KR100416741B1 - Rear locally sintered silicon solar cell - Google Patents
Rear locally sintered silicon solar cell Download PDFInfo
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- KR100416741B1 KR100416741B1 KR1019970011787A KR19970011787A KR100416741B1 KR 100416741 B1 KR100416741 B1 KR 100416741B1 KR 1019970011787 A KR1019970011787 A KR 1019970011787A KR 19970011787 A KR19970011787 A KR 19970011787A KR 100416741 B1 KR100416741 B1 KR 100416741B1
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- titanium oxide
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- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 47
- 239000010703 silicon Substances 0.000 title claims abstract description 47
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 46
- 239000000758 substrate Substances 0.000 claims abstract description 44
- 239000004065 semiconductor Substances 0.000 claims abstract description 32
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims abstract description 27
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 claims abstract description 23
- 229910052751 metal Inorganic materials 0.000 claims abstract description 21
- 239000002184 metal Substances 0.000 claims abstract description 21
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 18
- 238000000034 method Methods 0.000 claims abstract description 17
- 229910052814 silicon oxide Inorganic materials 0.000 claims abstract description 15
- 238000009792 diffusion process Methods 0.000 claims description 11
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 9
- 229910052782 aluminium Inorganic materials 0.000 claims description 8
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 8
- 239000010949 copper Substances 0.000 claims description 7
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 claims description 6
- 239000010936 titanium Substances 0.000 claims description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 4
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 4
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 4
- 229910052802 copper Inorganic materials 0.000 claims description 4
- 229910052709 silver Inorganic materials 0.000 claims description 4
- 239000004332 silver Substances 0.000 claims description 4
- 229910052719 titanium Inorganic materials 0.000 claims description 4
- 229910052759 nickel Inorganic materials 0.000 claims description 3
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 2
- 229910052763 palladium Inorganic materials 0.000 claims description 2
- 230000003647 oxidation Effects 0.000 abstract description 10
- 238000007254 oxidation reaction Methods 0.000 abstract description 10
- 229910052681 coesite Inorganic materials 0.000 abstract description 2
- 229910052906 cristobalite Inorganic materials 0.000 abstract description 2
- 239000000377 silicon dioxide Substances 0.000 abstract description 2
- 229910052682 stishovite Inorganic materials 0.000 abstract description 2
- 229910052905 tridymite Inorganic materials 0.000 abstract description 2
- 235000012239 silicon dioxide Nutrition 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 description 14
- 238000007747 plating Methods 0.000 description 7
- 238000006243 chemical reaction Methods 0.000 description 6
- 238000009718 spray deposition Methods 0.000 description 4
- 101100257624 Arabidopsis thaliana SPS4 gene Proteins 0.000 description 3
- 230000007547 defect Effects 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000007772 electroless plating Methods 0.000 description 2
- 238000009713 electroplating Methods 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 238000005215 recombination Methods 0.000 description 2
- 230000006798 recombination Effects 0.000 description 2
- VXUYXOFXAQZZMF-UHFFFAOYSA-N titanium(IV) isopropoxide Chemical compound CC(C)O[Ti](OC(C)C)(OC(C)C)OC(C)C VXUYXOFXAQZZMF-UHFFFAOYSA-N 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 239000002800 charge carrier Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 150000003376 silicon Chemical class 0.000 description 1
- XJDNKRIXUMDJCW-UHFFFAOYSA-J titanium tetrachloride Chemical compound Cl[Ti](Cl)(Cl)Cl XJDNKRIXUMDJCW-UHFFFAOYSA-J 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/06—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
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Abstract
Description
본 발명은 후면 부분소결형 실리콘 태양전지에 관한 것으로서, 상세하기로는 실리콘 기판 전면 및 후면에 산화티타늄막과, 기판 후면에 부분확산 p+형 반도체층을 각각 형성하는 동시에, 통상적인 함몰전극형 실리콘 태양전지와 구별되는 전면전극을 형성함으로써 제조비용이 절감되고 에너지 변환효율이 우수한 산화티타늄 비활성화 에미터 절연막을 갖는 후면 부분소결형 실리콘 태양전지(TiO2passivated Emitter, rear Locally Sintered silicon solar cell: TELS)에 관한 것이다.The present invention relates to a backside partially sintered silicon solar cell, and in detail, a titanium oxide film on the front and back of the silicon substrate, and partially diffused p on the back of the substrate.+brother By forming a semiconductor layer and forming a front electrode which is distinct from a conventional recessed electrode type silicon solar cell, a rear part sintered type silicon solar cell having a titanium oxide deactivated emitter insulating film having low manufacturing cost and excellent energy conversion efficiency ( TiO2passivated Emitter, rear Locally Sintered silicon solar cell (TELS).
