KR100265672B1 - 적외선 검출기 어레이용의 판독 시스템 및 그 방법 - Google Patents

적외선 검출기 어레이용의 판독 시스템 및 그 방법 Download PDF

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Publication number
KR100265672B1
KR100265672B1 KR1019920017612A KR920017612A KR100265672B1 KR 100265672 B1 KR100265672 B1 KR 100265672B1 KR 1019920017612 A KR1019920017612 A KR 1019920017612A KR 920017612 A KR920017612 A KR 920017612A KR 100265672 B1 KR100265672 B1 KR 100265672B1
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KR
South Korea
Prior art keywords
radiation
voltage
detector
terminal
reference voltage
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
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KR1019920017612A
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English (en)
Korean (ko)
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KR930006814A (ko
Inventor
에프. 킨넌 윌리엄
Original Assignee
윌리엄 비. 켐플러
텍사스 인스트루먼츠 인코포레이티드
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Application filed by 윌리엄 비. 켐플러, 텍사스 인스트루먼츠 인코포레이티드 filed Critical 윌리엄 비. 켐플러
Publication of KR930006814A publication Critical patent/KR930006814A/ko
Application granted granted Critical
Publication of KR100265672B1 publication Critical patent/KR100265672B1/ko
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Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/20—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming only infrared radiation into image signals
    • H04N25/21—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming only infrared radiation into image signals for transforming thermal infrared radiation into image signals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/673—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources
    • H04N25/674—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources based on the scene itself, e.g. defocusing
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/191—Photoconductor image sensors
    • H10F39/193—Infrared image sensors
    • H10F39/1935—Infrared image sensors of the hybrid type

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Radiation Pyrometers (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
KR1019920017612A 1991-09-27 1992-09-26 적외선 검출기 어레이용의 판독 시스템 및 그 방법 Expired - Lifetime KR100265672B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US766,879 1991-09-27
US07/766,879 US5196703A (en) 1991-09-27 1991-09-27 Readout system and process for IR detector arrays

Publications (2)

Publication Number Publication Date
KR930006814A KR930006814A (ko) 1993-04-21
KR100265672B1 true KR100265672B1 (ko) 2000-09-15

Family

ID=25077806

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019920017612A Expired - Lifetime KR100265672B1 (ko) 1991-09-27 1992-09-26 적외선 검출기 어레이용의 판독 시스템 및 그 방법

Country Status (4)

Country Link
US (1) US5196703A (enExample)
JP (1) JPH06197279A (enExample)
KR (1) KR100265672B1 (enExample)
TW (1) TW279273B (enExample)

