KR100624666B1 - 무선 주파수 장치의 잡음 지수 측정 시스템 - Google Patents

무선 주파수 장치의 잡음 지수 측정 시스템 Download PDF

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Publication number
KR100624666B1
KR100624666B1 KR1020017003673A KR20017003673A KR100624666B1 KR 100624666 B1 KR100624666 B1 KR 100624666B1 KR 1020017003673 A KR1020017003673 A KR 1020017003673A KR 20017003673 A KR20017003673 A KR 20017003673A KR 100624666 B1 KR100624666 B1 KR 100624666B1
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South Korea
Prior art keywords
power
noise
dut
signal
frequency
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KR1020017003673A
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English (en)
Korean (ko)
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KR20010075290A (ko
Inventor
카스텐제프리스코트
Original Assignee
크레던스 시스템스 코포레이션
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Publication of KR20010075290A publication Critical patent/KR20010075290A/ko
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
KR1020017003673A 1998-10-28 1999-10-25 무선 주파수 장치의 잡음 지수 측정 시스템 Expired - Fee Related KR100624666B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/181,940 US6114858A (en) 1998-10-28 1998-10-28 System for measuring noise figure of a radio frequency device
US09/181,940 1998-10-28

Publications (2)

Publication Number Publication Date
KR20010075290A KR20010075290A (ko) 2001-08-09
KR100624666B1 true KR100624666B1 (ko) 2006-09-18

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ID=22666452

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Application Number Title Priority Date Filing Date
KR1020017003673A Expired - Fee Related KR100624666B1 (ko) 1998-10-28 1999-10-25 무선 주파수 장치의 잡음 지수 측정 시스템

Country Status (5)

Country Link
US (1) US6114858A (https=)
EP (1) EP1125139A4 (https=)
JP (1) JP2002528724A (https=)
KR (1) KR100624666B1 (https=)
WO (1) WO2000025142A1 (https=)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2789181B1 (fr) * 1999-02-01 2001-04-20 St Microelectronics Sa Procede de determination du bruit d'instabilite de frequence d'une source et dispositif mettant en oeuvre le procede
US6496261B1 (en) 1999-09-24 2002-12-17 Schlumberger Technologies, Inc. Double-pulsed optical interferometer for waveform probing of integrated circuits
US6252222B1 (en) * 2000-01-13 2001-06-26 Schlumberger Technologies, Inc. Differential pulsed laser beam probing of integrated circuits
US7006939B2 (en) * 2000-04-19 2006-02-28 Georgia Tech Research Corporation Method and apparatus for low cost signature testing for analog and RF circuits
TW490563B (en) * 2000-08-30 2002-06-11 Ind Tech Res Inst Regulable test integrated circuit (IC) system for signal noise and its measurement method
US6693439B1 (en) * 2000-09-28 2004-02-17 Cadence Design Systems, Inc. Apparatus and methods for measuring noise in a device
JPWO2002033427A1 (ja) * 2000-10-17 2004-02-26 株式会社アドバンテスト ノイズ測定装置、方法、記録媒体
US7035324B2 (en) * 2001-08-01 2006-04-25 Agilent Technologies, Inc. Phase-noise measurement with compensation for phase noise contributed by spectrum analyzer
US6965242B2 (en) * 2002-06-28 2005-11-15 Rohde & Schwarz Gmbh & Co. Kg Procedure and apparatus for the determination of the noise level of an electronic object to be measured
US20050137814A1 (en) * 2003-12-19 2005-06-23 Joseph Kelly Method of measuring noise figure using arbitrary waveforms
DE102005059791A1 (de) 2005-12-14 2007-06-28 Rohde & Schwarz Gmbh & Co. Kg Verfahren zur Messung der Rauschzahl eines Meßobjekts mit einem Netzwerkanalysator
US8036616B2 (en) * 2008-05-05 2011-10-11 Infineon Technologies Ag Noise parameter determination method
JP5274550B2 (ja) 2008-05-09 2013-08-28 株式会社アドバンテスト デジタル変調信号の試験装置、ならびにデジタル変調器、変調方法およびそれを用いた半導体装置
JP5608205B2 (ja) * 2012-11-01 2014-10-15 アンリツ株式会社 測定装置
KR101265535B1 (ko) * 2013-01-09 2013-05-20 주식회사 썬닉스 감시 장치 및 그 방법
US10120008B2 (en) * 2013-08-29 2018-11-06 Keysight Technologies, Inc. Method and apparatus for estimating the noise introduced by a device
US11119140B1 (en) * 2017-08-31 2021-09-14 Christos Tsironis Impedance pattern generation for noise parameter measurement system
CN108508287B (zh) * 2018-06-08 2019-12-27 中国电子科技集团公司第四十一研究所 基于矢量网络分析仪和功率计测量噪声系数的测量方法
US10761134B2 (en) * 2018-10-25 2020-09-01 Rohde & Schwarz Gmbh & Co. Kg Method and measurement system for identifying the noise figure of a device under test
CN111220858B (zh) * 2018-11-26 2022-04-12 北京华航无线电测量研究所 一种量子Bell态探测器噪声等效功率测量方法
US11102596B2 (en) 2019-11-19 2021-08-24 Roku, Inc. In-sync digital waveform comparison to determine pass/fail results of a device under test (DUT)
JP7374938B2 (ja) * 2021-02-08 2023-11-07 アンリツ株式会社 移動端末試験装置、及び移動端末試験方法
US20240014987A1 (en) * 2022-07-08 2024-01-11 Nvidia Corporation Wireless reference signal transmission

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0064198B1 (en) * 1981-04-25 1985-12-18 Kabushiki Kaisha Toshiba Apparatus for measuring noise factor and available gain
US5068615A (en) * 1988-10-25 1991-11-26 Cascade Microtech, Inc. Noise parameter test apparatus
US4905308A (en) * 1989-04-05 1990-02-27 Cascade Microtech, Inc. Noise parameter determination method
US5191294A (en) * 1990-04-02 1993-03-02 Wiltron Company Measuring noise figure and y-factor
US5970429A (en) * 1997-08-08 1999-10-19 Lucent Technologies, Inc. Method and apparatus for measuring electrical noise in devices

Also Published As

Publication number Publication date
EP1125139A1 (en) 2001-08-22
WO2000025142A1 (en) 2000-05-04
EP1125139A4 (en) 2003-09-10
US6114858A (en) 2000-09-05
JP2002528724A (ja) 2002-09-03
KR20010075290A (ko) 2001-08-09

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