태양전지는 반도체의 광기전력을 이용한 것으로서, p형 반도체와 n형 반도체를 조합하여 만든다. p형 반도체와 n형 반도체의 접합 부분 (pn 접합부)에 빛이 들어오면 빛에너지에 의하여 반도체 내부에서 마이너스의 전하(전자)와 플러스의 전하(정공)이 발생한다.The solar cell uses photovoltaic power of a semiconductor and is made by combining a p-type semiconductor and an n-type semiconductor. When light enters the junction (pn junction) of the p-type semiconductor and the n-type semiconductor, negative charges (electrons) and positive charges (holes) are generated in the semiconductors by the light energy.
빛에너지에 의해 발생된 전자와 정공은 내부의 전계에 의하여 각각 n형 반도체측과 P형 반도체측으로 이동하여 양쪽의 전극부에 모아진다. 이러한 두 개의 전극을 도선으로 연결하면 전류가 흐르고 외부에서 전력으로 이용할 수 있게 된다.The electrons and holes generated by the light energy move to the n-type semiconductor side and the P-type semiconductor side by the internal electric field, and are collected at both electrode portions. Connecting these two electrodes with wires allows the current to flow and can be used as power from the outside.
태양전지는 전극의 형태에 따라 스크린 프린팅형 태양전지(Screen Printing Solar Cell: SPSC)와 함몰전극형 태양전지(Buried Contact Solar Cell: BCSC)로 구분할 수 있다. 여기에서 SPSC는 일반적으로 제조하기가 쉽지만 에너지 변환효율이 작은 편이다.Solar cells can be classified into screen printing solar cells (SPSCs) and buried contact solar cells (BCSCs) according to the shape of the electrodes. Here, the SPSC is generally easy to manufacture, but the energy conversion efficiency is small.
한편, BCSC는 SPSC와 거의 동일한 제조원가로 제조할 수 있고, SPSC보다 에너지 변환효율이 높은 편이다.On the other hand, BCSC can be manufactured at almost the same manufacturing cost as SPSC, and energy conversion efficiency is higher than that of SPSC.
도 1에는 일반적인 BCSC의 단면구조를 나타낸 도면이다.1 is a view showing a cross-sectional structure of a typical BCSC.
이를 참조하면, p형 실리콘 기판 (11) 상부에 n+형 반도체층 (12)과 산화막으로서 산화규소막 (13)이 순차적으로 형성되어 있고, 상기 기판내로 깊게 파인 홈에 전면전극 (17)이 형성되어 있다.Referring to this, the n +
실리콘 기판 (11) 후면에는 p+형 반도체층 (15)과 후면전극 (16)이 순차적으로 형성되어 있다.The p +
그런데, 상기한 바와 같은 구조를 갖는 BCSC는 다음과 같은 문제점을 갖고 있다.By the way, BCSC having the structure as described above has the following problems.
첫째, 실리콘 기판 전면 및 후면상의 산화규소막을 형성하기 위해서는 고가의 산화로(oxidation furnace)가 구비되어야 하며 장시간의 고온 산화공정을 거쳐야 한다. 또한 이러한 산화공정에서 통상적으로 수소가스를 사용하므로 제조공정상 위험성이 내포되어 있다.First, in order to form a silicon oxide film on the front and back of the silicon substrate, an expensive oxidation furnace must be provided and a long time high temperature oxidation process is required. In addition, since hydrogen gas is commonly used in such an oxidation process, there is a risk in manufacturing process.