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US5486698A (en) * 1994-04-19 1996-01-23 Texas Instruments Incorporated Thermal imaging system with integrated thermal chopper
US5457318A (en) * 1994-04-29 1995-10-10 Texas Instruments Incorporated Thermal detector apparatus and method using reduced thermal capacity
US5424544A (en) * 1994-04-29 1995-06-13 Texas Instruments Incorporated Inter-pixel thermal isolation for hybrid thermal detectors
US5426303A (en) * 1994-04-29 1995-06-20 Texas Instruments Incorporated Thermal isolation structure for hybrid thermal detectors
US5478242A (en) * 1994-04-29 1995-12-26 Texas Instruments Incorporated Thermal isolation of hybrid thermal detectors through an anisotropic etch
US5574282A (en) * 1994-06-30 1996-11-12 Texas Instruments Incorporated Thermal isolation for hybrid thermal detectors
US5653851A (en) * 1994-07-05 1997-08-05 Texas Instruments Incorporated Method and apparatus for etching titanate with organic acid reagents
US5512748A (en) * 1994-07-26 1996-04-30 Texas Instruments Incorporated Thermal imaging system with a monolithic focal plane array and method
JP2710228B2 (ja) * 1994-08-11 1998-02-10 日本電気株式会社 ボロメータ型赤外線検知素子、その駆動方法、および検出用積分回路
US5489776A (en) * 1994-08-30 1996-02-06 Hughes Aircraft Company Microbolometer unit cell signal processing circuit
US5532484A (en) * 1994-09-09 1996-07-02 Texas Instruments Incorporated Defective pixel signal substitution in thermal imaging systems
US5559332A (en) * 1994-11-04 1996-09-24 Texas Instruments Incorporated Thermal detector and method
US5602043A (en) * 1995-01-03 1997-02-11 Texas Instruments Incorporated Monolithic thermal detector with pyroelectric film and method
US5644838A (en) * 1995-01-03 1997-07-08 Texas Instruments Incorporated Method of fabricating a focal plane array for hybrid thermal imaging system
US5746930A (en) * 1995-01-03 1998-05-05 Texas Instruments Incorporated Method and structure for forming an array of thermal sensors
US5626773A (en) * 1995-01-03 1997-05-06 Texas Instruments Incorporated Structure and method including dry etching techniques for forming an array of thermal sensitive elements
US5603848A (en) * 1995-01-03 1997-02-18 Texas Instruments Incorporated Method for etching through a substrate to an attached coating
US5708269A (en) * 1995-08-15 1998-01-13 Raytheon Ti Systems, Inc. Thermal detector and method
US5796514A (en) * 1996-03-04 1998-08-18 Raytheon Ti Systems, Inc. Infrared zoom lens assembly having a variable F/number
US6249374B1 (en) 1996-03-04 2001-06-19 Raytheon Company Wide field of view infrared zoom lens assembly having a constant F/number
US6018414A (en) * 1996-03-04 2000-01-25 Raytheon Company Dual band infrared lens assembly using diffractive optics
US5852516A (en) * 1996-03-04 1998-12-22 Raytheon Ti Systems, Inc. Dual purpose infrared lens assembly using diffractive optics
JP3303786B2 (ja) 1998-08-13 2002-07-22 日本電気株式会社 ボロメータ型赤外線センサ
US6267501B1 (en) 1999-03-05 2001-07-31 Raytheon Company Ambient temperature micro-bolometer control, calibration, and operation
US6683310B2 (en) 2001-06-18 2004-01-27 Honeywell International Inc. Readout technique for microbolometer array
JP3944465B2 (ja) 2003-04-11 2007-07-11 三菱電機株式会社 熱型赤外線検出器及び赤外線フォーカルプレーンアレイ
US7462831B2 (en) * 2006-01-26 2008-12-09 L-3 Communications Corporation Systems and methods for bonding
US7459686B2 (en) * 2006-01-26 2008-12-02 L-3 Communications Corporation Systems and methods for integrating focal plane arrays
US7655909B2 (en) * 2006-01-26 2010-02-02 L-3 Communications Corporation Infrared detector elements and methods of forming same
US7718965B1 (en) 2006-08-03 2010-05-18 L-3 Communications Corporation Microbolometer infrared detector elements and methods for forming same
US8153980B1 (en) 2006-11-30 2012-04-10 L-3 Communications Corp. Color correction for radiation detectors
JP4482599B2 (ja) * 2008-10-24 2010-06-16 本田技研工業株式会社 車両の周辺監視装置
US8330820B2 (en) * 2008-12-05 2012-12-11 Bae Systems Information And Electronic Systems Integration Inc. Fast electrostatic shutter and method of achieving offset compensation in infrared video imagers using fast shutters
IL201915A0 (en) * 2009-11-04 2010-11-30 Lior Segal Warm body presence portable detection device and method
US8765514B1 (en) 2010-11-12 2014-07-01 L-3 Communications Corp. Transitioned film growth for conductive semiconductor materials
US11528442B2 (en) 2019-12-23 2022-12-13 Sivananthan Laboratories, Inc. Adjacent electrode which provides pixel delineation for monolithic integration of a colloidal quantum dot photodetector film with a readout integrated circuit
US11670616B2 (en) 2020-06-22 2023-06-06 Epir, Inc. Modified direct bond interconnect for FPAs
US11781914B2 (en) 2021-03-04 2023-10-10 Sivananthan Laboratories, Inc. Computational radiation tolerance for high quality infrared focal plane arrays
US12532085B2 (en) 2021-05-07 2026-01-20 Sivananthan Laboratories, Inc. Computational high-speed hyperspectral infrared camera system

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3827465A1 (de) * 1988-08-12 1990-02-15 Steinheil Optronik Gmbh Verstaerker fuer infrarotdetektoren

Also Published As

Publication number Publication date
KR930006814A (ko) 1993-04-21
US5196703A (en) 1993-03-23
TW279273B (enExample) 1996-06-21
JPH06197279A (ja) 1994-07-15

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