reduced synchronization error and settling time
JP2000040658A (ja) * 1998-07-24 2000-02-08 Nikon Corp ステージ制御方法及び走査型露光装置
US6360078B1 (en) * 1998-12-23 2002-03-19 Nortel Networks Limited Method of compensating for group time delay asymmetry in a radio receiver
TW490596B (en) * 1999-03-08 2002-06-11 Asm Lithography Bv Lithographic projection apparatus, method of manufacturing a device using the lithographic projection apparatus, device manufactured according to the method and method of calibrating the lithographic projection apparatus
JP3796367B2 (ja) * 1999-03-09 2006-07-12 キヤノン株式会社 ステージ制御方法、露光方法、露光装置およびデバイス製造方法
US6285438B1 (en) * 1999-05-19 2001-09-04 Nikon Corporation Scanning exposure method with reduced time between scans
JP2001250757A (ja) 2000-03-03 2001-09-14 Canon Inc 走査型露光装置
US6766339B2 (en) * 2001-01-11 2004-07-20 Asml Holding N.V. Method and system for efficient and accurate filtering and interpolation

Also Published As

Publication number Publication date
KR20040044175A (ko) 2004-05-27
TW200422773A (en) 2004-11-01
US6845287B2 (en) 2005-01-18
EP1422569B1 (en) 2009-01-21
CN100386701C (zh) 2008-05-07
JP4093950B2 (ja) 2008-06-04
US20050077484A1 (en) 2005-04-14
JP2004172625A (ja) 2004-06-17
US20040098160A1 (en) 2004-05-20
EP1422569A2 (en) 2004-05-26
CN1503093A (zh) 2004-06-09
US7389155B2 (en) 2008-06-17
DE60325933D1 (de) 2009-03-12
TWI266950B (en) 2006-11-21
SG105593A1 (en) 2004-08-27
EP1422569A3 (en) 2005-12-14

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