둘째, 전면전극을 형성하기 위해서는 실리콘 기판 전면내에 깊은 홈을 형성해야 하는데, 이러한 홈 형성과정에서 레이저 스크라이버(laser scriber) 등과 같은 고가의 장비가 필요할 뿐만 아니라 제조시간이 많이 소요된다.Second, in order to form the front electrode, deep grooves must be formed in the entire surface of the silicon substrate. In addition, expensive equipment such as a laser scriber, etc. are required in the process of forming the grooves, and manufacturing time is required.
셋째, 피라미드 구조가 형성된 실리콘 기판 후면상에 산화막 및 후면전극을 순차적으로 형성하므로 전위결함(dislocation defect)이 비교적 큰 편이고, 실리콘 기판 후면에 알루미늄층을 형성함으로써 얻어지는 후면반사효과가 낮다.Third, since the oxide film and the rear electrode are sequentially formed on the back surface of the silicon substrate on which the pyramid structure is formed, dislocation defects are relatively large, and the back reflection effect obtained by forming the aluminum layer on the back surface of the silicon substrate is low.
본 발명이 이루고자 하는 기술적 과제는 상기 문제점을 해결하여 종래의 산화과정대신 산화티타늄의 분무증착공정을 실시하여 실리콘 기판 전면과 후면에 산화티타늄막을 각각 형성하고, 기판 후면에 부분확산 에미터층을 형성하는 동시에, 통상적인 함몰전극형 실리콘 태양전지와 다른 전면전극을 형성함으로써 절감된 제조비용으로 에너지 변환효율이 우수한 산화티타늄 비활성화 에미터 절연막을 갖는 후면 부분소결형 실리콘 태양전지를 제공하는 것이다.The technical problem to be achieved by the present invention is to solve the above problems by performing a spray deposition process of titanium oxide instead of the conventional oxidation process to form a titanium oxide film on the front and back of the silicon substrate, respectively, and to form a partially diffused emitter layer on the back of the substrate At the same time, it is to provide a backside partial sintered silicon solar cell having a titanium oxide deactivated emitter insulating film having excellent energy conversion efficiency at a reduced manufacturing cost by forming a front electrode different from a conventional recessed electrode type silicon solar cell.
도 1은 통상적인 함몰전극형 실리콘 태양전지의 단면구조를 나타낸 도면이고,1 is a view showing a cross-sectional structure of a conventional recessed electrode type silicon solar cell,
도 2는 본 발명에 따른 후면 부분소결형 실리콘 태양전지의 단면구조를 나타낸 도면이다.2 is a view showing a cross-sectional structure of a backside partially sintered silicon solar cell according to the present invention.
*도면의 주요 부분에 대한 부호의 설명** Description of the symbols for the main parts of the drawings *
11, 21... p형 실리콘 기판12, 24... n+형 반도체층11, 21 ... p-
13, 22, 22'... 산화규소(SiO2)막15... p+형 반도체층13, 22, 22 '... silicon oxide (SiO 2 )
16, 29... 후면전극 17... 전면전극16, 29 ...
