KR100490495B1 - 반도체 장치 및 반도체 장치의 테스트 방법 - Google Patents

반도체 장치 및 반도체 장치의 테스트 방법 Download PDF

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Publication number
KR100490495B1
KR100490495B1 KR10-1999-0013814A KR19990013814A KR100490495B1 KR 100490495 B1 KR100490495 B1 KR 100490495B1 KR 19990013814 A KR19990013814 A KR 19990013814A KR 100490495 B1 KR100490495 B1 KR 100490495B1
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KR
South Korea
Prior art keywords
input
output
signal
circuit
pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR10-1999-0013814A
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English (en)
Korean (ko)
Other versions
KR20000016855A (ko
Inventor
모리가오리
Original Assignee
미쓰비시덴키 가부시키가이샤
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Publication date
Application filed by 미쓰비시덴키 가부시키가이샤 filed Critical 미쓰비시덴키 가부시키가이샤
Publication of KR20000016855A publication Critical patent/KR20000016855A/ko
Application granted granted Critical
Publication of KR100490495B1 publication Critical patent/KR100490495B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318566—Comparators; Diagnosing the device under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572—Input/Output interfaces

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
KR10-1999-0013814A 1998-08-18 1999-04-19 반도체 장치 및 반도체 장치의 테스트 방법 Expired - Fee Related KR100490495B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP98-231740 1998-08-18
JP23174098A JP3904737B2 (ja) 1998-08-18 1998-08-18 半導体装置及びその製造方法

Publications (2)

Publication Number Publication Date
KR20000016855A KR20000016855A (ko) 2000-03-25
KR100490495B1 true KR100490495B1 (ko) 2005-05-19

Family

ID=16928305

Family Applications (1)

Application Number Title Priority Date Filing Date
KR10-1999-0013814A Expired - Fee Related KR100490495B1 (ko) 1998-08-18 1999-04-19 반도체 장치 및 반도체 장치의 테스트 방법

Country Status (3)

Country Link
US (1) US6329669B1 (enExample)
JP (1) JP3904737B2 (enExample)
KR (1) KR100490495B1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101365956A (zh) * 2006-01-09 2009-02-11 Nxp股份有限公司 可测试的集成电路及集成电路的测试方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5772341A (en) * 1980-10-24 1982-05-06 Toshiba Corp Semiconductor integrated circuit device
JPH01111364A (ja) * 1987-10-24 1989-04-28 Nec Corp 半導体集積回路装置の信号切換回路
JP2672408B2 (ja) * 1991-03-19 1997-11-05 シャープ株式会社 半導体集積回路
JPH05264647A (ja) 1992-03-18 1993-10-12 Nec Corp 半導体装置のテスト回路
JP2869314B2 (ja) 1992-11-25 1999-03-10 松下電器産業株式会社 バウンダリースキャンセル回路，バウンダリースキャンテスト回路及びその使用方法
JP3099739B2 (ja) 1996-06-21 2000-10-16 日本電気株式会社 半導体記憶装置
JPH10303366A (ja) * 1997-04-30 1998-11-13 Mitsubishi Electric Corp 半導体装置

Also Published As

Publication number Publication date
JP3904737B2 (ja) 2007-04-11
KR20000016855A (ko) 2000-03-25
US6329669B1 (en) 2001-12-11
JP2000065900A (ja) 2000-03-03

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