23, 23'... 산화티탄(TiO2)막 25... 라인형 전면전극23, 23 '... titanium oxide (TiO 2 )
26... n++형 반도체층27... 부분확산 p+형 반도체층26 ... n ++
28... 전도성 금속층28 ... conductive metal layer
본 발명의 과제는 p형 실리콘기판; 피라미드 구조가 형성된 기판 전면에 순차적으로 형성되어 있는 n+형 반도체층, 산화규소(SiO2)막 및 산화티타늄(TiO2)막; 상기 기판 전면상에 소정간격으로 평형하게 이격되도록 형성되어 있고, 전도성 금속으로 된 복수개의 라인형 전면전극; 전면전극 하부에 형성된 n++형 반도체층; 평탄화된 기판 후면에 순차적으로 형성되어 있는 산화규소막, 산화티탄막 및 전도성 금속으로 된 후면전극; 상기 실리콘 기판 후면 내부로 확산되어 형성된 부분확산 p+형 반도체층; 및 실리콘 기판 후면의 산화티탄막과 후면전극사이의 소정영역에 형성된 전도성 금속층을 포함하는 것을 특징으로 하는 후면 부분소결형 실리콘 태양전지에 의하여 이루어진다.An object of the present invention is a p-type silicon substrate; N sequentially formed on the entire surface of the substrate on which the pyramid structure is formed+Semiconductor layer, silicon oxide (SiO2Film and titanium oxide (TiO)2)membrane; A plurality of line type front electrodes formed on the front surface of the substrate to be equally spaced apart at predetermined intervals and made of a conductive metal; N formed under the front electrode++Type semiconductor layer; A back electrode made of a silicon oxide film, a titanium oxide film and a conductive metal sequentially formed on the back surface of the planarized substrate; Partial diffusion p formed by diffusion into the back surface of the silicon+brother A semiconductor layer; And a conductive metal layer formed in a predetermined region between the titanium oxide film on the back surface of the silicon substrate and the back electrode.
상기 전도성 금속은 니켈(Ni), 구리(Cu), 알루미늄(Al), 은(Ag), 팔라듐(Pd), 티타늄(Ti) 및 그 산화물중에서 선택된다.The conductive metal is selected from nickel (Ni), copper (Cu), aluminum (Al), silver (Ag), palladium (Pd), titanium (Ti) and oxides thereof.
상기 부분확산 p+형 반도체층은 알루미늄(Al)으로 이루어지는 것이 바람직한데, 그 이유는 알루미늄 대신 다른 p형 불순물, 예로써 보론(B)을 확산하는 경우에는 고가의 확산장비가 반드시 필요하기 때문에 제조비용이 상승되기 때문이다.The partial diffusion p+brother It is preferable that the semiconductor layer is made of aluminum (Al), because in the case of diffusing other p-type impurities such as boron (B) instead of aluminum, expensive diffusion equipment is necessary, which increases manufacturing costs. .
이하, 도 2를 참조하여, 본 발명에 따른 후면 부분소결형 실리콘 태양전지를 설명하기로 한다.Hereinafter, with reference to FIG. 2, a backside partial sintered silicon solar cell according to the present invention will be described.
랜덤 피라미드(random pyramid) 구조가 형성된 p형 실리콘 기판 (21) 전면 상부에는 n+형 반도체층 (24), 산화규소막 (22'), 산화티타늄막 (23')이 순차적으로 형성되어 있다.N on the front surface of the p-
상기 산화규소막 (22')과 산화티타늄막 (23')은 실리콘 기판 전면에 티타늄과 산소를 함유한 화합물을 골고루 분무증착한 후 경화시키면 순차적으로 형성된다. 이 때 티타늄과 산소를 함유한 화합물로는 테트라이소프로필 티타네이트(tetraisopropyl titanate), 티타늄 테트라클로라이드(titanium tetrachloride) 등이 이용될 수 있다. 여기에서 산화티타늄막과 산화규소막의 두께는 증착조건 등의 실험조건에 따라 변화되는데, 산화규소막이 산화티타늄보다 그 두께가 얇게 형성되는 것이 일반적이다.The silicon oxide film 22 'and the titanium oxide film 23' are sequentially formed by spray deposition of a compound containing titanium and oxygen on the entire surface of the silicon substrate, followed by spray deposition. In this case, as the compound containing titanium and oxygen, tetraisopropyl titanate, titanium tetrachloride, or the like may be used. Here, the thickness of the titanium oxide film and the silicon oxide film is changed depending on the experimental conditions such as deposition conditions, the silicon oxide film is generally formed thinner than the titanium oxide.
상기 실리콘 기판 (21) 전면상에는 소정간격으로 평형하게 이격되도록 형성되어 있고, 전도성 금속으로 된 복수개의 라인형 전면전극 (25)이 형성되어 있다. 이러한 전면전극 (25)은 pn 접합 실리콘 기판 내부에서 생성된 전류를 모아서 외부 단자와 접촉하는 역할을 하며, 선택적 도금이 가능한 무전해 도금방법이나 전기도금방법으로 전도성 금속을 도금함으로써 형성된다. 특히, 상기 전도성 금속으로서 구리(Cu)를 도금하는 경우에는 무전해 도금방법을 사용하고, 전도성 금속으로서 은(Ag)을 도금하는 경우에는 전기도금법을 사용하는 것이 바람직하다. 이 때 구리나 은을 도금하기 이전에, 이러한 금속 도금층과 피도물의 밀착력을 향상시키기 위한 중간층으로서 니켈(Ni) 도금층을 먼저 형성하는 것이 바람직하다.The front surface of the
그리고 복수개의 라인형 전면전극 (25)과 실리콘 기판 (21)간의 전기적 접촉저항을 줄이기 위한 n++형반도체층 (26)이 도 2에 도시된 바와 같이 형성되어 있다.An n ++
평탄화된 실리콘 기판 (21) 후면에는 산화규소막 (22), 산화티타늄막 (23) 및 후면전극인 알루미늄층 (29)이 차례로 형성되어 있다. 이 실리콘 기판 (21) 후면내에는 금속 마스크를 이용한 알루미늄의 부분 확산으로 얻어진 부분확산 p+형 반도체층 (27)이 형성되어 있다.A
그리고, 산화티타늄 (23)과 후면전극 (29)사이의 소정영역에는 전도성 금속층 (28)이 형성되어 있다. 이 전도성 금속층은 상기 전면전극 (25)의 형성과정에서 동시에 제조된다.A
상기한 바와 같은 구조를 갖는 본 발명의 실리콘 태양전지에서는, 실리콘 기판의 전면과 후면에 형성된 산화티타늄막은 반사방지, 절연 및 보호막으로서의 역할을 동시에 하는 동시에 확산공정시 마스크로서도 작용한다. 그리고 평탄화된 실리콘 기판 후면에 부분확산 P+형반도체층을 형성하여 기판 후면에서의 전위결함이 감소되는 동시에 소수 전하 캐리어들의 재결합이 줄어들어 에너지 변환효율이 향상된다. 또한, 전면전극 형성시, 종래와 같이 기판내로 깊게 홈을 형성하지 않고, 산화막 형성시 고온의 산화공정을 거치지 않아도 되므로 레이저 장비나 산화로 등과 같은 고가의 장비가 불필요하므로 제조시간과 비용을 매우 절감할 수 있다.In the silicon solar cell of the present invention having the structure as described above, the titanium oxide film formed on the front and rear surfaces of the silicon substrate simultaneously acts as an antireflection, insulation and protective film and also acts as a mask during the diffusion process. In addition, a partial diffusion P + type semiconductor layer is formed on the backside of the planarized silicon substrate, thereby reducing potential defects on the backside of the substrate and reducing recombination of minority charge carriers, thereby improving energy conversion efficiency. In addition, when the front electrode is formed, grooves are not deeply formed into the substrate as in the prior art, and high-temperature oxidation processes are not required when forming the oxide film, so expensive equipment such as laser equipment or an oxidation furnace is unnecessary, thus greatly reducing manufacturing time and cost. can do.
본 발명에 따르면, 다음과 같은 효과를 갖는다.According to the present invention, the following effects are obtained.
첫째, 산화티타늄막의 분무증착공정을 이용함으로써 실리콘 기판 전면 및 후면상에 산화티타늄과 산화규소막을 동시에 형성할 수 있다. 이렇게 형성된 2중막은 반사방지막, 절연막 및 보호막 역할을 동시에 수행한다. 따라서 종래의 산화공정을 생략할 수 있어서 제조공정이 단순화됨으로써 제조시간이 줄어들 뿐만 아니라 산화로(oxidation furnace) 등과 같은 고가의 장비가 불필요하게 됨으로써 제조비용이 절감된다.First, by using a spray deposition process of a titanium oxide film, it is possible to simultaneously form a titanium oxide and a silicon oxide film on the front and back of the silicon substrate. The double film thus formed simultaneously serves as an antireflection film, an insulating film, and a protective film. Therefore, the conventional oxidation process can be omitted, thereby simplifying the manufacturing process, thereby reducing manufacturing time and reducing manufacturing costs by eliminating the need for expensive equipment such as an oxidation furnace.
둘째, 통상적인 함몰전극형 실리콘 태양전지와는 달리 전면전극 형성시 기판내부로 깊게 파인 홈을 별도로 제조하지 않아도 되므로 레이저 스크라이버 등과 같은 고가의 장비가 불필요하고 제조소요시간이 절감된다.Second, unlike conventional recessed electrode type silicon solar cells, expensive grooves, such as laser scribers, are unnecessary and manufacturing time is not required because the grooves do not need to be manufactured deeply into the substrate when the front electrode is formed.
셋째, 평탄화된 실리콘 기판 후면에 부분확산 p+형 반도체층을 형성함으로써 실리콘 기판 후면에서의 캐리어들의 재결합과 전위결함을 감소시킴으로써 전지의 개방전압이 향상된다. 그 결과, 에너지 변환효율이 향상된다.Third, the open voltage of the battery is improved by reducing the recombination and potential defects of carriers in the back of the silicon substrate by forming a partially diffused p + type semiconductor layer on the back of the planarized silicon substrate. As a result, the energy conversion efficiency is improved.
넷째, 부분확산 p+형 반도체층 형성시, 종래에는 번거로운 사진식각공정을 사용하는 반면, 본 발명에서는 금속 마스크(metal mask)을 이용한 진공증착법을 이용하므로 제조하기가 용이하고 제조시간을 절감할 수 있다.Fourth, in the formation of the partially-diffused p + type semiconductor layer, a conventional photolithography process is used, whereas the present invention uses a vacuum deposition method using a metal mask, which is easy to manufacture and saves manufacturing time. have.
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WO2010013972A3 (en) * | 2008-08-01 | 2010-06-03 | Lg Electronics Inc. | Solar cell and method for manufacturing the same |
KR101276888B1 (en) | 2010-08-25 | 2013-06-19 | 엘지전자 주식회사 | Solar cell |
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JPH07221333A (en) * | 1994-01-28 | 1995-08-18 | Sharp Corp | Manufacture of solar battery |
JPH0878709A (en) * | 1994-09-06 | 1996-03-22 | Hitachi Ltd | Solar battery |
KR980002281A (en) * | 1996-06-05 | 1998-03-30 | 서순화 | High-strength toothed steel and its manufacturing method |
KR19980017427A (en) * | 1996-08-30 | 1998-06-05 | 김광호 | Solar cell and manufacturing method |
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US4900369A (en) * | 1985-10-11 | 1990-02-13 | Nukem Gmbh | Solar cell |
JPH07221333A (en) * | 1994-01-28 | 1995-08-18 | Sharp Corp | Manufacture of solar battery |
JPH0878709A (en) * | 1994-09-06 | 1996-03-22 | Hitachi Ltd | Solar battery |
KR980002281A (en) * | 1996-06-05 | 1998-03-30 | 서순화 | High-strength toothed steel and its manufacturing method |
KR19980017427A (en) * | 1996-08-30 | 1998-06-05 | 김광호 | Solar cell and manufacturing method |
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WO2010013972A3 (en) * | 2008-08-01 | 2010-06-03 | Lg Electronics Inc. | Solar cell and method for manufacturing the same |
US8759140B2 (en) | 2008-08-01 | 2014-06-24 | Lg Electronics Inc. | Solar cell and method for manufacturing the same |
KR101276888B1 (en) | 2010-08-25 | 2013-06-19 | 엘지전자 주식회사 | Solar cell |
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